US20170310327A1 - Device and method for recovering clock and data - Google Patents
Device and method for recovering clock and data Download PDFInfo
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- US20170310327A1 US20170310327A1 US15/264,574 US201615264574A US2017310327A1 US 20170310327 A1 US20170310327 A1 US 20170310327A1 US 201615264574 A US201615264574 A US 201615264574A US 2017310327 A1 US2017310327 A1 US 2017310327A1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L7/00—Arrangements for synchronising receiver with transmitter
- H04L7/02—Speed or phase control by the received code signals, the signals containing no special synchronisation information
- H04L7/033—Speed or phase control by the received code signals, the signals containing no special synchronisation information using the transitions of the received signal to control the phase of the synchronising-signal-generating means, e.g. using a phase-locked loop
- H04L7/0332—Speed or phase control by the received code signals, the signals containing no special synchronisation information using the transitions of the received signal to control the phase of the synchronising-signal-generating means, e.g. using a phase-locked loop with an integrator-detector
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/0807—Details of the phase-locked loop concerning mainly a recovery circuit for the reference signal
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/20—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits characterised by logic function, e.g. AND, OR, NOR, NOT circuits
- H03K19/21—EXCLUSIVE-OR circuits, i.e. giving output if input signal exists at only one input; COINCIDENCE circuits, i.e. giving output only if all input signals are identical
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K21/00—Details of pulse counters or frequency dividers
- H03K21/38—Starting, stopping or resetting the counter
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/091—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal the phase or frequency detector using a sampling device
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/093—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using special filtering or amplification characteristics in the loop
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L7/00—Arrangements for synchronising receiver with transmitter
- H04L7/02—Speed or phase control by the received code signals, the signals containing no special synchronisation information
- H04L7/033—Speed or phase control by the received code signals, the signals containing no special synchronisation information using the transitions of the received signal to control the phase of the synchronising-signal-generating means, e.g. using a phase-locked loop
- H04L7/0331—Speed or phase control by the received code signals, the signals containing no special synchronisation information using the transitions of the received signal to control the phase of the synchronising-signal-generating means, e.g. using a phase-locked loop with a digital phase-locked loop [PLL] processing binary samples, e.g. add/subtract logic for correction of receiver clock
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L7/00—Arrangements for synchronising receiver with transmitter
- H04L7/02—Speed or phase control by the received code signals, the signals containing no special synchronisation information
- H04L7/033—Speed or phase control by the received code signals, the signals containing no special synchronisation information using the transitions of the received signal to control the phase of the synchronising-signal-generating means, e.g. using a phase-locked loop
- H04L7/0337—Selecting between two or more discretely delayed clocks or selecting between two or more discretely delayed received code signals
- H04L7/0338—Selecting between two or more discretely delayed clocks or selecting between two or more discretely delayed received code signals the correction of the phase error being performed by a feed forward loop
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L7/00—Arrangements for synchronising receiver with transmitter
- H04L7/0054—Detection of the synchronisation error by features other than the received signal transition
- H04L7/0062—Detection of the synchronisation error by features other than the received signal transition detection of error based on data decision error, e.g. Mueller type detection
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L7/00—Arrangements for synchronising receiver with transmitter
- H04L7/02—Speed or phase control by the received code signals, the signals containing no special synchronisation information
- H04L7/033—Speed or phase control by the received code signals, the signals containing no special synchronisation information using the transitions of the received signal to control the phase of the synchronising-signal-generating means, e.g. using a phase-locked loop
Definitions
- the present application relates to an integrated circuit. More particularly, the present application relates to a clock and data recovery device and a method thereof.
- CDR clock and data recovery
- the CDR device which employs a phase-picking circuit architecture, is implemented with feed-forward circuits.
- the CDR device which employs the phase-picking circuit architecture, cannot instantly reduce the frequency offset. As a result, an error occurs in the read data.
- the CDR device includes a data sampling module, a phase detection circuit, a frequency estimator, a clock generation module, and a data recovery module.
- the data sampling module is configured to sample input data according to first clock signals to generate data values, in which phases of the first clock signals are different from one another.
- the phase detection circuit is configured to detect a phase error of the input data according to at least one second clock signal, to generate an error signal.
- the frequency estimator is configured to generate an adjustment signal according to the error signal, a phase threshold value, and a frequency threshold value.
- the clock generation module is configured to generate the first clock signals and the at least one second clock signal according to the adjustment signal and a reference clock signal.
- the data recovery module is configured to generate recovered data corresponding to the input data according to the data values.
- the CDR method includes following operations: sampling, according to first clock signals, input data to generate a data values, in which phases of the first clock signals are different from one another; detecting, according to at least one second clock signal, an phase error of the input data, to generate an error signal; generating an adjustment signal according to the error signal, a phase threshold value, and a frequency threshold value; generating the first clock signals and the at least one second clock signal according to the adjustment signal and a reference clock signal; and generating, according to the data values, recovered data corresponding to the input data.
- the CDR device and the CDR method thereof which are provided in the present disclosure, are able to reduce the frequency offset on the input data, to improve the accuracy of the recovered data.
- FIG. 1A is a schematic diagram of a clock and data recovery (CDR) device, according to some embodiments of the present disclosure
- FIG. 1B is a schematic diagram illustrating the sampling operation of the CDR device in FIG. 1A and sampling operation of some approaches, according to some embodiments of the present disclosure
- FIG. 2 is a circuit diagram of the frequency estimator in FIG. 1A , according to some embodiments of the present disclosure
- FIG. 3 is a schematic diagram illustrating operations of the edge detection circuit in FIG. 1A according to some embodiments of the present disclosure.
- FIG. 4 is a flow chart of a CDR method according to some embodiments of the present disclosure.
- Coupled may also be termed as “electrically coupled,” and the term “connected” may be termed as “electrically connected.” “Coupled” and “connected” may also be used to indicate that two or more elements cooperate or interact with each other.
