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USRE26782E - Materials testing control circuitry - Google Patents

Materials testing control circuitry Download PDF

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Publication number
USRE26782E
USRE26782E US26782DE USRE26782E US RE26782 E USRE26782 E US RE26782E US 26782D E US26782D E US 26782DE US RE26782 E USRE26782 E US RE26782E
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command
circuit
control
load
specimen
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • G01N3/06Special adaptations of indicating or recording means
    • G01N3/066Special adaptations of indicating or recording means with electrical indicating or recording means

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  • ABSTRACT OF THE DISCLOSURE This invention relates to the balancing of control circuits in materials testing devices.
  • one mode of crosshead control e.g., strain
  • another e.g., load or stress
  • the invention features a first circuit directed by a first type of command, a second circuit directed by a second type of command, and a third circuit alternately responsive to whichever of said first and second circuitry is in command to control said materials testing device and simultaneously responsive to the other of said control circuits to vary the command signal of the circuitry not in command to follow existing specimen conditions.
  • FIG. 1 is a diagrammatic view of a materials testing device including control circuits and a balance circuit.
  • a materials testing device l comprising a frame 12, crosshead 14, drive screws 16 and 18, gears 20, 22, and 24, motor 26 and specimen grips 28 and 30.
  • a strain control circuit includes a sensor circuit utilizing extensometer 34 mounted on specimen 32 and mechanically coupled to linear variable differential transformer (LVDT) 38.
  • LVDT 38 thus serves to transduce the mechanical strain in the specimen to an electrical signal which is carried by the remainder of the sensor circuit, including isolation transformer 44 and amplifier 46, to the mode selector 48.
  • the remainder of the strain control circuit is formed by a command circuit including LVDT 50 identical to LVDT 38, isolation transformer 52, amplifier 54, and potentiometer 56 (calibrated in units of strain) arranged to present a command signal to mode selector 48, the amplitude of the command signal being controlled by the setting on potentiometer 56.
  • the primary windings of both LVDTs are connected in series to alternating current source 58.
  • a load control circuit includes a sensor circuit utilizing a load cell 60, disposed in crosshead 14, energized by alternating current source 62, and providing a signal representative of the load applied to specimen 32 to the mode selector 48 through the remainder of the sensor circuit composed of isolation transformer 64 and amplifier 66.
  • the remainder of the load control circuit is formed by a command circuit which includes isolation transformer 68, amplifier 70, and potentiometer 72 (calibrated in units of load) arranged to deliver a command signal to mode selector 48.
  • strain and load control circuits under direction of mode selector 48 alternately feed comparator 76 whose output is delivered to motor 26 by means of servo amplifier 78 and motor control 80.
  • a balance circuit includes mode selector 48, comparator 76 fed alternately by whichever of the load and strain control circuits is in command under direction of mode selector 48, comparator 74 fed alternately by whichever of the control circuits is not in command, balance controls 82, 84 directed by mode selector 48, and normally open gates 94, 96.
  • Balance controls 82 and 84 are arranged respectively to mechanically control the settings on potentiometers 56, 72. The potentiometer whose setting is being controlled by comparator 74 will be the one whose command is not currently controlling the materials testing device.
  • mode selector 48 set on mode 1
  • the output of the strain control circuit on lines 86 is directed to comparator 76.
  • the command and sensor signals on lines 88 are compared and any difference between the two causes motor control to appropriately adjust the movement of crosshead 14 until the specimen strain is such as to make the sensor signal coincide with the command signal.
  • Normally open gate 96 is closed and the load control circuit output, on lines 90, is directed to comparator '7a4 on lines 92 where the command and sensor signals are compared and any difference between the two causes balance circuit 84 to appropriately adjust the command on potentiometer 72 until the command signal coincides with the sensor signal.
  • the mode selector is set at mode 2 the load control circuit will be connected to comparator 76 for controlling the crosshead, the strain control circuit to comparator 74 for adjustment of potentiometer 56 in accordance with the specimen strain, and gate 94 will be closed.
  • a materials testing device comprising:
  • a third circuit alternately responsive to whichever of said control circuits is in command to apply the output of said circuit in command to said motor control While simultaneously responsive to the other of said control circuits to maintain the command of said other control circuit commensurate with the actual condition at the specimen.
  • each of said control circuits includes a sensor circuit and a command circuit
  • said third circuit includes:
  • first and second balance controls respectively coupled to the commands for said first and second control circuits for adjusting said commands
  • a rst comparator responsive to said control circuits for diverting said motor control
  • a strain sensor circuit including a first LVDT coupled to an extensometer for mounting on said specimen and providing a signal measuring the strain in said specimen, and
  • a strain command circuit including a second LVDT identical in electrical characteristics to said first LVDT and a rst potentiometer for determining the amplitude of a signal from said strain command circuit
  • a load control circuit comprising:
  • a load sensor circuit including a transducer in load sensing relation to said specimen and providing a signal measuring the load on said specimen
  • a load command circuit including a second potentiorneter for determining the amplitude of a signal from said load command circuit
  • first and second balance controls respectively mechanically coupled to said first and second potentiometers for adjusting the settings thereon
  • mode selector for alternately applying the output of whichever of said control circuit is in command to said first comparator, while simultaneously applying the output of the other of said control circuits to said second comparator, and applying the output of said second comparator to the balance control associted with said other control circuit to maintain the setting on the potentiometer of said other control circuit commensurate with the actual condition at the specimen.
  • a materials testing device comprising.'
  • pair of grips for applying a load to a specimen, one of said grips being attac/ted to a movable crossheatl, motor control,
  • circuitry responsive to at least one of said control circuits to apply tlte output of said one circuit to said motor control while simultaneously responsive to the other of said control circuits to maintain the command of said other control circuit commensurate with the actual condition at tlze specimen.

