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US20130161516A1 - Optical pulse tester using light emitting device - Google Patents

Optical pulse tester using light emitting device Download PDF

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Publication number
US20130161516A1
US20130161516A1 US13/770,458 US201313770458A US2013161516A1 US 20130161516 A1 US20130161516 A1 US 20130161516A1 US 201313770458 A US201313770458 A US 201313770458A US 2013161516 A1 US2013161516 A1 US 2013161516A1
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Prior art keywords
light emitting
active layer
emitting element
wavelength
optical pulse
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Abandoned
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US13/770,458
Inventor
Shintaro MORIMOTO
Hiroshi Mori
Yasuaki Nagashima
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Anritsu Corp
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Anritsu Corp
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Priority to US13/770,458 priority Critical patent/US20130161516A1/en
Publication of US20130161516A1 publication Critical patent/US20130161516A1/en
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/12—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
    • H01S5/1203—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers over only a part of the length of the active region
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
    • H01S5/4087—Array arrangements, e.g. constituted by discrete laser diodes or laser bar emitting more than one wavelength
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
    • H01S5/0287—Facet reflectivity
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/1021—Coupled cavities
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/1092—Multi-wavelength lasing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34306—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength longer than 1000nm, e.g. InP based 1300 and 1500nm lasers

Definitions

  • the present invention relates to an optical pulse tester using a light emitting device.
  • a system which outputs light beams with a plurality of wavelengths is used.
  • a configuration is adopted in which two semiconductor lasers manufactured for respective wavelengths are prepared and output light beams from the semiconductor lasers are mixed to be output (for example, refer to Patent Document 1).
  • the inventor of this application proposes, as a two-wavelength laser light source configured without requiring such a complicated optical system, a semiconductor light emitting element capable of emitting laser beams with a plurality of wavelengths from a single chip by connecting a plurality of active layers with very different gain wavelengths in series and disposing a diffraction grating inside to realize independent oscillation of each wavelength (refer to Patent Document 2).
  • the present invention has been made to solve such a problem, and it is an object of the present invention to suppress an optical output reduction caused by absorption of light, which is emitted and amplified by an active layer for a long wavelength, by carriers leaking from the active layer for a long wavelength when the light passes through an active layer for a short wavelength in a semiconductor light emitting element in which active layers with a plurality of different gain wavelengths are connected in series.
  • an optical pulse tester includes: a light emitting device including: a semiconductor light emitting element having first and second light emitting end facets formed by cleavage, respectively, wherein a plurality of active layers having gain wavelengths in different wavelength ranges are disposed on a semiconductor substrate so as to be optically coupled in a guiding direction of light from the first light emitting end facet toward the second light emitting end facet in order of the length of the gain wavelength, a lower electrode is formed on a bottom surface of the semiconductor substrate and a plurality of upper electrodes for applying a driving current to each of the plurality of active layers is formed above the plurality of active layers, at least one diffraction grating with a Bragg wavelength equivalent to a short gain wavelength is formed near an active layer with the short gain wavelength between two adjacent active layers and near the interface between the two active layers, and light generated in an active layer with a longest gain wavelength oscillates in a resonator formed by the first and second light emitting end facets and light generated in
  • a reflectance with respect to light emitted from the second light emitting end facet is set to be lower than a reflectance with respect to light emitted from the first light emitting end facet.
  • the plurality of active layers may include first and second active layers, the gain wavelength of the first active layer may be 1.52 to 1.58 ⁇ m, and the gain wavelength of the second active layer may be 1.28 to 1.34 ⁇ m.
  • the gain wavelength of the first active layer may be 1.52 to 1.58 ⁇ m
  • the gain wavelength of the second active layer may be 1.28 to 1.34 ⁇ m.
  • the plurality of active layers may include first to third active layers, the gain wavelength of the first active layer may be 1.60 to 1.65 ⁇ m, the gain wavelength of the second active layer may be 1.52 to 1.58 ⁇ m, and the gain wavelength of the third active layer may be 1.28 to 1.34 ⁇ m.
  • the gain wavelength of the first active layer may be 1.60 to 1.65 ⁇ m
  • the gain wavelength of the second active layer may be 1.52 to 1.58 ⁇ m
  • the gain wavelength of the third active layer may be 1.28 to 1.34 ⁇ m.
  • the present invention provides a small and high-performance optical pulse tester using light emitting device including a semiconductor light emitting element capable of emitting light beams with wavelengths in a plurality of wavelength ranges with a high optical output.
  • FIG. 1 is a view showing a light emitting device of a first embodiment of the present invention.
  • FIG. 2 is a view showing another aspect of the light emitting device of the first embodiment of the present invention.
  • FIG. 3 is a view showing a light emitting device of a second embodiment of the present invention.
  • FIG. 4 is a view showing another aspect of the light emitting device of the second embodiment of the present invention.
  • FIG. 5 is a block diagram showing the configuration of an optical pulse tester of a third embodiment of the present invention.
  • FIG. 6 is a view showing the characteristics of a semiconductor light emitting element of the light emitting device of the first embodiment of the present invention.
  • a first embodiment of the light emitting device related to the present invention is shown in FIGS. 1 and 2 .
  • a light emitting device 50 is configured to include a semiconductor light emitting element 10 and a light emitting element driving circuit 2 .
  • the semiconductor light emitting element 10 includes: an n-type semiconductor substrate 11 formed of n-type InP (indium.phosphorus); an n-type InP cladding layer 12 ; a first gain region I having a first active layer 13 a which is formed of InGaAsP (indium.gallium.arsenide.phosphorus) with a gain wavelength ⁇ 1 ; and a second gain region II having a second active layer 13 b which is formed of InGaAsP with a gain wavelength ⁇ 2 ( ⁇ 1 ).
  • the gain wavelength is assumed to be a peak wavelength of a desired longitudinal mode among oscillation wavelengths of a plurality of longitudinal modes which will be described later.
  • wavelengths 1.55 ⁇ m and 1.3 ⁇ m used in an optical pulse tester are used as examples of the gain wavelengths ⁇ 1 and ⁇ 2 for explanation.
  • the gain wavelengths ⁇ 1 and ⁇ 2 may be values in the range of 1.52 ⁇ 1 ⁇ 1.58 and 1.28 ⁇ 2 ⁇ 1.34, respectively.
  • any combination from the respective wavelength ranges of 1.28 to 1.34, 1.47 to 1.50, 1.52 to 1.55, and 1.60 to 1.65 may be selected (in this case, they are selected such that ⁇ 1 > ⁇ 2 is satisfied.
  • the unit is ⁇ m).
  • the first and second active layers 13 a and 13 b are disposed along the guiding direction of light and are optically coupled by the butt-joint method.