- FIG. 1A is a schematic diagram of a clock and data recovery (CDR) device 100 , according to some embodiments of the present disclosure.
- the CDR device 100 includes a data sampling module 110 , a phase detection circuit 120 , a frequency estimator 130 , a clock generation module 140 , and a data recovery module 150 .
- the data sampling module 110 is configured to receive input data Din, and to sample the input data Din according to clock signals CLK 1 to generate data values D 1 .
- the data sampling module 110 includes data samplers 112 .
- the data samplers 122 are configured to receive the input data Din, and are coupled to the clock generation module 140 to receive the clock signals CLK 1 , in which phases of the clock signals CLK 1 are different from one another. With such arrangements, the data samplers 112 are able to sample, according to the different clock signals CLK 1 , the input data Din at different times, to generate the data values D 1 .
- the data sampler 112 is implemented with an amplifier and a switching capacitor circuit, but the present disclosure is not limited in this regard.
- the phase detection circuit 120 is configured to receive the input data Din, and to detect a phase error of the input data Din according to at least one clock signal CLK 2 , to generate an error signal VE.
- the phase detection circuit 120 may include two data samplers (not shown) and a phase detector (not shown).
- the two data samplers sample the input data Din according to two clock signals CLK 2 , and output two sampled data values (not shown) to the phase detector. Accordingly, the phase detector is able to compare the two sampled data values to generate the error signal VE.
- a phase difference of about 90 degrees is present between the two clock signals CLK 2 , and the two sampled data values is an in-phase data value and a quadrature value.
- the phase detector is a bang-bang phase detector.
- phase detection circuit 120 includes a Hogge phase detector.
- phase detection circuit 120 includes a Muller-Muller phase detector.
- the frequency estimator 130 is coupled to the phase detection circuit 120 to receive the error signal VE.
- the frequency estimator 130 is configured to generate an adjustment signal UP/DOWN to the clock generation module 140 , according to the error signal VE, a phase threshold value (e.g., value MP in FIG. 2 below), and a frequency threshold value (e.g., value MF in FIG. 2 below).
- the clock generation module 140 is coupled to the frequency estimator 130 to receive the adjustment signal UP/DOWN.
- the clock generation module 140 is configured to generate the clock signals CLK 1 and the at least one clock signal CLK 2 according to the adjustment signal UP/DOWN and a reference clock signal CLKREF.
- the clock generation module 140 includes a phase interpolator 142 and a multi-phase clock generator 144 .
- the phase interpolator 142 is coupled to the frequency estimator 130 to receive the adjustment signal UP/DOWN, and generates a corresponding local clock signal CLKL according to the adjustment signal UP/DOWN and the reference clock signal CLKREF. For example, assuming that the current local clock signal CLKL has a first phase. When the status of the adjustment signal UP/DOWN is UP, the phase interpolator 142 generates the local clock signal CLKL having a second phase, in which the second phase leads to the first phase. Alternatively, when the status of the adjustment signal UP/DOWN is DOWN, the phase interpolator 142 generates the local dock signal CLKL having a third phase, in which the third phase lags behind the first phase.
- the multi-phase clock generator 144 is coupled to the phase interpolator 142 to receive the local clock signal CLKL.
- the multi-phase clock generator 144 is coupled to the data sampling module 110 to transmit the clock signals CLK 1 .
- the multi-phase clock generator 144 is coupled to the phase detection circuit 120 to transmit the at least one clock signal CLK 2 .
- the multi-phase clock generator 144 is configured to generate the clock signals CLK 1 and the at least one clock signal CLK 2 according to the local clock signal CLKL.
- the arrangement of the clock generation module 140 is given for illustrative purposes only, and the present disclosure is not limited in this regard. Various types of the clock generation module 140 are within the contemplated scope of the present disclosure.
- the data recovery module 150 is coupled to the data sampling module 110 , to receive the data values D 1 .
- the data recovery module 150 is configured to select corresponding data value according to the data values D 1 , to generate recovered data Dout corresponding to the input data Din.
- the data recovery module 150 includes a data storage circuit 152 , an edge detection circuit 154 , and a data selection circuit 156 .
- the data storage circuit 152 is coupled to the data samplers 112 to receive and store the data values D 1 .
- the data storage circuit 152 is a shift register.
- the data storage circuit 152 is able to synchronize, according to the local clock signal CLKL, the data values D 1 , and to store the synchronized data values D 1 .
- the arrangement of the data storage circuit 152 is given for illustrative purposes only, and the present disclosure is not limited in this regard. Various types of the data storage circuit 152 are within the contemplated scope of the present disclosure.
- the edge detection circuit 154 is able to be implemented with a digital circuit, which is able to perform various decision algorithms.
- the edge detection circuit 154 is coupled to the data storage circuit 152 , to read the data values D 1 from the data storage circuit 152 .
- the edge detection circuit 154 determines at least one transition point, which includes, for example, a falling edge where a value of logic 1 is switched to a value of logic 0, or a rising edge where the value of logic 0 is switched to the value of logic 1, of the input data Din, to generate a selection signal SE.
- the data recovery module 150 is able to determine a relation between the data values D 1 and boundary data values and a central data value in bit intervals of the input data Din. For ease of understanding, the detail operations are described with FIG. 3 .
- the data selection circuit 156 is coupled to the edge detection circuit 154 to receive the selection signal SE, and is coupled to the data storage circuit 152 to read the data values D 1 .
- the data selection circuit 156 is configured to select, according to the selection signal SE, at least corresponding one data value from the data values D 1 .
- the data selection circuit 156 includes a Tally circuit (not shown), an address generation circuit (not shown), and a multiplexer (not shown).
- the selection signal SE is multi-bits data that is able to indicate the location of the transition points.
- the Tally circuit is able to generate a control signal according to the multi-bits data of the selection signal SE, and the address generation circuit then outputs a corresponding address signal according to the control signal.
