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WO2009022577A1 - 光センサおよびそれを備えた表示装置 - Google Patents

光センサおよびそれを備えた表示装置 Download PDF

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Publication number
WO2009022577A1
WO2009022577A1 PCT/JP2008/064025 JP2008064025W WO2009022577A1 WO 2009022577 A1 WO2009022577 A1 WO 2009022577A1 JP 2008064025 W JP2008064025 W JP 2008064025W WO 2009022577 A1 WO2009022577 A1 WO 2009022577A1
Authority
WO
WIPO (PCT)
Prior art keywords
photodiode
optical sensor
cathode
display device
input terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/064025
Other languages
English (en)
French (fr)
Inventor
Hiromi Katoh
Christopher Brown
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to CN200880019640XA priority Critical patent/CN101680803B/zh
Priority to US12/673,454 priority patent/US8179386B2/en
Publication of WO2009022577A1 publication Critical patent/WO2009022577A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J1/46—Electric circuits using a capacitor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
    • G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
    • G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4204—Photometry, e.g. photographic exposure meter using electric radiation detectors with determination of ambient light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228—Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
    • G02F1/13312—Circuits comprising photodetectors for purposes other than feedback
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
    • G02F1/13318—Circuits comprising a photodetector

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Position Input By Displaying (AREA)

Abstract

　表示装置のアクティブマトリクス基板内に少なくとも一部がモノリシックに作り込まれた光センサである。この光センサは、迷光や光検出素子の特性ばらつきの影響を除外して周囲光を精度良く検出するために、検出用フォトダイオード（１１）と、遮光膜（１５）で覆われた参照用フォトダイオード（１２）とを備える。この光センサは、さらに、検出用フォトダイオード（１１）のカソードに一方の入力端子が接続され、参照用フォトダイオード（１２）のカソードに他方の入力端子が接続された差動増幅器（１６）と、積分コンデンサ（１９）と、リセットスイッチ（２２）とを備える。この光センサはさらに、参照用フォトダイオード（１２）および検出用フォトダイオード（１１）のアノードの電位を、参照用フォトダイオード（１２）のカソード電位よりも開路電圧ＶOCだけ高い電位と等しくするために、比較器（２１）とローパスフィルタ（２０）とを備える。
PCT/JP2008/064025 2007-08-10 2008-08-05 光センサおよびそれを備えた表示装置 Ceased WO2009022577A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN200880019640XA CN101680803B (zh) 2007-08-10 2008-08-05 光传感器和包括该光传感器的显示装置
US12/673,454 US8179386B2 (en) 2007-08-10 2008-08-05 Optical sensor and display device provided with the same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007209972 2007-08-10
JP2007-209972 2007-08-10

Publications (1)

Publication Number Publication Date
WO2009022577A1 true WO2009022577A1 (ja) 2009-02-19

Family

ID=40350631

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/064025 Ceased WO2009022577A1 (ja) 2007-08-10 2008-08-05 光センサおよびそれを備えた表示装置

Country Status (3)

Country Link
US (1) US8179386B2 (ja)
CN (1) CN101680803B (ja)
WO (1) WO2009022577A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108476020A (zh) * 2015-11-13 2018-08-31 拜尔沃逊股份公司 具有光学敏感输入元件的设备
CN115128358A (zh) * 2022-07-28 2022-09-30 深圳市汇顶科技股份有限公司 电容检测电路、芯片及电子设备

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5225985B2 (ja) * 2007-05-18 2013-07-03 シャープ株式会社 表示装置
KR100981970B1 (ko) * 2008-10-17 2010-09-13 삼성모바일디스플레이주식회사 광 감지 회로 및 이를 포함하는 평판 표시 장치
JP5866089B2 (ja) * 2009-11-20 2016-02-17 株式会社半導体エネルギー研究所 電子機器
TWI507934B (zh) * 2009-11-20 2015-11-11 Semiconductor Energy Lab 顯示裝置
KR102031848B1 (ko) 2010-01-20 2019-10-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 전자 기기 및 전자 시스템
US9477263B2 (en) 2011-10-27 2016-10-25 Apple Inc. Electronic device with chip-on-glass ambient light sensors
US8872093B2 (en) * 2012-04-18 2014-10-28 Apple Inc. Calibrated image-sensor-based ambient light sensor
US9129548B2 (en) 2012-11-15 2015-09-08 Apple Inc. Ambient light sensors with infrared compensation
DE102013109020B4 (de) 2013-08-21 2016-06-09 Pmdtechnologies Gmbh Streulichtreferenzpixel
CN105095800B (zh) * 2014-05-08 2018-07-20 中芯国际集成电路制造(上海)有限公司 光检测器
CN104501386B (zh) * 2014-12-10 2018-08-17 广东美的制冷设备有限公司 用于家用电器的面板组件、空调器及面板组件的测光方法
GB2560376B (en) 2017-03-10 2020-02-12 Toshiba Kk On-Chip Integration of a Bias Tee and a Single Photon Detector
CN110322846B (zh) * 2018-03-29 2021-01-15 京东方科技集团股份有限公司 一种显示装置的电荷释放电路及其驱动方法、显示装置
EP3811055A4 (en) * 2018-06-19 2022-08-10 Becton, Dickinson and Company VARIABLE MULTIPLEXING SWITCHES FOR SENSOR NETWORKS, SYSTEMS AND METHODS OF USE THEREOF

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000332546A (ja) * 1999-05-18 2000-11-30 Sharp Corp 受光アンプ回路
JP2005311542A (ja) * 2004-04-19 2005-11-04 Hamamatsu Photonics Kk 固体撮像装置
WO2006117956A1 (ja) * 2005-04-28 2006-11-09 Sharp Kabushiki Kaisha 液晶表示装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7265740B2 (en) * 2002-08-30 2007-09-04 Toshiba Matsushita Display Technology Co., Ltd. Suppression of leakage current in image acquisition
KR100669270B1 (ko) * 2003-08-25 2007-01-16 도시바 마쯔시따 디스플레이 테크놀로지 컴퍼니, 리미티드 표시 장치 및 광전 변환 소자

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000332546A (ja) * 1999-05-18 2000-11-30 Sharp Corp 受光アンプ回路
JP2005311542A (ja) * 2004-04-19 2005-11-04 Hamamatsu Photonics Kk 固体撮像装置
WO2006117956A1 (ja) * 2005-04-28 2006-11-09 Sharp Kabushiki Kaisha 液晶表示装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108476020A (zh) * 2015-11-13 2018-08-31 拜尔沃逊股份公司 具有光学敏感输入元件的设备
CN108476020B (zh) * 2015-11-13 2021-11-30 柏奥赛私人有限公司 具有光学敏感输入元件的设备
CN115128358A (zh) * 2022-07-28 2022-09-30 深圳市汇顶科技股份有限公司 电容检测电路、芯片及电子设备

Also Published As

Publication number Publication date
CN101680803B (zh) 2011-06-15
US20110199349A1 (en) 2011-08-18
US8179386B2 (en) 2012-05-15
CN101680803A (zh) 2010-03-24

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