  • the first and second active layers 13 a and 13 b referred to herein include a multiplex quantum well (MQW) structure and separate confinement heterostructure (SCH) layers with the MQW structure interposed therebetween.
  • MQW multiplex quantum well
  • SCH separate confinement heterostructure
  • a p-type InP cladding layer 14 and a contact layer 15 which is formed of p-type InGaAs (indium.gallium.arsenide), are laminated in this order on top surfaces of the first and second active layers 13 a and 13 b.
  • a lower electrode 16 is formed on the bottom surface of the n-type semiconductor substrate 11 by vapor deposition, and a first upper electrode 17 a for a first gain region I and a second upper electrode 17 b for a second gain region II are formed on the contact layer 15 by vapor deposition.
  • the semiconductor light emitting element 10 has first and second light emitting end facets 10 a and 10 b formed by cleavage, respectively.
  • a high-reflection (HR) coat 18 a is formed on the first light emitting end facet 10 a and a low-reflection (LR) coat 18 b is formed on the second light emitting end facet 10 b , such that the reflectance with respect to light emitted from the second light emitting end facet 10 b is lower than the reflectance with respect to light emitted from the first light emitting end facet 10 a.
  • the reflectance of the first light emitting end facet 10 a formed with the HR coat 18 a is set to 90% or more and the second light emitting end facet 10 b formed with the LR coat 18 b is set to about 1 to 10%.
  • a diffraction grating 20 having a Bragg wavelength ⁇ g of 1.3 ⁇ m and a coupling coefficient ⁇ of 100 cm ⁇ 1 or more is formed near a butt-joint coupling portion 19 between the first and second active layers 13 a and 13 b.
  • the diffraction grating 20 may be formed in a lower portion of the second active layer 13 b as shown in FIG. 1 , or may be formed within the p-type InP cladding layer 14 above the second active layer 13 b (not shown). In addition, the diffraction grating may also be formed near the first light emitting end facet 10 a of the first gain region I.
  • Patent Document 2 A method of manufacturing the semiconductor light emitting element with such a structure is disclosed in detail in Patent Document 2.
  • the light emitting element driving circuit 2 has a function of applying a driving current between a corresponding upper electrode and a lower electrode in order to make light with a desired wavelength oscillate and also has a function of short-circuiting other upper electrodes to the lower electrode (described in detail later).
  • the operation will be described.
  • a driving current is applied between the first upper electrode 17 a for the first gain region I and the lower electrode 16 , the inside of the first active layer 13 a has a light emitting state.
  • Light with a wavelength of about 1.55 ⁇ m generated in the first active layer 13 a is not absorbed in the second active layer 13 b which has a gain wavelength of 1.3 ⁇ m and is not reflected by the diffraction grating 20 which has the Bragg wavelength ⁇ g of 1.3 ⁇ m, and propagates through the first and second active layers 13 a and 13 b .
  • the light with a wavelength of about 1.55 ⁇ m generated in the first active layer 13 a oscillates in a plurality of longitudinal modes of about 1.55 ⁇ m and is emitted from the second light emitting end facet 10 b which is formed with the LR coat 18 b , in the resonator formed by the first and second light emitting end facets 10 a and 10 b.
  • the inside of the first active layer 13 a has a light emitting state.
  • the isolation resistance between the first and second upper electrodes 17 a and 17 b is limited, a portion of the current leaks into the second active layer 13 b.
  • the second upper electrode 17 b and the lower electrode 16 are made to be short-circuited as shown in FIG. 1 .
  • the laser beam output efficiency based on light emission of the first gain region I is improved.
  • the light with a wavelength of about 1.3 ⁇ m generated in the second active layer 13 b oscillates in a plurality of longitudinal modes of about 1.3 ⁇ m and is emitted from the second light emitting end facet 10 b formed with the LR coat 18 b in the resonator formed by the diffraction grating 20 and the second light emitting end facet 10 b.
  • the saturation of an optical output is suppressed by short-circuiting the other upper electrode to the lower electrode when applying a driving current between one upper electrode and the lower electrode.
  • a high optical output can be realized.
  • by short-circuiting an upper electrode for a short wavelength when making light with a long wavelength oscillate a large effect can be acquired.
  • wavelengths 1.625 ⁇ m, 1.55 ⁇ m, and 1.3 ⁇ m used in an optical pulse tester are used as examples of the gain wavelengths ⁇ 1 , ⁇ 2 , and ⁇ 3 for explanation.
  • the gain wavelengths ⁇ 1 , ⁇ 2 , and ⁇ 3 may be values in the range of 1.60 ⁇ 1 ⁇ 1.65, 1.52 ⁇ 2 ⁇ 1.58, and 1.28 ⁇ 3 ⁇ 1.34, respectively.
  • any combination from the respective wavelength ranges of 1.28 to 1.34, 1.47 to 1.50, 1.52 to 1.55, and 1.60 to 1.65 may be selected (in this case, they are selected such that ⁇ 1 > ⁇ 2 > ⁇ 3 is satisfied.
  • the unit is ⁇ m).
  • FIGS. 3 and 4 are views showing the second embodiment of the light emitting device related to the present invention.
  • a light emitting device 51 is configured to include a semiconductor light emitting element 30 and a light emitting element driving circuit 2 .
  • the semiconductor light emitting element 30 includes a first gain region I having a first active layer 33 a which is formed of InGaAsP with a gain wavelength ⁇ 1 of 1.625 ⁇ m, a second gain region II having a second active layer 33 b which is formed of InGaAsP with a gain wavelength ⁇ 2 of 1.55 ⁇ m, and a third gain region III having a third active layer 33 c which is formed of InGaAsP with a gain wavelength ⁇ 3 of 1.3 ⁇ m.
  • the first, second, and third active layers 33 a , 33 b , and 33 c are disposed in this order along the guiding direction of light and are optically coupled by the butt-joint method.
  • the first, second, and third active layers 33 a , 33 b , and 33 c referred to herein include an MQW structure and SCH layers with the MQW structure interposed therebetween.
  • a lower electrode 16 is formed on the bottom surface of the n-type semiconductor substrate 11 by vapor deposition, and a first upper electrode 37 a for a first gain region I, a second upper electrode 37 b for a second gain region II, and a third upper electrode 37 c for a third gain region III are formed on the contact layer 15 by vapor deposition.
  • the semiconductor light emitting element 30 has first and second light emitting end facets 30 a and 30 b formed by cleavage, respectively. Similar to the first embodiment, an HR coat 18 a is formed on the first light emitting end facet 30 a , and an LR coat 18 b is formed on the second light emitting end facet 30 b.
