US3838031A - Means and method for depositing recrystallized ferroelectric material - Google Patents
Means and method for depositing recrystallized ferroelectric material Download PDFInfo
- Publication number
- US3838031A US3838031A US00289480A US28948072A US3838031A US 3838031 A US3838031 A US 3838031A US 00289480 A US00289480 A US 00289480A US 28948072 A US28948072 A US 28948072A US 3838031 A US3838031 A US 3838031A
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- target
- substrate
- recrystallized
- ferroelectric
- ferroelectric material
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- Expired - Lifetime
Links
- 239000000463 material Substances 0.000 title abstract description 44
- 238000000034 method Methods 0.000 title description 19
- 238000000151 deposition Methods 0.000 title description 12
- 239000000758 substrate Substances 0.000 abstract description 36
- 238000004544 sputter deposition Methods 0.000 abstract description 18
- 239000013077 target material Substances 0.000 abstract description 15
- 239000011261 inert gas Substances 0.000 abstract description 13
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract description 10
- 239000001301 oxygen Substances 0.000 abstract description 10
- 229910052760 oxygen Inorganic materials 0.000 abstract description 10
- 150000002500 ions Chemical class 0.000 abstract description 8
- 239000012530 fluid Substances 0.000 abstract description 7
- 239000002826 coolant Substances 0.000 abstract description 3
- 230000006866 deterioration Effects 0.000 abstract description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 20
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 18
- 229910052786 argon Inorganic materials 0.000 description 10
- 239000007789 gas Substances 0.000 description 10
- 229910052688 Gadolinium Inorganic materials 0.000 description 8
- 239000004020 conductor Substances 0.000 description 8
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 8
- 230000008021 deposition Effects 0.000 description 6
- MEFBJEMVZONFCJ-UHFFFAOYSA-N molybdate Chemical compound [O-][Mo]([O-])(=O)=O MEFBJEMVZONFCJ-UHFFFAOYSA-N 0.000 description 6
- 239000010453 quartz Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 239000013078 crystal Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 4
- 229910052754 neon Inorganic materials 0.000 description 4
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 229910052724 xenon Inorganic materials 0.000 description 4
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910002113 barium titanate Inorganic materials 0.000 description 2
- JRPBQTZRNDNNOP-UHFFFAOYSA-N barium titanate Chemical compound [Ba+2].[Ba+2].[O-][Ti]([O-])([O-])[O-] JRPBQTZRNDNNOP-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 229910002115 bismuth titanate Inorganic materials 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- JJSINHRPPHLULR-UHFFFAOYSA-N gadolinium(3+);oxygen(2-);titanium(4+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Ti+4].[Gd+3].[Gd+3] JJSINHRPPHLULR-UHFFFAOYSA-N 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052743 krypton Inorganic materials 0.000 description 2
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000005297 pyrex Substances 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- 241000282326 Felis catus Species 0.000 description 1
- 206010021143 Hypoxia Diseases 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000000740 bleeding effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229920000136 polysorbate Polymers 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/18—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering
Definitions
- Recrystallized ferroelectric material is deposited by sputtering on a heated substrate by applying radio-frequency voltage to a target holder supporting a target of ferroelectric material held in proximity to the substrate within a chamber which is evacuated except for the presence of a small amount of inert gas, and optionally with a small amount of oxygen.
- the radio-frequency voltage causes ions of the gas to strike the target material with such force as to break off molecules or atoms which bond themselves to the substrate.
- the target holder is provided with fluid coolant channels which protect the target from deterioration.
- This invention relates to the sputtering deposition of recrystallized ferroelectric material and more particularly to a method and apparatus capable of producing such a deposit.
- Ferroelectric materials such as gadolinium titanate, gadolinium molybdate, gadolinium niobate, barium titanate, and bismuth titanate have been known. Such ferroelectric materials when in crystal form possess birefringent properties permitting their use as light modulators, enabling them to affect transmission of light in various ways, for example, the production of color effects, or the passing, reducing or blocking of light transmission in ways dependent on such factors as the physical dimensions of the material, the application of an electric field or voltage and the relationship of the light to the material.
- a related object is to create such a recrystallized ferroelectric deposit by sputtering on a substrate or the like.
