WO2013092304A1 - Anzeigevorrichtung und verfahren zur herstellung einer anzeigevorrichtung - Google Patents
Anzeigevorrichtung und verfahren zur herstellung einer anzeigevorrichtung Download PDFInfo
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- WO2013092304A1 WO2013092304A1 PCT/EP2012/075080 EP2012075080W WO2013092304A1 WO 2013092304 A1 WO2013092304 A1 WO 2013092304A1 EP 2012075080 W EP2012075080 W EP 2012075080W WO 2013092304 A1 WO2013092304 A1 WO 2013092304A1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H29/00—Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
- H10H29/10—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00
- H10H29/14—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00 comprising multiple light-emitting semiconductor components
- H10H29/142—Two-dimensional arrangements, e.g. asymmetric LED layout
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/441—Interconnections, e.g. scanning lines
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/83—Electrodes
- H10H20/831—Electrodes characterised by their shape
- H10H20/8312—Electrodes characterised by their shape extending at least partially through the bodies
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/857—Interconnections, e.g. lead-frames, bond wires or solder balls
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H29/00—Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
- H10H29/10—Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/036—Manufacture or treatment of packages
- H10H20/0364—Manufacture or treatment of packages of interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/851—Wavelength conversion means
- H10H20/8514—Wavelength conversion means characterised by their shape, e.g. plate or foil
Definitions
- Pixels can be controlled by a control in the multiplex
- the pixels can be controlled only one after the other, which in an increasing number of
- Display device requires ever higher currents through the pixel.
- An object to be solved is to provide a display device which enables high-resolution, high-repetition-rate imaging. Furthermore, a should
- a display device has a semiconductor layer sequence which has an active region provided for generating radiation and forms a plurality of pixels.
- the display device has continue to wear a carrier.
- the active region is between a first semiconductor layer and a second one
- the semiconductor layer sequence has at least one recess which extends from a main surface of the semiconductor layer sequence facing the carrier through the active region into the first semiconductor layer and is provided for electrical contacting of the first semiconductor layer.
- the carrier has a plurality of switches which are each provided for controlling at least one pixel. Preferably, each pixel is exactly one switch
- each pixel can be controlled by means of the associated switch.
- multiple pixels can thus simultaneously, in particular all pixels can be controlled simultaneously.
- Pixels preferably from a common
- a growth substrate for the semiconductor layer sequence is complete or at least partially removed or completely or at least partially thinned.
- the carrier may be the
- the display device is completely free of the growth substrate.
- the first connection layer may be arranged between the semiconductor layer sequence and the carrier.
- Terminal layer is the first semiconductor layer of the carrier side facing the semiconductor layer sequence ago electrically contacted. Furthermore, a second is preferred between the carrier and the semiconductor layer sequence
- Arranged terminal layer which is partially connected electrically conductively with the second semiconductor layer.
- the first connection layer and / or the second connection layer or at least one partial layer are preferably for the radiation to be generated during operation in the active region
- Reflectivity at least 50%, more preferably at least 70% for the radiation generated in the active region.
- the second connection layer can be arranged in regions between the semiconductor layer sequence and the first
- Connection layer may be arranged.
- the first connection layer and the second connection layer may be arranged.
- the first connection layer and / or the second connection layer can furthermore
- the first connection layer and / or the second connection layer may contain a TCO material (transparent conductive oxide).
- connection layers can form a common electrical contact for the pixels.
- the first connection layer for the first semiconductor layer can form a common electrical contact
- the second semiconductor layer of the pixels can be electrically conductively connected to one of the switches by means of the second connection layer or vice versa.
- the active area extends continuously over several pixels, in particular over all pixels. The active area is so
- the active region is subdivided into a plurality of segments, each of which forms a pixel.
- the subdivision between adjacent pixels may, for example, be formed by means of a respective trench which cuts through at least the active region.
- the trench can cover the entire semiconductor layer sequence
- the ditch can only be in the first
- Semiconductor layer may be formed. That is, the trench does not cut through the active area. By means of such a trench, the optical separation between the pixels can be improved without the active region being severed.
- the segments emerge from a common semiconductor layer sequence.