  • a diffraction grating 40 a having a Bragg wavelength ⁇ ga of 1.55 ⁇ m and a coupling coefficient ⁇ of 100 cm ⁇ 1 or more is formed near a butt-joint coupling portion 39 a between the first and second active layers 33 a and 33 b .
  • the pitch of the diffraction grating 40 a is about 0.24 ⁇ m.
  • a diffraction grating 40 b having a Bragg wavelength ⁇ gb of 1.3 ⁇ m and a coupling coefficient ⁇ of 100 cm ⁇ 1 or more is formed near a butt-joint coupling portion 39 b between the second and third active layers 33 b and 33 c.
  • the diffraction gratings 40 a and 40 b may be formed in lower portions of the second and third active layers 33 b and 33 c as described above and as shown in FIG. 2 , or may be formed within the p-type InP cladding layer 14 above the second active layer 33 b and (or) the third active layer 33 c (not shown).
  • the diffraction grating may also be formed near the first light emitting end facet 30 a of the first gain region I.
  • the operation will be described.
  • the inside of the first active layer 33 a has a light emitting state.
  • Light with a wavelength of about 1.625 ⁇ m generated in the first active layer 33 a is not absorbed in the second active layer 33 b which has a gain wavelength of 1.55 ⁇ m and the third active layer 33 c which has a gain wavelength of 1.3 ⁇ m and is not reflected by the diffraction grating 40 a with the Bragg wavelength ⁇ ga of 1.55 ⁇ m and the diffraction grating 40 b with the Bragg wavelength ⁇ gb of 1.3 ⁇ m, and propagates through the first, second, and third active layers 33 a , 33 b , and 33 c .
  • the light with a wavelength of about 1.625 ⁇ m generated in the first active layer 33 a oscillates in a plurality of longitudinal modes of about 1.625 ⁇ m and is emitted from the second light emitting end facet 30 b formed with the LR coat 18 b , in the resonator formed by the first and second light emitting end facets 30 a and 30 b.
  • the inside of the first active layer 33 a has a light emitting state.
  • the isolation resistance between the first and second upper electrodes 37 a and 37 b is limited, a portion of the current leaks into the second active layer 33 b.
  • the second upper electrode 37 b and the lower electrode 16 are made to be short-circuited.
  • the laser beam output efficiency based on light emission of the first gain region I is improved.
  • the third upper electrode 37 c may also be short-circuited to the lower electrode 16 in addition to short-circuiting the second upper electrode 37 b to the lower electrode 16 , it is clear that it is important to short-circuit the second upper electrode 37 b adjacent to the first gain region I in order to achieve the effect.
  • the inside of the second active layer 33 b has a light emitting state. Since 90% or more of light with a wavelength of about 1.55 ⁇ m generated in the second active layer 33 b is reflected by the diffraction grating 40 a which has a Bragg wavelength ⁇ ga of 1.55 ⁇ m, optical absorption in the first active layer 33 a with a gain wavelength of 1.625 ⁇ m can be suppressed.
  • light with a wavelength of about 1.55 ⁇ m generated in the second active layer 33 b is not absorbed in the third active layer 33 c with a gain wavelength of 1.3 ⁇ m and is not reflected by the diffraction grating 40 b with the Bragg wavelength ⁇ gb of 1.3 ⁇ m, and propagates through the second and third active layers 33 b and 33 c .
  • the light with a wavelength of about 1.55 ⁇ m generated in the second active layer 33 b oscillates in a plurality of longitudinal modes of about 1.55 ⁇ m and is emitted from the second light emitting end facet 30 b formed with the LR coat 18 b in the resonator formed by the diffraction grating 40 a and the second light emitting end facet 30 b.
  • the third upper electrode 37 c is short-circuited to the lower electrode 16 , as described in the first embodiment, in order to suppress a leakage current to the third active layer 33 c , through which light moves back and forth, as a part of the resonator. This greatly improves about 1.55 ⁇ m light wavelength light output especially at the time of a high current.
  • the first upper electrode 37 a may also be short-circuited to the lower electrode 16 simultaneously, the effect is larger when short-circuiting the third upper electrode.
  • the inside of the third active layer 33 c has a light emitting state (not shown).
  • the light with a wavelength of about 1.3 ⁇ m generated in the third active layer 33 c oscillates in a plurality of longitudinal modes of about 1.3 ⁇ m and is emitted from the second light emitting end facet 30 b formed with the LR coat 18 b in the resonator formed by the diffraction grating 40 b and the second light emitting end facet 30 b . Therefore, the optical output is improved by short-circuiting the first upper electrode 37 a and the second upper electrode 37 b as described in the first embodiment, but the effect is small. Moreover, in this case, it is needless to say that short-circuiting the second upper electrode 37 b adjacent to the third gain region III is important.
  • the saturation of an optical output is suppressed by short-circuiting other upper electrodes to the lower electrode when applying a driving current between one upper electrode and the lower electrode.
  • a high optical output can be realized.
  • by short-circuiting an adjacent upper electrode for a short wavelength when making light with a long wavelength oscillate a large effect can be acquired.
  • the light emitting devices 50 and 51 of the first and second embodiments capable of making light beams with wavelengths in a plurality of different wavelength ranges oscillate in a plurality of longitudinal modes can be used as light sources of the optical pulse tester.
  • an embodiment of the optical pulse tester using the light emitting devices 50 and 51 will be described with reference to the accompanying drawings.
  • an optical pulse tester 55 of a third embodiment includes: a light emitting section 1 that has the semiconductor light emitting elements 10 and 30 and a light emitting element driving circuit 2 ′, which applies a pulsed driving current for emitting a optical pulse to the semiconductor light emitting elements 10 and 30 , and that is a light emitting device which outputs to an optical fiber to be measured 3 the optical pulse emitted from the second light emitting end facets 10 b and 30 b of the semiconductor light emitting elements 10 and 30 ; a light receiving section 4 that converts returned light of the optical pulse from the optical fiber to be measured 3 into an electric signal; and a signal processor 5 which analyzes the loss distribution characteristic of the optical fiber to be measured 3 on the basis of the electric signal converted by the light receiving section 4 .
  • the light emitting element driving circuit 2 ′ in the third embodiment applies a pulsed driving current unlike the light emitting element driving circuit 2 in the first and second embodiments.
  • the signal processor 5 controls a timing at which the light emitting element driving circuit 2 ′ applies a driving current to the semiconductor light emitting elements 10 and 30 .
  • the optical pulse tester 55 of the present embodiment includes an optical coupler 7 , which outputs the optical pulse from the light emitting section 1 to a band pass filter (BPF) 6 and also outputs the returned light from the optical fiber to be measured 3 to the light receiving section 4 , an optical connector 8 for optical coupling to the optical fiber to be measured 3 , and a display section 9 which displays a processing result of the signal processor 5 .
