WO2013099875A1 - 光学用基材および発光デバイス - Google Patents
光学用基材および発光デバイス Download PDFInfo
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- WO2013099875A1 WO2013099875A1 PCT/JP2012/083497 JP2012083497W WO2013099875A1 WO 2013099875 A1 WO2013099875 A1 WO 2013099875A1 JP 2012083497 W JP2012083497 W JP 2012083497W WO 2013099875 A1 WO2013099875 A1 WO 2013099875A1
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1809—Diffraction gratings with pitch less than or comparable to the wavelength
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1861—Reflection gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/85—Arrangements for extracting light from the devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/85—Arrangements for extracting light from the devices
- H10K50/852—Arrangements for extracting light from the devices comprising a resonant cavity structure, e.g. Bragg reflector pair
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/85—Arrangements for extracting light from the devices
- H10K50/854—Arrangements for extracting light from the devices comprising scattering means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K77/00—Constructional details of devices covered by this subclass and not covered by groups H10K10/80, H10K30/80, H10K50/80 or H10K59/80
- H10K77/10—Substrates, e.g. flexible substrates
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Definitions
- the present invention relates to an optical substrate applicable to an organic EL used for a display, illumination, and the like, and a light emitting device using the same.
- Patent Documents 1 and 2 As a method for improving the light extraction efficiency, introduction of a light scattering layer or a low refractive index layer in a light emitting device has been studied (Patent Documents 1 and 2). In addition, a method is known in which the light extraction efficiency is increased by polarizing the traveling direction of light in a waveguide mode in the direction of the light emitting device surface using light diffraction (Patent Document 3). Further, a technique has been devised in which a metal periodic lattice structure or a fine particle dispersion is provided in the vicinity of a light emitting portion in a light emitting device to excite surface plasmons, thereby extracting light with high efficiency (Patent Document 4, Patent). Document 5, Non-Patent Document 1 to Non-Patent Document 5).
- the propagation type surface plasmon on the metal surface is one in which a polarization wave of free electrons generated by an electromagnetic wave (visible light or the like) incident on a conductor surface such as a metal forms a transverse wave electric field on the surface.
- an electromagnetic wave visible light or the like
- the propagating light cannot directly excite the plasmons because the propagating light dispersion line does not intersect the plasmon dispersion curve.
- the diffracted wave reflected by the grating crosses the polarization curve of the plasmon, so the incident electromagnetic wave and the polarization wave of free electrons on the metal surface create a resonance state.
- the wave number vector of the surface plasmon has the same value as the wavelength of the light, and the exciton and the light are coherently coupled to form an exciton polarin.
- Polatrine is a state where free-electron polarization waves and electromagnetic waves exchange energy by resonance.
- the pitch or height of the periodic grating structure is substantially constant, that is, when the crystallinity of the periodic grating structure is high, the surface plasmon has one wave vector, and has a specific incident angle and frequency (wavelength). A light emission enhancement phenomenon due to so-called surface plasmon resonance is observed in combination with light.
- Non-Patent Document 5 by using a periodic corrugated lattice structure to induce light and surface plasmon coupling in the light emitting layer in an organic light emitting device, the lateral direction of the emitted light is It has been proposed to prevent transmission and waveguiding and increase the light output and efficiency of the structure. According to this method, it is theoretically possible to couple up to 93% of the light emitted from the organic light emitting material in the organic EL light emitting device.
- Non-Patent Document 3 shows that the luminous efficiency of blue light by ultraviolet excitation of the semiconductor quantum well structure is enhanced by the periodic structure of silver.
- Non-Patent Document 4 also shows that the luminous efficiency of the LED is enhanced by the silver periodic structure.
- a light-emitting device such as an organic EL has a configuration in which a high refractive index region is sandwiched between low refractive index regions. Since the light emitting portion is included in the high refractive index region, the light emitted from the light emitting portion becomes a waveguide mode, is confined in the high refractive index region, and is absorbed and attenuated in the waveguide process. Therefore, light cannot be extracted outside the device, and the light extraction efficiency is greatly reduced.
- Patent Document 6 a method of forming an intermediate refractive index layer between the low refractive index region and the high refractive index region has been proposed.
- Patent Literature 7 a method has been proposed in which light confined in the waveguide mode is extracted as diffracted light by a periodic structure provided in the vicinity of the substrate (Patent Literature). 7).
- JP 2008-235605 A JP-T-2004-513383 Japanese Patent Laid-Open No. 2001-230069 JP 2004-31350 A JP 2009-158478 A Japanese Patent Laid-Open No. 62-172691 Special table 2010-533932 gazette
- a metal periodic grating structure is introduced in the vicinity of the light emitting portion, and in extracting light from a light emitting device using surface plasmon resonance, it is necessary to provide a substantially uniform periodic grating structure over the entire device surface.
- the period is a size that diffracts visible light, there is a problem that a steep color shift caused by light diffraction occurs when the observation direction is changed.
- the glare refers to a phenomenon in which light of a specific wavelength at a specific angle is observed as a dotted bright spot, and is bright spot-like light emission accompanied by a color shift.
- the present invention has been made in view of the above points, and provides an optical substrate and a light-emitting device that can improve light extraction efficiency and suppress color shift and glare caused by light diffraction. Objective.
- An optical substrate according to the present invention is an optical substrate that is applied to an organic EL light-emitting device that includes at least an anode, a cathode, and a light-emitting layer, and the light-emitting layer includes one or more organic layers.
- the plurality of dot rows are arranged at the pitch Py, and the plurality of dot rows are arranged at the pitch Px in the second direction orthogonal to the first direction in the base surface.
- a plurality of dot rows are formed, and either one of the pitch Py and the pitch Px is a constant interval of nano order and the other is an indefinite interval of nano order, or both are indefinite intervals of nano order.
- the nano-order indefinite interval has a fluctuation range ⁇ .
- the pitch Py having an indefinite interval is equal to the distance between the centers of the dots
- the pitch Px having an indefinite interval is a plurality of dots in which the plurality of dots are arranged at the pitch Py.
- the pitch Py having an indefinite interval is equal to the distance between the centers of the dots
- the pitch Px having an indefinite interval is a plurality of dots in which the plurality of dots are arranged at the pitch Py.
- the dot group constituted by the pitches Py1 to Pyn has a configuration in which long-period units Lyz are repeatedly arranged and the pitch Px is an indefinite interval
- the dot row group configured by the pitches Px1 to Pxn repeats the long-period units Lxz in the second direction while satisfying the relationship of the above formula (2).
- the diameter of each of the dots described above increases or decreases corresponding to the pitch Py and / or the pitch Px, and when the pitch Py is an indefinite interval, at least four adjacent dots.
- the relationship 3) is satisfied and at least one dot group composed of the dot diameters Dy1 to Dyn is arranged in the first direction and the pitch Px is an indefinite interval, at least four adjacent dots are arranged.
- the diameter of each of the dots described above increases or decreases corresponding to the pitch Py and / or the pitch Px, and when the pitch Py is an indefinite interval, at least four adjacent dots.
- the dot group composed of the dot diameters Dy1 to Dyn is repeatedly arranged in the long cycle unit Lyz, and the pitch Px is an indefinite interval
- the height of each dot described above increases or decreases corresponding to the pitch Py and / or the pitch Px, and when the pitch Py is an indefinite interval, at least four adjacent dots are present.
- the height of each dot described above increases or decreases corresponding to the pitch Py and / or the pitch Px, and when the pitch Py is an indefinite interval, at least four adjacent dots are present.
- the dot group composed of the dot heights Hy1 to Hyn is repeatedly arranged in the long cycle unit Lyz, and the pitch Px is an indefinite interval.
- the dot dot group consisting of height Hx1 ⁇ Hxn are repeatedly arranged in the long cycle unit Lxz are preferred.
- An optical substrate is an optical substrate that is applied to an organic EL light-emitting device that includes at least an anode, a cathode, and a light-emitting layer, and the light-emitting layer includes one or more organic layers.
- the dot is arranged with a nano-order pitch Py with a constant interval in FIG. 5 and the dot rows are arranged with a nano-order pitch Px with a constant interval in a second direction orthogonal to the first direction.
- the shift amount ⁇ 1 in the first direction between the adjacent first and second dot rows and the third dot row adjacent to the second and second dot rows are arranged in parallel.
- the shift amount ⁇ 2 in one direction is mutually It is characterized by being different.
- the difference between the shift amount ⁇ 1 and the shift amount ⁇ 2 is not constant.
- the optical substrate of the present invention is an optical substrate that is composed of at least an anode, a cathode, and a light emitting layer, and the light emitting layer is applied to an organic EL light emitting device having one or more organic layers, Forming a microstructure layer including a line composed of a plurality of convex portions extending in an out-of-plane direction from the substrate main surface of the substrate, and forming a line structure along the first direction in the substrate main surface; Forming a plurality of line rows in which the plurality of lines are arranged at a pitch Px in a second direction orthogonal to the first direction in the substrate main surface, and the pitch Px is nano-order It is characterized by irregular intervals.
- the substrate is preferably made of a resin.
- the surface of the substrate is preferably coated with a metal film. Furthermore, it is preferable that the base material is made of metal.
- the base material is composed of at least a base material and a material constituting the fine structure layer, a refractive index of the material constituting the fine structure layer, and the base material.
- the difference from the refractive index is preferably 0.15 or less.
- the surface of the substrate is preferably coated with a metal film.
- the substrate is preferably made of metal.
- the dots or the plurality of dots provided on the dots or the lines of the microstructure layer of the substrate and configured by the plurality of protrusions or recesses of the microstructure layer A transparent dielectric layer having a fine concavo-convex structure having a shape corresponding to a line composed of convex portions is provided, and a surface of the transparent dielectric layer opposite to the surface having the fine concavo-convex structure is flattened. Is preferred.
- the light-emitting device of the present invention has at least one of the above-mentioned optical base material, and the light-emitting layer is disposed so as to face the main surface of the optical base material on the fine structure layer side. .
- an optical substrate and a light emitting device that can improve light extraction efficiency and suppress color shift and glare caused by light diffraction.
- the optical substrate according to the present embodiment includes a fine structure layer including dots composed of a plurality of convex portions or concave portions extending in the out-of-plane direction from the main surface of the base material, and the fine structure layer includes: In the first direction in the substrate main surface, the plurality of dots constitutes a plurality of dot rows arranged at a pitch Py, while in the second direction orthogonal to the first direction in the substrate main surface.
- the plurality of dot rows are arranged at a pitch Px, and one of the pitch Py and the pitch Px is a constant interval of nano order, and the other is an indefinite interval of nano order. It is characterized in that either or both of them are nano-order indefinite intervals.
- the luminous efficiency is improved, and at the same time, the nano-order periodicity is disturbed.
- the light scattering property is strongly expressed, and the light extraction efficiency can be improved.
- the nano-order unevenness interval varies gently with a long period, which makes it possible to alleviate a color shift in improving light extraction efficiency due to surface plasmon resonance.
- the surface of the base material is formed by providing nano-order irregularities on the surface of the base material, so that either or both of the pitch Px and the pitch Py are indefinite intervals.
- the periodicity in the nano-order of the projections and depressions provided on the substrate is disturbed, and light scattering can be strongly expressed with respect to light emission from the light emitting layer.
- This light scattering property can disturb the light guide mode and increase the light extraction efficiency.
- the uniformity of the unevenness in the nano-order is disturbed, it is possible to reduce color shift, obtain light emission characteristics closer to natural light, and suppress glare.
- both pitch Py and pitch Px, or one of them is an indefinite interval
- the periodicity in the nano-order of the unevenness provided on the surface of the optical substrate is disturbed, and the light emission from the light emitting device is disturbed. It becomes possible to express light scattering properties strongly. With this light scattering property, the light guide mode can be eliminated, and at the same time, color shift and glare can be suppressed.
- the pitch Py and the pitch Px are both indefinite intervals
- the light scattering effect and the color shift reduction effect due to the periodic disturbance can be enhanced. That is, the waveguide mode is effectively disturbed, the light extraction efficiency is improved, and the light emission characteristics closer to natural light can be obtained, which is effective in suppressing glare. Even in surface plasmon resonance, the effect of improving the light emission efficiency is reduced, but the light scattering effect due to periodic disturbance can be further enhanced.
- the periodic disturbance is reduced as compared with the case where the pitch Py and the pitch Px are both indefinite intervals, and the scattering. Since the effect is reduced, the light emission characteristic close to natural light is lowered, but the light extraction efficiency due to the diffraction effect is improved. Also in the surface plasmon resonance, the uniformity of the nano-order unevenness is further increased as compared with the case where the pitch Py and the pitch Px are both indefinite intervals. Thereby, the color shift reduction effect and the light scattering effect due to the periodic disturbance are reduced, but the light extraction efficiency improvement effect by the surface plasmon resonance can be enhanced.
- the pitch Py and the pitch Px are indefinite intervals, or whether one of the pitch Py and the pitch Px is indefinite intervals, is the light emission characteristic and use of the light emitting device to which the optical substrate of the present invention is applied.
- Various selections can be made according to the above, and the optimum structure can be obtained.
- a structure in which either pitch Py or pitch Px is an indefinite interval is adopted.
- a structure in which both the pitch Py and the pitch Px are indefinite intervals may be employed.
- the optical substrate in the present invention is an optical substrate that is composed of at least an anode, a cathode, and a light emitting layer, and that is applied to an organic EL light emitting device in which the light emitting layer has one or more organic layers.
- the pitch means an interval, and does not necessarily mean a constant interval, and includes both a constant interval and an indefinite interval.
- FIG. 1 is a schematic perspective view showing an example of an optical substrate 1 according to the present embodiment.
- the optical substrate 1 has a generally flat plate shape, and includes a substrate 11 and a microstructure layer 12 provided on one main surface of the substrate 11. Yes.
- the fine structure layer 12 includes a plurality of convex portions 13 (convex portion rows 13-1 to 13-N) protruding upward from the main surface of the substrate 11.
- the convex portions 13 extend from the main surface of the base material 11 in the out-of-plane direction, and are arranged with specific intervals.
- the fine structure layer 12 may be separately formed on the main surface of the substrate 11 or may be formed by directly processing the substrate 11.
- the base material 1 for optics may be film shape other than flat plate shape.
- FIG. 1 shows an example in which the fine structure of the fine structure layer 12 is composed of a plurality of convex portions 13, but the present invention is not limited to this, and the fine structure of the fine structure layer is composed of a plurality of concave portions.
- FIG. 2 is a schematic perspective view showing another example of the optical substrate 1 according to the present embodiment.
- the optical substrate 11a has a generally flat plate shape, and includes a substrate 11a and a microstructure layer 12a provided on one main surface of the substrate 11a.
- the fine structure layer 12a includes a plurality of concave portions 14 (concave portions 14-1 to 14-N) recessed from the surface S of the fine structure layer 12a toward the main surface side of the base material 11a.
- the recesses 14 extend from the main surface of the substrate 11 in the out-of-plane direction, and are arranged with a specific interval.
- the fine structure layer 12a may be separately formed on the main surface of the base material 11a, or may be formed by directly processing the base material 11a.
- the base material 1 for optics may be film shape other than flat plate shape.
- the convex portion 13 or the concave portion 14 constituting the fine structure of the fine structure layers 12 and 12a in the optical substrate 1, 1a is referred to as “dot”.
- FIG. 3 is a schematic plan view of the optical substrate 1.
- a plurality of dots are arranged at indefinite intervals Py (pitch Py1, Py2, Py3,...) In the D1 direction in the main surface of the substrate 11.
- a plurality of dot rows are formed.
- each dot row is arranged at an indefinite interval Px (pitch Px1, Px2, Px3,...) In a second direction (D2 direction) orthogonal to the first direction (D1 direction) within the main surface of the substrate 11. Yes.
- the nano-order indefinite interval has a fluctuation range ⁇ .
- pitches Py1, Py2, and Py3 are in the range of Pyav ⁇ ⁇ .
- Fig. 4 shows a conceptual diagram of the average pitch.
- the fluctuation range ⁇ is a value that is three times the standard deviation ⁇ of the pitch Py between the dots 13-1 in the D1 direction, and is defined as a value calculated by measuring 100 or more points in the pitch Py in the D1 direction.
- the fluctuation range ⁇ is preferably smaller than the average pitch Pyav.
- the fluctuation width ⁇ is in the range of 1% to 50% of the average pitch Pyav
- the size of the pitch Py between the plurality of dots 13-1 is in an appropriate range. Improvement effect and color shift reduction effect can be realized.
- the fluctuation width ⁇ is in the range of 5% to 30% of the average pitch Pyav, in addition to the light extraction efficiency improvement effect and color shift reduction effect due to light scattering, the light extraction efficiency improvement effect due to diffraction Further, it is more preferable because the effect of improving the light extraction efficiency by surface plasmon resonance can be obtained.
- pitch Py in the D1 direction is the description about the pitch Py in the D1 direction, but the pitch Px in the D2 direction can be defined by replacing Py with Px.
- FIG. 5 is a schematic plan view of the optical substrate 1 according to the first embodiment.
- a plurality of dot rows 32-1 to 32-N in which a plurality of dots 13 are arranged in the direction D1 belonging to the main surface of the substrate 11 main body are arranged side by side.
- the plurality of dots 31 belonging to each of the dot rows 32-1 to 32-N are arranged at indefinite intervals at different pitches (Py1, Py2, Py3,).
- the dot rows 32-1 to 32-N are arranged in parallel at a constant pitch Px in the D2 direction orthogonal to the D1 direction in the main surface of the base 11 main body.
- a plurality of dots 31 belonging to each of the dot rows 32-1 to 32-N are arranged at indefinite intervals Py1, Py2, and Py3 in the D1 direction.
- the dot rows 32-1 to 32-N are provided at a constant interval Px in the D2 direction.
- FIG. 6 shows a first embodiment in which the plurality of dots are arranged in the D2 direction with a plurality of dot rows arranged at a constant pitch Px and arranged in the D1 direction at a pitch Py having a variation width ⁇ .
- a plurality of dots 31 belong to the dot row 32-1 (shown by a solid line), those belonging to the dot row 32-2 (shown by a dashed line in the drawing), and a dot row 32-3. (Indicated by a two-dot broken line in the figure).
- a plurality of dots 31 belonging to the same dot row are arranged at indefinite intervals Py1, Py2, and Py3 in the D1 direction. As a result, as shown in FIG. 6, the plurality of dots 31 are irregularly arranged so as to be shifted from each other, and the light scattering effect can be exhibited by disturbing the arrangement.
- FIG. 7 is a schematic diagram showing an example of the arrangement (dot pattern) of a plurality of dots 31 constituting the concavo-convex structure 12 in the optical substrate 1 according to the first embodiment.
- FIG. 7 shows an example in which the pitch Py and the pitch Px of each dot 31 are substantially equal, and the fluctuation range ⁇ is 20% of the pitch Pyav. As shown in FIG. 7, it can be seen that the pitch Py between the dots 31 in the D1 direction has no periodicity even if the dot rows 32-a and 32-b are arranged at a constant interval with the pitch Px.
- the presence of the plurality of dots 31 can increase the efficiency of extracting light from the organic EL provided on the optical substrate 1, and the light scattering effect can be obtained by disturbing the arrangement of the plurality of dots 31. And a color shift reducing effect can be exhibited.
- FIG. 8 is a schematic diagram illustrating an arrangement example of dot rows in the D2 direction.
- the dot rows (DL in FIG. 8) in the D2 direction are arranged at specific intervals (pitch Px) by eight rows, and eight dot rows are repeatedly arranged.
- a unit composed of a plurality of (z) dot rows is referred to as a long cycle unit Lxz (where z is a positive integer).
- Lxz where z is a positive integer
- the pitch Py having an indefinite interval is equal to the distance between the centers of the dots
- the pitch Px having an indefinite interval is equal to the distance between a plurality of dot rows in which a plurality of dots are arranged at the pitch Py.
- the pitch Py and the pitch Px are larger than the diameter of each dot.
- the pitch Py is an indefinite interval
- at least the pitch Pyn between 4 or more and 4 or less adjacent dots (3 ⁇ n ⁇ 2a or 3 ⁇ n ⁇ 2a + 1, where m and a are positive integers.
- Rukoto is preferable. Py1 ⁇ Py2 ⁇ Py3 ⁇ ... ⁇ Pya>...> Pyn (1) Px1 ⁇ Px2 ⁇ Px3 ⁇ ... ⁇ Pxa>...> Pxn (2)
- the pitch Px in the long cycle unit Lxz has a maximum phase shift ⁇ represented by a difference between the maximum value (Px (max)) and the minimum value (Px (min)) of the pitch Px, (Px (min) ) ⁇ 0.01 ⁇ ⁇ (Px (min)) ⁇ 0.66, preferably (Px (min)) ⁇ 0.02 ⁇ ⁇ (Px (min)) ⁇ 0.5, more preferably It is set to satisfy (Px (min)) ⁇ 0.1 ⁇ ⁇ (Px (min)) ⁇ 0.4.
- the pitch Pxn between the dot rows is expressed as follows.
- Px1 Px (min)
- Px2 Px (min) + ⁇ a
- Px4 Px (min) + ⁇ c
- Px5 Px (min) + ⁇ d
- Px6 Px (min) + ⁇ e
- Px7 Px (min) + ⁇ f
- the values of ⁇ a to ⁇ f satisfy Px (min) ⁇ 0.01 ⁇ ( ⁇ a to ⁇ f) ⁇ Px (min) ⁇ 0.5. The same applies to the adjacent long cycle unit L2.
- the maximum value of z in the long cycle unit Lxz or the long cycle unit Lyz is set to satisfy 4 ⁇ z ⁇ 1000, preferably 4 ⁇ z ⁇ 100, more preferably 4 ⁇ z ⁇ 20. Yes.
- At least one dot group having the long cycle unit Lyz is arranged in the D1 direction, and in the D2 direction, the dot group having the long cycle unit Lxz described above. It is preferable that at least one is arranged.
- the dots constituting the fine structure of the fine structure layer 12 (12a) are the pitches Px and Py having indefinite intervals as described above in both the D1 direction and the D2 direction. (See FIG. 9), or only one of the D1 direction and the D2 direction can be arranged at an indefinite interval pitch as described above, and the other can be arranged at a constant interval pitch (see FIG. 9). (See FIG. 10). In FIG. 10, dots in the D1 direction are arranged at indefinite intervals, and dot rows in the D2 direction are arranged at constant intervals.
- the disturbance of periodicity is reduced as compared with the case in which the pitch Py and the pitch Px are both indefinite intervals, and scattering. Since the effect is reduced, the light emission characteristic close to natural light is lowered, but the light extraction efficiency due to the diffraction effect is improved. Also in the surface plasmon resonance, the uniformity of the nano-order unevenness is further increased as compared with the case where the pitch Py and the pitch Px are both indefinite intervals. Thereby, the color shift reduction effect and the light scattering effect due to the periodic disturbance are reduced, but the light extraction efficiency improvement effect by the surface plasmon resonance can be enhanced.
