US20130040543A1 - Polishing pad and method for making the same - Google Patents
Polishing pad and method for making the same Download PDFInfo
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- US20130040543A1 US20130040543A1 US13/655,042 US201213655042A US2013040543A1 US 20130040543 A1 US20130040543 A1 US 20130040543A1 US 201213655042 A US201213655042 A US 201213655042A US 2013040543 A1 US2013040543 A1 US 2013040543A1
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- Prior art keywords
- polishing pad
- grinding layer
- holes
- polishing
- polymer
- Prior art date
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- Abandoned
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- 238000005498 polishing Methods 0.000 title claims abstract description 93
- 238000000034 method Methods 0.000 title claims abstract description 15
- 239000000463 material Substances 0.000 claims abstract description 42
- 239000002861 polymer material Substances 0.000 claims abstract description 19
- 230000006835 compression Effects 0.000 claims abstract description 6
- 238000007906 compression Methods 0.000 claims abstract description 6
- 239000000835 fiber Substances 0.000 claims description 22
- 229920000642 polymer Polymers 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 6
- 239000004744 fabric Substances 0.000 claims description 5
- 239000002952 polymeric resin Substances 0.000 claims description 4
- 229920003002 synthetic resin Polymers 0.000 claims description 4
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 3
- 239000004677 Nylon Substances 0.000 claims description 2
- 238000007605 air drying Methods 0.000 claims description 2
- 230000001112 coagulating effect Effects 0.000 claims description 2
- 238000001035 drying Methods 0.000 claims description 2
- 239000006260 foam Substances 0.000 claims description 2
- 229920001778 nylon Polymers 0.000 claims description 2
- 238000011084 recovery Methods 0.000 claims description 2
- 230000002238 attenuated effect Effects 0.000 abstract description 4
- 230000000694 effects Effects 0.000 abstract description 4
- 239000002245 particle Substances 0.000 abstract description 4
- 239000007788 liquid Substances 0.000 abstract description 3
- 239000000853 adhesive Substances 0.000 description 4
- 239000002002 slurry Substances 0.000 description 4
- 238000007517 polishing process Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000005304 optical glass Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
Definitions
- the present invention relates to a polishing pad and method for making the same, in particular, to a polishing pad with a grinding layer directly formed on the surface of a base material and a method for making the same.
- a polishing process is performed on a rough surface through chemical mechanical polishing (CMP).
- CMP chemical mechanical polishing
- a slurry containing polishing particles is uniformly distributed on the surface of a polishing pad.
- the polishing workpiece may be a semiconductor, a storage medium base material, an integrated circuit, an LCD flat panel glass, optical glass, or a photoelectric panel.
- a polishing pad is made by means of multi-layer adhesion.
- a grinding layer is adhered to a base material through a self-adhesive (referring to a multi-layer polishing pad disclosed in R.O.C. Patent Publication No. M269996), or a grinding layer made by adhesion of a plurality of thin layers is adhered to a base material through a self-adhesive (referring to a multi-layer polishing pad used for CMP disclosed in R.O.C. Patent Publication No. 200513348).
- the above conventional polishing pads are immersed in a slurry, as the grinding layer, the base material, and the self-adhesive used for adhering are made of different materials and have different compression ratios, stress is easily generated. Further, after immersion in the slurry for a long time, the adhesiveness of the self-adhesive is gradually reduced, thus resulting in unevenness of the surface of the polishing pad.
- the polishing machine applies a pressure to polish a polishing workpiece, protrusions on the surface of the polishing pad may cause serious abrasion of the grinding layer as well as scratches on the surface of the polishing workpiece.
- the conventional polishing pads are limited by the thickness of the grinding layer. If no long holes are formed for storing the slurry and chippings generated after polishing, the holes may be filled with the chippings generated after polishing and easily become smaller. As a result, the polishing effect is reduced, and the service life of the polishing pad is shortened.
- the present invention is directed to a polishing pad having a base material and a grinding layer.
