WO2003088351A1 - Structure d'orifice dans un dispositif de traitement de semi-conducteur - Google Patents
Structure d'orifice dans un dispositif de traitement de semi-conducteur Download PDFInfo
- Publication number
- WO2003088351A1 WO2003088351A1 PCT/JP2003/003997 JP0303997W WO03088351A1 WO 2003088351 A1 WO2003088351 A1 WO 2003088351A1 JP 0303997 W JP0303997 W JP 0303997W WO 03088351 A1 WO03088351 A1 WO 03088351A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- carrier container
- port
- door
- container
- carrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H10P72/3408—
-
- H10P72/50—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/07—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for semiconductor wafers Not used, see H01L21/677
-
- H10P30/20—
-
- H10P95/90—
Definitions
- Fig. 2 is a vertical view schematically showing the inside of the vertical heat treatment apparatus shown in Fig. 1. Sectional view.
- FIG. 7 is a perspective view showing a holding mechanism of the vertical heat treatment apparatus shown in FIG.
- the area S 1 and the loading area S 2 are separated by a partition wall 4.
- the partition 4 is formed with a port 41, and the port 41 is opened and closed by a door 43.
- the area S1 is set to the air atmosphere (the atmosphere in the clean room).
- the opening area S2 is set in an inert gas atmosphere, for example, a nitrogen ( ⁇ 2) gas atmosphere or a clean dry gas (air having a low particle and organic component and a dew point of less than 60 ° C). You.
- a vertical heat treatment furnace 91 having a furnace B at its lower end which is opened and closed by a lid 94 is provided.
- a wafer boat 92 which is a holder for holding a large number of wafers W in a shelf shape, is placed on a lid 94.
- a heat insulating portion 93 is provided between the wafer boat 92 and the cover 94 on the cover 94.
- the lid body 94 is supported on an elevating mechanism 95, and the elevating mechanism 95 loads and unloads the wafer port 92 from the heat treatment furnace 91.
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
L'invention concerne un dispositif de traitement de semi-conducteur comprenant une structure d'orifice permettant d'introduire ou de sortir un substrat (W) soumis à un traitement. Une paroi de séparation (4) destinée à séparer la région extérieure (S1) de la région intérieure (S2) du dispositif est dotée d'un orifice (41) permettant le passage du substrat (W) soumis à un traitement. Ladite paroi de séparation (4) est équipée d'une porte (43) permettant d'ouvrir et de fermer l'orifice (41). Un support (61) est disposé dans la région extérieure (S1) face à l'orifice (41). Un élément de presse (72) est disposé au-dessus dudit support (61). Ledit élément de presse (72) presse un récipient porteur (2) destiné au substrat (W) soumis à un traitement du haut vers le support (61). Cet élément de presse (72) se déplace d'une position inférieure dans laquelle il coopère avec le récipient porteur (2) vers une position supérieure dans laquelle il n'interfère pas avec le déplacement dudit récipient porteur (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020047010060A KR100922051B1 (ko) | 2002-04-12 | 2003-03-28 | 반도체 처리 장치에 있어서의 포트 구조 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002-111114 | 2002-04-12 | ||
| JP2002111114 | 2002-04-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2003088351A1 true WO2003088351A1 (fr) | 2003-10-23 |
Family
ID=29243258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2003/003997 Ceased WO2003088351A1 (fr) | 2002-04-12 | 2003-03-28 | Structure d'orifice dans un dispositif de traitement de semi-conducteur |
Country Status (4)
