WO2002062917A1 - Cerium based abrasive material and method for preparation thereof - Google Patents
Cerium based abrasive material and method for preparation thereof Download PDFInfo
- Publication number
- WO2002062917A1 WO2002062917A1 PCT/JP2002/000762 JP0200762W WO02062917A1 WO 2002062917 A1 WO2002062917 A1 WO 2002062917A1 JP 0200762 W JP0200762 W JP 0200762W WO 02062917 A1 WO02062917 A1 WO 02062917A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- cerium
- less
- abrasive
- roasting
- polishing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1436—Composite particles, e.g. coated particles
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01F—COMPOUNDS OF THE METALS BERYLLIUM, MAGNESIUM, ALUMINIUM, CALCIUM, STRONTIUM, BARIUM, RADIUM, THORIUM, OR OF THE RARE-EARTH METALS
- C01F17/00—Compounds of rare earth metals
- C01F17/20—Compounds containing only rare earth metals as the metal element
- C01F17/206—Compounds containing only rare earth metals as the metal element oxide or hydroxide being the only anion
- C01F17/224—Oxides or hydroxides of lanthanides
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01F—COMPOUNDS OF THE METALS BERYLLIUM, MAGNESIUM, ALUMINIUM, CALCIUM, STRONTIUM, BARIUM, RADIUM, THORIUM, OR OF THE RARE-EARTH METALS
- C01F17/00—Compounds of rare earth metals
- C01F17/20—Compounds containing only rare earth metals as the metal element
- C01F17/206—Compounds containing only rare earth metals as the metal element oxide or hydroxide being the only anion
- C01F17/224—Oxides or hydroxides of lanthanides
- C01F17/235—Cerium oxides or hydroxides
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/12—Surface area
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/60—Optical properties, e.g. expressed in CIELAB-values
Definitions
- the present invention relates to a cerium-based abrasive and a method for producing the same, and more particularly, to a cerium-based abrasive having excellent polishing speed and surface properties after polishing, and excellent in polishing characteristics, and a method for producing the same.
- Conventional technology relates to a cerium-based abrasive and a method for producing the same, and more particularly, to a cerium-based abrasive having excellent polishing speed and surface properties after polishing, and excellent in polishing characteristics, and a method for producing the same.
- glass substrates for optical disks glass substrates for magnetic disks, glass substrates for photomasks used in semiconductor manufacturing, glass substrates for LCDs, etc., and optical lenses, etc.
- high-precision surface polishing Is required.
- a cerium-based abrasive mainly composed of a rare earth oxide, particularly cerium oxide (hereinafter referred to as “cerium-based abrasive”) is used.
- Cerium oxide is superior in polishing characteristics to glass polishing in comparison with zirconium oxide and silicon dioxide.
- cerium oxide has a higher polishing rate than zirconium oxide, silicon dioxide, aluminum oxide, and the like, so that it is possible to perform polishing more quickly.
- cerium oxide is not very hard, so if it is used for polishing, it is possible to obtain a smoother glass surface after polishing.
- the polishing characteristics of a cell-based abrasive are determined by many factors such as the content of cell oxide-fluorine (F) and the specific surface area. Therefore, in order to control the polishing properties, there is a problem that each property must be accurately evaluated and comprehensively determined.
- cerium-based abrasives are important. For example, one of the most important steps is the roasting step in the latter half of the manufacturing process.
- the roasting process the raw materials for ceramic abrasives are heated to high temperatures in an oxidizing atmosphere.
- fluorine which is one of the important factors that determine the polishing characteristics, is easily dissipated from the raw material. Therefore, it is necessary to appropriately control the roasting process.
- a device capable of continuously roasting is used, there is a problem that it is difficult to control the roasting state because it is difficult to judge the roasting state quickly and accurately.
- the present invention has been made in response to such a problem, and it is an object of the present invention to provide a cerium-based abrasive having excellent polishing characteristics and a method for producing the same. Disclosure of the invention
- polishing rate is high (high polishing efficiency), that there is no scratch, and that the residual abrasive after polishing is excellent in cleanability.
- various physical properties including the size of the abrasive particles, and chemical composition have been studied, and various optimizations have been made.
- the present inventors have carried out various studies on abrasives excellent in polishing evaluation without being limited to the viewpoint of the characteristics of such conventionally used abrasives. As a result, it was found that the color of the ceramic abrasive was related to the polishing evaluation.
- the present invention relates to a cerium-based abrasive mainly containing cerium oxide, wherein when the color of the cerium-based abrasive is represented by an L * a * b * color system, the value of L * is 65 or more and 90 or less. It is characterized by being.
- L * a * b * Jels 1st, Aster, Bees 1st
- the color system is very commonly used in industry for color management.
