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WO2009003714A3 - Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina - Google Patents

Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina Download PDF

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Publication number
WO2009003714A3
WO2009003714A3 PCT/EP2008/005468 EP2008005468W WO2009003714A3 WO 2009003714 A3 WO2009003714 A3 WO 2009003714A3 EP 2008005468 W EP2008005468 W EP 2008005468W WO 2009003714 A3 WO2009003714 A3 WO 2009003714A3
Authority
WO
WIPO (PCT)
Prior art keywords
scattered light
sample
electromagnetic radiation
small volumes
measuring static
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2008/005468
Other languages
English (en)
French (fr)
Other versions
WO2009003714A2 (de
Inventor
Christoph Janzen
Reinhard Noll
Walter Uhl
Kurt Hoffmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fraunhofer Gesellschaft zur Foerderung der Angewandten Forschung eV
Original Assignee
Fraunhofer Gesellschaft zur Foerderung der Angewandten Forschung eV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Gesellschaft zur Foerderung der Angewandten Forschung eV filed Critical Fraunhofer Gesellschaft zur Foerderung der Angewandten Forschung eV
Priority to JP2010513791A priority Critical patent/JP2010532468A/ja
Priority to EP08784613A priority patent/EP2165182A2/de
Priority to US12/667,601 priority patent/US20100315635A1/en
Publication of WO2009003714A2 publication Critical patent/WO2009003714A2/de
Publication of WO2009003714A3 publication Critical patent/WO2009003714A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4752—Geometry
    • G01N2021/4759—Annular illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Die Erfindung betrifft eine Vorrichtung zur Durchführung von Streulichtmessungen, aufweisend mindestens ein Fokussierungselement, mit dem elektromagnetische Strahlung auf eine Probe fokussiert werden kann, einen Detektor, sowie eine Detektionsoptik, mit der von der Probe gestreute elektromagnetische Strahlung zu dem Detektor geleitet werden kann, dadurch gekennzeichnet, dass ein Mittel zur Bildung eines Ringstrahls vorhanden ist, dass durch das mindestens eine Fokussierungselement eine Fokussierung des Ringstrahls auf einen Fokuspunkt innerhalb der Probe bewirkbar ist und dass durch die Detektionsoptik von der Probe gestreute elektromagnetische Strahlung erfassbar ist, welche sich innerhalb des vom Ringstrahl umgebenen Raumes ausbreitet.
PCT/EP2008/005468 2007-07-05 2008-07-04 Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina Ceased WO2009003714A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010513791A JP2010532468A (ja) 2007-07-05 2008-07-04 低容積で静的錯乱光および動的錯乱光を測定するための装置および方法
EP08784613A EP2165182A2 (de) 2007-07-05 2008-07-04 Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina
US12/667,601 US20100315635A1 (en) 2007-07-05 2008-07-04 Device and method for measuring static and dynamic scattered light in small volumes

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007031244.1 2007-07-05
DE102007031244A DE102007031244B3 (de) 2007-07-05 2007-07-05 Vorrichtung und Verfahren zur Durchführung statischer und dynamischer Streulichtmessungen in kleinen Volumina

Publications (2)

Publication Number Publication Date
WO2009003714A2 WO2009003714A2 (de) 2009-01-08
WO2009003714A3 true WO2009003714A3 (de) 2009-03-19

Family

ID=40076266

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2008/005468 Ceased WO2009003714A2 (de) 2007-07-05 2008-07-04 Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina

Country Status (5)

Country Link
US (1) US20100315635A1 (de)
EP (1) EP2165182A2 (de)
JP (1) JP2010532468A (de)
DE (1) DE102007031244B3 (de)
WO (1) WO2009003714A2 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5911354B2 (ja) 2012-03-30 2016-04-27 オリンパス株式会社 倒立顕微鏡
US9419573B2 (en) 2014-06-27 2016-08-16 Nxp, B.V. Variable gain transimpedance amplifier
US9851200B2 (en) 2015-06-26 2017-12-26 Glasstech, Inc. Non-contact gaging system and method for contoured panels having specular surfaces
US9470641B1 (en) 2015-06-26 2016-10-18 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured glass sheets
US9841276B2 (en) 2015-06-26 2017-12-12 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured glass sheet
US9952037B2 (en) 2015-06-26 2018-04-24 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured sheet
US9952039B2 (en) 2015-06-26 2018-04-24 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured panels having specular surfaces
US9933251B2 (en) 2015-06-26 2018-04-03 Glasstech, Inc. Non-contact gaging system and method for contoured glass sheets
DK3150988T3 (da) 2015-10-01 2021-04-26 Nanotemper Tech Gmbh System og fremgangsmåde til den optiske måling af stabiliteten og aggregeringen af partikler
EP3309536A1 (de) 2016-10-11 2018-04-18 Malvern Panalytical Limited Partikelcharakterisierungsinstrument
CN113466171A (zh) * 2016-11-01 2021-10-01 韩国食品研究院 利用贝塞尔光束的高分辨率检查装置
DE102023103406A1 (de) * 2023-02-13 2024-08-14 Isud Solutions Gmbh Vorrichtung zur Untersuchung von Stoffproben mittels elektromagnetischer Strahlung

