USD360599S - Measurement scanner for semi-conductor - Google Patents
Measurement scanner for semi-conductor Download PDFInfo
- Publication number
- USD360599S USD360599S US29/025,210 US2521094F USD360599S US D360599 S USD360599 S US D360599S US 2521094 F US2521094 F US 2521094F US D360599 S USD360599 S US D360599S
- Authority
- US
- United States
- Prior art keywords
- semi
- conductor
- measurement scanner
- scanner
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front, top and right side elevational perspective view of measurement scanner for semi-conductor showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a right elevational view thereof;
FIG. 4 is a top plan elevational view thereof;
FIG. 5 is a bottom plan elevational view thereof;
FIG. 6 is a rear elevational view thereof; and,
FIG. 7 is a left elevational view thereof.
Claims (1)
- The ornamental design for a measurement scanner for semi-conductor, as shown.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1033594 | 1994-04-15 | ||
| JP6-10335 | 1994-04-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD360599S true USD360599S (en) | 1995-07-25 |
Family
ID=65267638
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/025,210 Expired - Lifetime USD360599S (en) | 1994-04-15 | 1994-07-26 | Measurement scanner for semi-conductor |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD360599S (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD332616S (en) | 1990-01-26 | 1993-01-19 | Hitachi, Ltd. | Electronic microscope |
| USD352910S (en) | 1992-11-27 | 1994-11-29 | Hitachi, Ltd. | Processing machine for electron beam lithography system |
-
1994
- 1994-07-26 US US29/025,210 patent/USD360599S/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD332616S (en) | 1990-01-26 | 1993-01-19 | Hitachi, Ltd. | Electronic microscope |
| USD352910S (en) | 1992-11-27 | 1994-11-29 | Hitachi, Ltd. | Processing machine for electron beam lithography system |
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