- the color is represented by the value of L *, the value of a *, and the value of b * (hereinafter referred to as “L * value”, “a * value”, and “b * value”, respectively).
- L * represents brightness and is also called “brightness index”.
- a * and b * represent hue and godliness, and are also called “Chromatic Takeness Index”.
- a larger L * value indicates a color closer to white, and a smaller value indicates a color closer to black.
- the cerium-based abrasive has a low L * value when the grain growth of the abrasive has progressed excessively and there are many coarse particles that cause scratches during polishing. I found it.
- L * value is large, grain growth by roasting is not sufficiently advanced, a sufficient polishing rate cannot be obtained, uniform dispersion in the dispersion medium is difficult, and huge coagulation occurs. It has been found that particles remain and scratches easily occur.
- a cerium-based abrasive having an L * value of 65 or more and 90 or less, preferably 70 or more and 80 or less has poor polishing characteristics such as being less likely to be scratched and having excellent smoothness. I found it to be excellent.
- the value of a * in the L * a * b * color system is preferably 0 or more and 15 or less.
- the value of a * is smaller than this range, the content of fluorine is low, and the chemical reaction required for glass polishing cannot be obtained, and fine irregularities on the polished surface cannot be smoothed.
- the value of a * is larger than this range, the polishing effect is high, but the state contains excessive fluorine, which is not preferable. Furthermore, the content of coarse particles is high, and abrasive scratches are likely to occur. This is thought to be the result of excessive grain growth during roasting.
- the value of a * is more preferably 5 or more and 15 or less.
- the value of b * in the L * a * b * color system is preferably 10 or more and 30 or less. .
- the value of b * is more preferably 20 or more and 25 or less.
- the L * value of the L * a * b * color system is 65 to 90, the a * value is 0 to 15 and the value of b * is 10
- a cerium-based abrasive having a value of 30 or less has a sufficiently high polishing rate, has very few abrasive flaws, has almost no residual abrasive, and can stably obtain these excellent polishing characteristics. Therefore, it is particularly suitable for precision polishing applications requiring surface smoothness after polishing. It is even more preferable that the L * value is 70 to 80, the a * value is 5 to 15 and the b * value is 20 to 25.
- the L * value, the a * value, and the b * value can be recognized by a human visual measuring device. Therefore, for example, by comparing the color of a cerium-based abrasive with a standard product, the color of the abrasive can be specified to determine or control its quality, or the quality can be determined by using a measuring device to determine the quality. Or you can manage.
- the color management of the cerium-based abrasive to a desired color can be realized by controlling the fluorine content and further controlling the praseodymium oxide content. For example, by measuring the color of the abrasive powder in the roasting process of the manufacturing process, and adjusting the roasting temperature, roasting time, gas flow in the roasting furnace, and the supply speed to the roasting furnace, The L * value, a * value, and b * value in the * a * b * color system can be easily set within a certain range. By setting the color of the cerium-based abrasive within the above-mentioned certain range, the polishing speed, polishing scratches, Abrasive characteristics such as residual abrasive can be easily controlled.
- the cerium-based abrasive as a rare earth oxide other than cerium oxide (C e 0 2), lanthanum oxide (L a 2 ⁇ 3), neodymium oxide (N d 2 0 3), praseodymium oxide (P r eou ) contains samarium oxide (Sm 2 0 3) or the like.
- Cerium oxide is the main component used as the abrasive.
- the proportion of cerium oxide in total rare earth oxide (hereinafter referred to as TREO), that is, the content is required to be 30 wt% or more. is there.
- cerium oxide in TREO is less than 30% by weight, a sufficient polishing rate cannot be obtained and it is not practical as an abrasive. If this value is 30 wt% or more, it can be used for polishing, especially for glass polishing.
- cerium-based abrasives contained in ores such as bath tonesite, for example, oxidation of Si, Al, Na, K, Ca, ⁇ a, etc. Compounds other than substances or oxides remain. Some of these have the function of an abrasive, but they are low, and they cause abrasive flaws.
- the content of TRE O in the cerium-based abrasive is set to 80 wt% or more and 99 wt% or less. If the TREO is less than 80%, many abrasive flaws are generated. When T RE O exceeds 9.9%, productivity decreases due to higher purity.
- cerium-based abrasives especially those for glass, contain a fluorine component.
- the presence of the fluorine component enables chemical polishing and enhances the smoothness of the polished surface.
- the cerium-based abrasive of the present invention has a TRE ⁇ content of 80 wt% or more and 99 wt% or less in the cerium-based abrasive, and a fluorine content of TREO of 0. It was found that the content is more preferably 5 wt% or more and 10 wt% or less.
- the content of fluorine to TREO is 0.5 wt% or more, not only physical polishing but also chemical reaction with fluorine can provide an excellent polishing effect especially for glass polishing. is there. In other words, it was found that if the fluorine content was less than 0.5 wt%, the polishing rate was too low to be practical.