- the base material is formed by covering a fiber layer with a polymer and has a surface.
- the grinding layer is bonded to the surface and has a plurality of holes.
- the present invention is further directed to a method for making a polishing pad.
- the method includes: (a) providing a base material formed by covering a fiber layer with a polymer and having a surface; (b) forming a liquid-state polymer material on the surface; and (c) solidifying the liquid-state polymer material to form a grinding layer.
- the grinding layer is bonded to the surface and has a plurality of holes.
- the liquid-state polymer material is directly formed on the surface of the base material, and is then solidified to form the flat grinding layer, which makes the polishing pad very even and flat.
- the grinding layer has attenuated structures and holes, which increases the ability to store the polishing particles distributed in a polishing liquid.
- the polishing pad has high compression ratio, so the polishing pad can compactly contact a polishing workpiece, and will not scratch the surface of the polishing workpiece. Therefore, the polishing effect and quality will be improved.
- FIG. 1 is a schematic view of a polishing pad of the present invention
- FIG. 2 is a schematic view of another aspect of a polishing pad according to the present invention.
- FIG. 3 is a flow chart of a method for making a polishing pad according to the present invention.
- the present invention provides a polishing pad used in a chemical mechanical polishing (CMP) process for polishing or planarizing a polishing workpiece.
- the polishing workpiece includes, but is not limited to, a semiconductor, a storage medium base material, an integrated circuit, an LCD flat panel glass, optical glass, and a photoelectric panel.
- FIG. 1 is a schematic view of a polishing pad of the present invention.
- the polishing pad 1 includes a base material 11 and a grinding layer 12 .
- the base material 11 is formed by covering a fiber layer 112 with a polymer 111 , and has a surface 113 .
- the surface 113 is flattened.
- the fiber layer 112 is made of a cloth material (for example, a non-woven cloth).
- the polymer 111 is continuous foam.
- the polymer 111 is selected from PU, PP, PET, or polymer resin.
- the material of the fiber layer 112 is selected from at least one of PP, PET, or nylon.
- the grinding layer 12 is bonded to the surface 113 of the base material 11 , and is disposed on the surface 113 of the base material 11 . That is, the grinding layer 12 does not extend into the interior of the base material 11 , so that the polishing pad 1 is a double layered structure.
- the grinding layer 12 has a plurality of holes 121 and a polishing surface 122 .
- the holes 121 are columnar-like cells, and each of the columnar-like cells 121 is in a shape of column rather than in a shape of water drop.
- the distribution thickness of the holes 121 is at least half of the total thickness of the grinding layer 12 . That is, the holes 121 are distributed over a thickness that is at least one half of the overall thickness of the grinding layer 12 .
- the depth of some of the columnar-like cells 121 is greater than one half of the overall thickness of the grinding layer 12 .
- the columnar-like cells 121 properly communicate with each other.
- the holes 121 extend toward the polishing surface 122 of the grinding layer 12 , and are substantially perpendicular to the polishing surface 122 of the grinding layer 12 .
- Some of the holes 121 are completely disposed inside the grinding layer 12 , that is, some of the holes 121 are embedded in the grinding layer 12 , and completely enclosed by the grinding layer 12 . Therefore, some of the holes 121 do not have opening on the polishing surface 122 of the grinding layer 12 .
- the polishing pad 1 has a compression ratio of 5% to 50%, a recovery ratio greater than 80%, a thickness of 0.5 to 3.0 mm, and a density of 0.2 to 0.6 g/cm 3 .
- the grinding layer 12 is not only attached to the surface 113 of the base material 11 , but also covers the fibers 114 of the fiber layer 112 .
- the grinding layer 12 is bonded to the base material 11 more stably.
- FIG. 3 is a flow chart of a method for making a polishing pad according to the present invention.
- a base material 11 is provided.
- the base material 11 is formed by covering a fiber layer 112 with a polymer 111 , and has a surface 113 .
