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US20170301928A1 - Device and method for maskless thin film etching - Google Patents

Device and method for maskless thin film etching Download PDF

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Publication number
US20170301928A1
US20170301928A1 US15/339,153 US201615339153A US2017301928A1 US 20170301928 A1 US20170301928 A1 US 20170301928A1 US 201615339153 A US201615339153 A US 201615339153A US 2017301928 A1 US2017301928 A1 US 2017301928A1
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Prior art keywords
ablation tool
suction member
gas
gas jet
ablation
Prior art date
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US15/339,153
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English (en)
Inventor
Michael Yu-Tak Young
Jeffrey L. Franklin
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Elevated Materials US LLC
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Applied Materials Inc
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Priority to US15/339,153 priority Critical patent/US20170301928A1/en
Assigned to APPLIED MATERIALS, INC. reassignment APPLIED MATERIALS, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: FRANKLIN, JEFFREY L., YOUNG, MICHAEL YU-TAK
Priority to TW106111996A priority patent/TW201803189A/zh
Priority to PCT/US2017/027536 priority patent/WO2017180942A1/en
Publication of US20170301928A1 publication Critical patent/US20170301928A1/en
Assigned to ELEVATED MATERIALS US LLC reassignment ELEVATED MATERIALS US LLC ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: APPLIED MATERIALS, INC.
Abandoned legal-status Critical Current

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    • H01M50/20Mountings; Secondary casings or frames; Racks, modules or packs; Suspension devices; Shock absorbers; Transport or carrying devices; Holders
    • H01M50/233Mountings; Secondary casings or frames; Racks, modules or packs; Suspension devices; Shock absorbers; Transport or carrying devices; Holders characterised by physical properties of casings or racks, e.g. dimensions
    • H01M50/24Mountings; Secondary casings or frames; Racks, modules or packs; Suspension devices; Shock absorbers; Transport or carrying devices; Holders characterised by physical properties of casings or racks, e.g. dimensions adapted for protecting batteries from their environment, e.g. from corrosion
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    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/0006Working by laser beam, e.g. welding, cutting or boring taking account of the properties of the material involved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
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    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/14Working by laser beam, e.g. welding, cutting or boring using a fluid stream, e.g. a jet of gas, in conjunction with the laser beam; Nozzles therefor
    • B23K26/142Working by laser beam, e.g. welding, cutting or boring using a fluid stream, e.g. a jet of gas, in conjunction with the laser beam; Nozzles therefor for the removal of by-products
    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/362Laser etching
    • BPERFORMING OPERATIONS; TRANSPORTING
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    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
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    • CCHEMISTRY; METALLURGY
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    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
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    • H01M4/525Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of nickel, cobalt or iron of mixed oxides or hydroxides containing iron, cobalt or nickel for inserting or intercalating light metals, e.g. LiNiO2, LiCoO2 or LiCoOxFy
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    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B23K2101/00Articles made by soldering, welding or cutting
    • B23K2101/36Electric or electronic devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2103/00Materials to be soldered, welded or cut
    • B23K2103/16Composite materials, e.g. fibre reinforced
    • B23K2103/166Multilayered materials
    • B23K2103/172Multilayered materials wherein at least one of the layers is non-metallic
    • B23K2201/34
    • B23K2201/36
    • B23K2203/172
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
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    • B29K2995/00Properties of moulding materials, reinforcements, fillers, preformed parts or moulds
    • B29K2995/0003Properties of moulding materials, reinforcements, fillers, preformed parts or moulds having particular electrical or magnetic properties, e.g. piezoelectric
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29LINDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
    • B29L2031/00Other particular articles
    • B29L2031/34Electrical apparatus, e.g. sparking plugs or parts thereof
    • B29L2031/3468Batteries, accumulators or fuel cells
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    • H01M2300/0065Solid electrolytes
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    • H01M2300/0065Solid electrolytes
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Definitions

  • the present embodiments relate generally to the fabrication of thin film devices, and more particularly to maskless etching devices and techniques for the fabrication of thin film batteries.