- the fluorine content exceeds 10 wt% the inside of the roasting furnace tends to corrode, and the cost of exhaust gas treatment increases.
- the cerium-based abrasive preferably has a praseodymium oxide content of 1% by weight or more and 10% by weight or less in TREO.
- cerium-based abrasives especially those for glass, contain a fluorine component. Therefore, if the dissipation of fluorine progresses too much during roasting, the possibility that the fluorine component contained in the abrasive is too low is undesirably high. Therefore, when the roasting process was examined, it was found that there was a difference in the degree of fluorine component dissipation in the roasting process even when the roasting conditions were constant.
- praseodymium in a praseodymium compound can have a value greater than +3, not only +3, whose oxidation number is commonly found in rare earth elements, and especially greater than +3 for praseodymium oxide. Values are stable, and praseodymium forms a composite composition of oxide and fluoride, which is thermally stable, and so on. From such examination results, it was found that praseodymium oxides such as praseodymium oxide prevent the dissipation of fluorine during roasting.
- the content of praseodymium oxide is more preferably lwt% or more and 10 ⁇ % or less, as described above. If the content of praseodymium oxide is less than 1 wt%, the dissipation of fluorine during roasting cannot be prevented. On the other hand, when the content is low, the grain growth does not proceed, and the obtained cerium-based abrasive may not have a sufficient polishing rate. Further, in order to adjust the content of praseodymium oxide to less than 1 wt% in the abrasive production stage, a special treatment for removing praseodymium oxide and other praseodymium compounds is required, which is problematic in terms of cost.
- Praseodymium oxide has a higher hydrophilicity than cerium oxide, and when used as an abrasive slurry, its pH changes, which causes a problem when the polishing rate changes.
- the cerium-based abrasive is preferably a specific surface area of the abrasive particles is less than 1 m 2 Zg than on 30 m 2 Zg.
- the specific surface area is less than lm 2 Zg, the polishing speed is sufficiently high, but there is a problem that polishing accuracy is low and polishing scratches are large. And the specific surface area
- the polishing rate is sufficiently high, polishing scratches are less likely to occur during polishing, a smoother polishing surface is formed after polishing, and the polishing surface remains after polishing.
- Abrasive material with more excellent abrasive characteristics, that is, less abrasive material to be obtained, can be obtained.
- the cerium-based abrasive according to the present invention is used as an abrasive slurry obtained by mixing and dispersing it in water or an organic solvent.
- concentration of the cerium-based abrasive (solid content) in the abrasive slurry is preferably lwt% or more and 40wt% or less, more preferably 5wt% or more and 30wt% or less.
- organic solvent include alcohols, polyhydric alcohols, and tetrahydrofuran.
- cerium-based abrasive is contained in the range of 1 wt% to 40 wt% is less than 1 wt% because the slurry has a low concentration and the polishing efficiency is poor, and a large amount of polishing waste liquid is generated. It is. On the other hand, if it exceeds 40% by weight, the viscosity of the slurry becomes high, and it becomes difficult to quantitatively and uniformly supply the slurry, and the polishing tends to be uneven, which is also undesirable.
- the slurry abrasive may contain additives such as a dispersant, a solidification inhibitor, and a pH adjuster.
- Additives include sodium hexaphosphate, sodium pyrophosphate, crystalline cellulose, dibasic calcium phosphate, j3-naphthylene sodium sulfonate formalin condensate, synthetic silicon dioxide, polya Polyacrylates such as sodium acrylate,
- the additives may be mixed with a cerium-based abrasive to form a slurry containing the additive and then slurried, or the additive may be dissolved or dispersed in water or an organic solvent in advance and then the cerium-based abrasive may be used.
- the abrasive may be dispersed or added when the cerium-based abrasive and water or an organic solvent are slurryed.
- the additive weight is usually 0.1 wt% or more and 4 wt% or less based on the weight of the cerium-based abrasive (solid content).
- Cerium-based abrasives are produced by pulverizing raw materials for cerium-based abrasives, subjecting them to fluorination if necessary, and performing roasting, crushing, and classification. In the fluorine treatment, a known treatment method using hydrofluoric acid, ammonium fluoride, or the like can be arbitrarily used.
- This roasting step is a step of promoting grain growth by promoting sintering of the particles, but also a step of dissipating fluorine. Therefore, in the roasting step, it is preferable to control both the grain growth and the fluorine content in order to produce a cerium-based abrasive having more excellent polishing characteristics. Therefore, a roasting method for controlling the dissipation of fluorine was studied.