- a further related object is to provide a fluid-cooled target holder for carrying the ferroelectric material used as the target in the sputtering operation.
- the invention is carried out by the application of radiofrequency (R.F.) electrical power to a target holder containing a ferroelectric target material, in a high vacuum to which there have been introduced minor amounts of inert gas, preferably a relatively heavy inert gas such as argon, xenon, neon or krypton or mixtures thereof.
- inert gas preferably a relatively heavy inert gas such as argon, xenon, neon or krypton or mixtures thereof.
- the RF. energy acting upon the gas creates a plasma.
- a heated substrate or the like spaced somewhat from the target material receives a layer of recrystallized ferroelectric material bonded to it due to the sputtering of this material from the target by the actions of ions of the plasma striking the target material in response to the radio frequency energy.
- lighter inert gases such as nitrogen are usable, they are not as efficient as the heavier ones since ions of the lighter gases do not possess as much kinetic energy as ions of the heavier gases
- the target holder may be cooled by fluid, ordinarily water. Novel aspects reside in the configuration and arrangement of the coolant channels at the target holder.
- Recrystallized ferroelectric material can be used in such equipment as: computers or data processing systems, such as that of Snaper Pat. 3,348,217, issued Oct. 17, 1967; polarized film structures such as those of Snaper Pat. 3,- 376,135, issued Apr. 2, 1968; color-producing tubes such as that illustrated in Snaper Pat. 3,391,296, issued July 2, 1968; electro-optical devices such as that illustrated in Snaper Pat. 3,445,666, issued May 20, 1969; color-producing equipment such as that illustrated in Snaper Pat. 3,- 488,106, issued Jan. 6, 1970; and planar random access ferroelectrie computer memories such as that illustrated in Snaper et al. Pat. 3,675,220, issued July 4, 1972. These are only some of the many possible uses for the material.
- FIG. 1 is a cross-section view showing equipment for carrying out an RF. sputtering deposition according to this invention
- FIG. 2 is an elevation view in cross-section showing a target holder which may be used in the arrangement of FIG. 1;
- FIG. 3 is a front view of a portion of the head of the target holder of FIG. 1;
- FIG, 4 is a side view of the portion shown in FIG. 3;
- FIG. 5 is a top view of the portion shown in FIGS. 3 and 4;
- FIG. 6 is a side view of another portion of the head of the target holder of FIG. 1;
- FIG. 7 is a bottom view of the portion shown in FIG. 6.
- FIG. 1 there is shown a vacuum bell jar I mounted with an O-ring seal In on a base member 2 provided with an opening 3 for connection to the inlet of a vacuum pump.
- the bell jar will ordinarily be circular in its top view, although it may be of a different shape.
- a bleed conduit 4 provided with a bleed valve 5 is adapted for connection to a source of gas which it may be desired to introduce into the evacuated bell jar.
- the base 2 is provided with a centrally located opening 6 to the wall in which there is attached an upstanding hollow tubular member 7 of an electrical conducting material extending upwardly into the bell jar.
- the upper end of this tubular member is provided with an annular head 8 having an outwardly and upwardly beveled surface 9 which is attached to a corresponding beveled surface 10 of a target holder 11 through an electrical insulating member 12 sealed to both the target holder and the head 8.
- the top surface of the target holder is flat and horizontal and preferably circular in its top view.
- the target holder has attached to its underside a stem 13 extending down through, and spaced from, the tubular member 7 to the exterior of the bell jar.
- the members 2, 7, 8, 11, and 13 are of electrical conducting material, ordinarily metal, and the material of the bell jar 1 is electrically insulating.
- a layer of ferroelectric target material 14 which will ordinarily be in the amorphous form.
- the bonding may be done by use of an electrically conductive bonding material such as 0 a silver conductive paste and the application of heat and
- an electrically conductive bonding material such as 0 a silver conductive paste and the application of heat and
- a substrate 17 ordinarily of an optically transparent electrically-insulating material which should ordinarily be compatible with transparent conductors and with opaque high dielectric materials.
- Typical substrate materials can be Pyrex glass or quartz or the like.
