WO2008011630A3 - Apparatus for ejecting fluid onto a substrate and system and method incorporating the same - Google Patents
Apparatus for ejecting fluid onto a substrate and system and method incorporating the same Download PDFInfo
- Publication number
- WO2008011630A3 WO2008011630A3 PCT/US2007/074133 US2007074133W WO2008011630A3 WO 2008011630 A3 WO2008011630 A3 WO 2008011630A3 US 2007074133 W US2007074133 W US 2007074133W WO 2008011630 A3 WO2008011630 A3 WO 2008011630A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- same
- fluid onto
- ejecting fluid
- method incorporating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
A fluid dispenser for use in the processing of substrates. The dispenser has a dome shaped body with a convex upper surface and has a number of conduits designed to supply fluid to the surface of a substrate at predetermined points.
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US83263106P | 2006-07-21 | 2006-07-21 | |
| US60/832,631 | 2006-07-21 | ||
| TW096126671A TWI352628B (en) | 2006-07-21 | 2007-07-20 | Nozzle for use in the megasonic cleaning of substr |
| TW096126671 | 2007-07-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2008011630A2 WO2008011630A2 (en) | 2008-01-24 |
| WO2008011630A3 true WO2008011630A3 (en) | 2008-10-09 |
Family
ID=38957689
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2007/074133 Ceased WO2008011630A2 (en) | 2006-07-21 | 2007-07-23 | Apparatus for ejecting fluid onto a substrate and system and method incorporating the same |
Country Status (1)
| Country | Link |
|---|---|
| WO (1) | WO2008011630A2 (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6357457B1 (en) * | 1998-03-16 | 2002-03-19 | Tokyo Electron Limited | Substrate cleaning apparatus and method |
| US6684890B2 (en) * | 2001-07-16 | 2004-02-03 | Verteq, Inc. | Megasonic cleaner probe system with gasified fluid |
| US6848455B1 (en) * | 2002-04-22 | 2005-02-01 | Novellus Systems, Inc. | Method and apparatus for removing photoresist and post-etch residue from semiconductor substrates by in-situ generation of oxidizing species |
-
2007
- 2007-07-23 WO PCT/US2007/074133 patent/WO2008011630A2/en not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6357457B1 (en) * | 1998-03-16 | 2002-03-19 | Tokyo Electron Limited | Substrate cleaning apparatus and method |
| US6684890B2 (en) * | 2001-07-16 | 2004-02-03 | Verteq, Inc. | Megasonic cleaner probe system with gasified fluid |
| US6848455B1 (en) * | 2002-04-22 | 2005-02-01 | Novellus Systems, Inc. | Method and apparatus for removing photoresist and post-etch residue from semiconductor substrates by in-situ generation of oxidizing species |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008011630A2 (en) | 2008-01-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
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| NENP | Non-entry into the national phase |
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| NENP | Non-entry into the national phase |
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| 122 | Ep: pct application non-entry in european phase |
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