WO2005054883A1 - 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置 - Google Patents
制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置 Download PDFInfo
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- WO2005054883A1 WO2005054883A1 PCT/JP2004/017970 JP2004017970W WO2005054883A1 WO 2005054883 A1 WO2005054883 A1 WO 2005054883A1 JP 2004017970 W JP2004017970 W JP 2004017970W WO 2005054883 A1 WO2005054883 A1 WO 2005054883A1
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- pattern signal
- inspection
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
- G01R31/2848—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms using simulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
Definitions
- Control device inspection device pattern signal creation device, and inspection program generation device
- the present invention relates to a simulation for simulating an operating environment of an electronic device and performing an automatic inspection.
- the present invention relates to an apparatus (an inspection apparatus for a control apparatus, a pattern signal generation apparatus, and an inspection program generation apparatus) that supports creation of an inspection program to be executed in a computer.
- ECUs Electronic Control Units
- An inspection program for operating such a simulator is prepared by manually creating an inspection pattern, a judgment opening jig, and the like based on an inspection specification created manually.
- the present invention has been made in view of the above-described problems, and has as its object to provide an inspection program executed by a simulator for automatically inspecting electronic devices.
- An object of the present invention is to provide a device for supporting the creation of a gram, thereby reducing the number of preparation steps and improving the reliability in an automatic inspection.
- a simulating means for simulating a control target of a control device, a pattern signal input to the control device, and the simulating means according to the pattern signal.
- Inspection means for inspecting the operation of the control device based on a relationship with the output signal to be output, wherein the inspection means inspects the operation of the control device at a predetermined timing.
- a pattern signal creating apparatus for creating a pattern signal, wherein the pattern signal is created based on a control cycle of an apparatus using the pattern signal created by the pattern signal creating apparatus.
- a second function processing unit for generating the pattern signal based on a cycle different from the control cycle.
- the second function processing means creates the pattern signal based on a period of time over a plurality of the control periods.
- the second function processing means creates the pattern signal based on a cycle of each control cycle.
- a pattern signal creating apparatus for creating a pattern signal, comprising: means for creating a correlation pattern signal in which correlation information for a reference pattern signal is designated; A display unit for displaying the correlation pattern signal on the same screen;
- a pattern signal generation for generating a pattern signal is performed.
- Display means for displaying, on a same screen, the reference pattern signal and the correlation pattern signal when there is a correlation pattern signal in which correlation information for the reference pattern signal is specified; and the reference pattern signal.
- Pattern signal interlocking changing means for changing the correlation pattern signal in conjunction with the change of the pattern signal, wherein the display means is configured to output the reference pattern signal when the reference pattern signal is edited.
- a pattern signal generating apparatus for redisplaying the correlation pattern signal changed by the pattern signal interlocking change unit.
- an inspection program creating apparatus for creating an inspection program for inspecting a diag function for causing a control device to output data, wherein the inspection program is processed by the control device.
- An inspection program creation device comprising: means for displaying a pattern signal on a screen; and means for enabling setting in the inspection of the diag function while the pattern signal is displayed on the screen. You.
- the setting in the inspection of the diagnostic function includes data output request information for the control device and whether the diagnostic function is normal when the data output request information is requested to the control device. Is an abnormality determination condition.
- an inspection program creating apparatus for creating an inspection program, comprising: a child project including a pattern signal input to a control device and a transition condition between the pattern signals; Display means for simultaneously displaying a parent project including a project and a transition condition between the child projects, an edit screen for the child project, and an edit screen for the parent project; and When the child project is selected on the editing screen of the parent project, first editing means for displaying the contents of the selected child project on the editing screen of the child project to enable editing, and For display means When the content of the child project on the displayed edit screen of the child project is selected, the setting information of the content of the selected child project is displayed on a new edit screen to enable editing.
- An inspection program creation device comprising: a second editing unit;
- an inspection device for a control device the inspection device being based on a relationship between a pattern signal input to the control device and an output signal output from a control target of the control device according to the pattern signal.
- An inspection apparatus for a control device comprising:
- FIG. 1 is a diagram showing a configuration example of an electronic device automatic inspection system including an electronic device automatic inspection program creation support device according to the present invention.
- FIG. 2 is a flowchart showing a procedure of a determination retry setting process executed by the support device.
