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WO1991006845A3 - Machine de controle de coplanarite - Google Patents

Machine de controle de coplanarite

Info

Publication number
WO1991006845A3
WO1991006845A3 PCT/US1990/006111 US9006111W WO9106845A3 WO 1991006845 A3 WO1991006845 A3 WO 1991006845A3 US 9006111 W US9006111 W US 9006111W WO 9106845 A3 WO9106845 A3 WO 9106845A3
Authority
WO
WIPO (PCT)
Prior art keywords
axis
gage
points
signals
point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US1990/006111
Other languages
English (en)
Other versions
WO1991006845A2 (fr
Inventor
Frank Linker
Edward T Claffey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Tech Manufacturing Corp
Original Assignee
American Tech Manufacturing Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US07/427,797 external-priority patent/US4996439A/en
Application filed by American Tech Manufacturing Corp filed Critical American Tech Manufacturing Corp
Publication of WO1991006845A2 publication Critical patent/WO1991006845A2/fr
Publication of WO1991006845A3 publication Critical patent/WO1991006845A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0813—Controlling of single components prior to mounting, e.g. orientation, component geometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • G01N2021/95661—Inspecting patterns on the surface of objects for PCB's for leads, e.g. position, curvature

Landscapes

  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Operations Research (AREA)
  • Pathology (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Manufacturing Of Electrical Connectors (AREA)

Abstract

Dispositif de signaux destinés à opérer sur un chemin comprenant un réflecteur mobile aligné pour se déplacer le long d'un axe, ainsi qu'une source de lumière et un détecteur de lumière positionnés pour produire un point de déclenchement de signal, lorsque la lumière provenant de la source est reflétée par le réflecteur au détecteur, à un endroit prédéterminé sur ledit axe. Appareil permettant de déterminer la coplanarité d'une pluralité de points, comprenant une unité de déplacement linéaire destinée à déplacer un objet le long d'un axe linéaire. L'objet a un plan perpendiculaire à l'axe. Un gabarit définit un plan connu, lequel est également perpendiculaire à l'axe et sur lequel se trouve une pluralité de points correspondant aux points situés sur l'objet. Le gabarit est également adapté pour se déplacer le long de l'axe à l'aide de ladite unité de déplacement linéaire. Des commutateurs de signaux numériques comportant des capteurs individuels alignés sur l'axe pour venir en contact avec l'objet et le gabarit sont disposés pour envoyer un ensemble de signaux, afin d'indiquer la position de l'objet le long de l'axe au niveau de chacun des points, et pour produire un ensemble de signaux de référence lorsqu'un contact a eu lieu avec les points correspondants situés sur le gabarit. On a également prévu un moyen de comparaison destiné à comparer les signaux avec les signaux de référence pour chaque point et le point correspondant se trouvant sur le plan du gabarit, afin de déterminer l'écart de chaque point par rapport à la coplanarité.
PCT/US1990/006111 1989-10-27 1990-10-24 Machine de controle de coplanarite Ceased WO1991006845A2 (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US07/427,797 US4996439A (en) 1989-10-27 1989-10-27 Coplanarity inspection machine
US427,797 1989-10-27
US07/526,162 US5045710A (en) 1989-10-27 1990-05-21 Coplanarity inspection machine
US526,162 1990-05-21

Publications (2)

Publication Number Publication Date
WO1991006845A2 WO1991006845A2 (fr) 1991-05-16
WO1991006845A3 true WO1991006845A3 (fr) 1991-06-13

Family

ID=27027519

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1990/006111 Ceased WO1991006845A2 (fr) 1989-10-27 1990-10-24 Machine de controle de coplanarite

Country Status (3)

Country Link
US (1) US5045710A (fr)
JP (1) JPH05503991A (fr)
WO (1) WO1991006845A2 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5519315A (en) * 1994-10-31 1996-05-21 Hughes Aircraft Company Printed wiring assembly coplanarity inspection fixture
AU3663197A (en) * 1996-07-12 1998-02-20 Linker, Frank V. Jr. Split optics arrangement for vision inspection/sorter module
US6037791A (en) * 1997-08-01 2000-03-14 Intel Corporation Vision aided docking mechanism for semiconductor testers
US8323227B2 (en) 2004-07-02 2012-12-04 C. R. Bard, Inc. Tip configurations for a multi-lumen catheter
CN101191718A (zh) * 2006-11-24 2008-06-04 深圳富泰宏精密工业有限公司 平面度检验平台
TWI410619B (zh) * 2006-12-11 2013-10-01 Fih Hong Kong Ltd 平面度檢驗平台
CN102384732B (zh) * 2011-10-31 2013-10-23 西安理工大学 交点内置正交回转轴轴线共面度检测装置及精度检测方法
TWI761202B (zh) * 2020-09-09 2022-04-11 海華科技股份有限公司 晶片共面度檢測設備
TWI750800B (zh) * 2020-09-09 2021-12-21 海華科技股份有限公司 晶片共面度檢測設備

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3278023A (en) * 1964-02-19 1966-10-11 Paul J Schneider Bottle width selector
US4739175A (en) * 1986-02-24 1988-04-19 Mitsubishi Denki Kabushiki Kaisha Apparatus for inspecting configuration of terminal legs of an electronic device
US4774768A (en) * 1987-04-14 1988-10-04 Allteq Industries Coplanarity tester for surface mounted device
US4814621A (en) * 1988-01-12 1989-03-21 Universal Instruments Corporation Lead detection by variable pressure lead-contacting optical interposers

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3278023A (en) * 1964-02-19 1966-10-11 Paul J Schneider Bottle width selector
US4739175A (en) * 1986-02-24 1988-04-19 Mitsubishi Denki Kabushiki Kaisha Apparatus for inspecting configuration of terminal legs of an electronic device
US4774768A (en) * 1987-04-14 1988-10-04 Allteq Industries Coplanarity tester for surface mounted device
US4814621A (en) * 1988-01-12 1989-03-21 Universal Instruments Corporation Lead detection by variable pressure lead-contacting optical interposers

Also Published As

Publication number Publication date
WO1991006845A2 (fr) 1991-05-16
US5045710A (en) 1991-09-03
JPH05503991A (ja) 1993-06-24

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