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USD352911S - Processing machine for electron beam lithography system - Google Patents

Processing machine for electron beam lithography system Download PDF

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Publication number
USD352911S
USD352911S US29/004,587 US458793F USD352911S US D352911 S USD352911 S US D352911S US 458793 F US458793 F US 458793F US D352911 S USD352911 S US D352911S
Authority
US
United States
Prior art keywords
electron beam
processing machine
lithography system
beam lithography
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/004,587
Inventor
Takashi Yamamoto
Tomoyuki Miyata
Kazunori Hasimoto
Mitsuru Ohnuma
Toshihiko Wada
Seishiro Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Assigned to HITACHI, LTD. reassignment HITACHI, LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HASIMOTO, KAZUNORI, MIYATA, TOMOYUKI, OHNUMA, MITSURU, SATO, SEISHIRO, WADA, TOSHIHIKO, YAMAMOTO, TAKASHI
Application granted granted Critical
Publication of USD352911S publication Critical patent/USD352911S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front, top and right side elevational perspective view of a processing machine showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a right elevational view thereof;
FIG. 4 is a left elevational view thereof;
FIG. 5 is a top plan elevational view thereof;
FIG. 6 is a bottom plan elevational view thereof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is a front, top and right side elevational perspective view thereof in condition that a drawer on which a keyboard and a mouse pad is disposed.

Claims (1)

  1. The ornamental design for a processing machine for electron beam lithography system, as shown and described.
US29/004,587 1992-11-27 1993-02-08 Processing machine for electron beam lithography system Expired - Lifetime USD352911S (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP34703/1992 1992-11-27
JP3470392 1992-11-27

Publications (1)

Publication Number Publication Date
USD352911S true USD352911S (en) 1994-11-29

Family

ID=71014444

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/004,587 Expired - Lifetime USD352911S (en) 1992-11-27 1993-02-08 Processing machine for electron beam lithography system

Country Status (1)

Country Link
US (1) USD352911S (en)

Cited By (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD360598S (en) 1994-04-15 1995-07-25 Hitachi, Ltd. Console for measurement scanner for semi-conductor
USD365584S (en) 1993-12-15 1995-12-26 Tokyo Electron Kabushiki Kaisha Semiconductor manufacturing device
USD413341S (en) 1998-05-15 1999-08-31 Dowty Aerospace Yakima Automated work station
USD426785S (en) * 1999-07-09 2000-06-20 Matsushita Electric Industrial Co., Ltd. Wafer level burn-in tester
USD427088S (en) * 1999-07-09 2000-06-27 Matsushita Electric Industrial Co., Ltd. Wafer level burn-in tester
USD554070S1 (en) * 2006-05-03 2007-10-30 Data I/O Corporation Processing apparatus
USD554069S1 (en) * 2006-05-03 2007-10-30 Data I/O Corporation Processing apparatus
USD664666S1 (en) 2010-11-24 2012-07-31 Panasonic Corporation Inspection device for medical tablet
USD665097S1 (en) 2010-11-24 2012-08-07 Panasonic Corporation Inspection device for medical tablet
USD872777S1 (en) * 2017-10-31 2020-01-14 Blix Ltd. Processing machine
USD921069S1 (en) * 2019-05-03 2021-06-01 Glatt Gmbh Machine for the development and production of solid pharmaceutical products
US11559170B2 (en) 2016-07-20 2023-01-24 Blix Ltd. Single-use food preparation container assembly, system and method
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device
US11844465B2 (en) 2017-07-18 2023-12-19 Blix Ltd. Single-use food preparation container assemblies, systems and methods
USD1106300S1 (en) * 2024-09-12 2025-12-16 Maxim Smart Manufacturing Co., Ltd Product traceability robot

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD342909S (en) 1992-08-12 1994-01-04 Souriau Diagnostic Electronic Test station for monitoring and diagnosing operation of diesel engines
USD344719S (en) 1991-04-15 1994-03-01 Acer Incorporated Computer housing

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD344719S (en) 1991-04-15 1994-03-01 Acer Incorporated Computer housing
USD342909S (en) 1992-08-12 1994-01-04 Souriau Diagnostic Electronic Test station for monitoring and diagnosing operation of diesel engines

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD365584S (en) 1993-12-15 1995-12-26 Tokyo Electron Kabushiki Kaisha Semiconductor manufacturing device
USD360598S (en) 1994-04-15 1995-07-25 Hitachi, Ltd. Console for measurement scanner for semi-conductor
USD413341S (en) 1998-05-15 1999-08-31 Dowty Aerospace Yakima Automated work station
USD426785S (en) * 1999-07-09 2000-06-20 Matsushita Electric Industrial Co., Ltd. Wafer level burn-in tester
USD427088S (en) * 1999-07-09 2000-06-27 Matsushita Electric Industrial Co., Ltd. Wafer level burn-in tester
USD554069S1 (en) * 2006-05-03 2007-10-30 Data I/O Corporation Processing apparatus
USD554070S1 (en) * 2006-05-03 2007-10-30 Data I/O Corporation Processing apparatus
USD664666S1 (en) 2010-11-24 2012-07-31 Panasonic Corporation Inspection device for medical tablet
USD665097S1 (en) 2010-11-24 2012-08-07 Panasonic Corporation Inspection device for medical tablet
US11559170B2 (en) 2016-07-20 2023-01-24 Blix Ltd. Single-use food preparation container assembly, system and method
US11844465B2 (en) 2017-07-18 2023-12-19 Blix Ltd. Single-use food preparation container assemblies, systems and methods
US12390050B2 (en) 2017-07-18 2025-08-19 Blix Ltd. Single-use food preparation container assemblies, systems and methods
US12201244B2 (en) 2017-07-18 2025-01-21 Blix Ltd. Single-use food preparation container assemblies, systems and methods
US12042095B2 (en) 2017-07-18 2024-07-23 Blix Ltd. Single-use food preparation container assemblies, systems and methods
USD872777S1 (en) * 2017-10-31 2020-01-14 Blix Ltd. Processing machine
USD921069S1 (en) * 2019-05-03 2021-06-01 Glatt Gmbh Machine for the development and production of solid pharmaceutical products
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD1106300S1 (en) * 2024-09-12 2025-12-16 Maxim Smart Manufacturing Co., Ltd Product traceability robot

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