WO2009008424A1 - ケイ素化合物の製造方法 - Google Patents
ケイ素化合物の製造方法 Download PDFInfo
- Publication number
- WO2009008424A1 WO2009008424A1 PCT/JP2008/062327 JP2008062327W WO2009008424A1 WO 2009008424 A1 WO2009008424 A1 WO 2009008424A1 JP 2008062327 W JP2008062327 W JP 2008062327W WO 2009008424 A1 WO2009008424 A1 WO 2009008424A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- general formula
- silicon compound
- producing silicon
- compound represented
- producing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F7/00—Compounds containing elements of Groups 4 or 14 of the Periodic Table
- C07F7/02—Silicon compounds
- C07F7/08—Compounds having one or more C—Si linkages
- C07F7/18—Compounds having one or more C—Si linkages as well as one or more C—O—Si linkages
- C07F7/1804—Compounds having Si-O-C linkages
- C07F7/1872—Preparation; Treatments not provided for in C07F7/20
- C07F7/1876—Preparation; Treatments not provided for in C07F7/20 by reactions involving the formation of Si-C linkages
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
Abstract
下記一般式(7)で表されるケイ素化合物を製造する方法であって、下記一般式(1)で表される有機マグネシウム化合物と、下記一般式(2)で表される有機シラン化合物とを、下記一般式(3)、下記一般式(4)、下記一般式(5)、および下記一般式(6)で表される化合物から選ばれる少なくとも1種を含む溶媒の下で反応させる工程を含む方法。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/668,523 US20100261925A1 (en) | 2007-07-10 | 2008-07-08 | Method for producing silicon compound |
Applications Claiming Priority (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007180930 | 2007-07-10 | ||
| JP2007-180930 | 2007-07-10 | ||
| JP2008-020297 | 2008-01-31 | ||
| JP2008-020298 | 2008-01-31 | ||
| JP2008-020296 | 2008-01-31 | ||
| JP2008020297 | 2008-01-31 | ||
| JP2008020296 | 2008-01-31 | ||
| JP2008020298 | 2008-01-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2009008424A1 true WO2009008424A1 (ja) | 2009-01-15 |
Family
ID=40228594
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2008/062327 Ceased WO2009008424A1 (ja) | 2007-07-10 | 2008-07-08 | ケイ素化合物の製造方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20100261925A1 (ja) |
| TW (1) | TW200909443A (ja) |
| WO (1) | WO2009008424A1 (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8932674B2 (en) | 2010-02-17 | 2015-01-13 | American Air Liquide, Inc. | Vapor deposition methods of SiCOH low-k films |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20250369102A1 (en) * | 2024-06-03 | 2025-12-04 | Applied Materials, Inc. | Lower k and higher hardness with improved plasma induced damage (pid) dielectric film deposition |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63250388A (ja) * | 1987-04-03 | 1988-10-18 | Shin Etsu Chem Co Ltd | モノアルコキシシラン化合物の製造方法 |
| JPH06345781A (ja) * | 1993-06-07 | 1994-12-20 | Shin Etsu Chem Co Ltd | オルガノアルコキシシラン化合物の製造方法 |
| JP2002179687A (ja) * | 2000-12-18 | 2002-06-26 | Dow Corning Toray Silicone Co Ltd | オルガノアルコキシシランの製造方法 |
Family Cites Families (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6499679B1 (en) * | 1997-12-04 | 2002-12-31 | Basf Aktiengesellschaft | Granular spreader and product container |
| US7354873B2 (en) * | 1998-02-05 | 2008-04-08 | Asm Japan K.K. | Method for forming insulation film |
| US7064088B2 (en) * | 1998-02-05 | 2006-06-20 | Asm Japan K.K. | Method for forming low-k hard film |
| US6881683B2 (en) * | 1998-02-05 | 2005-04-19 | Asm Japan K.K. | Insulation film on semiconductor substrate and method for forming same |
| US6432846B1 (en) * | 1999-02-02 | 2002-08-13 | Asm Japan K.K. | Silicone polymer insulation film on semiconductor substrate and method for forming the film |
| US6514880B2 (en) * | 1998-02-05 | 2003-02-04 | Asm Japan K.K. | Siloxan polymer film on semiconductor substrate and method for forming same |
| US6852650B2 (en) * | 1998-02-05 | 2005-02-08 | Asm Japan K.K. | Insulation film on semiconductor substrate and method for forming same |
| US7582575B2 (en) * | 1998-02-05 | 2009-09-01 | Asm Japan K.K. | Method for forming insulation film |
| US20060258176A1 (en) * | 1998-02-05 | 2006-11-16 | Asm Japan K.K. | Method for forming insulation film |
| TW437017B (en) * | 1998-02-05 | 2001-05-28 | Asm Japan Kk | Silicone polymer insulation film on semiconductor substrate and method for formation thereof |