- fluorine is dissipated by roasting.However, by controlling the fluorine content after roasting based on the fluorine content before roasting, stable sintering of abrasives is required, and it is necessary for chemical polishing. It was found that a large amount of fluorine could be maintained. In other words, the inventors have found that by measuring the fluorine content before and after roasting and controlling this reduction amount, it is possible to produce a serium-based abrasive having excellent polishing characteristics and hence excellent polishing evaluation. Was.
- the present invention relates to a method for producing a cerium-based abrasive comprising a step of roasting a raw material for a cerium-based abrasive, wherein the content of fluorine relative to TREO before roasting is F 1 (hereinafter simply referred to as “F 1”).
- F 1 the content of fluorine relative to TREO before roasting
- F 2 the ratio between them, F 2 ZF 1
- a method for producing a serium-based abrasive characterized by the following.
- the roasting temperature, the roasting time, the gas flow state in the roasting furnace, the supply speed to the roasting furnace, and the like are adjusted so that F 2 F 1 becomes 0.7 or more and 1 or less. Perform roasting. Then, the control of the fluorine content is easily performed, and the polishing characteristics and the polishing evaluation are appropriately adjusted. As a result, a cerium-based abrasive having excellent polishing characteristics, such as being less likely to be damaged during polishing and having excellent smoothness on the surface to be polished after polishing, is produced.
- the production method of the present invention does not control the roasting temperature, the roasting time, the amount of roasting per hour, and other various operating conditions in the roasting step individually, but only controls the fluorine content.
- the cerium-based abrasive is produced by the method for producing the cerium-based abrasive.
- the color of the cerium-based abrasive is influenced by the fluorine content, the degree of oxidation, the specific surface area representing the particle size, and the like. Therefore, a cerium-based abrasive having excellent polishing characteristics can be manufactured by controlling these to make the cerium-based abrasive raw material a desired color.
- the color of the ceramic abrasive can be adjusted by adjusting the roasting temperature in the roasting process, the roasting time, the gas distribution in the roasting furnace, and the supply speed to the roasting furnace.
- control can be performed, it is not always possible to accurately produce a ceramic-based abrasive in a desired color.
- the method for producing a cerium-based abrasive according to the present invention is suitable for controlling the color of the cerium-based abrasive.
- the present manufacturing method uses extremely simple and easy means for the roasting step, and it is considered that the color of the cerium-based abrasive can be adjusted relatively easily. .
- the roasting step of the method for producing a cerium-based abrasive according to the present invention is such that F 2 ZF 1 is not less than 0.7 and not more than 1, when represented by the L * a * b * color system
- a cerium-based abrasive having a L * value of 65 or more and 90 or less is produced.
- the thus-prepared serium-based abrasive has a sufficiently high polishing rate, has few abrasive flaws, can provide a smooth abrasive surface with high polishing accuracy, and has a low residual abrasive. It has the advantage of less.
- the content of praseodymium oxide in TREO is lwt% or more and 10wt% or less, and fluorine for TREO before roasting is used. It is preferable that the content F1 of the metal be 0.5 wt% or more and 14.3 wt% or less.
- the fluorine content of the cerium-based abrasive relative to TREO can be regarded as F 2 (the content of fluorine relative to TREO after roasting). did Therefore, F2 is preferably, for example, 0.5 wt% or more and 101% or less.
- F1 is at least 0.5 wt% or more and 14.3 wt% or less. become. That is, F 1 is preferably 0.5% or more and 14.3% by weight or less. Further, in order to ensure that the content of F 2 is not less than 0.5 wt% and not more than 10 wt%, FIU is preferably not less than 7% and not more than 10 wt%. The reason why such a range is preferable is as described above. Also, in the production of cerium-based abrasives, when the content of fluorine is high, it is necessary to treat the exhaust gas during roasting, which causes the problem of corrosion of the furnace material. Considering this point, F 1 is preferably 10 wt% or less.
- the L * value is 6 Abrasive materials having an a * value of 0 or more and 15 or less and a b * value of 10 or more and 30 or less can be easily produced in addition to the abrasive material having a value of 5 or more and 90 or less.
- the fluorine content of TREO in the raw material for cerium-based abrasives is less than 0.5 wt%, or when the fluorine content of TREO is desired to be further increased even if it is 0.5 wt% or more.
- the content of TRE O, the content of cerium oxide and praseodymium oxide in TRE 0, and the content of fluorine of the produced cerium-based abrasive are as described above.
- the content of rare earth oxides such as cerium oxide and praseodymium oxide in TREO does not change between the raw material for the cerium-based abrasive and the cerium-based abrasive. Therefore, the content of cerium oxide and praseodymium oxide in TREO of the raw material for cerium-based abrasives is a value within a range that is preferable for cerium-based abrasives. Preferably, one is used.
- the TREO content of the raw material may be less than 80 wt% depending on the content of water, carbonate, etc. in the raw material. Is not a problem because it is over 80.1%.