- the base material 11 is formed through the following steps. First, a fiber substrate is provided. Then, the fiber substrate is immersed in a polymer solution, so that the polymer solution covers the fiber substrate. Finally, the polymer solution is solidified to form the base material 11 .
- a liquid-state polymer material is formed on the surface of the base material 11 .
- the liquid-state polymer material is formed on the surface 113 of the base material 11 by coating, but not limited to coating.
- the liquid-state polymer material can be formed on the surface 113 of the base material 11 in other manners.
- the liquid-state polymer material is selected from at least one of PU, PP, PET, or polymer resin.
- Step S 23 the liquid-state polymer material is solidified to form a grinding layer 12 , so as to complete the polishing pad 1 of the present invention.
- the grinding layer 12 is bonded to the surface 113 of the base material 11 and has a plurality of holes 121 .
- the liquid-state polymer material can be solidified by natural drying or air drying.
- the flat surface (the polishing surface 122 ) is further immersed in and contacts a liquid-state polymer material in a coagulating basin, so as to form the holes 121 of the grinding layer 12 through single surface exchange.
- the grinding layer 12 grows into the attenuated structure.
- the grinding layer 12 is disposed on the surface 113 of the base material 11 . That is, the grinding layer 12 does not extend into the interior of the base material 11 , so that the polishing pad 1 is a double layered structure.
- the holes 121 are columnar-like cells, and each of the columnar-like cells 121 is in a shape of column rather than in a shape of water drop.
- the holes 121 are distributed over a thickness that is at least one half of the overall thickness of the grinding layer 12 .
- the holes 121 extend toward the polishing surface 122 of the grinding layer 12 , and are substantially perpendicular to the polishing surface 122 of the grinding layer 12 .
- Some of the holes 121 are completely disposed inside the grinding layer 12 , that is, some of the holes 121 are embedded in the grinding layer 12 , and completely enclosed by the grinding layer 12 . Therefore, some of the holes 121 do not have opening on the polishing surface 122 of the grinding layer 12 .
- the liquid-state polymer material is directly formed on the surface 113 of the base material 11 , and is then solidified to form the flat grinding layer 12 , which makes the polishing pad very even and flat.
- the grinding layer 12 has attenuated structures and the holes 121 , which increases the ability to store the polishing particles distributed in a polishing liquid.
- the polishing pad 1 has high compression ratio, so the polishing pad 1 can compactly contact a polishing workpiece, and will not scratch the surface of the polishing workpiece. Therefore, the polishing effect and quality will be improved.
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
The present invention relates to a polishing pad and method for making the same. In the invention, a liquid-state polymer material is directly formed on the surface of a base material, and then the liquid-state polymer material is solidified to form a flat grinding layer. Whereby, the polishing pad has high unity and flatness. The grinding layer has attenuated structures and a plurality of holes, thus increasing the storage ability of polishing particles distributed in a polishing liquid. In addition, the polishing pad has high compression ratio, so the polishing pad can compactly contact a polishing workpiece, and will not scratch the surface of the polishing workpiece scratched. Therefore, the polishing effect and quality will be improved.
Description
- This application is a Continuation-in-part of the pending U.S. Pat. application Ser. No. 12/208,520 filed on Sep. 11, 2008, all of which is hereby incorporated by reference in its entirety.
- Although incorporated by reference in its entirety, no arguments or disclaimers made in the parent application apply to this CIP application. Any disclaimer that may have occurred during the prosecution of the above-referenced application(s) is hereby expressly rescinded. Consequently, the Patent Office is asked to review the new set of claims in view of the entire prior art of record and any search that the Office deems appropriate.
- 1. Field of the Invention
- The present invention relates to a polishing pad and method for making the same, in particular, to a polishing pad with a grinding layer directly formed on the surface of a base material and a method for making the same.