- the pitch Py and the pitch Px are both indefinite intervals
- the light scattering effect and the color shift reduction effect due to periodic disturbance can be enhanced. That is, the waveguide mode is effectively disturbed, the light extraction efficiency is improved, and the light emission characteristics closer to natural light can be obtained, which is effective in suppressing glare. Even in surface plasmon resonance, the effect of improving the light extraction efficiency is reduced, but the light scattering effect due to periodic disturbance can be further enhanced.
- the pitch Py and the pitch Px are indefinite intervals, or whether one of the pitch Py and the pitch Px is indefinite intervals, is the light emission characteristic and use of the light emitting device to which the optical substrate of the present invention is applied.
- Various selections can be made according to the above, and the optimum structure can be obtained.
- a structure in which either pitch Py or pitch Px is an indefinite interval is adopted.
- a structure in which both the pitch Py and the pitch Px are indefinite intervals may be employed.
- pitch Py or pitch Px is set to an indefinite interval in order to enhance the light extraction efficiency improvement effect due to surface plasmon resonance.
- a structure may be adopted.
- a structure in which both the pitch Py and the pitch Px are indefinite intervals may be employed in order to enhance the color shift reduction effect.
- the ratio of the pitch of the indefinite interval to the pitch of the constant interval is within a specific range. Preferably there is.
- the ratio of the pitch Px with indefinite intervals to the pitch Pyc with constant intervals is in the range of 85% to 100%. It is preferable that the ratio of the pitch Px of the indefinite interval to the pitch Pyc of the constant interval is 85% or more because the overlap between adjacent dots is reduced. In addition, it is preferable that the ratio of the pitch Px of the indefinite interval to the pitch Pyc of the constant interval is 100% or less because the filling rate of the convex portions 13 constituting the dots is improved. It is more preferable that the ratio of the irregularly spaced pitch Px to the regularly spaced pitch Pyc is in the range of 90% to 95%.
- the long-period unit Lxz or Lyz is composed of five or more dots (when the belonging pitch Px or Py is four or more), the long period of the refractive index of the light generated in the organic EL light-emitting device. Is preferable because it is far from the nano-order and light scattering tends to occur.
- the long-period unit Lxz or Lyz is preferably composed of 1001 or less dots (the pitch Px or Py to which it belongs is 1000 or less).
- the optical substrate 1 (1a) according to the first embodiment satisfies the above-described relationship of the microstructure of the microstructure layer 12 (12a), so that the light scattering effect is sufficient, and the dots Since the interval between (the convex portion 13 or the concave portion 14) is nano-order, the effect of improving the light extraction efficiency by surface plasmon resonance appears. As a result, the light extraction efficiency due to surface plasmon resonance and diffraction effect is improved by the unevenness of the nano order, and at the same time, the periodicity of the nano order is disturbed, and the light scattering property is strongly expressed with respect to the light emission from the organic EL light emitting device. be able to.
- the nano-order irregularity interval changes gently due to long-period fluctuations, the color shift in improving light extraction efficiency due to surface plasmon resonance and diffraction effects is reduced, and it is possible to obtain emission characteristics closer to natural light. Can be suppressed.
- the interval between the dots is divided according to the size of the pitch (13a to 13c in the figure). Therefore, the excitation wavelength of the surface plasmon excited in each region is different and the boundary is smooth, so that the wavelength at which the light emission efficiency is improved can be adjusted in a wide range. Since the interval between the dots (the convex portion 13 or the concave portion 15) and the fluctuation of the long period Lxz or Lyz can be arbitrarily adjusted, the emission wavelength can be appropriately adjusted depending on the use of the light emitting device. For example, for lighting applications, a warm color, a natural color, a cool color, or the like can be selected by selecting an emission wavelength.
- the dot shape (uneven structure) constituting the microstructure of the microstructure layer 12 (12a) of the optical substrate 1 according to the present embodiment will be described.
- the shape of the convex part 13 and the recessed part 14 will not be specifically limited if it is a range in which the effect of this invention is acquired, It can change suitably according to a use.
- a shape of the convex portion 13 and the concave portion 14 for example, a pillar shape, a hole shape, a conical shape, a pyramid shape, an elliptical cone shape, a line and space structure, and the like can be used. Further, a finer structure may be provided on the side surface (inner surface) of these structures.
- the long axis direction of the line is defined as the first direction.
- the shortest distance between the center lines of adjacent lines corresponds to the pitch Px.
- the line shape comprised from the some convex part in this invention is defined as the ratio (line length / convex part width) of a line length and a convex part width
- variety being larger than one. That is, it includes from an elliptical shape in which the long radius / short radius is larger than 1 to a fence-like resistance connected to the surface of the optical substrate 1 without interruption.
- the shape constituting the line it is used whether it is a continuous shape over the entire surface of the optical substrate 1 or a shape in which the line length / convex width is interrupted in a range larger than 1. It can be appropriately selected depending on the application. In the case of continuous shapes without interruption, the degree of limitation (anisotropy) in the direction of light extracted by diffraction is strong, and the diffraction effect is large, so that it is suitable for applications where the demand for color shift is low. On the other hand, in the case of a shape in which the line length / convex width is interrupted in a range larger than 1, the effect of light scattering can be further expressed as the line length approaches the pitch Px, and thus color shift can be suppressed. Therefore, in the case of a discontinuous structure, it is suitable for applications that demand high color shift suppression.
- the line length / convex width can be appropriately selected depending on the use, but is preferably 1.5 or more, more preferably 2.5 or more, and most preferably 5.0 or more.
- the pitch Px prefferably be an indefinite interval because it is possible to take out light in a waveguide mode by diffracted light due to the line structure and to exhibit a scattering effect, and to suppress glare.
- the pitch Px can further exhibit this effect by having a long period Lxz as well as the pitch Px described in the dot shape.
- the diameter of each dot is the pitch Py and / or the pitch. It is preferable to increase or decrease corresponding to Px.
- the fact that the diameter of each dot increases or decreases corresponding to the pitch Py and / or the pitch Px means that the diameter of each dot increases as the pitch Py or the pitch Px increases, or Point to one that decreases.
- the dot diameter Dyn 3 ⁇ n ⁇ 2a) constituting at least 4 adjacent m pitches.
- 3 ⁇ n ⁇ 2n + 1, where m and a are positive integers and n m ⁇ 1) satisfy the relationship of the following formula (3), and in the first direction, the dot diameters Dy1 to Dyn Is arranged with at least one dot group and the pitch Px is an indefinite interval, the dot diameter Dxn (3 ⁇ n ⁇ 2a or 3 constituting at least 4 or more adjacent pitches) is used.
- the dot diameter decreases as the interval between adjacent dots increases, and the dot diameter increases as the dot interval decreases. If the increase / decrease range of the dot diameter to be increased / decreased is too large, the adjacent dot comes into contact with the adjacent dots. It is preferable that the average diameter of dots within the same long period unit Lxz is within ⁇ 20%, because the light extraction efficiency increases.
- the dot diameter increases when the pitch constituting the dots decreases, but similarly, the dot diameter may decrease correspondingly when the pitch constituting the dots decreases. In any case, it is preferable that the long period of increase / decrease in the dot diameter coincides with the long period of increase / decrease in the pitch constituting the dot.
- the height of each dot is the pitch Py. It is preferable to increase and decrease with respect to the pitch Px.
- the dot height Hyn 3 ⁇ n ⁇ 3 3) constituting at least four adjacent m pitches.
- 2a or 3 ⁇ n ⁇ 2n + 1, where m and a are positive integers and n m ⁇ 1) satisfy the relationship of the following formula (5), and in the first direction, the dot height Hy1
- the dot height Hxn 3.ltoreq.n constituting at least the adjacent four or more m pitches.
- Hx1 Dots composed of ⁇ Hxn It is preferred that but arranged at least one more.
- the dot height Hyn (3) constituting at least four adjacent m pitches.
- Dot group consisting of xn is it is preferred that repeatedly arranged in long period units Lxz.
- the dot height decreases as the interval between adjacent dots increases, and the dot height increases as the dot interval decreases. If the increase / decrease range of the dot height to be increased / decreased is too large, the unevenness of the light extraction efficiency at that portion becomes large, which is not preferable. Within ⁇ 20% of the average dot height within the same long period unit Lxz, the light extraction efficiency is preferably increased without unevenness.
- a plurality of dots configured by a plurality of convex portions 13 or concave portions 14 extending in the out-of-plane direction from the main surface of the base material 11 (11a).
- the fine structure layer 12 (12a) includes a dot row in which a plurality of dots are arranged at a constant interval Py in the first direction in the main surface of the substrate 11 (11a). These dot rows are arranged in parallel in a second direction orthogonal to the first direction at a constant pitch Px, and a shift amount ⁇ 1 in the first direction between the adjacent first dot rows and second dot rows. And the shift amount ⁇ 2 in the first direction between the second dot row and the third dot row adjacent to the second dot row are preferably different from each other.
- the pitch Py and the pitch Px are both constant and have a periodic structure, the shift amounts ⁇ 1 and ⁇ 2 in the first direction between the dot rows are different from each other.
- the periodicity of the arrangement of the plurality of dots constituting (12a) is disturbed, and a light scattering effect can be generated.
- a plurality of dot rows arranged in parallel at a constant pitch Px of nano order are provided on the surface of the base material, so that the light extraction efficiency is improved by the diffraction effect and surface plasmon resonance. Will improve.
- FIG. 18 is a schematic plan view of an optical substrate according to the second embodiment of the present invention.
- the plurality of dots 61 are arranged at a constant pitch Py with a pitch Py in the direction D1 in the main surface of the substrate body, and the dot row 62-1.
- the dot rows 62-1 to 62-N are arranged side by side at a constant pitch Px in the D2 direction orthogonal to the D1 direction in the main surface of the base body. And it arrange
- the concavo-convex structure is a shift in the D1 direction between the first dot row 62-1 and the second dot row 62-2 adjacent in the D2 direction.
- the amount ⁇ 1 and the shift amount ⁇ 2 between the second dot row 62-2 and the third dot row 62-3 adjacent to the second dot row 62-2 are provided to be different from each other.
- the pitches P1 to P3 between the plurality of dots 61 in the oblique direction within the main surface of the base body become irregular and the periodicity of the repeated pattern is reduced, so that the light scattering property by the concavo-convex structure is further improved. Strengthen.
- the difference between the shift amount ⁇ 1 and the shift amount ⁇ 2 is not constant.
- the pitch Py and the pitch Px are both provided at a constant interval.
- the pitch Py is an indefinite interval
- the light extraction effect due to the diffraction effect or the surface plasmon resonance is reduced, but the arrangement period of the plurality of dots 61 is reduced. It is possible to further enhance the light scattering effect due to the disturbance of the property, and to suppress the increase in light extraction efficiency, color shift, and glare by eliminating the waveguide mode.
- the difference between the shift amount ⁇ 1 and the shift amount ⁇ 2 is not constant.
- the pitch Px and the pitch Py are preferably 100 nm or more and 1000 nm or less, respectively.
- the pitches Px and Py are within this range, when an organic EL light emitting device is provided on the optical substrate 1 (60) by providing nano-order irregularities on the surface of the optical substrate 1 (60).
- the light emission efficiency from the light emitting layer can be improved by the diffractive effect and the surface plasmon resonance.
- the pitches Px and Py are 100 nm or more, the light extraction efficiency of the organic EL light emitting device is improved, and the effect of improving the light emission efficiency by surface plasmon resonance appears.
- the pitches Px and Py are 1000 nm or less, the effect of light emission efficiency due to the diffraction effect and surface plasmon resonance appears.
- a fine structure layer including a line composed of a plurality of convex portions extending in the out-of-plane direction from the base material main surface of the base material that is, the fine structure layer 12 (12a).
- the fine structure is a line-and-space structure
- a line structure is formed along the first direction in the substrate main surface, and the second direction is orthogonal to the first direction in the substrate main surface.
- a plurality of lines have a plurality of line rows arranged at a pitch Px, and the pitch Px is an nano-order indefinite interval.
- the optical base 60 by providing the optical base 60 with a microstructure layer composed of nano-order irregularities (dots), 1) improvement of light extraction efficiency by surface plasmon resonance, 2) light extraction efficiency by diffraction effect
- the following four effects can be obtained: improvement of 3) improvement of light extraction efficiency by eliminating the waveguide mode by light scattering, and 4) suppression of color shift and glare by light scattering.
- the same effect will be produced.
- the behavior of light can be explained by an average refractive index distribution (effective medium approximation), so if the average refractive index distribution in space is calculated, it is as if long-period unit Lxz
- the plurality of dots act on light as if repeated as one unit. In this way, the plurality of dots arranged in the long-period unit Lxz exhibit a light scattering effect.
- the diameter of each dot increases or decreases according to the pitch. Since the average refractive index distribution of the space changes depending on the volume fraction of the structural unit, the change in the average refractive index distribution increases as the volume of each dot changes in a plurality of dots in the long period unit Lxz. Even in the same long period unit Lxz, the light scattering effect is further enhanced. This effect becomes more prominent by increasing the dot diameter when the dot pitch is narrow and decreasing the dot diameter when the dot pitch is wide.
- the height of the dots also increases or decreases according to the pitch between dots. Also in this case, for the same reason as described above, when the dot pitch is narrow, the dot height is increased, and when the dot pitch is wide, when the dot height is decreased, the average refractive index distribution in the long-period unit Lxz is increased. , Will increase the light scattering effect.
- both the diameter of each dot and the height of the dot are increased or decreased according to the pitch, which is described by effective medium approximation.
- the dot pitch is narrow, the dot diameter and the dot height are increased.
- the dot pitch is wide, the dot diameter and the dot height are reduced.
- the difference in unit volume fraction is increased, and the light scattering effect is further increased, which is preferable.
- FIG. 19 is a schematic cross-sectional view of an organic EL light emitting device 40 to which the optical substrate 1 (1a) according to the present embodiment is applied.
- the organic EL light emitting device 40 has at least one optical substrate 1 (1a), and the light emitting layer is on the microstructure layer 12 (12a) side of the optical substrate 1 (1a). It is arrange
- the organic EL light emitting device 40 includes a light emitting unit 42 and a transparent conductive film layer 43 (a TCO layer typified by an ITO layer) sequentially stacked on an optical substrate 41 (1, 1a) having a microstructure layer 12 (12a). ).
- a light diffusing substrate may be provided on the other main surface of the transparent conductive film layer 43 in contact with the light emitting portion 42.
- the light diffusing substrate diffuses the light emitted from the light emitting portion 42 and the light reflected from the optical substrate 41 (1, 1a), and can further reduce the color shift caused by the light diffraction. it can.
- the light emitting portion 42 is produced by sequentially laminating a cathode (metal electrode), an electron injection layer, an electron transport layer, a light emitting layer, a hole transport layer, a hole injection layer, and an anode (transparent conductive film layer). It is composed of three layers of a cathode, a light emitting layer, and an anode, and the light emitting layer is one or more organic layers.
- the surface of the optical substrate 41 (1, 1a) is a metal surface
- the optical substrate 41 (1, 1a) may be used as a cathode, and the cathode formation of the light emitting unit 42 may be omitted.
- the electron injection layer the electron transport layer, the light emitting layer, the hole transport layer, and the hole injection layer
- one layer may serve two or more functions, and the hole transport layer and the electron transport layer may be omitted.
- a light emitting layer is necessary as a place where holes and electrons meet.
- the simplest system need only have a light emitting layer sandwiched between an anode conductive layer and a cathode conductive layer.
- the optical substrate 41 (1, 1a) is a reflection type
- the optical substrate 41 (1, 1a) is a dielectric, a semiconductor, or a combination of these with a metal. Can be formed.
- the concavo-convex structure created on the optical base material 41 (1, 1a) generates diffracted light of the light emitted by EL, and creates a resonance state with the surface plasmon of the cathode.
- the light emitted from the organic EL light emitting device travels in the direction of the light extraction surface, and the light that travels to the metal surface of the cathode that cannot be extracted. However, the light is temporarily transferred to the surface plasmon energy due to the unevenness of the metal film on the cathode surface. After that, it is radiated from the cathode surface toward the extraction surface as high-intensity radiation light.
- the emitted light emitted from the cathode surface has high directivity, and the light extraction efficiency can be improved.
- a material with a high electron transport number and low loss (a material with a low work function) is suitable as the cathode material. Therefore, Ag, Au, or the like is selected, or generally selected Al, etc. Co-evaporation (Al / Ag or the like) may be used, but material selection is not necessarily limited to these.
- an anode transparent conductive film
- a hole injection layer a hole transport layer, a light emitting layer
- An electron transport layer, an electron injection layer, and a cathode are sequentially laminated to complete.
- the shape of the fine unevenness of the optical substrate 41 (1, 1a) is transmitted to the cathode, and the cathode creates a surface plasmon resonance state.
- the thickness of each layer needs to be as thin as possible.
- these layers of the organic EL light emitting device are usually formed with a thickness of about 20 to 100 nm, and there is no problem.
- FIG. 20 is a schematic cross-sectional view of another form of the organic EL light emitting device 80 to which the optical substrate 1 (1a) according to the present embodiment is applied.
- the organic EL light emitting device 80 includes a transparent conductive film layer 83 on an optical substrate 81 (1, 1 a) having a fine structure layer 12 (12 a) via a transparent dielectric layer 82.
- the light emitting portion 84 is stacked on the transparent conductive film layer 83.
- the light emitting part 84 is created by sequentially laminating an anode (transparent conductive film layer), a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, an electron injection layer, and a cathode (metal electrode). It is composed of three layers of an anode, a light emitting layer, and a cathode, and the light emitting layer is one or more organic layers. Since the transparent conductive film layer 83 is formed, the anode formation of the light emitting portion 84 may be omitted.
- one layer may serve two or more functions, or the hole transport layer and the electron transport layer may be omitted.
- a light emitting layer is necessary as a place where holes and electrons meet. The simplest system requires only a light emitting layer and a cathode.
- the method for producing the anode, hole injection layer, hole transport layer, light emitting layer, electron transport layer, electron injection layer, and cathode used in the present invention is not particularly limited, but a general bottom emission organic EL light emitting device will be described as an example. It becomes as follows. That is, the anode (transparent conductive film layer) and the cathode are formed by vacuum deposition or sputtering, and the hole injection layer, hole transport layer, light emitting layer, electron transfer layer, and electron injection layer are formed by organic deposition or thin film coating. .
- an anode transparent conductive film layer
- the material is a transparent conductive material (TCO) such as ITO (Indium Tin Oxide), ZnO (Zinc Oxide), or ZTO (Zinc Tin Oxide). ) Is selected.
- Aromatic amine compounds such as ⁇ -NPD and CuPc are most often used as hole transport materials because they have appropriate ionization potential and hole transport properties and are electrochemically reversible.
- a light emitting layer is laminated. Examples of the material used alone for the light emitting layer include fluorescent dye compounds such as BBA and DTE, but holes and electron transport compounds may be doped with the fluorescent dye compound. It is preferable to use a phosphorescent material instead of a fluorescent material because the theoretical conversion efficiency is improved from about 25% to about 100%.
- an electron transport layer is laminated.
- an oxadiol type PBD or the like
- a triazole type TEZ or the like
- Use of a metal complex (Alq3 or the like) substance is convenient because it can serve as both an electron transport layer and a light emitting layer.
- the material of the cathode conductive layer is generally a method in which a very small amount of LiF, Li-based compound or the like is applied, and then Al, Ag, an Al / Ag alloy, or the like is laminated.
- a light diffusion layer (not shown) may be provided between the transparent dielectric layer 82 and the transparent conductive film layer 83. In this case, the color shift can be further suppressed.
- a light reflection layer (not shown) may be provided on the main surface opposite to the main surface of the light emitting unit 84 in contact with the transparent conductive film layer 83. In this case, the light intensity reaching the optical substrate 81 (1, 1a) can be improved.
- the dielectric layer provided on the surface of the optical substrate according to the present embodiment will be described in more detail.
- the optical substrate 71 (1, 1a) according to the present embodiment had a shape corresponding to a dot shape or a line shape on the dot surface of the microstructure layer 12 (12a).
- a transparent conductive film layer 72 may be provided.
- the main surface 73 of the transparent dielectric layer 72 opposite to the microstructure layer 12 (12a) is flattened.
- the shape corresponding to the dot shape or line shape is the relationship between the transfer shape and the dot shape or line shape of the transparent dielectric layer 72 and the dot shape or line shape of the fine structure layer 12 (12a).
- the fine structure of the fine structure layer 12 (12 a) means that it is filled with the transparent dielectric layer 72.
- the degree of planarization can be appropriately selected according to the characteristics of the light emitting device used. For example, from the viewpoint of suppressing a short circuit, Ra ⁇ 10 nm is preferable, Ra ⁇ 5 nm is more preferable, Ra ⁇ 2 nm is further preferable, and Ra ⁇ 1 nm is most preferable. Ra can be measured with an atomic force microscope (AFM), and the range of AFM measurement when calculating Ra is 5 ⁇ m ⁇ 5 ⁇ m.
- AFM atomic force microscope
- FIG. 22 is a schematic cross-sectional view of another form of the organic EL light emitting device 50 to which the substrate for optics 1 (1a) according to the present embodiment is applied.
- the organic EL light emitting device 50 has a transparent conductive layer 53 laminated on a light emitting portion 54, and an optical substrate 51 (1) via a transparent dielectric layer 52 on the transparent conductive layer 53. 1a).
- a light diffusion layer (not shown) may be provided on the main surface opposite to the main surface in contact with the transparent conductive film layer 53 of the light emitting unit 54. In this case, the color shift can be further suppressed.
- a light reflecting layer (not shown) may be provided on the main surface opposite to the main surface in contact with the transparent conductive film layer 53 of the light emitting unit 54. In this case, the light intensity reaching the optical substrate 51 (1, 1a) can be improved.
- the base material in the optical base material 51 (1, 1a) may be left on the organic EL light emitting device 50, or on the transparent conductive film layer 53.
- the optical substrate 51 (1, 1a) may be attached to the substrate and then removed. Further, after the optical substrate 51 (1, 1a) is attached on the transparent conductive film layer 53, the substrate and the fine structure layer 12 (12a) may be removed.
- the substrate for optics 1 (1a) in the present invention is not particularly limited as long as the substrate has a periodic dot structure on the surface, and any material of resin, dielectric, semiconductor, and metal is used. be able to.
- the optical substrate 41 (1, 1a) of the present invention When the light emitted from the organic EL light emitting device is reflected by the optical substrate 41 (1, 1a) of the present invention and emitted from the light emitting device, as shown in FIG. 19, the optical substrate of the present invention.
- the surface of 41 (1, 1a) needs to be composed of at least a reflective material such as metal.
- a metal is used as the optical substrate 41 (1, 1a)
- an organic EL light emitting device is provided on the optical substrate 41 (1, 1a)
- a light extraction effect due to surface plasmon resonance is easily obtained. .
- the optical substrate 41 (1, 1a) is preferably formed by coating a metal film on the surface of the optical substrate having a dot structure made of a dielectric, for example.
