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USD397052S - Test lead - Google Patents

Test lead Download PDF

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Publication number
USD397052S
USD397052S US29/068,886 US6888697F USD397052S US D397052 S USD397052 S US D397052S US 6888697 F US6888697 F US 6888697F US D397052 S USD397052 S US D397052S
Authority
US
United States
Prior art keywords
test lead
view
test
lead
tip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/068,886
Inventor
Daniel Arnoux
Axel Arnoux
Claude Genter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chauvin Arnoux SAS
Original Assignee
Chauvin Arnoux SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chauvin Arnoux SAS filed Critical Chauvin Arnoux SAS
Priority to US29/068,886 priority Critical patent/USD397052S/en
Assigned to SOCIETE CHAUVIN ARNOUX reassignment SOCIETE CHAUVIN ARNOUX ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ARNOUX, AXEL, ARNOUX, DANIEL, GENTER, CLAUDE
Application granted granted Critical
Publication of USD397052S publication Critical patent/USD397052S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of the test lead according to our new design;
FIG. 2 is a side elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is an enlarged end view thereof, as seen from the left side of FIG. 2;
FIG. 6 is an enlarged end view thereof, as seen from the right side of FIG. 2;
FIG. 7 is an exploded view of the tip end of FIG. 4, showing the inner construction of the tip; and,
FIG. 8 is a perspective view of another embodiment of the test lead of our new design, the modifications appearing at the connector and tip.

Claims (1)

  1. The ornamental design for a test lead, as shown.
US29/068,886 1997-04-08 1997-04-08 Test lead Expired - Lifetime USD397052S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/068,886 USD397052S (en) 1997-04-08 1997-04-08 Test lead

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/068,886 USD397052S (en) 1997-04-08 1997-04-08 Test lead

Publications (1)

Publication Number Publication Date
USD397052S true USD397052S (en) 1998-08-18

Family

ID=71577837

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/068,886 Expired - Lifetime USD397052S (en) 1997-04-08 1997-04-08 Test lead

Country Status (1)

Country Link
US (1) USD397052S (en)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD867183S1 (en) * 2017-02-10 2019-11-19 Kabushiki Kaisha Nihon Micronics Probe pin
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
USD873160S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873159S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873684S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873685S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873686S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873683S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD874958S1 (en) * 2018-02-02 2020-02-11 Kabushiki Kaisha Nihon Micronics Electric contact
USD1016642S1 (en) * 2022-03-17 2024-03-05 Fluke Corporation Test lead
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1060684S1 (en) * 2023-05-23 2025-02-04 Canon Medical Systems Corporation Probe for an ultrasonic diagnosis device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD334147S (en) 1990-06-13 1993-03-23 Tektronix, Inc. Electrical test probe
USD344681S (en) 1992-04-07 1994-03-01 Tektronix, Inc. Head assembly for a switchable electrical test probe

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD334147S (en) 1990-06-13 1993-03-23 Tektronix, Inc. Electrical test probe
USD344681S (en) 1992-04-07 1994-03-01 Tektronix, Inc. Head assembly for a switchable electrical test probe

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD867183S1 (en) * 2017-02-10 2019-11-19 Kabushiki Kaisha Nihon Micronics Probe pin
USD869305S1 (en) * 2017-02-10 2019-12-10 Kabushiki Kaisha Nihon Micronics Probe pin
USD873685S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873161S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873159S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873684S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873160S1 (en) * 2018-02-02 2020-01-21 Kabushiki Kaisha Nihon Micronics Electric contact
USD873686S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD873683S1 (en) * 2018-02-02 2020-01-28 Kabushiki Kaisha Nihon Micronics Electric contact
USD874958S1 (en) * 2018-02-02 2020-02-11 Kabushiki Kaisha Nihon Micronics Electric contact
USD1042182S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
USD1016642S1 (en) * 2022-03-17 2024-03-05 Fluke Corporation Test lead
USD1060684S1 (en) * 2023-05-23 2025-02-04 Canon Medical Systems Corporation Probe for an ultrasonic diagnosis device

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