- the composition and the layer thicknesses of the semiconductor layer sequence of the segments are thus identical except for production-related variations in the epitaxial deposition.
- the at least one recess extends at least partially along a circumference of a segment.
- the recess can completely circumscribe the segment.
- Pixels along its circumference in particular be contacted electrically along its entire circumference, for example by means of the first connection layer.
- Connection layer may be arranged in the region of the recess between adjacent pixels and, for example, be formed lattice-shaped.
- the first connection layer forms a common electrical contact for the first semiconductor layer of the segments.
- a side surface of at least one segment in particular the side surfaces of several or all segments, a parallel or substantially parallel, approximately at an angle of at most 10 °, to the radiation exit surface of the display device extending projection, in which the first semiconductor layer electrically contacted.
- the first borders in particular, the first borders
- the switch is electrically conductively connected on one side to the first semiconductor layer and on another side to the second semiconductor layer of the pixel.
- the switch so the associated pixel can be electrically bridged.
- an individual controllability of the individual pixels can be achieved even with an electrical series circuit of one or more pixels.
- each of the pixels connected in series has an electrical bypass switch.
- the number of recesses can be varied within wide limits, in particular depending on the intended use of the display device and the size of the individual pixels.
- a uniform current injection it is preferable for a uniform current injection to have a plurality of recesses.
- the number of recesses is at least as large as the number of pixels. This can be the case both in an embodiment in which the first semiconductor layer is connected to a switch via the first connection layer, as well as in one embodiment
- Embodiment in which the first connection layer runs continuously over the pixels find application. Especially with a comparatively large lateral extent of the individual pixels, two or more recesses per pixel may be expedient. A homogeneous impression of charge carriers in the lateral direction in the active area of the pixel is thus simplified.
- the semiconductor layer sequence is on a side facing away from the carrier of the semiconductor layer sequence
- Radiation conversion element is preferably for this
- the radiation conversion element can extend continuously over several pixels, in particular over all pixels.
- the radiation conversion element may comprise a plurality of segments, each of which
- At least one pixel is assigned.
- three or more pixels can be combined to form a color triple, which is provided for the generation of radiation in the red, green and blue spectral range.
- Such a display device is suitable for the full-color display of still or moving images.
- a pad is formed on the semiconductor layer sequence.
- a carrier having a plurality of switches is provided.
- Semiconductor layer sequence is positioned relative to the carrier such that each pad is associated with a pad. Between the pads and the
- Semiconductor layer sequence is completely or partially removed.
- the method does not necessarily have to be performed in the order of the above enumeration.
- the removal of the growth substrate is preferably carried out after establishing an electrically conductive connection between the pads and the switches. In this case, the removal of the growth substrate thus takes place only after the pixels of the display device are already connected to the associated switches of the carrier.
- the semiconductor layer sequence can already be provided on a subcarrier other than the growth substrate serving auxiliary carrier.
- the submount can be the mechanical stabilization of
- Semiconductor layer sequence serve before the carrier is attached to the semiconductor layer sequence and performs this task. After attachment to the carrier of the
- Subcarrier be removed.
- the production of a plurality of display devices takes place simultaneously in a wafer composite, with a plurality of display devices resulting from the singulation of the wafer composite, for example by sawing or by means of a laser separation method.
- the separation into the display devices is preferably carried out after the
- FIGS. 8A to 8D show an exemplary embodiment of FIG
- FIG. 1 shows a first exemplary embodiment of a
- Display device 1 schematically in sectional view
- the display device has a plurality of pixels which are arranged side by side, in particular in a matrix-like manner.
- a detail of the display device with a first pixel 2a and a second pixel 2b is shown in the figure.
- the display device 1 has a semiconductor layer sequence 2.
- the semiconductor layer sequence has one for generation radiation provided active region 20 which extends in a vertical direction between a main surface 27 and a radiation exit surface 29.
- the active region is between a first semiconductor layer 21 of a first conductivity type and a second semiconductor layer 22 of a second different from the first conductivity type
- Semiconductor layer n-type and the second semiconductor layer may be p-type or vice versa.
- a plurality of recesses 25 is formed, which extend from the main surface through the second semiconductor layer 22 and the active region 20 into the first semiconductor layer 21 inside.