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Description

Feb. 3, 1970 J. l.. PRI-:s'roN MATERIALS TESTING CONTROL CIRGUITRY Original Filed Oct. 5, 1965 United States Patent Office Re. 26,782 Reissuied Feb. 3, 1970 26,782 MATERIALS TESTING CONTROL CIRCUITRY John Linnartz Preston, Needham, Mass., assignor to Instron Corporation, Canton, Mass., a corporation of Massachusetts Original No. 3,374,665, dated Mar. 26, 1968, Ser. No. 493,054, Oct. 5, 1965. Application for reissue Dec. 6, 1968, Ser. No. 786,500
Int. Cl. G01n 3/00 U.S. Cl. 73-90 4 Claims Matter enclosed in heavy brackets appears in the original patent but forms no part of this reissue specification; matter printed in italics indicates the additions made by reissue.
ABSTRACT OF THE DISCLOSURE This invention relates to the balancing of control circuits in materials testing devices.
It is a primary object of the invention to provide, in a materials testing device having a movable crosshead, for conversion from one mode of crosshead control (e.g., strain) to another (e.g., load or stress) without requiring sudden gross adjustment of the crosshead position.
The invention features a first circuit directed by a first type of command, a second circuit directed by a second type of command, and a third circuit alternately responsive to whichever of said first and second circuitry is in command to control said materials testing device and simultaneously responsive to the other of said control circuits to vary the command signal of the circuitry not in command to follow existing specimen conditions.
Other objects, features, and advantages will appear from the following description of a preferred embodiment of the invention, taken together with the attached drawing in which:
FIG. 1 is a diagrammatic view of a materials testing device including control circuits and a balance circuit.
There is shown in the drawing a portion of a materials testing device l comprising a frame 12, crosshead 14, drive screws 16 and 18, gears 20, 22, and 24, motor 26 and specimen grips 28 and 30.
A strain control circuit includes a sensor circuit utilizing extensometer 34 mounted on specimen 32 and mechanically coupled to linear variable differential transformer (LVDT) 38. LVDT 38 thus serves to transduce the mechanical strain in the specimen to an electrical signal which is carried by the remainder of the sensor circuit, including isolation transformer 44 and amplifier 46, to the mode selector 48. The remainder of the strain control circuit is formed by a command circuit including LVDT 50 identical to LVDT 38, isolation transformer 52, amplifier 54, and potentiometer 56 (calibrated in units of strain) arranged to present a command signal to mode selector 48, the amplitude of the command signal being controlled by the setting on potentiometer 56. The primary windings of both LVDTs are connected in series to alternating current source 58.
A load control circuit includes a sensor circuit utilizing a load cell 60, disposed in crosshead 14, energized by alternating current source 62, and providing a signal representative of the load applied to specimen 32 to the mode selector 48 through the remainder of the sensor circuit composed of isolation transformer 64 and amplifier 66. The remainder of the load control circuit is formed by a command circuit which includes isolation transformer 68, amplifier 70, and potentiometer 72 (calibrated in units of load) arranged to deliver a command signal to mode selector 48.
The strain and load control circuits under direction of mode selector 48 alternately feed comparator 76 whose output is delivered to motor 26 by means of servo amplifier 78 and motor control 80.
A balance circuit includes mode selector 48, comparator 76 fed alternately by whichever of the load and strain control circuits is in command under direction of mode selector 48, comparator 74 fed alternately by whichever of the control circuits is not in command, balance controls 82, 84 directed by mode selector 48, and normally open gates 94, 96. Balance controls 82 and 84 are arranged respectively to mechanically control the settings on potentiometers 56, 72. The potentiometer whose setting is being controlled by comparator 74 will be the one whose command is not currently controlling the materials testing device.
In operation, with mode selector 48 set on mode 1, the output of the strain control circuit on lines 86 is directed to comparator 76. The command and sensor signals on lines 88 are compared and any difference between the two causes motor control to appropriately adjust the movement of crosshead 14 until the specimen strain is such as to make the sensor signal coincide with the command signal. Normally open gate 96 is closed and the load control circuit output, on lines 90, is directed to comparator '7a4 on lines 92 where the command and sensor signals are compared and any difference between the two causes balance circuit 84 to appropriately adjust the command on potentiometer 72 until the command signal coincides with the sensor signal. If the mode selector is set at mode 2 the load control circuit will be connected to comparator 76 for controlling the crosshead, the strain control circuit to comparator 74 for adjustment of potentiometer 56 in accordance with the specimen strain, and gate 94 will be closed.