- FIG. 3 is a flowchart illustrating a procedure of a retry determination process generated by the determination retry setting process for the 8 ms update counter and executed by the simulator.
- FIG. 4 is a diagram exemplifying a state in which the determination on the 8 ms update counter is made by the retry determination in FIG.
- FIG. 5A, 5B and 5C show the sinusoidal signals generated by the support equipment.
- FIG. 6 is a flowchart showing a procedure of the Sin signal creation process executed by the support device.
- FIG. 7 is an example of a screen display for defining a correlation signal.
- FIG. 8 is a diagram illustrating a time chart of the correlation signal.
- FIG. 9 is a flowchart illustrating a procedure of a correlation signal creation process performed by the support device.
- FIG. 10 is a flowchart illustrating a procedure of a signal pattern creation process executed by the support device.
- FIG. 11 is a diagram illustrating a communication data setting screen.
- FIG. 12 is a flowchart showing a procedure of a communication event signal creation process executed by the support device.
- FIG. 13 is a program illustrating a procedure of a communication function detection process executed by the simulator.
- FIG. 14 is a diagram showing an example of a functional configuration (software configuration) for realizing the function for setting a state transition between test patterns.
- FIG. 15 is a diagram illustrating a state transition setting screen.
- FIG. 16 is a diagram illustrating a chart screen.
- FIG. 17 is a diagram illustrating a transition condition setting screen.
- FIG. 18 is a flowchart (1/2) showing the procedure of the state transition setting process executed by the support device.
- FIG. 19 is a flowchart (2/2) showing the procedure of the state transition setting process executed by the support device.
- FIG. 20 is a flowchart showing the procedure of the automatic inspection process executed by the simulator.
- FIG. 1 is a diagram showing a configuration example of an electronic device automatic inspection system including an electronic device automatic inspection program creation support device 10 according to the present invention. As shown in the figure, this system is composed of an electronic device automatic inspection program creation support device 10, a simulator 20, and an electronic device 30.
- the electronic device 30 is an object of the automatic inspection, and in the present embodiment, is an electronic control unit (ECU: Electronic Control Unit) mounted on the vehicle.
- the simulator 20 is a computer that performs an automatic inspection by simulating the operation environment of the ECU 30.
- An automatic inspection program creation support device (hereinafter abbreviated as a support device) 10 is a device that supports the creation of an inspection program executed by the simulator 20, and includes a computer main body (such as a CPU and a storage device). It is realized by an ordinary personal computer consisting of 12, display 14, keyboard 16, etc.
- the support device 10 inputs the inspection specification for the ECU 30 based on a user's input operation on the screen (that is, based on a GUI (Graphical User Interface)).
- An inspection pattern (including an input signal to the ECU 30 and determination logic for determining whether a signal output from the ECU 30 in response to the input signal is normal) based on the inspection specification. Generate.
- the ECU 30 calculates the RAM value. There is a difference between the timing for updating and the timing for the simulator 20 to sample the RAM value, so that an erroneous determination may occur. Therefore, the support device 10 is one of the functions for generating the determination logic. And supports the judgment retry function. This judgment retry function allows the number of retries to be set. To prevent misjudgment.
- the support device 10 is one of the functions for generating the determination logic. And supports the judgment retry function. This judgment retry function allows the number of retries to be set. To prevent misjudgment.
- FIG. 2 is a flowchart illustrating a procedure of the determination retry setting process executed by the support device 10.
- step 52 a judgment retry setting screen for setting the retry judgment, the number of retries, and the retry cycle is displayed.
- step 5 a judgment retry setting screen for setting the retry judgment, the number of retries, and the retry cycle is displayed.
- step 4 processing for setting various conditions related to retry determination is performed.
- the user specifies, via this screen, that a retry is to be set for the determination of the 8 ms update counter in the ECU 30, and the number of retries is two, and the retry period is two. 1 ms can be set.
- step 56 the judgment retry setting screen is closed.
- FIG. 3 is a flowchart showing a procedure of a retry determination process generated by the illustrated retry setting process for the 8 ms update counter and executed by the simulator 20.
- step 62 it is determined whether or not the retry counter for counting the number of retries is two. This retry counter is initialized to 2 in the initial processing executed in the main cycle. If the retry counter is 2, the process proceeds to step 64 to perform determination processing (normal determination processing), that is, processing for determining whether or not the 8 ms update counter is normally updated.