- 2. Description of the Related Art
- Generally speaking, a polishing process is performed on a rough surface through chemical mechanical polishing (CMP). In the polishing process, a slurry containing polishing particles is uniformly distributed on the surface of a polishing pad. After a polishing workpiece is pressed on the polishing pad, a repetitious and regular rubbing and polishing action is performed thereon. The polishing workpiece may be a semiconductor, a storage medium base material, an integrated circuit, an LCD flat panel glass, optical glass, or a photoelectric panel.
- In the prior art, a polishing pad is made by means of multi-layer adhesion. For example, a grinding layer is adhered to a base material through a self-adhesive (referring to a multi-layer polishing pad disclosed in R.O.C. Patent Publication No. M269996), or a grinding layer made by adhesion of a plurality of thin layers is adhered to a base material through a self-adhesive (referring to a multi-layer polishing pad used for CMP disclosed in R.O.C. Patent Publication No. 200513348).
- After the above conventional polishing pads are immersed in a slurry, as the grinding layer, the base material, and the self-adhesive used for adhering are made of different materials and have different compression ratios, stress is easily generated. Further, after immersion in the slurry for a long time, the adhesiveness of the self-adhesive is gradually reduced, thus resulting in unevenness of the surface of the polishing pad. In addition, during the polishing process, when the polishing machine applies a pressure to polish a polishing workpiece, protrusions on the surface of the polishing pad may cause serious abrasion of the grinding layer as well as scratches on the surface of the polishing workpiece.
- Moreover, the conventional polishing pads are limited by the thickness of the grinding layer. If no long holes are formed for storing the slurry and chippings generated after polishing, the holes may be filled with the chippings generated after polishing and easily become smaller. As a result, the polishing effect is reduced, and the service life of the polishing pad is shortened.
- Consequently, there is an existing need for a polishing pad and a method for making the same to solve the above-mentioned problems.
- Accordingly, the present invention is directed to a polishing pad having a base material and a grinding layer. The base material is formed by covering a fiber layer with a polymer and has a surface. The grinding layer is bonded to the surface and has a plurality of holes.
- The present invention is further directed to a method for making a polishing pad. The method includes: (a) providing a base material formed by covering a fiber layer with a polymer and having a surface; (b) forming a liquid-state polymer material on the surface; and (c) solidifying the liquid-state polymer material to form a grinding layer. The grinding layer is bonded to the surface and has a plurality of holes.
- In the present invention, the liquid-state polymer material is directly formed on the surface of the base material, and is then solidified to form the flat grinding layer, which makes the polishing pad very even and flat. The grinding layer has attenuated structures and holes, which increases the ability to store the polishing particles distributed in a polishing liquid. In addition, the polishing pad has high compression ratio, so the polishing pad can compactly contact a polishing workpiece, and will not scratch the surface of the polishing workpiece. Therefore, the polishing effect and quality will be improved.
-
FIG. 1 is a schematic view of a polishing pad of the present invention; -
FIG. 2 is a schematic view of another aspect of a polishing pad according to the present invention; and -
FIG. 3 is a flow chart of a method for making a polishing pad according to the present invention. - The present invention provides a polishing pad used in a chemical mechanical polishing (CMP) process for polishing or planarizing a polishing workpiece. The polishing workpiece includes, but is not limited to, a semiconductor, a storage medium base material, an integrated circuit, an LCD flat panel glass, optical glass, and a photoelectric panel.
