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WO2003028367A1 - Imaging device and method for removing noise - Google Patents

Imaging device and method for removing noise Download PDF

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Publication number
WO2003028367A1
WO2003028367A1 PCT/JP2002/008953 JP0208953W WO03028367A1 WO 2003028367 A1 WO2003028367 A1 WO 2003028367A1 JP 0208953 W JP0208953 W JP 0208953W WO 03028367 A1 WO03028367 A1 WO 03028367A1
Authority
WO
WIPO (PCT)
Prior art keywords
image signal
image
noise
circuit
pixel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2002/008953
Other languages
French (fr)
Japanese (ja)
Inventor
Ken Nakajima
Nobuyuki Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to US10/432,134 priority Critical patent/US7479993B2/en
Priority to KR1020037006751A priority patent/KR100880085B1/en
Priority to EP02762990A priority patent/EP1387574A4/en
Publication of WO2003028367A1 publication Critical patent/WO2003028367A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Image Processing (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Image Analysis (AREA)
  • Picture Signal Circuits (AREA)
  • Facsimile Image Signal Circuits (AREA)

Abstract

An imaging device in which noise due to a dark signal from a solid state image sensor can be removed. An image signal (A2) obtained through normal imaging is stored in an image memory, and an image signal (B2) obtained by closing a shutter immediately thereafter is stored in the image memory. Subsequently, the image signals (A2) and (B2) are delivered to a preprocessing circuit (6a) through a memory controller (6c). An operating circuit (61) subtracts the image signal (B2) from the image signal (A2) thus removing the fixed pattern noise and the offset component. A bright point sensing circuit (62) determines the generating position of bright point noise from the image signal (B2) and outputs a timing pulse (T1) in response to the determination. Synchronously with the timing pulse (T1), a dark point correction circuit (63) detects a pixel possibly generating dark point noise in an image signal (C1) outputted from the operating circuit (61) and corrects that pixel using the data on a nearby pixel.
PCT/JP2002/008953 2001-09-20 2002-09-03 Imaging device and method for removing noise Ceased WO2003028367A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US10/432,134 US7479993B2 (en) 2001-09-20 2002-09-03 Image device and method for removing noise
KR1020037006751A KR100880085B1 (en) 2001-09-20 2002-09-03 Imager and noise reduction method
EP02762990A EP1387574A4 (en) 2001-09-20 2002-09-03 IMAGING DEVICE AND METHOD OF NOISE REMOVAL

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001287036A JP3931606B2 (en) 2001-09-20 2001-09-20 Imaging apparatus and noise removal method
JP2001-287036 2001-09-20

Publications (1)

Publication Number Publication Date
WO2003028367A1 true WO2003028367A1 (en) 2003-04-03

Family

ID=19109909

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/008953 Ceased WO2003028367A1 (en) 2001-09-20 2002-09-03 Imaging device and method for removing noise

Country Status (7)

Country Link
US (1) US7479993B2 (en)
EP (1) EP1387574A4 (en)
JP (1) JP3931606B2 (en)
KR (1) KR100880085B1 (en)
CN (2) CN100399805C (en)
TW (1) TW574827B (en)
WO (1) WO2003028367A1 (en)

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CN102316275A (en) * 2011-09-06 2012-01-11 中国科学院长春光学精密机械与物理研究所 Exposure time regulating method for non-electronic shutter frame transfer CCD (charge coupled device)
CN104486563A (en) * 2014-12-19 2015-04-01 中国科学院长春光学精密机械与物理研究所 Implementation method for short to zero exposure time of frame transfer CCD with charge dumping function

