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USD1100689S1 - Measuring instrument - Google Patents

Measuring instrument

Info

Publication number
USD1100689S1
USD1100689S1 US29/911,321 US202329911321F USD1100689S US D1100689 S1 USD1100689 S1 US D1100689S1 US 202329911321 F US202329911321 F US 202329911321F US D1100689 S USD1100689 S US D1100689S
Authority
US
United States
Prior art keywords
measuring instrument
view
ornamental design
measuring
instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/911,321
Inventor
Reinhard Sulik
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Numerik Jena GmbH
Original Assignee
Numerik Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Numerik Jena GmbH filed Critical Numerik Jena GmbH
Application granted granted Critical
Publication of USD1100689S1 publication Critical patent/USD1100689S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of a measuring instrument showing my new design;
FIG. 2 is a front view thereof;
FIG. 3 is a rear view thereof;
FIG. 4 is a left-side view thereof;
FIG. 5 is a right-side view thereof;
FIG. 6 is a bottom view thereof; and,
FIG. 7 is a top view thereof.
Broken lines in the Figures show portions of the measuring instrument that form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a measuring instrument, as shown and described.
US29/911,321 2023-03-09 2023-09-01 Measuring instrument Active USD1100689S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EM015014004-0001 2023-03-09
EM150140040001 2023-03-09

Publications (1)

Publication Number Publication Date
USD1100689S1 true USD1100689S1 (en) 2025-11-04

Family

ID=89771298

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/911,321 Active USD1100689S1 (en) 2023-03-09 2023-09-01 Measuring instrument

Country Status (2)

Country Link
US (1) USD1100689S1 (en)
JP (1) JP1762925S (en)

Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD348616S (en) * 1993-05-14 1994-07-12 Apigian Ardash V Manufacturing inspection transducer
US5386291A (en) * 1992-11-25 1995-01-31 Mitutoyo Corporation Displacement sensor including a heat insulating member partitioning the moving scale and the semiconductor laser
US6119359A (en) * 1997-06-10 2000-09-19 Mitutoyo Corporation Measuring instrument
US20030037455A1 (en) * 2001-08-21 2003-02-27 Mitutoyo Corporation Inside micrometer
US20070056183A1 (en) * 2005-09-12 2007-03-15 Mitutoyo Corporation Digital measuring instrument
RU82310U1 (en) * 2008-09-22 2009-04-20 Юрий Валерьевич Яворский LOOPHOLE
USD592086S1 (en) * 2008-02-12 2009-05-12 Mitutoyo Corporation Digital dial gauge
RU108184U1 (en) * 2011-02-28 2011-09-10 Виктор Никифорович Сараев SYSTEM OF LOCAL POSITIONING OF PERSONNEL AT LARGE TECHNOGENIC OBJECTS
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
US20170314903A1 (en) * 2016-04-27 2017-11-02 Mitutoyo Corporation Linear gage
USD820697S1 (en) * 2016-10-27 2018-06-19 InstruMMents, Inc. Measuring device
US20190353505A1 (en) * 2018-05-21 2019-11-21 Mitutoyo Corporation Position measurement apparatus
USD899946S1 (en) * 2018-07-24 2020-10-27 E+E Elektronik Ges.M.B.H Measuring instrument
US20210333079A1 (en) * 2020-04-27 2021-10-28 Mitutoyo Corporation Network apparatus
US20220042863A1 (en) * 2020-08-05 2022-02-10 Mitutoyo Corporation Measuring device
US20240212129A1 (en) * 2022-12-22 2024-06-27 Mitutoyo Corporation Inspection method, inspection apparatus, and inspection program for disk-shaped graduation plate
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument

Patent Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5386291A (en) * 1992-11-25 1995-01-31 Mitutoyo Corporation Displacement sensor including a heat insulating member partitioning the moving scale and the semiconductor laser
USD348616S (en) * 1993-05-14 1994-07-12 Apigian Ardash V Manufacturing inspection transducer
US6119359A (en) * 1997-06-10 2000-09-19 Mitutoyo Corporation Measuring instrument
US20030037455A1 (en) * 2001-08-21 2003-02-27 Mitutoyo Corporation Inside micrometer
US20070056183A1 (en) * 2005-09-12 2007-03-15 Mitutoyo Corporation Digital measuring instrument
USD592086S1 (en) * 2008-02-12 2009-05-12 Mitutoyo Corporation Digital dial gauge
RU82310U1 (en) * 2008-09-22 2009-04-20 Юрий Валерьевич Яворский LOOPHOLE
RU108184U1 (en) * 2011-02-28 2011-09-10 Виктор Никифорович Сараев SYSTEM OF LOCAL POSITIONING OF PERSONNEL AT LARGE TECHNOGENIC OBJECTS
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
US20170314903A1 (en) * 2016-04-27 2017-11-02 Mitutoyo Corporation Linear gage
USD820697S1 (en) * 2016-10-27 2018-06-19 InstruMMents, Inc. Measuring device
US20190353505A1 (en) * 2018-05-21 2019-11-21 Mitutoyo Corporation Position measurement apparatus
USD899946S1 (en) * 2018-07-24 2020-10-27 E+E Elektronik Ges.M.B.H Measuring instrument
US20210333079A1 (en) * 2020-04-27 2021-10-28 Mitutoyo Corporation Network apparatus
US20220042863A1 (en) * 2020-08-05 2022-02-10 Mitutoyo Corporation Measuring device
USD1042181S1 (en) * 2021-12-17 2024-09-17 SensePeek AB Electricity measuring instrument
US20240212129A1 (en) * 2022-12-22 2024-06-27 Mitutoyo Corporation Inspection method, inspection apparatus, and inspection program for disk-shaped graduation plate

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
Acanto Series, heidenhain.us, No date, [site visited: Mar. 11, 2025], Available from URL: https://www.heidenhain.us/products/length-gauges/acanto/ (Year: 2025). *
Digital Linear Gauge Sensor, onosokki.co.jp, No date, [site visited: Mar. 11, 2025], Available from URL: https://www.onosokki.co.jp/English/hp_e/products/category/gauge_front.htm (Year: 2025). *
Metro, numerikjena.com, Date: Apr. 2024, [site visited: Mar. 11, 2024] Available from URL: https://www.numerikjena.com/fileadmin/Redaktion/004_PDF-Dokumente/MeTaP/Pin_assignment_SPECTO_METRO_de_en.pdf (Year: 2024). *
Mitutoyo 575-328, amazon.com, Date: Jun. 30, 2010, [site visited: Mar. 11, 2025], Available from URL: https://a.co/d/dBEugNd (Year: 2010). *
Specto 12mm Axial Spring-driven, numerikajena.com, No date, [site visited: Mar. 11, 2025], Available from URL: https://www.numerikjena.com/products/lengthgauges/incremental-sd/specto-sd/ (Year: 2025). *

Also Published As

Publication number Publication date
JP1762925S (en) 2024-02-05

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