- the multiplexers are able to select a corresponding one from the data values D 1 in the data storage circuit 152 , and to output the same as the recovered data Dout.
- the arrangements of the data selection circuit 156 are given for illustrative purposes only, and the present disclosure is not limited in this regard. Various arrangements of the data selection circuit 156 are within the contemplated scope of the present disclosure.
- FIG. 1B is a schematic diagram illustrating the sampling operation of the CDR device 100 in FIG. 1A and sampling operation of some approaches, according to some embodiments of the present disclosure.
- a CDR device which employs a phase-picking architecture, is implemented with a feed forward circuit. If a frequency offset was present in the clock signals between the transmitting terminal and the receiving terminal, data errors may occur in recovered data generated by the CDR device of such approaches. For illustration, as shown in FIG. 18B , when the frequency offset occurs, as the approaches discussed above only employ the feed forward circuit, the sampling time TS 1 would vary gradually, and thus data errors will occur in the sampled data values.
- the phase detection circuit 120 , the frequency estimator 130 , and the clock generation module 140 are arranged as a feedback control mechanism.
- the clock generation module 140 adjusts the local clock signal CLKL correspondingly, to reduce an impact from the frequency offset.
- the accuracy of the recovered data Dout is improved.
- the sampling time TS 2 of the data sampling module 110 can be stabled at a fixed timing, such that the sampled data value is able to be correct.
- FIG. 2 is a circuit diagram of the frequency estimator 130 in FIG. 1A , according to some embodiments of the present disclosure. For ease of understanding, like elements in FIG. 2 are designated with the same reference numbers in FIG. 1A .
- the frequency estimator 130 includes a sigma delta modulator 231 , a sigma delta modulator 232 , an integrator 233 , a counter 234 , and an adder 235 .
- the sigma delta modulator 231 is coupled to the phase detection circuit 120 in FIG. 1A , to receive the error signal VE.
- the sigma delta modulator 231 is configured to accumulate the error signal VE to generate a phase accumulated value AP, and to compare the phase accumulated value AP with the phase threshold value MP. When the phase accumulated value AP is greater than the phase threshold value MP, the sigma delta modulator 231 outputs a control signal VCP.
- the sigma delta modulator 232 is coupled to the phase detection circuit 120 in FIG. 1A , to receive the error signal VE.
- the sigma delta modulator 232 is configured to accumulate the error signal VE to generate a frequency accumulated value AF, and to compare the frequency accumulated value AF with the frequency threshold value MF. When the frequency accumulated value AF is greater than the frequency threshold value MF, the sigma delta modulator 232 outputs a control signal VCF.
- the phase threshold value MP and the frequency threshold value MF are predetermined values. In some other embodiments, the phase threshold value MP and the frequency threshold value MF are able to be pre-stored in the frequency estimator 130 , and to be dynamically adjusted by external programs or circuits.
- the integrator 233 is coupled to the sigma delta modulator 232 to receive the control signal VCF.
- the integrator 233 is configured to accumulate the control signal VCF to generate an integral signal VI.
- the counter 234 is coupled to the integrator 233 to receive the integral signal VI.
- the counter 234 is configured to generate a control signal VCT according to the integral signal VI.
- the adder 235 is coupled to the sigma delta modulator 231 and the counter 234 to receive the control signals VCP and VCT, and sums up the control signal VCP and the control signal VCT to generate the adjustment signal UP/DOWN.
- control signal VCP, the control signal VCF, the integral signal VI, and the control signal VCT are digital signals having multiple bits.
- the sigma delta modulator 232 switches the bit values of the control signal VCF, such that the counter 234 starts counting. Accordingly, the counter 234 generates different control signals VCT to the adder 235 .
- the sigma delta modulator 231 switches the bit values of the control signal VCP, such that the adder 235 generates different adjustment signals UP/DOWN.
- the arrangement of the frequency estimator 130 is given for illustrative purposes only, and the present disclosure is not limited in this regard. Various types of the frequency estimator 130 are also within the contemplated scope of the present disclosure.
- FIG. 3 is a schematic diagram illustrating operations of the edge detection circuit 154 in FIG. 1A according to some embodiments of the present disclosure.
- the data sampling module 110 utilizes three clock signals CLK 1 to sample the bit intervals of the input data Din, in which the phases of the three clock signals CLK 1 are P 1 , P 2 , and P 3 , respectively.
- the six sampled data values D 1 which are sequentially sampled by the data samplers 112 according to the three clock signals CLK 1 , are “0”, “1”, “1”, “1”, “0”, and “0.”
- the edge detection circuit 154 can perform an exclusive OR (XOR) operation according to two adjacent data values D 1 , to detect at least one transition point of the input data Din.
- the edge detection circuit 154 includes XOR gates.
- a first XOR gate outputs a signal having a value of logic 1 according to a first data value D 1 (“0”) and a second data value D 1 (“1”).
- a second XOR gate outputs a signal having a value of logic 0 according to the second data value D 1 (“1”) and a third data value D 1 (“1”). Based on the signal, which is outputted from the first XOR gate, having the value of logic 1, it is able to determine that a transition point of the input data Din is present between the two corresponding sampling times (i.e., the clock signal CLK 1 having the phase P 1 and the clock signal CLK 1 having the phase P 2 ).
- the edge detection circuit 154 determines that the data values D 1 , which are sampled according the clock signal CLK 1 having the phase P 1 or P 2 , is a rising edge or a falling edge of the input data Din, and that the data values D 1 , which are sampled according the clock signal CLK 1 having the phase P 3 , is a central data value of the input data Din.
- the edge detection circuit 154 outputs a corresponding selection signal SE, to make the data selection circuit 156 select at least one, which corresponds to the central data values of the input data Din, of the data values D 1 .
- the aforementioned operations of determining the transition points of the input data Din according to the number of the transition points are referred to as a center-picking algorithm.
- the aforementioned operations of determining the number of the transition points of the input data Din are performed by the Tally circuit.