  • TFBs Solid state thin film batteries
  • An embodiment of a TFB may include a plurality of layers disposed in a stacked arrangement, such layers including a cathode current collector layer, a cathode layer, a solid state electrolyte, an anode layer, an anode current collector layer, and an encapsulation layer, for example.
  • These layers are commonly formed by successive deposition of the layers on a substrate using a deposition tool. After certain layers are deposited, portions of the layers may be removed or “etched” before additional layers are deposited. In this manner a TFB having a predetermined layer profile or architecture may be achieved.
  • etching of TFB layers has traditionally been accomplished using so-called “masked” etching techniques involving the use of a physical mask placed over a layer (or layers) to be etched.
  • the mask covers certain portions of the layer and leaves other portions exposed.
  • the masked layer is subjected to a blanket ablation (e.g., via exposure to heat, solvent, ion bombardment, etc.), resulting in the exposed portions of the masked layer being removed while the covered portions are left intact.
  • maskless etching techniques have been developed for selectively removing portions of TFB layers during manufacture.
  • Maskless etching involves the use of a precision ablation tool (e.g., a laser) to etch discrete portions of a TFB layer (or layers) while leaving other portions of the layer intact.
  • a precision ablation tool e.g., a laser
  • HAZs heat affected zones
  • a laser ablation tool can also disperse ablated particulate matter in the vicinity an ablation beam path. Either of these phenomena can facilitate the propagation of leakage currents in an affected layer, resulting in a defective or sub-standard TFB.
  • An exemplary embodiment of a device for maskless thin film etching in accordance with the present disclosure may include an ablation tool, a gas jet associated with a source of carrier gas and adapted to emit a stream of the carrier gas, and a suction member associated with a vacuum source and adapted to collect gas and particulate.
  • the ablation tool, the gas jet, and the suction member are mounted adjacent one another.
  • a device for maskless thin film etching may include an ablation tool adapted to emit an ablative output for etching a surface.
  • the device may further include a gas jet associated with a source of carrier gas and adapted to emit a stream of the carrier gas at an area of the surface where the output of the ablation tool impinges.
  • the device may further include a suction member associated with a vacuum source and adapted to collect ablated particulate from the area of the surface where the output of the ablation tool impinges.
  • the ablation tool, the gas jet, and the suction member are mounted adjacent one another.
  • An exemplary embodiment of a method for maskless thin film etching in accordance with the present disclosure may include positioning an ablation tool adjacent a surface to be etched.
  • the method may further include positioning a gas jet adjacent the ablation tool, wherein the gas jet is associated with a source of carrier gas and is adapted to emit a stream of the carrier gas, and positioning a suction member adjacent the ablation tool, wherein the suction member associated with a vacuum source and is adapted to collect gas and particulate.
  • FIG. 1 is a cross-sectional view illustrating an exemplary thin-film battery structure contemplated for fabrication by the disclosed device and method
  • FIG. 2 is a schematic illustration of an exemplary embodiment of an etching device in accordance with the present disclosure
  • FIG. 3 is a flow diagram illustrating an exemplary method in accordance with the present disclosure.
  • the present disclosure relates to a device and method for masklessly etching layers of thin film batteries (TFBs) during manufacture.
  • the disclosed device and method are directed toward mitigating manufacturing defects associated with maskless ablation techniques, and specifically those defects stemming from plasma generation and re-deposition of ablated particulate in the vicinity of an ablated area of a TFB layer.
  • the disclosed device and method may include an ablation tool (e.g., a laser) for etching discrete, predetermined portions of the layers of a TFB after the layers have been deposited on a substrate.
  • the disclosed device and method further include a gas jet and a suction member disposed adjacent the ablation tool.
  • the gas jet may be coupled to a gas source containing a pressurized carrier gas and may be configured to direct a stream of the pressurized carrier gas toward a point where the ablation tool impinges on an ablated surface (e.g., a surface of a layer of a TFB).