- determination processing normal determination processing
- step 70 determines whether the retry counter is 1. If the retry counter is 1, proceed to step 72 and perform the judgment processing (first retry judgment processing). In step 74, it is determined whether or not a " ⁇ " determination has been made. In the case of a " ⁇ " determination, the retry counter is returned to 2 in step 76 to terminate this routine, while the "X" determination is made. In this case, in step 78, the retry counter is further decremented, and this routine ends. If it is determined in step 70 that the retry counter is not 1, the process proceeds to step 80 to perform a determination process (second retry determination process).
- step 82 it is determined whether or not a “ ⁇ ” determination was made. If “ ⁇ ” determination, this routine is terminated. On the other hand, if “X” determination is made, “X” determination is made in step 84. In addition to performing the process of determining the value, the retry counter is returned to 2 in step 86, and then this routine is terminated.
- FIG. 4 is a diagram exemplifying a state in which the determination regarding the 8 ms update counter is performed by the retry determination process in FIG.
- the NG decision is not immediately finalized, but only for the specified number of retries (two in this example). Is performed.
- this determination retry function With this determination retry function, erroneous determination is prevented, and the function of setting a monitoring expression (expression for deciding whether or not the determination is successful) in the determination logic is improved.
- the pattern signal can be described only by the time variable for each inspection step, even if the pattern signal across the steps is expressed, the connection of the signals will be discontinuous, and an arbitrary pattern signal will be described. There is a problem that you can not
- the support device 10 can arbitrarily set a pattern signal that crosses between steps without discontinuity by preparing not only a time variable within a step but also a variable relating to time between a plurality of steps. I am trying to do it.
- the sine signal y sin ( ⁇ ($ SYS ⁇ ⁇ ⁇ ⁇ ⁇ )) can be described using the time elapsed from the start $ SYSTE MT IME, as shown in Fig. 5 5.
- FIG. 6 is a flowchart showing a procedure of a Sin signal creation process executed by the support device 10.
- step 102 it is determined whether or not the input S in function is a description extending over a plurality of steps. If it does not span multiple steps, proceed to step 104, assigning the input $ T to the variable T, If so, proceed to step 106 and substitute the input $ SYST EMT IME for the variable T.
- step 108 it is determined whether or not the cycle is set for each step. If the cycle is not set for each step, the process proceeds to step 110, and the angular frequency ⁇ is set to 2 ⁇ / t.If the cycle is set for each step, the process proceeds to step 112, and the angular frequency is set. Is 2 TC / $ STEP.
- step 116 the Sin signal created Draw the signal on the screen. As described above, by expanding the variables related to time, it is possible to set an arbitrary waveform in the S in signal, and the pattern signal editing function is improved.
- a reference signal is designated, and an offset ⁇ coefficient is set for the signal, whereby two or more patterns that change in relation to each other are set. It allows you to create signals.
- signal B is defined as signal A * 36 by using the function input function on the pattern signal editing screen, as shown in FIG. Then, signal B is automatically created by multiplying signal A by 36, and if signal A is modified, the same modification is automatically made for signal B.
- FIG. 9 is a flowchart illustrating a procedure of the above-described correlation signal creation processing executed by the support apparatus 10.
- step 132 designation of signal A as a reference signal is accepted.
- step 134 y is obtained by the operation of the reference signal * 36 based on the specified function expression.
- step 1 36 a signal B is created using the operation result y. In this way, a plurality of related signals can be easily created, and the number of steps can be reduced even when changing the pattern signal.
- FIG. 10 is a flowchart illustrating a procedure of a signal pattern creation process executed by the support device 10.
- step 152 a screen for setting signal conditions is displayed.
- step 154 various conditions are set based on the input on the screen.
- step 156 the condition setting screen is closed.
- step 158 it is determined whether or not the created signal uses another signal, that is, whether or not the created signal is described using the other signal as described above. If another signal is used, proceed to step 160, and draw the created signal and the used other signal at the same time. If no other signal is used, go to step 162. Proceed and perform drawing processing only for the created signal. This completes the signal pattern creation processing.