  • BPF band pass filter
  • the optical pulse tester 55 of the present embodiment configured as described above will be described.
  • the optical pulse tester 55 of the present embodiment is assumed to include the semiconductor light emitting element 10 .
  • a pulsed driving current is applied to the first gain region I (or the second gain region II) of the semiconductor light emitting element 10 by the light emitting element driving circuit 2 ′, and the second upper electrode 17 b (or the first upper electrode 17 a ) is short-circuited to the lower electrode 16 .
  • an optical pulse of about 1.55 ⁇ m (or about 1.3 ⁇ m) is output from the light emitting section 1 .
  • upper and lower electrodes are short-circuited in a gain region where light is not emitted.
  • the optical pulse output from the light emitting section 1 is incident on the optical fiber to be measured 3 through the optical coupler 7 , the BPF 6 , and the optical connector 8 .
  • the optical pulse incident on the optical fiber to be measured 3 becomes returned light and is received in the light receiving section 4 through the optical coupler 7 .
  • the returned light is converted into an electric signal by the light receiving section 4 and is then input to the signal processor 5 .
  • the loss distribution characteristic of the optical fiber to be measured 3 is calculated by the signal processor 5 .
  • the calculated loss distribution characteristic is displayed on the display section 9 .
  • the optical pulse tester 55 of the present embodiment includes the semiconductor light emitting element capable of making light beams with wavelengths in a plurality of different wavelength ranges oscillate with a high optical output using one element, miniaturization and high performance can be realized.

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Abstract

To provide a small and high-performance optical pulse tester using a light emitting device including semiconductor light emitting element capable of emitting light beams with wavelengths in a plurality of wavelength ranges with a high optical output. An optical pulse tester includes: a light emitting device including a semiconductor light emitting element having first and second light emitting end facets formed by cleavage respectively, and a light emitting element driving circuit which applies a driving current to each of a plurality of active layers; a light receiving section which converts returned light of the optical pulse from the optical fiber to be measured into an electric signal; and a signal processor which analyzes a loss distribution characteristic of the optical fiber to be measured on the basis of the electric signal converted by the light receiving section.

Description

  • This is a divisional of application Ser. No. 13/151,597, filed Jun. 2, 2011.
    • TECHNICAL FIELD
  • The present invention relates to an optical pulse tester using a light emitting device.
    • BACKGROUND ART
  • In the field of optical communication, a system which outputs light beams with a plurality of wavelengths is used. For example, in the case of a system of outputting laser beams with two wavelengths, a configuration is adopted in which two semiconductor lasers manufactured for respective wavelengths are prepared and output light beams from the semiconductor lasers are mixed to be output (for example, refer to Patent Document 1).
  • In contrast, the inventor of this application proposes, as a two-wavelength laser light source configured without requiring such a complicated optical system, a semiconductor light emitting element capable of emitting laser beams with a plurality of wavelengths from a single chip by connecting a plurality of active layers with very different gain wavelengths in series and disposing a diffraction grating inside to realize independent oscillation of each wavelength (refer to Patent Document 2).
    • RELATED ART DOCUMENTS Patent Documents
    • [Patent Document 1] Japanese Unexamined Patent Application Publication No. 2008-209266
    • [Patent Document 2] Japanese Patent Application No. 2009-34080 (Japanese Unexamined Patent Application Publication No. 2010-192601)
    DISCLOSURE OF THE INVENTION Problem that the Invention is to Solve
  • However, in the configuration disclosed in Patent Document 2, when applying a driving current to an active layer for a long wavelength for oscillation, a leakage carrier flows into an adjacent active layer for a short wavelength. Since this causes free carrier absorption, there has been a problem in that output is reduced.
  • The present invention has been made to solve such a problem, and it is an object of the present invention to suppress an optical output reduction caused by absorption of light, which is emitted and amplified by an active layer for a long wavelength, by carriers leaking from the active layer for a long wavelength when the light passes through an active layer for a short wavelength in a semiconductor light emitting element in which active layers with a plurality of different gain wavelengths are connected in series.
    • Means for Solving the Problem
  • According to an aspect of the present invention, an optical pulse tester includes: a light emitting device including: a semiconductor light emitting element having first and second light emitting end facets formed by cleavage, respectively, wherein a plurality of active layers having gain wavelengths in different wavelength ranges are disposed on a semiconductor substrate so as to be optically coupled in a guiding direction of light from the first light emitting end facet toward the second light emitting end facet in order of the length of the gain wavelength, a lower electrode is formed on a bottom surface of the semiconductor substrate and a plurality of upper electrodes for applying a driving current to each of the plurality of active layers is formed above the plurality of active layers, at least one diffraction grating with a Bragg wavelength equivalent to a short gain wavelength is formed near an active layer with the short gain wavelength between two adjacent active layers and near the interface between the two active layers, and light generated in an active layer with a longest gain wavelength oscillates in a resonator formed by the first and second light emitting end facets and light generated in an active layer with a short gain wavelength oscillates in a resonator formed by the diffraction grating and the second light emitting end facet and both the light beams are emitted from the second light emitting end facet; and a light emitting element driving circuit which applies a driving current to each of the plurality of active layers and which short-circuits the upper electrode provided above an active layer with a short gain wavelength to the lower electrode provided on the bottom surface of the semiconductor substrate so that when a driving current is applied to one of the plurality of active layers, a leakage current does not flow into an active layer with a shorter gain wavelength adjacent to the active layer to which the driving current is applied, in which the driving current applied by the light emitting element driving circuit has a pulse form so that the semiconductor light emitting element emits an optical pulse and the light emitting device outputs the optical pulse emitted from the second light emitting end facet of the semiconductor light emitting element to an optical fiber to be measured; a light receiving section which converts returned light of the optical pulse from the optical fiber to be measured into an electric signal; and a signal processor which analyzes a loss distribution characteristic of the optical fiber to be measured on the basis of the electric signal converted by the light receiving section.
  • Through this configuration, since a semiconductor light emitting element capable of making light beams with wavelengths in a plurality of wavelength ranges oscillate in a plurality of longitudinal modes can operate with a high optical output, a small and high-performance optical pulse tester can be realized.
  • Moreover, in the optical pulse tester according to the aspect of the present invention, a reflectance with respect to light emitted from the second light emitting end facet is set to be lower than a reflectance with respect to light emitted from the first light emitting end facet.
  • Moreover, in the optical pulse tester according to the aspect of the present invention, the plurality of active layers may include first and second active layers, the gain wavelength of the first active layer may be 1.52 to 1.58 μm, and the gain wavelength of the second active layer may be 1.28 to 1.34 μm. Through this configuration, light with a wavelength of about 1.3 μm and light with a wavelength of about 1.55 μm can be made to oscillate in a plurality of longitudinal modes using one element.
