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WO1992000520A3 - Systeme d'imagerie a courants de foucault - Google Patents

Systeme d'imagerie a courants de foucault Download PDF

Info

Publication number
WO1992000520A3
WO1992000520A3 PCT/US1991/002173 US9102173W WO9200520A3 WO 1992000520 A3 WO1992000520 A3 WO 1992000520A3 US 9102173 W US9102173 W US 9102173W WO 9200520 A3 WO9200520 A3 WO 9200520A3
Authority
WO
WIPO (PCT)
Prior art keywords
signal
workpiece
eddy current
regions
spatial derivative
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US1991/002173
Other languages
English (en)
Other versions
WO1992000520A2 (fr
Inventor
John P Lareau
David Leonard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Amdata Inc
Original Assignee
ABB Amdata Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ABB Amdata Inc filed Critical ABB Amdata Inc
Priority to AU84354/91A priority Critical patent/AU650049B2/en
Publication of WO1992000520A2 publication Critical patent/WO1992000520A2/fr
Publication of WO1992000520A3 publication Critical patent/WO1992000520A3/fr
Priority to KR92703431A priority patent/KR960016172B1/ko
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/902—Arrangements for scanning by moving the sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Abstract

Un système d'imagerie à courants de Foucault (15) comprend une bobine de détection de courants de Foucault (17) placée à proximité d'une pièce afin d'effectuer le balayage de celle-ci et de produire un signal (21, 22) indiquant l'intégrité de la pièce pour certaines régions dans un réseau de données x, y. Un tel signal (21, 22) peut être sous forme d'un signal d'impédance complexe représentant l'amplitude et/ou la phase du signal. Deux techniques de traitement de données sont décrites, lesquelles servent à accentuer la visualisation d'un défaut de la pièce. La première technique comprend une étape (30) qui consiste à calculer une dérivée spatial du signal indicatif de l'amplitude et/ou de la phase émanant de la bobine (17) et à produire une image de la dérivée spatiale afin d'obtenir une image balayée de format C de la dérivée spatiale. La seconde technique comprend les étapes (35, 36) consistant à déterminer les régions de montée maximale et/ou de descente maximale du signal, relatives à certaines régions de l'image balayée et à calculer une trajectoire de plan d'impédance à partir du réseau de données de points de parcours afin de visualiser un signal optimal reconstruit indépendant de la configuration du parcours de balayage.
PCT/US1991/002173 1990-06-29 1991-04-01 Systeme d'imagerie a courants de foucault Ceased WO1992000520A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
AU84354/91A AU650049B2 (en) 1990-06-29 1991-04-01 Eddy current imaging system
KR92703431A KR960016172B1 (en) 1990-06-29 1992-12-29 Eddy current imaging system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US54548790A 1990-06-29 1990-06-29
US545,487 1990-06-29

Publications (2)

Publication Number Publication Date
WO1992000520A2 WO1992000520A2 (fr) 1992-01-09
WO1992000520A3 true WO1992000520A3 (fr) 1992-03-19

Family

ID=24176445

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1991/002173 Ceased WO1992000520A2 (fr) 1990-06-29 1991-04-01 Systeme d'imagerie a courants de foucault

Country Status (7)