- the active region 20 can be provided for generating radiation in the visible spectral range, in the ultraviolet spectral range or in the infrared spectral range.
- the active area may be a
- Quantum well structure for example, a multiple quantum well structure have.
- the semiconductor layer sequence 2 in particular the active
- Area 20 preferably comprises a III-V compound semiconductor material.
- the semiconductor material can be any III-V compound semiconductor material.
- the semiconductor material can be any III-V compound semiconductor material.
- the semiconductor material can be any III-V compound semiconductor material.
- At least one group III element from the group consisting of Ga, Al and In and at least one group-V
- III-V compound semiconductor materials are known for
- the display device 1 furthermore has a carrier 5 on which the semiconductor layer sequence 2 is arranged and
- Integrated switches 51 which may be formed for example as a single transistor or as a circuit with a plurality of transistors and capacitors.
- Integrated switches 51 On one of the semiconductor layer sequence 2 facing the main surface 50 of the
- Support 5 is the switches 51 each associated with a contact area 54, which is for electrical connection to the
- Pixels 2a, 2b of the semiconductor layer sequence is provided. Between adjacent contact regions 54, an insulating region 53 is respectively provided on the main surface 50
- the carrier 5 may be formed, for example, as a silicon carrier, in which the switches 51 approximately in CMOS
- the carrier may also include other electronic components for
- the semiconductor layer sequence is also thermally conductively connected to the carrier 5, so that the waste heat generated during operation can be efficiently removed via the carrier.
- soldering such as brazing using solder paste
- a first one is present between the semiconductor layer sequence 2 and the carrier 5
- Terminal layer 31 and a second terminal layer 32 is arranged.
- the first connection layer 31 extends through the recesses 25 and is for the
- the second connection layer 32 is provided for electrically contacting the second semiconductor layer 22 and directly adjoins the second
- connection layers are preferably formed metallic and further preferably for the radiation generated in the active region 20
- Silver by a particularly high reflectivity in the visible and ultraviolet spectral range.
- another metal for example aluminum, nickel, gold, rhodium or palladium, or a metallic alloy with at least one of said materials, find application, for example, a silver-palladium alloy or Au: Ge.
- connection layers 31, 32 can also be designed as a multilayer.
- a sub-layer of the terminal layers 31, 32 may contain a TCO material, for example, indium tin oxide (ITO) or zinc oxide.
- the first connection layer 31 and the second connection layer 32 overlap in regions.
- the second connection layer 32 can thus directly adjoin the second semiconductor layer 22 in a comparatively large area and thus reflect a predominant part of the radiation emitted by the active area 20 in the direction of the carrier 5, so that the latter
- Radiation fraction can escape through the radiation exit surface 29.
- the second connection layer 32 forms for each pixel 2 a, 2 b a connection surface 35 which is connected to the contact region 54 of the associated switch 51.
- Semiconductor layer 21 is continuous by means of the first
- Terminal layer 31 is electrically contacted, so that the first terminal layer has a common contact for all Pixels 2a, 2b forms the display device and is connected directly to a supply line 52.
- the common contact may be connected to a supply line 52 at one or more locations or may be led out directly from the display device 1.
- Terminal layer 32 is a first insulating layer 41, for example, a silicon oxide layer arranged.
- Insulation layer serves the electrical insulation between the first terminal layer 31 and the second
- the pixels 2a, 2b via the switches 51 independently and
- the pixels are connected line by line and column by column with contact lines, so the number of pixels can be increased without requiring the switching times per pixel at a given
- Pixels can not be increased.
- the active area 20 is thus as a coherent area formed.
- the number of recesses 25 may depend on the size of the pixels and the transverse conductivity of the first
- Semiconductor layer can be varied within wide limits. Deviating from the illustrated exemplary embodiment, therefore, not every pixel has its own recess 25 or even its own recesses 25. Rather, a plurality of juxtaposed pixels may have a common recess 25. In extreme cases, a single recess may be sufficient for the entire display device.
- the edge length of the individual pixels 2a, 2b can be varied within wide ranges.
- the edge length may be between 1 ⁇ and 1 mm inclusive.