- the roasting temperature is preferably at least 600 ° C. and at most 1200 ° C.
- the roasting time is preferably at least 1 hour and at most 60 hours.
- the granular cerium-containing rare earth element which is the raw material, is grown by sintering to such a size that an appropriate polishing rate can be obtained.
- the roasting means for example, an electric furnace, a rotary kiln, or the like can be used.
- the atmosphere is preferably an oxidizing atmosphere.
- the atmosphere can be used as the atmospheric gas.
- praseodymium compounds such as praseodymium oxide suppress abnormal grain growth and increase the amount of raw material.
- roasting can be performed at a higher temperature. Since roasting at a high temperature facilitates sintering, it is particularly effective for obtaining an abrasive having a large average particle size or obtaining an abrasive having a large average particle size and a sufficiently large polishing rate.
- the content of praseodymium oxide such as praseodymium oxide in the raw material is not particularly limited, but the content is such that the content of praseodymium oxide in TREO in the abrasive finally becomes 1 wt% or more and 10 ⁇ % or less. Is appropriate.
- the color of the cerium-based abrasive is also affected by the roasting temperature, but the above temperature range is also preferable in that respect.
- roasting prior cerium oxide C e 0 2
- the content of TREO after roasting and the yield of fluorine by roasting (Gu F 2 ZF 1>) were measured. The measurement results are shown in Table 1.
- the fluorine content was measured by alkali melting, Hot water extraction ⁇ Measured by the fluoride ion electrode method This is a measurement method as follows: First, an abrasive or its raw material is used as a sample, melted with an alkali flux, allowed to cool, and then heated. After extracting an appropriate amount, adding a buffer solution, adjusting the pH to about 5.3, and adjusting the volume to obtain a sample solution. The procedure for obtaining the standard solution does not use the above sample, and after the fractionation, the fluorine content is added to the desired value by adding the fluorine standard solution. The procedure was the same as that for obtaining the sample solution except that the standard solution was prepared as follows: several types of standard solutions were obtained by changing the fluorine concentration.
- the fluorine content was measured using an attached ion meter.Specifically, the fluorine concentration of the sample solution was determined based on the calibration curve obtained by measuring the standard solution, and the fluorine concentration of the sample was measured. It was converted to a fluorine content. Further, the obtained fluorine content was divided by the TREO content of the sample described below to obtain a fluorine content with respect to TREO.
- the fluorine content before roasting was measured by drying the sample before roasting at 120 ° C for 2 hours, and using this sample to measure the fluorine content by the same operation as for the abrasive after roasting. did.
- the TREO content was measured as follows. First, after decomposing the sample using perchloric acid and hydrogen peroxide, oxalic acid was added to the solution, and the pH of the solution was maintained at about 1.5 to obtain a precipitate. This precipitate was separated by filtration, and the obtained precipitate was roasted at 1000. The weight of the roasted product was measured, and the TR content was determined by the weight of the roasted product relative to the weight of the sample. The contents of cerium oxide and praseodymium oxide were measured using an alkaline flux and IC ⁇ emission spectroscopy. First, the sample was acid-dissolved or melted, then an appropriate amount was taken and the volume was adjusted to obtain a sample. In addition, several standard samples with different concentrations of cerium etc. were prepared.
- the content of cerium and the like in the sample was quantified based on a calibration curve indicating the concentration of cerium and the like obtained by the measurement of the standard sample, and converted into the content of cerium oxide and praseodymium oxide. From the cerium oxide and praseodymium oxide contents of this sample and the TREO content of the sample, the contents of cerium oxide and praseodymium oxide in TREO were determined.
- an Oscar type polishing tester (HSP-21 type, manufactured by Taito Seiki Co., Ltd.) was used.
- As the polishing test machine a cerium-based abrasive slurry having an abrasive concentration of 101% prepared by dispersing a powdered cerium-based abrasive in water was used.
- the polishing target was a glass material for flat panels of 65 ⁇ , and a polishing pad made of polyurethane was used.
- the polishing conditions were as follows: the rotation speed of the glass material was 1700 rpm, the pad pressing force was 98 kPa (lkg Zcm 2 ), and the polishing time was 10 minutes.
- the polishing value in Table 2 is a value based on the polishing amount calculated by measuring the weight of the glass material before and after polishing.
- Example 1 was represented by a relative value of 100.
- the evaluation of the abrasive flaw was performed as follows. First, the surface of the polished flat panel glass is irradiated with a halogen lamp with a light source of 300,000 lux, and the number and size of the scratches are determined by the reflection method. Then, according to the number and size of the scratches, the numerical value is calculated by the deduction method from 100 points.