  • Moreover, in the optical pulse tester according to the aspect of the present invention, the plurality of active layers may include first to third active layers, the gain wavelength of the first active layer may be 1.60 to 1.65 μm, the gain wavelength of the second active layer may be 1.52 to 1.58 μm, and the gain wavelength of the third active layer may be 1.28 to 1.34 μm. Through this configuration, light with a wavelength of about 1.3 μm, light with a wavelength of about 1.55 μm, and light with a wavelength of about 1.625 μm can be made to oscillate in a plurality of longitudinal modes using one element.
    • Advantage of the Invention
  • The present invention provides a small and high-performance optical pulse tester using light emitting device including a semiconductor light emitting element capable of emitting light beams with wavelengths in a plurality of wavelength ranges with a high optical output.
    • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a view showing a light emitting device of a first embodiment of the present invention.
  • FIG. 2 is a view showing another aspect of the light emitting device of the first embodiment of the present invention.
  • FIG. 3 is a view showing a light emitting device of a second embodiment of the present invention.
  • FIG. 4 is a view showing another aspect of the light emitting device of the second embodiment of the present invention.
  • FIG. 5 is a block diagram showing the configuration of an optical pulse tester of a third embodiment of the present invention.
  • FIG. 6 is a view showing the characteristics of a semiconductor light emitting element of the light emitting device of the first embodiment of the present invention.
    •  BEST MODE FOR CARRYING OUT THE INVENTION
  • Hereinafter, embodiments of a semiconductor light emitting element, a driving method of a semiconductor light emitting element, a light emitting device, and an optical pulse tester using a light emitting device of the present invention will be described with reference to the accompanying drawings.
    • First Embodiment
  • A first embodiment of the light emitting device related to the present invention is shown in FIGS. 1 and 2. A light emitting device 50 is configured to include a semiconductor light emitting element 10 and a light emitting element driving circuit 2.
  • As shown in FIGS. 1 and 2, for example, the semiconductor light emitting element 10 includes: an n-type semiconductor substrate 11 formed of n-type InP (indium.phosphorus); an n-type InP cladding layer 12; a first gain region I having a first active layer 13 a which is formed of InGaAsP (indium.gallium.arsenide.phosphorus) with a gain wavelength λ1; and a second gain region II having a second active layer 13 b which is formed of InGaAsP with a gain wavelength λ2 (<λ1).
  • Here, the gain wavelength is assumed to be a peak wavelength of a desired longitudinal mode among oscillation wavelengths of a plurality of longitudinal modes which will be described later. In the present embodiment, wavelengths 1.55 μm and 1.3 μm used in an optical pulse tester are used as examples of the gain wavelengths λ1 and λ2 for explanation. In addition, the gain wavelengths λ1 and λ2 may be values in the range of 1.52≦λ1≦1.58 and 1.28≦λ2≦1.34, respectively.
  • Alternatively, any combination from the respective wavelength ranges of 1.28 to 1.34, 1.47 to 1.50, 1.52 to 1.55, and 1.60 to 1.65 may be selected (in this case, they are selected such that λ1>λ2 is satisfied. The unit is μm).
  • The first and second active layers 13 a and 13 b are disposed along the guiding direction of light and are optically coupled by the butt-joint method. In addition, the first and second active layers 13 a and 13 b referred to herein include a multiplex quantum well (MQW) structure and separate confinement heterostructure (SCH) layers with the MQW structure interposed therebetween.
  • In addition, a p-type InP cladding layer 14 and a contact layer 15, which is formed of p-type InGaAs (indium.gallium.arsenide), are laminated in this order on top surfaces of the first and second active layers 13 a and 13 b.
  • In addition, a lower electrode 16 is formed on the bottom surface of the n-type semiconductor substrate 11 by vapor deposition, and a first upper electrode 17 a for a first gain region I and a second upper electrode 17 b for a second gain region II are formed on the contact layer 15 by vapor deposition.
  • In addition, the semiconductor light emitting element 10 has first and second light emitting end facets 10 a and 10 b formed by cleavage, respectively. A high-reflection (HR) coat 18 a is formed on the first light emitting end facet 10 a and a low-reflection (LR) coat 18 b is formed on the second light emitting end facet 10 b, such that the reflectance with respect to light emitted from the second light emitting end facet 10 b is lower than the reflectance with respect to light emitted from the first light emitting end facet 10 a.
  • Here, it is preferable that the reflectance of the first light emitting end facet 10 a formed with the HR coat 18 a is set to 90% or more and the second light emitting end facet 10 b formed with the LR coat 18 b is set to about 1 to 10%.
  • Moreover, in the second gain region II of the n-type InP cladding layer 12, a diffraction grating 20 having a Bragg wavelength λg of 1.3 μm and a coupling coefficient κ of 100 cm−1 or more is formed near a butt-joint coupling portion 19 between the first and second active layers 13 a and 13 b.
  • In addition, the diffraction grating 20 may be formed in a lower portion of the second active layer 13 b as shown in FIG. 1, or may be formed within the p-type InP cladding layer 14 above the second active layer 13 b (not shown). In addition, the diffraction grating may also be formed near the first light emitting end facet 10 a of the first gain region I.
  • A method of manufacturing the semiconductor light emitting element with such a structure is disclosed in detail in Patent Document 2.
  • The light emitting element driving circuit 2 has a function of applying a driving current between a corresponding upper electrode and a lower electrode in order to make light with a desired wavelength oscillate and also has a function of short-circuiting other upper electrodes to the lower electrode (described in detail later).
  • Next, a driving method of the semiconductor light emitting element 10 in the light emitting device 50 of the present embodiment configured as described above will be described.
  • First, the operation will be described. When a driving current is applied between the first upper electrode 17 a for the first gain region I and the lower electrode 16, the inside of the first active layer 13 a has a light emitting state. Light with a wavelength of about 1.55 μm generated in the first active layer 13 a is not absorbed in the second active layer 13 b which has a gain wavelength of 1.3 μm and is not reflected by the diffraction grating 20 which has the Bragg wavelength λg of 1.3 μm, and propagates through the first and second active layers 13 a and 13 b. The light with a wavelength of about 1.55 μm generated in the first active layer 13 a oscillates in a plurality of longitudinal modes of about 1.55 μm and is emitted from the second light emitting end facet 10 b which is formed with the LR coat 18 b, in the resonator formed by the first and second light emitting end facets 10 a and 10 b.