- it can be obtained by a method of forming a flat metal film on the surface of a dielectric or the like and then patterning the metal film, but the manufacturing method is not particularly limited.
- the optical substrate 41 (1, 1a) is formed of a resin substrate
- the optical substrate 41 (1, 1a) is obtained by a method of coating a metal film on a resin substrate having a dot structure.
- the metal applied to the optical substrate 41 (1, 1a) is appropriately selected depending on the target wavelength.
- aluminum having a high frequency (plasma frequency) at which metal free electrons cannot follow due to vibration of electromagnetic waves is preferable, and a light emitting device in the visible blue to green, for example, 380 nm to 650 nm region.
- silver or aluminum which shows a high reflectivity in the entire visible wavelength range it is preferable to use silver or aluminum which shows a high reflectivity in the entire visible wavelength range, and it is particularly preferable to use silver having a small absolute ratio of the real part of the dielectric constant.
- red in the visible range for example, 580 nm to 780 nm, it is preferable to use silver or gold having high reflectance in the wavelength band.
- the optical substrate of the present invention. 1 (1a) needs to be made of a light-transmitting material.
- the base material 11 (11a) and the fine structure layer 12 (12a) may be made of the same material, or may be made of different materials. It is preferable that the substrate 11 (11a) and the fine structure layer (12a) are made of different materials because various properties required for each can be selected.
- any material of resin, dielectric, semiconductor, and metal can be used.
- an inorganic base material such as quartz, glass, metal, silicon, or ceramic, a resin base material, or the like can be used.
- the resin base material include polyvinyl alcohol resin, polyacrylonitrile resin, polymethyl methacrylate resin, polycarbonate resin, polystyrene resin, cycloolefin resin (COP), cross-linked polyethylene resin, polyvinyl chloride resin, and polyvinyl chloride copolymer.
- a thermoplastic resin can be used.
- the resin base material includes crystalline thermoplastics such as polyethylene terephthalate (PET) resin, polyethylene naphthalate resin, polyethylene resin, polypropylene resin, polybutylene terephthalate resin, aromatic polyester resin, polyacetal resin, polyamide resin, and polyimide resin. Resin can be used.
- UV curable resins such as acrylic, epoxy, and urethane, thermosetting resins, and the like can be used.
- the optical substrate 41 (51) a composite substrate in which an ultraviolet curable resin or a thermosetting resin and an inorganic substrate such as glass, a thermoplastic resin, a triacetate resin, or the like may be used.
- the fine structure layer 12 (12a) is a metal. It is preferable that it is reflective materials, such as.
- a metal is used as the microstructure layer 12 (12a)
- an organic EL light emitting device is provided on the optical substrate 1 (1a)
- materials other than metals, such as a dielectric material are used, the surface is coat
- the metal applied to the microstructure layer 12 (12a) is appropriately selected depending on the target wavelength.
- aluminum having a high frequency (plasma frequency) at which metal free electrons cannot follow due to vibration of electromagnetic waves is preferable, and a light emitting device in the visible blue to green, for example, 380 nm to 650 nm region.
- silver or aluminum which shows a high reflectivity in the entire visible wavelength range it is preferable to use silver or aluminum which shows a high reflectivity in the entire visible wavelength range, and it is particularly preferable to use silver having a small absolute ratio of the real part of the dielectric constant.
- the red in the visible range for example, 580 nm to 780 nm, it is preferable to use silver or gold having high reflectance in the wavelength band.
- the difference between the refractive index of the material constituting the fine structure layer 12 (12a) and the refractive index of the material constituting the substrate 11 (11a) is preferably 0.15 or less.
- the refractive index difference is within this range, the fine structure layer 12 (12a) and the base material 11 (11a) of the emitted light transmitted from the fine structure layer 12 (12a) side to the base material 11 (11a) side. Since the reflection at the interface is suppressed, the light extraction efficiency is improved.
- the refractive index difference is more preferably 0.1 or less.
- the refractive index of the material constituting the microstructure layer 12 (12a) and the refractive index of the material constituting the substrate 11 (11a) are substantially equal or equivalent.
- the fact that the refractive indexes are substantially equal includes the case where the reflection at the interface has a refractive index difference that does not cause a problem with respect to the light extraction efficiency.
- the refractive index of the substrate 11 (11a) is 1.45
- the microstructure layer 12 (12a at the interface) is realized.
- the difference in refractive index is about 0.08 to 0.09 or less.
- the range where the said refractive index is equivalent is the case where the refractive index of the material which comprises the fine structure layer 12 (12a) and the refractive index of the material which comprises the base material 11 (11a) are the same (refractive index difference is 0). Including the case.
- the fine structure layer 12 (12a) directly forms the fine structure layer 12 (12a) by processing the base material 11 (11a), the fine structure layer 12 (12a) and the base material 11 (11a) At the interface, their refractive indices are substantially equal.
- the refractive index of the material constituting the fine structure layer 12 (12a) is such that the fine structure layer 12 (12a) and the base material are formed.
- the material constituting the fine structure layer 12 (12a) is not particularly limited as long as it satisfies the above refractive index range.
- various known resin organic resins, organic-inorganic composite resins, inorganic precursors, inorganic condensates , Metal oxide fillers, metal oxide fine particles and the like, or a combination of these can be used.
- the material constituting the fine structure layer 12 (12a) is preferably optically transparent even after the heat treatment.
- the heat treatment temperature is preferably 150 ° C. or higher, and more preferably 200 ° C. or higher.
- the heating time is preferably 10 minutes or more.
- the heating atmosphere is preferably under a low oxygen environment (for example, a vacuum state, a nitrogen substitution state, etc.).
- a sol-gel material or an inorganic filler inorganic fine particles
- the refractive index can be easily adjusted in the above range, and when the optical substrate 1 according to the present embodiment is used as a light emitting device, It is preferable because deterioration of the fine structure layer 12 (12a) can be suppressed.
- the material constituting the microstructure layer 12 (12a) can include a sol-gel material or an inorganic filler (inorganic fine particles) as described above, but even if it is composed of only the sol-gel material, an organic resin (photopolymerizable resin, It may be composed of an organic-inorganic hybrid material such as a thermopolymerizable resin or a thermoplastic resin, or may be composed of only an organic resin. In particular, from the viewpoint of moldability and molding speed of the fine structure layer 12 (12a), it is preferable to include a photopolymerizable resin.
- Examples of the photopolymerizable group contained in the microstructure layer 12 (12a) include acryloyl group, methacryloyl group, acryloxy group, methacryloxy group, acrylic group, methacryl group, vinyl group, epoxy group, allyl group, oxetanyl group and the like. .
- the metal elements contained in the microstructure layer 12 (12a) include titanium (Ti), zirconium (Zr), chromium (Cr), zinc (Zn), tin (Sn), boron (B), indium (In ), Aluminum (Al), and silicon (Si).
- titanium (Ti), zirconium (Zr), and silicon (Si) are preferable.
- Examples of the resin contained in the microstructure layer 12 (12a) include both photopolymerizable and thermal polymerizable resins, or any one of them. Examples thereof include a photosensitive resin used as a hard coat material, a photopolymerizable resin and a thermopolymerizable resin used in nanoimprint lithography.
- the material forming the fine structure layer 12 (12a) preferably includes a sol-gel material.
- the inclusion of the sol-gel material is preferable because the heat resistance of the microstructure layer 12 (12a) is improved.
- the sol-gel material only a metal alkoxide having a single metal species may be used, or a metal alkoxide having a different metal species may be used in combination, but the metal species M1 (where M1 is Ti, Zr, Zn, It is preferable to contain at least two types of metal alkoxides, ie, a metal alkoxide having at least one metal element selected from the group consisting of Sn, Mg, and In and a metal alkoxide having the metal species Si.
- hybrids of these sol-gel materials and known photopolymerizable resins can also be used.
- the sol-gel material preferably contains at least two types of metal alkoxides having different metal types.
- metal species of two types of metal alkoxides with different metal species include Si and Ti, Si and Sn, Si and Zr, Si and Zn, Si and In, Si and Mg, Ti and Zr, and Ti. Zn, Ti, Mg, etc. are mentioned.
- the metal species of one metal alkoxide is Si
- the molar concentration (CSi) of the metal alkoxide having Si as the metal species and the metal species M1 other than Si are determined.
- CM1 / CSi to the metal alkoxide (CM1) is preferably 0.2 to 15. From the viewpoint of moldability of the microstructure layer 12, CM1 / CSi is preferably 0.5 to 15, and CM1 / CSi is more preferably 5 to 8.
- the microstructure layer 12 (12a) may be a hybrid including an inorganic segment and an organic segment.
- hybrids include a combination of inorganic fine particles (inorganic filler) and a resin that can be photopolymerized (or thermally polymerized), a resin that can be photopolymerized (or thermally polymerized) with an inorganic precursor, an organic polymer, and an inorganic segment. And the like, and a polymer that forms a hydrogen bond with inorganic fine particles (inorganic filler) (PVP, etc.).
- PVP polymer that forms a hydrogen bond with inorganic fine particles (inorganic filler)
- a metal alkoxide, a silane coupling material having a photopolymerizable group, a radical polymerization resin, and the like can be mixed.
- silicone may be added thereto.
- the sol-gel material part may be pre-condensed by precondensation.
- the mixing ratio of the metal alkoxide containing the silane coupling agent and the photopolymerizable resin is preferably in the range of 3: 7 to 7: 3. More preferably, it is in the range of 3.5: 6.5 to 6.5: 3.5.
- the resin used for the hybrid is not particularly limited as long as it can be photopolymerized, whether it is a radical polymerization system or a cationic polymerization system.
- the photopolymerizable radical polymerization resin constituting the microstructure layer 12 (12a) for example, a resin composition that is a mixture of (meth) acrylate and a photopolymerization initiator can be used.
- the (meth) acrylate is not particularly limited as long as the glass transition temperature after curing is 100 ° C. or higher, more preferably 120 ° C. or higher, but a monomer having an acryloyl group or a methacryloyl group, a monomer having a vinyl group, Monomers having an allyl group are preferred, and monomers having an acryloyl group or a methacryloyl group are more preferred.
- the glass transition temperature after hardening means here the glass transition temperature with respect to the hardened
- the glass transition temperatures of (meth) acrylates A, B, and C after curing are 60 ° C. and 100 ° C., respectively. Even in the case of 120 ° C., if the glass transition temperature after curing of the mixture ((meth) acrylate A + (meth) acrylate B + (meth) acrylate C) is 105 ° C., 105 ° C. is adopted as the glass transition temperature. Shall.
- the polymerizable monomer is preferably a polyfunctional monomer having a plurality of polymerizable groups, and the number of polymerizable groups is preferably an integer of 1 to 6 because of excellent polymerizability.
- the average number of polymerizable groups is preferably 2 to 5.
- the number of polymerizable groups may be 3 or more in order to increase the crosslinking point after the polymerization reaction and to obtain physical stability (strength, heat resistance, etc.) of the cured product. preferable.
- a monomer having 1 or 2 polymerizable groups it is preferably used in combination with monomers having different polymerizable numbers.
- the (meth) acrylate monomer include the following compounds.
- the monomer having an acryloyl group or a methacryloyl group include (meth) acrylic acid, aromatic (meth) acrylate [phenoxyethyl acrylate, benzyl acrylate, etc.], hydrocarbon (meth) acrylate [stearyl acrylate, lauryl acrylate, 2-ethylhexyl acrylate, allyl acrylate, 1,3-butanediol diacrylate, 1,4-butanediol diacrylate, 1,6-hexanediol diacrylate, trimethylolpropane triacrylate, pentaaerythritol triacrylate, dipentaerythritol Hexaacrylate, etc.], hydrocarbon-based (meth) acrylates containing etheric oxygen atoms [ethoxyethyl acrylate, methoxyethyl acrylate, gly
- Others include EO-modified glycerol tri (meth) acrylate, ECH-modified glycerol tri (meth) acrylate, PO-modified glycerol tri (meth) acrylate, pentaerythritol triacrylate, EO-modified phosphate triacrylate, trimethylolpropane tri (meth) Acrylate, caprolactone-modified trimethylolpropane tri (meth) acrylate, PO-modified trimethylolpropane tri (meth) acrylate, tris (acryloxyethyl) isocyanurate, EO-modified trimethylolpropane tri (meth) acrylate, dipentaerythritol hexa (meta) ) Acrylate, caprolactone-modified dipentaerythritol hexa (meth) acrylate, dipentaerythritol hydroxypenta (meth) acrylate
- Examples of the monomer having an allyl group include p-isopropenylphenol, and examples of the monomer having a vinyl group include styrene, ⁇ -methylstyrene, acrylonitrile, and vinylcarbazole.
- EO modification means ethylene oxide modification
- ECH modification means epichlorohydrin modification
- PO modification means propylene oxide modification.
- bisphenol A-based polyalkylene glycol dimethacrylate in which two moles of propylene oxide and six moles of ethylene oxide are added to both ends of bisphenol A, respectively
- Polyethylene glycol dimethacrylate (NK ester BPE-500, manufactured by Shin-Nakamura Chemical Co., Ltd.) and ethylene glycol dimethacrylate with an average of 2 moles of ethylene oxide added to both ends of bisphenol A respectively. Shin Nakamura Chemical Co., Ltd. NK ester BPE-200) can also be employed.
- urethane compound examples include diisocyanate compounds such as hexamethylene diisocyanate, tolylene diisocyanate, or 2,2,4-trimethylhexamethylene diisocyanate, and compounds having a hydroxyl group and a (meth) acryl group in one molecule (2- And urethane compounds obtained by reaction with hydroxypropyl acrylate, oligopropylene glycol monomethacrylate, etc.).
- diisocyanate compounds such as hexamethylene diisocyanate, tolylene diisocyanate, or 2,2,4-trimethylhexamethylene diisocyanate
- compounds having a hydroxyl group and a (meth) acryl group in one molecule 2- And urethane compounds obtained by reaction with hydroxypropyl acrylate, oligopropylene glycol monomethacrylate, etc.
- a binder resin may be included. Including a binder resin is preferable because adjustment of the refractive index and heat resistance are improved.
- the binder resin may be a reactive binder resin.
- the weight average molecular weight of the binder resin is preferably 5000 to 500,000 from the viewpoint of moldability. In order to further exhibit the above-described effect, it is more preferably from 5,000 to 100,000, and even more preferably from 5,000 to 60,000.
- the degree of dispersion is generally about 1 to 6, and preferably 1 to 4.
- the molecular weight was measured by Gel Permeation Chromatography (GPC) manufactured by JASCO Corporation (pump: Gulliver, PU-1580 type, column: Shodex (registered trademark) (KF-807, KF-) manufactured by Showa Denko KK 806M, KF-806M, KF-802.5) 4 in series, moving bed solvent: tetrahydrofuran, using a calibration curve with polystyrene standard sample) to determine the weight average molecular weight (polystyrene conversion).
- GPC Gel Permeation Chromatography
- the binder resin is not particularly limited.
- a resin obtained by copolymerizing one or more monomers from the following two types of monomers may be used as the binder resin. it can.
- Examples of the first monomer include alkyl (meth) acrylates such as methyl (meth) acrylate, ethyl (meth) acrylate, butyl (meth) acrylate, and 2-ethylhexyl (meth) acrylate, and 2-hydroxyethyl (meth) ) Acrylate, 2-hydroxypropyl (meth) acrylate, (meth) acrylonitrile, benzyl (meth) acrylate, methoxybenzyl (meth) acrylate, chlorobenzyl (meth) acrylate, furfuryl (meth) acrylate, tetrahydrofurfuryl (meth) acrylate , Aryl (meth) acrylates such as phenoxyethyl (meth) acrylate, phenyl (meth) acrylate, cresyl (meth) acrylate, naphthyl (meth) acrylate, vinylation having a phenyl group
- benzyl (meth) acrylate or a vinyl compound having a phenyl group for example, styrene
- 10% by mass to 95% by mass of benzyl (meth) acrylate or a vinyl compound having a phenyl group (for example, styrene) is copolymerized in one molecule of the binder resin. In particular, 20 mass% or more and 90 mass% or less are more preferable.
- the photopolymerization initiator is not particularly limited, but in the environment where the optical substrate 1 is used, it is preferable that there is substantially no absorption for the wavelength used.
- the photopolymerization initiator causes a radical reaction or an ionic reaction by light, and a photopolymerization initiator that causes a radical reaction is preferable.
- Examples of the photopolymerization initiator include the following photopolymerization initiators.
- acetophenone-based photopolymerization initiator As an acetophenone-based photopolymerization initiator, acetophenone, p-tert-butyltrichloroacetophenone, chloroacetophenone, 2,2-diethoxyacetophenone, hydroxyacetophenone, 2,2-dimethoxy-2′-phenylacetophenone, 2-aminoacetophenone, And dialkylaminoacetophenone.
- Benzoin-based photopolymerization initiators include benzyl, benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, 1-hydroxycyclohexyl phenyl ketone, 2-hydroxy-2-methyl-1-phenyl-2 -Methylpropan-1-one, 1- (4-isopropylphenyl) -2-hydroxy-2-methylpropan-1-one, benzyldimethyl ketal and the like.
- Benzophenone-based photopolymerization initiators include benzophenone, benzoylbenzoic acid, methyl benzoylbenzoate, methyl-o-benzoylbenzoate, 4-phenylbenzophenone, hydroxybenzophenone, hydroxypropylbenzophenone, acrylic benzophenone, 4,4′-bis ( Dimethylamino) benzophenone, perfluorobenzophenone and the like.
- thioxanthone photopolymerization initiator examples include thioxanthone, 2-chlorothioxanthone, 2-methylthioxanthone, diethylthioxanthone, dimethylthioxanthone and the like.
- anthraquinone-based photopolymerization initiator examples include 2-methylanthraquinone, 2-ethylanthraquinone, 2-tert-butylanthraquinone, 1-chloroanthraquinone, 2-amylanthraquinone and the like.
- ketal photopolymerization initiators examples include acetophenone dimethyl ketal and benzyl dimethyl ketal.
- photopolymerization initiators include ⁇ -acyl oxime ester, benzyl- (o-ethoxycarbonyl) - ⁇ -monooxime, acyl phosphine oxide, glyoxy ester, 3-ketocoumarin, 2-ethylanthraquinone, camphorquinone, tetra Methyl thiuram sulfide, azobisisobutyronitrile, benzoyl peroxide, dialkyl peroxide, tert-butyl peroxypivalate, etc.
- Photopolymerization initiators having fluorine atoms Known and commonly used photopolymerization initiators such as perfluorotert-butyl peroxide and perfluorobenzoyl peroxide can be used alone or in combination of two or more.
- Examples of commercially available initiators include “Irgacure (registered trademark)” manufactured by BASF Japan Ltd. (for example, Irgacure 651, 184, 500, 2959, 127, 754, 907, 369, 379, 379EG, 819, 1800, 784, O26E01, O26E02), “Darocur (registered trademark)” (for example, Darocur 1173, MBF, TPO, 4265) and the like.
- Irgacure (registered trademark) manufactured by BASF Japan Ltd.
- “Darocur (registered trademark)” for example, Darocur 1173, MBF, TPO, 4265
- the photopolymerizable cationic polymerization resin constituting the microstructure layer 12 means a composition containing at least a cationic curable monomer and a photoacid generator.
- the cation curable monomer in the cation curable resin composition is a compound from which a cured product can be obtained by performing a curing treatment such as UV irradiation or heating in the presence of a cationic polymerization initiator.
- Examples of the cationic curable monomer include epoxy compounds, oxetane compounds, and vinyl ether compounds, and examples of the epoxy compounds include alicyclic epoxy compounds and glycidyl ethers.
- the alicyclic epoxy compound has an improved polymerization initiation rate, and the oxetane compound has an effect of improving the polymerization rate. Therefore, the alicyclic epoxy compound is preferably used, and glycidyl ether reduces the viscosity of the cationic curable resin composition. It is preferable to use it because it is effective in coating properties. More preferably, the alicyclic epoxy compound and the oxetane compound are used in combination, and more preferably, the weight ratio of the alicyclic epoxy compound and the oxetane compound is used in a range of 99: 1 to 51:49. is there.
- cationic curable monomer examples include the following.
- examples of the alicyclic epoxy compound include 3 ′, 4′-epoxycyclohexanecarboxylic acid-3,4-epoxycyclohexylmethyl, 3 ′, 4′-epoxy-6′-methylcyclohexanecarboxylic acid-3,4-epoxy.
- -6'-cyclohexylmethyl vinylcyclohexene monooxide 1,2-epoxy-4-vinylcyclohexane, 2- (3,4-epoxycyclohexyl) ethyltrimethoxysilane.
- Examples of the glycidyl ether include bisphenol A glycidyl ether, bisphenol F glycidyl ether, hydrogenated bisphenol A glycidyl ether, hydrogenated bisphenol F glycidyl ether, 1,4-butanediol glycidyl ether, 1,6-hexanediol glycidyl ether, Examples include methylolpropane triglycidyl ether, glycidyl methacrylate, 3-glycidyloxypropyltrimethoxysilane, 3-glycidyloxypropylethyldiethoxysilane, and 3-glycidyloxypropyltriethoxysilane.
- oxetane compound examples include 3-ethyl-3- (phenoxymethyl) oxetane, di [1-ethyl (3-oxetanyl)] methyl ether, 3-ethyl-3allyloxymethyloxetane, 3-ethyl-3- ( 2-ethylhexyloxymethyl) oxetane, 3-ethyl-3- ⁇ [3- (triethoxysilyl) propoxy] methyl ⁇ oxetane, and the like.
- vinyl ether examples include 2-hydroxybutyl vinyl ether, diethylene glycol monovinyl ether, 2-hydroxybutyl vinyl ether, 4-hydroxybutyl vinyl ether, triethylene glycol divinyl ether, cyclohexane dimethanol divinyl ether, 1,4-butanediol divinyl ether, and the like. .
- the photoacid generator is not particularly limited as long as it generates photoacid by light irradiation.
- aromatic onium salts such as sulfonium salts and iodonium salts.
- the photoacid generator include sulfonium hexafluoroantimonate, benzyltriphenylphosphonium hexafluorophosphate, benzylpyridinium hexafluorophosphate, diphenyliodonium hexafluorophosphate, triphenylsulfonium hexafluorophosphate, benzoin tosylate, adekatopomer sp -170 (Adeka), Adekaoptomer sp-172 (ADEKA), WPAG-145 (Wako Pure Chemical Industries), WPAG-170 (Wako Pure Chemical Industries), WPAG-199 (Wako Pure) Yakuhin Kogyo Co., Ltd.), WPAG-281 (Wako Pure
- the surface of the optical substrate according to the present embodiment may include a transparent dielectric layer 72 as shown in FIG.
- the refractive index of the transparent dielectric layer 72 is preferably 1.7 or more and 2.4 or less.
- the optical substrate 71 (1, 1a) can be used to more effectively extract the emitted light that has become a waveguide mode inside the organic EL light emitting device and is confined inside the light emitting device.
