US20130026421A1 - Composition and method for preparation of organic electronic devices - Google Patents
Composition and method for preparation of organic electronic devices Download PDFInfo
- Publication number
- US20130026421A1 US20130026421A1 US13/640,408 US201113640408A US2013026421A1 US 20130026421 A1 US20130026421 A1 US 20130026421A1 US 201113640408 A US201113640408 A US 201113640408A US 2013026421 A1 US2013026421 A1 US 2013026421A1
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- 239000000203 mixture Substances 0.000 title claims abstract description 122
- 238000000034 method Methods 0.000 title claims abstract description 40
- 238000002360 preparation method Methods 0.000 title claims abstract description 7
- 239000002904 solvent Substances 0.000 claims abstract description 77
- 239000003960 organic solvent Substances 0.000 claims abstract description 29
- 238000013086 organic photovoltaic Methods 0.000 claims abstract description 22
- 239000007787 solid Substances 0.000 claims abstract description 17
- 238000009835 boiling Methods 0.000 claims abstract description 14
- 239000012530 fluid Substances 0.000 claims abstract description 14
- -1 naphthalene compound Chemical class 0.000 claims description 104
- 150000001875 compounds Chemical class 0.000 claims description 88
- 239000000463 material Substances 0.000 claims description 69
- 125000004432 carbon atom Chemical group C* 0.000 claims description 65
- 125000003118 aryl group Chemical group 0.000 claims description 52
- 239000000758 substrate Substances 0.000 claims description 34
- 238000000151 deposition Methods 0.000 claims description 26
- 229910052731 fluorine Inorganic materials 0.000 claims description 25
- 229910052801 chlorine Inorganic materials 0.000 claims description 20
- 125000000217 alkyl group Chemical group 0.000 claims description 19
- 125000004122 cyclic group Chemical group 0.000 claims description 19
- 239000000080 wetting agent Substances 0.000 claims description 19
- 238000002844 melting Methods 0.000 claims description 18
- 230000008018 melting Effects 0.000 claims description 18
- 229910052760 oxygen Inorganic materials 0.000 claims description 18
- 238000007639 printing Methods 0.000 claims description 18
- 125000003545 alkoxy group Chemical group 0.000 claims description 15
- 239000011230 binding agent Substances 0.000 claims description 15
- 229910052794 bromium Inorganic materials 0.000 claims description 15
- 125000001072 heteroaryl group Chemical group 0.000 claims description 15
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 15
- 229910052717 sulfur Inorganic materials 0.000 claims description 14
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- 238000000576 coating method Methods 0.000 claims description 12
- 125000005842 heteroatom Chemical group 0.000 claims description 12
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- 229910052757 nitrogen Inorganic materials 0.000 claims description 11
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- 125000005843 halogen group Chemical group 0.000 claims description 10
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- 125000006165 cyclic alkyl group Chemical group 0.000 claims description 8
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- 229910052739 hydrogen Inorganic materials 0.000 claims description 8
- 239000003446 ligand Substances 0.000 claims description 8
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- 125000001424 substituent group Chemical group 0.000 claims description 8
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- 125000004453 alkoxycarbonyl group Chemical group 0.000 claims description 6
- 125000004429 atom Chemical group 0.000 claims description 6
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- 125000005248 alkyl aryloxy group Chemical group 0.000 claims description 5
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- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 claims description 5
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- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 claims description 5
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- 150000001491 aromatic compounds Chemical class 0.000 claims description 4
- 125000003917 carbamoyl group Chemical group [H]N([H])C(*)=O 0.000 claims description 4
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- 125000002485 formyl group Chemical group [H]C(*)=O 0.000 claims description 4
- 125000005067 haloformyl group Chemical group 0.000 claims description 4
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 claims description 4
- 125000002462 isocyano group Chemical group *[N+]#[C-] 0.000 claims description 4
- 125000002950 monocyclic group Chemical group 0.000 claims description 4
- JUJWROOIHBZHMG-UHFFFAOYSA-N pyridine Substances C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 claims description 4
- ZMZDMBWJUHKJPS-UHFFFAOYSA-M thiocyanate group Chemical group [S-]C#N ZMZDMBWJUHKJPS-UHFFFAOYSA-M 0.000 claims description 4
- NONOKGVFTBWRLD-UHFFFAOYSA-N thioisocyanate group Chemical group S(N=C=O)N=C=O NONOKGVFTBWRLD-UHFFFAOYSA-N 0.000 claims description 4