- the edge detection circuit 154 is also able to be implemented with digital circuits that perform a majority-voting algorithm. For illustration, as shown in FIG. 3 , the first three data values, which are sequentially sampled by the data sampler 112 according to the three clock signals CLK 1 , are “0”, “1,” and “1.” As the number of the data values D 1 having the value of logic 1 is greater, the edge detection circuit 154 determines that the value of logic 1 is the central data value of the input data Din, and then determines that the data values D 1 , which are sampled according to the clock signal CLK 1 having the phase P 1 , are rising or falling edges of the input data Din.
- edge detection circuit 154 The arrangements of the edge detection circuit 154 are given for illustrative purposes only, and the present disclosure is not limited in this regard. Various decision algorithms, which are able to be employed by the edge detection circuit 154 , are also within the contemplated scope of the present disclosure.
- FIG. 4 is a flow chart of a CDR method 400 according to some embodiments of the present disclosure. For ease of understanding, reference is now made to both of FIG. 1A and FIG. 4 , and operations of the CDR device 100 are described with the CDR method 400 .
- the data sampling module 110 samples the input data Din to generate data values D 1 according to the clock signals CLK 1 .
- the data samplers 112 sample the input data Din according to the clock signals CLK 1 having different phases, to continuously generate the data values D 1 .
- the phase detection circuit 120 detects a phase error present in the input data Din according to at least one second clock signal CLK 2 to generate the error signal VE.
- the phase detection circuit 120 can employ various types of the phase detectors to analyze the input data Din, to generate the error signal VE according to the phase error of the input data Din.
- the frequency estimator 130 In operation S 430 , the frequency estimator 130 generates the adjustment signal UP/DOWN according to the error signal VE, the phase threshold value MP, and the frequency threshold value MF. For illustration, as shown in FIG. 2 , the frequency estimator 130 can compare the error signal VE with the phase threshold value MP, and compare the error signal VE with the frequency threshold value MF, so as to generate the corresponding adjustment signal UP/DOWN.
- the clock generation module 140 In operation S 440 , the clock generation module 140 generates the dock signals CLK 1 and the at least one clock signal CLK 2 according to the adjustment signal UP/DOWN and the reference clock signal CLKREF. As described above, the phase detection circuit 120 , the frequency estimator 130 , and the clock generation module 140 are arranged as a feedback control mechanism. Effectively, with such feedback control mechanism, the clock generation module 140 is able to dynamically adjust the clock signals CLK 1 and the at least one clock signal CLK 2 according to the adjustment signal UP/DOWN.
- the data recovery module 150 generates the recovered data Dout corresponding to the input data Din according to the data values D 1 .
- the edge detection circuit 154 is able to analyze the transition points of the input data Din by performing various decision algorithms, to determine which one of the data values is the central data value of the input data Din. Accordingly, the data selection circuit 156 can select at least one data value, which corresponds to the central data value of the input data Din, from the data values D 1 , to generate the recovered data Dout.
- CDR method 400 includes exemplary operations, but the operations are not necessarily performed in the order shown. Operations may be added, replaced, changed order, and/or eliminated as appropriate, in accordance with the spirit and scope of various embodiments of the present disclosure.
- the CDR device 100 and the CDR method 400 thereof which are provided in the present disclosure, are able to reduce the frequency offset on the input data, to improve the accuracy of the recovered data.
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Abstract
Description
- This application claims priority to China Application Serial Number 201610260484.2 filed Apr. 25, 2016, which is herein incorporated by reference.
- The present application relates to an integrated circuit. More particularly, the present application relates to a clock and data recovery device and a method thereof.
- With the rapid development of process technologies, the operational speed of integrated circuits is significantly improved. In a high-speed communication system, a clock and data recovery (CDR) device is usually utilized to assure that the received input data can be read properly.
- In current approaches, the CDR device, which employs a phase-picking circuit architecture, is implemented with feed-forward circuits. When a frequency offset is present between clock signals of the transmitting terminal and clock signals of the receiving terminal, the CDR device, which employs the phase-picking circuit architecture, cannot instantly reduce the frequency offset. As a result, an error occurs in the read data.
- Some aspects of the present disclosure provide a clock and data recovery (CDR) device. The CDR device includes a data sampling module, a phase detection circuit, a frequency estimator, a clock generation module, and a data recovery module. The data sampling module is configured to sample input data according to first clock signals to generate data values, in which phases of the first clock signals are different from one another. The phase detection circuit is configured to detect a phase error of the input data according to at least one second clock signal, to generate an error signal. The frequency estimator is configured to generate an adjustment signal according to the error signal, a phase threshold value, and a frequency threshold value. The clock generation module is configured to generate the first clock signals and the at least one second clock signal according to the adjustment signal and a reference clock signal. The data recovery module is configured to generate recovered data corresponding to the input data according to the data values.
- Some aspects of the present disclosure provide a CDR method. The CDR method includes following operations: sampling, according to first clock signals, input data to generate a data values, in which phases of the first clock signals are different from one another; detecting, according to at least one second clock signal, an phase error of the input data, to generate an error signal; generating an adjustment signal according to the error signal, a phase threshold value, and a frequency threshold value; generating the first clock signals and the at least one second clock signal according to the adjustment signal and a reference clock signal; and generating, according to the data values, recovered data corresponding to the input data.
- As described above, the CDR device and the CDR method thereof, which are provided in the present disclosure, are able to reduce the frequency offset on the input data, to improve the accuracy of the recovered data.
- This disclosure can be more fully understood by reading the following detailed description of the embodiment, with reference made to the accompanying drawings as follows:
-
FIG. 1A is a schematic diagram of a clock and data recovery (CDR) device, according to some embodiments of the present disclosure; -
FIG. 1B is a schematic diagram illustrating the sampling operation of the CDR device inFIG. 1A and sampling operation of some approaches, according to some embodiments of the present disclosure; -
FIG. 2 is a circuit diagram of the frequency estimator inFIG. 1A , according to some embodiments of the present disclosure; -
FIG. 3 is a schematic diagram illustrating operations of the edge detection circuit inFIG. 1A according to some embodiments of the present disclosure; and -
FIG. 4 is a flow chart of a CDR method according to some embodiments of the present disclosure. - Reference will now be made in details to the present embodiments of the disclosure, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers are used in the drawings and the description to refer to the same or like parts.
