USD335463S - Portable electronic thickness measuring instrument - Google Patents
Portable electronic thickness measuring instrument Download PDFInfo
- Publication number
- USD335463S USD335463S US07/636,974 US63697491F USD335463S US D335463 S USD335463 S US D335463S US 63697491 F US63697491 F US 63697491F US D335463 S USD335463 S US D335463S
- Authority
- US
- United States
- Prior art keywords
- portable electronic
- measuring instrument
- thickness measuring
- electronic thickness
- ornamental design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front elevational view of a portable electronic thickness measuring instrument showing my new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a right side elevational view;
FIG. 4 is a left side elevational view;
FIG. 5 is a bottom plan view; and,
FIG. 6 is a rear elevational view thereof.
Claims (1)
- The ornamental design for a portable electronic thickness measuring instrument, as shown and described.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DEM9004660.9 | 1990-07-10 | ||
| DEM9004660 | 1990-07-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD335463S true USD335463S (en) | 1993-05-11 |
Family
ID=70734358
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US07/636,974 Expired - Lifetime USD335463S (en) | 1990-07-10 | 1991-01-02 | Portable electronic thickness measuring instrument |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD335463S (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5467014A (en) | 1992-07-03 | 1995-11-14 | Nix; Norbert | Device for measuring the thickness of a layer or coating on a ferrous and/or non-ferrous substrate |
| USD419465S (en) * | 1999-03-01 | 2000-01-25 | Silicon Graphics, Inc. | Color calibration device for a display |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4164707A (en) | 1976-06-30 | 1979-08-14 | Norbert Nix | Magnetic thickness gauge of the magnet adhesion type using drive means with a governor to raise the magnet |
| USD254778S (en) | 1977-07-07 | 1980-04-22 | Tokyo Keiki Company Limited | Ultrasonic wave thickness meter |
| US4400665A (en) | 1978-12-23 | 1983-08-23 | Norbert Nix | Device for automatically measuring thickness of coatings on a substrate by comparison with an uncoated substrate |
| US4425546A (en) | 1980-03-05 | 1984-01-10 | Taylor James C | Coating thickness gauge |
| US4459550A (en) | 1980-05-22 | 1984-07-10 | Nix Maria | Non-magnetic layer thickness tester utilizing a permanent magnet |
| US4904939A (en) | 1988-09-16 | 1990-02-27 | International Electronic Machines Corp. | Portable electronic wheel wear gauge |
-
1991
- 1991-01-02 US US07/636,974 patent/USD335463S/en not_active Expired - Lifetime
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4164707A (en) | 1976-06-30 | 1979-08-14 | Norbert Nix | Magnetic thickness gauge of the magnet adhesion type using drive means with a governor to raise the magnet |
| USD254778S (en) | 1977-07-07 | 1980-04-22 | Tokyo Keiki Company Limited | Ultrasonic wave thickness meter |
| US4400665A (en) | 1978-12-23 | 1983-08-23 | Norbert Nix | Device for automatically measuring thickness of coatings on a substrate by comparison with an uncoated substrate |
| US4425546A (en) | 1980-03-05 | 1984-01-10 | Taylor James C | Coating thickness gauge |
| US4459550A (en) | 1980-05-22 | 1984-07-10 | Nix Maria | Non-magnetic layer thickness tester utilizing a permanent magnet |
| US4904939A (en) | 1988-09-16 | 1990-02-27 | International Electronic Machines Corp. | Portable electronic wheel wear gauge |
Non-Patent Citations (4)
| Title |
|---|
| Mono-Check, Schichtdickenmessung auf Eisen, Lixt-Magnetik, Dipl.-lng. Heinrich List GmbH., Max-Lang-Strasse 56, D-7033 Leinfelden-Echterdingen. |
| Permascope® MPO, Helmut Fischer GmbH & Company, Institute fur Elektronik und Messtechnik, Postfach 4, D-7032 Sindelfingen 6. |
| PosiTector® 2000, 3000, 300, Automation Ko, Dr. Nix GmbH, Robert-Perthel Strass 2, 500 Koln 60. |
| PosiTest™, Das Schichtdicken-Bessgerat, daskaum zu *schlagen ist, Der Messkopf ist mit einer Hartmetall-Kugel bestuckt. |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5467014A (en) | 1992-07-03 | 1995-11-14 | Nix; Norbert | Device for measuring the thickness of a layer or coating on a ferrous and/or non-ferrous substrate |
| USD419465S (en) * | 1999-03-01 | 2000-01-25 | Silicon Graphics, Inc. | Color calibration device for a display |
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