| Country | Link |
|---|---|
| KR (1) | KR100922051B1 (fr) |
| CN (2) | CN1307706C (fr) |
| TW (1) | TWI270955B (fr) |
| WO (1) | WO2003088351A1 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150243540A1 (en) * | 2014-02-24 | 2015-08-27 | Tokyo Electron Limited | Substrate processing apparatus and substrate processing method |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4778546B2 (ja) * | 2007-11-30 | 2011-09-21 | 東京エレクトロン株式会社 | 半導体製造装置における地震被害拡散低減方法及び地震被害拡散低減システム |
| JP5134495B2 (ja) | 2008-10-16 | 2013-01-30 | 東京エレクトロン株式会社 | 処理装置及び処理方法 |
| KR101258350B1 (ko) * | 2010-06-07 | 2013-04-30 | 도쿄엘렉트론가부시키가이샤 | 기판 처리 장치 |
| KR101283312B1 (ko) * | 2011-12-29 | 2013-07-09 | 로체 시스템즈(주) | Fosb 오토 로딩 시스템 |
| JP7422577B2 (ja) * | 2020-03-23 | 2024-01-26 | 平田機工株式会社 | ロードポート及び制御方法 |
| KR102372513B1 (ko) * | 2021-05-10 | 2022-03-10 | 주식회사 위존 | Fims 시스템 |
| KR102372514B1 (ko) * | 2021-05-10 | 2022-03-10 | 주식회사 위존 | Fims 시스템의 풉 고정장치 |
| KR102897579B1 (ko) | 2021-08-05 | 2025-12-09 | 삼성전자주식회사 | 링크 암을 갖는 이송 장치 및 이를 포함하는 스토커 |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04184958A (ja) * | 1990-11-20 | 1992-07-01 | Ebara Corp | キャリヤボックス内容物の収容取出方法及び装置 |
| JPH0846005A (ja) * | 1994-07-26 | 1996-02-16 | Takenaka Komuten Co Ltd | ウエーハ移載装置 |
| US5730573A (en) * | 1994-02-22 | 1998-03-24 | Tdk Corporation | Clean transfer method and apparatus therefor |
| WO1999032381A1 (fr) * | 1997-12-19 | 1999-07-01 | Semitool, Inc. | Systeme de manipulation en entree/sortie de tranches de semi-conducteurs |
| JP2001127138A (ja) * | 1993-12-10 | 2001-05-11 | Tokyo Electron Ltd | 処理装置及び処理方法 |
| US6231290B1 (en) * | 1998-03-23 | 2001-05-15 | Tokyo Electron | Processing method and processing unit for substrate |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6501070B1 (en) * | 1998-07-13 | 2002-12-31 | Newport Corporation | Pod load interface equipment adapted for implementation in a fims system |
-
2003
- 2003-03-28 CN CNB03804921XA patent/CN1307706C/zh not_active Expired - Fee Related
- 2003-03-28 KR KR1020047010060A patent/KR100922051B1/ko not_active Expired - Fee Related
- 2003-03-28 WO PCT/JP2003/003997 patent/WO2003088351A1/fr not_active Ceased
- 2003-04-11 TW TW092108580A patent/TWI270955B/zh not_active IP Right Cessation
- 2003-04-14 CN CNU03243278XU patent/CN2795158Y/zh not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04184958A (ja) * | 1990-11-20 | 1992-07-01 | Ebara Corp | キャリヤボックス内容物の収容取出方法及び装置 |
| JP2001127138A (ja) * | 1993-12-10 | 2001-05-11 | Tokyo Electron Ltd | 処理装置及び処理方法 |
| US5730573A (en) * | 1994-02-22 | 1998-03-24 | Tdk Corporation | Clean transfer method and apparatus therefor |
| JPH0846005A (ja) * | 1994-07-26 | 1996-02-16 | Takenaka Komuten Co Ltd | ウエーハ移載装置 |
| WO1999032381A1 (fr) * | 1997-12-19 | 1999-07-01 | Semitool, Inc. | Systeme de manipulation en entree/sortie de tranches de semi-conducteurs |
| US6231290B1 (en) * | 1998-03-23 | 2001-05-15 | Tokyo Electron | Processing method and processing unit for substrate |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150243540A1 (en) * | 2014-02-24 | 2015-08-27 | Tokyo Electron Limited | Substrate processing apparatus and substrate processing method |
| US9666464B2 (en) * | 2014-02-24 | 2017-05-30 | Tokyo Electron Limited | Substrate processing apparatus and substrate processing method |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20040099260A (ko) | 2004-11-26 |
| TWI270955B (en) | 2007-01-11 |
| CN1639857A (zh) | 2005-07-13 |
| KR100922051B1 (ko) | 2009-10-19 |
| TW200402822A (en) | 2004-02-16 |
| CN2795158Y (zh) | 2006-07-12 |
| CN1307706C (zh) | 2007-03-28 |
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