WO2008002832A3 - Method for programming non-volatile memory using variable amplitude programming pulses - Google Patents
Method for programming non-volatile memory using variable amplitude programming pulses Download PDFInfo
- Publication number
- WO2008002832A3 WO2008002832A3 PCT/US2007/071859 US2007071859W WO2008002832A3 WO 2008002832 A3 WO2008002832 A3 WO 2008002832A3 US 2007071859 W US2007071859 W US 2007071859W WO 2008002832 A3 WO2008002832 A3 WO 2008002832A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- programmed
- waveform
- storage elements
- programming
- volatile memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
- G11C11/5628—Programming or writing circuits; Data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
- G11C2211/562—Multilevel memory programming aspects
- G11C2211/5621—Multilevel programming verification
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
Abstract
Non-volatile storage elements are programmed using a series of voltage waveforms, where each waveform includes different portions with different amplitudes. For example, the amplitudes can vary as a decreasing staircase or ramp. Storage elements which are to be programmed to the highest level are programmed using the entire waveform, while storage elements which are to be programmed to intermediate and lower levels are programmed using different portions of the waveform. For example, the storage elements to be programmed to the intermediate level are programmed using the last two-thirds of each waveform, while the storage elements to be programmed to the lower level are programmed using the last one-third of each waveform. For these storage elements, programming is inhibited for a portion of the waveform by applying an inhibit voltage to an associated bit line. Higher programming speeds and narrower threshold voltage distributions can be achieved.
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US42648706A | 2006-06-26 | 2006-06-26 | |
| US11/426,475 US20070297247A1 (en) | 2006-06-26 | 2006-06-26 | Method for programming non-volatile memory using variable amplitude programming pulses |
| US11/426,475 | 2006-06-26 | ||
| US11/426,487 | 2006-06-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2008002832A2 WO2008002832A2 (en) | 2008-01-03 |
| WO2008002832A3 true WO2008002832A3 (en) | 2008-02-28 |
Family
ID=38740276
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2007/071859 Ceased WO2008002832A2 (en) | 2006-06-26 | 2007-06-22 | Method for programming non-volatile memory using variable amplitude programming pulses |
Country Status (2)
| Country | Link |
|---|---|
| TW (1) | TW200807421A (en) |
| WO (1) | WO2008002832A2 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7796435B2 (en) | 2008-06-12 | 2010-09-14 | Sandisk Corporation | Method for correlated multiple pass programming in nonvolatile memory |
| US7800945B2 (en) | 2008-06-12 | 2010-09-21 | Sandisk Corporation | Method for index programming and reduced verify in nonvolatile memory |
| US7813172B2 (en) | 2008-06-12 | 2010-10-12 | Sandisk Corporation | Nonvolatile memory with correlated multiple pass programming |
| US7826271B2 (en) | 2008-06-12 | 2010-11-02 | Sandisk Corporation | Nonvolatile memory with index programming and reduced verify |
| US7965562B2 (en) | 2007-04-10 | 2011-06-21 | Sandisk Corporation | Predictive programming in non-volatile memory |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7715235B2 (en) | 2008-08-25 | 2010-05-11 | Sandisk Corporation | Non-volatile memory and method for ramp-down programming |
| JP2011040135A (en) | 2009-08-13 | 2011-02-24 | Toshiba Corp | Nonvolatile semiconductor memory device |
| US8526233B2 (en) | 2011-05-23 | 2013-09-03 | Sandisk Technologies Inc. | Ramping pass voltage to enhance channel boost in memory device, with optional temperature compensation |
| FR3039921B1 (en) * | 2015-08-06 | 2018-02-16 | Stmicroelectronics (Rousset) Sas | METHOD AND SYSTEM FOR CONTROLLING A DATA WRITE OPERATION IN A MEMORY CELL OF THE EEPROM TYPE |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6243290B1 (en) * | 1999-08-31 | 2001-06-05 | Hitachi, Ltd. | Nonvolatile semiconductor memory device |
| US6282119B1 (en) * | 2000-06-02 | 2001-08-28 | Winbond Electronics Corporation | Mixed program and sense architecture using dual-step voltage scheme in multi-level data storage in flash memories |
| WO2002063630A1 (en) * | 2001-02-08 | 2002-08-15 | Advanced Micro Devices, Inc. | Programming method using voltage pulse with stepped portions for multi-level cell flash memories |
| US6538923B1 (en) * | 2001-02-26 | 2003-03-25 | Advanced Micro Devices, Inc. | Staircase program verify for multi-level cell flash memory designs |
| US20040190337A1 (en) * | 2001-09-17 | 2004-09-30 | Jian Chen | Selective operation of a multi-state non-volatile memory system in a binary mode |
| US20050083735A1 (en) * | 2003-10-20 | 2005-04-21 | Jian Chen | Behavior based programming of non-volatile memory |
-
2007
- 2007-05-30 TW TW96119382A patent/TW200807421A/en unknown
- 2007-06-22 WO PCT/US2007/071859 patent/WO2008002832A2/en not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6243290B1 (en) * | 1999-08-31 | 2001-06-05 | Hitachi, Ltd. | Nonvolatile semiconductor memory device |
| US6282119B1 (en) * | 2000-06-02 | 2001-08-28 | Winbond Electronics Corporation | Mixed program and sense architecture using dual-step voltage scheme in multi-level data storage in flash memories |
| WO2002063630A1 (en) * | 2001-02-08 | 2002-08-15 | Advanced Micro Devices, Inc. | Programming method using voltage pulse with stepped portions for multi-level cell flash memories |
| US6538923B1 (en) * | 2001-02-26 | 2003-03-25 | Advanced Micro Devices, Inc. | Staircase program verify for multi-level cell flash memory designs |
| US20040190337A1 (en) * | 2001-09-17 | 2004-09-30 | Jian Chen | Selective operation of a multi-state non-volatile memory system in a binary mode |
| US20050083735A1 (en) * | 2003-10-20 | 2005-04-21 | Jian Chen | Behavior based programming of non-volatile memory |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7965562B2 (en) | 2007-04-10 | 2011-06-21 | Sandisk Corporation | Predictive programming in non-volatile memory |
| US7796435B2 (en) | 2008-06-12 | 2010-09-14 | Sandisk Corporation | Method for correlated multiple pass programming in nonvolatile memory |
| US7800945B2 (en) | 2008-06-12 | 2010-09-21 | Sandisk Corporation | Method for index programming and reduced verify in nonvolatile memory |
| US7813172B2 (en) | 2008-06-12 | 2010-10-12 | Sandisk Corporation | Nonvolatile memory with correlated multiple pass programming |
| US7826271B2 (en) | 2008-06-12 | 2010-11-02 | Sandisk Corporation | Nonvolatile memory with index programming and reduced verify |
| US8045378B2 (en) | 2008-06-12 | 2011-10-25 | Sandisk Technologies Inc. | Nonvolatile memory with correlated multiple pass programming |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200807421A (en) | 2008-02-01 |
| WO2008002832A2 (en) | 2008-01-03 |
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