- the ECU 30 has a diagnostic function. If the setting of communication data and the setting of the judgment value are performed on separate screens in order to inspect the diag function, the number of steps is increased. Therefore, in the support device 10, the transmission data to the ECU 30 to be inspected, the transmission timing thereof, and the theoretical value of the reception data to be received from the ECU 30 according to the transmission data must be set. Has a function to execute automatic transmission of transmission data to the ECU 30 and to determine whether or not the reception data from the ECU 30 is acceptable. This function is based on the transmission data, transmission timing and theoretical value of the reception data.
- Fig. 11 when the user clicks on the event mark (black triangle) set for a specific signal as a communication event timing signal on the signal pattern editing screen, A window for the communication data setting screen is displayed, and it is possible to set the transmission message and the reception message (theoretical value) related to the specific signal.
- the transmission timing is automatically generated according to the position of the clicked event mark.
- FIG. 12 is a flowchart illustrating a procedure of a communication event signal creation process performed by the support device 10.
- a communication event condition setting screen as shown in FIG. 11 is displayed.
- various conditions transmission message, transmission timing, reception message theoretical value
- the condition setting screen is closed.
- a drawing function inspection processing program executable by the simulator 20 is created while drawing processing of the created communication event.
- FIG. 13 is a flowchart illustrating a procedure of a diagnostic function detection process executed by the simulator 20.
- the transmission data O x 10 is transmitted to the ECU 30 to be inspected, and it is confirmed that the reception data 0 x 20 is returned from the ECU 30.
- step 202 data 0x10 is transmitted to the ECU to be inspected.
- step 204 data from the ECU to be inspected is It is determined whether or not it has been received. If it has not been received, the process proceeds to step 206, and it is determined whether or not time is over. If not, the process returns to step 204.
- step 208 If there is received data from the ECU to be inspected in step 204, the judgment processing is performed in step 208, and it is checked in step 210 whether the received data is 0x20. If the received data is the expected value of 0 X 20, the process at the time of OK determination is performed in step 2 12, while if the received data is different from the expected value, the process proceeds to step 2 14 and NG Perform processing at the time of determination. Also, if it is determined in step 206 that the time is over, the process of NG determination is performed in step 214.
- the support device 10 enables the reuse of common test items by providing a state transition setting function between test patterns.
- FIG. 14 is a diagram showing an example of a functional configuration (software configuration) for realizing such a state transition setting function.
- the automatic inspection pattern editor of the support device 10 is provided with an automatic inspection project setting function (parent) having a project editing function and a project saving / reading function.
- an automatic inspection project setting function (child) having a project editing function and a project saving / reading function is provided inside the automatic inspection project setting function (parent).
- the automatic inspection project setting function (child) has an automatic inspection A turn setting function and a transition condition setting function are provided.
- the automatic inspection pattern setting function has a pattern editing function and a pattern saving / reading function
- the transition condition setting function has a transition condition editing function.
- the simulator has an automatic test pattern execution function, and an automatic test pattern transition function having a transition condition monitoring function and a pattern switching function is provided inside the automatic test pattern execution function.
- the state transition setting function saves one designed detection pattern as one file (hereinafter, referred to as a pattern file), reads the saved pattern file, Implement the function of editing again and saving again under a different name.
- the state transition setting function automatically executes the inspection pattern 1 on the simulator for the inspection pattern 1 designed by the automatic inspection pattern editor and the inspection pattern 2 set for another purpose.
- a separately set condition hereinafter referred to as a “pattern transition condition” is constantly monitored, and when the transition condition is satisfied, a function of shifting to the execution of the inspection pattern 2 is realized.
- the state transition setting function enables such a pattern transition condition to be set with a GUI, and the combination information of the inspection pattern 1, the inspection pattern 2, and the pattern transition condition is converted into a project having an arbitrary name.
- This function implements the function of saving a project file (hereinafter referred to as a project file), reading the saved project file, editing it again, and saving it again with a different name.
- the state transition setting function designs multiple projects as described above and sets the same project transition conditions as pattern transition conditions between multiple projects, so that the state transition between projects can be simulated.
- the state transition setting function sets the project transition condition
- the two columns are displayed at the same time on a single screen in a hierarchical structure with the columns for setting the transition conditions as children and the columns for setting the pattern transition conditions as children.
- a GUI that has the function of editing the project / pattern combination settings is realized.
