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WO2003041115A1 - Mass spectrometer - Google Patents

Mass spectrometer Download PDF

Info

Publication number
WO2003041115A1
WO2003041115A1 PCT/JP2001/009729 JP0109729W WO03041115A1 WO 2003041115 A1 WO2003041115 A1 WO 2003041115A1 JP 0109729 W JP0109729 W JP 0109729W WO 03041115 A1 WO03041115 A1 WO 03041115A1
Authority
WO
WIPO (PCT)
Prior art keywords
section
hole electrode
thin hole
intermediate pressure
electrode side
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2001/009729
Other languages
English (en)
French (fr)
Inventor
Tomoyuki Tobita
Toshihiro Ishizuka
Masaru Tomioka
Kiyomi Yoshinari
Masami Sakamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp, Hitachi High Tech Corp filed Critical Hitachi High Technologies Corp
Priority to US10/494,335 priority Critical patent/US7053367B2/en
Priority to JP2003543061A priority patent/JP4178110B2/ja
Priority to PCT/JP2001/009729 priority patent/WO2003041115A1/ja
Publication of WO2003041115A1 publication Critical patent/WO2003041115A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
PCT/JP2001/009729 2001-11-07 2001-11-07 Mass spectrometer Ceased WO2003041115A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US10/494,335 US7053367B2 (en) 2001-11-07 2001-11-07 Mass spectrometer
JP2003543061A JP4178110B2 (ja) 2001-11-07 2001-11-07 質量分析装置
PCT/JP2001/009729 WO2003041115A1 (en) 2001-11-07 2001-11-07 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2001/009729 WO2003041115A1 (en) 2001-11-07 2001-11-07 Mass spectrometer

Publications (1)

Publication Number Publication Date
WO2003041115A1 true WO2003041115A1 (en) 2003-05-15

Family

ID=11737913

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2001/009729 Ceased WO2003041115A1 (en) 2001-11-07 2001-11-07 Mass spectrometer

Country Status (3)

Country Link
US (1) US7053367B2 (ja)
JP (1) JP4178110B2 (ja)
WO (1) WO2003041115A1 (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005519450A (ja) * 2002-03-08 2005-06-30 ヴァリアン オーストラリア ピーティーワイ．エルティーディー． プラズマ質量分析計
JP2008527653A (ja) * 2005-01-10 2008-07-24 アプレラ コーポレイション 質量分析器における改良された感度のための方法および装置
JP2009222660A (ja) * 2008-03-18 2009-10-01 Central Res Inst Of Electric Power Ind ナノ粒子成分計測装置
JP2011228071A (ja) * 2010-04-19 2011-11-10 Hitachi High-Technologies Corp 質量分析装置