- the substrate Before a sputtering operation, the substrate should be made very clean, which can be done by cleaning ultrasonically and baking in a high temperature oven, or by reverse sputter etching. Then the substrate is mounted to a matrix mask 18, the configuration or position of which will determine the area or areas of the deposition on the substrate. Above the substrate, there are supported heating elements 18 ordinarily in the form of high-temperature quartz lamps which direct their heat down upon the top of the substrate.
- a source 20 of radio frequency voltage is applied over respective conductors 21 and 22 between the grounded elements 2, 15 and the electrode 13', which thus acts as an antenna radiating electromagnetic energy into the bell jar.
- a high vacuum pump is attached at the entrance 3 to the bell jar and vacuum pumped to a very high vacuum of about 10- to 10' torr while the heaters 19 are turned on to preheat the substrate 17 to a high temperature which, though not critical, should be between about 200 degrees and 600 degrees C.
- the vacuum pump is throttled to a partially closed condition by means of a valve 23 at a vacuum port 3 Opening and the inert gas, ordinarily argon, is bled into the chamber through tube 4 past valve 5.
- the amount of the inert gas such as argon, xenon, or neon or the like bled into the system is not critical, and may be between 1.0x 10 torr and 40x10 torr. Argon is preferred over xenon or neon for the inert gas, as argon is usually less costly.
- ferroelectric materials commonly contain oxygen in the binder, some more than others. If a ferroelectric material deficient in oxygen relative to others is being used for the sputtering, it is found desirable to bleed into the chamber an amount of oxygen sufiicient to make up the oxygen deficiency in the material.
- the radio frequency electrical energy from source 20 is turned on to apply it to the electrode 11, 13, the radiation from which thereby ionizes the argon (or other inert) gas.
- the negative cycle portions of the RP. energy cause positive ions, represented in FIG. 1 by circles 55 containing plus signs, to strike the target material, thus knocking olf particles in the form of atoms and molecules (probably mostly molecules) of the target material toward the under surface of the substrate. These particles striking the substrate through the mask 8 have enough energy to bond themselves into the substrate.
- the radio frequency energy must be of at least a high enough frequency to create the plasma and this minimum frequency is believed to be around 5 megacycles per second.
- a normal range would be about 5 to 25 megacycles per second, which is below the microwave range.
- a proper R.F. power level would be between about 1 and 10 watts per square centimeter surface of the target material.
- time of the sputtering operation will be dependent on the thickness of the recrystallized ferroelectric layer desired on the substrate, the longer the time, the greater the thickness.
- Substrate material quartz; target to substrate distance 1% inches; argon gas pressure 4X10 torr; oxygen gas pressure 1.0x 10' torr; quartz substrate temperature 400 centigrade using quartz heating lamps.
- the system was pumped onto a very high vacuum, and then the vacuum pump was throttled as the argon and oxygen were backfilled into the chamber to the foregoing pressure.
- the heating lamps were kept on, and holding the substrate temperature at 400 C.
- the RF. power of a frequency of 12.7 megacycles per second was applied to the target, igniting an RF. plasma.
- the radio frequency power was increased slowly to a power level of 7 watts per square cm. of target material surface area.
- the thickness of the deposit is about proportional to the time of the sputtering.
- the conductive stannic oxide constitutes an electrically conductive surface adjacent to the ferroelectric material to which an electrical lead or conductor may be brought in a suitable manner to apply voltage over the ferroelectric layer.
- Such a stannic oxide film may be formed over the entire ferroelectric layer or, if desired, only over part of it, as for example, in strips, according to the effects which are desired.
- the stannic oxide is not only electrically conductive, but is transparent and compatible with such substrate material as Pyrex glass and quartz and is compatible with ferroelectric material which is a ceramic type of dielectric.
- Stannic oxide is mentioned merely as an example of a compatible transparent conductor which may be used for the purpose.
- Thin metallic films and other materials may also be utilized.
- the ferroelectric deposit has been referred to herein as recrystallized ferroelectric material, which is the term usually applied to it even though the ferroelectric material constituting the target is amorphous and not crystalline.
- FIGS. 2 to 7 illustrate a fluid-cooled target holder which can be used as the target holder of FIG. 1.
- the stem 13 constituting the RF. elec trode is in the form of a hollow conduit 30, terminating at its upper end in a flanged collar 31 having attached to it a circular head 32 of greater diameter than that of tube 30.