- the refractive index of the material constituting the transparent dielectric layer 72 at the interface between the surface 73 of the transparent dielectric layer 72 opposite to the microstructure layer 12 (12a) and the layer laminated on the surface 73 It is preferable that the refractive index of the material composing the layer laminated on the surface 73 is substantially equal.
- the layer laminated on the surface 73 is a transparent conductive film because the function as a light emitting device is exhibited.
- the refractive index of the transparent dielectric layer 72 can be appropriately selected in the above range according to the characteristics of the light emitting device used.
- the material constituting the transparent dielectric layer 72 may include density fluctuation (phase separation).
- a density fluctuation of 50 nm to 800 nm is preferable because a scattering effect can be expressed inside the transparent dielectric layer 72.
- the density fluctuation can be achieved by phase separation of the material constituting the transparent dielectric layer 72, addition of fine particles or fillers in the material constituting the transparent dielectric layer 72, and the like. Further, when the fluctuation in density is measured as a refractive index, the refractive index decreases from the surface side (surface 73 side) opposite to the fine structure of the transparent dielectric layer 72 to the fine structure surface side.
- the density fluctuation is preferable because, in addition to the above-described effect, reflection of light at the interface between the transparent dielectric layer and the light emitting device formed on the transparent dielectric layer can be further suppressed.
- Examples of the density fluctuation include a fine particle (filler) concentration gradient of fine particles or filler.
- the material constituting the transparent dielectric layer 72 is not particularly limited as long as the refractive index range described above is satisfied, but various known resins (organic substances), inorganic precursors, inorganic condensates, metal oxide fillers, metal oxide fine particles Etc. can be used.
- a transparent dielectric layer 72 is composed of an inorganic precursor, an inorganic condensate, an inorganic precursor or an inorganic condensate and a metal filler, an organic-inorganic hybrid composed of an inorganic precursor or an inorganic condensate and an organic substance, or an inorganic precursor or an inorganic An organic-inorganic hybrid composed of a condensate, a metal filler, and an organic substance is preferable.
- the material constituting the transparent dielectric layer contains at least one metal element selected from the group consisting of In, Sn, Ti, Zr, Zn, and Mg, adjustment that satisfies the refractive index range is easy. Therefore, it is preferable.
- the material constituting the transparent dielectric layer 72 is preferably optically transparent even after the heat treatment.
- the heat treatment temperature is preferably 150 ° C. or higher, and more preferably 200 ° C. or higher.
- the heating time is preferably 10 minutes or more.
- the heating atmosphere is preferably under a low oxygen environment (for example, a vacuum state, a nitrogen substitution state, etc.).
- the organic substance contained in the organic-inorganic hybrid material is a thermopolymerizable resin, a thermoplastic resin, or a photopolymerizable photopolymerizable group and a photopolymerizable polymerizable group from the viewpoint of refractive index adjustment and environmental resistance. It is particularly preferred that both or one of them is included. Moreover, it is preferable to have a site
- the inorganic substance included in the material constituting the transparent dielectric layer 72 can include, for example, a sol-gel material.
- a sol-gel material By including the sol-gel material, the refractive index can be easily adjusted in the above range, and the optical substrate 71 (1, 1a) according to the present embodiment is used as an organic EL light emitting device. It is preferable because deterioration of the fine structure layer 12 (12a) can be suppressed.
- the material constituting the microstructure layer 12 (12a) can include a sol-gel material as described above. However, even if the material is composed only of the sol-gel material or the metal oxide fine particles (filler) are contained in the sol-gel material. Further, it may be composed of an organic-inorganic hybrid material of a sol-gel material and an organic resin.
- the sol-gel material not only a monomer (monomolecule) or a dimer but also a partially cured body (prepolymer) can be used.
- a sol-gel material in particular, a metal alkoxide partially condenses, whereby a prepolymer in which metal species are connected via an oxygen element can be obtained. That is, a prepolymer having a large molecular weight can be produced by partial condensation. Thereby, the number of unreacted functional groups is reduced and the density is increased. For this reason, the refractive index can be changed in a higher direction.
- the partial condensation reduces the number of unreacted functional groups and increases the viscosity, thereby reducing the number of functional groups that react with water vapor and the like, thereby improving stability. Furthermore, the flatness of the surface 73 of the transparent dielectric layer 72 opposite to the microstructure layer 12 (12a) is improved.
- the sol-gel material is a group of compounds that are cured by hydrolysis and polycondensation by the action of heat or a catalyst.
- metal alkoxide metal alcoholate
- silsesquioxane compound metal chelate compound
- halogenated metal halogenated silane
- liquid glass spin-on-glass
- silane coupling agent silane coupling agent
- the catalyst to be included is included. These may be used alone or in combination of a plurality of types according to the required physical properties.
- the sol-gel material may contain a siloxane material such as silicone, a reaction inhibitor, and the like.
- the sol-gel material as the material constituting the transparent dielectric layer 72 is a metal species M1 (where M1 is In, Sn, Ti, Zr, Zn) from the viewpoint of adjusting the refractive index high and the flatness of the surface 73.
- M1 is In, Sn, Ti, Zr, Zn
- steam of the material which comprises the transparent dielectric material layer 72 improves by including the metal alkoxide which has metal seed
- Two or more metal alkoxides having the metal species M1 may be used, or two or more metal alkoxides having the metal species Si may be used.
- a metal alkoxide having the metal species M2 (where M2 ⁇ M1, and M2 ⁇ Si) may be used.
- a metal alkoxide having a metal species M3 (where M3 ⁇ M2, M3 ⁇ M1, and M3 ⁇ Si) may be used.
- Examples of combinations of metal species of two types of metal alkoxides with different metal species include Si and Ti, Si and Zr, Si and Zn, Si and Sn, Si and In, Si and Mg, Ti and Zr, and Ti. Zn, Ti and Mg, In and Sn, Zn and Mg, Zn and Zr, Zn and Sn, etc. are mentioned.
- the metal species of one metal alkoxide is Si
- the molar concentration (CSi) of the metal alkoxide having Si as the metal species and the metal species M1 other than Si are determined.
- the ratio CM1 / CSi to the metal alkoxide (CM1) is preferably 0.2 to 15.
- CM1 / CSi is preferably 0.5 to 15, and CM1 / CSi is more preferably 5 to 8.
- three types of metal alkoxides with different metal types include combinations of metal types such as Si and Ti and Zn, Si and Ti and Mg, Si and Ti and Zr, Si and Ti and In, Si and Ti and Sn, Si and Zr and Zn, Si and Zr and In, Si and Zr and Mg, Si and In and Sn, Si and Zn and Sn, Ti and Zn and Zr, Ti and Zn and Mg, Zn and Mg and Zr, etc. It is done.
- the interatomic distance can be changed. Can be changed. Since the ratio between CM1 and CSi can be selected within a range that satisfies 0.2 ⁇ CM1 / CSi ⁇ 25, the refractive index can be flexibly changed.
- the molar concentration (CSi) of the metal alkoxide having the metal species Si means the total concentration of the metal alkoxide having the metal species Si contained in the material constituting the transparent dielectric layer 71.
- the molar concentration (CM1) of the metal alkoxide having the metal species M1 is the mole of all metal alkoxides having the metal species other than the metal alkoxide having the metal species Si included in the material constituting the transparent dielectric layer 72.
- Mean total concentration for example, when metal alkoxides having metal species Ti, metal species Zr, and metal species Mg are present in molar concentrations of CTi, CZr, and CMg, CM1 becomes CTi + CZr + CMg.
- the metal species M1 is preferably at least one selected from the group consisting of In, Sn, Ti, Zr, Zn, and Mg from the viewpoint of refractive index variability. What kind of metal alkoxide is used may be selected from the viewpoints of handling and layer structure of the light emitting element.
- the material constituting the transparent dielectric layer may include a binder polymer, a reactive diluent, and a polymerization initiator.
- a binder polymer the binder resin described as one material which comprises the fine structure layer 12 (12a) can be used.
- the reactive diluent it is possible to use a photopolymerizable radical polymerization resin, a photopolymerizable cationic polymerization resin, or a mixture thereof described as one material constituting the microstructure layer 12 (12a). it can.
- the polymerization initiator the photopolymerization initiator or photoacid generator described as one material constituting the fine structure layer 12 (12a) can be used.
- the substrate for optics 1 (1a) Since the substrate for optics 1 (1a) according to the present embodiment has a nano-scale size of the fine concavo-convex structure, it is transparent when producing an organic EL light emitting device using the substrate for optics 1 (1a). It is possible to easily flatten the interface between the dielectric layer 72 and the transparent conductive film layer.
- the optical substrate 1 (1a) of the present invention is opposite to the interface position between the substrate 11 (11a) and the microstructure layer 12 (12a) or the microstructure layer 12 (12a) of the substrate 11 (11a).
- a barrier layer may be provided on the side surface. Providing the barrier layer is preferable because the reliability of the organic EL light emitting device is improved when the optical substrate 1 (1a) of the present invention is applied to the organic EL light emitting device.
- the barrier layer can be formed of, for example, an inorganic oxide such as silicon oxide or silicon nitride, an inorganic nitride, diamond-like carbon (DLC), or the like.
- the gas barrier layer is more preferably a multilayer.
- the thickness of the gas barrier layer is 5 nm or more, more preferably 10 nm or more, and even more preferably 50 nm or more.
- the thickness of the gas barrier layer is preferably 10 ⁇ m or less, more preferably 1 ⁇ m or less.
- a light diffusing substrate In the organic EL light emitting device using the optical substrate 1 (1a) according to the present embodiment, a light diffusing substrate may be disposed.
- the light diffusing substrate can be formed of a sheet (plate body) having a light diffusing function or a film having a light diffusing function.
- a light diffusing material dispersed in a sheet or film As the light diffusing substrate, a light diffusing material dispersed in a sheet or film, a light diffusing structure formed on the sheet or film surface, a diffusing material and a light diffusing property What combined the structure which has can be used. Of these, application may be made in consideration of the directivity of the wavelength applied in the light emitting device.
- a light diffusing substrate in which a light diffusing material is dispersed in a sheet or film Olphas made by Ewa Co., Ltd. can be applied.
- a light diffusing substrate having a light diffusing structure formed on a sheet or film surface LIGHT SHAPPING DIFFUSER manufactured by Luminit is applicable.
- the sheet or film constituting the light diffusing substrate glass, resin, or the like can be used, but it is preferable to use a resin because of good workability and light weight.
- a low refractive index material such as air or a high refractive index material such as titanium oxide can be used.
- the light extraction efficiency is increased by reducing the interface reflection of the light diffusing substrate, it is preferable to attach a sheet or film having a light diffusing ability using an adhesive or an adhesive. Also, from the viewpoint of gas barrier properties, it is preferable that an air layer is not provided by sticking a sheet or film having light diffusing ability using an adhesive or an adhesive.
- the manufacturing method shown below is an example, and the manufacturing method of the optical substrate 1 (1a) is not limited thereto.
- the optical substrate 1 (1a) according to the present embodiment can be prepared by nanoimprint, EB drawing, photolithography, interference exposure, or the like.
- FIG. 23 is an explanatory view showing an example of a method for producing an optical substrate.
- the exposure apparatus 400 holds a roll-shaped member 401 coated with a resist layer by a roll holding unit (not shown), and includes a rotation control unit 402, a processing head unit 403, and a moving mechanism unit 404. And an exposure control unit 405.
- the rotation control unit 402 rotates the roll member 401 around the center of the roll member 401.
- the processing head unit 403 irradiates a laser beam to expose the resist layer of the roll-shaped member 401.
- the moving mechanism unit 404 moves the processing head unit 403 at a control speed along the long axis direction of the roll-shaped member 401.
- the exposure control unit 405 controls a pulse signal for laser exposure by the processing head unit 403 based on a reference signal synchronized with the rotation of the roll-shaped member 401 by the rotation control unit 402.
- the processing of the roll-shaped member 401 by the exposure apparatus 400 is performed by irradiating a pulse laser from the processing head unit 403 while the roll-shaped member 401 is rotated.
- the processing head unit 403 is moved along the long axis direction of the roll-shaped member 401 by the moving mechanism unit 404 while irradiating the pulse laser.
- the pattern 406 is recorded at an arbitrary pitch on the resist layer on the outer peripheral surface of the roll-shaped member 401 in the rotation direction. This is the pitch Py in the D1 direction in the roll-to-roll nanoimprint mold.
- the processing head portion 403 is displaced in the long-axis direction.
- the pitches Py and Px of the pattern 406 are very small on the order of nanometers, so that the shift in the D1 direction is observed in the major axis direction while maintaining the pitch Py in the D1 direction. It is possible to form a columnar pattern whose amount is shifted.
- the pitches Py and Px of the pattern 406 are very small compared to the circumferential length of the roll-shaped member 401, the D1 direction and the D2 direction are substantially orthogonal to each other.
- the roll-shaped member 401 is a member formed in a cylindrical shape and provided with a rotation shaft, and as a material, a metal, a carbon core, glass, quartz, or the like can be applied. Since the roll-shaped member 401 requires processing accuracy capable of high rotation, the material is preferably a metal, a carbon core, or the like. Furthermore, only the cylindrical surface portion to be laser-exposed can be coated with a different material. In particular, when using a heat-reactive resist, it is preferable to apply a material having a lower thermal conductivity than metal in order to enhance the heat insulation effect, and examples thereof include glass, quartz, oxide, and nitride. It is also possible to use the layer covering the cylindrical surface as an etching layer for etching using a resist layer described later as a mask.
- the resist that covers the roll-shaped member 401 is not particularly limited as long as it is exposed by laser light, and a photo-curing resist, a light amplification resist, a thermal reaction resist, or the like can be applied.
- a heat-reactive resist is preferable because a pattern can be formed at a wavelength smaller than the wavelength of laser light.
- the heat-reactive resist is preferably an organic resist or an inorganic resist.
- the resist layer formed of these resists may have a single layer structure or a multilayer structure in which a plurality of resist layers are combined.
- the type of resist to be selected can be changed as appropriate depending on the process, required processing accuracy, and the like.
- an organic resist can be applied with a roll coater or the like when forming a resist layer that covers the roll-shaped member 401, thereby simplifying the process.
- it since it is applied on the sleeve, there is a limit to the viscosity of the resist, and it is difficult to apply coating thickness accuracy and control, or to coat multiple layers.
- the inorganic resist is preferably provided with a resist layer covering the roll-like member 401 by a vapor phase method such as a resistance heating vapor deposition method, an electron beam sputtering method, or a CVD method. Since these methods are basically vacuum processes, it takes a lot of man-hours to form them on the sleeve, but the film thickness can be controlled with high accuracy and can be easily laminated in multiple layers.
- a vapor phase method such as a resistance heating vapor deposition method, an electron beam sputtering method, or a CVD method. Since these methods are basically vacuum processes, it takes a lot of man-hours to form them on the sleeve, but the film thickness can be controlled with high accuracy and can be easily laminated in multiple layers.
- the inorganic resist material can be variously selected depending on the reaction temperature.
- examples of the inorganic resist material include Al, Si, P, Ni, Cu, Zn, Ga, Ge, As, Se, In, Sn, Sb, Te, Pb, Bi, Ag, Au, and alloys thereof.
- Inorganic resist materials include Mg, Al, Si, Ca, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Sr, Y, Zr, Nb, and Mo.
- pre-heating for processing the resist at a temperature lower than that at the time of pattern formation may be performed before exposure for forming the following pattern.
- the pattern resolution at the time of pattern formation can be improved.
- the details of the mechanism by which the pattern resolution is improved by preheating are unknown, but if the change in the material that forms the resist layer due to the thermal energy of the heat-reactive resist material is based on multiple reactions, the preheating causes a reaction other than the reaction during pattern formation. It is presumed that the pattern formation reaction is simplified and the pattern resolution is improved by terminating in advance.
- the method of preheating the resist covering the roll-shaped member 401 is not particularly limited, and the roll surface is heated at a lower output than the method of heating the entire roll-shaped member or patterning the roll-shaped member 401 with a laser. Examples include a method of scanning the whole and irradiating the resist with thermal energy.
- the diameter of each dot forming the pattern is This is preferable because the pitch Py and / or the pitch Px increases or decreases correspondingly.
- the clear mechanism by which the dot diameter increases or decreases corresponding to the pitch is unknown, but is estimated as follows.
- the material forming the resist layer is changed by the thermal energy of the laser irradiated to the irradiated portion, and the pattern is formed by changing the etching characteristics.
- the irradiated heat is not completely used for the change of the resist layer, but a part of the heat is stored and transferred to an adjacent region. Therefore, the heat energy in the adjacent region is added with the heat transfer energy from the adjacent region in addition to the irradiation energy.
- the contribution of this heat transfer energy cannot be ignored, and the contribution of heat transfer is inversely proportional to the distance between dots forming the pattern, so the resulting pattern diameter is the distance between adjacent dots. Affected by.
- the inter-dot distance changes due to phase modulation, the above-mentioned contribution of heat transfer energy differs from dot to dot. If the inter-dot distance is wide, the contribution of heat transfer energy becomes small and the dot diameter becomes small. Thus, if the distance between dots is narrow, the contribution of heat transfer energy increases, and the dot diameter increases.
- the processing depth of the pattern is controlled, as described above, based on the reference signal synchronized with the rotation.
- the height of each dot forming a pattern is preferably increased or decreased in accordance with the pitch Py and / or the pitch Px.
- the etching depth increases or decreases depending on the dot diameter.
- the etching depth increases, and when the dot diameter decreases, the etching depth tends to decrease.
- the etching technique is remarkable in dry etching. This is presumably because the etchant is not exchanged or the etching product is not quickly removed.
- the dot diameter decreases when the inter-dot distance is wide, and the dot diameter increases when the inter-dot distance is narrow. Since the etching depth tends to increase or decrease depending on the dot diameter, as a result, when the inter-dot distance is large, the dot depth becomes shallow, and when the inter-dot distance is narrow, the dot depth becomes deep.
- the resist layer covering the roll-shaped member 401 may be used as it is as a roll-to-roll nanoimprint mold, and the surface base material of the roll-shaped member 401 is etched using the resist layer as a mask. A pattern may be formed.
- the processing depth of the pattern can be freely controlled, and the thickness of the heat-reactive resist layer can be selected to an optimum thickness for processing. That is, the processing depth can be freely controlled by controlling the thickness of the etching layer. Further, since the processing depth can be controlled by the etching layer, the heat-reactive resist layer may be selected to have a thickness that can be easily exposed and developed.
- the laser used for the processing head unit 403 that performs exposure preferably has a wavelength of 150 nm to 550 nm. Moreover, it is preferable to use a semiconductor laser from the viewpoint of miniaturization of wavelength and availability.
- the wavelength of the semiconductor laser is preferably 150 nm or more and 550 nm or less. This is because when the wavelength is shorter than 150 nm, the output of the laser becomes small and it is difficult to expose the resist layer covering the roll-shaped member 401. On the other hand, when the wavelength is longer than 550 nm, the laser spot diameter cannot be made 500 nm or less, and it is difficult to form a small exposed portion.
- gas lasers of XeF, XeCl, KrF, ArF, and F2 are preferable because the wavelengths are as short as 351 nm, 308 nm, 248 nm, 193 nm, and 157 nm and can be condensed into a very small spot size.
- a second harmonic, a third harmonic, and a fourth harmonic of an Nd: YAG laser can be used as a laser used for the processing head unit 403.
- the wavelengths of the second harmonic, third harmonic, and fourth harmonic of the Nd: YAG laser are 532 nm, 355 nm, and 266 nm, respectively, and a small spot size can be obtained.
- the rotational position accuracy of the roll-shaped member 401 is very high, and the optical of the laser is set so that the surface of the member is first within the depth of focus. Manufacture is easy if the system is adjusted. However, it is very difficult to maintain roll dimensional accuracy and rotational accuracy that are suitable for nanoimprinting. Therefore, it is preferable that the laser used for exposure is focused by the objective lens and the surface of the roll-shaped member 401 is autofocused so that it is constantly present in the depth of focus.
- Rotation control unit 402 is not particularly limited as long as it is a device having a function of rotating roll-shaped member 401 about the center of the roll, and a spindle motor or the like is suitable, for example.
- the moving mechanism unit 404 that moves the processing head unit 403 in the major axis direction of the roll-shaped member 401 is not particularly limited as long as the processing head unit 403 can be moved at a controlled speed, and a linear servo motor or the like is preferable. Can be mentioned.
- the exposure pattern formed on the surface of the roll-shaped member 401 is phase-modulated based on a reference signal synchronized with the rotation of the rotation control unit 402 (for example, the rotation of the spindle motor).
- the position of the exposure unit is controlled by the exposure control unit 405 based on the pulse signal.
- the reference signal an output pulse from an encoder synchronized with the rotation of the spindle motor can be used.
- the pulse signal phase-modulated based on the reference signal synchronized with the rotation can be controlled as follows, for example.
- a pulse signal with a frequency of m times (an integer of m> 2) is a reference pulse signal with a Z-phase signal as a reference, and a pulse signal with a frequency of n times (an integer of m / n> k and k> 1). It becomes a modulated pulse signal. Since both the reference pulse signal and the modulation pulse signal are integer multiples of the frequency of the Z-phase signal, an integer pulse signal exists within the time that the roll-shaped member 401 makes one rotation around the central axis.
- a phase modulation pulse signal is obtained.
- the reference pulse frequency fY0 Asin ( ⁇ 0t + ⁇ 0)
- the modulation frequency fYL is expressed by the following equation (9)
- the frequency-modulated modulated pulse signal fY is expressed by the following equation (10).
- fY0 Asin ( ⁇ 0t + ⁇ 0)
- fYL Bsin ( ⁇ 1t + ⁇ 1)
- fY Asin ( ⁇ 0t + ⁇ 0 + Csin ( ⁇ 1t)) (10)
- the phase modulation pulse signal fY ′ can also be obtained by adding a sine wave obtained from the modulation pulse signal to the reference pulse frequency fY0.
- fY ′ fY0 + C′sin (t ⁇ fYL / fY0 ⁇ 2 ⁇ ) (11)
- the wavelength LY of the phase modulation pulse signal can be obtained by adding a sine wave obtained from the wavelength LYL of the modulation pulse signal to the pulse wavelength LY0 of the reference pulse.
- the obtained phase modulation pulse signal is a signal in which the pulse interval of the reference pulse signal is periodically increased or decreased according to the signal interval of the modulation pulse signal.
- the pulse signal of the laser exposure by the processing head unit 403 is controlled using the reference pulse signal having a constant frequency, not the phase-modulated pulse signal, and the processing head unit 403 of the moving mechanism unit 404 is controlled. It is good also as a structure which increases / decreases a moving speed periodically. In this case, for example, as shown in FIG. 26, the moving speed of the machining head unit 403 is periodically increased or decreased.
- the movement speed illustrated in FIG. 26 is an example of the movement speed of the reference movement speed ⁇ ⁇ . This moving speed is preferably synchronized with the rotation of the roll-shaped member 401. For example, the moving speed is controlled so that the speed in the Z-phase signal becomes the speed shown in FIG.