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7095019B1 (en) 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
JP4505460B2 (ja) * 2003-02-14 2010-07-21 エムディーエス インコーポレイテッド 質量分析のための大気圧荷電粒子選別器
CA2976507C (en) * 2003-06-09 2020-05-12 Perkinelmer Health Sciences Canada, Inc. Mass spectrometer interface
JP4162138B2 (ja) * 2003-10-27 2008-10-08 株式会社リガク 昇温脱離ガス分析装置
US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
US7568401B1 (en) 2005-06-20 2009-08-04 Science Applications International Corporation Sample tube holder
US7576322B2 (en) * 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
US8123396B1 (en) 2007-05-16 2012-02-28 Science Applications International Corporation Method and means for precision mixing
US8008617B1 (en) 2007-12-28 2011-08-30 Science Applications International Corporation Ion transfer device
EP2851433B1 (en) 2008-08-01 2017-10-11 Brown University System and methods for determining molecules using mass spectrometry and related techniques
US8071957B1 (en) 2009-03-10 2011-12-06 Science Applications International Corporation Soft chemical ionization source
GB2472638B (en) * 2009-08-14 2014-03-19 Edwards Ltd Vacuum system
US9105457B2 (en) * 2010-02-24 2015-08-11 Perkinelmer Health Sciences, Inc. Cone-shaped orifice arrangement for inductively coupled plasma sample introduction system
CN102971826B (zh) * 2010-06-24 2015-07-22 株式会社岛津制作所 大气压电离质谱仪
US8373118B2 (en) 2010-10-21 2013-02-12 Advion, Inc. Atmospheric pressure ionization inlet for mass spectrometers
GB2498173C (en) * 2011-12-12 2018-06-27 Thermo Fisher Scient Bremen Gmbh Mass spectrometer vacuum interface method and apparatus
JP5802566B2 (ja) * 2012-01-23 2015-10-28 株式会社日立ハイテクノロジーズ 質量分析装置
GB201409604D0 (en) * 2014-05-30 2014-07-16 Shimadzu Corp Improvements in or relating to mass spectrometry
JP6295150B2 (ja) * 2014-07-07 2018-03-14 株式会社日立ハイテクノロジーズ 質量分析装置
US9558924B2 (en) * 2014-12-09 2017-01-31 Morpho Detection, Llc Systems for separating ions and neutrals and methods of operating the same
CN108140537B (zh) * 2015-08-06 2020-01-17 株式会社岛津制作所 质谱分析装置
WO2017089044A1 (en) 2015-11-27 2017-06-01 Shimadzu Corporation Ion transfer apparatus
CN107221488A (zh) * 2016-03-22 2017-09-29 四川大学 一种用于传输质子转移反应离子源中离子的传输装置
US11235329B2 (en) 2017-08-10 2022-02-01 Rapiscan Systems, Inc. Systems and methods for substance detection using thermally stable collection devices
US11609214B2 (en) 2019-07-31 2023-03-21 Rapiscan Systems, Inc. Systems and methods for improving detection accuracy in electronic trace detectors
US12051584B2 (en) * 2020-02-04 2024-07-30 Perkinelmer Scientific Canada Ulc ION interfaces and systems and methods using them
US12411122B2 (en) 2020-05-12 2025-09-09 Rapiscan Systems, Inc. Sensitivity traps for electronic trace detection having explosives or narcotics embedded in a plasticized polymer matrix
WO2025072067A1 (en) * 2023-09-26 2025-04-03 Inficon, Inc. Method and assembly for creating a molecular beam

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05203637A (ja) * 1992-01-28 1993-08-10 Hitachi Ltd 質量分析計
JPH06331616A (ja) * 1993-05-07 1994-12-02 Waters Investments Ltd 電気噴霧をイオン流に変換するためのハウジング
JP2001101992A (ja) * 1999-09-30 2001-04-13 Shimadzu Corp 大気圧イオン化質量分析装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3274302B2 (ja) * 1994-11-28 2002-04-15 株式会社日立製作所 質量分析計
US6392226B1 (en) * 1996-09-13 2002-05-21 Hitachi, Ltd. Mass spectrometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05203637A (ja) * 1992-01-28 1993-08-10 Hitachi Ltd 質量分析計
JPH06331616A (ja) * 1993-05-07 1994-12-02 Waters Investments Ltd 電気噴霧をイオン流に変換するためのハウジング
JP2001101992A (ja) * 1999-09-30 2001-04-13 Shimadzu Corp 大気圧イオン化質量分析装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005519450A (ja) * 2002-03-08 2005-06-30 ヴァリアン オーストラリア ピーティーワイ．エルティーディー． プラズマ質量分析計
JP2008527653A (ja) * 2005-01-10 2008-07-24 アプレラ コーポレイション 質量分析器における改良された感度のための方法および装置
JP2009222660A (ja) * 2008-03-18 2009-10-01 Central Res Inst Of Electric Power Ind ナノ粒子成分計測装置
JP2011228071A (ja) * 2010-04-19 2011-11-10 Hitachi High-Technologies Corp 質量分析装置

Also Published As

Publication number Publication date
JP4178110B2 (ja) 2008-11-12
US7053367B2 (en) 2006-05-30
US20040262512A1 (en) 2004-12-30
JPWO2003041115A1 (ja) 2005-03-03

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