- Headlamps for example, for an adaptive
- Adaptive front lighting system in a motor vehicle, the edge length is
- the edge length is preferably between 1 ⁇ inclusive and 5 ⁇ inclusive.
- Pixels can be between 0.5 ⁇ and
- a metal for example gold, silver, copper, nickel or a metallic alloy with at least one of said materials, for example gold-tin, copper-silver Tin, indium-tin or nickel-tin.
- the second terminal layer 32 forms a common contact for all
- Pixels 2a, 2b of the display device 1. The first
- Connection layers 31 each form the connection surfaces 35, which are electrically conductively connected to the switches 51 assigned to the respective pixel.
- the radiation conversion element is a coherent one
- Color triplets are formed for the generation of radiation in the red, green and blue spectral range.
- the radiation conversion element 6 can be fixed in prefabricated form to the radiation exit surface 29 or formed directly on the radiation exit surface. Furthermore, the radiation conversion element
- the radiation conversion element as a
- ceramic radiation conversion element in which the particles provided for the radiation conversion alone, for example by sintering form a ceramic or are joined together with the aid of other materials to form a ceramic.
- the segments 6a, 6b of the radiation conversion element 6 can also be similar
- Radiation exit surface 29 at least through the active region, preferably through the entire semiconductor layer sequence 2 therethrough.
- the pixels 2a, 2b can be simplified visually and electrically separated by means of the trenches.
- the trenches can also extend only from the radiation exit surface 29 into the first semiconductor layer 21, without severing the active region 20.
- Such trenches can also be used with a continuous first semiconductor layer 21, as described for example in connection with FIG. 1,
- the side surfaces of the trenches are with the second
- the trenches 26 may be unfilled or filled with a filling material.
- the filling material can be used for the radiation generated in the active region 20
- the optical separation between adjacent pixels can be increased. As transparent or
- absorbent material for the trenches may be a dielectric material, such as a
- titanium oxide, filled plastic application find.
- a dielectric material as Filling material can also be dispensed with the second insulating layer 42 on the side surfaces of the trenches 42.
- Radiation conversion element 6 is formed as a continuous element which extends over the pixels 2a, 2b away.
- the radiation conversion element may in particular be formed in one piece.
- a radiation conversion element as described in connection with FIG. 2 can also be used.
- the radiation conversion elements 6 described in connection with FIGS. 2 and 3 are suitable for the display devices described in connection with all exemplary embodiments, even if these are simplified
- a pixel 2a unlike the embodiment shown in Figure 2, a plurality
- pixels 2a, 2b for example in a display device for a pixelated headlight.
- FIG. 4 essentially corresponds to the exemplary embodiment illustrated in connection with FIG. In contrast, everyone points
- Pixel 2a, 2b each have exactly one recess 25. The size of the individual pixels and thus the
- Such a display device 1 is suitable in particular as a light source for a
- the fifth embodiment shown in FIG. 5 differs from the preceding ones
- first semiconductor layer 21 of the pixel 2a is electrically conductively connected to the second semiconductor layer 22 of the adjacent pixel 2b via the terminal layers 31, 32.
- the switch 51 is on one side, for example at a source terminal of a transistor, via the first connection layer 31 with the first semiconductor layer 21 and on the other side, for example at a drain terminal of this transistor, via the second connection layer 32 with the second
- each pixel is assigned a switchable bridging of the carrier 5, so that the individual pixels 2a, 2b, despite the electrical
- Switch 51 can be controlled individually.
- FIG. 1 A sixth exemplary embodiment of a display device is shown schematically in FIG. This sixth
- Connection layer 31 each having a switch 51 and the second semiconductor layer 22 via the second connection layer 32 for each pixel in each case electrically connected to a further switch 55.
- Each pixel is thus assigned two switches.
- the display device 1 thus has no common contact for the pixels. The pixels can be contacted completely independently of each other.
- a seventh embodiment of a display device is shown schematically in FIG. This seventh
- the first connection layer 31 forms a common electrical contact for the first semiconductor layer 21 of the pixels 2a, 2b.
- Semiconductor layer 22 of the pixels is electrically conductively connected to one of the switches 51 by means of the second connection layer.