- 229910052718 tin Inorganic materials 0.000 claims description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 3
- PCNDJXKNXGMECE-UHFFFAOYSA-N Phenazine Natural products C1=CC=CC2=NC3=CC=CC=C3N=C21 PCNDJXKNXGMECE-UHFFFAOYSA-N 0.000 claims description 3
- 229910052796 boron Inorganic materials 0.000 claims description 3
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical group [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 3
- JCXJVPUVTGWSNB-UHFFFAOYSA-N nitrogen dioxide Inorganic materials O=[N]=O JCXJVPUVTGWSNB-UHFFFAOYSA-N 0.000 claims description 3
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical class [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 2
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 claims description 2
- 230000005669 field effect Effects 0.000 claims description 2
- 150000002390 heteroarenes Chemical class 0.000 claims description 2
- HZVOZRGWRWCICA-UHFFFAOYSA-N methanediyl Chemical class [CH2] HZVOZRGWRWCICA-UHFFFAOYSA-N 0.000 claims description 2
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- 125000003367 polycyclic group Chemical group 0.000 claims description 2
- 239000000976 ink Substances 0.000 abstract description 22
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- QIMMUPPBPVKWKM-UHFFFAOYSA-N 2-methylnaphthalene Chemical compound C1=CC=CC2=CC(C)=CC=C21 QIMMUPPBPVKWKM-UHFFFAOYSA-N 0.000 description 14
- SDDBCEWUYXVGCQ-UHFFFAOYSA-N 1,5-dimethylnaphthalene Chemical compound C1=CC=C2C(C)=CC=CC2=C1C SDDBCEWUYXVGCQ-UHFFFAOYSA-N 0.000 description 11
- 238000002161 passivation Methods 0.000 description 11
- 239000003989 dielectric material Substances 0.000 description 10
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- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
- 150000001412 amines Chemical class 0.000 description 9
- 238000009472 formulation Methods 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 9
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 8
- 239000000654 additive Substances 0.000 description 8
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- 239000007788 liquid Substances 0.000 description 7
- 239000011159 matrix material Substances 0.000 description 7
- BEZDDPMMPIDMGJ-UHFFFAOYSA-N pentamethylbenzene Chemical compound CC1=CC(C)=C(C)C(C)=C1C BEZDDPMMPIDMGJ-UHFFFAOYSA-N 0.000 description 7
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- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 6
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- 108091006146 Channels Proteins 0.000 description 5
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- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 4
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D5/00—Coating compositions, e.g. paints, varnishes or lacquers, characterised by their physical nature or the effects produced; Filling pastes
- C09D5/22—Luminous paints
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
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Definitions
- the present invention relates to novel compositions comprising an organic semiconducting compound (OSC), to their use as conducting inks for the preparation of organic electronic (OE) devices, especially organic photovoltaic (OPV) cells and OLED devices, to methods for preparing OE devices using the novel formulations, and to OE devices and OPV cells prepared from such methods and compositions.
- OSC organic semiconducting compound
- OE organic electronic
- OLED organic photovoltaic
- OE devices like OFETs or OPV cells
- usually printing or coating techniques like inkjet printing, roll to roll printing, slot dye coating or flexographic/gravure printing are used to apply the OSC layer.
- these techniques need the use of solvents in high amounts.
- surfactants can be used. These additives are especially needed with regard to small molecular OSC or polymeric OSC having a low molecular weight.
- conventional surfactants or wetting agents is disclosed, e.g. in WO 2009/049744. However, no explicit examples are mentioned.
- the amounts of surfactants needed are high in relation to the amount of OSC material in the ink formulation.
- compositions comprising special solvents in order to achieve specific viscosity.
- the specific viscosity is needed to apply the composition via application methods as roll to roll printing, slot dye coating or flexographic/gravure printing etc. without the need of using high amounts of polymeric binder.
- these binders can be used as optional components.
- the compositions may comprise wetting agents as mentioned above.
- JP 2001-288416 discloses a coating liquid composition dissolved or dispersed in at least two organic solvents comprising a liquid solvent and a solid solvent. Using a combination of a liquid solvent and a solid solvent provides a thin film having a functional material in a highly dispersed isotropic state.
- OE devices as disclosed in WO 2009/049744, WO 2009/109273 and JP 2001-288416 show useful efficiencies and lifetimes. However, it is a permanent desire to improve the performance of the OSC layer, such as efficiency, lifetime and sensitivity regarding oxidation or water.