- the pattern 406 is controlled by periodic phase modulation, but the pattern 406 can also be formed by random phase modulation instead of periodic.
- the pitch Py is inversely proportional to the pulse frequency. Therefore, when random frequency modulation is performed on the pulse frequency so that the maximum phase shift becomes 1/10, the pitch Py is 1/10 of the pitch Py.
- a pattern having the maximum fluctuation range ⁇ 1 and the pitch Py increasing or decreasing randomly can be obtained.
- the modulation pulse signal may be controlled by a reference signal having a frequency of a plurality of times such as per roll, or only by the initial reference signal set at the initial stage of exposure. May be.
- the control is performed only with the initial reference signal, when the rotation number of the rotation control unit 402 is modulated, the exposure pulse signal is phase-modulated. This is because nano-order rotation control is performed, and even a slight potential fluctuation of the rotation control unit 402 causes nano-order pitch fluctuation and is integrated.
- a pattern pitch of 500 nm pitch if the roll outer peripheral length is 250 mm, the laser exposure is 500,000 times, and even if the deviation is 1 nm every 10,000 times, the deviation is 50 nm.
- the fine structure having the arrangement shown in FIGS. 9 and 11 can be created by adjusting the control frequency of the reference signal.
- the control frequency of the reference signal is lowered, and when the fine structure having the arrangement shown in FIG. 11 is formed, the control frequency of the reference signal is increased. Therefore, in the arrangement shown in FIG. 11, the phase (position) of the corresponding dot in the second direction is aligned, and in the arrangement shown in FIG. 9, the phase (position) of the corresponding dot in the second direction is shifted. Arise.
- the arrangement relationship shown in FIGS. 10 and 12 is the same.
- the shift amount ⁇ 2 between the adjacent third dot rows 62-3 is provided to be different from each other, and the difference between the shift amount ⁇ 1 and the shift amount ⁇ 2 is not constant.
- the pitch P1) to pitch P3 between the plurality of dots 61 in the oblique direction within the main surface of the substrate body become irregular and the periodicity of the repeated pattern is reduced, so that the light scattering property by the concavo-convex structure is reduced. Become stronger.
- the exposure apparatus 400 develops the roll-shaped member 401 on which the resist layer provided on the surface is exposed, and etches the etching layer by dry etching using the developed resist layer as a mask. When the residual resist layer is removed after etching, a roll-to-roll nanoimprint mold can be obtained.
- the pattern 406 obtained as described above is transferred to a predetermined substrate, and the method for obtaining the optical substrate according to the present embodiment is not particularly limited.
- the pattern 406 is obtained by a nanoimprint lithography method.
- the pattern 406 can be transferred to the substrate by transferring the pattern to the substrate surface and etching the substrate by dry etching using the transfer pattern portion as a mask.
- the roll-shaped member 401 on which the pattern 406 is formed is used as a cylindrical mold (roll-to-roll nanoimprint mold).
- a resist layer made of an organic material By forming a resist layer made of an organic material on the surface side of the substrate, pressing a cylindrical mold against the resist layer, transferring the pattern 406 to the resist layer, and then etching the resist layer and the substrate from the surface side.
- a fine concavo-convex structure can be formed on the surface side of the substrate to provide the optical substrate of the present invention.
- the pattern 406 is once transferred to a film to form a resin mold, and then a nanoimprint lithography method using this resin mold.
- the method of forming a pattern on a base material and obtaining the base material for optics which concerns on this Embodiment is also mentioned. According to this method, the utilization efficiency of the mold can be increased and the flatness of the substrate can be absorbed. Therefore, as a method for transferring the pattern to the substrate, a nanoimprint lithography method using a resin mold is more preferable.
- the method for transferring the pattern 406 from the cylindrical mold to the resin mold is not particularly limited, and for example, a direct nanoimprint method can be applied.
- a direct nanoimprint method thermal nanoimprint is performed by filling the pattern 406 of the cylindrical mold with a thermosetting resin while heating at a predetermined temperature, releasing the cured thermosetting resin after cooling the cylindrical mold, and transferring it.
- the photocurable resin filled in the cylindrical mold pattern 406 is irradiated with light of a predetermined wavelength to cure the photocurable resin, and then the cured photocurable resin is released from the cylindrical mold. And photo-nanoimprinting method for transfer.
- cylindrical mold (roll-shaped member 401) is a seamless cylindrical mold, it is particularly suitable for continuously transferring a resin mold by roll-to-roll nanoimprint.
- a method of forming an electroformed mold by electroforming from a resin mold to which the pattern 406 is transferred and forming a pattern by the nanoimprint lithography method using the electroformed mold is also exemplified.
- an electroformed mold it is preferable in terms of extending the life of the cylindrical mold that is the original mold. Even in the method of forming the electroformed mold once, the flatness of the base material can be absorbed, so a resin mold is further formed. Is preferred.
- the resin mold method is preferable because repeated transfer is easy.
- “repeated transfer” means (1) producing a plurality of transferred concavo-convex pattern transfer products from a resin mold (+) having a concavo-convex pattern shape, or (2) a curable resin composition in particular.
- a transfer agent When used as a transfer agent, obtain a reversed transfer body (-) from the resin mold (+), and then obtain a reverse transfer body (+) using the transfer body (-) as the resin mold (-). , Unevenness / unevenness / unevenness / unevenness /..., Repeatedly or reverse pattern transfer, or both.
- the substrate for optics 1 (1a) according to the present embodiment can be obtained by transferring the pattern 406 obtained as described above to the substrate.
- the transfer method is not particularly limited.
- a pattern is transferred to the substrate surface by a nanoimprint lithography method using a resin, and the substrate is etched by dry etching using the transfer pattern portion as a mask to provide a pattern 406.
- Examples thereof include a method for obtaining the optical substrate 1 (1a) and a method for transferring the inverted structure of the pattern 406 to the substrate surface by a nanoimprint method.
- a flat plate mold is produced from the cylindrical mold by any one of the methods described above. Subsequently, the flat plate-shaped optical substrate 1 (1a) can be obtained by using the flat plate mold as a mold and transferring the pattern 406 to the raw material of the fine structure layer 12 (12a).
- a flat optical substrate 1 (1a) can be obtained by the following steps (11) to (14).
- a photocurable resin is disposed on the pattern 406 of the flat plate mold by a method such as casting, spin coating, or inkjet.
- a photocurable resin is placed on an inorganic base material such as a glass plate or a glass film, or a transparent heat resistant resin (transparent polyimide or the like) by a method such as casting, spin coating, or ink jet.
- the photocurable resin is sandwiched between the substrate and the flat mold.
- Light is irradiated from at least one of the flat mold side or the base material to cure the photocurable resin.
- the substrate and the flat mold are peeled off.
- the base material used in the step (12) is an easy-adhesion coating (for chemical bonding with the photocurable resin or physical bonding such as penetration) in order to improve the adhesion with the photocurable resin.
- Silane coupling treatment, etc. primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation treatment, surface roughening treatment, porous treatment, etc. may be performed.
- the light irradiation in the step (13) may be performed in a low oxygen environment.
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- a flat optical substrate 1 (1a) can be obtained by the following steps (21) to (24).
- thermosetting resin is disposed on the flat mold pattern 406 by a method such as casting, spin coating, or ink jet.
- (22) Level the thermosetting resin uniformly.
- (23) The solvent is removed in a heating environment and the thermosetting resin is cured.
- the thermosetting resin and the flat plate mold are peeled off.
- the obtained optical substrate 1 (1a) may be bonded onto another substrate.
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- a flat optical substrate 1 (1a) can be obtained by the following steps (31) to (34).
- thermoplastic resin is sandwiched between the flat plate mold and the pressing plate.
- Pressure is applied at a temperature equal to or higher than Tg of the thermoplastic resin.
- Cool to a temperature lower than Tg.
- the thermoplastic resin and the flat plate mold are peeled off.
- the step (31) it is preferable to perform a mold release treatment on the surface 406 of the flat plate mold. Further, at the time of the step (31), at least one of the flat plate mold and the pressing plate may be heated. Moreover, the heating of a process (32) should just heat from at least one of a flat mold or a press plate, and it is preferable to heat at least a flat mold side.
- the obtained optical substrate 1 (1a) may be bonded onto another substrate.
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- a flat optical substrate 1 (1a) can be obtained by the following steps (41) to (45).
- An inorganic precursor is disposed on the flat mold pattern 406 by a method such as casting, spin coating, or ink jet.
- an inorganic precursor is placed on a base material made of PDMS or resin by a method such as casting, spin coating, or ink jet.
- (42) Promote condensation of the inorganic precursor.
- (43) The inorganic precursor is sandwiched between the base material and the flat plate mold.
- (44) The condensation is further promoted to cure the inorganic precursor.
- the substrate and the flat mold are peeled off.
- the flat optical substrate 1 (1a) can be obtained.
- the base material used in the step (41) is an easy-adhesion coating (silane cup) for chemical bonding with the inorganic precursor and physical bonding such as penetration in order to improve adhesion to the inorganic precursor. Ring treatment, etc.), primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation treatment, surface roughening treatment, porosification treatment, and the like.
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- ⁇ Method (2)> A flat plate mold is produced from the cylindrical mold. Subsequently, the flat mold is used as a mold, the pattern 406 is transferred to a photocurable resin, a thermosetting resin, an inorganic precursor, or a thermoplastic resin, a remaining film treatment is performed, and the resulting pattern is used as a mask. By processing the base material, a flat optical base material 1 (1a) can be obtained.
- the plate-shaped optical substrate 1 (1a) can be obtained by the following steps (51) to (56).
- a photocurable resin is disposed on the pattern 406 of the flat mold by a method such as casting, spin coating, or ink jet.
- a photocurable resin is placed on an inorganic base material such as a glass plate or a glass film, or a transparent heat resistant resin (transparent polyimide or the like) by a method such as casting, spin coating, or ink jet.
- the photocurable resin is sandwiched and pressed between the substrate and the flat mold.
- Light is irradiated from at least one of the flat mold side or the base material to cure the photocurable resin.
- the substrate and the flat mold are peeled off.
- the remaining film of the pattern transferred and formed on the substrate is removed.
- the substrate is etched using the obtained pattern as a mask.
- the base material used in the step (52) is an easy-adhesion coating (for chemical bonding with the photocurable resin or physical bonding such as penetration) in order to improve the adhesion with the photocurable resin.
- Silane coupling treatment, etc. primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation treatment, surface roughening treatment, porous treatment, etc. may be performed.
- the light irradiation in the step (53) may be performed in a low oxygen environment.
- the remaining film process of a process (55) may be performed by dry etching or wet etching, it is preferable in dry etching from a viewpoint of suppressing an undercut.
- an etching step for removing the photocurable resin residue may be added after the step (56).
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- thermosetting resin or an inorganic precursor can be used as a transfer material to obtain a post-diffraction base material according to the present embodiment.
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- a flat plate mold is produced from the cylindrical mold. Subsequently, a mold (G1) having a structure in which a flat mold is used as a mold, the pattern 406 is transferred to a photo-curing resin, a thermosetting resin, an inorganic precursor, or a thermoplastic resin, and the pattern 406 is inverted. Get. Using the obtained mold (G1) as a template, the pattern is transferred again to the raw material of the fine structure layer 12 (12a), or electroplating represented by Ni is used to form the flat optical substrate 1 (1a). Obtainable.
- the optical substrate 1 (1a) obtained by the method (1) can be used as the mold (G1).
- a flat optical substrate 1 (1a) can be obtained by the following steps (61) to (64).
- a photocurable resin is disposed on the pattern (406) of the mold (G1) by a method such as casting, spin coating, or ink jet.
- a photocurable resin is placed on an inorganic base material such as a glass plate or a glass film, or a transparent heat resistant resin (transparent polyimide or the like) by a method such as casting, spin coating, or ink jet.
- the photocurable resin is sandwiched between the base material and the mold (G1).
- Light is irradiated from the mold (G1) side or at least one of the base materials to cure the photocurable resin.
- the substrate and the mold (G1) are peeled off.
- the material which comprises the pattern of mold (G1) with the fluorine-containing resin, the resin containing a methyl group, the silicone represented by PDMS, or the material which combined these. Further, before the mold release treatment, a layer made of metal, metal oxide, or metal and metal oxide may be formed on the pattern surface of the mold (G1).
- the base material used in the step (62) is an easy-adhesion coating (for chemical bonding with the photocurable resin or physical bonding such as penetration) in order to improve the adhesion with the photocurable resin.
- Silane coupling treatment, etc. primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation treatment, surface roughening treatment, porous treatment, etc. may be performed.
- the light irradiation in the step (63) may be performed in a low oxygen environment.
- the mold (G1) preferably has a flexible structure, and the base material used in the step (61) is bent.
- the mold (G1) can be either a low-flexibility configuration or a high flexibility.
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- the flat optical substrate 1 (1a) can be obtained by the following steps (71) to (74).
- thermosetting resin is disposed on the pattern 33 of the mold (G1) by a method such as casting, spin coating, or ink jet.
- the thermosetting resin is uniformly leveled.
- the solvent is removed in a heating environment and the thermosetting resin is cured.
- the thermosetting resin and the mold (G1) are peeled off.
- the obtained optical substrate 1 (1a) may be bonded onto another substrate.
- the mold (G1) it is preferable to select a mold having a structure that does not change in quality at the thermosetting temperature.
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- a flat optical substrate 1 (1a) can be obtained by the following steps (81) to (84).
- thermoplastic resin is sandwiched between the mold (G1) and the pressing plate.
- Pressure is applied at a temperature equal to or higher than Tg of the thermoplastic resin.
- Cool to a temperature lower than Tg.
- the thermoplastic resin and the mold (G1) are peeled off.
- the mold (G1) and the pressing plate may be heated at the time of the step (81).
- the heating of a process (82) should just heat from at least one of a mold (G1) or a press plate, and it is preferable to heat a mold (G1) side at least.
- the obtained optical substrate 1 (1a) may be bonded onto another substrate.
- the mold (G1) it is preferable to select a mold that does not change in quality at the heating temperature used in the step (82).
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- a flat optical substrate 1 (1a) can be obtained by the following steps (91) to (95).
- An inorganic precursor is placed on the pattern (406) of the mold (G1) by a method such as casting, spin coating, or ink jet.
- an inorganic precursor is placed on a base material made of PDMS or resin by a method such as casting, spin coating, or ink jet.
- (92) Promote condensation of inorganic precursor.
- (93) The inorganic precursor is sandwiched between the base material and the mold (G1).
- (94) The condensation is further promoted to cure the inorganic precursor.
- the substrate and the mold (G1) are peeled off.
- the base material used in the step (91) is an easy-adhesion coating (silane cup) for chemical bonding with the inorganic precursor and physical bonding such as permeation in order to improve adhesion with the inorganic precursor. Ring treatment, etc.), primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation treatment, surface roughening treatment, porosification treatment, and the like.
- optical film 1 (1a) obtained by using a photocurable resin, a thermosetting resin, or an inorganic precursor is subjected to a residual film treatment in the same manner as in (2), and then the substrate is removed.
- the substrate for optics 1 (1a) can also be obtained by processing by dry etching.
- a cover film may be disposed on the pattern surface of the obtained optical substrate 1 (1a).
- a flat plate mold is produced from the cylindrical mold. Subsequently, a mold (G1) having a structure in which a flat mold is used as a mold, the pattern 406 is transferred to a photo-curing resin, a thermosetting resin, an inorganic precursor, or a thermoplastic resin, and the pattern 406 is inverted. Get. Using the obtained mold (G1) as a template, the pattern is transferred again to a photocurable resin, a thermosetting resin, an inorganic precursor, or a thermoplastic resin, or similar to the pattern 406 by electroforming represented by Ni. A mold (G2) having the structure is obtained. Using the obtained mold (G2) as a template, the pattern is transferred again to the raw material of the fine structure layer 12 (12a), or electroplating represented by Ni is used to form the flat optical substrate 1 (1a). Obtainable.
- Mold (G1) can be obtained by method (3).
- the mold (G2) can be the optical substrate 1 (1a) obtained by the method (3).
- the flat optical substrate 1 (1a) can be produced by replacing the mold (G1) with the mold (G2) in the method (3).
- the photocurable resin (G1) and the pattern of the mold (G2) are also made of the photocurable resin (G2)
- the photocurable resin (G1) Both G1 and G2) are preferably fluorine-containing photocurable resins.
- a fluorine component can be segregated on the surface of the pattern portion of the photocurable resin (G1).
- a mold (G1) comprises the mold release property of a pattern part and can also ensure the adhesiveness with a base material
- a mold (G2) can be obtained favorably.
- the fluorine element concentration (Es) in the surface portion is larger than the average fluorine element concentration (Eb) in the resin constituting the pattern.
- the average fluorine element concentration (Eb) in the resin layer constituting the mold (G1) and / or the mold (G2) and the fluorine element on the surface of the fine pattern of the resin layer constituting the mold (G1) or / and the mold (G2) It is more preferable that the ratio (Es / Eb) to the concentration (Es) satisfies 1 ⁇ Es / Eb ⁇ 30000 because the above-described effect is more exhibited. In particular, it is preferable because the releasability is further improved as the range becomes 3 ⁇ Es / Eb ⁇ 1500 and 10 ⁇ Es / Eb ⁇ 100.
- the resin constituting the mold (G1) and / or the mold (G2) is in the widest range (1 ⁇ Es / Eb ⁇ 30000) and within the range of 20 ⁇ Es / Eb ⁇ 200. Since the fluorine element concentration (Es) on the surface of the layer is sufficiently higher than the average fluorine concentration (Eb) in the resin layer, the free energy on the mold (G1) and / or mold (G2) surface is effectively reduced. The releasability from the transfer material resin and the material constituting the optical substrate is improved.
- the average fluorine element concentration (Eb) in the resin layer constituting the mold (G1) or / and the mold (G2) is determined as the fluorine element concentration on the surface of the resin layer constituting the mold (G1) or / and the mold (G2).
- the free energy on the surface of the resin layer constituting the mold (G1) or / and the mold (G2) can be reduced, and the strength of the resin can be maintained. It is preferable because the repeat transferability is further improved, and more preferably 31 ⁇ Es / Eb ⁇ 155. If 46 ⁇ Es / Eb ⁇ 155, the above effect can be further exhibited, which is preferable.
- the pattern surface side region of the resin layer constituting the mold (G1) or / and the mold (G2) is, for example, from the pattern surface side surface of the resin layer constituting the mold (G1) or / and the mold (G2). This means a portion that has entered approximately 1 to 10% in the thickness direction toward the material side, or a portion that has entered 2 nm to 20 nm in the thickness direction.
- the fluorine element concentration (Es) in the pattern surface side region of the resin layer constituting the mold (G1) and / or the mold (G2) can be quantified by the XPS method. Since the penetration length of X-rays in the XPS method is as shallow as several nm, it is suitable for quantifying the Es value. As another analysis method, Es / Eb can be calculated using energy dispersive X-ray spectroscopy (TEM-EDX) using a transmission electron microscope.
- TEM-EDX energy dispersive X-ray spectroscopy
- the average fluorine concentration (Eb) in the resin constituting the resin layer constituting the mold (G1) and / or the mold (G2) can be calculated from the charged amount. Or it can measure with a gas chromatograph mass spectrometer (GC / MS).
- GC / MS gas chromatograph mass spectrometer
- the average fluorine element concentration can be identified by physically separating the resin layer constituting the mold (G1) and / or the mold (G2) and subjecting the resin layer to gas chromatography mass spectrometry.
- the average of the resin in the resin can also be obtained by decomposing the section from which the resin layer constituting the mold (G1) and / or the mold (G2) is physically peeled by the flask combustion method and subsequently subjecting to ion chromatography analysis.
- the elemental fluorine concentration (Eb) can be identified.
- a mold (G3) is further produced from the mold (G2) obtained by the method (4), and in the method (3), the mold (G1) is read as the mold (G3), thereby obtaining a flat optical substrate.
- Material 1 (1a) can be produced.
- the mold (GN + 1) is manufactured from the mold (GN), and the optical substrate 1 (1a) is manufactured by replacing the mold (G1) with the mold (GN + 1) in the method (3). it can.
- the reel-shaped optical substrate 1 (1a) can be obtained by the following steps (101) to (104).
- a photocurable resin is coated on a film substrate such as a PET film, a TAC film, a glass film, or a transparent polyimide by a method such as a gravure coater, a micro gravure coater, a slit coat, or an ink jet.
- a film substrate such as a PET film, a TAC film, a glass film, or a transparent polyimide by a method such as a gravure coater, a micro gravure coater, a slit coat, or an ink jet.
- the photocurable resin is sandwiched between the film substrate and the cylindrical mold.
- light is irradiated from the cylindrical mold side or at least one of the base materials to cure the photocurable resin.
- the substrate and the cylindrical mold are peeled off.
- photo-curing resin coating uses blade coaters, wire bar coaters, air knife coaters, dip coaters, comma knife coaters, spray coaters, curtain coaters, etc. can do.
- the film substrate used in the step (102) is an easy-adhesive coating (silane) for chemical bonding with the photocurable resin and physical bonding such as infiltration to improve adhesion with the photocurable resin.
- Coupling treatment, etc.), primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation treatment, surface roughening treatment, porous treatment, and the like may be performed.
- the light irradiation in the step (103) may be performed in a low oxygen environment.
- the obtained base material for optics 1 (1a) may paste a cover film on a pattern surface, and may wind up and collect.
- the reel-like optical substrate 1 (1a) can be obtained by the following steps (111) to (114).
- thermosetting resin is coated on a film substrate having a Tg higher than the curing temperature of the thermosetting resin by a method such as a gravure coater, a micro gravure coater, an inkjet, or a slit coat. (112) Subsequently, the solvent is removed in a heating environment. (113) Thereafter, the thermosetting resin is pressed against the pattern surface of the cylindrical mold and heated. (114) Finally, it peels from the thermosetting resin and the cylindrical mold.
- a method such as a gravure coater, a micro gravure coater, an inkjet, or a slit coat.
- thermosetting resin coating uses a blade coater, wire bar coater, air knife coater, dip coater, comma knife coater, spray coater, curtain coater, etc. can do.
- the film base material used at a process (111) has Tg higher than the curing temperature of a thermosetting resin.
- thermosetting resin easy adhesion coating for physical bonding such as penetration (silane coupling treatment, etc.), primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation You may perform a process, a surface roughening process, a porous process, etc.
- the obtained base material for optics 1 (1a) may paste a cover film on a pattern surface, and may wind up and collect.
- the reel-shaped optical substrate 1 (1a) can be obtained by the following steps (121) to (124).
- thermoplastic resin film and the cylindrical mold are peeled off.
- the step (121) Before the step (121), it is preferable to release the pattern 406 of the cylindrical mold. Further, at least one of the cylindrical mold and the pressing roll may be heated at the time of the step (121).
- the heating in the step (122) may be performed from at least one of the cylindrical mold or the pressing roll, and it is preferable to heat at least the cylindrical mold side.
