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USD400811S - Test probe plunger tip - Google Patents

Test probe plunger tip Download PDF

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Publication number
USD400811S
USD400811S US29/079,957 US7995797F USD400811S US D400811 S USD400811 S US D400811S US 7995797 F US7995797 F US 7995797F US D400811 S USD400811 S US D400811S
Authority
US
United States
Prior art keywords
test probe
plunger tip
probe plunger
tip
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/079,957
Inventor
Mark A. Swart
Charles J. Johnston
Gordon A. Vinther
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Delaware Capital Formation Inc
Original Assignee
Delaware Capital Formation Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Delaware Capital Formation Inc filed Critical Delaware Capital Formation Inc
Priority to US29/079,957 priority Critical patent/USD400811S/en
Assigned to EVERETT CHARLES TECHNOLOGIES, INC. reassignment EVERETT CHARLES TECHNOLOGIES, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: JOHNSTON, CHARLES J., SWART, MARK A., VINTHER, GORDON A.
Assigned to DELAWARE CAPITAL FORMATION, INC. reassignment DELAWARE CAPITAL FORMATION, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: EVERETT CHARLES TECHNOLOGIES, INC.
Application granted granted Critical
Publication of USD400811S publication Critical patent/USD400811S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of the test probe plunger tip showing the new design;
FIG. 2 is a left side elevational view of the embodiment of FIG. 1;
FIG. 3 is a front elevational view of the embodiment of FIG. 1;
FIG. 4 is a right side elevational view of the embodiment of FIG. 1;
FIG. 5 is a back elevational view of the embodiment of FIG. 1;
FIG. 6 is a bottom elevational view of the embodiment of FIG. 1; and,
FIG. 7 is a top elevational view of the embodiment of FIG. 1.

Claims (1)

  1. The ornamental design for a test probe plunger tip, as shown and described.
US29/079,957 1997-11-21 1997-11-21 Test probe plunger tip Expired - Lifetime USD400811S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/079,957 USD400811S (en) 1997-11-21 1997-11-21 Test probe plunger tip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/079,957 USD400811S (en) 1997-11-21 1997-11-21 Test probe plunger tip

Publications (1)

Publication Number Publication Date
USD400811S true USD400811S (en) 1998-11-10

Family

ID=71573602

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/079,957 Expired - Lifetime USD400811S (en) 1997-11-21 1997-11-21 Test probe plunger tip

Country Status (1)

Country Link
US (1) USD400811S (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD422518S (en) 1999-04-15 2000-04-11 Applied Power Inc. Electrical instrument probe tip
USD444720S1 (en) 2000-07-31 2001-07-10 Lecroy Corporation Notched electrical test probe tip
WO2002010784A1 (en) * 2000-07-31 2002-02-07 Lecroy Corporation Notched electrical test probe tip
USD699607S1 (en) 2012-03-01 2014-02-18 Yamaichi Electronics Co., Ltd. Contact probe
USD769753S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4560926A (en) 1982-01-08 1985-12-24 Technobal S.A. Contact device for use in the testing of printed circuits and a removable contact head for use in such a device
US5227718A (en) 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4560926A (en) 1982-01-08 1985-12-24 Technobal S.A. Contact device for use in the testing of printed circuits and a removable contact head for use in such a device
US5227718A (en) 1992-03-10 1993-07-13 Virginia Panel Corporation Double-headed spring contact probe assembly

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD422518S (en) 1999-04-15 2000-04-11 Applied Power Inc. Electrical instrument probe tip
USD444720S1 (en) 2000-07-31 2001-07-10 Lecroy Corporation Notched electrical test probe tip
WO2002010784A1 (en) * 2000-07-31 2002-02-07 Lecroy Corporation Notched electrical test probe tip
US6538424B1 (en) 2000-07-31 2003-03-25 Le Croy Corporation Notched electrical test probe tip
US20030189437A1 (en) * 2000-07-31 2003-10-09 Lecroy Corporation Notched electrical test probe tip
US6809535B2 (en) 2000-07-31 2004-10-26 Lecroy Corporation Notched electrical test probe tip
US20050052193A1 (en) * 2000-07-31 2005-03-10 Lecroy Corporation Notched electrical test probe tip
US7140105B2 (en) 2000-07-31 2006-11-28 Lecroy Corporation Method of fabricating a notched electrical test probe tip
USD699607S1 (en) 2012-03-01 2014-02-18 Yamaichi Electronics Co., Ltd. Contact probe
USD769753S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin

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