- the composition subsequently applied comprises a solvent which does not dissolve the existing film.
- a solvent which does not dissolve the existing film is usually called orthogonal solvent approach.
- organic semiconducting compounds of the existing film and the semiconducting compounds of the subsequently applied composition have similar properties and are soluble in similar solvents such approach is difficult to achieve.
- compositions comprising an OSC that are suitable for the preparation of OE devices, especially thin film transistors, diodes, OLED displays and OPV cells, which allow the manufacture of high efficient OE devices having a high performance, a long lifetime and a low sensitivity against water or oxidation.
- One aim of the present invention is to provide such improved compositions.
- Another aim is to provide improved methods of preparing an OE device from such compositions.
- Another aim is to provide improved OE devices obtained from such compositions and methods.
- another aim is to provide improved methods for preparing multilayer devices. Further aims are immediately evident to the person skilled in the art from the following description.
- the present invention relates to a composition
- a composition comprising one or more organic semiconducting compounds (OSC), and one or more organic solvents, characterized in that said composition is solid at a temperature of 25° C. and fluid at a higher temperature and the boiling point of the solvent is at most 400° C.
- OSC organic semiconducting compounds
- the present invention further relates to the use of a composition as described above and below as coating or printing ink, especially for the preparation of OE devices, in particular for thin film transistors, diodes, OLED devices and rigid or flexible organic photovoltaic (OPV) cells and devices.
- a composition as described above and below as coating or printing ink, especially for the preparation of OE devices, in particular for thin film transistors, diodes, OLED devices and rigid or flexible organic photovoltaic (OPV) cells and devices.
- OOV organic photovoltaic
- the present invention further relates to a process of preparing an organic electronic (OE) device, comprising the steps of
- the present invention further relates to an OE device prepared from a composition and/or by a process as described above and below.
- the OE devices include, without limitation, organic field effect transistors (OFET), integrated circuits (IC), thin film transistors (TFT), Radio Frequency Identification (RFID) tags, organic light emitting diodes (OLED), organic light emitting transistors (OLET), electroluminescent displays, organic photovoltaic (OPV) cells, organic solar cells (O—SC), flexible OPVs and O—SCs, organic laserdiodes (O-laser), organic integrated circuits (O—IC), lighting devices, sensor devices, electrode materials, photoconductors, photodetectors, electrophotographic recording devices, capacitors, charge injection layers, Schottky diodes, planarising layers, anti-static films, conducting substrates, conducting patterns, photoconductors, electrophotographic devices, organic memory devices, biosensors and biochips.
- OFET organic field effect transistors
- IC integrated circuits
- TFT thin film transistors
- RFID Radio Frequency Identification
- OLED organic light emitting diodes
- OLET organic light emitting transistor
- the present invention provides organic light emitting diodes (OLED).
- OLED devices can for example be used for illumination, for medical illumination purposes, as signalling device, as signage devices, and in displays. Displays can be addressed using passive matrix driving, total matrix addressing or active matrix driving. Transparent OLEDs can be manufactured by using optically transparent electrodes. Flexible OLEDs are assessable through the use of flexible substrates.
- compositions, methods and devices of the present invention provide surprising improvements in the efficiency of the OE devices and the production thereof. Unexpectedly, the performance, the lifetime and the efficiency of the OE devices can be improved, if these devices are achieved by using a composition of the present invention. Furthermore, the composition of the present invention provides an astonishingly high level of film forming. Especially, the homogeneity and the quality of the films can be improved. In addition thereto, the present invention enables better printing of multi layer devices.
- FIG. 1A exemplarily and schematically depicts a typical bottom gate (BG), top contact (TC) OFET device according to the present invention, comprising a substrate ( 1 ), a gate electrode ( 2 ), a layer of dielectric material ( 3 ) (also known as gate insulator layer), an OSC layer ( 4 ), and source and drain (S/D) electrodes ( 5 ), and an optional passivation or protection layer ( 6 ).
- BG bottom gate
- TC top contact
- FIG. 1A exemplarily and schematically depicts a typical bottom gate (BG), top contact (TC) OFET device according to the present invention, comprising a substrate ( 1 ), a gate electrode ( 2 ), a layer of dielectric material ( 3 ) (also known as gate insulator layer), an OSC layer ( 4 ), and source and drain (S/D) electrodes ( 5 ), and an optional passivation or protection layer ( 6 ).
