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WO2007038339A3 - Strobe technique for recovering a clock in a digital signal - Google Patents

Strobe technique for recovering a clock in a digital signal Download PDF

Info

Publication number
WO2007038339A3
WO2007038339A3 PCT/US2006/037099 US2006037099W WO2007038339A3 WO 2007038339 A3 WO2007038339 A3 WO 2007038339A3 US 2006037099 W US2006037099 W US 2006037099W WO 2007038339 A3 WO2007038339 A3 WO 2007038339A3
Authority
WO
WIPO (PCT)
Prior art keywords
digital signal
edge time
samples
clock information
recovering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2006/037099
Other languages
French (fr)
Other versions
WO2007038339A2 (en
Inventor
Ronald A Sartschev
Ernest P Walker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/234,542 external-priority patent/US7856578B2/en
Priority claimed from US11/234,599 external-priority patent/US7573957B2/en
Priority claimed from US11/234,814 external-priority patent/US7574632B2/en
Application filed by Teradyne Inc filed Critical Teradyne Inc
Priority to CN200680035231XA priority Critical patent/CN101379754B/en
Priority to JP2008532444A priority patent/JP4907663B2/en
Priority to EP06815244A priority patent/EP1927210A2/en
Priority to KR1020087006701A priority patent/KR101237878B1/en
Publication of WO2007038339A2 publication Critical patent/WO2007038339A2/en
Publication of WO2007038339A3 publication Critical patent/WO2007038339A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L7/00—Arrangements for synchronising receiver with transmitter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G01R31/31726—Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004—Pattern generation
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56012—Timing aspects, clock generation, synchronisation

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Manipulation Of Pulses (AREA)

Abstract

A method and apparatus is provided to recover clock information embedded in a digital signal such as a digital signal A set of strobe pulses can be generated by routing an edge generator to a delay elements with incrementally increasing delay values A set of latches triggered by incrementally delayed signals from the edge generator can capture samples of the data signal An encoder (84) can convert the samples to a word representing edge time and polarity of the sampled signal The word representing edge time can be stored in memory (86) An accumulator can collect the average edge time over N samples (88) The average edge time can be adjusted with a fixed de-skew value to form the extracted clock information The extracted clock information can be used as pointer to the words stored in memory
PCT/US2006/037099 2005-09-23 2006-09-22 Strobe technique for recovering a clock in a digital signal Ceased WO2007038339A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN200680035231XA CN101379754B (en) 2005-09-23 2006-09-22 Strobe technique for test of digital signal timing
JP2008532444A JP4907663B2 (en) 2005-09-23 2006-09-22 Strobe technique for recovering clocks in digital signals
EP06815244A EP1927210A2 (en) 2005-09-23 2006-09-22 Strobe technique for recovering a clock in a digital signal
KR1020087006701A KR101237878B1 (en) 2005-09-23 2006-09-22 Strobe technique for recovering a clock in a digital signal

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US11/234,814 2005-09-23
US11/234,542 US7856578B2 (en) 2005-09-23 2005-09-23 Strobe technique for test of digital signal timing
US11/234,542 2005-09-23
US11/234,599 2005-09-23
US11/234,599 US7573957B2 (en) 2005-09-23 2005-09-23 Strobe technique for recovering a clock in a digital signal
US11/234,814 US7574632B2 (en) 2005-09-23 2005-09-23 Strobe technique for time stamping a digital signal

Publications (2)

Publication Number Publication Date
WO2007038339A2 WO2007038339A2 (en) 2007-04-05
WO2007038339A3 true WO2007038339A3 (en) 2007-12-06

Family

ID=37900290

Family Applications (3)

Application Number Title Priority Date Filing Date
PCT/US2006/037100 Ceased WO2007038340A2 (en) 2005-09-23 2006-09-22 Strobe technique for time stamping a digital signal
PCT/US2006/036912 Ceased WO2007038233A2 (en) 2005-09-23 2006-09-22 Strobe technique for test of digital signal timing
PCT/US2006/037099 Ceased WO2007038339A2 (en) 2005-09-23 2006-09-22 Strobe technique for recovering a clock in a digital signal

Family Applications Before (2)

Application Number Title Priority Date Filing Date
PCT/US2006/037100 Ceased WO2007038340A2 (en) 2005-09-23 2006-09-22 Strobe technique for time stamping a digital signal
PCT/US2006/036912 Ceased WO2007038233A2 (en) 2005-09-23 2006-09-22 Strobe technique for test of digital signal timing

Country Status (4)