  • As described above, when a driving current is applied between the first upper electrode 17 a for the first gain region I and the lower electrode 16, the inside of the first active layer 13 a has a light emitting state. However, since the isolation resistance between the first and second upper electrodes 17 a and 17 b is limited, a portion of the current leaks into the second active layer 13 b.
  • Therefore, in the driving method of the present invention, when emitting light in the first gain region I, the second upper electrode 17 b and the lower electrode 16 are made to be short-circuited as shown in FIG. 1. As a result, since optical absorption caused by carriers when a leakage current from the first gain region I flows through the second gain region II is suppressed, the laser beam output efficiency based on light emission of the first gain region I is improved.
  • As shown in FIG. 6, this greatly improves the saturation conditions of 1.55 μm light output especially at the time of a high current. Accordingly, a high-output operation is realized. Since an output of 200 mW or more from the second light emitting end facet is obtained, high performance of 35 dB or more is obtained as a dynamic range when this is used for an optical time domain reflectometer which is a representative example of the optical pulse tester.
  • On the other hand, when a driving current is applied between the second upper electrode 17 b for the second gain region II and the lower electrode 16 as shown in FIG. 2, the inside of the second active layer 13 b has a light emitting state.
  • Light with a wavelength of about 1.3 μm generated in the second active layer 13 b propagates through the second active layer 13 b. Since 90% or more of this 1.3 μm light is reflected by the diffraction grating 20 which has a Bragg wavelength λg of 1.3 μm, optical absorption in the first active layer 13 a with a gain wavelength of 1.55 μm is suppressed. Therefore, the light with a wavelength of about 1.3 μm generated in the second active layer 13 b oscillates in a plurality of longitudinal modes of about 1.3 μm and is emitted from the second light emitting end facet 10 b formed with the LR coat 18 b in the resonator formed by the diffraction grating 20 and the second light emitting end facet 10 b.
  • In this case, most of the light with a wavelength of about 1.3 μm generated in the second active layer 13 b is hardly incident on the first active layer 13 a. Accordingly, the effect obtained by short-circuiting the first upper electrode 17 a as shown in FIG. 6 becomes smaller than that in the above case.
  • As described above, in the driving method of the semiconductor light emitting element in the light emitting device of the present embodiment, the saturation of an optical output is suppressed by short-circuiting the other upper electrode to the lower electrode when applying a driving current between one upper electrode and the lower electrode. As a result, a high optical output can be realized. In particular, by short-circuiting an upper electrode for a short wavelength when making light with a long wavelength oscillate, a large effect can be acquired.
    • Second Embodiment
  • A second embodiment of the light emitting device related to the present invention will be described with reference to the accompanying drawings. The same configuration as in the first embodiment will not be described. In the present embodiment, wavelengths 1.625 μm, 1.55 μm, and 1.3 μm used in an optical pulse tester are used as examples of the gain wavelengths λ1, λ2, and λ3 for explanation. In addition, the gain wavelengths λ1, λ2, and λ3 may be values in the range of 1.60≦λ1≦1.65, 1.52≦λ2≦1.58, and 1.28≦λ3≦1.34, respectively.
  • Alternatively, any combination from the respective wavelength ranges of 1.28 to 1.34, 1.47 to 1.50, 1.52 to 1.55, and 1.60 to 1.65 may be selected (in this case, they are selected such that λ1>λ2>λ3 is satisfied. The unit is μm).
  • FIGS. 3 and 4 are views showing the second embodiment of the light emitting device related to the present invention. A light emitting device 51 is configured to include a semiconductor light emitting element 30 and a light emitting element driving circuit 2.
  • As shown in FIGS. 3 and 4, the semiconductor light emitting element 30 includes a first gain region I having a first active layer 33 a which is formed of InGaAsP with a gain wavelength λ1 of 1.625 μm, a second gain region II having a second active layer 33 b which is formed of InGaAsP with a gain wavelength λ2 of 1.55 μm, and a third gain region III having a third active layer 33 c which is formed of InGaAsP with a gain wavelength λ3 of 1.3 μm.
  • The first, second, and third active layers 33 a, 33 b, and 33 c are disposed in this order along the guiding direction of light and are optically coupled by the butt-joint method. In addition, the first, second, and third active layers 33 a, 33 b, and 33 c referred to herein include an MQW structure and SCH layers with the MQW structure interposed therebetween.
  • In addition, a lower electrode 16 is formed on the bottom surface of the n-type semiconductor substrate 11 by vapor deposition, and a first upper electrode 37 a for a first gain region I, a second upper electrode 37 b for a second gain region II, and a third upper electrode 37 c for a third gain region III are formed on the contact layer 15 by vapor deposition.
  • In addition, the semiconductor light emitting element 30 has first and second light emitting end facets 30 a and 30 b formed by cleavage, respectively. Similar to the first embodiment, an HR coat 18 a is formed on the first light emitting end facet 30 a, and an LR coat 18 b is formed on the second light emitting end facet 30 b.
  • Moreover, in the second gain region II of the n-type InP cladding layer 12, a diffraction grating 40 a having a Bragg wavelength λga of 1.55 μm and a coupling coefficient κ of 100 cm−1 or more is formed near a butt-joint coupling portion 39 a between the first and second active layers 33 a and 33 b. Here, the pitch of the diffraction grating 40 a is about 0.24 μm.
  • Similarly, in the third gain region III of the n-type InP cladding layer 12, a diffraction grating 40 b having a Bragg wavelength λgb of 1.3 μm and a coupling coefficient κ of 100 cm−1 or more is formed near a butt-joint coupling portion 39 b between the second and third active layers 33 b and 33 c.
  • In addition, the diffraction gratings 40 a and 40 b may be formed in lower portions of the second and third active layers 33 b and 33 c as described above and as shown in FIG. 2, or may be formed within the p-type InP cladding layer 14 above the second active layer 33 b and (or) the third active layer 33 c (not shown). In addition, the diffraction grating may also be formed near the first light emitting end facet 30 a of the first gain region I.
  • Next, a driving method of the semiconductor light emitting element 30 in the light emitting device 51 of the present embodiment configured as described above will be described.
  • First, the operation will be described. As shown in FIG. 3, when a driving current is applied between the first upper electrode 37 a for the first gain region I and the lower electrode 16, the inside of the first active layer 33 a has a light emitting state. Light with a wavelength of about 1.625 μm generated in the first active layer 33 a is not absorbed in the second active layer 33 b which has a gain wavelength of 1.55 μm and the third active layer 33 c which has a gain wavelength of 1.3 μm and is not reflected by the diffraction grating 40 a with the Bragg wavelength λga of 1.55 μm and the diffraction grating 40 b with the Bragg wavelength λgb of 1.3 μm, and propagates through the first, second, and third active layers 33 a, 33 b, and 33 c. The light with a wavelength of about 1.625 μm generated in the first active layer 33 a oscillates in a plurality of longitudinal modes of about 1.625 μm and is emitted from the second light emitting end facet 30 b formed with the LR coat 18 b, in the resonator formed by the first and second light emitting end facets 30 a and 30 b.