- the arranged in the recess first connection layer extends in a plan view of the
- the Charge carrier injection into the first semiconductor layer 21 can thus take place over the entire circumference of the individual pixels
- Terminal layer 31 of the active region 20 and of the second semiconductor layer 22, the insulating layer 41 covers the side surfaces 201 of the segments in regions.
- Pixels 2a, 2b are arranged. Lateral spaced from the trenches recesses for the electrical contact are therefore not required. Furthermore, the first connection layer 31 extends in a grid-like manner between the pixels 2a, 2b. An undesired optical crosstalk between adjacent pixels is thus avoided or at least reduced. Expediently, the first connection layer has at least one metal layer which is impermeable, in particular reflective, for the radiation produced during operation.
- the first connection layer 31 adjoins the first semiconductor layer 21 only on the side surface 201 of the pixels 2a, 2b.
- the radiation exit surface 29 is free of the first connection layer 31.
- the first connection layer can extend in the vertical direction up to the radiation exit surface and partially cover it.
- the first connection layer can extend in the vertical direction up to the radiation exit surface and partially cover it.
- Connection layer in each case like a frame on the
- the first connection layer a radiation-transmissive partial layer
- the first connection layer 31 and the second connection layer 32 extend without overlapping in a plan view of the display device 1.
- An electrical insulation between these layers can be achieved in a simplified manner.
- an overlapping arrangement is conceivable as long as these layers are electrically isolated from each other.
- the side surfaces 201 of the pixels 2a, 2b each have a projection 251. In the region of the projection, the side surface 201 extends parallel to the radiation exit surface 29
- Pixels jump to.
- the cross section of the pixels is thus on the carrier 5 side facing the projection at least partially smaller than on the side facing away from the carrier side of the projection.
- the first connection layer 31 adjoins the first in the region of the projection
- the projection 251 is formed by a bottom surface of the recess 25. Deviating from the embodiment with a projection, the side surface 201 of the pixels 2a, 2b may also be different
- Radiation exit surface 29 extend.
- the recess 25 can thus extend completely through the semiconductor layer sequence in the vertical direction, so that the Recess simultaneously forms the trenches between the pixels.
- the intermediate carrier may in particular be a growth substrate for the
- Semiconductor layer sequence act.
- a growth substrate is suitable depending on the material of the semiconductor layer sequence 2, for example, sapphire, silicon or gallium arsenide.
- the intermediate carrier can also be a subcarrier different from the growth substrate.
- a first connection layer 31 and a second connection layer 32 are formed on the main surface, which are for the electrical
- the second connection layer 32 is first formed.
- a first insulation layer 41 is applied, which partially covers the second connection layer 32 and the side surfaces of the recess 25.
- the first connection layer 31 is applied in such a way that it is completely electrically insulated from the second connection layer 32 and adjoins the first semiconductor layer 21 in the region of the recess 25.
- a carrier 5 is provided in which a
- a plurality of switches 51 is provided.
- the switches 51 are each on a main surface 50 of the carrier 5 a
- Terminal layer 31 serving for the electrical contact with the respectively associated switch 51
- Terminal 35 Deviating but may, as in
- Terminal layer 32 form the pads 35.
- the semiconductor layer sequence 2 and the carrier 5 are positioned relative to one another in such a way that the connection areas 35 and the contact areas 54 each overlap in plan view. In making a connection between the Semiconductor layer sequence 2 and the carrier 5 is thus between the pads 35 and the contact areas 54 an electrically conductive, mechanically stable and continue
- Intermediate carrier in particular of the growth substrate, can be effected, for example, mechanically, by means of grinding, chemically, for example by means of etching, or by means of a laser liftoff (LLO) method. Subsequently, the pixels may be as shown in FIG. 8D
- trenches 26 shown separated by trenches 26 from each other. Deviating from the trenches 26 also from the
- described display device can also be dispensed with the formation of trenches.
- Embodiment deviating the radiation exit surface 29 also cover. A structured application of the second insulating layer is not required in this case.
- Wafer composite are separated, for example mechanically, as by sawing, chemically, for example by wet chemical or dry chemical etching, or by means of a
- Display device can be controlled individually.
