USD397052S - Test lead - Google Patents
Test lead Download PDFInfo
- Publication number
- USD397052S USD397052S US29/068,886 US6888697F USD397052S US D397052 S USD397052 S US D397052S US 6888697 F US6888697 F US 6888697F US D397052 S USD397052 S US D397052S
- Authority
- US
- United States
- Prior art keywords
- test lead
- view
- test
- lead
- tip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010276 construction Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Description
FIG. 1 is a perspective view of the test lead according to our new design;
FIG. 2 is a side elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is an enlarged end view thereof, as seen from the left side of FIG. 2;
FIG. 6 is an enlarged end view thereof, as seen from the right side of FIG. 2;
FIG. 7 is an exploded view of the tip end of FIG. 4, showing the inner construction of the tip; and,
FIG. 8 is a perspective view of another embodiment of the test lead of our new design, the modifications appearing at the connector and tip.
Claims (1)
- The ornamental design for a test lead, as shown.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/068,886 USD397052S (en) | 1997-04-08 | 1997-04-08 | Test lead |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/068,886 USD397052S (en) | 1997-04-08 | 1997-04-08 | Test lead |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD397052S true USD397052S (en) | 1998-08-18 |
Family
ID=71577837
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/068,886 Expired - Lifetime USD397052S (en) | 1997-04-08 | 1997-04-08 | Test lead |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD397052S (en) |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD867183S1 (en) * | 2017-02-10 | 2019-11-19 | Kabushiki Kaisha Nihon Micronics | Probe pin |
| USD869305S1 (en) * | 2017-02-10 | 2019-12-10 | Kabushiki Kaisha Nihon Micronics | Probe pin |
| USD873160S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873161S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873159S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873684S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873685S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873686S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873683S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD874958S1 (en) * | 2018-02-02 | 2020-02-11 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD1016642S1 (en) * | 2022-03-17 | 2024-03-05 | Fluke Corporation | Test lead |
| USD1042182S1 (en) * | 2021-12-17 | 2024-09-17 | SensePeek AB | Electricity measuring instrument |
| USD1042181S1 (en) * | 2021-12-17 | 2024-09-17 | SensePeek AB | Electricity measuring instrument |
| USD1060684S1 (en) * | 2023-05-23 | 2025-02-04 | Canon Medical Systems Corporation | Probe for an ultrasonic diagnosis device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD334147S (en) | 1990-06-13 | 1993-03-23 | Tektronix, Inc. | Electrical test probe |
| USD344681S (en) | 1992-04-07 | 1994-03-01 | Tektronix, Inc. | Head assembly for a switchable electrical test probe |
-
1997
- 1997-04-08 US US29/068,886 patent/USD397052S/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD334147S (en) | 1990-06-13 | 1993-03-23 | Tektronix, Inc. | Electrical test probe |
| USD344681S (en) | 1992-04-07 | 1994-03-01 | Tektronix, Inc. | Head assembly for a switchable electrical test probe |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD867183S1 (en) * | 2017-02-10 | 2019-11-19 | Kabushiki Kaisha Nihon Micronics | Probe pin |
| USD869305S1 (en) * | 2017-02-10 | 2019-12-10 | Kabushiki Kaisha Nihon Micronics | Probe pin |
| USD873685S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873161S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873159S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873684S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873160S1 (en) * | 2018-02-02 | 2020-01-21 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873686S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD873683S1 (en) * | 2018-02-02 | 2020-01-28 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD874958S1 (en) * | 2018-02-02 | 2020-02-11 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| USD1042182S1 (en) * | 2021-12-17 | 2024-09-17 | SensePeek AB | Electricity measuring instrument |
| USD1042181S1 (en) * | 2021-12-17 | 2024-09-17 | SensePeek AB | Electricity measuring instrument |
| USD1016642S1 (en) * | 2022-03-17 | 2024-03-05 | Fluke Corporation | Test lead |
| USD1060684S1 (en) * | 2023-05-23 | 2025-02-04 | Canon Medical Systems Corporation | Probe for an ultrasonic diagnosis device |
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