- “ ⁇ ” is 95 points or more and 100 points or less and is very suitable for precision polishing
- ⁇ ” is 90 points or more and less than 95 points and is suitable for precision polishing. That “ ⁇ ” is 80 or more and less than 90 points and can be used for general polishing, and that “X” is less than 80 points and is unsuitable as an abrasive. Shown respectively.
- the evaluation of the residual abrasive was performed as follows. First, the polished glass is washed in pure water using an ultrasonic cleaner, and dried without dust. Then, observe the glass surface with an optical microscope to see if there is any residual abrasive adhered to the glass surface.
- Table 2 “ ⁇ ” indicates that there is almost no residual abrasive and is very suitable as an abrasive, “ ⁇ ” indicates that there is a little residual abrasive but is suitable as an abrasive, and “X” indicates that it is suitable as an abrasive. Remaining The fact that many non-abrasives are unsuitable as abrasives is shown below. Table 2: Color, specific surface area and polishing characteristics of cerium-based abrasives>
- ⁇ 95 points or more and 100 points or less are very suitable for precision polishing.
- ⁇ J 90 points or more and less than 95 points are suitable for precision polishing.
- ⁇ 80 points or more and less than 90 points can be used for general polishing.
- ⁇ X J If less than 80 points, it is not suitable as an abrasive.
- ⁇ J Suitable as an abrasive.
- Xj unsuitable as an abrasive.
- the L * value in the L * a * b * color system was 65 or more and 90 or less, and the a * value was The b * value is in the range of 10 to 30 and the specific surface area is 1 to 30 m 2 / g, and the polishing value, polishing scratch, and residual abrasive All had good results.
- Comparative Example 1 contained a large amount of fluorine, had a small specific surface area, and had many abrasive flaws.
- the b * value was 18.87, but the L * value was less than 65 and the a * value was greater than 15.
- Comparative Example 3 had many abrasive scratches.
- the b * value was 19.28, but the L * value was less than 60.19 and 65, and the a * value was greater than 19.41 and 15.
- Comparative Example 4 had a large amount of residual abrasive.
- * value was larger than 94.53 and 90. This is probably because praseodymium oxide was not contained. Also, the sign of the & * value was opposite to -1.95, the color changed to green, and the b * value was much smaller than 2.40 and 10.
- a cerium-based abrasive having a sufficiently high polishing rate, less occurrence of abrasive flaws, and excellent polishing characteristics with little residual abrasive. Further, a method for producing such a cerium-based abrasive can be provided. The provided abrasive can be used for high-precision surface polishing required in the production of glass substrates for optical disks and magnetic disks.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geology (AREA)
- Inorganic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Composite Materials (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Compounds Of Alkaline-Earth Elements, Aluminum Or Rare-Earth Metals (AREA)
- Surface Treatment Of Glass (AREA)
- Polishing Bodies And Polishing Tools (AREA)
Description
Claims
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020037010014A KR100571033B1 (ko) | 2001-02-07 | 2002-01-31 | 세륨계 연마재 및 그 제조방법 |
| US10/467,481 US6843816B2 (en) | 2001-02-07 | 2002-01-31 | Cerium-based abrasive material and method for preparation thereof |
| EP02710420A EP1371707A4 (en) | 2001-02-07 | 2002-01-31 | CER-BASED ABRASIVE AND METHOD FOR THE PRODUCTION THEREOF |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001030774A JP4064636B2 (ja) | 2001-02-07 | 2001-02-07 | セリウム系研摩材粒子及びその製造方法 |
| JP2001-30774 | 2001-02-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2002062917A1 true WO2002062917A1 (en) | 2002-08-15 |
Family
ID=18894943
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2002/000762 Ceased WO2002062917A1 (en) | 2001-02-07 | 2002-01-31 | Cerium based abrasive material and method for preparation thereof |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US6843816B2 (ja) |