- FIG. 1B exemplarily and schematically depicts a typical bottom gate (BG), bottom contact (BC) OFET device according to the present invention, comprising a substrate ( 1 ), a gate electrode ( 2 ), a dielectric layer ( 3 ), S/D electrodes ( 5 ), an OSC layer ( 4 ), and an optional passivation or protection layer ( 6 ).
- BG bottom gate
- BC bottom contact
- FIG. 1B exemplarily and schematically depicts a typical bottom gate (BG), bottom contact (BC) OFET device according to the present invention, comprising a substrate ( 1 ), a gate electrode ( 2 ), a dielectric layer ( 3 ), S/D electrodes ( 5 ), an OSC layer ( 4 ), and an optional passivation or protection layer ( 6 ).
- FIG. 2 exemplarily and schematically depicts a top gate (TG) OFET device according to the present invention, comprising a substrate ( 1 ), source and drain electrodes ( 5 ), an OSC layer ( 4 ), a dielectric layer ( 3 ), and a gate electrode ( 2 ), and an optional passivation or protection layer ( 6 ).
- TG top gate
- FIGS. 3 and 4 exemplarily and schematically depict typical and preferred OPV devices according to the present invention.
- FIG. 5 depicts the transistor characteristic and the linear and saturation mobility of the device.
- the present invention provides a composition being solid at a temperature of 25° C. and fluid at a higher temperature.
- These type of coating compositions or printing inks can be called hot melt formulation based on the fact that the application of such compositions is performed at temperatures above 25° C.
- said composition is solid at a temperature of 30° C., especially 35° C., particularly 40° C., more preferably 50° C. and most preferably 60° C.
- the term solid means that the viscosity of the ink is very high such that the composition cannot be applied by usual printing techniques. Therefore, a composition comprising a viscosity of at least 500 Pas at the temperatures as mentioned above and below (especially 25° C.) is considered solid.
- the viscosity values are measured with a parallel plate rotational viscometer or rheometer (TA Instruments) at a shear rate of 500 s ⁇ 1 , unless stated otherwise.
- the composition of the present invention is preferably fluid at a temperature of 200° C. or less, especially 150° C. or less, more preferably 120° C. or less, and most preferably 100° C. or less.
- fluid means that the viscosity of the ink is in a range such that the composition can be processed by usual printing techniques as mentioned above and below. Therefore, a composition comprising a viscosity in the range of 0.1 to 2000 mPas at the temperatures as mentioned above and below (200° C., 150° C., 120° C. and 100° C., respectively) is considered fluid.
- the viscosity values are measured with a parallel plate rotational viscometer or rheometer (TA Instruments) at a sheer rate of 500 s ⁇ 1 , unless stated otherwise.
- the composition has a viscosity in the range of 0.25 to 100 mPas, especially 1.0 to 40 mPas, more preferably in the range of 2.0 to 20 mPas and most preferably in the range of 2.1 to 15 mPas.
- the viscosity is determined at a shear rate of 500 s ⁇ 1 by measuring on AR-G2 rheometer manufactured by TA Instruments. This is measured using parallel plate geometry.
- the temperature to determine the viscosity is preferably about 10° C. above the melting point of the solvent having the highest boiling point. If merely fluid solvents are used, the viscosity can be determined at a processing temperature of the composition.
- the composition of the present invention comprises a surface tension in the range of 20 to 60 mN/m, more preferably 25 to 45 mN/m.
- the surface tension can be measured using a FTA (First Ten Angstrom) 125 contact angle goniometer as mentioned above and below.
- the surface tension can be achieved by selection the polymeric binder and the solvent in an appropriate manner.
- the surface tension can be achieved by using a wetting agent, preferably a volatile wetting agent as mentioned below.
- the temperature to determine the surface tension is preferably about 10° C. above the melting point of the solvent having the highest boiling point.
- the composition can be filtered e.g. to 1 micron or less.
- the composition of the present invention comprises one or more solvents.
- the solvents are preferably selected from the group consisting of aromatic hydrocarbons, like toluene, o-, m- or p-xylene, trimethylbenzenes (e.g. 1,2,3-, 1,2,4- and 1,3,5-trimethylbenzenes), tetralin, other mono-, di-, tri- and tetraalkylbenzenes (e.g. diethylbenzenes, methylcumene, tetramethylbenzenes etc), aromatic ethers (e.g. anisole, alkylanisoles, e.g.