Country Link
US (1) US5311128A (fr)
EP (1) EP0536333A1 (fr)
JP (1) JPH06500170A (fr)
KR (1) KR960016172B1 (fr)
AU (1) AU650049B2 (fr)
CA (1) CA2040766A1 (fr)
WO (1) WO1992000520A2 (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2696550B1 (fr) * 1992-10-07 1994-10-28 Commissariat Energie Atomique Procédé de traitement de signaux recueillis par un capteur ponctuel absolu à courants de Foucault.
US6657429B1 (en) 1995-08-25 2003-12-02 Jentek Sensors, Inc. Material condition assessment with spatially periodic field sensors
US6285183B1 (en) 1996-09-30 2001-09-04 Mcdonnell Douglas Corporation Method and system for measuring the volume loss of a metal substrate
US6037768A (en) * 1997-04-02 2000-03-14 Iowa State University Research Foundation, Inc. Pulsed eddy current inspections and the calibration and display of inspection results
US7161350B2 (en) * 1999-09-07 2007-01-09 Jentek Sensors, Inc. Method for material property monitoring with perforated, surface mounted sensors
CA2385868A1 (fr) * 1999-09-20 2001-03-29 Jentek Sensors, Inc. Reseaux de capteurs a courants de foucault
US7824244B2 (en) * 2007-05-30 2010-11-02 Corning Incorporated Methods and apparatus for polishing a semiconductor wafer
US6933718B2 (en) * 2001-06-12 2005-08-23 The Boeing Company Quantification method and system for corrosion and damage assessment
CA2467054C (fr) * 2001-11-19 2012-01-10 Chk Wireless Technologies Australia Pty Ltd Procede et appareil pour determiner un courant dans un conducteur
US7518359B2 (en) * 2005-03-09 2009-04-14 General Electric Company Inspection of non-planar parts using multifrequency eddy current with phase analysis
US20080278151A1 (en) * 2007-05-07 2008-11-13 General Electric Company System and methods for inspecting internal cracks
CA2711129A1 (fr) * 2007-12-28 2009-07-09 General Electric Company Procede et appareil pour l'essai d'un composant a l'aide d'une sonde a courant de foucault omnidirectionnelle
US20110004452A1 (en) * 2007-12-31 2011-01-06 Sanghamithra Korukonda Method for compensation of responses from eddy current probes
JP2009216559A (ja) * 2008-03-11 2009-09-24 Hitachi-Ge Nuclear Energy Ltd 渦電流検査装置
DE102012112121B4 (de) * 2012-12-11 2023-02-09 Baker Hughes Digital Solutions Gmbh Verfahren und Vorrichtung zur zerstörungsfreien Prüfung eines rotationssymmetrischen Werkstücks, welches Abschnitte verschiedener Durchmesser aufweist
US9747683B2 (en) 2015-12-21 2017-08-29 General Electric Company Methods and systems for detecting component wear
RU172091U1 (ru) * 2016-06-27 2017-06-28 Дмитрий Сергеевич Крюков Вихретоковый измерительный преобразователь
CN109884182B (zh) * 2019-04-04 2022-08-09 中国兵器科学研究院宁波分院 一种涡流c扫描成像检测方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4470122A (en) * 1981-09-30 1984-09-04 The Boeing Company Integrated electro-optical position sensing, workpiece probing and display method and apparatus
US4555664A (en) * 1981-09-14 1985-11-26 Commissariat A L'energie Atomique Process and device for inspecting a surface in simulated manner which differs from the real surface scanning by an eddy current transducer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4836026A (en) * 1984-06-01 1989-06-06 Science Applications International Corporation Ultrasonic imaging system
US4755753A (en) * 1986-07-23 1988-07-05 General Electric Company Eddy current surface mapping system for flaw detection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4555664A (en) * 1981-09-14 1985-11-26 Commissariat A L'energie Atomique Process and device for inspecting a surface in simulated manner which differs from the real surface scanning by an eddy current transducer
US4470122A (en) * 1981-09-30 1984-09-04 The Boeing Company Integrated electro-optical position sensing, workpiece probing and display method and apparatus

Also Published As

Publication number Publication date
KR960016172B1 (en) 1996-12-04
US5311128A (en) 1994-05-10
WO1992000520A2 (fr) 1992-01-09
CA2040766A1 (fr) 1991-12-30
AU650049B2 (en) 1994-06-09
KR930701743A (ko) 1993-06-12
JPH06500170A (ja) 1994-01-06
AU8435491A (en) 1992-01-23
EP0536333A1 (fr) 1993-04-14

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