- the target holder 11 comprises a plate 33, shown in detail in FIGS. 3, 4 and 5, and an upper plate 34 shown in detail in FIGS. 6 and 7.
- FIG. 6 is a front elevation view and FIG. 7 is a bottom view, of the upper plate 34, from which it is seen that the plate is flat and circular with upper and lower surfaces which are horizontal and with a side peripheral surface which is beveled inwardly in a downward direction from the top.
- the lower surface is flat and horizontal excepting for an arrangement of connected generally circular grooves 35 machined into the plate from the bottom as shown in FIG. 7.
- This groove arrangement comprises a central recess 35a located at the central axis of the plate, around which are recesses arranged in generally concentric circles.
- the central recess 35a communi cates through an opening 36 into the end of the innermost concentric circle 35b, the end of which communicates through an opening 37 into the next concentric circle 350, the end of which in turn communicates through passageway 38 into the outermost concentric circle 35d.
- the end of the outermost concentric circle connects with a circular recess 39.
- the lower plate 33 of the target holder 11, illustrated in detail in FIGS. 3, 4, and 5 is a flat circular plate of about the same thickness as plate 34, having horizontal upper and lower surfaces with a perpheral surface beveled at the same angle as plate 34.
- the diameter of the upper surface of plate 33 coincides with the diameter of the lower surface of plate 34.
- Plate 33 has formed through it at its central axis, an opening 40 of somewhat smaller diameter than recess 35a of plate 34, and adapted to register with recess 35a.
- plate 33 has machined into it a concentric circular recess 41 shown dotted in FIG. 3, and also in FIG. 5, the top view of the plate. From one side of recess 41, there is formed a channel 42 communicating from the recess 41 to a circular opening 43 extending from the top of the plate to meet the end of channel 42. Plates 33 and 34 are fastened together as by welding around the beveled periphery.
- the electrode 13 is assembled to target holder 11 by use of a hollow pipe or conduit 44 extending through and spaced from the inner wall of tube 30.
- the upper end of pipe 44 is provided with outside threads 45 which threads into corresponding internalthreads 46 in opening 40 of plate 33, and also to threads 47 at opening 48 of head 32.
- the head 32 of the electrode will be threaded onto the threads 45 of pipe 44 until the end of the threading is reached to secure the head 32 firmly on the pipe. This will leave a substantial part of the pipe threading protruding above head 32, so that the threads 46 of plate 33 of target holder 11 can then be threaded until the plate 33 assumes a position firmly against the top of head 32.
- the concentric recess 41 of plate 33 aligns with the vertically extending bores 49 of head 32 which communicate with the annular passage 50 between pipe 44 and tubular electrode 30.
- the passage 50 within pipe 44 is in communication with recess 35a of the upper plate 34.
- the head 32 is provided with concentric recesses 52 and 53 containing resilient O-rings to act as seals.
- Fluid ordinarily a liquid, preferably water, can be circulated through the target holder in the direction of arrows 54, by a suitable pump or pressure means.
- fluid is forced upwardly through conduit 44 into recess 35a from which it passes through the concentric recesses 35b, 35c and 350! to channel 42 and downward through the concentric passage 50.
- Method of depositing recrystallized ferroelectric material which comprises applying radio frequency power to a target comprising ferroelectric material in proximity to a substrate heated to a temperature between 200 C. and 600 C. within an enclosure substantially evacuated, but containing some inert ionizable gas, said voltage being of a frequency and intensity sufficient to create a plasma comprising ions derived from the gas, causing at least some of said ions to strike the ferroelectric material with such force as to sputter particles of it to the substrate, with sufficient velocity to bond it to the substrate in crystalline form.
- inert gas is selected from the group consisting of argon, xenon, neon, and krypton, and mixtures thereof.