- aromatic esters e.g alkylbenzoates
- aromatic ketones e.g. acetophenone, propiophenone
- alkylketones e.g. cyclohexanone
- aromatic ketones e.g benzophenone
- heteroaromatic solvents e.g.
- thiophene mono-, di- and trialkylthiophenes, 2-alkyl-thiazoles, benzthiazoles etc, pyridines), halogenaryls and aniline derivatives.
- solvents may comprise halogen atoms.
- one or more additives can be used.
- solvents can be used being solid at 25° C. and fluid, preferably liquid at higher temperatures. Using these solvents provides astonishingly improvements regarding the performance of the organic electronic devices being obtained using the inventive compositions.
- the solvent is solid at a temperature of 25° C., particularly of 30° C., especially of 35° C., particularly of 40° C., more preferably of 50° C. and most preferably of 60° C.
- the term solid is used as mentioned above with regard to the composition.
- the solvent has a melting point at a temperature of 25° C. or above, particularly 30° C. or above, especially 35° C. or above, particularly 40° C. or above, more preferably 50° C. or above and most preferably 60° C. or above.
- the solvent is fluid at a temperature of 200° C. or less, especially 150° C. or less, more preferably 120° C. or less, and most preferably 100° C. or less.
- the term fluid is used as mentioned above with regard to the composition.
- the solvent has a melting point at a temperature of 200° C. or less, especially 150° C. or less, more preferably 120° C. or less, and most preferably 100° C. or less.
- the organic solvent preferably comprises an aromatic and/or heteroaromatic compound, especially an aromatic compound, and more preferably an aromatic hydrocarbon compound.
- the organic solvent may comprise a benzene compound, a pyridine compound, a pyrazine compound, a pyrazole compound having a molecular weight of at least 120 g/mol, especially at least 130 g/mol and more preferably at least 140 g/mol, a sulphone compound, a sulfolane compound, an alcohol compound, and/or a naphthalene compound.
- Preferred benzene compounds include, e.g. 1,2,4,5-tetramethylbenzene, pentamethylbenzene and hexamethylbenzene.
- Preferred naphthalene compounds include, e.g. 2-methylnaphthalene, 1,5-dimethylnaphthalene and 2-ethoxynaphthalene.
- Astonishing improvements can be achieved by a mixture of organic solvent.
- the solvent mixture may comprise at least one benzene compound, especially having a molecular weight of at least 120 g/mol, especially at least 130 g/mol.
- specific mixtures may comprise at least one naphthalene compound.
- solvents can be used as mixture of two, three or more.
- the solvent has a boiling point or sublimation temperature of ⁇ 400° C., especially ⁇ 350° C., more preferably ⁇ 270° C., most preferably ⁇ 250° C., at the pressure employed, very preferably at atmospheric pressure (1013 hPa). Evaporation can also be accelerated e.g. by applying heat and/or reduced pressure.
- the organic solvent can comprise a surface tension in the range of 15 to 80 mN/m, more preferably 25 mN/m to 45 mN/m.
- the surface tension can be measured using a FTA (First Ten Angstrom) 125 contact angle goniometer. Details of the method are available from First Ten Angstrom as published by Roger P. Woodward, Ph.D. “Surface Tension Measurements Using the Drop Shape Method”.
- the pendant drop method can be used to determine the surface tension.
- the temperature for determining the surface tension is preferably in the range of about 30° C. to 200° C., especially 60° C. to 150° C. and more preferably 80° C. to 120° C.
- the surface tension of the solvent can be determined at a temperature of 10° C. above the melting point of the solvent. If merely fluid solvents are used, the surface tension can be preferably determined at the application temperature.
- Preferred organic solvents can comprise Hansen Solubility parameters of H d in the range of 17.0 to 23.2 MPa 0.5 , H p in the range of 0.2 to 12.5 MPa 0.5 and H h in the range of 0.9 to 14.2 MPa 0.5 . More preferred organic solvents comprise Hansen Solubility parameters of H d in the range of 18.5 to 21.0 MPa 0.5 , H p in the range of 2.0 to 6.0 MPa 0.5 and H h in the range of 2.0 to 6.0 MPa 0.5 .
- the Hansen Solubility Parameters can be determined according to the Hansen Solubility Parameters in Practice (HSPiP) program (2 nd edition) as supplied by Hanson and Abbot et al.