| EP (1) | EP1371707A4 (ja) |
| JP (1) | JP4064636B2 (ja) |
| KR (1) | KR100571033B1 (ja) |
| CN (1) | CN1240802C (ja) |
| MY (1) | MY129183A (ja) |
| TW (1) | TW593648B (ja) |
| WO (1) | WO2002062917A1 (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7025796B2 (en) * | 2002-11-22 | 2006-04-11 | Seimi Chemical Co., Ltd. | Method for evaluating the quality of abrasive grains, polishing method and abrasive for polishing glass |
| CN1810911B (zh) * | 2004-12-28 | 2010-07-21 | 三井金属鉱业株式会社 | 铈系磨料用原料以及铈系磨料用原料的制造方法、铈系磨料以及铈系磨料的制造方法 |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI332981B (en) * | 2003-07-17 | 2010-11-11 | Showa Denko Kk | Method for producing cerium oxide abrasives and cerium oxide abrasives obtained by the method |
| JP4041110B2 (ja) * | 2004-09-29 | 2008-01-30 | Hoya株式会社 | 磁気ディスク用ガラス基板の製造方法及び磁気ディスクの製造方法 |
| CA2611735A1 (en) * | 2005-04-28 | 2006-11-02 | The Regents Of The University Of Colorado | Therapeutic bifunctional compounds |
| WO2006118821A2 (en) * | 2005-05-02 | 2006-11-09 | The Regents Of The University Of Colorado | Systems and methods for treating human inflammatory and proliferative diseases, with a combination of compounds, or a bifunctional compound,that provides fatty acid metabolism and glycolysis inhibition |
| KR101201170B1 (ko) * | 2006-03-21 | 2012-11-13 | 삼성에스디아이 주식회사 | 리튬 이차 전지용 양극과 이를 포함하는 리튬 이차전지 및리튬 이차전지의 제조방법 |
| CN107556922B (zh) * | 2017-09-27 | 2020-05-19 | 甘肃稀土新材料股份有限公司 | 一种含钐稀土抛光粉及其制备工艺 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0781932A (ja) * | 1993-09-14 | 1995-03-28 | Showa Denko Kk | 酸化第二セリウムの製造方法 |
| JPH0967121A (ja) * | 1995-08-30 | 1997-03-11 | Shin Etsu Chem Co Ltd | 耐変色性酸化セリウム |
| JPH10106986A (ja) * | 1996-09-30 | 1998-04-24 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
| JPH10106989A (ja) * | 1996-09-30 | 1998-04-24 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
| JPH10106990A (ja) * | 1996-09-30 | 1998-04-24 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
| JPH10226518A (ja) * | 1997-02-13 | 1998-08-25 | Toray Ind Inc | 酸化セリウム粉末、その製造方法ならびに塗料および化粧料 |
| JP2001089748A (ja) * | 1999-07-16 | 2001-04-03 | Seimi Chem Co Ltd | 研磨剤 |
| JP2002097458A (ja) * | 2000-09-20 | 2002-04-02 | Mitsui Mining & Smelting Co Ltd | セリウム系研摩材、その品質検査方法および製造方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AT339253B (de) * | 1975-07-25 | 1977-10-10 | Treibacher Chemische Werke Ag | Verfahren zur herstellung eines reinen ceroxids |
| JP2832270B2 (ja) * | 1993-05-18 | 1998-12-09 | 三井金属鉱業株式会社 | ガラス研磨用研磨材 |
| EP0820092A4 (en) * | 1996-02-07 | 2000-03-29 | Hitachi Chemical Co Ltd | Cerium oxide abrasive, semiconductor chip, semiconductor device, process for the production of them, and method for the polishing of substrates |
| JPH1112561A (ja) * | 1997-04-28 | 1999-01-19 | Seimi Chem Co Ltd | 半導体用研磨剤および半導体用研磨剤の製造方法 |
| JP3480323B2 (ja) * | 1998-06-30 | 2003-12-15 | 日立化成工業株式会社 | 酸化セリウム研磨剤、基板の研磨法及び半導体装置 |
| DE19923930A1 (de) * | 1999-05-26 | 2000-11-30 | Voith Sulzer Papiertech Patent | Vorrichtung zum Aufwickeln einer Materialbahn |
-
2001
- 2001-02-07 JP JP2001030774A patent/JP4064636B2/ja not_active Expired - Lifetime
-
2002
- 2002-01-23 MY MYPI20020264A patent/MY129183A/en unknown
- 2002-01-23 TW TW091101071A patent/TW593648B/zh not_active IP Right Cessation
- 2002-01-31 KR KR1020037010014A patent/KR100571033B1/ko not_active Expired - Fee Related
- 2002-01-31 US US10/467,481 patent/US6843816B2/en not_active Expired - Lifetime
- 2002-01-31 EP EP02710420A patent/EP1371707A4/en not_active Withdrawn
- 2002-01-31 WO PCT/JP2002/000762 patent/WO2002062917A1/ja not_active Ceased
- 2002-01-31 CN CNB028045963A patent/CN1240802C/zh not_active Expired - Lifetime
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0781932A (ja) * | 1993-09-14 | 1995-03-28 | Showa Denko Kk | 酸化第二セリウムの製造方法 |
| JPH0967121A (ja) * | 1995-08-30 | 1997-03-11 | Shin Etsu Chem Co Ltd | 耐変色性酸化セリウム |
| JPH10106986A (ja) * | 1996-09-30 | 1998-04-24 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