- Although the terms “first,” “second,” etc., may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used to distinguish one element from another.
- In this document, the term “coupled” may also be termed as “electrically coupled,” and the term “connected” may be termed as “electrically connected.” “Coupled” and “connected” may also be used to indicate that two or more elements cooperate or interact with each other.
- Reference is now made to
FIG. 1A .FIG. 1A is a schematic diagram of a clock and data recovery (CDR)device 100, according to some embodiments of the present disclosure. For illustration, theCDR device 100 includes adata sampling module 110, aphase detection circuit 120, afrequency estimator 130, aclock generation module 140, and adata recovery module 150. - The
data sampling module 110 is configured to receive input data Din, and to sample the input data Din according to clock signals CLK1 to generate data values D1. In some embodiments, thedata sampling module 110 includesdata samplers 112. The data samplers 122 are configured to receive the input data Din, and are coupled to theclock generation module 140 to receive the clock signals CLK1, in which phases of the clock signals CLK1 are different from one another. With such arrangements, thedata samplers 112 are able to sample, according to the different clock signals CLK1, the input data Din at different times, to generate the data values D1. In some embodiments, thedata sampler 112 is implemented with an amplifier and a switching capacitor circuit, but the present disclosure is not limited in this regard. - The
phase detection circuit 120 is configured to receive the input data Din, and to detect a phase error of the input data Din according to at least one clock signal CLK2, to generate an error signal VE. In some embodiments, thephase detection circuit 120 may include two data samplers (not shown) and a phase detector (not shown). The two data samplers sample the input data Din according to two clock signals CLK2, and output two sampled data values (not shown) to the phase detector. Accordingly, the phase detector is able to compare the two sampled data values to generate the error signal VE. In some embodiments, a phase difference of about 90 degrees is present between the two clock signals CLK2, and the two sampled data values is an in-phase data value and a quadrature value. In some embodiments, the phase detector is a bang-bang phase detector. - The arrangement of the
phase detection circuit 120 is given for illustrative purposes only, and the present disclosure is not limited in this regard. Various types of thephase detection circuit 120 are within the contemplated scope of the present disclosure. For example, in some embodiments, thephase detection circuit 120 includes a Hogge phase detector. In some embodiments, thephase detection circuit 120 includes a Muller-Muller phase detector. - The
frequency estimator 130 is coupled to thephase detection circuit 120 to receive the error signal VE. Thefrequency estimator 130 is configured to generate an adjustment signal UP/DOWN to theclock generation module 140, according to the error signal VE, a phase threshold value (e.g., value MP inFIG. 2 below), and a frequency threshold value (e.g., value MF inFIG. 2 below). - The
clock generation module 140 is coupled to thefrequency estimator 130 to receive the adjustment signal UP/DOWN. Theclock generation module 140 is configured to generate the clock signals CLK1 and the at least one clock signal CLK2 according to the adjustment signal UP/DOWN and a reference clock signal CLKREF. - For illustration, in some embodiments, the
clock generation module 140 includes aphase interpolator 142 and amulti-phase clock generator 144. Thephase interpolator 142 is coupled to thefrequency estimator 130 to receive the adjustment signal UP/DOWN, and generates a corresponding local clock signal CLKL according to the adjustment signal UP/DOWN and the reference clock signal CLKREF. For example, assuming that the current local clock signal CLKL has a first phase. When the status of the adjustment signal UP/DOWN is UP, thephase interpolator 142 generates the local clock signal CLKL having a second phase, in which the second phase leads to the first phase. Alternatively, when the status of the adjustment signal UP/DOWN is DOWN, thephase interpolator 142 generates the local dock signal CLKL having a third phase, in which the third phase lags behind the first phase. - The
multi-phase clock generator 144 is coupled to thephase interpolator 142 to receive the local clock signal CLKL. Themulti-phase clock generator 144 is coupled to thedata sampling module 110 to transmit the clock signals CLK1. Themulti-phase clock generator 144 is coupled to thephase detection circuit 120 to transmit the at least one clock signal CLK2. Themulti-phase clock generator 144 is configured to generate the clock signals CLK1 and the at least one clock signal CLK2 according to the local clock signal CLKL. - The arrangement of the
clock generation module 140 is given for illustrative purposes only, and the present disclosure is not limited in this regard. Various types of theclock generation module 140 are within the contemplated scope of the present disclosure. - The
data recovery module 150 is coupled to thedata sampling module 110, to receive the data values D1. Thedata recovery module 150 is configured to select corresponding data value according to the data values D1, to generate recovered data Dout corresponding to the input data Din. - For illustration, in some embodiments, the
data recovery module 150 includes adata storage circuit 152, anedge detection circuit 154, and adata selection circuit 156. Thedata storage circuit 152 is coupled to thedata samplers 112 to receive and store the data values D1. In some embodiments, thedata storage circuit 152 is a shift register. In some other embodiments, as the data values D1 are obtained according to the clock signals CLK1 having different phases, thedata storage circuit 152 is able to synchronize, according to the local clock signal CLKL, the data values D1, and to store the synchronized data values D1. The arrangement of thedata storage circuit 152 is given for illustrative purposes only, and the present disclosure is not limited in this regard. Various types of thedata storage circuit 152 are within the contemplated scope of the present disclosure. - In various embodiments, the
edge detection circuit 154 is able to be implemented with a digital circuit, which is able to perform various decision algorithms. Theedge detection circuit 154 is coupled to thedata storage circuit 152, to read the data values D1 from thedata storage circuit 152. Theedge detection circuit 154 determines at least one transition point, which includes, for example, a falling edge where a value oflogic 1 is switched to a value oflogic 0, or a rising edge where the value oflogic 0 is switched to the value oflogic 1, of the input data Din, to generate a selection signal SE. Accordingly, thedata recovery module 150 is able to determine a relation between the data values D1 and boundary data values and a central data value in bit intervals of the input data Din. For ease of understanding, the detail operations are described withFIG. 3 . - The
