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WO2003019163A1 - Procede pour determiner la structure d'une molecule a atomes multiples - Google Patents

Procede pour determiner la structure d'une molecule a atomes multiples Download PDF

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Publication number
WO2003019163A1
WO2003019163A1 PCT/RU2001/000354 RU0100354W WO03019163A1 WO 2003019163 A1 WO2003019163 A1 WO 2003019163A1 RU 0100354 W RU0100354 W RU 0100354W WO 03019163 A1 WO03019163 A1 WO 03019163A1
Authority
WO
WIPO (PCT)
Prior art keywords
source
particles
zοndiρuyuschiχ
chasτits
mοleκuly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/RU2001/000354
Other languages
English (en)
Russian (ru)
Inventor
Vadim Israilovich Rakhovski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to RU2003112621/28A priority Critical patent/RU2260791C2/ru
Priority to PCT/RU2001/000354 priority patent/WO2003019163A1/fr
Publication of WO2003019163A1 publication Critical patent/WO2003019163A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20058—Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/295—Electron or ion diffraction tubes

Definitions

  • the invention is not available for analysis, based on the study of dispersed samples, and is subject to study.
  • the study of the structure of proteins is carried out, mainly, by the methods of classical X-ray analysis. This will take place: all the time, the methods of processing the proteins for the purpose of obtaining crystalline samples for the X-ray analysis; secondly, studying the crystals of the studied proteins; In the process of processing the processes used in the process of research of the process of research of the process of the study,
  • the intense interaction of the elec- trons with the material limits the thickness of the samples illuminated by the magnitude of the order of the micrometer.
  • diffuse secondary diffusers are diffused.
  • the basis for the separation of the elementary crystalline cell and the symmetry of the crystal is the measurement of the location of the reflexes on the elec- tronic system.
  • the main task of the invention is to provide a convenient division of the structure of a large molecule, including a real protein.
  • the calculation procedure of the dispersing center is close to the calculation procedure used in the X-ray analysis and gas electric.
  • the source of the source part of the sounding particles in all of the above-mentioned options may be used:
  • a needle placed close to the studied molecule for example, from a heavy metal, from a direct pulling of an electric plug or from an electrical

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Radiation-Therapy Devices (AREA)

Abstract

L'invention appartient au domaine de l'analyse structurelle basée sur l'étude des particules sondes dispersées et peut s'utiliser pour étudier la structure atomique d'une molécule protéique. L'invention vise à déterminer avec précision la structure d'une molécule à atomes multiples, y compris de celle d'une protéine réelle. La particularité de l'invention consiste en ce qu'il est possible de déplacer la source de particules sondes et/ou d'un substrat ou d'une aiguille sur une distance prédéterminée avec une valeur discrète linéaire jusqu'à 0,01 nanomètre et une valeur discrète angulaire jusqu'à 10-3 secondes angulaires, de fixer dans chaque position de répartition les particules sondes dispersées de manière élastique en fonction des intensités et des angles, au moyen d'un analyseur semi-sphérique à matrice. La récupération des centres de dispersion constitués par les atomes de la molécule étudiée peut s'effectuer par des calculs utilisant une indicatrice spatiale de la dispersion des particules sondes ou selon le tableau des interférences qui se forme sous l'effet de l'interaction du faisceau primaire des particules sondes et des particules sondes dispersées de manière élastique.
PCT/RU2001/000354 2001-08-28 2001-08-28 Procede pour determiner la structure d'une molecule a atomes multiples Ceased WO2003019163A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
RU2003112621/28A RU2260791C2 (ru) 2001-08-28 2001-08-28 Способ определения структуры многоатомной молекулы
PCT/RU2001/000354 WO2003019163A1 (fr) 2001-08-28 2001-08-28 Procede pour determiner la structure d'une molecule a atomes multiples

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/RU2001/000354 WO2003019163A1 (fr) 2001-08-28 2001-08-28 Procede pour determiner la structure d'une molecule a atomes multiples

Publications (1)

Publication Number Publication Date
WO2003019163A1 true WO2003019163A1 (fr) 2003-03-06

Family

ID=20129645

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/RU2001/000354 Ceased WO2003019163A1 (fr) 2001-08-28 2001-08-28 Procede pour determiner la structure d'une molecule a atomes multiples

Country Status (2)

Country Link
RU (1) RU2260791C2 (fr)
WO (1) WO2003019163A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2329488C1 (ru) * 2006-11-23 2008-07-20 Институт физики твердого тела РАН Способ определения величины угла хиральности на электронно-дифракционных картинах кристаллов с трубчатой структурой
EA015236B1 (ru) * 2009-07-07 2011-06-30 Владимир Абрамович Намиот Способ определения внутренней структуры объектов и устройство

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5581082A (en) * 1995-03-28 1996-12-03 The Regents Of The University Of California Combined scanning probe and scanning energy microscope
US5675148A (en) * 1991-02-15 1997-10-07 Shimadzu Corporation Scanning reflection electron diffraction microscope
US5754335A (en) * 1996-05-10 1998-05-19 Shimadzu Corporation Infrared microscope for analysis of a selected sample area
RU2131629C1 (ru) * 1997-12-30 1999-06-10 Брюхневич Геннадий Иванович Электронно-оптическое дифрактометрическое устройство
RU2145109C1 (ru) * 1999-03-09 2000-01-27 Левин Геннадий Генрихович Способ оптической томографии трехмерных микрообъектов и микроскоп для его осуществления

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU843024A1 (ru) * 1979-09-17 1981-06-30 Институт Кристаллографии Им.А.В.Шуб-Никова Ah Cccp Способ электронно-дифракционногоСТРуКТуРНОгО АНАлизА МАТЕРиАлОВ иуСТРОйСТВО дл ЕгО ОСущЕСТВлЕНи
JPS60165951A (ja) * 1984-02-10 1985-08-29 株式会社東芝 磁気共鳴イメージング装置
SU1269215A1 (ru) * 1985-05-27 1986-11-07 МГУ им.М.В.Ломоносова Способ измерени интенсивности рассе ни электронов при электронографических исследовани х
US5659175A (en) * 1995-12-21 1997-08-19 Lucent Technologies Inc. Apparatus and method for tomography of microscopic samples
JP2001527456A (ja) * 1997-05-23 2001-12-25 ザ・カロライナス・ハート・インスティテュート 電磁式画像処理装置及び診断装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5675148A (en) * 1991-02-15 1997-10-07 Shimadzu Corporation Scanning reflection electron diffraction microscope
US5581082A (en) * 1995-03-28 1996-12-03 The Regents Of The University Of California Combined scanning probe and scanning energy microscope
US5754335A (en) * 1996-05-10 1998-05-19 Shimadzu Corporation Infrared microscope for analysis of a selected sample area
RU2131629C1 (ru) * 1997-12-30 1999-06-10 Брюхневич Геннадий Иванович Электронно-оптическое дифрактометрическое устройство
RU2145109C1 (ru) * 1999-03-09 2000-01-27 Левин Геннадий Генрихович Способ оптической томографии трехмерных микрообъектов и микроскоп для его осуществления

Also Published As

Publication number Publication date
RU2003112621A (ru) 2005-02-10
RU2260791C2 (ru) 2005-09-20

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