| JPH10106989A (ja) * | 1996-09-30 | 1998-04-24 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
| JPH10106990A (ja) * | 1996-09-30 | 1998-04-24 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
| JPH10226518A (ja) * | 1997-02-13 | 1998-08-25 | Toray Ind Inc | 酸化セリウム粉末、その製造方法ならびに塗料および化粧料 |
| JP2001089748A (ja) * | 1999-07-16 | 2001-04-03 | Seimi Chem Co Ltd | 研磨剤 |
| JP2002097458A (ja) * | 2000-09-20 | 2002-04-02 | Mitsui Mining & Smelting Co Ltd | セリウム系研摩材、その品質検査方法および製造方法 |
Non-Patent Citations (1)
| Title |
|---|
| See also references of EP1371707A4 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7025796B2 (en) * | 2002-11-22 | 2006-04-11 | Seimi Chemical Co., Ltd. | Method for evaluating the quality of abrasive grains, polishing method and abrasive for polishing glass |
| CN1810911B (zh) * | 2004-12-28 | 2010-07-21 | 三井金属鉱业株式会社 | 铈系磨料用原料以及铈系磨料用原料的制造方法、铈系磨料以及铈系磨料的制造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1371707A4 (en) | 2009-11-11 |
| JP4064636B2 (ja) | 2008-03-19 |
| US6843816B2 (en) | 2005-01-18 |
| TW593648B (en) | 2004-06-21 |
| MY129183A (en) | 2007-03-30 |
| CN1491269A (zh) | 2004-04-21 |
| JP2002226837A (ja) | 2002-08-14 |
| EP1371707A1 (en) | 2003-12-17 |
| CN1240802C (zh) | 2006-02-08 |
| KR100571033B1 (ko) | 2006-04-13 |
| KR20030074754A (ko) | 2003-09-19 |
| US20040093803A1 (en) | 2004-05-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6893477B2 (en) | Cerium-based abrasive material slurry and method for producing cerium-based abrasive material slurry | |
| KR100495774B1 (ko) | 세륨계 연마재 | |
| US6905527B2 (en) | Method of manufacturing cerium-based polishing agent | |
| WO2002062917A1 (en) | Cerium based abrasive material and method for preparation thereof | |
| KR100637746B1 (ko) | 세륨 카보네이트의 소성 온도 설정 방법, 산화 세륨연마재의 제조방법 및 그 제조방법에 의해 제조된 산화세륨 연마재 | |
| JP4273920B2 (ja) | 酸化セリウム粒子及び多段階焼成による製造方法 | |
| JP3365993B2 (ja) | セリウム系研摩材およびそのための原料、ならびにそれらの製造方法 | |
| JP4434869B2 (ja) | 酸化セリウム研磨材の製造方法及び得られる酸化セリウム研磨材 | |
| TWI695060B (zh) | 鈰系研磨材用原料之製造方法,及鈰系研磨材之製造方法 | |
| TWI410479B (zh) | 鈰系研磨材 | |
| JP5619515B2 (ja) | 酸化セリウム系研磨剤及びガラス製ハードディスク基板の製造方法 | |
| JP3685481B2 (ja) | 粒度分布に優れたセリウム系研摩材粒子粉末、該粒子粉末を含有する研摩材スラリー及び該粒子粉末の製造方法 | |
| JP3392398B2 (ja) | セリウム系研摩材、その品質検査方法および製造方法 | |
| JP2011224751A (ja) | 酸化セリウム研磨剤及びこの研磨剤を用いた基板の研磨方法 | |
| TWI847023B (zh) | 鈰系研磨材漿料原液及其製造方法,以及研磨液 | |
| JP3392399B2 (ja) | セリウム系研摩材、その品質検査方法および製造方法 | |
| JP2004189857A (ja) | セリウム系研摩材及びセリウム系研摩材の製造方法並びにセリウム系研摩材の品質評価方法 | |
| JP2003027044A (ja) | セリウム系研摩材 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WWE | Wipo information: entry into national phase |
Ref document number: 1-2003-500702 Country of ref document: PH |
|
| AK | Designated states |
Kind code of ref document: A1 Designated state(s): AU BR CN EE IN KR PH US VN |
|
| AL | Designated countries for regional patents |
Kind code of ref document: A1 Designated state(s): AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE TR |
|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application | ||
| DFPE | Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101) |
Free format text: EXCEPT/SAUF AU, BR, EE, IN, VN, EA (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)) |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 1020037010014 Country of ref document: KR |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 028045963 Country of ref document: CN |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 10467481 Country of ref document: US |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 2002710420 Country of ref document: EP |
|
| WWP | Wipo information: published in national office |
Ref document number: 1020037010014 Country of ref document: KR |
|
| WWP | Wipo information: published in national office |
Ref document number: 2002710420 Country of ref document: EP |
|
| WWG | Wipo information: grant in national office |
Ref document number: 1020037010014 Country of ref document: KR |
|
| WWG | Wipo information: grant in national office |
Ref document number: 12003500702 Country of ref document: PH |