-
FIG. 1 is a schematic view of a polishing pad of the present invention. Thepolishing pad 1 includes abase material 11 and agrinding layer 12. In this embodiment, thebase material 11 is formed by covering afiber layer 112 with apolymer 111, and has asurface 113. Preferably, thesurface 113 is flattened. Thefiber layer 112 is made of a cloth material (for example, a non-woven cloth). In this embodiment, thepolymer 111 is continuous foam. In addition, thepolymer 111 is selected from PU, PP, PET, or polymer resin. The material of thefiber layer 112 is selected from at least one of PP, PET, or nylon. - The
grinding layer 12 is bonded to thesurface 113 of thebase material 11, and is disposed on thesurface 113 of thebase material 11. That is, thegrinding layer 12 does not extend into the interior of thebase material 11, so that thepolishing pad 1 is a double layered structure. Thegrinding layer 12 has a plurality ofholes 121 and apolishing surface 122. Theholes 121 are columnar-like cells, and each of the columnar-like cells 121 is in a shape of column rather than in a shape of water drop. Preferably, the distribution thickness of theholes 121 is at least half of the total thickness of thegrinding layer 12. That is, theholes 121 are distributed over a thickness that is at least one half of the overall thickness of thegrinding layer 12. In this embodiment, the depth of some of the columnar-like cells 121 is greater than one half of the overall thickness of thegrinding layer 12. The columnar-like cells 121 properly communicate with each other. In this embodiment, theholes 121 extend toward thepolishing surface 122 of thegrinding layer 12, and are substantially perpendicular to thepolishing surface 122 of thegrinding layer 12. Some of theholes 121 are completely disposed inside thegrinding layer 12, that is, some of theholes 121 are embedded in thegrinding layer 12, and completely enclosed by thegrinding layer 12. Therefore, some of theholes 121 do not have opening on the polishingsurface 122 of the grindinglayer 12. - In this embodiment, the
polishing pad 1 has a compression ratio of 5% to 50%, a recovery ratio greater than 80%, a thickness of 0.5 to 3.0 mm, and a density of 0.2 to 0.6 g/cm3. - Further, in other applications, some of the
fibers 114 in thefiber layer 112 are exposed on thesurface 113 of thebase material 11, and are further covered by the grinding layer 12 (as shown inFIG. 2 ). Therefore, the grindinglayer 12 is not only attached to thesurface 113 of thebase material 11, but also covers thefibers 114 of thefiber layer 112. Thus, the grindinglayer 12 is bonded to thebase material 11 more stably. -
FIG. 3 is a flow chart of a method for making a polishing pad according to the present invention. As shown inFIGS. 2 and 3 , first, in Step S21, abase material 11 is provided. Thebase material 11 is formed by covering afiber layer 112 with apolymer 111, and has asurface 113. In this embodiment, thebase material 11 is formed through the following steps. First, a fiber substrate is provided. Then, the fiber substrate is immersed in a polymer solution, so that the polymer solution covers the fiber substrate. Finally, the polymer solution is solidified to form thebase material 11. - Next, in Step S22, a liquid-state polymer material is formed on the surface of the
base material 11. In this embodiment, the liquid-state polymer material is formed on thesurface 113 of thebase material 11 by coating, but not limited to coating. Obviously, the liquid-state polymer material can be formed on thesurface 113 of thebase material 11 in other manners. In addition, the liquid-state polymer material is selected from at least one of PU, PP, PET, or polymer resin. - Afterwards, in Step S23, the liquid-state polymer material is solidified to form a grinding
layer 12, so as to complete thepolishing pad 1 of the present invention. The grindinglayer 12 is bonded to thesurface 113 of thebase material 11 and has a plurality ofholes 121. In this solidification step, the liquid-state polymer material can be solidified by natural drying or air drying. - It should be noted that, after the liquid-state polymer material is formed on the
surface 113 of thebase material 11 and then solidified to form a flat surface (the polishing surface 122), the flat surface (the polishing surface 122) is further immersed in and contacts a liquid-state polymer material in a coagulating basin, so as to form theholes 121 of the grindinglayer 12 through single surface exchange. Thus, the grindinglayer 12 grows into the attenuated structure. The grindinglayer 12 is disposed on thesurface 113 of thebase material 11. That is, the grindinglayer 12 does not extend into the interior of thebase material 11, so that thepolishing pad 1 is a double layered structure. Theholes 121 are columnar-like cells, and each of the columnar-like cells 121 is in a shape of column rather than in a shape of water drop. Preferably, theholes 121 are distributed over a thickness that is at least one half of the overall thickness of the grindinglayer 12. In this embodiment, theholes 121 extend toward the polishingsurface 122 of the grindinglayer 12, and are substantially perpendicular to the polishingsurface 122 of the grindinglayer 12. Some of theholes 121 are completely disposed inside the grindinglayer 12, that is, some of theholes 121 are embedded in the grindinglayer 12, and completely enclosed by the grindinglayer 12. Therefore, some of theholes 121 do not have opening on the polishingsurface 122 of the grindinglayer 12. - In the present invention, the liquid-state polymer material is directly formed on the
