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WO2004006199A3 - Verfahren zur überwachung einer durchflussmesseinrichtung - Google Patents

Verfahren zur überwachung einer durchflussmesseinrichtung Download PDF

Info

Publication number
WO2004006199A3
WO2004006199A3 PCT/EP2003/006367 EP0306367W WO2004006199A3 WO 2004006199 A3 WO2004006199 A3 WO 2004006199A3 EP 0306367 W EP0306367 W EP 0306367W WO 2004006199 A3 WO2004006199 A3 WO 2004006199A3
Authority
WO
WIPO (PCT)
Prior art keywords
monitoring
flow meter
characteristic value
measuring device
measuring instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/EP2003/006367
Other languages
English (en)
French (fr)
Other versions
WO2004006199A2 (de
Inventor
Frank Buhl
Joerg Herwig
Axel Papenbrock
Peter Riegler
Axel Rossberg
Jens Timmer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Patent GmbH
Original Assignee
ABB Patent GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ABB Patent GmbH filed Critical ABB Patent GmbH
Priority to US10/520,564 priority Critical patent/US7505861B2/en
Priority to EP03738046A priority patent/EP1521949A2/de
Priority to JP2004518536A priority patent/JP2005532542A/ja
Publication of WO2004006199A2 publication Critical patent/WO2004006199A2/de
Publication of WO2004006199A3 publication Critical patent/WO2004006199A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F25/00—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume
    • G01F25/10—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume of flowmeters

Landscapes

  • Physics & Mathematics (AREA)
  • Fluid Mechanics (AREA)
  • General Physics & Mathematics (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Measuring Volume Flow (AREA)

Abstract

Die Erfindung betrifft ein Verfahren zur Überwachung einer Messeinrichtung, insbesondere Durchflussmesseinrichtung, sowie eine Messeinrichtung selbst. Um hierbei Messfehler durch Falscheinbau zuverlässig zu vermeiden ist erfindungsgemäss vorgeschlagen, dass aus einer Zeitreihe s(t) des Messsignales einer Messeinrichtung eine Kenngrösse errechnet wird, die mit zuvor aufgenommenen Referenzwerten verglichen, und davon ausgehend eine Meldung automatisch generiert wird, ob ein ordnungsgemässer oder ein fehlerhafter Einbau der Messeinrichtung vorliegt.
PCT/EP2003/006367 2002-07-08 2003-06-17 Verfahren zur überwachung einer durchflussmesseinrichtung Ceased WO2004006199A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US10/520,564 US7505861B2 (en) 2002-07-08 2003-06-17 Method for monitoring the installation of a measurement device
EP03738046A EP1521949A2 (de) 2002-07-08 2003-06-17 Verfahren zur überwachung einer durchflussmesseinrichtung
JP2004518536A JP2005532542A (ja) 2002-07-08 2003-06-17 測定装置とりわけ流量測定装置の監視方法、および測定装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10230607A DE10230607A1 (de) 2002-07-08 2002-07-08 Verfahren zur Überwachung einer Messeinrichtung, insbesondere einer Durchflussmesseinrichtung, sowie eine Messeinrichtung selbst
DE10230607.9 2002-07-08

Publications (2)

Publication Number Publication Date
WO2004006199A2 WO2004006199A2 (de) 2004-01-15
WO2004006199A3 true WO2004006199A3 (de) 2004-03-04

Family

ID=30009826

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2003/006367 Ceased WO2004006199A2 (de) 2002-07-08 2003-06-17 Verfahren zur überwachung einer durchflussmesseinrichtung

Country Status (5)

Country Link
US (1) US7505861B2 (de)
EP (1) EP1521949A2 (de)
JP (1) JP2005532542A (de)
DE (1) DE10230607A1 (de)
WO (1) WO2004006199A2 (de)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7510913B2 (en) 2003-04-11 2009-03-31 Vitex Systems, Inc. Method of making an encapsulated plasma sensitive device
US7648925B2 (en) 2003-04-11 2010-01-19 Vitex Systems, Inc. Multilayer barrier stacks and methods of making multilayer barrier stacks
US7767498B2 (en) 2005-08-25 2010-08-03 Vitex Systems, Inc. Encapsulated devices and method of making
US8590338B2 (en) 2009-12-31 2013-11-26 Samsung Mobile Display Co., Ltd. Evaporator with internal restriction
US8955217B2 (en) 1999-10-25 2015-02-17 Samsung Display Co., Ltd. Method for edge sealing barrier films
US9184410B2 (en) 2008-12-22 2015-11-10 Samsung Display Co., Ltd. Encapsulated white OLEDs having enhanced optical output
US9337446B2 (en) 2008-12-22 2016-05-10 Samsung Display Co., Ltd. Encapsulated RGB OLEDs having enhanced optical output
US9839940B2 (en) 2002-04-15 2017-12-12 Samsung Display Co., Ltd. Apparatus for depositing a multilayer coating on discrete sheets
US10950821B2 (en) 2007-01-26 2021-03-16 Samsung Display Co., Ltd. Method of encapsulating an environmentally sensitive device