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JP4069943B2 (en) 2003-12-03 2008-04-02 株式会社ニコン Image processing apparatus, image processing program, image processing method, and electronic camera for controlling noise removal strength within screen
JP4525198B2 (en) * 2004-06-17 2010-08-18 株式会社ニコン Noise removal device, electronic camera, and noise removal program.
US8009207B2 (en) 2004-05-24 2011-08-30 Nikon Corporation Noise reduction device for reducing noise in image using blackout image, electronic camera, program, and method
CN100394463C (en) * 2004-05-31 2008-06-11 东芝松下显示技术有限公司 Display device equipped with image acquisition function
JP4230967B2 (en) * 2004-07-02 2009-02-25 富士通マイクロエレクトロニクス株式会社 IMAGING DEVICE, IMAGING DEVICE CONTROL METHOD, CMOS IMAGE SENSOR
JP4744828B2 (en) * 2004-08-26 2011-08-10 浜松ホトニクス株式会社 Photodetector
KR101119969B1 (en) * 2004-11-09 2012-02-22 삼성전자주식회사 Apparatus and method for removing hot pixel in digital camera
JP4598182B2 (en) * 2005-01-05 2010-12-15 Ｈｏｙａ株式会社 Electronic endoscope system
CN100394779C (en) * 2005-02-04 2008-06-11 三洋电机株式会社 Noise processing apparatus and image pickup apparatus
JP2007053691A (en) * 2005-08-19 2007-03-01 Micron Technol Inc Extended digital data path structure using sub-LSB
JP2007173953A (en) * 2005-12-19 2007-07-05 Matsushita Electric Ind Co Ltd Solid-state imaging device and driving method
WO2008153085A1 (en) * 2007-06-14 2008-12-18 Sony Corporation Image picking-up device, image picking-up method and image picking-up program
JP2009136459A (en) * 2007-12-05 2009-06-25 Hoya Corp Noise reduction system, endoscope processor, and endoscope system
US8090183B2 (en) * 2009-03-12 2012-01-03 Visiongate, Inc. Pattern noise correction for pseudo projections
JP2009260871A (en) * 2008-04-21 2009-11-05 Nikon Corp Imaging device
US8164657B2 (en) * 2008-06-27 2012-04-24 AltaSens, Inc Pixel or column fixed pattern noise mitigation using partial or full frame correction with uniform frame rates
US20120038778A1 (en) * 2010-08-11 2012-02-16 United States Of America, As Represented By The Secretary Of The Army Self-Scanning Passive Infrared Personnel Detection Sensor
CN102143332B (en) * 2011-04-20 2013-03-20 中国科学院半导体研究所 Standard complementary metal oxide semiconductor (CMOS) process-based color image sensor
KR102149270B1 (en) * 2013-12-13 2020-08-28 한화테크윈 주식회사 Method and system for reducing noise by controlling lens iris
CN104061908B (en) * 2014-06-13 2016-06-01 北京空间机电研究所 A kind of infrared remote sensing device background level drift elimination system and method thereof
US11069054B2 (en) 2015-12-30 2021-07-20 Visiongate, Inc. System and method for automated detection and monitoring of dysplasia and administration of immunotherapy and chemotherapy
JP6862129B2 (en) * 2016-08-29 2021-04-21 キヤノン株式会社 Photoelectric converter and imaging system
JP6880709B2 (en) * 2016-12-20 2021-06-02 株式会社リコー Photoelectric conversion device, photoelectric conversion method and image forming device
US11367390B2 (en) * 2018-12-24 2022-06-21 Novatek Microelectronics Corp. Display apparatus and method for noise reduction
JP2024056345A (en) * 2022-10-11 2024-04-23 浜松ホトニクス株式会社 Solid-state imaging device and signal processing method

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JPH05137073A (en) * 1991-11-11 1993-06-01 Canon Inc Fixed pattern correction device for solid-state image sensor
JPH06303531A (en) * 1993-04-09 1994-10-28 Olympus Optical Co Ltd Picture element defect correcting device for solid-state image pickup element
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JPH0851571A (en) * 1994-08-03 1996-02-20 Olympus Optical Co Ltd Electronic imager
JPH11215439A (en) * 1998-01-26 1999-08-06 Toshiba Corp Fixed pattern noise reduction device for image sensor
JP2000152092A (en) * 1998-11-10 2000-05-30 Olympus Optical Co Ltd Electronic camera
JP2000209506A (en) * 1999-01-14 2000-07-28 Toshiba Corp Imaging device and imaging method
JP2001024951A (en) * 1999-07-06 2001-01-26 Olympus Optical Co Ltd Image pickup device
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See also references of EP1387574A4

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102316275A (en) * 2011-09-06 2012-01-11 中国科学院长春光学精密机械与物理研究所 Exposure time regulating method for non-electronic shutter frame transfer CCD (charge coupled device)
CN104486563A (en) * 2014-12-19 2015-04-01 中国科学院长春光学精密机械与物理研究所 Implementation method for short to zero exposure time of frame transfer CCD with charge dumping function
CN104486563B (en) * 2014-12-19 2017-10-31 中国科学院长春光学精密机械与物理研究所 The electrically charged frame transfer CCD time for exposure for toppling over function is as short as zero implementation method

Also Published As

Publication number Publication date
CN1484913A (en) 2004-03-24
EP1387574A1 (en) 2004-02-04
CN100399805C (en) 2008-07-02
JP3931606B2 (en) 2007-06-20
KR20040038894A (en) 2004-05-08
US7479993B2 (en) 2009-01-20
TW574827B (en) 2004-02-01
JP2003101887A (en) 2003-04-04
KR100880085B1 (en) 2009-01-23
EP1387574A4 (en) 2006-08-02
CN101141561B (en) 2010-06-16
US20040135922A1 (en) 2004-07-15
CN101141561A (en) 2008-03-12

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