surface 113 of thebase material 11, and is then solidified to form theflat grinding layer 12, which makes the polishing pad very even and flat. The grindinglayer 12 has attenuated structures and theholes 121, which increases the ability to store the polishing particles distributed in a polishing liquid. In addition, thepolishing pad 1 has high compression ratio, so thepolishing pad 1 can compactly contact a polishing workpiece, and will not scratch the surface of the polishing workpiece. Therefore, the polishing effect and quality will be improved. - While the embodiments of the present invention have been illustrated and described, various modifications and improvements can be made by those skilled in the art. The embodiments of the present invention are to therefore described in an illustrative but not restrictive sense. It is intended that the present invention may not be limited to the particular forms as illustrated, and that all modifications that maintain the spirit and scope of the present invention are within the scope as defined in the appended claims.
Claims (17)
1. A polishing pad, comprising:
a base material, formed by covering a fiber layer with a polymer, and having a surface; and
a grinding layer, bonded to the surface, and having a plurality of holes, wherein each of the holes is in a shape of column, the holes are distributed over a thickness that is at least one half of the overall thickness of the grinding layer, the depth of some of the holes is greater than one half of the overall thickness of the grinding layer, and the holes communicate with each other, some of the holes are completely disposed inside the grinding layer.
2. The polishing pad according to claim 1 , wherein the fiber layer is made of a cloth material.
3. The polishing pad according to claim 2 , wherein the cloth material is a non-woven cloth.
4. The polishing pad according to claim 1 , wherein the material of the fiber layer is selected from PP, PET, or nylon.
5. The polishing pad according to claim 1 , wherein the polymer is continuous foam.
6. The polishing pad according to claim 5 , wherein the polymer is selected from PU, PP, PET, or polymer resin.
7. The polishing pad according to claim 1 , wherein the surface is flattened, and the grinding layer is made of one material selected from PU, PP, PET, or polymer resin.
8. The polishing pad according to claim 1 , wherein some fibers in the fiber layer are exposed on the surface, and are further covered by the grinding layer.
9. The polishing pad according to claim 1 , wherein the compression ratio of the polishing pad is 5% to 50%.
10. The polishing pad according to claim 1 , wherein the recovery ratio of the polishing pad is greater than 80%.
11. The polishing pad according to claim 1 , wherein a thickness of the polishing pad is 0.5 to 3.0 mm.
12. The polishing pad according to claim 1 , wherein the density of the polishing pad is 0.2 to 0.6 g/cm3.
13. A method for making a polishing pad, comprising:
(a) providing a base material, wherein the base material is formed by covering a fiber layer with a polymer and has a surface;
(b) forming a liquid-state polymer material on the surface; and
(c) solidifying the liquid-state polymer material to form a grinding layer, wherein the grinding layer is bonded to the surface and has a flat surface; and
(d) immersing the flat surface of the grinding layer in a coagulating basin, so as to form a plurality of holes in the grinding layer through single surface exchange, wherein each of the holes is in a shape of column rather than in a shape of water drop, the holes are distributed over a thickness that is at least one half of the overall thickness of the grinding layer, the depth of some of the holes is greater than one half of the overall thickness of the grinding layer, the holes communicate with each other, and some of the holes are completely disposed inside the grinding layer.
14. The making method according to claim 13 , wherein Step (a) further comprises:
(a1) providing a fiber substrate;
(a2) immersing the fiber substrate in a polymer solution, so that the polymer solution covers the fiber substrate; and
(a3) solidifying the polymer solution to form the base material.
