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WO2008142744A1 - Component carrier device, electronic component testing device, and method for recognizing optimal distance in component carrier device - Google Patents

Component carrier device, electronic component testing device, and method for recognizing optimal distance in component carrier device Download PDF

Info

Publication number
WO2008142744A1
WO2008142744A1 PCT/JP2007/059595 JP2007059595W WO2008142744A1 WO 2008142744 A1 WO2008142744 A1 WO 2008142744A1 JP 2007059595 W JP2007059595 W JP 2007059595W WO 2008142744 A1 WO2008142744 A1 WO 2008142744A1
Authority
WO
WIPO (PCT)
Prior art keywords
component carrier
carrier device
recognizing
adsorption head
optimal distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2007/059595
Other languages
French (fr)
Japanese (ja)
Inventor
Akihiko Ito
Akihisa Suda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to PCT/JP2007/059595 priority Critical patent/WO2008142744A1/en
Priority to TW097113468A priority patent/TWI395283B/en
Publication of WO2008142744A1 publication Critical patent/WO2008142744A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

A device carrier (310) has :an adsorption head (320) which adsorbs and holds an IC device; a vacuum pressure sensor (330) which detects the presence/absence of adsorption of the IC device by the adsorption head (320); an actuator (318a) which moves the adsorption head (320); and a controller (340) which controls the movement operation of the adsorption head (320). The controller (340) controls the actuator (318a) to move the adsorption head (320) depending on the result of detection by the vacuum pressure sensor (330), or sets the distance between the position (A) of starting movement and the position of the adsorption head (320) after moved to be an optimal distance.
PCT/JP2007/059595 2007-05-09 2007-05-09 Component carrier device, electronic component testing device, and method for recognizing optimal distance in component carrier device Ceased WO2008142744A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
PCT/JP2007/059595 WO2008142744A1 (en) 2007-05-09 2007-05-09 Component carrier device, electronic component testing device, and method for recognizing optimal distance in component carrier device
TW097113468A TWI395283B (en) 2007-05-09 2008-04-14 Element handling device, electronic component testing device, and identification of the optimum distance of the component handling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/059595 WO2008142744A1 (en) 2007-05-09 2007-05-09 Component carrier device, electronic component testing device, and method for recognizing optimal distance in component carrier device

Publications (1)

Publication Number Publication Date
WO2008142744A1 true WO2008142744A1 (en) 2008-11-27

Family

ID=40031471

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/059595 Ceased WO2008142744A1 (en) 2007-05-09 2007-05-09 Component carrier device, electronic component testing device, and method for recognizing optimal distance in component carrier device

Country Status (2)

Country Link
TW (1) TWI395283B (en)
WO (1) WO2008142744A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114345742A (en) * 2021-12-31 2022-04-15 苏州汇川控制技术有限公司 Method, apparatus, device and medium for detecting chip mounting position

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01183900A (en) * 1988-01-19 1989-07-21 Yamagata Kashio Kk Method for judging sucking of part in electronic part mounting machine
JPH06232599A (en) * 1993-02-05 1994-08-19 Yamagata Casio Co Ltd Component pickup apparatus
JPH0726783U (en) * 1993-10-22 1995-05-19 株式会社アドバンテスト Pick and place equipment for automated test handlers
JPH07193397A (en) * 1993-12-27 1995-07-28 Yamaha Motor Co Ltd Mounter suction point correction device
JPH08204391A (en) * 1995-01-31 1996-08-09 Matsushita Electric Ind Co Ltd Semiconductor mounting equipment
JP2004035718A (en) * 2002-07-03 2004-02-05 Sharp Corp Ink jet ink composition and ink jet recording method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101339205B (en) * 2002-07-30 2011-08-31 株式会社爱德万测试 Electronic parts test device
JP3851854B2 (en) * 2002-08-30 2006-11-29 山形カシオ株式会社 Electronic component mounting device
JP2006286781A (en) * 2005-03-31 2006-10-19 Yamagata Casio Co Ltd Mounting head of electronic parts, parts mounting device, and its control method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01183900A (en) * 1988-01-19 1989-07-21 Yamagata Kashio Kk Method for judging sucking of part in electronic part mounting machine
JPH06232599A (en) * 1993-02-05 1994-08-19 Yamagata Casio Co Ltd Component pickup apparatus
JPH0726783U (en) * 1993-10-22 1995-05-19 株式会社アドバンテスト Pick and place equipment for automated test handlers
JPH07193397A (en) * 1993-12-27 1995-07-28 Yamaha Motor Co Ltd Mounter suction point correction device
JPH08204391A (en) * 1995-01-31 1996-08-09 Matsushita Electric Ind Co Ltd Semiconductor mounting equipment
JP2004035718A (en) * 2002-07-03 2004-02-05 Sharp Corp Ink jet ink composition and ink jet recording method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114345742A (en) * 2021-12-31 2022-04-15 苏州汇川控制技术有限公司 Method, apparatus, device and medium for detecting chip mounting position

Also Published As

Publication number Publication date
TWI395283B (en) 2013-05-01
TW200908194A (en) 2009-02-16

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