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WO2002097679A3 - Verfahren zum bereitstellen von fehlerinformationen über inkonsistenzen in einem system von differentialgleichungen - Google Patents

Verfahren zum bereitstellen von fehlerinformationen über inkonsistenzen in einem system von differentialgleichungen Download PDF

Info

Publication number
WO2002097679A3
WO2002097679A3 PCT/DE2002/001878 DE0201878W WO02097679A3 WO 2002097679 A3 WO2002097679 A3 WO 2002097679A3 DE 0201878 W DE0201878 W DE 0201878W WO 02097679 A3 WO02097679 A3 WO 02097679A3
Authority
WO
WIPO (PCT)
Prior art keywords
inconsistencies
error information
information concerning
differential equations
providing error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE2002/001878
Other languages
English (en)
French (fr)
Other versions
WO2002097679A2 (de
Inventor
Gunther Reissig
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Infineon Technologies AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Priority to JP2003500789A priority Critical patent/JP2004532483A/ja
Priority to KR1020037015502A priority patent/KR100552639B1/ko
Priority to EP02737851A priority patent/EP1390883A2/de
Publication of WO2002097679A2 publication Critical patent/WO2002097679A2/de
Publication of WO2002097679A3 publication Critical patent/WO2002097679A3/de
Priority to US10/723,642 priority patent/US7490026B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B17/00—Systems involving the use of models or simulators of said systems
    • G05B17/02—Systems involving the use of models or simulators of said systems electric
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/11—Complex mathematical operations for solving equations, e.g. nonlinear equations, general mathematical optimization problems
    • G06F17/13—Differential equations
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/36—Circuit design at the analogue level
    • G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Data Mining & Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • Algebra (AREA)
  • Operations Research (AREA)
  • Automation & Control Theory (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Complex Calculations (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Testing And Monitoring For Control Systems (AREA)

Abstract

Die Erfindung betrifft ein Verfahren zum Bereitstellen von Fehlerinformationen über Inkonsistenzen in einem ein technisches System oder einen technischen Prozeß beschreibenden System von Differentialgleichungen.
PCT/DE2002/001878 2001-05-28 2002-05-23 Verfahren zum bereitstellen von fehlerinformationen über inkonsistenzen in einem system von differentialgleichungen Ceased WO2002097679A2 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2003500789A JP2004532483A (ja) 2001-05-28 2002-05-23 連立微分方程式における不一致性に関する誤り情報の提供方法
KR1020037015502A KR100552639B1 (ko) 2001-05-28 2002-05-23 미분 방정식 시스템에서 불일치에 관한 에러 정보를제공하는 방법
EP02737851A EP1390883A2 (de) 2001-05-28 2002-05-23 Verfahren zum bereitstellen von fehlerinformationen über inkonsistenzen in einem system von differentialgleichungen
US10/723,642 US7490026B2 (en) 2001-05-28 2003-11-26 Method for providing error information relating to inconsistencies in a system of differential equations

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10126018.0 2001-05-28
DE10126018A DE10126018A1 (de) 2001-05-28 2001-05-28 Verfahren zum Bereitstellen von Fehlerinformationen über Inkonsistenzen in einem System von Differentialgleichungen

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/723,642 Continuation US7490026B2 (en) 2001-05-28 2003-11-26 Method for providing error information relating to inconsistencies in a system of differential equations

Publications (2)

Publication Number Publication Date
WO2002097679A2 WO2002097679A2 (de) 2002-12-05
WO2002097679A3 true WO2002097679A3 (de) 2003-05-22

Family

ID=7686449

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE2002/001878 Ceased WO2002097679A2 (de) 2001-05-28 2002-05-23 Verfahren zum bereitstellen von fehlerinformationen über inkonsistenzen in einem system von differentialgleichungen

Country Status (7)

Country Link
US (1) US7490026B2 (de)
EP (1) EP1390883A2 (de)
JP (1) JP2004532483A (de)
KR (1) KR100552639B1 (de)
CN (1) CN1527979A (de)
DE (1) DE10126018A1 (de)
WO (1) WO2002097679A2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7415395B2 (en) * 2001-12-21 2008-08-19 Caterpillar Inc. Symbolic evaluation engine for high-performance simulations
DE102004040177A1 (de) * 2004-08-18 2006-03-09 Infineon Technologies Ag Verfahren zur Verbesserung der Aussageschärfe von Diagnosen technischer Anordnungen
EP2049635A2 (de) * 2006-07-28 2009-04-22 ExxonMobil Research and Engineering Company Schmiermittelzusammensetzungen, ihre herstellung und verwendung
US8483999B2 (en) 2010-11-18 2013-07-09 Toyota Motor Engineering & Manufacturing North America, Inc. Method and system for simplifying models
WO2013125118A1 (ja) * 2012-02-22 2013-08-29 カルソニックカンセイ株式会社 パラメータ推定装置
US8726203B1 (en) 2013-04-25 2014-05-13 Cydesign, Inc. System and method for generating virtual test benches

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01307868A (ja) 1988-06-06 1989-12-12 Mitsubishi Electric Corp 数値解析装置
JPH0944473A (ja) 1995-07-26 1997-02-14 Hitachi Ltd 有限要素法による偏微分方程式解析手法
DE19626984C1 (de) * 1996-07-04 1997-11-27 Siemens Ag Verfahren zur rechnergestützten Ermittlung einer Systemzusammenhangsfunktion
WO1999048030A1 (de) * 1998-03-18 1999-09-23 Siemens Aktiengesellschaft Verfahren und vorrichtung zur ermittlung einer störung eines technischen systems
US6266630B1 (en) * 1998-06-03 2001-07-24 Mentor Graphics Corporation Method and apparatus for providing a graphical user interface for simulating designs with analog and mixed signals
US6230101B1 (en) * 1999-06-03 2001-05-08 Schlumberger Technology Corporation Simulation method and apparatus

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
CHOWDHRY S ET AL: "Automatic structure analysis of large scale differential algebraic systems", IMTC 2001. PROCEEDINGS OF THE 18TH. IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE. BUDAPEST, HUNGARY, MAY 21 - 23, 2001, IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE. (IMTC):, NEW YORK, NY: IEEE, US, vol. 1 OF 3. CONF. 18, 21 May 2001 (2001-05-21), pages 798 - 803, XP010545871, ISBN: 0-7803-6646-8 *
REISSIG GUNTHER ET AL: "Differential-algebraic equations of index 1 may have an arbitrarily high structural index", SIAM J. SCI. COMPUT.;SIAM JOURNAL OF SCIENTIFIC COMPUTING 2000 SOC FOR INDUSTRIAL & APPLIED MATHEMATICS PUBL, PHILADELPHIA, PA, USA, vol. 21, no. 6, 2000, pages 1987 - 1990, XP008013088 *
UNGER J ET AL: "Structural analysis of differential-algebraic equation systems - theory and applications", COMPUT CHEM ENG;COMPUTERS & CHEMICAL ENGINEERING AUG 1995 PERGAMON PRESS INC, TARRYTOWN, NY, USA, vol. 19, no. 8, August 1995 (1995-08-01), pages 867 - 882, XP002229560 *

Also Published As

Publication number Publication date
KR20040007612A (ko) 2004-01-24
KR100552639B1 (ko) 2006-02-20
DE10126018A1 (de) 2003-02-27
WO2002097679A2 (de) 2002-12-05
US7490026B2 (en) 2009-02-10
JP2004532483A (ja) 2004-10-21
CN1527979A (zh) 2004-09-08
US20040133407A1 (en) 2004-07-08
EP1390883A2 (de) 2004-02-25

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