Country Link
EP (3) EP1927210A2 (en)
JP (3) JP4907663B2 (en)
KR (3) KR101239743B1 (en)
WO (3) WO2007038340A2 (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7573957B2 (en) 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for recovering a clock in a digital signal
US7574632B2 (en) 2005-09-23 2009-08-11 Teradyne, Inc. Strobe technique for time stamping a digital signal
US7856578B2 (en) 2005-09-23 2010-12-21 Teradyne, Inc. Strobe technique for test of digital signal timing
CN102356594B (en) * 2009-04-30 2015-03-25 爱德万测试株式会社 Clock generating apparatus, testing apparatus and clock generating method
JP5211239B2 (en) * 2009-05-11 2013-06-12 株式会社アドバンテスト Receiving device, testing device, receiving method and testing method
WO2011033589A1 (en) * 2009-09-18 2011-03-24 株式会社アドバンテスト Testing apparatus and testing method
US8554514B2 (en) 2009-09-18 2013-10-08 Advantest Corporation Test apparatus and test method
WO2014108742A1 (en) * 2013-01-09 2014-07-17 Freescale Semiconductor, Inc. Method and apparatus for sampling a signal
US9279857B2 (en) 2013-11-19 2016-03-08 Teradyne, Inc. Automated test system with edge steering
KR101738005B1 (en) 2016-06-10 2017-05-19 (주)제이케이아이 Logic analyzer
US10733345B1 (en) * 2018-08-23 2020-08-04 Cadence Design Systems, Inc. Method and system for generating a validation test

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6285722B1 (en) * 1997-12-05 2001-09-04 Telcordia Technologies, Inc. Method and apparatus for variable bit rate clock recovery
US20050157780A1 (en) * 2003-12-17 2005-07-21 Werner Carl W. Signaling system with selectively-inhibited adaptive equalization

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3997740A (en) * 1975-05-30 1976-12-14 Bell Telephone Laboratories, Incorporated Pulse train analyzer
US4989202A (en) * 1988-10-14 1991-01-29 Harris Corporation ISDN testing device and method
US5084669A (en) * 1990-03-08 1992-01-28 Telefonaktiebolaget L M Ericsson Direct phase digitization
DE69324507T2 (en) * 1992-01-16 1999-10-07 Hamamatsu Photonics K.K., Hamamatsu Arrangement for measuring the temporal relationship between two or more signals
JP2682334B2 (en) * 1992-05-29 1997-11-26 日本電気株式会社 Image signal coding transmission method
US5446650A (en) * 1993-10-12 1995-08-29 Tektronix, Inc. Logic signal extraction
US5526286A (en) * 1994-02-16 1996-06-11 Tektronix, Inc. Oversampled logic analyzer
US6173207B1 (en) 1997-09-22 2001-01-09 Agilent Technologies, Inc. Real-time control system with non-deterministic communication
US6204710B1 (en) * 1998-06-22 2001-03-20 Xilinx, Inc. Precision trim circuit for delay lines
US6198700B1 (en) * 1999-06-04 2001-03-06 Level One Communications, Inc. Method and apparatus for retiming test signals
JP4495308B2 (en) * 2000-06-14 2010-07-07 株式会社アドバンテスト Semiconductor device testing method and semiconductor device testing equipment
JP2002196053A (en) * 2000-12-25 2002-07-10 Ando Electric Co Ltd Ic measurement device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6285722B1 (en) * 1997-12-05 2001-09-04 Telcordia Technologies, Inc. Method and apparatus for variable bit rate clock recovery
US20050157780A1 (en) * 2003-12-17 2005-07-21 Werner Carl W. Signaling system with selectively-inhibited adaptive equalization
US20050157781A1 (en) * 2003-12-17 2005-07-21 Andrew Ho Signal receiver with data precessing function

Also Published As

Publication number Publication date
EP1927210A2 (en) 2008-06-04
JP2009510403A (en) 2009-03-12
EP1927204A2 (en) 2008-06-04
WO2007038233A2 (en) 2007-04-05
KR20080045714A (en) 2008-05-23
EP1927203A2 (en) 2008-06-04
WO2007038233A3 (en) 2008-10-30
WO2007038340A3 (en) 2007-11-22
JP5254795B2 (en) 2013-08-07
JP4907663B2 (en) 2012-04-04
WO2007038339A2 (en) 2007-04-05
KR20080047403A (en) 2008-05-28
JP2009510842A (en) 2009-03-12
JP2009509174A (en) 2009-03-05
KR20080048487A (en) 2008-06-02
JP5254794B2 (en) 2013-08-07
KR101237878B1 (en) 2013-02-27
KR101236769B1 (en) 2013-02-25
KR101239743B1 (en) 2013-03-06
WO2007038340A2 (en) 2007-04-05

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