data selection circuit 156 is coupled to theedge detection circuit 154 to receive the selection signal SE, and is coupled to thedata storage circuit 152 to read the data values D1. Thedata selection circuit 156 is configured to select, according to the selection signal SE, at least corresponding one data value from the data values D1. For example, thedata selection circuit 156 includes a Tally circuit (not shown), an address generation circuit (not shown), and a multiplexer (not shown). In this example, the selection signal SE is multi-bits data that is able to indicate the location of the transition points. The Tally circuit is able to generate a control signal according to the multi-bits data of the selection signal SE, and the address generation circuit then outputs a corresponding address signal according to the control signal. As a result, the multiplexers are able to select a corresponding one from the data values D1 in thedata storage circuit 152, and to output the same as the recovered data Dout. - The arrangements of the
data selection circuit 156 are given for illustrative purposes only, and the present disclosure is not limited in this regard. Various arrangements of thedata selection circuit 156 are within the contemplated scope of the present disclosure. - Reference is now made to
FIG. 1B .FIG. 1B is a schematic diagram illustrating the sampling operation of theCDR device 100 inFIG. 1A and sampling operation of some approaches, according to some embodiments of the present disclosure. - In some approaches, a CDR device, which employs a phase-picking architecture, is implemented with a feed forward circuit. If a frequency offset was present in the clock signals between the transmitting terminal and the receiving terminal, data errors may occur in recovered data generated by the CDR device of such approaches. For illustration, as shown in
FIG. 18B , when the frequency offset occurs, as the approaches discussed above only employ the feed forward circuit, the sampling time TS1 would vary gradually, and thus data errors will occur in the sampled data values. - Compared with the approaches above, in the
CDR device 100, thephase detection circuit 120, thefrequency estimator 130, and theclock generation module 140 are arranged as a feedback control mechanism. With this feedback control mechanism, when a frequency offset is detected to be present in the input data Din, theclock generation module 140 adjusts the local clock signal CLKL correspondingly, to reduce an impact from the frequency offset. As a result, compared with the approaches above, the accuracy of the recovered data Dout is improved. For illustration, as shown inFIG. 1B , when the frequency offset occurs, with the operations of the feedback control mechanism, the sampling time TS2 of thedata sampling module 110 can be stabled at a fixed timing, such that the sampled data value is able to be correct. - Several embodiments will be provided in following paragraphs to describe the function and the application of the
CDR device 100, but the present disclosure is not limited thereto. - Reference is now made to
FIG. 2 .FIG. 2 is a circuit diagram of thefrequency estimator 130 inFIG. 1A , according to some embodiments of the present disclosure. For ease of understanding, like elements inFIG. 2 are designated with the same reference numbers inFIG. 1A . - In some embodiments, the
frequency estimator 130 includes asigma delta modulator 231, asigma delta modulator 232, anintegrator 233, acounter 234, and anadder 235. - The
sigma delta modulator 231 is coupled to thephase detection circuit 120 inFIG. 1A , to receive the error signal VE. Thesigma delta modulator 231 is configured to accumulate the error signal VE to generate a phase accumulated value AP, and to compare the phase accumulated value AP with the phase threshold value MP. When the phase accumulated value AP is greater than the phase threshold value MP, thesigma delta modulator 231 outputs a control signal VCP. - The
sigma delta modulator 232 is coupled to thephase detection circuit 120 inFIG. 1A , to receive the error signal VE. Thesigma delta modulator 232 is configured to accumulate the error signal VE to generate a frequency accumulated value AF, and to compare the frequency accumulated value AF with the frequency threshold value MF. When the frequency accumulated value AF is greater than the frequency threshold value MF, thesigma delta modulator 232 outputs a control signal VCF. - In some embodiments, the phase threshold value MP and the frequency threshold value MF are predetermined values. In some other embodiments, the phase threshold value MP and the frequency threshold value MF are able to be pre-stored in the
frequency estimator 130, and to be dynamically adjusted by external programs or circuits. - The
integrator 233 is coupled to the sigma delta modulator 232 to receive the control signal VCF. Theintegrator 233 is configured to accumulate the control signal VCF to generate an integral signal VI. Thecounter 234 is coupled to theintegrator 233 to receive the integral signal VI. Thecounter 234 is configured to generate a control signal VCT according to the integral signal VI. Theadder 235 is coupled to thesigma delta modulator 231 and thecounter 234 to receive the control signals VCP and VCT, and sums up the control signal VCP and the control signal VCT to generate the adjustment signal UP/DOWN. - In some embodiments, the control signal VCP, the control signal VCF, the integral signal VI, and the control signal VCT are digital signals having multiple bits. When the frequency accumulated value AF is greater than the frequency threshold value MF, the
sigma delta modulator 232 switches the bit values of the control signal VCF, such that thecounter 234 starts counting. Accordingly, thecounter 234 generates different control signals VCT to theadder 235. Alternatively, when the phase accumulated value AP is greater than the phase threshold value MP, thesigma delta modulator 231 switches the bit values of the control signal VCP, such that theadder 235 generates different adjustment signals UP/DOWN. With such arrangement, when a frequency offset occurs in the input data Din, theclock generation module 140 is able to adjust the local clock signal CLKL according to the adjustment signal UP/DOWN, to improve the accuracy of the recovered data Dout. - The arrangement of the
frequency estimator 130 is given for illustrative purposes only, and the present disclosure is not limited in this regard. Various types of thefrequency estimator 130 are also within the contemplated scope of the present disclosure. - Reference is now made to
FIG. 3 .FIG. 3 is a schematic diagram illustrating operations of theedge detection circuit 154 inFIG. 1A according to some embodiments of the present disclosure. For ease of understanding, like elements ofFIG. 3 are designated with the same reference numbers inFIG. 1A . For illustration, in this example, thedata sampling module 110 utilizes three clock signals CLK1 to sample the bit intervals of the input data Din, in which the phases of the three clock signals CLK1 are P1, P2, and P3, respectively. - For illustration, as shown in