  • the suction member may be coupled to a vacuum source and may be configured to draw gas and particulate away from the point where the ablation tool impinges on an ablated surface.
  • the pressurized carrier gas emitted from the gas jet may provide a medium for entraining ablated particulate generated by the ablation tool, and the suction member may evacuate the carrier gas and the entrained particulate from the ablation site. The ablated particulate is thus prevented from redepositing on the etched surface.
  • the carrier gas may be an inert gas selected for an ability to suppress plasma formation in the vicinity of the ablation site for mitigating the creation of heat affected zones (HAZs) in surrounding portions of the etched surface.
  • FIG. 1 illustrates a cross-sectional view of a non-limiting, exemplary TFB 10 amenable to fabrication using the device and method described herein.
  • the illustrated TFB 10 may include a stack of layers 12 fabricated on a substrate 14 .
  • the stack of layers 12 may include a cathode current collector (CCC) layer 16 , a cathode layer 18 , a solid state electrolyte layer 20 , an anode/anode current collector (ACC) layer 24 , and an encapsulation layer 26 .
  • CCC cathode current collector
  • ACC anode/anode current collector
  • the encapsulation layer 26 may be formed of a plurality of alternating polymer and dielectric layers 28 , 29 for providing the encapsulation layer 26 with resiliency to accommodate thermal expansion and contraction of the TFB 10 .
  • the CCC may be formed of a metal layer (e.g., Au or Pt) or a plurality of metal layers (e.g., Ti and Au or Ti and Pt) capable of good adhesion to the substrate 14 and capable of withstanding high temperature annealing of the cathode layer 18 .
  • the cathode layer 18 may be formed of lithium cobalt oxide (LiCoO 2 ) or a similar material.
  • the solid state electrolyte layer 20 may be formed of lithium phosphorus oxynitride (LiPON) or similar material.
  • the ACC layer 24 may be formed of copper or similar material.
  • the device and method disclosed herein may be utilized to etch portions of the various layers 12 of the TFB 10 as the various layers 12 are deposited atop the substrate 14 (e.g., in between depositions) to achieve a predetermined TFB architecture.
  • the TFB 10 depicted in FIG. 1 has a so-called “non-coplanar” architecture wherein the CCC layer 16 is not coplanar with the ACC layer 24 .
  • FIG. 1 merely illustrates one possible arrangement for a TFB architecture amendable to fabrication using the device and method described below, and those of ordinary skill in the art will appreciate the concepts disclosed herein can be implemented to achieve various other TFB architectures.
  • a non-limiting example of such an alternative architecture is a so-called “coplanar” architecture having a CCC layer coplanar with an ACC layer.
  • the device 30 may generally include an ablation tool 32 , a gas jet 34 , and a suction member 36 mounted adjacent one another on a movable carrier arm 38 .
  • the carrier arm 38 may be adapted to selectively move the ablation tool 32 , gas jet 34 , and suction member 36 vertically and horizontally relative to a surface 44 (e.g., a surface of a layer of a TFB) to be etched as further described below.
  • the device 30 may have a fixed, static position (e.g., omitting a movable carrier arm) and the surface 44 may be vertically and horizontally movable relative to the device 30 .
  • the device 30 and the surface 44 may be movable.
  • the ablation tool 32 may be, and will be described hereinafter as, a laser adapted to emit a laser beam 46 from a tip 48 of the ablation tool 32 as shown in FIG. 2 .
  • the ablation tool 32 may be any type of precision ablation device, such as a media jet or blaster adapted to emit a jet of abrasive media (e.g., silica sand) suspended in a stream of pressurized gas.
  • abrasive media e.g., silica sand
  • the etching device 30 may include a laser and a media jet capable of being implemented selectively and interchangeably.
  • the laser may be a laser scanner independent of the carrier arm 38 and capable of scanning a laser beam at speeds of 50 meters per second or higher, much faster than can be achieved through mechanical movement of the carrier arm 38 .
  • the ablation tool 32 may be operably connected to an electrical power source 50 and to a controller 52 .
  • the controller 52 may be adapted to dictate operation of the carrier arm 38 and the ablation tool 32 in a predetermined or preprogrammed manner, such as to etch a predefined pattern in the surface 44 .
  • the ablation tool 32 is a media blaster or a similar device configured to emit a jet of abrasive media
  • the ablation tool 32 may additionally be coupled to a pressurized gas source and to a source of abrasive media (not shown) as may be appropriate.
  • the gas jet 34 of the device 30 may be coupled to a pressurized carrier gas source 54 and may be configured to emit a stream 56 of pressurized carrier gas from a tip 58 of the gas jet 34 disposed in close proximity to (e.g., in a range of 0.25 millimeters to 300 millimeters from) the tip 48 of the ablation tool 32 .
  • the stream 56 may be directed toward an area 58 of the surface 44 where the laser beam 46 emitted by the ablation tool 32 impinges.
  • the gas jet 34 may further be coupled to the controller 52 , wherein the controller 52 may be configured to dictate operation of the gas jet 34 .
  • the controller 52 may be configured to operate the gas jet 34 in concert with the ablation tool 32 , with the gas jet 34 being activated when the ablation tool 32 is active.
  • the controller 52 may be configured to activate the gas jet 34 a predetermined amount of time before or after activation of the ablation tool 32 , and may be configured to deactivate the gas jet 34 a predetermined amount of time before or after deactivation of the ablation tool 32 .
  • the embodiments of the present disclosure are not limited in this regard.
  • the carrier gas emitted by the gas jet 34 may be any gas suitable for use within the vicinity of the surface 44 .
  • gases include, with, clean dry air (CDA) with less than or equal to 8% moisture content, argon gas, nitrogen gas, etc.
  • the carrier gas may be specifically selected for an ability to suppress the formation of laser-induced plasma at the area 58 where the laser beam 46 emitted by the ablation tool 32 impinges.
  • Non-limiting examples of such inert gases include Argon, Nitrogen, etc.
  • the suppression of laser-induced plasma at the area 58 may mitigate the formation of HAZs in surrounding portions of the surface 44 .
  • the carrier gas may be selected based on factors such as the type and power of the laser emitted by the ablation tool 32 , the nature of the environment of the surface 44 , the material of the surface 44 , etc.
  • the suction member 36 of the device 30 may be coupled to a vacuum source 60 and may be configured to collect gas and/or particulate (as further described below) at an inlet 62 of the suction member 36 disposed in close proximity to (e.g., in a range of 0.25 millimeters to 300 millimeters from) the tip 48 of the ablation tool 32 .
  • the inlet 62 may be disposed in the path of the stream 56 of carrier gas emitted by the gas jet 34 and may be directed toward the area 58 where the laser beam 46 impinges on the surface 44 .
  • the suction member 36 may further be coupled to the controller 52 , wherein the controller 52 may be configured to dictate operation of the suction member 36 .
  • the controller 52 may be configured to operate the suction member 36 in concert with the ablation tool 32 and/or the gas jet 34 , with the suction member 36 being activated when the ablation tool 32 and/or the gas jet 34 are active.
  • the controller 52 may be configured to activate the suction member 36 a predetermined amount of time before or after activation of the ablation tool 32 and/or the gas jet 34 , and may be configured to deactivate the suction member 36 a predetermined amount of time before or after deactivation of the ablation tool 32 and/or the gas jet 34 .
  • the embodiments of the present disclosure are not limited in this regard.
  • the suction member 36 may collect vapor and ablated particulate from the impingement area 58 , wherein the ablated particulate may be suspended in the stream 56 of pressurized carrier gas emitted from the gas jet 34 .
  • the ablation tool 32 is a media blaster or a similar device configured to emit a jet of abrasive media
  • the suction member 36 may collect the media emitted by the ablation tool 32 (i.e., after the media has impinged on the surface 44 ) as well as any gas suspending the media.
  • the media and the suspension gas may be directed toward the inlet 62 of the suction member 36 by the stream 56 of the pressurized carrier gas emitted from the gas jet 34 .
  • the suction member 36 may prevent ablated particulate and any abrasive media (if abrasive media is used) from depositing on the surface 44 , mitigating any undesirable effects associated with such deposition.
  • the suction member 36 may also prevent the distribution and accumulation of carrier gas emitted by the gas jet 34 in the environment of the surface 44 .
  • FIG. 3 a flow diagram illustrating an exemplary embodiment of a method for implementing the device 30 in accordance with the present disclosure is shown. The method will now be described in detail in conjunction with the schematic representation of the device 30 shown in FIG. 2 .
  • the carrier arm 38 of the device 30 may be operated move the ablation tool 32 , the gas jet 34 , and the suction member 36 to a designated position above a surface (e.g., the surface 44 shown in FIG. 2 ) to be etched.
  • the movement of the carrier arm 38 may be dictated and coordinated by the controller 52 , and the designated position may be a position wherein the tip 48 of the ablation tool 32 is positioned directly above a starting point of a predetermined pattern to be etched in the surface 44 .
  • the ablation tool 32 may be activated (e.g., by the controller 52 ) and may emit a laser beam 46 (if the ablation tool 32 is a laser) or a jet of abrasive media (if the ablation tool 32 is media jet or blaster), collectively referred to as an “output” of the ablation tool 32 , to etch an area 58 of the surface 44 where the output impinges.
  • a laser beam 46 if the ablation tool 32 is a laser
  • a jet of abrasive media if the ablation tool 32 is media jet or blaster
  • the gas jet 34 may be activated (e.g., by the controller 52 ) and may emit the stream 56 of pressurized carrier gas from the tip 58 of the gas jet 34 toward the impingement area 58 on the surface 44 .
  • the gas jet 34 may be operated in concert with the ablation tool 32 , with the gas jet 34 being activated when the ablation tool 32 is activated.
  • the gas jet 34 may be activated a predetermined amount of time before or after activation of the ablation tool 32 .
  • stream 56 of carrier gas may entrain ablated particulate adjacent the impingement area 58 .
  • the carrier gas may suppress the formation of laser-induced plasma at the impingement area 58 , mitigating the formation of HAZs adjacent the impingement area 58 .
  • the suction member 36 may be activated (e.g., by the controller 52 ) and may collect vapor and ablated particulate from the impingement area 58 , wherein the ablated particulate may be suspended in the stream 56 of pressurized carrier gas emitted from the gas jet 34 .
  • the ablation tool 32 is a media blaster or a similar device configured to emit a jet of abrasive media
  • the suction member 36 may collect the media emitted by the ablation tool 32 (i.e., after the media has impinged on the surface 44 ) as well as any gas suspending the media.
  • the media and the suspension gas may be directed toward the inlet 62 of the suction member 36 by the stream 56 of the pressurized carrier gas emitted from the gas jet 34 .
  • the suction member 36 may prevent ablated particulate and abrasive media (if abrasive media is used) from depositing on the surface 44 , mitigating any undesirable effects associated with such deposition.
  • the suction member 36 may also prevent the distribution and accumulation of carrier gas emitted by the gas jet 34 in the environment of the surface 44 .
  • the suction member 36 may be operated in concert with the ablation tool 32 and/or the gas jet 34 , with the suction member 36 being activated when the ablation tool 32 and/or the gas jet 34 are activated. In various embodiments, the suction member 36 may be activated a predetermined amount of time before or after activation of the ablation tool 32 and/or the gas jet 34 .
  • the controller 52 may operate the carrier arm 38 to move the ablation tool 32 , the gas jet 34 , and the suction member 36 along a predetermined path relative to the surface 44 , such as for etching a predetermined pattern in the surface 44 .