  • As described above, when a driving current is applied between the first upper electrode 37 a for the first gain region I and the lower electrode 16, the inside of the first active layer 33 a has a light emitting state. However, since the isolation resistance between the first and second upper electrodes 37 a and 37 b is limited, a portion of the current leaks into the second active layer 33 b.
  • Therefore, in the driving method of the present invention, when emitting light in the first gain region I, the second upper electrode 37 b and the lower electrode 16 are made to be short-circuited. As a result, since optical absorption caused by carriers when a leakage current from the first gain region I flows through the second gain region II is suppressed, the laser beam output efficiency based on light emission of the first gain region I is improved. Although the third upper electrode 37 c may also be short-circuited to the lower electrode 16 in addition to short-circuiting the second upper electrode 37 b to the lower electrode 16, it is clear that it is important to short-circuit the second upper electrode 37 b adjacent to the first gain region I in order to achieve the effect.
  • This significantly suppresses the saturation of 1.625 μm light output especially at the time of a high current. Accordingly, a high-output operation is realized.
  • On the other hand, when a driving current is applied between the second upper electrode 37 b for the second gain region II and the lower electrode 16 as shown in FIG. 4, the inside of the second active layer 33 b has a light emitting state. Since 90% or more of light with a wavelength of about 1.55 μm generated in the second active layer 33 b is reflected by the diffraction grating 40 a which has a Bragg wavelength λga of 1.55 μm, optical absorption in the first active layer 33 a with a gain wavelength of 1.625 μm can be suppressed. In addition, light with a wavelength of about 1.55 μm generated in the second active layer 33 b is not absorbed in the third active layer 33 c with a gain wavelength of 1.3 μm and is not reflected by the diffraction grating 40 b with the Bragg wavelength λgb of 1.3 μm, and propagates through the second and third active layers 33 b and 33 c. The light with a wavelength of about 1.55 μm generated in the second active layer 33 b oscillates in a plurality of longitudinal modes of about 1.55 μm and is emitted from the second light emitting end facet 30 b formed with the LR coat 18 b in the resonator formed by the diffraction grating 40 a and the second light emitting end facet 30 b.
  • Also in this case, the third upper electrode 37 c is short-circuited to the lower electrode 16, as described in the first embodiment, in order to suppress a leakage current to the third active layer 33 c, through which light moves back and forth, as a part of the resonator. This greatly improves about 1.55 μm light wavelength light output especially at the time of a high current. Although the first upper electrode 37 a may also be short-circuited to the lower electrode 16 simultaneously, the effect is larger when short-circuiting the third upper electrode.
  • On the other hand, when a current is applied between the third upper electrode 37 c for the third gain regions III and the lower electrode 16, the inside of the third active layer 33 c has a light emitting state (not shown).
  • Since 90% or more of light with a wavelength of 1.3 μm generated in the third active layer 33 c is reflected by the diffraction grating 40 b which has a Bragg wavelength λgb of 1.3 μm, optical absorption in the first active layer 33 a with a gain wavelength of 1.625 μm and the second active layer 33 b with a gain wavelength of 1.55 μm can be suppressed. The light with a wavelength of about 1.3 μm generated in the third active layer 33 c oscillates in a plurality of longitudinal modes of about 1.3 μm and is emitted from the second light emitting end facet 30 b formed with the LR coat 18 b in the resonator formed by the diffraction grating 40 b and the second light emitting end facet 30 b. Therefore, the optical output is improved by short-circuiting the first upper electrode 37 a and the second upper electrode 37 b as described in the first embodiment, but the effect is small. Moreover, in this case, it is needless to say that short-circuiting the second upper electrode 37 b adjacent to the third gain region III is important.
  • As described above, in the driving method of the semiconductor light emitting element in the light emitting device of the present embodiment, the saturation of an optical output is suppressed by short-circuiting other upper electrodes to the lower electrode when applying a driving current between one upper electrode and the lower electrode. As a result, a high optical output can be realized. In particular, by short-circuiting an adjacent upper electrode for a short wavelength when making light with a long wavelength oscillate, a large effect can be acquired.
    • Third Embodiment
  • The light emitting devices 50 and 51 of the first and second embodiments capable of making light beams with wavelengths in a plurality of different wavelength ranges oscillate in a plurality of longitudinal modes can be used as light sources of the optical pulse tester. Hereinafter, an embodiment of the optical pulse tester using the light emitting devices 50 and 51 will be described with reference to the accompanying drawings.
  • As shown in FIG. 5, an optical pulse tester 55 of a third embodiment includes: a light emitting section 1 that has the semiconductor light emitting elements 10 and 30 and a light emitting element driving circuit 2′, which applies a pulsed driving current for emitting a optical pulse to the semiconductor light emitting elements 10 and 30, and that is a light emitting device which outputs to an optical fiber to be measured 3 the optical pulse emitted from the second light emitting end facets 10 b and 30 b of the semiconductor light emitting elements 10 and 30; a light receiving section 4 that converts returned light of the optical pulse from the optical fiber to be measured 3 into an electric signal; and a signal processor 5 which analyzes the loss distribution characteristic of the optical fiber to be measured 3 on the basis of the electric signal converted by the light receiving section 4.
  • The light emitting element driving circuit 2′ in the third embodiment applies a pulsed driving current unlike the light emitting element driving circuit 2 in the first and second embodiments.
  • In addition, the signal processor 5 controls a timing at which the light emitting element driving circuit 2′ applies a driving current to the semiconductor light emitting elements 10 and 30.
  • In addition, the optical pulse tester 55 of the present embodiment includes an optical coupler 7, which outputs the optical pulse from the light emitting section 1 to a band pass filter (BPF) 6 and also outputs the returned light from the optical fiber to be measured 3 to the light receiving section 4, an optical connector 8 for optical coupling to the optical fiber to be measured 3, and a display section 9 which displays a processing result of the signal processor 5.
  • Next, an operation of the optical pulse tester 55 of the present embodiment configured as described above will be described. In addition, in the following explanation, the optical pulse tester 55 of the present embodiment is assumed to include the semiconductor light emitting element 10.
  • First, a pulsed driving current is applied to the first gain region I (or the second gain region II) of the semiconductor light emitting element 10 by the light emitting element driving circuit 2′, and the second upper electrode 17 b (or the first upper electrode 17 a) is short-circuited to the lower electrode 16. Then, an optical pulse of about 1.55 μm (or about 1.3 μm) is output from the light emitting section 1.