FIG. 3 , the six sampled data values D1, which are sequentially sampled by thedata samplers 112 according to the three clock signals CLK1, are “0”, “1”, “1”, “1”, “0”, and “0.” In this example, theedge detection circuit 154 can perform an exclusive OR (XOR) operation according to two adjacent data values D1, to detect at least one transition point of the input data Din. For example, theedge detection circuit 154 includes XOR gates. A first XOR gate outputs a signal having a value oflogic 1 according to a first data value D1 (“0”) and a second data value D1 (“1”). A second XOR gate outputs a signal having a value oflogic 0 according to the second data value D1 (“1”) and a third data value D1 (“1”). Based on the signal, which is outputted from the first XOR gate, having the value oflogic 1, it is able to determine that a transition point of the input data Din is present between the two corresponding sampling times (i.e., the clock signal CLK1 having the phase P1 and the clock signal CLK1 having the phase P2). Based on the signal, which is outputted from the second XOR gate, having the value oflogic 0, it is able to determine that no transition point of the input data Din is present between the two corresponding sampling times (i.e., the clock signal CLK1 having the phase P2 and the clock signal CLK1 having the phase P3). With this analogy, it is able to analyze the transition points of the input data Din according to the signals outputted from the XOR gates. - For example, as shown in
FIG. 3 , a number of the transition points occurring at the corresponding sampling times (i.e. between the phases P1 and P2) is six, and the number of the transition points occurring at other sampling times (i.e. between the phases P2 and P3) is 0. Accordingly, theedge detection circuit 154 thus determines that the data values D1, which are sampled according the clock signal CLK1 having the phase P1 or P2, is a rising edge or a falling edge of the input data Din, and that the data values D1, which are sampled according the clock signal CLK1 having the phase P3, is a central data value of the input data Din. As a result, theedge detection circuit 154 outputs a corresponding selection signal SE, to make thedata selection circuit 156 select at least one, which corresponds to the central data values of the input data Din, of the data values D1. In some embodiments, the aforementioned operations of determining the transition points of the input data Din according to the number of the transition points are referred to as a center-picking algorithm. In some embodiments, the aforementioned operations of determining the number of the transition points of the input data Din are performed by the Tally circuit. - In some other embodiments, the
edge detection circuit 154 is also able to be implemented with digital circuits that perform a majority-voting algorithm. For illustration, as shown inFIG. 3 , the first three data values, which are sequentially sampled by thedata sampler 112 according to the three clock signals CLK1, are “0”, “1,” and “1.” As the number of the data values D1 having the value oflogic 1 is greater, theedge detection circuit 154 determines that the value oflogic 1 is the central data value of the input data Din, and then determines that the data values D1, which are sampled according to the clock signal CLK1 having the phase P1, are rising or falling edges of the input data Din. - The arrangements of the
edge detection circuit 154 are given for illustrative purposes only, and the present disclosure is not limited in this regard. Various decision algorithms, which are able to be employed by theedge detection circuit 154, are also within the contemplated scope of the present disclosure. -
FIG. 4 is a flow chart of aCDR method 400 according to some embodiments of the present disclosure. For ease of understanding, reference is now made to both ofFIG. 1A andFIG. 4 , and operations of theCDR device 100 are described with theCDR method 400. - In operation 8410, the
data sampling module 110 samples the input data Din to generate data values D1 according to the clock signals CLK1. For illustration, as shown inFIG. 1A , thedata samplers 112 sample the input data Din according to the clock signals CLK1 having different phases, to continuously generate the data values D1. - In operation S420, the
phase detection circuit 120 detects a phase error present in the input data Din according to at least one second clock signal CLK2 to generate the error signal VE. As described above, thephase detection circuit 120 can employ various types of the phase detectors to analyze the input data Din, to generate the error signal VE according to the phase error of the input data Din. - In operation S430, the
frequency estimator 130 generates the adjustment signal UP/DOWN according to the error signal VE, the phase threshold value MP, and the frequency threshold value MF. For illustration, as shown inFIG. 2 , thefrequency estimator 130 can compare the error signal VE with the phase threshold value MP, and compare the error signal VE with the frequency threshold value MF, so as to generate the corresponding adjustment signal UP/DOWN. - In operation S440, the
clock generation module 140 generates the dock signals CLK1 and the at least one clock signal CLK2 according to the adjustment signal UP/DOWN and the reference clock signal CLKREF. As described above, thephase detection circuit 120, thefrequency estimator 130, and theclock generation module 140 are arranged as a feedback control mechanism. Effectively, with such feedback control mechanism, theclock generation module 140 is able to dynamically adjust the clock signals CLK1 and the at least one clock signal CLK2 according to the adjustment signal UP/DOWN. - In operation S450, the
data recovery module 150 generates the recovered data Dout corresponding to the input data Din according to the data values D1. For illustration, as described above, theedge detection circuit 154 is able to analyze the transition points of the input data Din by performing various decision algorithms, to determine which one of the data values is the central data value of the input data Din. Accordingly, thedata selection circuit 156 can select at least one data value, which corresponds to the central data value of the input data Din, from the data values D1, to generate the recovered data Dout. - The above illustrations of the
CDR method 400 include exemplary operations, but the operations are not necessarily performed in the order shown. Operations may be added, replaced, changed order, and/or eliminated as appropriate, in accordance with the spirit and scope of various embodiments of the present disclosure. - As described above, the
CDR device 100 and theCDR method 400 thereof, which are provided in the present disclosure, are able to reduce the frequency offset on the input data, to improve the accuracy of the recovered data. - Although the present disclosure has been described in considerable details with reference to certain embodiments thereof, other embodiments are possible. Therefore, the spirit and scope of the appended claims should not be limited to the description of the embodiments contained herein. It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present disclosure without departing from the scope or spirit of the disclosure. In view of the foregoing, it is intended that the present disclosure covers modifications and variations of this disclosure provided they fall within the scope of the following claims.