- FIG. 1 a diagram illustrating a state transition setting screen is shown in FIG.
- each state of “State A”, “State B” and “State C” as a project (the state related to the project is called “Group”). Blocks are located. Nodes with circles ( ⁇ ) between the “state A”, “state B”, and “state C” blocks (“groups”) indicate project transition conditions.
- This “Setting 1” enables editing of an inspection program consisting of multiple projects and project transition conditions.
- Nodes in ( ⁇ ) represent pattern transition conditions.
- Setting 2 a project consisting of multiple inspection patterns and pattern transition conditions can be edited.
- this transition condition setting screen In the example of this transition condition setting screen,
- FIG. 18 and FIG. 19 are flowcharts showing the procedure of the state transition setting process executed by the support device 10.
- step 302 it is determined whether or not a new project file is to be created. In the case of a new creation, the process proceeds to step 308. On the other hand, if it is not a new creation, the existing project file is read out in step 304, the drawing process is performed in step 310, and then the process proceeds to step 310. 'Determine whether or not to edit, and create / edit “group”. In step 310, determine whether to use existing “group”. Only in the case of diversion, the pattern file of the diversion source is read in step 312.
- step 314 "group” is set according to the user's input, and in step 316, the set "group” symbol is drawn. If it is determined in step 308 that it is not “creation” of “group”, the process proceeds to step 318 to determine whether any “group” has been designated. If a “group” is specified, proceed to step 320 to display the contents of the specified “group” on the “setting 2” screen.
- step 3 18 determines whether to create and edit “details”.
- “Details” are set according to the input of the user, and the set “details” symbol is drawn in step 326.
- step 328 the chart screen (Fig. 16) is displayed, and in step 330, the chart editing process is performed. Then, in step 332, the chart screen is closed.
- step 334 it is determined whether “transition conditions” are created or edited. In the case of “creation” of “transition condition”, the “transition” symbol is drawn in step 336.
- display the "Transition condition” setting screen (Fig. 17) in step 338 perform the "Transition condition” setting process in step 340, and open the "Transition condition” setting screen in step 342 To kiss me.
- step 334 If it is determined in step 334 that the transition condition has not been created and edited, the process proceeds to step 344 to perform other editing processing. Steps 3 16, 3 2 0, 3 3 2, 3 4 2, or 3 4 4 After execution, go to step 3 4 6, determine whether all editing work has been completed, and do not complete If so, loop pack to step 308. On the other hand, if the processing has been completed, the project file and the pattern file are saved in step 348, and this routine ends.
- FIG. 20 is a flowchart showing the procedure of an automatic inspection process executed by the simulator 20 according to the inspection program created through the above-described state transition setting process.
- step 404 it is determined in step 404 whether or not the project transition condition is satisfied. If the project transition condition is satisfied, the execution (transition destination) project is updated in step 406.
- step 408 an execution project is selected.
- step 410 it is determined whether the pattern transition condition is satisfied. If the pattern transition condition is satisfied, the execution (transition destination) pattern is updated in step 4 12.
- step 414 an execution pattern is selected, and in step 416, the selected pattern is executed.
- step 418 it is determined whether or not the inspection has been completed. If not, the process loops back to step 404. If completed, the automatic inspection is completed.
- the reuse rate of the inspection patterns is improved. Also, by enabling the above setting function on one screen, the man-hour required for designing the inspection pattern is reduced.