15. The making method according to claim 13 , wherein in Step (b), the liquid-state polymer material is formed on the surface by coating.
16. The making method according to claim 13 , wherein in Step (c), to the liquid-state polymer material is solidified by natural drying.
17. The making method according to claim 13 , wherein in Step (c), the liquid-state polymer material is solidified by air drying.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/655,042 US20130040543A1 (en) | 2008-09-11 | 2012-10-18 | Polishing pad and method for making the same |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/208,520 US20090258578A1 (en) | 2008-04-11 | 2008-09-11 | Polishing pad and method for making the same |
| US13/655,042 US20130040543A1 (en) | 2008-09-11 | 2012-10-18 | Polishing pad and method for making the same |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US12/208,520 Continuation-In-Part US20090258578A1 (en) | 2008-04-11 | 2008-09-11 | Polishing pad and method for making the same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US20130040543A1 true US20130040543A1 (en) | 2013-02-14 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US13/655,042 Abandoned US20130040543A1 (en) | 2008-09-11 | 2012-10-18 | Polishing pad and method for making the same |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | US20130040543A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10702970B2 (en) * | 2017-01-06 | 2020-07-07 | San Fang Chemical Industry Co., Ltd. | Polishing pad and polishing apparatus |
| US11545365B2 (en) * | 2019-05-13 | 2023-01-03 | Chempower Corporation | Chemical planarization |
| US20230077988A1 (en) * | 2021-09-03 | 2023-03-16 | Chempower Corporation | Tools for chemical planarization |
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|---|---|---|---|---|
| US20020040098A1 (en) * | 2000-06-29 | 2002-04-04 | Kuraray Co., Ltd. | Aqueous dispersion |
| US20020081946A1 (en) * | 2000-06-30 | 2002-06-27 | Scott Diane B. | Base-pad for a polishing pad |
| US20040248508A1 (en) * | 2003-06-09 | 2004-12-09 | Lombardo Brian Scott | Controlled penetration subpad |
| US20060029790A1 (en) * | 2003-05-09 | 2006-02-09 | Troy Polymers, Inc. | Foam articles |
-
2012
- 2012-10-18 US US13/655,042 patent/US20130040543A1/en not_active Abandoned
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020040098A1 (en) * | 2000-06-29 | 2002-04-04 | Kuraray Co., Ltd. | Aqueous dispersion |
| US20020081946A1 (en) * | 2000-06-30 | 2002-06-27 | Scott Diane B. | Base-pad for a polishing pad |
| US20060029790A1 (en) * | 2003-05-09 | 2006-02-09 | Troy Polymers, Inc. | Foam articles |
| US20040248508A1 (en) * | 2003-06-09 | 2004-12-09 | Lombardo Brian Scott | Controlled penetration subpad |
Non-Patent Citations (1)
| Title |
|---|
| Japanese Patent Publication 2002-264006 Translation, Retrieved on 6/13/2012, Pages 1-6 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10702970B2 (en) * | 2017-01-06 | 2020-07-07 | San Fang Chemical Industry Co., Ltd. | Polishing pad and polishing apparatus |
| US11545365B2 (en) * | 2019-05-13 | 2023-01-03 | Chempower Corporation | Chemical planarization |
| US20230077988A1 (en) * | 2021-09-03 | 2023-03-16 | Chempower Corporation | Tools for chemical planarization |
| US12500088B2 (en) * | 2021-09-03 | 2025-12-16 | Chempower Corporation | Tools for chemical planarization |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AS | Assignment |
Owner name: SAN FANG CHEMICAL INDUSTRY CO., LTD., TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:FENG, CHUNG-CHIH;WANG, CHUN-TA;HUNG, YUNG-CHANG;AND OTHERS;REEL/FRAME:029359/0194 Effective date: 20121115 |
|
| STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |