US20150233786A1

US20150233786A1 - Ultrasonic measurement device

Info

Publication number: US20150233786A1
Application number: US14/181,313
Authority: US
Inventors: Joseph J. Pieper; Clinton N. Fell; Sunita J. Kottoor
Original assignee: Caterpillar Inc
Current assignee: Caterpillar Inc
Priority date: 2014-02-14
Filing date: 2014-02-14
Publication date: 2015-08-20
Also published as: AU2015294478A1; AU2015294478B2; US20160023696A1; CA2955446A1; US9238491B1; RU2672321C1; CA2955446C

Abstract

A wear measurement device for measuring wear of a machine component includes a probe configured to generate and send an ultrasonic wave through the component, generate a first signal upon sending the ultrasonic wave, and generate a second signal upon receiving the reflected wave. The device also includes a display configured to provide a visible output to a user of the device and a controller coupled to the probe and the display and comprising a memory and a processor. The processor is configured to receive the first and second signals and to, immediately upon receiving the signals, determine a measurement of the component based on the signals, determine a percent worn value for the component based on the measurement and stored component data, and cause the display to provide the percent worn value as a visible output.

Description

TECHNICAL FIELD

This disclosure relates to measurement devices for measuring industrial equipment components, and particularly to a measurement device for determining wear of components of the equipment undercarriage.

BACKGROUND

This section is intended to provide a background or context to the invention recited in the claims. The description herein may include concepts that could be pursued, but are not necessarily ones that have been previously conceived or pursued. Therefore, unless otherwise indicated herein, what is described in this section is not prior art to the description and claims in this application and is not admitted to be prior art by inclusion in this section.
Ultrasonic measurement devices may be used to measure or estimate the wear of components for equipment used in industrial applications. For instance, an undercarriage (e.g., track) of a moveable industrial machine may be particularly subject to wear and require frequent service to assess and/or replace worn components. Ultrasonic measurement devices may send an ultrasonic signal (e.g., high frequency sound wave) through the material of a machine component and measure the elapsed time before the signal is reflected and received at the device in order to determine a thickness of the component. However, the measured thickness may not provide an indication of component wear relative to the component's original dimensions (e.g., thickness), or an estimation of when the component may require replacement. Thus, an operator may be required to manually compare the measured values to the original dimensions of the component to determine a relative wear, requiring additional time and equipment.
Some measurement devices may include systems for alerting an operator of the device when the thickness of a material is below a certain level. An example of such a measurement device can be found in U.S. Patent Application Publication No. 2008/0072673, published Mar. 27, 2008, for “Portable Testing System,” which discloses “a device for measuring the thickness of a material; a display screen for displaying the thickness of a material to the operator; and a device for alerting the operator when the thickness of the material is below a certain level.” However, the disclosed testing system does not provide an indication of wear relative to the material's original dimensions, or an estimation of when an associated component may require replacement.

SUMMARY

An embodiment of the present disclosure relates to a wear measurement device for measuring wear of a machine component. The device includes a probe configured to generate and send an ultrasonic wave through the component, generate a first signal upon sending the ultrasonic wave, and generate a second signal upon receiving the reflected wave. The device also includes a display configured to provide a visible output to a user of the device and a controller coupled to the probe and the display and comprising a memory and a processor. The processor is configured to receive the first and second signals and to, immediately upon receiving the signals, determine a measurement of the component based on the signals, determine a percent worn value for the component based on the measurement and stored component data, and cause the display to provide the percent worn value as a visible output.
Another embodiment of the present disclosure relates to a computer-implemented method for determining wear of a machine component. The method includes causing a probe of a measurement device to generate and send an ultrasonic wave through the component by sending a signal to the probe and, immediately upon receipt of the reflected wave at the probe, determining a measurement of the component based on receipt of the reflected wave at the probe, determining a percent worn value for the component based on the measurement and stored component data, and causing a display of the measurement device to provide the percent worn value as a visible output.
Another embodiment of the present disclosure relates to a processing circuit for determining wear of a machine component. The processing circuit includes a memory comprising data related to the component and a processor coupled to the memory. The processor is configured to cause a probe to generate and send an ultrasonic wave by sending a signal to the probe and to, immediately upon receipt of the reflected wave at the probe, determine a measurement of the component based on receipt of the reflected wave at the probe, determine a percent worn value for the component by comparing the measurement to the stored component data, and cause a display to provide the percent worn value as a visible output.

BRIEF DESCRIPTION OF THE DRAWINGS

The disclosure will become more fully understood from the following detailed description, taken in conjunction with the accompanying figures, wherein like reference numerals refer to like elements, in which:

FIG. 1 is a block diagram of a system for measuring machine components, including an ultrasonic measurement device, according to an exemplary embodiment.

FIG. 2 is a block diagram of a processing circuit for an ultrasonic measurement device, according to an exemplary embodiment.

FIG. 3 is a flow chart diagram of a method for determining a percent worn value of a machine component, according to an exemplary embodiment.

DETAILED DESCRIPTION

Before turning to the figures, which illustrate the exemplary embodiments in detail, it should be understood that the present application is not limited to the details or methodology set forth in the description or illustrated in the figures. It should also be understood that the terminology is for the purpose of description only and should not be regarded as limiting.
Referring to FIG. 1, an ultrasonic measurement system 100 is shown, according to an exemplary embodiment. The system 100 may be used to measure components of large industrial equipment in order to determine wear of the components. For instance, the system 100 may be used to measure components of a vehicle undercarriage (e.g., track), including links, bushings, shoes, rollers, idlers, and sprockets. The system 100 includes an ultrasonic measurement device 110. The device 110 is configured to send an ultrasound signal through the material of a component and determine a measurement of the component based on the amount of time measured before the signal is reflected from the back surface of the component. The device 110 is configured to compare the measurement with the original thickness of the component in order to determine mechanical wear of the component. The device 110 may also be configured to determine other information related to wear of the component based on the measurement, such as a percent worn value, an estimated component life remaining, a projected life of the component, an estimated meter reading for the associated machine at replacement (e.g., in hours, miles, kilometers, etc.), and/or an estimated service interval for the component.
As shown in FIG. 1, the device 110 includes an ultrasonic probe 116 for administering an ultrasound wave 118. The probe 116 is shown contacting a machine component 120. The probe 116 is configured to send the ultrasound wave 118 through the component 120 and receive the wave 118 once it reflects from the back surface of the component 120. In the illustrated embodiment, the probe 116 is configured to contact a surface of the component 120. However, in other embodiments, the probe 116 may be otherwise configured to measure another component, such as having dimensions that are tailored for a particular type of component or application. For instance, the probe 116 may have a curved surface or may be pointed in order to measure a particular component.
The probe 116 is coupled to a controller 112 (i.e., control module) configured to control one or more operations of the measurement device 110. For example, the controller 112 may include or be part of a processing circuit such as processing circuit 200 shown in FIG. 2. The controller 112 may be configured to receive and interpret signals from the probe 116. In an exemplary embodiment, the probe 116 is configured to send a first signal to the controller when the wave 118 is sent and a second signal when the wave 118 is received. In this embodiment, the controller 112 is configured to determine (e.g., calculate) a thickness of the component 120 based on the signals received from the probe 116. For instance, the controller 112 may be configured to calculate the thickness of the component 120 based on the amount of time between when the first signal and the second signal are received (e.g., when the wave 118 is sent and when the wave 118 is received). In other embodiments, the controller 112 may be configured to determine or calculate other information related to the component 120 based on the signals, such as those referenced above and those referenced below in reference to processing circuit 200. In one embodiment, the controller 112 may include a processing circuit such as processing circuit 200 for processing data received via the probe 116, including for processing any calculations described herein. The processing circuit 200 is shown in FIG. 2 and described in further detail below.
The controller 112 is coupled to a display 114. The display 114 may be an electronic display or screen configured to display information to a user of the device 110. For instance, the display 114 may be a viewable screen configured to display text to the user. In one embodiment, the display 114 is a touchscreen configured to receive inputs from the user and send signals to the controller 112 based on the inputs. In an exemplary embodiment, the controller 112 is configured to communicate with the display 114, including sending signals to the display 114 in order to cause the display 114 to display component information to the user, such as communications related to wear of the component 120.
The system 100 may include any number of servers and other devices, such as server 102 (e.g., remote storage device), which are configured to communicate with the measurement device 110 (e.g., controller 112) and support the various functions described herein. The various servers and other devices may be located at more than one physical location and configured to communicate remotely as part of the measurement system 100. The measurement system 100 may further include a network 104 through which the measurement device 110 (e.g., controller 112) and the server 102 communicate. The system 100 may also include a global positioning system (GPS) 122 configured to determine a location of the device 110 and/or the component. The GPS 122 may be included as part of the measurement device 110. The GPS 122 may be configured to collect (geographic) location information and store the information at the controller 112. The GPS 122 may also be configured to send the location information to the server 102 via the network 104.
The network 104 may be any form of communications network that conveys data between the measurement device 110 and the server 102. The network 104 may include any number of wired or wireless connections, in various embodiments. In one embodiment, the server 102 is configured to communicate with the measurement device 110 over a wired connection that includes a serial cable, a fiber optic cable, a CAT5 cable, or another form of wired connection. For example, the device 110 may be connected to the server 102 (e.g., by the user) upon measuring the component in order to transmit the measurements to the server 102. In another example, the server 102 may communicate with the device 110 via a wireless connection (e.g., via WiFi, cellular, radio, etc.). The network 104 may also include any number of local area networks (LANs), wide area networks (WANs), or the Internet. Accordingly, the network 104 may include any number of intermediary networking devices, such as routers, switches, servers, etc.
Referring now to FIG. 2, a processing circuit 200 is shown, according to an exemplary embodiment. Processing circuit 200 may be a processing component of any electronic device used as part of the ultrasonic measurement system 100. For example, either (or both) of the server 102 and the device 110 (e.g., controller 112) may include processing circuit 200. The processing circuit 200 may also be part of a computing system (e.g., system 100) that includes multiple devices. In such a case, processing circuit 200 may represent the collective components of the system (e.g., processors, memories, etc.). For example, the server 102 in communication with the controller 112 may form a processing circuit configured to perform the operations described herein.
The processing circuit 200 may include a processor 202 and a memory 204. The memory 204 stores machine instructions that, when executed by the processor 202, cause the processor 202 to perform one or more operations described herein. The memory 204 may also be configured to store any data related to the measured components (e.g., component 120), such as a thickness or other dimensions of the components. The memory 204 may be physically coupled to the processing circuit 200 and the measurement device 110 such that any information stored within the memory 204 is immediately made available to the measurement device 110 and the processing circuit 200 without a wireless network connection and without connecting to a separate device. The processor 202 may include a microprocessor, FPGA, ASIC, any other form of processing electronics, or combinations thereof. The memory 204 may be any electronic storage medium such as, but not limited to, a floppy disk, a hard drive, a CD-ROM, a DVD-ROM, a magnetic disk, RAM, ROM, EEPROM, EPROM, flash memory, optical memory, or combinations thereof. The memory 204 may be a tangible storage medium that stores non-transitory machine instructions. The processing circuit 200 may include any number of processors and memories. In other words, the processor 202 may represent the collective processing devices of the processing circuit 200 and the memory 204 may represent the collective storage devices of the processing circuit 200. The processor 202 and memory 204 may be on the same printed circuit board or may be in communication with each other via a bus or other form of connection.
I/O hardware 206 includes the interface hardware used by the processing circuit 200 to receive data from other devices (e.g., within the system 100) and/or to provide data to other devices. For example, a command may be sent from the processing circuit 200 to a controlled device of the system 100 (e.g., the ultrasonic measurement device 110) via the I/O hardware 206. The I/O hardware 206 may include, but is not limited to, hardware to communicate on a local system bus and/or on a network. For example, the I/O hardware 206 may include a port to transmit display data to an electronic display (e.g., display 114) and another port to receive data from any of the devices connected to network 104 shown in FIG. 1 (e.g., ultrasonic probe 116).
The processing circuit 200 may store component data 208 in the memory 204. In general, the component data 208 includes data related to measured components (e.g., component 120). In an exemplary embodiment, the measurement device 110 is configured to determine a dimension of a component (e.g., component thickness) using the probe 116 and automatically store the measurement within the component data 208 of the memory 204. In other embodiments, the component data 208 may be stored manually. For instance, the component data 208 may be manually entered by an operator or user of the device 110 and/or the measurement system 100. The component data 208 may also include data that is measured or observed using another device (other than device 110) of the system 100, such as a mechanical measurement tool (e.g., depth gauge). The data 208 may be measured by an operator using the mechanical tool and manually entered via the I/O hardware 206.
The component data 208 may be used by the processing circuit 200 to determine wear calculations of the measured component. Example data in component data 208 may include observed dimensions of a machine component, such as the component's thickness, height (e.g., a flange height), length, circumference, area, volume, diameter, or another dimension of the component. The component data 208 may include identifying information related to the measured component and the associated machine in order to attach the measurements and wear calculations to a particular component. The component data 208 may also include time stamp information to track the wear of the measured components over time. Component data 208 may be specific to one type of component (e.g., component 120) or may include data for any number of different components. In one embodiment, the component data 208 is received via the I/O hardware 206 (e.g., from the measurement device 110). In another embodiment, the component data 208 is generated locally in the memory 204. For example, if the processing circuit 200 is provided at the measurement device 110, the component data 208 may be generated locally in memory 204 during execution of the measurement.
The memory 204 may store original component data 210 which identifies the measured components (e.g., component 120) and includes information related to the measured components, such as original dimensions of the measured components (e.g., thickness, height, length, circumference, area, volume, diameter, etc.). In one embodiment, the original component data 210 may also include previous measured dimensions of the measured components. The original component data 210 may also include one or more wear limits for a component, such as lower limits for each component dimension indicating that a component is 100 percent worn. The original component data 210, including the one or more wear limits, may be used to determine (e.g., calculate) one or more measurements of the measurement system 100, including one or more percent worn values.
In various embodiments, memory 204 includes a percent worn generator 212 configured to generate percent worn values 214. The percent worn generator 212 is configured to generate any number of percent worn values for various machine components as part of the measurement system 100. For example, the processor 202 may execute the stored percent worn generator 212 to calculate a percent worn value of a selected component. The percent worn generator 212 is configured to generate the percent worn values 214 based on the measured component data 208 and/or the original component data 210. In an exemplary embodiment, the processor 202 is configured to generate the percent worn values 214 by comparing the measured component data 208 to the original component data 210. For instance, the percent worn values 214 may convey the measured component data 208 as a percentage relative to the original component data 210 (e.g., a wear limit for the component).
In another embodiment, the processor 202 is configured to generate the percent worn values 214 by comparing the measured component data 208 to wear tables 218. The wear tables 218 may include wear data for each of the measured components, including recommended maintenance intervals, wear limits, projected component life, and estimated wear percentages based on certain measureable dimensions. The stored percent wear generator 212 may be configured to generate the percent worn values 214 by comparing the measured component data 208 to any of the wear tables 218. The processor 202 may be configured to execute the percent worn generator 212 to determine the percent worn values 214. The percent worn generator 212 may be configured to generate percent worn values 214 for each component of a machine as part of the measurement system 100.
The memory 204 may also include wear metric generator 216. The wear metric generator 216 is configured to determine other metrics or measurements related to the measured component (e.g., component 120) based on the measured component data 208. The wear metric generator 216 may be executed by the processor 202 (e.g., controller 112, server 102, etc.). The wear metric generator 216 may be configured to compare the measured component data 208 and/or the percent worn values 214 to the wear tables 218 in order to determine other metrics related to wear of the measured component(s).
The wear metric generator 216 may be configured to determine an estimated life remaining (e.g., a remaining useful life in operating hours, miles, or kilometers) for the component based on the percent worn values 214. In one embodiment, the wear metric generator 216 may determine the estimated life remaining based on the percent worn value for a component using the wear tables 218, the original component data 210, component installation information, and/or current machine operating information. For instance, the wear tables 218 may include a table showing an estimated remaining component life based on a percent worn value or based on a measured dimension of the component. In other embodiments, the wear tables 218 may include other similar lookup/data tables configured to show a remaining component life in relation to a percent worn value and/or a measured dimension of the component. In still other embodiments, the original component data 210 may include information related to the component material and the wear metric generator 216 may be configured to determine an estimated remaining component life based on the percent worn value for the component and certain wear characteristics of the material stored in the original component data 210. Similarly, the wear metric generator 216 may be configured to determine an estimated meter reading for replacement of the component (i.e., a meter reading for the associated machine at which the component may require replacement, such as a mileage or work-hours count) and/or an estimated projected life for the component based on the percent worn values 214.
The wear metric generator 216 may also be configured to determine an estimated service interval for the component based on the percent worn values 214. In one embodiment, the wear metric generator 216 may determine the estimated service interval by comparing the percent worn value for a component to the wear tables 218. In this embodiment, for instance, the wear tables 218 may include a table showing recommended service intervals based on a particular percent worn value for the component. The wear metric generator 216 may be configured to look up an estimated service interval for the component based on the percent worn value using the wear tables 218. In other embodiments, the wear metric generator 216 may estimate the next service interval based also on the original component data 210, including data related to the material and/or function of the component. The estimated service interval may also be based on a geographic location of the component, including operating climate, which may be included as part of the measured component data 208 (e.g., via the GPS).
Referring now to FIG. 3, a process 300 for determining wear of a machine component (e.g., component 120) is shown, according to one embodiment. In an exemplary embodiment, the process 300 is executed by the processing circuit 200. In other embodiments, however, the process 300 may be executed, in whole or in part, by any of the server 102, the controller 112, and the processing circuit 200. Likewise, the process 300 may be executed at the measurement device 110 or remotely (e.g., at server 102).
At 302, a signal is sent to the probe 116 (e.g., by the processing circuit 200), causing the probe 116 to generate an ultrasonic wave (e.g., wave 118). The probe 116 is intended to send the wave through the material of a machine component (e.g., component 120) and receive the reflected wave at the probe 116. At 304, a measurement (e.g., dimension) of the component is determined based on receipt of the reflected wave at the probe 116. In an exemplary embodiment, the measurement is determined by the processing circuit 200 immediately upon receipt of the reflected wave at the probe 116. For instance, the processing circuit 200 may be configured to receive a first signal from the probe 116 when the wave is sent and a second signal from the probe 116 when the wave is received (e.g., after reflecting from a surface of the component). The processing circuit 200 may then determine a thickness of the component based on the signals (e.g., based on an amount of time between when the wave is sent and when the wave is received). The processing circuit 200 may also be configured to determine the thickness based on the type of material in the component and any other information received as part of the system 100.
At 306, a percent worn value for the component is determined by comparing the determined measurement to stored component data. For instance, component data may be stored at original component data 210 of the memory 204. The original component data 210 may include one or more dimensions of the component as-new or as-installed, such that the determined measurement may be compared to an original dimension of the component. The percent worn value may be related to a ratio of determined measurement to original measurement or dimension. In one embodiment, the percent worn value is determined by comparing the determined measurement to a table or chart (e.g., a wear table) which provides a percent worn value for the component based on the determined measurement. The stored component data may be stored in memory 204 and may include any or all of original component data 210, percent worn values 214, and/or wear tables 218. The stored component data may also include other measured component data 208 stored within memory 204.
At 308, a display (e.g., display 114) of the measurement device 110 is caused to provide the percent worn value as a visible output. For instance, the display may be a screen configured to display text to a user of the device 110. The display may be coupled to the processing circuit 200. In an exemplary embodiment, the percent worn value is displayed as text on the display. In other embodiments, the percent worn value may be displayed as a symbol or another visual output intended to convey the percent worn value to the user. In one embodiment, a signal is sent to the display (e.g., by the processing circuit 200), causing the display to provide the percent worn value as a visible output.
At 310, a remaining useful life may be determined for the component (e.g., by the processing circuit 200) based on the percent worn value, component installation information, and/or current machine operating information. For instance, the remaining useful life may be determined by comparing the percent worn value to a table or chart related to the useful life of the component. The table or chart may be stored in the original component data 210 or the wear tables 218, for instance. The remaining useful life may be determined using the wear metric generator stored in the memory 204. In one embodiment, the remaining useful life is determined using an algorithm based on the percent worn value and other information related to the component, which may include any or all of a geographic location of the component or associated machine, a material of the component, an applied use of the component or the machine, hours of operation for the component or machine, or other information or data related to the component, the machine, and/or the use of either. Likewise, at 312 an estimated service interval may be determined for the component (e.g., by the processing circuit 200) based on the percent worn value and using any methodology described above in relation to the remaining useful life of the component.
At 314, data related to the component may be transmitted to a remote storage device (e.g., server 102), including any data or information measured, determined, or calculated as part of the process 300. The data may be transmitted via the network 104 or another network configured to transmit data remotely. The data may be transmitted by the processing circuit 200, such as by the I/O hardware 206.
The construction and arrangement of the ultrasonic measurement device, as shown in the various exemplary embodiments, are illustrative only. Although only a few embodiments have been described in detail in this disclosure, many modifications are possible (e.g., variations in sizes, dimensions, structures, shapes and proportions of the various elements, values of parameters, mounting arrangements, use of materials, colors, orientations, etc.) without materially departing from the novel teachings and advantages of the subject matter described herein. Some elements shown as integrally formed may be constructed of multiple parts or elements, the position of elements may be reversed or otherwise varied, and the nature or number of discrete elements or positions may be altered or varied. The order or sequence of any process, logical algorithm, or method steps may be varied or re-sequenced according to alternative embodiments. Other substitutions, modifications, changes and omissions may also be made in the design, operating conditions and arrangement of the various exemplary embodiments without departing from the scope of the present invention.

INDUSTRIAL APPLICABILITY

The disclosed ultrasonic measurement device and system may be implemented to determine one or more wear measurements for any industrial equipment having one or more replaceable or wearable components. The disclosed ultrasonic measurement device is intended to provide a device for efficiently determining wear characteristics of a machine component using an ultrasonic probe. The disclosed ultrasonic measurement device is also intended to display certain wear characteristics of the machine component to an operator or technician in the field using the ultrasonic measurement device, such as a percent worn value for the component, which may reduce operating costs for the component and/or the associated machine (e.g., maintenance time required to service the component, lost operating time of the machine for service, etc.). The disclosed ultrasonic measurement device allows a user to measure components, evaluate wear information for the components, and store the data at the measurement device, rather than requiring the user to upload the measured data for analysis and store at a separate location or device. The disclosed ultrasonic measurement device may also display other information based on a percent worn value for the component, including estimated service times.
It will be apparent to those skilled in the art that various modifications and variations can be made to the disclosed ultrasonic measurement device. Other embodiments will be apparent to those skilled in the art from consideration of the specification and practice of the disclosed ultrasonic measurement device. It is intended that the specification and examples be considered as exemplary only, with a true scope being indicated by the following claims and their equivalents.

Claims

What is claimed is:

1. A wear measurement device for measuring wear of a machine component, the device comprising:

a probe configured to:

generate and send an ultrasonic wave through the component;

generate a first signal upon sending the ultrasonic wave; and

generate a second signal upon receiving the reflected wave;

a display configured to provide a visible output to a user of the device; and

a controller coupled to the probe and the display and comprising a memory and a processor, the processor being configured to receive the first and second signals and to, immediately upon receiving the signals:

determine a measurement of the component based on the signals;

determine a percent worn value for the component based on the measurement and stored component data; and

cause the display to provide the percent worn value as a visible output.

2. The device of claim 1, wherein the component data is stored in the memory of the device.

3. The device of claim 1, wherein the processor is further configured to:

based on the percent worn value, determine a remaining useful life for the component; and

cause the display to provide the remaining useful life as a visible output.

4. The device of claim 3, further comprising:

a global positioning system configured to determine location information for the component and send the location information to the controller;

wherein the remaining useful life is determined based on the location information.

5. The device of claim 3, wherein the remaining useful life is determined based on hours of operation and use application of the component.

6. The device of claim 1, wherein the processor is further configured to:

based on the percent worn value, determine an estimated service interval for the component; and

cause the display to provide the estimated service interval as a visible output.

7. The device of claim 1, wherein the controller is configured to transmit data to a remote storage device for storing the data, and wherein the data includes at least one of the measurement of the component and the percent worn value.

8. A computer-implemented method for determining wear of a machine component, the method comprising:

causing a probe of a measurement device to generate and send an ultrasonic wave through the component by sending a signal to the probe; and

immediately upon receipt of the reflected wave at the probe:

determining a measurement of the component based on receipt of the reflected wave at the probe;

determining a percent worn value for the component based on the measurement and stored component data; and

causing a display of the measurement device to provide the percent worn value as a visible output.

9. The method of claim 8, further comprising:

determining a remaining useful life for the component based on the percent worn value; and

causing the display to provide the remaining useful life as a visible output.

10. The method of claim 9, further comprising:

receiving location information for the component;

11. The method of claim 9, wherein the remaining useful life is determined based on hours of operation and use application of the vehicle.

12. The method of claim 8, further comprising:

determining an estimated service interval for the component based on the percent worn value; and

causing the display to provide the estimated service interval as a visible output.

13. The method of claim 8, further comprising:

transmitting data to a remote storage device for storing the data;

wherein the data includes at least one of the measurement of the component and the percent worn value.

14. A processing circuit for determining wear of a machine component, the processing circuit comprising:

a memory comprising data related to the component; and

a processor coupled to the memory and configured to cause a probe to generate and send an ultrasonic wave by sending a signal to the probe and to, immediately upon receipt of the reflected wave at the probe:

determine a measurement of the component based on receipt of the reflected wave at the probe;

determine a percent worn value for the component by comparing the measurement to the stored component data; and

cause a display to provide the percent worn value as a visible output.

15. The processing circuit of claim 14, wherein the processor is further configured to store the measurement and the percent worn value on the memory.

16. The processing circuit of claim 14, wherein the processor is further configured to:

determine a remaining useful life for the component based on the percent worn value; and

cause the display to provide the remaining useful life as a visible output.

17. The processing circuit of claim 16, wherein the processor is further configured to:

receive location information for the component;

18. The processing circuit of claim 16, wherein the remaining useful life is determined based on hours of operation and use application of the vehicle.

19. The processing circuit of claim 14, wherein the processor is further configured to:

determine an estimated service interval for the component based on the percent worn value; and

20. The processing circuit of claim 14, wherein the processor is further configured to:

transmit data to a remote storage device for storing the data;