- the obtained optical substrate 1 (1a) may be bonded onto another substrate.
- the substrate for optics 1 (1a) can be obtained by applying a method in the case of using the photocurable resin or a case of using a thermosetting resin. Moreover, the obtained base material for optics 1 (1a) may paste a cover film on a pattern surface, and may wind up and collect.
- the optical substrate 1 (1a) produced by a continuous process can be used as a mold for obtaining the flat optical substrate 1 (1a) of (1) to (5). By cutting the optical substrate 1 (1a) obtained by the continuous process, it can be used as the molds (1) to (5) for producing the flat optical substrate 1 (1a).
- a reel-shaped mold (G1) having a structure reversed to the pattern 406 is obtained.
- the reel-shaped optical substrate 1 (1a) can be obtained by a continuous process. .
- the optical substrate 1 (1a) obtained by the method (6) can be used as the mold (G1).
- the optical substrate 1 (1a) can be obtained by a film-to-film continuous process by the following steps (131) to (134).
- a photocurable resin is disposed on the pattern (406) of the mold (G1) by a method such as a gravure coater or a micro gravure coater. Or photocurable resin is arrange
- the photocurable resin is sandwiched between the base material and the mold (G1).
- light is irradiated from the mold (G1) side or at least one of the base materials to cure the photocurable resin.
- the substrate and the mold (G1) are peeled off.
- a mold release treatment on the pattern 406 surface of the mold (G1).
- the material which comprises the pattern of mold (G1) with the fluorine-containing resin, the resin containing a methyl group, the silicone represented by PDMS, or the material which combined these.
- a layer made of metal, metal oxide, or metal and metal oxide may be formed on the pattern surface of the mold (G1).
- photo-curing resin coating uses blade coaters, wire bar coaters, air knife coaters, dip coaters, comma knife coaters, spray coaters, curtain coaters, etc. can do.
- the base material used in the step (132) is an easy-adhesion coating (silane cup for chemical bonding with the photocurable resin and physical bonding such as infiltration to improve adhesion with the photocurable resin. Ring treatment, etc.), primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation treatment, surface roughening treatment, porosification treatment, and the like.
- the light irradiation in the step (133) may be performed in a low oxygen environment. Moreover, when pinching a photocurable resin, it is preferable to press with a nip roll from the surface on the opposite side to the side with which the photocurable resin of the film base material is applied. The light irradiation in the step (133) may be performed in a low oxygen environment. Moreover, the obtained base material for optics 1 (1a) may paste a cover film on a pattern surface, and may wind up and collect.
- the optical substrate 1 (1a) can be obtained by a continuous film-to-film process by the following steps (141) to (144).
- thermosetting resin is applied on the pattern 406 of the mold (G1) by a method such as a gravure coater or a micro gravure coater, or a thermosetting resin is applied on a film substrate by a gravure coater or a micro gravure coater. Apply by such methods.
- a method such as a gravure coater or a micro gravure coater, or a thermosetting resin is applied on a film substrate by a gravure coater or a micro gravure coater. Apply by such methods.
- the solvent is removed in a heating environment.
- the thermosetting resin is pressed against the pattern surface of the mold (G1) and heated.
- thermosetting resin is pressed against the pattern surface of the mold (G1) and heated.
- the mold (G1) and the film substrate preferably have a Tg higher than the curing temperature of the thermosetting resin. Moreover, it is preferable to perform mold release treatment on the pattern 406 surface of the mold (G1) before the step (141). Or it is preferable to comprise the material which comprises the pattern of mold (G1) with the fluorine-containing resin, the resin containing a methyl group, the silicone represented by PDMS, or the material which combined these. Further, before the mold release treatment, a layer made of metal, metal oxide, or metal and metal oxide may be formed on the pattern surface of the mold (G1).
- thermosetting resin coating blade coater, wire bar coater, air knife coater, dip coater, comma knife coater, spray coater, curtain coater, etc. should be adopted in addition to the gravure coater method and the micro-gravure coater method. Can do.
- the film base material used at a process (141) has Tg higher than the curing temperature of a thermosetting resin.
- thermosetting resin easy adhesion coating for physical bonding such as penetration (silane coupling treatment, etc.), primer treatment, corona treatment, plasma treatment, UV / ozone treatment, high energy ray irradiation You may perform a process, a surface roughening process, a porous process, etc.
- the obtained base material for optics 1 (1a) may paste a cover film on a pattern surface, and may wind up and collect.
- the optical substrate 1 (1a) can be obtained by a continuous film-to-film process by the following steps (151) to (154).
- thermoplastic resin film and the mold (G1) are peeled off.
- the mold (G1) preferably has a Tg higher than that of the thermoplastic resin. Moreover, it is preferable to perform mold release treatment on the pattern 406 surface of the mold (G1) before the step (151). Or it is preferable to comprise the material which comprises the pattern of mold (G1) with the fluorine-containing resin, the resin containing a methyl group, the silicone represented by PDMS, or the material which combined these. Further, before the mold release treatment, a layer made of metal, metal oxide, or metal and metal oxide may be formed on the pattern surface of the mold (G1).
- the heating in the step (152) may be performed from at least one of the mold (G1) and the pressing roll, and it is preferable to heat at least the mold (G1) side.
- the obtained optical substrate 1 (1a) may be bonded onto another substrate.
- the obtained base material for optics 1 (1a) may paste a cover film on a pattern surface, and may wind up and collect.
- the substrate for optics 1 (1a) can be obtained by applying a method in the case of using the photocurable resin or a case of using a thermosetting resin. Moreover, the obtained base material for optics 1 (1a) may paste a cover film on a pattern surface, and may wind up and collect.
- the optical substrate 1 (1a) produced by a continuous process can be used as a mold for obtaining the flat optical substrate 1 (1a) of (1) to (5). By cutting the optical substrate 1 (1a) obtained by the continuous process, it can be used as the molds (1) to (5) for producing the flat optical substrate 1 (1a).
- the reel-like optical substrate 1 (1a) obtained is regarded as a mold (G2), and the above-described mold (G1) is replaced with the mold (G2), thereby further performing a roll-to-roll continuous process.
- the optical substrate 1 (1a) can be obtained.
- the optical substrate 1 (1a) can also be obtained by regarding the obtained optical substrate 1 (1a) (G3) as the mold (G1) described above.
- the mold (GN + 1) is produced from the mold (GN), and the mold (GN + 1) is regarded as the mold (G1) described above, whereby the optical substrate 1 (1a) can be obtained.
- the photocurable resin (GN) Both GN and GN + 1) are preferably fluorine-containing photocurable resins.
- the fluorine component can be segregated to the pattern portion surface of the photocurable resin (GN).
- a mold (GN) has the mold release property of a pattern part and can also ensure the adhesiveness with a base material, a mold (GN + 1) can be obtained favorably.
- the fluorine element concentration (Es) in the surface portion is larger than the average fluorine element concentration (Eb) in the resin constituting the pattern.
- the average fluorine element concentration (Eb) in the resin layer constituting the mold (GN) or / and the mold (GN + 1) and the fluorine element on the surface of the fine pattern of the resin layer constituting the mold (GN) or / and the mold (N + 1) It is more preferable that the ratio (Es / Eb) to the concentration (Es) satisfies 1 ⁇ Es / Eb ⁇ 30000 because the above-described effect is more exhibited. In particular, it is preferable because the releasability is further improved as the range becomes 3 ⁇ Es / Eb ⁇ 1500 and 10 ⁇ Es / Eb ⁇ 100.
- the resin constituting the mold (GN) and / or the mold (GN + 1) Since the fluorine element concentration (Es) on the surface of the layer is sufficiently higher than the average fluorine concentration (Eb) in the resin layer, the free energy on the mold (GN) or / and the mold (GN + 1) surface is effectively reduced. The releasability between the transfer material resin and the material constituting the optical substrate 1 (1a) is improved.
- the average fluorine element concentration (Eb) in the resin layer constituting the mold (GN) or / and the mold (GN + 1) is the fluorine element concentration on the surface of the resin layer constituting the mold (GN) or / and the mold (GN + 1).
- the pattern surface side region of the resin layer constituting the mold (GN) or / and the mold (GN + 1) is, for example, from the pattern surface side surface of the resin layer constituting the mold (GN) or / and the mold (GN + 1). This means a portion that has entered approximately 1 to 10% in the thickness direction toward the material side, or a portion that has entered 2 nm to 20 nm in the thickness direction.
- the fluorine element concentration (Es) in the putter surface side region of the resin layer constituting the mold (GN) and / or the mold (GN + 1) can be quantified by the XPS method. Since the penetration length of X-rays in the XPS method is as shallow as several nm, it is suitable for quantifying the Es value.
- Es / Eb can be calculated using energy dispersive X-ray spectroscopy (TEM-EDX) using a transmission electron microscope.
- the average fluorine concentration (Eb) in the resin constituting the resin layer constituting the mold (GN) and / or the mold (GN + 1) can be calculated from the charged amount. Or it can measure with a gas chromatograph mass spectrometer (GC / MS).
- GC / MS gas chromatograph mass spectrometer
- the average fluorine element concentration can be identified by physically peeling the resin layer constituting the mold (GN) and / or the mold (GN + 1) and subjecting the resin layer to gas chromatography mass spectrometry.
- the average of the resin in the resin can also be obtained by decomposing the section from which the resin layer constituting the mold (GN) and / or the mold (GN + 1) is physically peeled by the flask combustion method and subsequently subject to ion chromatography analysis.
- the elemental fluorine concentration (Eb) can be identified.
- a pattern 406 of the optical substrate 1 (1a) produced from the cylindrical mold by the method (6) or (7) is transferred and molded by electroforming represented by Ni.
- the optical substrate 1 (1a) can be obtained by a roll-to-roll process.
- the Ni electric mold is not processed into a cylindrical shape, but is used as a flat plate to be used as a mold for obtaining the flat optical substrate 1 (1a) of the methods (1) to (5). Can do.
- An optical substrate 71 can be obtained by forming a transparent dielectric layer 72 on the fine concavo-convex structure surface of the optical substrate 1 (1a) obtained by the methods (1) to (8). it can.
- the reel-shaped optical substrate 1 (1a) When the reel-shaped optical substrate 1 (1a) is used as the optical substrate 1 (1a), a gravure coater, micro gravure coater, blade coater, wire bar coater, air knife coater, dip coater, comma knife coater
- the material of the transparent dielectric layer 72 is coated on the fine concavo-convex structure surface of the optical substrate 1 (1a) with a spray coater, a curtain coater or the like. Subsequently, the solvent is removed and the material of the transparent dielectric layer 72 is leveled (the surface 73 of the transparent dielectric layer 72 opposite to the microstructure layer is planarized). Thereafter, the optical base material 71 can be obtained by a continuous process by curing (reacting) the transparent dielectric layer 72 material. Moreover, the obtained base material 71 for optics may bond a cover film to a pattern surface, and may wind up and collect
- a method such as a cast method, a slit coat method, an ink jet method, a spin coat method, or a combination thereof (for example, cast).
- the material of the transparent dielectric layer 72 is applied onto the fine concavo-convex structure surface of the optical substrate 1 (1a) by the spin coating method after the method and the slit coating method.
- the solvent is removed and the material of the transparent dielectric layer 72 is leveled (the surface 73 of the transparent dielectric layer 72 opposite to the microstructure layer is planarized). Thereafter, the transparent dielectric layer 72 material is cured (reacted), whereby the optical substrate 71 can be obtained in a batch manner.
- the optical substrate 71 can be obtained in a continuous process by the following steps (161) to (167).
- a casting method, an inkjet method, a spin coating method, a slit coating method, or a combination thereof was performed on a substrate having surface accuracy typified by a silicon wafer.
- the transparent dielectric layer 72 material is applied by spin coating).
- the fine uneven surface side of the optical substrate 1 (1a) obtained by the methods (1) to (9) is pressed against the transparent dielectric layer 72 material.
- the optical base 1 (1a) is peeled off to form a shape reversed from the pattern of the optical base 1 (1a) on the base.
- a transparent dielectric layer 72 is formed.
- a fine layer material is formed on the substrate by a method such as a cast method, an ink jet method, or a spin coat method. (165) The pattern composed of the transparent dielectric layer 72 obtained in the step (164) is pressed. (166) The microstructure layer material is cured. (167) Finally, the substrate is peeled off.
- the transparent dielectric layer 72 material may be applied on the optical substrate 1 (1a), and then a substrate having surface accuracy such as a silicon wafer may be pressed.
- a substrate having surface accuracy such as a silicon wafer
- the base material having surface accuracy include a silicon wafer and a resin obtained by transferring a mirror surface of the silicon wafer.
- the thickness of the release layer is preferably 30 nm or less from the viewpoint of transfer accuracy, and is preferably a monomolecular layer or more. From the viewpoint of releasability, it is more preferably 2 nm or more, and from the viewpoint of transfer accuracy, it is more preferably 20 nm or less.
- the material constituting the release layer is not limited, but known commercially available materials include, for example, Zonyl TC coat (DuPont), Cytop CTL-107M (Asahi Glass), Cytop CTL-107A (Asahi Glass).
- the material constituting the release layer is preferably a material containing a methyl group, a material containing silicone, or a material containing fluorine from the viewpoint of releasability.
- the material constituting the release layer is preferably a silane coupling agent or a silicone-based resin typified by PDMS because the release layer can be easily thinned and the transfer accuracy can be maintained.
- the material used for the release layer may be used alone or in combination.
- the material constituting the release layer preferably has a contact angle with water of 90 degrees or more.
- the contact angle means a contact angle when a solid film (film having no fine pattern) is produced using a material constituting the release layer.
- the curing of the transparent dielectric layer 72 in the step (163) may be accelerated by heat or light. Further, a cover film may be disposed on the pattern surface of the obtained optical substrate 71.
- the optical substrate 71 can be obtained in a continuous process by the following steps (171) to (173).
- a transparent dielectric layer 72 material is applied on a substrate having surface accuracy typified by a silicon wafer. (172) Subsequently, the fine uneven surface side of the optical substrate 1 (1a) obtained by the above methods (1) to (9) is pressed against the transparent dielectric layer 72 material. (173) After the transparent dielectric layer 72 material is cured, the optical substrate 1 (1a) is peeled off.
- the transparent dielectric layer 72 material is applied onto the optical substrate 1 (1a), and then a surface accurate substrate such as a silicon wafer is pressed. Also good.
- a surface accurate substrate such as a silicon wafer is pressed.
- the base material having surface accuracy include a silicon wafer and a resin obtained by transferring a mirror surface of the silicon wafer.
- the release layer thickness is preferably 30 nm or less from the viewpoint of transfer accuracy, and is preferably a monomolecular layer or more. From the viewpoint of releasability, it is more preferably 2 nm or more, and from the viewpoint of transfer accuracy, it is more preferably 20 nm or less.
- the material constituting the release layer is not limited, but known commercially available materials include, for example, Zonyl TC coat (DuPont), Cytop CTL-107M (Asahi Glass), Cytop CTL-107A (Asahi Glass).
- the material constituting the release layer is preferably a material containing a methyl group, a material containing silicone, or a material containing fluorine from the viewpoint of releasability.
- the material constituting the release layer is preferably a silane coupling agent or a silicone-based resin typified by PDMS because the release layer can be easily thinned and the transfer accuracy can be maintained.
- the material used for the release layer may be used alone or in combination.
- the material constituting the release layer preferably has a contact angle with water of 90 degrees or more.
- the contact angle means a contact angle when a solid film (film having no fine pattern) is produced using a material constituting the release layer.
- the curing of the transparent dielectric layer 72 in the step (173) may be accelerated by heat or light. Further, a cover film may be arranged on the pattern surface of the obtained optical substrate 71.
- Example 1 Cylindrical mold production (preparation of resin mold production mold)
- a cylindrical quartz glass roll having a diameter of 80 mm and a length of 50 mm was used as the base of the cylindrical mold.
- a fine structure fine concavo-convex structure was formed on the surface of this cylindrical quartz glass roll by the direct drawing lithography method using a semiconductor pulse laser by the following method.
- a resist layer was formed on the fine structure of the quartz glass surface by sputtering.
- the sputtering method was performed with RF100W power using CuO (containing 8 atm% Si) as a target (resist layer).
- the film thickness of the resist layer after film formation was 20 nm.
- the target pitch Py and the effective pitch Py ′ are Py ⁇ Py ′, but since L / Py ⁇ 107, Py / Py′ ⁇ 10 ⁇ 7 , which can be treated as being substantially equal. it can.
- the effective long period PyL ′ is obtained by the following equation (14) so that L / PyL becomes an integer.
- L / PyL ′ n (n is an integer) (14)
- the pulse frequency fy at the elapsed time t from the Z-phase signal of the spindle motor is determined as the equation (17).
- fy fy0 + ⁇ 1 ⁇ sin (t ⁇ (fyL / fy0) ⁇ 2 ⁇ ) (17)
- Vx Vx0 + V ⁇ 2 ⁇ sin (Px / PxL ⁇ t ⁇ 2 ⁇ ) (19)
- V ⁇ 2 is the speed fluctuation width in the long cycle PxL in the D2 direction, and is expressed by the following formula (20) by the pitch fluctuation widths ⁇ 2, Px, Vx0 of the long cycle PxL.
- V ⁇ 2 ⁇ 2 ⁇ Vx0 / Px (20)
- the resist layer is developed.
- the development of the resist layer was carried out using a 0.03 wt% glycine aqueous solution under a processing time of 240 seconds.
- the etched resist layer was etched by dry etching using the developed resist layer as a mask. Dry etching was performed using SF 6 as an etching gas under the conditions of a processing gas pressure of 1 Pa, a processing power of 300 W, and a processing time of 5 minutes.
- SF 6 as an etching gas under the conditions of a processing gas pressure of 1 Pa, a processing power of 300 W, and a processing time of 5 minutes.
- only a residual resist layer was peeled off with hydrochloric acid having a pH of 6 for 6 minutes from a cylindrical mold having a fine structure on the surface to prepare a cylindrical mold (transfer mold).
- Durasurf HD-1101Z manufactured by Daikin Chemical Industry Co., Ltd.
- Durasurf HD-ZV manufactured by Daikin Chemical Industries, Ltd.
- a reel-shaped resin mold was produced from the obtained cylindrical mold.
- OPTOOL DAC HP manufactured by Daikin Industries
- trimethylolpropane triacrylate manufactured by Toagosei Co., Ltd.
- Irgacure 184 manufactured by Ciba
- a photocurable resin is mixed.
- this photo-curing resin is applied to the easily adhesive surface of a PET film (A4100, manufactured by Toyobo Co., Ltd .: width 300 mm, thickness 100 ⁇ m) by microgravure coating (manufactured by Yasui Seiki Co., Ltd.) so that the coating film thickness becomes 6 ⁇ m. Applied.
- a PET film coated with a photocurable resin is pressed against a cylindrical mold (cylindrical mold) with a nip roll (0.1 MPa), and integrated in the air at a temperature of 25 ° C. and a humidity of 60% under the center of the lamp.
- the UV exposure device H-bulb manufactured by Fusion UV Systems Japan Co., Ltd.
- the UV exposure device is used to irradiate UV rays continuously to achieve an exposure amount of 600 mJ / cm 2, and the microstructure is inverted on the surface.
- a transferred reel-shaped transparent resin mold (length 200 m, width 300 mm) was obtained.
- the convex portion having a cross-sectional shape of ⁇ 400 nm ⁇ 40 nm and h800 nm ⁇ 80 nm was formed with a periodic structure having the following long-period structure.
- the maximum value of dot diameter and dot height is observed in the dot with the shortest distance between dots with the surrounding area, and the minimum value of dot diameter and dot height is observed with the dot with the widest distance between dots with the surrounding area.
- the dot diameter in the meantime showed a modulation curve similar to the modulation of the fluctuation range of the inter-dot distance.
- This photo-curing resin was applied to the easily adhesive surface of a PET film (A4100, manufactured by Toyobo Co., Ltd .: width 300 mm, thickness 100 ⁇ m) by microgravure coating (manufactured by Yurai Seiki Co., Ltd.) so as to have a coating film thickness of 2 ⁇ m.
- a PET film coated with a photocurable resin is pressed onto the reel-shaped resin mold with a nip roll (0.1 MPa), and the integrated exposure amount under the center of the lamp is 600 mJ in the air at a temperature of 25 ° C. and a humidity of 60%. / Cm 2 , UV irradiation was performed using a UV exposure device (H-bulb manufactured by Fusion UV Systems Japan Co., Ltd.), and photocuring was continuously carried out.
- a transparent resin mold sheet (length 200 mm, width 300 mm) was obtained.
- An organic EL element was produced using the transparent resin mold sheet as an optical substrate.
- a buffer layer, a cathode, an electron transport layer, a hole transport layer, and a cathode were laminated in this order on the surface on which fine irregularities were formed.
- the material, film thickness, and film formation method of each layer are as follows.
- Buffer layer SiO 2 100 nm Vacuum deposition
- Cathode Ag 40 nm Vacuum deposition
- Electron transport layer Tris- (8-hydroxyquinoline) aluminum (Alq3) 40 nm Vacuum deposition
- Hole transport layer N, N′-diphenyl-N, N′-bis (1-naphthyl)-(1,1′-biphenyl)-(4,4′-diamine) (NPB) 60 nm Vacuum deposition
- Anode ITO 150 nm sputtering
- Semiconductor laser wavelength for exposure 405 nm
- Exposure laser power 3.5mW
- Variation width ⁇ 2 for the pitch Px in the D2 direction 61 nm Long period PxL in the D2 direction of fluctuation width ⁇ 2: 6 ⁇ m
- Example 2 Using this reel-shaped transparent resin mold, an organic EL element (Example 2) was produced in the same manner as in Example 1.
- Semiconductor laser wavelength for exposure 405 nm
- Exposure laser power 3.5mW D2 direction pitch
- Px 700 nm
- D1 direction pitch Py 700 nm
- the control of the reference signal of the pitch Py was made only at the initial stage.
- the surface of the produced reel-shaped transparent resin mold was observed with a scanning electron microscope.
- the convex portions were arranged in a row at a pitch Py set in the D1 direction, and the row of convex portions were repeatedly provided at a predetermined pitch Px in the D2 direction.
- the shift amount ⁇ was irregular between the row-shaped convex portions arranged adjacent to each other in the D2 direction.
- a transparent resin mold sheet (length: 200 m, width: 300 mm) having a fine structure inverted and transferred onto a PET film was obtained in the same manner as in Example 1.
- Luminous efficiency characteristics of the organic EL devices of Examples 1 to 3, Comparative Example 1, and Comparative Example 2 were measured with a spectral radiance meter CS-2000 manufactured by Konica Minolta. The results of the intensity ratio with the emission intensity of Comparative Example 1 as 1.0 are shown in Table 1 below.
- Example 4 (Optical substrate 1) The reverse resin mold produced as described above was cut out to a length of 50 cm.
- Material 1 was coated on a glass film (refractive index of 1.52) having a width of 300 mm and a length of 600 mm by a bar coating method.