  • the active ablation tool 32 may be moved along a path defining the predetermined pattern.
  • the controller 52 may operate the ablation tool 32 to impinge on the surface 44 in the predefined pattern.
  • the predefined pattern may be stored in a memory of the controller 52 or may be communicated to the controller 52 via external input means, for example.
  • the active gas jet 34 and suction member 36 may operate in the manner described above to collect vapor and particulate and to suppress the formation of laser-induced plasma in the etched surface 44 .
  • the ablation tool 32 , the gas jet 34 , and the suction member 36 may be deactivated (e.g., by the controller 52 ).
  • the gas jet 34 may be activated a predetermined amount of time before or after deactivation of the ablation tool 32
  • the suction member 36 may be deactivated a predetermined amount of time before or after deactivation of the ablation tool 32 and/or the gas jet 34 .
  • the device and method of the present disclosure provide numerous advantages. These include precise, maskless etching of a TFB layer while suppressing the formation of laser-induced plasma (in the case of laser ablation) and preventing the deposition of etched material on the etched layer.
  • the device and method of the present disclosure further facilitate high-precision ablation of a TFB layer using abrasive media while preventing the deposition of the abrasive media on the etched layer. HAZs and leakage currents in etched layers are thus mitigated, facilitating the manufacture of better performing and more reliable TFBs.

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  • Secondary Cells (AREA)
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TW106111996A TW201803189A (zh) 2016-04-14 2017-04-11 用於無遮罩薄膜蝕刻的裝置和方法
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US15/339,168 Abandoned US20170301926A1 (en) 2016-04-14 2016-10-31 System and method for maskless thin film battery fabrication
US15/339,187 Active 2037-08-27 US10547040B2 (en) 2016-04-14 2016-10-31 Energy storage device having an interlayer between electrode and electrolyte layer
US15/338,950 Abandoned US20170301897A1 (en) 2016-04-14 2016-10-31 Thin film device encapsulation using volume change accommodating materials
US15/338,996 Abandoned US20170301956A1 (en) 2016-04-14 2016-10-31 Thin film battery device having recessed substrate and method of formation
US15/339,121 Abandoned US20170301895A1 (en) 2016-04-14 2016-10-31 Energy storage device with encapsulation anchoring
US15/338,958 Abandoned US20170301892A1 (en) 2016-04-14 2016-10-31 Multilayer thin film device encapsulation using soft and pliable layer first
US15/338,977 Abandoned US20170301955A1 (en) 2016-04-14 2016-10-31 Thin film battery device and method of formation
US15/338,969 Abandoned US20170301954A1 (en) 2016-04-14 2016-10-31 Thin film battery device and method of formation
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US15/339,187 Active 2037-08-27 US10547040B2 (en) 2016-04-14 2016-10-31 Energy storage device having an interlayer between electrode and electrolyte layer
US15/338,950 Abandoned US20170301897A1 (en) 2016-04-14 2016-10-31 Thin film device encapsulation using volume change accommodating materials
US15/338,996 Abandoned US20170301956A1 (en) 2016-04-14 2016-10-31 Thin film battery device having recessed substrate and method of formation
US15/339,121 Abandoned US20170301895A1 (en) 2016-04-14 2016-10-31 Energy storage device with encapsulation anchoring
US15/338,958 Abandoned US20170301892A1 (en) 2016-04-14 2016-10-31 Multilayer thin film device encapsulation using soft and pliable layer first
US15/338,977 Abandoned US20170301955A1 (en) 2016-04-14 2016-10-31 Thin film battery device and method of formation
US15/338,969 Abandoned US20170301954A1 (en) 2016-04-14 2016-10-31 Thin film battery device and method of formation
US15/462,209 Abandoned US20170301894A1 (en) 2016-04-14 2017-03-17 Multilayer thin film device encapsulation using soft and pliable layer first

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