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Abstract
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/596,118 US20080281549A1 (en) | 2003-12-01 | 2004-11-26 | Test Apparatus for Control Unit, Pattern Signal Creating Apparatus, and Test Program Generating Apparatus |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003402159A JP2005164338A (ja) | 2003-12-01 | 2003-12-01 | 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置 |
| JP2003-402159 | 2003-12-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2005054883A1 true WO2005054883A1 (ja) | 2005-06-16 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2004/017970 Ceased WO2005054883A1 (ja) | 2003-12-01 | 2004-11-26 | 制御装置の検査装置、パターン信号作成装置及び検査プログラム生成装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20080281549A1 (ja) |
| JP (1) | JP2005164338A (ja) |
| WO (1) | WO2005054883A1 (ja) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4619941B2 (ja) * | 2005-12-26 | 2011-01-26 | 富士通テン株式会社 | 信号パターン作成装置 |
| WO2008038770A1 (fr) * | 2006-09-29 | 2008-04-03 | Fujitsu Ten Limited | Appareil, système et procédé de simulation |
| US9020796B2 (en) * | 2010-11-22 | 2015-04-28 | Certon Software Inc. | Model based verification using intelligent connectors |
| JP6263163B2 (ja) * | 2015-12-21 | 2018-01-17 | アンリツ株式会社 | シーケンス発生装置、それを用いた誤り率測定装置、及びシーケンス発生方法 |
| JP6765554B2 (ja) * | 2018-12-12 | 2020-10-07 | 三菱電機株式会社 | ソフトウェア試験装置、ソフトウェア試験方法、および、ソフトウェア試験プログラム |
| CN112131063B (zh) * | 2020-09-29 | 2023-10-24 | 中国银行股份有限公司 | 重试方法及装置、计算机设备及计算机可读存储介质 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0224584A (ja) * | 1988-07-13 | 1990-01-26 | Nec Corp | テストパターン作成方法 |
| JPH0432784A (ja) * | 1990-05-29 | 1992-02-04 | Mitsubishi Electric Corp | テストプログラムジエネレータ |
| JP2001124811A (ja) * | 1999-10-22 | 2001-05-11 | Clarion Co Ltd | 自動測定装置、自動測定用データ処理・制御装置、ネットワークシステム及び自動測定処理・制御用プログラムの記録媒体 |
| JP2003114254A (ja) * | 2001-10-04 | 2003-04-18 | Matsushita Electric Ind Co Ltd | 検査方法および検査装置 |
| JP2003270300A (ja) * | 2002-03-14 | 2003-09-25 | Ricoh Co Ltd | 検査装置および方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4954948A (en) * | 1986-12-29 | 1990-09-04 | Motorola, Inc. | Microprocessor operating system for sequentially executing subtasks |
| US5307290A (en) * | 1988-10-18 | 1994-04-26 | Fiat Auto S.P.A. | System for the automatic testing, preferably on a bench, of electronic control systems which are intended to be fitted in vehicles |
| JPH0416782A (ja) * | 1990-05-11 | 1992-01-21 | Fujitsu Ltd | Lsi試験方法とその試験装置 |
| DE4121637C2 (de) * | 1991-06-29 | 1997-04-24 | Bosch Gmbh Robert | Verfahren zur Prüfung von Steuergeräten und Prüfeinrichtung zur Durchführung des Verfahrens |
| JPH07129645A (ja) * | 1993-10-29 | 1995-05-19 | Nec Corp | タイムチャートの波形表示方法 |
| US5438513A (en) * | 1993-11-19 | 1995-08-01 | Chrysler Corporation | Automotive electronics test system |
| US5442738A (en) * | 1993-12-03 | 1995-08-15 | Motorola, Inc. | Computer display representing structure |
| JP4247517B2 (ja) * | 2002-11-15 | 2009-04-02 | 富士通テン株式会社 | 波形編集用プログラム、波形編集装置、及び波形編集方法 |
-
2003
- 2003-12-01 JP JP2003402159A patent/JP2005164338A/ja active Pending
-
2004
- 2004-11-26 US US10/596,118 patent/US20080281549A1/en not_active Abandoned
- 2004-11-26 WO PCT/JP2004/017970 patent/WO2005054883A1/ja not_active Ceased
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0224584A (ja) * | 1988-07-13 | 1990-01-26 | Nec Corp | テストパターン作成方法 |
| JPH0432784A (ja) * | 1990-05-29 | 1992-02-04 | Mitsubishi Electric Corp | テストプログラムジエネレータ |
| JP2001124811A (ja) * | 1999-10-22 | 2001-05-11 | Clarion Co Ltd | 自動測定装置、自動測定用データ処理・制御装置、ネットワークシステム及び自動測定処理・制御用プログラムの記録媒体 |
| JP2003114254A (ja) * | 2001-10-04 | 2003-04-18 | Matsushita Electric Ind Co Ltd | 検査方法および検査装置 |
| JP2003270300A (ja) * | 2002-03-14 | 2003-09-25 | Ricoh Co Ltd | 検査装置および方法 |
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| Publication number | Publication date |
|---|---|
| US20080281549A1 (en) | 2008-11-13 |
| JP2005164338A (ja) | 2005-06-23 |
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