Citations (4)

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DE593226C (de) * 1932-06-23 1934-02-28 Zeiss Carl Fa Dunkelfeldkondensor fuer Mikroskope
US20050117144A1 (en) * 2002-04-10 2005-06-02 Bryan Greenway Automated protein crystallization imaging
US20060207066A1 (en) * 2005-03-16 2006-09-21 The Regents Of The University Of California Robotic CCD microscope for enhanced crystal recognition
BE1017090A6 (de) * 2006-04-03 2008-02-05 Hoffmann Kurt Mario Victor Virtuelle reaktionsgef sse.

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JPS60217325A (ja) * 1984-04-13 1985-10-30 Nippon Kogaku Kk <Nikon> エピダ−ク用対物レンズ
DE3421577C2 (de) * 1984-06-09 1986-06-05 Harald Dr.-Ing. 6240 Königstein Krzyminski Gerät zur Reflexionsmessung an farbigen Objekten
GB8726305D0 (en) * 1987-11-10 1987-12-16 Secr Defence Portable particle analysers
JPH0815156A (ja) * 1993-06-03 1996-01-19 Hamamatsu Photonics Kk レーザスキャン光学系及びレーザスキャン光学装置
JPH1054793A (ja) * 1996-08-09 1998-02-24 Dainippon Screen Mfg Co Ltd 分光反射光量測定装置
DE19713200C1 (de) * 1997-03-28 1998-06-18 Alv Laser Vertriebsgesellschaf Meßgerät zur Bestimmung der statischen und/oder dynamischen Lichtstreuung
DE19949029C2 (de) * 1999-10-11 2002-11-21 Innovatis Gmbh Verfahren und Vorrichtung zur Charakterisierung einer Kulturflüssigkeit
US6330059B1 (en) * 1999-10-27 2001-12-11 Hitachi, Ltd. Optical system for detecting surface defects, a disk tester and a disk testing method
JP4171775B2 (ja) * 2002-08-26 2008-10-29 賢二 安田 核酸分析装置
DE102004005878A1 (de) * 2004-02-05 2005-09-01 Rina-Netzwerk Rna Technologien Gmbh Verfahren zur Überwachung der Herstellung von Biomolekülkristallen
US7738099B2 (en) * 2005-07-15 2010-06-15 Biovigilant Systems, Inc. Pathogen and particle detector system and method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE593226C (de) * 1932-06-23 1934-02-28 Zeiss Carl Fa Dunkelfeldkondensor fuer Mikroskope
US20050117144A1 (en) * 2002-04-10 2005-06-02 Bryan Greenway Automated protein crystallization imaging
US20060207066A1 (en) * 2005-03-16 2006-09-21 The Regents Of The University Of California Robotic CCD microscope for enhanced crystal recognition
BE1017090A6 (de) * 2006-04-03 2008-02-05 Hoffmann Kurt Mario Victor Virtuelle reaktionsgef sse.

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
KASHII M ET AL: "FEMTOSECOND LASER PROCESSING OF PROTEIN CRYSTALS IN CRYSTALLIZATION DROP", JAPANESE JOURNAL OF APPLIED PHYSICS, JAPAN SOCIETY OF APPLIED PHYSICS, TOKYO,JP, vol. 44, no. 24-27, 1 January 2005 (2005-01-01), pages L873 - L875, XP001236959, ISSN: 0021-4922 *
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Also Published As

Publication number Publication date
US20100315635A1 (en) 2010-12-16
WO2009003714A2 (de) 2009-01-08
JP2010532468A (ja) 2010-10-07
DE102007031244B3 (de) 2009-01-02
EP2165182A2 (de) 2010-03-24

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