- the coating film thickness was set so that the solid film thickness after solvent evaporation would be 1000 nm. After coating, it was allowed to stand at room temperature for 2 minutes, and then allowed to stand for 30 seconds in an atmosphere of 80 degrees.
- the fine structure surface side of the cut out inverted resin mold was bonded to the surface of the material 1 under a pressure of 0.01 Mpa and left to stand for 24 hours in an environment of 25 ° C. and a humidity of 50%.
- the reverse resin mold was peeled off to obtain an optical substrate 1 having a fine structure on a glass film.
- the convex portion having a cross-sectional shape of ⁇ 400 nm and h800 nm was formed with a periodic structure having the following long-period structure.
- D2 direction pitch Px 433 nm Variation width ⁇ 2 with respect to the pitch Px in the D2 direction: 108 nm Long period PxL in the D2 direction of fluctuation width ⁇ 2: 5000 nm D1 direction pitch Py: 500 nm Variation width ⁇ 1: 125 nm with respect to the pitch Py in the D1 direction Long period PyL of fluctuation range ⁇ 1 in the D1 direction: 5000 nm
- the refractive index of this material 1 was 1.513 at a wavelength of 460 nm and 1.507 at a wavelength of 550 nm.
- Optical substrate 2 The surface of a 4-inch ⁇ silicon wafer substrate was treated with UV-O3 for 15 minutes. Subsequently, Durasurf 1101Z was formed into a spin coat film and allowed to stand for 12 hours in an atmosphere of 25 degrees and 50% humidity. Thereafter, spin coat cleaning was performed three times using the Durasurf HD-ZV solution.
- the optical substrate 1 was heat-treated in an environment of 300 ° C. for 1 hour. After natural cooling, the following material 2 was coated on the microstructure surface of the optical substrate 1 by a bar coating method so that a solid film thickness of 1000 nm was obtained. After coating, it was allowed to stand for 5 minutes in an environment of 25 ° C. and 50% humidity, and further heated at 80 ° C. for 30 seconds.
- the surface coated with the material 1 was bonded onto a surface-treated silicon wafer under a pressure of 0.01 Mpa. After pasting, it was allowed to stand for 24 hours in an environment of 25 ° C. and a humidity of 50%.
- the optical substrate 2 was obtained by peeling the silicon wafer.
- the surface accuracy of the optical substrate 2 on the material 1 surface side was 1 nm or less in terms of Ra.
- the obtained optical substrate 2 was heat-treated in an environment of 300 ° C. for 1 hour.
- An organic EL element (Example 4) was produced using the optical substrate 2 produced from the optical substrate 1. On the planarized surface composed of a cured product of the material 1 of the optical substrate 2, an anode, a hole transport layer, an electron transport layer, a cathode, a buffer layer, a cathode, an electron transport layer, a hole transport layer, and a cathode are stacked in this order. did.
- Anode ITO 130 nm Sputtering hole transport layer: N, N′-diphenyl-N, N′-bis (1-naphthyl)-(1,1′-biphenyl)-(4,4′-diamine) (NPB) 60 nm Vacuum deposition / electron transport layer: Tris- (8-hydroxyquinoline) aluminum (Alq3) 40 nm Vacuum deposition / cathode: Al 100 nm Vacuum deposition
- Organic EL elements (Comparative Examples 3 to 5) were produced by the same method as described above, using a base material different from the optical base materials 1 and 2 according to the present embodiment.
- the organic EL element of the comparative example 3 used the glass base material (flat base material) used by preparation of the base material 1 for optics
- the organic EL element of the comparative example 4 was formed with the fine structure of pitch 500nm.
- the organic EL element of Comparative Example 5 is the optical substrate 1 (provided that the fine structure has a long period) No variation was used.
- the organic EL element of Comparative Example 3 was produced in the same manner as in Example 4 except that the optical substrate 2 was changed to a flat substrate.
- the organic EL elements of Comparative Example 4 and Comparative Example 5 were produced in the same manner as in Example 4 by forming fine structures having respective pitches on the surface of the cylindrical mold.
- Example 4 and Comparative Examples 3 to 5 were examined for luminous efficiency and glare as described above. The results are shown in Table 2 below.
- the case of the flat base material in the organic EL element of the comparative example 3 was set to 1.
- the state where glare was alleviated was marked with ⁇
- the state where glare was observed was marked with x.
- Example 4 As can be seen from Table 2, compared to the case of the organic EL element having no fine structure (Comparative Example 3), the organic EL element using the optical substrate having the fine structure (Comparative Example 4, Comparative Example 5, implementation) In Example 4), it can be seen that the luminous efficiency is improved. In particular, the fine structure size was more efficient in the nano-order (Comparative Example 4, Example 4) than in the micro-order (Comparative Example 5). Furthermore, the organic EL element (Example 4) using the optical base material having both long-period fluctuations showed the greatest improvement in efficiency. In addition, in the organic EL elements of Comparative Examples 4 and 5, glare based on diffraction was observed when light emission was visually recognized. However, the organic EL element of Example 4 was an optical substrate having both long-period fluctuations. Since it was used, it was observed that glare was alleviated and visibility was improved.
- the optical substrate of the present invention can be applied to an optical substrate for improving light extraction, plasmonic polycrystal, and the like, and color shift caused by light diffraction can be reduced.
- a light-emitting device capable of improving luminance and reducing color shift due to light diffraction can be provided. Therefore, since the optical substrate and the light emitting device of the present invention have high luminous efficiency while suppressing color shift, it is possible to effectively use electric power and greatly contribute to energy saving.
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- Optics & Photonics (AREA)
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Description
Py1<Py2<Py3<…<Pya>…>Pyn (1)
Px1<Px2<Px3<…<Pxa>…>Pxn (2)
Dy1<Dy2<Dy3<…<Dya>…>Dyn (3)
Dx1<Dx2<Dx3<…<Dxa>…>Dxn (4)
Hy1<Hy2<Hy3<…<Hya>…>Hyn (5)
Hx1<Hx2<Hx3<…<Hxa>…>Hxn (6)
Px1<Px2<Px3<…<Pxa>…>Pxn (7)
本実施の形態に係る光学用基材は、基材主面から面外方向に延在する複数の凸部または凹部から構成されるドットを含む微細構造層を備え、前記微細構造層は、前記基材主面内の第1方向において、前記複数のドットがピッチPyで配列された複数のドット列を構成し、一方、前記基材主面内の前記第1方向に直交する第2方向において、前記複数のドット列がピッチPxで配列された複数のドット列を構成しており、前記ピッチPyおよび前記ピッチPxはいずれか一方がナノオーダーの一定間隔であり他方がナノオーダーの不定間隔であるか、またはいずれもナノオーダーの不定間隔であることを特徴とする。
図3は、光学用基材1の平面模式図である。図3に示すように、ドット(凸部13または凹部14)は、基材11主面内のD1方向において、複数のドットが不定間隔Py(ピッチPy1,Py2,Py3,…)で配列された複数のドット列(凸部列13-1~13-Nまたは凹部列14-1~14-N)を構成する。また、各ドット列は、基材11主面内で第1方向(D1方向)に直交する第2方向(D2方向)において、不定間隔Px(ピッチPx1,Px2,Px3,…)で配置されている。
Py1<Py2<Py3<…<Pya>…>Pyn (1)
Px1<Px2<Px3<…<Pxa>…>Pxn (2)
Px1<Px2<Px3>Px4>Px5>Px6>Px7
Px1=Px(min)
Px2=Px(min)+δa
Px3=Px(min)+δb=Px(max)
Px4=Px(min)+δc
Px5=Px(min)+δd
Px6=Px(min)+δe
Px7=Px(min)+δf
ただし、δaからδfの値は、Px(min)×0.01<(δa~δf)<Px(min)×0.5を満たす。隣接する長周期単位L2についても同様である。
本実施の形態に係る光学用基材1(1a)において、ピッチPyが不定間隔である場合には、少なくとも隣接する4個以上m個以下のピッチを構成するドット径Dyn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(3)の関係を満たすとともに、第1方向において、ドット径Dy1~Dynで構成されるドット群が少なくとも1個以上配列され、ピッチPxが不定間隔である場合には、少なくとも隣接する4個以上m個以下のピッチを構成するドット径Dxn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(4)の関係を満たすとともに、第2方向において、ドット径Dx1~Dxnで構成されるドット群が少なくとも1個以上配列されることが好ましい。
Dy1<Dy2<Dy3<…<Dya>…>Dyn (3)
Dx1<Dx2<Dx3<…<Dxa>…>Dxn (4)
本実施の形態に係る光学用基材1(1a)において、ピッチPyが不定間隔である場合には、少なくとも隣接する4個以上m個以下のピッチを構成するドット高さHyn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(5)の関係を満たすとともに、第1方向において、ドット高さHy1~Hynで構成されるドット群が少なくとも1個以上配列され、ピッチPxが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット高さHxn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(6)の関係を満たすとともに、第2方向において、ドット径Hx1~Hxnで構成されるドット群が少なくとも1個以上配列されることが好ましい。
Hy1<Hy2<Hy3<…<Hya>…>Hyn (5)
Hx1<Hx2<Hx3<…<Hxa>…>Hxn (6)
Px1<Px2<Px3<…<Pxa>…>Pxn (7)
図19は、本実施の形態に係る光学用基材1(1a)を適用した有機EL発光デバイス40の断面模式図である。図19に示すように、有機EL発光デバイス40は、光学用基材1(1a)を少なくとも1つ有し、発光層は、光学用基材1(1a)の微細構造層12(12a)側の主面に対向して配置される。有機EL発光デバイス40は、微細構造層12(12a)を有する光学用基材41(1、1a)上に順次積層された発光部42、透明導電膜層43(ITO層に代表されるTCO層)から構成される。光学用基材41(1、1a)を構成する材料に限定はなく、誘電体、半導体、金属等の材料を用いることができる。有機EL発光デバイス40において、発光部42と接している透明導電膜層43の他の主面に光拡散性基材を設けてもよい。この場合、光拡散性基材は、発光部42からの射出光および光学用基材41(1、1a)を反射した光を拡散し、光の回折に起因するカラーシフトをさらに低減することができる。
本発明における光学用基材1(1a)は、表面に周期性のドット構造を有する基材であれば特に限定されるものではなく、樹脂、誘電体、半導体、金属のいずれかの材料を用いることができる。
基材11(11a)としては、樹脂、誘電体、半導体、金属のいずれかの材料を用いることができる。例えば、石英、ガラス、金属、シリコン、セラミック等の無機基材や、樹脂基材等を用いることができる。樹脂基材としては、例えば、ポリビニルアルコール樹脂、ポリアクリロニトリル樹脂、ポリメタクリル酸メチル樹脂、ポリカーボネート樹脂、ポリスチレン樹脂、シクロオレフィン樹脂(COP)、架橋ポリエチレン樹脂、ポリ塩化ビニル樹脂、ポリ塩化ビニル共重合体樹脂、ポリ塩化ビニリデン樹脂、ポリ塩化ビニリデン共重合体樹脂、ポリアリレート樹脂、ポリフェニレンエーテル樹脂、変性ポリフェニレンエーテル樹脂、ポリエーテルイミド樹脂、ポリエーテルサルフォン樹脂、ポリサルフォン樹脂、ポリエーテルケトン樹脂等の非晶性熱可塑性樹脂を用いることができる。また、樹脂基材としては、ポリエチレンテレフタレート(PET)樹脂、ポリエチレンナフタレート樹脂、ポリエチレン樹脂、ポリプロピレン樹脂、ポリブチレンテレフタレート樹脂、芳香族ポリエステル樹脂、ポリアセタール樹脂、ポリアミド樹脂、ポリイミド樹脂等の結晶性熱可塑性樹脂を用いることができる。さらに、アクリル系、エポキシ系、ウレタン系等の紫外線(UV)硬化性樹脂や熱硬化性樹脂等を用いることができる。また、光学用基材41(51)として、紫外線硬化性樹脂や熱硬化性樹脂と、ガラス等の無機基材、熱可塑性樹脂、トリアセテート樹脂等を組み合わせた複合基材を用いてもよい。
有機EL発光デバイスからの発光光が、図19に図示したように本発明の光学用基材1(1a)に反射して、発光デバイスから発光する場合、少なくとも微細構造層12(12a)は金属等の反射性材料であることが好ましい。微細構造層12(12a)として、金属を用いた場合、光学用基材1(1a)上に有機EL発光デバイスを設けた場合、表面プラズモン共鳴による光取り出し効果を得やすく好ましい。また、誘電体等の金属以外の材料を使用した場合は、その表面を金属膜で被覆する。
有機EL発光デバイスからの発光光が、図20、図22に図示したように本発明の光学用基材1(1a)を透過する発光デバイスの構成である場合、本発明の光学用基材1(1a)は、以下のような光透過性の材料で構成されていることが必要である。
本実施の形態に係る光学用基材の表面には、図21に示すように透明誘電体層72を具備していてもよい。
また、本実施の形態に係る光学用基材1(1a)を用いた有機EL発光デバイスにおいては、光拡散性基材を配置してもよい。光拡散性基材は、光拡散機能を有するシート(板状体)または光拡散機能を有するフィルムで形成することができる。具体的には、光拡散性基材としては、光拡散材がシートまたはフィルム内に分散されたもの、光拡散性を有する構造がシートまたはフィルム表面に形成されたもの、拡散材と光拡散性を有する構造を組み合わせたもの等を用いることができる。これらの中から発光デバイスで適用する波長の指向性等を考慮して適用すればよい。
fY0=Asin(ω0t+φ0) (8)
fYL=Bsin(ω1t+φ1) (9)
fY=Asin(ω0t+φ0+Csin(ω1t)) (10)
fY´=fY0+C´sin(t・fYL/fY0×2π) (11)
<方法(1)>
円筒状モールドから上記したいずれかの方法で、平板状モールドを作製する。続いて、平板状モールドを金型とし、微細構造層12(12a)の原料へとパターン406を転写することで、平板状の光学用基材1(1a)を得ることができる。
(12)基材と、平板状モールドとで、前記光硬化性樹脂を狭持する。
(13)平板状モールド側あるいは、基材の少なくとも一方から光を照射し、光硬化性樹脂を硬化させる。
(14)基材と平板状モールドを剥離する。
(22)熱硬化性樹脂を均質にレベリングする。
(23)加熱環境にて溶剤を除去するとともに、熱硬化性樹脂を硬化させる。
(24)熱硬化性樹脂と平板状モールドを剥離する。
(32)熱可塑性樹脂のTg以上の温度にて圧力を加える。
(33)Tgより低い温度まで冷却する。
(34)熱可塑性樹脂と平板状モールドとを剥離する。
(42)無機前駆体の縮合を促進する。
(43)基材と、平板状モールドとで、前記無機前駆体を狭持する。
(44)縮合をより促進させ無機前駆体を硬化させる。
(45)基材と平板状モールドを剥離する。
円筒状モールドから、平板状モールドを作製する。続いて、平板状モールドを金型とし、光硬化性樹脂、熱硬化性樹脂、無機前駆体、あるいは熱可塑性樹脂へとパターン406を転写し、残膜処理を行い、得られたパターンをマスクとして、基材を加工することで、平板状の光学用基材1(1a)を得ることができる。
(52)基材と平板状モールドとで、前記光硬化性樹脂を狭持し、押圧する。
(53)平板状モールド側あるいは、基材の少なくとも一方から光を照射し、光硬化性樹脂を硬化させる。
(54)基材と平板状モールドを剥離する。
(55)基材上に転写形成されたパターンの残膜を除去する。
(56)得られたパターンをマスクとして、基材をエッチングする。
円筒状モールドから、平板状モールドを作製する。続いて、平板状モールドを金型とし、光硬化性樹脂、熱硬化性樹脂、無機前駆体、あるいは熱可塑性樹脂へとパターン406を転写し、パターン406と反転した構造を具備するモールド(G1)を得る。得られたモールド(G1)をテンプレートとし、微細構造層12(12a)の原料へと再度パターンを転写するか、Niに代表される電鋳により、平板状の光学用基材1(1a)を得ることができる。
(62)基材とモールド(G1)とで、前記光硬化性樹脂を狭持する。
(63)モールド(G1)側あるいは、基材の少なくとも一方から光を照射し、光硬化性樹脂を硬化させる。
(64)基材とモールド(G1)を剥離する。
(72)熱硬化性樹脂を均質にレベリングする。
(73)加熱環境にて溶剤を除去するとともに、熱硬化性樹脂を硬化させる。
(74)熱硬化性樹脂とモールド(G1)を剥離する。
(82)熱可塑性樹脂のTg以上の温度にて圧力を加える。
(83)Tgより低い温度まで冷却する。
(84)熱可塑性樹脂とモールド(G1)とを剥離する。
(92)無機前駆体の縮合を促進する。
(93)基材とモールド(G1)とで、前記無機前駆体を狭持する。
(94)縮合をより促進させ無機前駆体を硬化させる。
(95)基材とモールド(G1)を剥離する。
円筒状モールドから、平板状モールドを作製する。続いて、平板状モールドを金型とし、光硬化性樹脂、熱硬化性樹脂、無機前駆体、あるいは熱可塑性樹脂へとパターン406を転写し、パターン406と反転した構造を具備するモールド(G1)を得る。得られたモールド(G1)をテンプレートとし、光硬化性樹脂、熱硬化性樹脂、無機前駆体、あるいは熱可塑性樹脂へと再度パターンを転写するか、Niに代表される電鋳によりパターン406と同様の構造を具備するモールド(G2)を得る。得られたモールド(G2)をテンプレートとし、微細構造層12(12a)の原料へと再度パターンを転写するか、Niに代表される電鋳により、平板状の光学用基材1(1a)を得ることができる。
方法(4)により得られたモールド(G2)から、さらにモールド(G3)を作製するとともに、方法(3)において、モールド(G1)をモールド(G3)と読み替えることで、平板状の光学用基材1(1a)を作製することができる。同様に、モールド(GN)からモールド(GN+1)を作製するとともに、方法(3)において、モールド(G1)をモールド(GN+1)と読み替えることで、光学用基材1(1a)を作製することができる。
<方法(6)>
上記方法により作製した円筒状モールドをテンプレートとして用い、微細構造層12(12a)の原料へとパターン406を転写することで、リール状の光学用基材1(1a)を得ることができる。円筒状モールドをテンプレートにすることで、ロールツーロールによる連続プロセスにより、光学用基材1(1a)を得ることができる。
(102)続いて、フィルム基材と、円筒状モールドとで、前記光硬化性樹脂を狭持する。
(103)その後、円筒状モールド側あるいは、基材の少なくとも一方から光を照射し、光硬化性樹脂を硬化させる。
(104)最後に、基材と円筒状モールドを剥離する。
(112)続いて、加熱環境にて溶剤を除去する。
(113)その後、熱硬化性樹脂を、円筒状金型のパターン面に押圧し、加熱する。
(114)最後に、熱硬化性樹脂と円筒状モールドから剥離する。
(122)続いて、熱可塑性樹脂のTg以上の温度にて圧力を加える。
(123)その後、Tgより低い温度まで冷却する。
(124)最後に、熱可塑性樹脂フィルムと円筒状モールドとを剥離する。
円筒状モールドから方法(6)を用い、パターン406と反転した構造を具備するリール状のモールド(G1)を得る。得られたモールド(G1)をテンプレートとし、微細構造層12(12a)の原料へと再度パターンを転写することで、連続プロセスにてリール状の光学用基材1(1a)を得ることができる。
(132)続いて、基材と、モールド(G1)とで、前記光硬化性樹脂を狭持する。
(133)その後、モールド(G1)側あるいは、基材の少なくとも一方から光を照射し、光硬化性樹脂を硬化させる。
(134)最後に、基材とモールド(G1)を剥離する。
(142)続いて、加熱環境にて溶剤を除去する。
(143)その後、熱硬化性樹脂を、モールド(G1)のパターン面に押圧し、加熱する。
(144)最後に、熱硬化性樹脂とモールド(G1)から剥離する。
(152)続いて、熱可塑性樹脂のTg以上の温度にて圧力を加える。
(153)その後、Tg以下の温度まで冷却する。
(154)最後に、熱可塑性樹脂フィルムとモールド(G1)とを剥離する。
円筒状モールドから方法(6)または(7)により製造した光学用基材1(1a)のパターン406を、Niに代表される電鋳により転写成形する。得られたNi電鋳を円筒状に加工し、方法(6)の円筒状モールドとして見立てることで、ロールツーロールプロセスにより光学用基材1(1a)を得ることができる。なお、Ni電鋳型を円筒状に加工せず、平板状で使用することで、方法(1)~(5)の平板状の光学用基材1(1a)を得るためのモールドとして使用することができる。
つぎに図21に示す光学用基材71の製造方法について説明する。
<方法(9)>
方法(1)~方法(8)にて得られた光学用基材1(1a)の微細凹凸構造面上に、透明誘電体層72を製膜することで光学用基材71を得ることができる。
以下の工程(161)~(167)により、連続プロセスにて光学用基材71を得ることができる。
(162)続いて、上記方法(1)~(9)で得られた光学用基材1(1a)の微細凹凸構造面側を、透明誘電体層72材料に押圧する。