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6623861B2 (en) 2001-04-16 2003-09-23 Battelle Memorial Institute Multilayer plastic substrates
US7198832B2 (en) 1999-10-25 2007-04-03 Vitex Systems, Inc. Method for edge sealing barrier films
US6413645B1 (en) 2000-04-20 2002-07-02 Battelle Memorial Institute Ultrabarrier substrates
US8900366B2 (en) 2002-04-15 2014-12-02 Samsung Display Co., Ltd. Apparatus for depositing a multilayer coating on discrete sheets
DE102004031637A1 (de) * 2004-06-30 2006-01-26 Abb Patent Gmbh Verfahren zum Betrieb einer Messeinrichtung, insbesondere einer Durchflussmesseinrichtung
DE102005045485A1 (de) * 2005-09-22 2007-04-12 Endress + Hauser Flowtec Ag Verfahren zur System- und/oder Prozessüberwachung bei einem Ultraschall-Durchflussmessgerät
JP2007333507A (ja) * 2006-06-14 2007-12-27 Mitsubishi Electric Corp 距離センサを設けた機器
JP2008261289A (ja) * 2007-04-12 2008-10-30 Toyota Motor Corp 空燃比センサの異常診断装置
EP2000788A1 (de) 2007-06-06 2008-12-10 Kamstrup A/S Energierechner mit Installationsfehlerdetektion
DK2000784T4 (da) 2007-06-06 2022-03-14 Kamstrup As Ultralydsgennemstrømningsmåler med temperaturkompensation
DE102008029772A1 (de) 2008-06-25 2009-12-31 Endress + Hauser Flowtec Ag Verfahren und Messsystem zur Bestimmung und/oder Überwachung des Durchflusses eines Messmediums durch ein Messrohr
DE102010002504B4 (de) * 2010-03-02 2017-02-09 TAKATA Aktiengesellschaft Verfahren und Vorrichtung zum Überprüfen einer elektronischen Einrichtung
MX2013001820A (es) * 2010-08-27 2013-03-08 Micro Motion Inc Validacion de ensamble de sensor.
DE102010064394A1 (de) 2010-12-30 2012-07-05 Endress + Hauser Gmbh + Co. Kg Verfahren und Vorrichtung zum Ausrichten eines Messgerätes
CN103196479B (zh) * 2012-01-05 2016-08-03 中国石油化工股份有限公司 光纤流量、含水率传感器的实流标定装置及标定方法
DE102013007180A1 (de) * 2013-04-17 2014-10-23 SIKA Dr. Siebert & Kühn GmbH & Co. KG Verfahren zur Auswertung eines Ausgangssignales eines Wirbeldurchflussmessgerätes (WDM) zur Verifikation des Vorliegens einer Strömung
FR3014203B1 (fr) * 2013-11-29 2015-12-25 Thales Sa Dispositif et procede de controle d'une sonde de mesure de pression d'un ecoulement

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5307667A (en) * 1992-07-13 1994-05-03 Ford Motor Company Response time test apparatus for a mass air flow sensor

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4478713A (en) * 1983-09-23 1984-10-23 Pharmuka Laboratoires Automatic installation for liquid chromatography
JP2997571B2 (ja) * 1991-07-10 2000-01-11 三菱電機株式会社 監視診断装置
DE4412653C2 (de) * 1994-04-13 1997-01-09 Schmersal K A Gmbh & Co Überwachungseinrichtung
ES2121560B1 (es) * 1997-05-08 1999-08-16 Sala Vicente Rodilla Avisador programable de consumo electrico.
DE19945395A1 (de) * 1999-09-22 2001-04-05 Deckel Maho Gmbh Überwachungsverfahren und -einrichtung für numerisch gesteuerte Werkzeugmaschinen

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5307667A (en) * 1992-07-13 1994-05-03 Ford Motor Company Response time test apparatus for a mass air flow sensor

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8955217B2 (en) 1999-10-25 2015-02-17 Samsung Display Co., Ltd. Method for edge sealing barrier films
US9839940B2 (en) 2002-04-15 2017-12-12 Samsung Display Co., Ltd. Apparatus for depositing a multilayer coating on discrete sheets
US7510913B2 (en) 2003-04-11 2009-03-31 Vitex Systems, Inc. Method of making an encapsulated plasma sensitive device
US7648925B2 (en) 2003-04-11 2010-01-19 Vitex Systems, Inc. Multilayer barrier stacks and methods of making multilayer barrier stacks
US7767498B2 (en) 2005-08-25 2010-08-03 Vitex Systems, Inc. Encapsulated devices and method of making
US10950821B2 (en) 2007-01-26 2021-03-16 Samsung Display Co., Ltd. Method of encapsulating an environmentally sensitive device
US9184410B2 (en) 2008-12-22 2015-11-10 Samsung Display Co., Ltd. Encapsulated white OLEDs having enhanced optical output
US9337446B2 (en) 2008-12-22 2016-05-10 Samsung Display Co., Ltd. Encapsulated RGB OLEDs having enhanced optical output
US9362530B2 (en) 2008-12-22 2016-06-07 Samsung Display Co., Ltd. Encapsulated white OLEDs having enhanced optical output
US8590338B2 (en) 2009-12-31 2013-11-26 Samsung Mobile Display Co., Ltd. Evaporator with internal restriction
US8904819B2 (en) 2009-12-31 2014-12-09 Samsung Display Co., Ltd. Evaporator with internal restriction

Also Published As

Publication number Publication date
US20060155515A1 (en) 2006-07-13
US7505861B2 (en) 2009-03-17
DE10230607A1 (de) 2004-02-05
EP1521949A2 (de) 2005-04-13
JP2005532542A (ja) 2005-10-27
WO2004006199A2 (de) 2004-01-15

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