  • In this case, upper and lower electrodes are short-circuited in a gain region where light is not emitted.
  • In addition, the optical pulse output from the light emitting section 1 is incident on the optical fiber to be measured 3 through the optical coupler 7, the BPF 6, and the optical connector 8. The optical pulse incident on the optical fiber to be measured 3 becomes returned light and is received in the light receiving section 4 through the optical coupler 7.
  • The returned light is converted into an electric signal by the light receiving section 4 and is then input to the signal processor 5. Then, the loss distribution characteristic of the optical fiber to be measured 3 is calculated by the signal processor 5. The calculated loss distribution characteristic is displayed on the display section 9.
  • As described above, since the optical pulse tester 55 of the present embodiment includes the semiconductor light emitting element capable of making light beams with wavelengths in a plurality of different wavelength ranges oscillate with a high optical output using one element, miniaturization and high performance can be realized.
    • DESCRIPTION OF REFERENCE NUMERALS AND SIGNS
      • 1: light emitting section (light emitting device)
      • 2, 2′: light emitting element driving circuit
      • 3: optical fiber to be measured
      • 4: light receiving section
      • 5: signal processor
      • 10, 30: semiconductor light emitting element
      • 10 a, 30 a: first light emitting end facet
      • 10 b, 30 b: second light emitting end facet
      • 13 a, 33 a: first active layer
      • 13 b, 33 b: second active layer
      • 18 a: high-reflection (HR) coat
      • 18 b: low-reflection (LR) coat
      • 19, 39 a, 39 b: butt-joint coupling portion (interface)
      • 20, 40 a, 40 b: diffraction grating
      • 33 c: third active layer
      • 50, 51: light emitting device
      • 55: optical pulse tester

Claims (6)

1. An optical pulse tester comprising:
a light emitting device including: a semiconductor light emitting element having first and second light emitting end facets formed by cleavage respectively, in which a plurality of active layers having gain wavelengths in different wavelength ranges are disposed on a semiconductor substrate so as to be optically coupled in a guiding direction of light from the first light emitting end facet toward the second light emitting end facet in order of the length of the gain wavelength, a lower electrode is formed on a bottom surface of the semiconductor substrate and a plurality of upper electrodes for applying a driving current to each of the plurality of active layers is formed above the plurality of active layers, at least one diffraction grating with a Bragg wavelength equivalent to a short gain wavelength is formed near an active layer with the short gain wavelength between two adjacent active layers and near the interface between the two active layers, and light generated in an active layer with a longest gain wavelength oscillates in a resonator formed by the first and second light emitting end facets and light generated in an active layer with a short gain wavelength oscillates in a resonator formed by the diffraction grating and the second light emitting end facet and both the light beams are emitted from the second light emitting end facet; and a light emitting element driving circuit which applies a driving current to each of the plurality of active layers and which short-circuits the upper electrode provided above an active layer with a short gain wavelength to the lower electrode provided on the bottom surface of the semiconductor substrate so that when a driving current is applied to one of the plurality of active layers, a leakage current does not flow into an active layer with a shorter gain wavelength adjacent to the active layer to which the driving current is applied, in which the driving current applied by the light emitting element driving circuit has a pulse form so that the semiconductor light emitting element emits an optical pulse and the light emitting device outputs the optical pulse emitted from the second light emitting end facet of the semiconductor light emitting element to an optical fiber to be measured;
a light receiving section which converts returned light of the optical pulse from the optical fiber to be measured into an electric signal; and
a signal processor which analyzes a loss distribution characteristic of the optical fiber to be measured on the basis of the electric signal converted by the light receiving section.
2. The optical pulse tester according to claim 1,
wherein a reflectance with respect to light emitted from the second light emitting end facet of the semiconductor light emitting element is set to be lower than a reflectance with respect to light emitted from the first light emitting end facet of the semiconductor light emitting element.
3. The optical pulse tester according to claim 1,
wherein the plurality of active layers of the semiconductor light emitting element includes first and second active layers,
the gain wavelength of the first active layer is 1.52 to 1.58 μm, and
the gain wavelength of the second active layer is 1.28 to 1.34 p.m.
4. The optical pulse tester according to claim 2,
wherein the plurality of active layers of the semiconductor light emitting element includes first and second active layers,
the gain wavelength of the first active layer is 1.52 to 1.58 μm, and
the gain wavelength of the second active layer is 1.28 to 1.34 μm.
5. The optical pulse tester according to claim 1,
wherein the plurality of active layers of the semiconductor light emitting element includes first to third active layers,
the gain wavelength of the first active layer is 1.60 to 1.65 μm,
the gain wavelength of the second active layer is 1.52 to 1.58 μm, and
the gain wavelength of the third active layer is 1.28 to 1.34 μm.
6. The optical pulse tester according to claim 2,
wherein the plurality of active layers of the semiconductor light emitting element includes first to third active layers,
the gain wavelength of the first active layer is 1.60 to 1.65 μm,
the gain wavelength of the second active layer is 1.52 to 1.58 μm, and
the gain wavelength of the third active layer is 1.28 to 1.34 μm.
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0575093A (en) * 1991-09-13 1993-03-26 Nippon Telegr & Teleph Corp <Ntt> Integrated optical circuit
US5708674A (en) * 1995-01-03 1998-01-13 Xerox Corporation Semiconductor laser or array formed by layer intermixing
US5717707A (en) * 1995-01-03 1998-02-10 Xerox Corporation Index guided semiconductor laser diode with reduced shunt leakage currents
SE507376C2 (en) * 1996-09-04 1998-05-18 Ericsson Telefon Ab L M Wavelength tunable laser device
JP2004153136A (en) * 2002-10-31 2004-05-27 Sharp Corp Semiconductor laser device and method of manufacturing the same
JP4926641B2 (en) * 2006-10-18 2012-05-09 日本電信電話株式会社 Semiconductor laser
US8184671B2 (en) * 2006-10-31 2012-05-22 Anritsu Corporation Semiconductor optical element, semiconductor laser using the semiconductor optical element, and optical transponder using the semiconductor laser
JP2008209266A (en) 2007-02-27 2008-09-11 Yokogawa Electric Corp Bidirectional optical module and optical pulse tester
JP5069262B2 (en) 2009-02-17 2012-11-07 アンリツ株式会社 Semiconductor light emitting device and optical pulse tester using the same

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CN102377108B (en) 2014-04-09
US8401044B2 (en) 2013-03-19
JP2012064921A (en) 2012-03-29
US20120044481A1 (en) 2012-02-23
CN102377108A (en) 2012-03-14

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