| US6383955B1 (en) * | 1998-02-05 | 2002-05-07 | Asm Japan K.K. | Silicone polymer insulation film on semiconductor substrate and method for forming the film |
| US6784123B2 (en) * | 1998-02-05 | 2004-08-31 | Asm Japan K.K. | Insulation film on semiconductor substrate and method for forming same |
| US6303523B2 (en) * | 1998-02-11 | 2001-10-16 | Applied Materials, Inc. | Plasma processes for depositing low dielectric constant films |
| US6627532B1 (en) * | 1998-02-11 | 2003-09-30 | Applied Materials, Inc. | Method of decreasing the K value in SiOC layer deposited by chemical vapor deposition |
| US6340435B1 (en) * | 1998-02-11 | 2002-01-22 | Applied Materials, Inc. | Integrated low K dielectrics and etch stops |
| US6054379A (en) * | 1998-02-11 | 2000-04-25 | Applied Materials, Inc. | Method of depositing a low k dielectric with organo silane |
| US6593247B1 (en) * | 1998-02-11 | 2003-07-15 | Applied Materials, Inc. | Method of depositing low k films using an oxidizing plasma |
| US6413583B1 (en) * | 1998-02-11 | 2002-07-02 | Applied Materials, Inc. | Formation of a liquid-like silica layer by reaction of an organosilicon compound and a hydroxyl forming compound |
| US6287990B1 (en) * | 1998-02-11 | 2001-09-11 | Applied Materials, Inc. | CVD plasma assisted low dielectric constant films |
| US6660656B2 (en) * | 1998-02-11 | 2003-12-09 | Applied Materials Inc. | Plasma processes for depositing low dielectric constant films |
| US6800571B2 (en) * | 1998-09-29 | 2004-10-05 | Applied Materials Inc. | CVD plasma assisted low dielectric constant films |
| US7091137B2 (en) * | 2001-12-14 | 2006-08-15 | Applied Materials | Bi-layer approach for a hermetic low dielectric constant layer for barrier applications |
| US6699784B2 (en) * | 2001-12-14 | 2004-03-02 | Applied Materials Inc. | Method for depositing a low k dielectric film (K>3.5) for hard mask application |
| US6838393B2 (en) * | 2001-12-14 | 2005-01-04 | Applied Materials, Inc. | Method for producing semiconductor including forming a layer containing at least silicon carbide and forming a second layer containing at least silicon oxygen carbide |
| US6890850B2 (en) * | 2001-12-14 | 2005-05-10 | Applied Materials, Inc. | Method of depositing dielectric materials in damascene applications |
| KR101227664B1 (ko) * | 2002-01-31 | 2013-01-29 | 도소 가부시키가이샤 | 유기실란화합물을 포함하여 구성되는 절연막용 재료, 그 제조방법 및 반도체장치 |
| TWI282124B (en) * | 2002-11-28 | 2007-06-01 | Tosoh Corp | Insulating film material containing an organic silane compound, its production method and semiconductor device |
| EP1705208B1 (en) * | 2004-01-16 | 2013-03-20 | JSR Corporation | Composition for forming insulating film, method for producing same, silica insulating film, and method for forming same |
| TW200536621A (en) * | 2004-01-16 | 2005-11-16 | Jsr Corp | Method for producing polymer, polymer, composition for forming insulating film, method for producing insulating film, and insulating film |
| JP5110239B2 (ja) * | 2004-05-11 | 2012-12-26 | Jsr株式会社 | 有機シリカ系膜の形成方法、膜形成用組成物 |
| KR101140535B1 (ko) * | 2004-05-11 | 2012-05-02 | 제이에스알 가부시끼가이샤 | 유기 실리카계 막의 형성 방법, 유기 실리카계 막, 배선구조체, 반도체 장치 및 막 형성용 조성물 |
| JP5110238B2 (ja) * | 2004-05-11 | 2012-12-26 | Jsr株式会社 | 絶縁膜形成用組成物およびその製造方法、ならびにシリカ系絶縁膜およびその形成方法 |
| JP5365785B2 (ja) * | 2008-05-30 | 2013-12-11 | Jsr株式会社 | 有機ケイ素化合物の製造方法 |
-
2008
- 2008-07-08 WO PCT/JP2008/062327 patent/WO2009008424A1/ja not_active Ceased
- 2008-07-08 US US12/668,523 patent/US20100261925A1/en not_active Abandoned
- 2008-07-10 TW TW097126027A patent/TW200909443A/zh unknown
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63250388A (ja) * | 1987-04-03 | 1988-10-18 | Shin Etsu Chem Co Ltd | モノアルコキシシラン化合物の製造方法 |
| JPH06345781A (ja) * | 1993-06-07 | 1994-12-20 | Shin Etsu Chem Co Ltd | オルガノアルコキシシラン化合物の製造方法 |
| JP2002179687A (ja) * | 2000-12-18 | 2002-06-26 | Dow Corning Toray Silicone Co Ltd | オルガノアルコキシシランの製造方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8932674B2 (en) | 2010-02-17 | 2015-01-13 | American Air Liquide, Inc. | Vapor deposition methods of SiCOH low-k films |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200909443A (en) | 2009-03-01 |
| US20100261925A1 (en) | 2010-10-14 |
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