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| CN201610260484.2A CN107306178B (en) | 2016-04-25 | 2016-04-25 | Clock data recovery device and method |
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| CN201610260484.2 | 2016-04-25 |
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| CN110611496B (en) * | 2018-06-14 | 2023-04-07 | 创意电子股份有限公司 | Clock data recovery device and phase control method |
| US10924125B2 (en) | 2018-10-23 | 2021-02-16 | Taiwan Semiconductor Manufacturing Company Ltd. | Frequency divider circuit, method and compensation circuit for frequency divider circuit |
| CN112260685B (en) * | 2019-07-22 | 2023-08-11 | 创意电子股份有限公司 | Clock data recovery device and method |
| CN112583539B (en) * | 2019-09-30 | 2024-07-19 | 瑞昱半导体股份有限公司 | Signal detection circuit and signal detection method |
| TWI727843B (en) * | 2020-06-30 | 2021-05-11 | 瑞昱半導體股份有限公司 | Receiving end of electronic device and method of setting phase threshold of timing recovery operation |
| CN113972910B (en) * | 2020-07-24 | 2025-07-04 | 瑞昱半导体股份有限公司 | Frequency control device and frequency control method |
| CN112187391B (en) * | 2020-09-04 | 2022-07-29 | 烽火通信科技股份有限公司 | Oversampling clock data recovery method and system for loop bandwidth dynamic adjustment |
| US11522573B1 (en) * | 2021-11-05 | 2022-12-06 | Realtek Semiconductor Corporation | Transceiver apparatus and transceiver apparatus operation method thereof having phase-tracking mechanism |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050084048A1 (en) * | 2003-10-15 | 2005-04-21 | Ching-Yen Wu | Clock and data recovery circuit |
| US20070085579A1 (en) * | 2005-10-19 | 2007-04-19 | Texas Instruments Incorporated | All digital phase locked loop architecture for low power cellular applications |
| US20090086872A1 (en) * | 2007-09-28 | 2009-04-02 | Xin Liu | Method for binary clock and data recovery for fast acquisition and small tracking error |
| US20120250811A1 (en) * | 2011-03-31 | 2012-10-04 | Avago Technologies Enterprise IP (Singapore) Pte. Ltd. | Fast lock clock-data recovery for phase steps |
| US20130181754A1 (en) * | 2010-05-07 | 2013-07-18 | Stmicroelectronics Pvt. Ltd. | High jitter and frequency drift tolerant clock data recovery |
| US20150227162A1 (en) * | 2014-02-10 | 2015-08-13 | Analog Devices, Inc. | Redundant clock switchover |
| US9148235B1 (en) * | 2014-09-15 | 2015-09-29 | Global Unichip Corporation | Eye diagram measuring circuit and measuring method thereof |
| US20150318978A1 (en) * | 2014-05-02 | 2015-11-05 | Qualcomm Incorporated | Clock and data recovery with high jitter tolerance and fast phase locking |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI436630B (en) * | 2010-11-16 | 2014-05-01 | Etron Technology Inc | Phase selector capable of tolerating jitter and method thereof, and clock data recovery circuit |
| US8427219B1 (en) * | 2011-12-05 | 2013-04-23 | Skymedi Corporation | Clock generator and a method of generating a clock signal |
| DE102013221678B4 (en) | 2012-11-12 | 2024-08-01 | Nvidia Corp. | System and method for determining a time to securely sample a clock domain signal |
| KR101416542B1 (en) | 2012-12-24 | 2014-07-09 | 주식회사 로웸 | Method for Apparatus for managing passcode |
| TWI565283B (en) | 2014-10-15 | 2017-01-01 | 創意電子股份有限公司 | Clock and data recovery circuit and method |
| TWI535213B (en) * | 2014-10-15 | 2016-05-21 | 創意電子股份有限公司 | Clock and data recovery circuit and method |
-
2016
- 2016-04-25 CN CN201610260484.2A patent/CN107306178B/en active Active
- 2016-09-13 US US15/264,574 patent/US9793903B1/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050084048A1 (en) * | 2003-10-15 | 2005-04-21 | Ching-Yen Wu | Clock and data recovery circuit |
| US20070085579A1 (en) * | 2005-10-19 | 2007-04-19 | Texas Instruments Incorporated | All digital phase locked loop architecture for low power cellular applications |
| US20090086872A1 (en) * | 2007-09-28 | 2009-04-02 | Xin Liu | Method for binary clock and data recovery for fast acquisition and small tracking error |
| US20130181754A1 (en) * | 2010-05-07 | 2013-07-18 | Stmicroelectronics Pvt. Ltd. | High jitter and frequency drift tolerant clock data recovery |
| US20120250811A1 (en) * | 2011-03-31 | 2012-10-04 | Avago Technologies Enterprise IP (Singapore) Pte. Ltd. | Fast lock clock-data recovery for phase steps |
| US20150227162A1 (en) * | 2014-02-10 | 2015-08-13 | Analog Devices, Inc. | Redundant clock switchover |
| US20150318978A1 (en) * | 2014-05-02 | 2015-11-05 | Qualcomm Incorporated | Clock and data recovery with high jitter tolerance and fast phase locking |
| US9148235B1 (en) * | 2014-09-15 | 2015-09-29 | Global Unichip Corporation | Eye diagram measuring circuit and measuring method thereof |
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| CN107306178A (en) | 2017-10-31 |
| US9793903B1 (en) | 2017-10-17 |
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