- the number of pixels can be increased in such a display device without affecting the operating time of the
- Microstructure of semiconductor layer sequences particularly small pixels and small distances between the pixels can be realized. Furthermore, the connection of the individual pixels 2a, 2b with the associated switches 51 can still take place in the wafer composite. Alternatively to a
- Display devices are connected to one another and subsequently separated, a semiconductor layer sequence already singulated into a plurality of semiconductor chips, in which the semiconductor chips each have a plurality of pixels 2a, 2b, can be transferred to a support for one or more display devices and electrically conductively connected thereto ,
- the display device is further characterized by a particularly compact design, in which the switches already in the semiconductor layer sequence mechanically
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Abstract
Description
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Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE112012005357.5T DE112012005357B4 (de) | 2011-12-22 | 2012-12-11 | Anzeigevorrichtung und Verfahren zur Herstellung einer Anzeigevorrichtung |
| CN201710590343.1A CN107464822B (zh) | 2011-12-22 | 2012-12-11 | 显示设备、用于制造显示设备的方法和像素化的前照灯 |
| JP2014547841A JP6072824B2 (ja) | 2011-12-22 | 2012-12-11 | 表示装置および表示装置の製造方法 |
| KR1020147016627A KR20140116382A (ko) | 2011-12-22 | 2012-12-11 | 디스플레이 소자와, 디스플레이 소자를 제조하는 방법 |
| CN201280064059.6A CN104011864B (zh) | 2011-12-22 | 2012-12-11 | 显示设备和用于制造显示设备的方法 |
| US14/367,821 US9362335B2 (en) | 2011-12-22 | 2012-12-11 | Display device and method for producing a display device |
| US15/147,499 US9748309B2 (en) | 2011-12-22 | 2016-05-05 | Display device and method for producing a display device |
| US15/663,936 US10461120B2 (en) | 2011-12-22 | 2017-07-31 | Display device and method for producing a display device |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102011056888.3 | 2011-12-22 | ||
| DE102011056888A DE102011056888A1 (de) | 2011-12-22 | 2011-12-22 | Anzeigevorrichtung und Verfahren zur Herstellung einer Anzeigevorrichtung |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
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| US15/147,499 Continuation US9748309B2 (en) | 2011-12-22 | 2016-05-05 | Display device and method for producing a display device |
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| KR101039610B1 (ko) | 2010-10-12 | 2011-06-09 | 엘지이노텍 주식회사 | 발광 소자 및 발광 소자 패키지 |
| DE102011102032A1 (de) | 2011-05-19 | 2012-11-22 | Osram Opto Semiconductors Gmbh | Optoelektronisches Halbleitermodul und Display mit einer Mehrzahl derartiger Module |
| DE102011056888A1 (de) * | 2011-12-22 | 2013-06-27 | Osram Opto Semiconductors Gmbh | Anzeigevorrichtung und Verfahren zur Herstellung einer Anzeigevorrichtung |
| US20150028754A1 (en) * | 2012-01-20 | 2015-01-29 | Osram Sylvania Inc. | Zero energy storage driver integrated in led chip carrier |
-
2011
- 2011-12-22 DE DE102011056888A patent/DE102011056888A1/de not_active Withdrawn
-
2012
- 2012-12-11 KR KR1020147016627A patent/KR20140116382A/ko not_active Ceased
- 2012-12-11 CN CN201280064059.6A patent/CN104011864B/zh active Active
- 2012-12-11 JP JP2014547841A patent/JP6072824B2/ja active Active
- 2012-12-11 US US14/367,821 patent/US9362335B2/en active Active
- 2012-12-11 WO PCT/EP2012/075080 patent/WO2013092304A1/de not_active Ceased
- 2012-12-11 CN CN201710590343.1A patent/CN107464822B/zh active Active