(163)透明誘電体層72材料を硬化させた後に、光学用基材1(1a)を剥離することで基材上に、光学用基材1(1a)のパターンとは反転した形状を具備する透明誘電体層72を形成する。
(164)基材上に微細構造層材料をキャスト法、インクジェット法、スピンコート法等の方法により成膜する。
(165)工程(164)で得られた透明誘電体層72から成るパターンを押圧する。
(166)微細構造層材料を硬化させる。
(167)最後に、基材を剥離する。
工程(161)および(162)においては、光学用基材1(1a)上に透明誘電体層72材料を塗工し、その後、シリコンウェハ等の面精度のある基材を押圧してもよい。面精度のある基材としては、シリコンウェハや、シリコンウェハの鏡面を転写した樹脂等が挙げられる。
以下の工程(171)~(173)により、連続プロセスにて光学用基材71を得ることができる。
(172)続いて、上記方法(1)~(9)で得られた光学用基材1(1a)の微細凹凸構造面側を、透明誘電体層72材料に押圧する。
(173)透明誘電体層72材料を硬化させた後に、光学用基材1(1a)を剥離する。
以下、本発明の効果を明確にするために行った実施例をもとに本発明をより詳細に説明する。なお、下記実施の形態における材料、使用組成、処理工程等は例示的なものであり、適宜変更して実施することが可能である。その他、本発明の範囲を逸脱しない限りにおいて、適宜変更して実施することが可能である。そのため、本発明は以下の実施例によって何ら限定されるものではない。
(円筒状金型作製(樹脂モールド作製用鋳型の作製))
円筒状金型の基材としては、直径80mm、長さ50mmの円筒型石英ガラスロールを用いた。この円筒型石英ガラスロール表面に、次の方法により半導体パルスレーザを用いた直接描画リソグラフィ法により微細構造(微細凹凸構造)を形成した。
露光用半導体レーザ波長:405nm
露光レーザパワー:3.5mW
D2方向ピッチPx:398nm
D2方向ピッチPxに対する変動幅δ2:80nm
変動幅δ2のD2方向の長周期PxL :5μm
D1方向ピッチPy:460nm
D1方向ピッチPyに対する変動幅δ1:100nm
変動幅δ1のD1方向の長周期PyL :5μm
スピンドルモーターのZ相信号を基準に、1周に要する時間Tが測定され、線速度sから周長Lが計算され、次の式(12)が得られる。
L=T×s (12)
L/Py’=m (mは整数) (13)
L/PyL’=n (nは整数) (14)
fy0=s/Py’ (15)
fyL=s/PyL’ (16)
fy=fy0+δ1×sin(t×(fyL/fy0)×2π) (17)
スピンドルモーターのZ相信号を基準に、1周に要する時間Tが測定され、D2方向ピッチPxから、軸方向の基準送り速度Vx0が次の式(18)のように決定される。
Vx0=Px/T (18)
Vx=Vx0+Vδ2・sin(Px/PxL×t×2π) (19)
Vδ2=δ2×Vx0/Px (20)
得られた円筒状の石英ガラスロール表面(転写用モールド)に対し、デュラサーフHD-1101Z(ダイキン化学工業社製)を塗布し、60℃で1時間加熱後、室温で24時間静置、固定化した。その後、デュラサーフHD-ZV(ダイキン化学工業社製)で3回洗浄し、離型処理を施した。
D2方向ピッチPx:398nm
D2方向ピッチPxに対する変動幅δ2:80nm
変動幅δ2のD2方向の長周期PxL :5μm
D1方向ピッチPy:460nm
D1方向ピッチPyに対する変動幅δ1:100nm
変動幅δ1のD1方向の長周期PyL :5μm
装置;HITACHI s-5500
加速電圧;10kV
MODE;Normal
次に、OPTOOL DAC HP(ダイキン工業社製)、トリメチロールプロパントリアクリレート(東亞合成社製 M350)、およびIrgacure 184(Ciba社製)を重量部で10:100:5の割合で混合して光硬化性樹脂を調製した。この光硬化性樹脂をPETフィルム(A4100、東洋紡社製:幅300mm、厚さ100μm)の易接着面にマイクログラビアコーティング(廉井精機社製)により、塗布膜厚2μmになるように塗布した。
上記透明樹脂モールドシートを光学用基材として、有機EL素子を作製した。微細凹凸が形成されている面に、バッファー層、陰極、電子輸送層、ホール輸送層、陰極の順に積層した。各層の材料および膜厚、成膜方法は以下の通りである。
(1)バッファー層:SiO2 100nm 真空蒸着
(2)陰極:Ag 40nm 真空蒸着
(3)電子輸送層:Tris-(8-hydroxyquinoline)aluminum(Alq3) 40nm 真空蒸着
(4)ホール輸送層:N,N‘-diphenyl-N,N’-bis(1-naphtyl)-(1,1‘-biphenyl)-(4,4’-diamine)(NPB) 60nm 真空蒸着
(5)陽極:ITO 150nm スパッタリング
実施例1と同様に作製した円筒状金型を線速度s=1.0m/secで回転させながら、以下の条件で露光した。
露光用半導体レーザ波長:405nm
露光レーザパワー:3.5mW
D2方向ピッチPx:606nm
D2方向ピッチPxに対する変動幅δ2:61nm
変動幅δ2のD2方向の長周期PxL :6μm
D1方向ピッチPy:700nm
D1方向ピッチPyに対する変動幅δ1:70nm
変動幅δ1のD1方向の長周期PyL :7μm
実施例1と同様に作製した円筒状金型を線速度s=1.0m/secで回転させながら、以下の条件で露光した。
露光用半導体レーザ波長:405nm
露光レーザパワー:3.5mW
D2方向ピッチPx:700nm
D1方向ピッチPy:700nm
ピッチPyの基準信号の制御を初期のみとした。
このリール状透明樹脂モールドを用いて、実施例1と同様にして有機EL素子(実施例3)を作製した。
周期構造を持たない平滑なNi板を用いて、実施例1と全く同じ操作でフラットなUV硬化樹脂が積層されたPET基材上に有機EL素子(比較例1)を作製した。
実施例1と同様の製法により、直径80mm、長さ50mmの円筒型石英ガラスロール表面に微細構造を形成した。ただし、露光を以下の条件で行った。
露光用半導体レーザ波長:405nm
露光レーザパワー:3.5mW
D2方向ピッチPx:398nm
D1方向ピッチPy:460nm
D2方向ピッチPx:398nm
D1方向ピッチPy:460nm
実施例1~実施例3、比較例1、比較例2の有機EL素子の発光効率特性をコニカミノルタ製分光放射輝度計CS-2000にて測定した。比較例1の発光強度を1.0とした強度比の結果を下記表1に示す。
実施例1~実施例3、比較例1、比較例2の有機EL素子それぞれを発光させた状態で、サンプル周囲に白色の円筒形の紙をかぶせ、紙に投影された像を目視にて観察した。
(光学用基材1)
上記のように作製した反転樹脂モールドを、50cmの長さで切り出した。
D2方向ピッチPx:433nm
D2方向ピッチPxに対する変動幅δ2:108nm
変動幅δ2のD2方向の長周期PxL :5000nm
D1方向ピッチPy:500nm
D1方向ピッチPyに対する変動幅δ1:125nm
変動幅δ1のD1方向の長周期PyL :5000nm
材料1は、TTB:3APTMS:SH710:I.184=39.5g:39.5g:19.7g:1.34gを25℃、湿度50%の環境下にて撹拌混合することにより作製した。この材料1の屈折率は、波長460nmで1.513、波長550nmで1.507であった。
4インチφのシリコンウェハ基材表面を、UV-O3にて15分間処理した。続いて、Durasurf 1101Zをスピンコート製膜し、25度、湿度50%の雰囲気中で12時間静置した。そのあと、Durasurf HD-ZV溶液を用い、スピンコート洗浄を3回行った。
材料2は、TTB:DEDFS:TEOS:SH710=93.3g:2.38g:2.38:2.38gを25℃、湿度50%の環境下で撹拌混合し、続いて、80℃の雰囲気中で撹拌しながら、1706ulの3.25%にエタノールで希釈した水を滴下し、滴下後、6時間撹拌することにより作製した。この材料2の屈折率は、波長460nmで1.893、波長550nmで1.861であった。
上記光学用基材1より作製された光学用基材2を用い有機EL素子(実施例4)を作製した。光学用基材2の材料1の硬化物より構成される平坦化面上に、陽極、ホール輸送層、電子輸送層、陰極、バッファー層、陰極、電子輸送層、ホール輸送層、陰極の順に積層した。
・陽極:ITO 130nm スパッタリング
・ホール輸送層:N,N‘-diphenyl-N,N’-bis(1-naphtyl)-(1,1‘-biphenyl)-(4,4’-diamine)(NPB) 60nm 真空蒸着
・電子輸送層:Tris-(8-hydroxyquinoline)aluminum(Alq3) 40nm 真空蒸着
・陰極:Al 100nm 真空蒸着
本実施の形態に係る光学用基材1,2とは異なる基材を使用し、上記同様の方法にて、有機EL素子(比較例3~比較例5)を作製した。なお、比較例3の有機EL素子は、光学用基材1の作製で使用したガラス基材(フラット基材)を用い、比較例4の有機EL素子は、ピッチ500nmの微細構造が形成された光学用基材1(但し、微細構造の長周期変動はなし)を用い、比較例5の有機EL素子は、ピッチ5000nmの微細構造が形成された光学用基材1(但し、微細構造の長周期変動はなし)を用いた。
Claims (18)
- 少なくとも、陽極と陰極と発光層とで構成され、前記発光層が一層以上の有機層を有する有機EL発光デバイスに適用される光学用基材であって、
基材主面から面外方向に延在する複数の凸部または凹部から構成されるドットを含む微細構造層を備え、前記微細構造層は、前記基材主面内の第1方向において、前記複数のドットがピッチPyで配列された複数のドット列を構成し、一方、前記基材主面内の前記第1方向に直交する第2方向において、前記複数のドット列がピッチPxで配列された複数のドット列を構成しており、
前記ピッチPyおよび前記ピッチPxはいずれか一方がナノオーダーの一定間隔であり他方がナノオーダーの不定間隔であるか、またはいずれもナノオーダーの不定間隔であることを特徴とする光学用基材。 - 前記ナノオーダーの不定間隔が変動幅δであることを特徴とする請求項1に記載の光学用基材。
- 不定間隔の前記ピッチPyは、各ドットの中心間の距離に等しく、不定間隔の前記ピッチPxは、前記複数のドットが前記ピッチPyで配列された複数のドット列間距離に等しく、かつ、前記ピッチPyおよび前記ピッチPxは各ドットの直径より大きく、
前記ピッチPyが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ドット間の前記ピッチPyn(3≦n≦2aまたは3≦n≦2a+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(1)の関係を満たすとともに、前記第1方向において、前記ピッチPy1~Pynで構成されるドット群が少なくとも1個以上配列され、
前記ピッチPxが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ドット間の前記ピッチPxn(3≦n≦2aまたは3≦n≦2a+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(2)の関係を満たすとともに、
前記第2方向において、前記ピッチPx1~Pxnで構成されるドット列群が少なくとも1個以上配列されることを特徴とする請求項1に記載の光学用基材。
Py1<Py2<Py3<…<Pya>…>Pyn (1)
Px1<Px2<Px3<…<Pxa>…>Pxn (2) - 不定間隔の前記ピッチPyは、各ドットの中心間の距離に等しく、不定間隔の前記ピッチPxは、前記複数のドットが前記ピッチPyで配列された複数のドット列間距離に等しく、かつ、前記ピッチPyおよび前記ピッチPxは各ドットの直径より大きく、
前記ピッチPyが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ドット間の前記ピッチPyn(3≦n≦2aまたは3≦n≦2a+1、ただし、m,aは正の整数であり、n=m-1である)は、下記式(1)の関係を満たすとともに、前記第1方向において、前記ピッチPy1~Pynで構成されるドット群が、長周期単位Lyzを繰り返し配列した構成であり、かつ、
前記ピッチPxが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ドット間の前記ピッチPxn(3≦n≦2aまたは3≦n≦2a+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(2)の関係を満たすとともに、
前記第2方向において、前記ピッチPx1~Pxnで構成されるドット列群が、長周期単位Lxzを繰り返し配列した構成であることを特徴とする請求項1に記載の光学用基材。
Py1<Py2<Py3<…<Pya>…>Pyn (1)
Px1<Px2<Px3<…<Pxa>…>Pxn (2) - 前記したドットの各々の直径が、ピッチPyおよび/またはピッチPxに対応して増減し、
前記ピッチPyが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット径Dyn(3≦n≦2aまたは3≦n≦2n+1、ただしm、aは正の整数であり、n=m-1である)は、下記式(3)の関係を満たすとともに、前記第1方向において、前記ドット径Dy1~Dynで構成されるドット群が少なくとも1個以上配列され、
前記ピッチPxが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット径Dxn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(4)の関係を満たすとともに、前記第2方向において、前記ドット径Dx1~Dxnで構成されるドット群が少なくとも1個以上配列されることを特徴とする請求項3に記載の光学用基材。
Dy1<Dy2<Dy3<…<Dya>…>Dyn (3)
Dx1<Dx2<Dx3<…<Dxa>…>Dxn (4) - 前記したドットの各々の直径が、ピッチPyおよび/またはピッチPxに対応して増減し、
前記ピッチPyが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット径Dyn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(3)の関係を満たすとともに、前記第1方向において、前記ドット径Dy1~Dynで構成されるドット群が長周期単位Lyzで繰り返し配列され、かつ、
前記ピッチPxが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット径Dxn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(4)の関係を満たすとともに、前記第2方向において、前記ドット径Dx1~Dxnで構成されるドット群が長周期単位Lxzで繰り返し配列されることを特徴とする請求項4に記載の光学用基材。
Dy1<Dy2<Dy3<…<Dya>…>Dyn (3)
Dx1<Dx2<Dx3<…<Dxa>…>Dxn (4) - 前記したドットの各々の高さが、ピッチPyおよび/またはピッチPxに対応して増減し、
前記ピッチPyが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット高さHyn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(5)の関係を満たすとともに、前記第1方向において、前記ドット高さHy1~Hynで構成されるドット群が少なくとも1個以上配列され、
前記ピッチPxが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット高さHxn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(6)の関係を満たすとともに、前記第2方向において、前記ドット径Hx1~Hxnで構成されるドット群が少なくとも1個以上配列されることを特徴とする請求項5に記載の光学用基材。
Hy1<Hy2<Hy3<…<Hya>…>Hyn (5)
Hx1<Hx2<Hx3<…<Hxa>…>Hxn (6) - 前記したドットの各々の高さが、ピッチPyおよび/またはピッチPxに対応して増減し、
前記ピッチPyが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット高さHyn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(5)の関係を満たすとともに、前記第1方向において、前記ドット高さHy1~Hynで構成されるドット群が長周期単位Lyzで繰り返し配列され、かつ、
前記ピッチPxが不定間隔である場合には、少なくとも隣接する4個以上m個以下の前記ピッチを構成するドット高さHxn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(6)の関係を満たすとともに、前記第2方向において、前記ドット高さHx1~Hxnで構成されるドット群が長周期単位Lxzで繰り返し配列されることを特徴とする請求項6に記載の光学用基材。
Hy1<Hy2<Hy3<…<Hya>…>Hyn (5)
Hx1<Hx2<Hx3<…<Hxa>…>Hxn (6) - 少なくとも、陽極と陰極と発光層とで構成され、前記発光層が一層以上の有機層を有する有機EL発光デバイスに適用される光学用基材であって、
基材の主面から面外方向に延在する複数の凸部または凹部で構成される複数のドットを含む微細構造層を備え、前記微細構造層は、前記基材の主面内の第1方向において前記複数のドットが一定間隔のナノオーダーのピッチPyで配列されたドット列を構成し、且つ、これらのドット列を前記第1方向に直交する第2方向に一定間隔のナノオーダーのピッチPxで並設し、
隣接する第1ドット列及び第2ドット列間の前記第1方向におけるシフト量α1と、前記第2ドット列及び前記第2ドット列に隣接する第3ドット列間の前記第1方向におけるシフト量α2とが互いに異なることを特徴とする光学用基材。 - 前記シフト量α1と前記シフト量α2の差分が一定でないことを特徴とする請求項9に記載の光学用基材。
- 少なくとも、陽極と陰極と発光層とで構成され、前記発光層が一層以上の有機層を有する有機EL発光デバイスに適用される光学用基材であって、
前記基材の基材主面から面外方向に延在する複数の凸部から構成されるラインを含む微細構造層を形成し、前記基材主面内の前記第1方向に沿ってライン構造を形成し、前記基材主面内の前記第1方向に直交する第2方向において、前記複数のラインがピッチPxで配列された複数のライン列を有しており、
前記ピッチPxはナノオーダーの不定間隔であることを特徴とする光学用基材。 - 不定間隔の前記ピッチPxは、前記ライン構造の凸部幅より大きく、
少なくとも、隣接する4個以上m個以下の前記ピッチPxn(3≦n≦2aまたは3≦n≦2n+1、ただし、m、aは正の整数であり、n=m-1である)は、下記式(7)の関係を満たし、
前記第2方向において、前記ピッチPx1~Pxnで構成される長周期Lzが繰り返し配列されることを特徴とする請求項11に記載の光学用基材。
Px1<Px2<Px3<…<Pxa>…>Pxn (7) - 前記基材は、樹脂からなることを特徴とする請求項1から請求項12のいずれかに記載の光学用基材。
- 前記基材は、少なくとも、基材と前記微細構造層を構成する材料とで構成され、前記微細構造層を構成する材料の屈折率と、前記基材の屈折率との差が、0.15以下であることを特徴とする請求項1から請求項12のいずれかに記載の光学用基材。
- 前記基材の表面に、金属膜が被覆されることを特徴とする請求項1から請求項12のいずれかに記載の光学用基材。
- 前記基材は、金属からなることを特徴とする請求項1から請求項12のいずれかに記載の光学用基材。
- 前記基材の微細構造層の前記ドット上又は前記ライン上に設けられ、前記微細構造層の前記複数の凸部または凹部から構成されるドットまたは前記複数の凸部から構成されるラインに対応する形状の微細凹凸構造を有する透明誘電体層を具備し、前記透明誘電体層の前記微細凹凸構造を有する面とは反対側の面が平坦化されることを特徴とする請求項1から請求項12のいずれかに記載の光学用基材。
- 請求項1から請求項12のいずれかに記載の光学用基材を少なくとも1つ有する有機ELデバイスであって、前記発光層は、前記光学用基材の微細構造層側の主面に対向して配置されていることを特徴とする発光デバイス。
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP12863077.9A EP2799915A4 (en) | 2011-12-27 | 2012-12-25 | OPTICAL SUBSTRATE AND LIGHT-EMITTING DEVICE |
| CN201280065274.8A CN104024894A (zh) | 2011-12-27 | 2012-12-25 | 光学用基材及发光设备 |
| US14/369,126 US9541684B2 (en) | 2011-12-27 | 2012-12-25 | Substrate for optics and light emitting device |
| KR1020147017524A KR101665833B1 (ko) | 2011-12-27 | 2012-12-25 | 광학용 기재 및 발광 디바이스 |
| KR1020157034620A KR20150141196A (ko) | 2011-12-27 | 2012-12-25 | 광학용 기재 및 발광 디바이스 |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011-284820 | 2011-12-27 | ||
| JP2011284820 | 2011-12-27 | ||
| JP2012-024035 | 2012-02-07 | ||
| JP2012024035 | 2012-02-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2013099875A1 true WO2013099875A1 (ja) | 2013-07-04 |
Family
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| PCT/JP2012/083497 Ceased WO2013099875A1 (ja) | 2011-12-27 | 2012-12-25 | 光学用基材および発光デバイス |
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| Country | Link |
|---|---|
| US (1) | US9541684B2 (ja) |
| EP (1) | EP2799915A4 (ja) |
| JP (1) | JPWO2013099875A1 (ja) |
| KR (2) | KR101665833B1 (ja) |
| CN (1) | CN104024894A (ja) |
| TW (1) | TWI477824B (ja) |
| WO (1) | WO2013099875A1 (ja) |
Cited By (10)
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| JP2015075546A (ja) * | 2013-10-07 | 2015-04-20 | 旭化成イーマテリアルズ株式会社 | 光学用凹凸賦形体 |
| JP2015187923A (ja) * | 2014-03-26 | 2015-10-29 | 旭化成イーマテリアルズ株式会社 | 超格子正方配列型光学用基材及び発光素子 |
| JP2015226064A (ja) * | 2014-05-27 | 2015-12-14 | ザ・ボード・オブ・トラスティーズ・オブ・ザ・ユニバーシティ・オブ・イリノイThe Board Of Trustees Of The University Of Illinois | ナノ構造材料の方法および素子 |
| WO2016190056A1 (ja) * | 2015-05-25 | 2016-12-01 | Jxエネルギー株式会社 | 発光素子 |
| US9704924B2 (en) | 2015-01-26 | 2017-07-11 | Industrial Technology Research Institute | Light emitting device |
| US9741959B1 (en) | 2016-02-19 | 2017-08-22 | Industrial Technology Research Institute | Light emitting device |
| JP2017167231A (ja) * | 2016-03-15 | 2017-09-21 | 株式会社島津製作所 | レプリカ光学素子 |
| WO2017222064A1 (ja) * | 2016-06-24 | 2017-12-28 | 凸版印刷株式会社 | 光学デバイス、表示体、表示体付きデバイス、光学フィルタ、および、光学デバイスの製造方法 |
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Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015075546A (ja) * | 2013-10-07 | 2015-04-20 | 旭化成イーマテリアルズ株式会社 | 光学用凹凸賦形体 |
| JP2015187923A (ja) * | 2014-03-26 | 2015-10-29 | 旭化成イーマテリアルズ株式会社 | 超格子正方配列型光学用基材及び発光素子 |
| JP2015226064A (ja) * | 2014-05-27 | 2015-12-14 | ザ・ボード・オブ・トラスティーズ・オブ・ザ・ユニバーシティ・オブ・イリノイThe Board Of Trustees Of The University Of Illinois | ナノ構造材料の方法および素子 |
| CN105280832A (zh) * | 2014-05-27 | 2016-01-27 | 陶氏环球技术有限责任公司 | 纳米结构材料方法和装置 |
| KR101823662B1 (ko) * | 2014-05-27 | 2018-01-31 | 롬 앤드 하스 일렉트로닉 머트어리얼즈 엘엘씨 | 나노구조 재료 방법 및 디바이스 |
| JP2017151442A (ja) * | 2014-05-27 | 2017-08-31 | ザ・ボード・オブ・トラスティーズ・オブ・ザ・ユニバーシティ・オブ・イリノイThe Board Of Trustees Of The University Of Illinois | ナノ構造材料の方法および素子 |
| US9704924B2 (en) | 2015-01-26 | 2017-07-11 | Industrial Technology Research Institute | Light emitting device |
| JP2016219341A (ja) * | 2015-05-25 | 2016-12-22 | Jxエネルギー株式会社 | 発光素子 |
| WO2016190056A1 (ja) * | 2015-05-25 | 2016-12-01 | Jxエネルギー株式会社 | 発光素子 |
| US9741959B1 (en) | 2016-02-19 | 2017-08-22 | Industrial Technology Research Institute | Light emitting device |
| JP2017167231A (ja) * | 2016-03-15 | 2017-09-21 | 株式会社島津製作所 | レプリカ光学素子 |
| WO2017222064A1 (ja) * | 2016-06-24 | 2017-12-28 | 凸版印刷株式会社 | 光学デバイス、表示体、表示体付きデバイス、光学フィルタ、および、光学デバイスの製造方法 |
| CN112771443A (zh) * | 2018-08-23 | 2021-05-07 | 日东电工株式会社 | 用于高光学调制的超薄电致变色设备 |
| JP2021534466A (ja) * | 2018-08-23 | 2021-12-09 | 日東電工株式会社 | 高光変調用極薄型エレクトロクロミックデバイス |
| JP2023016819A (ja) * | 2019-02-05 | 2023-02-02 | 三菱ケミカル株式会社 | 画像表示用導光板 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20140097468A (ko) | 2014-08-06 |
| EP2799915A1 (en) | 2014-11-05 |
| TW201333544A (zh) | 2013-08-16 |
| TWI477824B (zh) | 2015-03-21 |
| JPWO2013099875A1 (ja) | 2015-05-07 |
| KR101665833B1 (ko) | 2016-10-12 |
| US20140326988A1 (en) | 2014-11-06 |
| KR20150141196A (ko) | 2015-12-17 |
| US9541684B2 (en) | 2017-01-10 |
| CN104024894A (zh) | 2014-09-03 |
| EP2799915A4 (en) | 2015-08-05 |
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