- ferroelectric material is selected from the group consisting of gadolinium titanate, gadolinium molybdate, gadolinium niobate, barium titanate and bismuth titanate.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
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Abstract
Description
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00289480A US3838031A (en) | 1972-09-15 | 1972-09-15 | Means and method for depositing recrystallized ferroelectric material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00289480A US3838031A (en) | 1972-09-15 | 1972-09-15 | Means and method for depositing recrystallized ferroelectric material |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US3838031A true US3838031A (en) | 1974-09-24 |
Family
ID=23111723
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US00289480A Expired - Lifetime US3838031A (en) | 1972-09-15 | 1972-09-15 | Means and method for depositing recrystallized ferroelectric material |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | US3838031A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3945911A (en) * | 1974-08-28 | 1976-03-23 | Shatterproof Glass Corporation | Cathodes for sputter-coating glass sheets or other substrates |
| US4313783A (en) * | 1980-05-19 | 1982-02-02 | Branson International Plasma Corporation | Computer controlled system for processing semiconductor wafers |
| US4376025A (en) * | 1982-06-14 | 1983-03-08 | Battelle Development Corporation | Cylindrical cathode for magnetically-enhanced sputtering |
| US4405436A (en) * | 1982-06-16 | 1983-09-20 | Anelva Corporation | Sputtering apparatus |
| US4668373A (en) * | 1984-07-20 | 1987-05-26 | Balzers Ag | Target plate for cathode sputtering |
| US4747927A (en) * | 1985-07-10 | 1988-05-31 | Balzers Aktiengesellschaft | Target plate for cathode disintegration |
| US4782235A (en) * | 1983-08-12 | 1988-11-01 | Centre National De La Recherche Scientifique | Source of ions with at least two ionization chambers, in particular for forming chemically reactive ion beams |
| US5298137A (en) * | 1991-04-19 | 1994-03-29 | Surface Solutions, Inc. | Method and apparatus for linear magnetron sputtering |
| US20040056070A1 (en) * | 2000-09-11 | 2004-03-25 | Ivanov Eugene Y | Method of manufacturing sputter targets with internal cooling channels |
| US20060260936A1 (en) * | 2005-05-02 | 2006-11-23 | Hort Werner H | Target assemblies, targets, backing plates, and methods of target cooling |
-
1972
- 1972-09-15 US US00289480A patent/US3838031A/en not_active Expired - Lifetime
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3945911A (en) * | 1974-08-28 | 1976-03-23 | Shatterproof Glass Corporation | Cathodes for sputter-coating glass sheets or other substrates |
| US4313783A (en) * | 1980-05-19 | 1982-02-02 | Branson International Plasma Corporation | Computer controlled system for processing semiconductor wafers |
| US4376025A (en) * | 1982-06-14 | 1983-03-08 | Battelle Development Corporation | Cylindrical cathode for magnetically-enhanced sputtering |
| US4405436A (en) * | 1982-06-16 | 1983-09-20 | Anelva Corporation | Sputtering apparatus |
| US4782235A (en) * | 1983-08-12 | 1988-11-01 | Centre National De La Recherche Scientifique | Source of ions with at least two ionization chambers, in particular for forming chemically reactive ion beams |
| US4668373A (en) * | 1984-07-20 | 1987-05-26 | Balzers Ag | Target plate for cathode sputtering |
| US4747927A (en) * | 1985-07-10 | 1988-05-31 | Balzers Aktiengesellschaft | Target plate for cathode disintegration |
| US5298137A (en) * | 1991-04-19 | 1994-03-29 | Surface Solutions, Inc. | Method and apparatus for linear magnetron sputtering |
| US20040056070A1 (en) * | 2000-09-11 | 2004-03-25 | Ivanov Eugene Y | Method of manufacturing sputter targets with internal cooling channels |
| US6840427B2 (en) | 2000-09-11 | 2005-01-11 | Tosoh Smd, Inc. | Method of manufacturing sputter targets with internal cooling channels |
| US20050092604A1 (en) * | 2000-09-11 | 2005-05-05 | Tosoh Smd, Inc. | Method of manufacturing sputter targets with internal cooling channels |
| US6955852B2 (en) | 2000-09-11 | 2005-10-18 | Tosoh Smd, Inc. | Method of manufacturing sputter targets with internal cooling channels |
| US20060260936A1 (en) * | 2005-05-02 | 2006-11-23 | Hort Werner H | Target assemblies, targets, backing plates, and methods of target cooling |
| US7691240B2 (en) * | 2005-05-02 | 2010-04-06 | Honeywell International Inc. | Target assemblies, targets, backing plates, and methods of target cooling |
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