- 2012-12-11 DE DE112012005357.5T patent/DE112012005357B4/de active Active
-
2016
- 2016-05-05 US US15/147,499 patent/US9748309B2/en active Active
- 2016-12-28 JP JP2016254891A patent/JP2017098568A/ja active Pending
-
2017
- 2017-07-31 US US15/663,936 patent/US10461120B2/en active Active
-
2018
- 2018-07-23 JP JP2018137768A patent/JP6942097B2/ja active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110241031A1 (en) * | 2008-12-23 | 2011-10-06 | Osram Opto Semiconductors Gmbh | Optoelectronic projection device |
| DE102009047788A1 (de) * | 2009-09-30 | 2011-03-31 | Osram Opto Semiconductors Gmbh | Beleuchtungseinrichtung für eine Kamera sowie Verfahren zum Betrieb derselben |
| EP2341543A1 (de) * | 2009-12-31 | 2011-07-06 | Seoul Opto Device Co., Ltd. | Lichtemittierende Vorrichtung und Verfahren zu ihrer Herstellung |
Cited By (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9899418B2 (en) | 2012-12-14 | 2018-02-20 | Osram Opto Semiconductors Gmbh | Display device and method for producing a display device |
| WO2014090605A1 (de) * | 2012-12-14 | 2014-06-19 | Osram Opto Semiconductors Gmbh | Anzeigevorrichtung und verfahren zur herstellung einer anzeigevorrichtung |
| DE112013006060B4 (de) * | 2012-12-18 | 2025-01-30 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Verfahren zum Herstellen einer Mehrzahl von optoelektronischen Halbleiterchips und optoelektronischer Halbleiterchip |
| US9917077B2 (en) | 2013-03-15 | 2018-03-13 | Osram Opto Semiconductors Gmbh | Display device |
| US10297718B2 (en) | 2013-06-20 | 2019-05-21 | Epistar Corporation | Light-emitting device |
| JP2015015326A (ja) * | 2013-07-04 | 2015-01-22 | 晶元光電股▲ふん▼有限公司 | 発光装置 |
| CN105830215B (zh) * | 2013-12-20 | 2018-10-12 | 欧司朗光电半导体有限公司 | 光电子的半导体组件和用于机动车辆的自适应前照灯 |
| CN105830215A (zh) * | 2013-12-20 | 2016-08-03 | 欧司朗光电半导体有限公司 | 光电子的半导体组件和用于机动车辆的自适应前照灯 |
| DE102014101896A1 (de) | 2014-02-14 | 2015-08-20 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines optoelektronischen Halbleiterbauteils sowie optoelektronisches Halbleiterbauteil |
| US9685591B2 (en) | 2014-02-14 | 2017-06-20 | Osram Opto Semiconductors Gmbh | Method for producing an optoelectronic semiconductor component and optoelectronic semiconductor component |
| JP2017510980A (ja) * | 2014-02-14 | 2017-04-13 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツングOsram Opto Semiconductors GmbH | オプトエレクトロニクス半導体部品を製造するための方法およびオプトエレクトロニクス半導体部品 |
| WO2015121062A1 (de) | 2014-02-14 | 2015-08-20 | Osram Opto Semiconductors Gmbh | Verfahren zur herstellung eines optoelektronischen halbleiterbauteils sowie optoelektronisches halbleiterbauteil |
| JP2015173222A (ja) * | 2014-03-12 | 2015-10-01 | スタンレー電気株式会社 | 半導体発光装置 |
| US20170309794A1 (en) * | 2014-09-01 | 2017-10-26 | Osram Opto Semiconductors Gmbh | Optoelectronic semiconductor chip and method for producing an optoelectronic semiconductor chip |
| DE102014112750A1 (de) | 2014-09-04 | 2016-03-10 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines optoelektronischen Halbleiterbauteils und optoelektronisches Halbleiterbauteil |
| US10026868B2 (en) | 2014-09-04 | 2018-07-17 | Osram Opto Semiconductors Gmbh | Method for producing an optoelectronic semiconductor component, and optoelectronic semiconductor component |
| US10516079B2 (en) | 2014-09-04 | 2019-12-24 | Osram Opto Semiconductors Gmbh | Method for producing an optoelectronic semiconductor component, and optoelectronic semiconductor component |
| EP3021361A1 (de) * | 2014-11-17 | 2016-05-18 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Emittierende vorrichtung, die erste und zweite benachbarte pixel umfasst, die sich denselben emittierenden stapel von halbleitern teilen |