Other embodiments will occur to those skilled in the art and are within the following claims.
What is claimed is:
1. A materials testing device comprising:
a pair of grips for applying a load to a specimen, one
of said grips being attached to a movable crosshead,
a motor control,
a motor responsive to said rnotor control for moving said crosshead,
a `first control circuit responsive to a first variable command,
a second control circuit responsive to a second variable command, and
a third circuit alternately responsive to whichever of said control circuits is in command to apply the output of said circuit in command to said motor control While simultaneously responsive to the other of said control circuits to maintain the command of said other control circuit commensurate with the actual condition at the specimen.
2. The device of claim 1 wherein each of said control circuits includes a sensor circuit and a command circuit, and said third circuit includes:
first and second balance controls respectively coupled to the commands for said first and second control circuits for adjusting said commands,
a rst comparator responsive to said control circuits for diverting said motor control,
a strain sensor circuit including a first LVDT coupled to an extensometer for mounting on said specimen and providing a signal measuring the strain in said specimen, and
a strain command circuit including a second LVDT identical in electrical characteristics to said first LVDT and a rst potentiometer for determining the amplitude of a signal from said strain command circuit,
the primaries of said LVDTs being connected in series with a source of alternating current,
a load control circuit comprising:
a load sensor circuit including a transducer in load sensing relation to said specimen and providing a signal measuring the load on said specimen,
a load command circuit including a second potentiorneter for determining the amplitude of a signal from said load command circuit,
first and second balance controls respectively mechanically coupled to said first and second potentiometers for adjusting the settings thereon,
first comparator responsive to said control circuits for directing Said motor control,
second comparator responsive to said control circuits for directing said balance controls, and
mode selector for alternately applying the output of whichever of said control circuit is in command to said first comparator, while simultaneously applying the output of the other of said control circuits to said second comparator, and applying the output of said second comparator to the balance control associted with said other control circuit to maintain the setting on the potentiometer of said other control circuit commensurate with the actual condition at the specimen.
A materials testing device comprising.'
pair of grips for applying a load to a specimen, one of said grips being attac/ted to a movable crossheatl, motor control,
motor responsive to said motor control for moving said crosslzead,
a first control circuit responsive t0 a rst variable command,
a second control circuit responsive to a second variable command, and
circuitry responsive to at least one of said control circuits to apply tlte output of said one circuit to said motor control while simultaneously responsive to the other of said control circuits to maintain the command of said other control circuit commensurate with the actual condition at tlze specimen.
References Cited The following references, cited by the Examiner, are of record in the patented file of this patent or the original patent.
UNITED STATES PATENTS 2,411,450 ll/l946 Miller et al. 73-90 2,445,683 7/1948 MacGeorge 73-90 2,923,501 2/1960 Seliger 318--245 3,068,387 12/1962 Koppel 3lS-20 3,156,438 l1/1964 Diller et al. 318-20 JERRY W. MYRACLE, Primary Examiner U.S. Cl. X.R. 3lS-333
US26782D 1968-12-06 1968-12-06 Materials testing control circuitry Expired USRE26782E (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050098125A1 (en) * 2002-07-01 2005-05-12 Thomas Hathaway Valve lash adjustment apparatus and method
US7559301B2 (en) 2002-07-01 2009-07-14 Cinetic Automation Corporation Valve lash adjustment and inspection apparatus

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050098125A1 (en) * 2002-07-01 2005-05-12 Thomas Hathaway Valve lash adjustment apparatus and method
US20050205035A1 (en) * 2002-07-01 2005-09-22 Thomas Hathaway Valve lash adjustment apparatus and method
US6973905B2 (en) 2002-07-01 2005-12-13 Cinetic Automation Corporation Valve lash adjustment apparatus and method
US7207301B2 (en) 2002-07-01 2007-04-24 Cinetic Automation Corporation Valve lash adjustment apparatus and method
US7559301B2 (en) 2002-07-01 2009-07-14 Cinetic Automation Corporation Valve lash adjustment and inspection apparatus
US20090250031A1 (en) * 2002-07-01 2009-10-08 Hathaway Thomas J Valve Lash Adjustment and Inspection Apparatus
US8001939B2 (en) 2002-07-01 2011-08-23 Cinetic Automation Corporation Valve lash adjustment and inspection apparatus

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