| JP2017536704A (ja) * | 2014-12-04 | 2017-12-07 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツングOsram Opto Semiconductors GmbH | オプトエレクトロニクス半導体デバイスおよびオプトエレクトロニクス半導体デバイスの製造方法 |
| US10586827B2 (en) | 2014-12-04 | 2020-03-10 | Osram Opto Semiconductors Gmbh | Optoelectronic semiconductor component and method for fabricating an optoelectronic semiconductor component |
| US10475778B2 (en) * | 2015-05-29 | 2019-11-12 | Osram Opto Semiconductors Gmbh | Optoelectronic component and method for producing an optoelectronic component |
| US11745415B2 (en) | 2015-09-18 | 2023-09-05 | Osram Oled Gmbh | Optoelectronic semiconductor component and 3D printer |
| US10906235B2 (en) * | 2015-09-18 | 2021-02-02 | Osram Oled Gmbh | Optoelectronic semiconductor component and 3D printer |
| US10566500B2 (en) | 2016-06-17 | 2020-02-18 | Osram Opto Semiconductors Gmbh | Optoelectronic semiconductor component |
| WO2017215910A1 (de) * | 2016-06-17 | 2017-12-21 | Osram Opto Semiconductors Gmbh | Optoelektronisches halbleiterbauelement |
| WO2018185086A1 (de) | 2017-04-04 | 2018-10-11 | Osram Opto Semiconductors Gmbh | Verfahren zum herstellen eines optoelektronischen halbleiterbauelements und optoelektronisches halbleiterbauelement |
| US11069842B2 (en) | 2017-04-04 | 2021-07-20 | Osram Oled Gmbh | Method for producing an optoelectronic semiconductor component and optoelectronic semiconductor component |
| DE102017107201A1 (de) | 2017-04-04 | 2018-10-04 | Osram Opto Semiconductors Gmbh | Verfahren zum Herstellen eines optoelektronischen Halbleiterbauelements und optoelektronisches Halbleiterbauelement |
| WO2019155146A1 (fr) * | 2018-02-06 | 2019-08-15 | Aledia | Dispositif optoélectronique avec des composants électroniques au niveau de la face arrière du substrat et procédé de fabrication |
| FR3077653A1 (fr) * | 2018-02-06 | 2019-08-09 | Aledia | Dispositif optoelectronique avec des composants electroniques au niveau de la face arriere du substrat et procede de fabrication |
| US11552126B2 (en) | 2018-02-06 | 2023-01-10 | Aledia | Optoelectronic device with electronic components at the level of the rear face of the substrate and manufacturing method |
| WO2020187845A1 (de) * | 2019-03-19 | 2020-09-24 | Osram Opto Semiconductors Gmbh | Optoelektronische halbleitervorrichtung mit einer vielzahl von bildelementen und trennelementen und verfahren zur herstellung der optoelektronischen halbleitervorrichtung |
| US12176380B2 (en) | 2019-03-19 | 2024-12-24 | Osram Opto Semiconductors Gmbh | Optoelectronic semiconductor device with a plurality of image elements and separating elements, and method for producing the optoelectronic semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2018207114A (ja) | 2018-12-27 |
| DE102011056888A1 (de) | 2013-06-27 |
| DE112012005357A5 (de) | 2014-08-28 |
| DE112012005357B4 (de) | 2023-05-04 |
| US10461120B2 (en) | 2019-10-29 |
| JP2017098568A (ja) | 2017-06-01 |
| US9748309B2 (en) | 2017-08-29 |
| US20170352700A1 (en) | 2017-12-07 |
| CN107464822A (zh) | 2017-12-12 |
| CN104011864B (zh) | 2017-08-15 |
| KR20140116382A (ko) | 2014-10-02 |
| JP6942097B2 (ja) | 2021-09-29 |
| CN104011864A (zh) | 2014-08-27 |
| US20160247855A1 (en) | 2016-08-25 |
| US20150014716A1 (en) | 2015-01-15 |
| US9362335B2 (en) | 2016-06-07 |
| CN107464822B (zh) | 2022-03-15 |
| JP6072824B2 (ja) | 2017-02-01 |
| JP2015501085A (ja) | 2015-01-08 |
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