- composition of the present invention preferably comprises at least 70% by weight, more preferably at least 80% by weight and most preferably at least 90% by weight of organic solvents.
- the processing temperature used for removing the solvent and any volatile additive should be selected such that the layer, comprising the organic semiconducting material, is not damaged.
- the deposition processing temperature is from about 30° C. to 200° C., more preferably 60° C. to 150° C. and most preferably 80° C. to 120° C.
- the OSC compounds can be selected from standard materials known to the skilled person and described in the literature.
- the OSC may be a monomeric compound (also referred to as “small molecule”, as compared to a polymer or macromolecule), a polymeric compound, or a mixture, dispersion or blend containing one or more compounds selected from either or both of monomeric and polymeric compounds.
- the OSC is selected from monomeric compounds, where it is easier to achieve a significant variation in the degree of crystallinity.
- the OSC is preferably a conjugated aromatic molecule, and contains preferably at least three aromatic rings, which can be fused or unfused. Unfused rings are connected e.g. via a linkage group, a single bond or a spiro-linkage.
- Preferred monomeric OSC compounds contain one or more rings selected from the group consisting of 5-, 6- or 7-membered aromatic rings, and more preferably contain only 5- or 6-membered aromatic rings.
- the material may be a monomer, oligomer or polymer, including mixtures, dispersions and blends.
- Each of the aromatic rings optionally contains one or more hetero atoms selected from Se, Te, P, Si, B, As, N, O or S, preferably from N, O or S.
- the aromatic rings may be optionally substituted with alkyl, alkoxy, polyalkoxy, thioalkyl, acyl, aryl or substituted aryl groups, halogen, particularly fluorine, cyano, nitro or an optionally substituted secondary or tertiary alkylamine or arylamine represented by —N(R x )(R y ), where R x and R y independently of each other denote H, optionally substituted alkyl, optionally substituted aryl, alkoxy or polyalkoxy groups. Where R x and/or R y denote alkyl or aryl these may be optionally fluorinated.
- Preferred OSC compounds include small molecules (i.e. monomeric compounds), polymers, oligomers and derivatives thereof, selected from condensed aromatic hydrocarbons such as tetracene, chrysene, pentacene, pyrene, perylene, coronene, or soluble substituted derivatives of the aforementioned; oligomeric para substituted phenylenes such as p-quaterphenyl (p-4P), p-quinquephenyl (p-5P), p-sexiphenyl (p-6P), or soluble substituted derivatives of the aforementioned; conjugated hydrocarbon polymers such as polyacene, polyphenylene, poly(phenylene vinylene), polyfluorene, polyindenofluorene, including oligomers of these conjugated hydrocarbon polymers; conjugated heterocyclic polymers such as poly(3-substituted thiophene), poly(3,4-bisubstituted thiophene), poly
- OSC materials are substituted polyacenes, such as 6,13-bis(trialkylsilylethynyl)pentacene or derivatives thereof, such as 5,11-bis(trialkylsilylethynyl)anthradithiophenes, as described for example in U.S. Pat. No. 6,690,029, WO 2005/055248 A1, or WO 2008/107089 A1.
- a further preferred OSC material is poly(3-substituted thiophene), very preferably poly(3-alkylthiophenes) (P3AT) wherein the alkyl group is preferably straight-chain and preferably has 1 to 12, most preferably 4 to 10 C-atoms, like e.g. poly(3-hexylthiophene).
- Particularly preferred polymeric OSC compounds are polymers or copolymers comprising one or more repeating units selected from the group consisting of thiophene-2,5-diyl, 3-substituted thiophene-2,5-diyl, optionally substituted thieno[2,3-b]thiophene-2,5-diyl, optionally substituted thieno[3,2-b]thiophene-2,5-diyl, selenophene-2,5-diyl, 3-substituted selenophene-2,5-diyl, optionally substituted indenofluorene, optionally substituted phenanthrene and optionally substituted triarylamine.
- composition according to the present invention can comprise between 0.01 and 20% by weight, preferably between 0.1 and 15% by weight, more preferably between 0.2 and 10% by weight and most preferably between 0.25 and 5% by weight of OSC materials or the corresponding blend.
- the percent data relate to 100% of the solvent or solvent mixture.
- the composition may comprise one or more than one, preferably 1, 2, 3 or more than three OSC compounds.
- the organic semiconductor compound used here is either a pure component or a mixture of two or more components, at least one of which must have semiconducting properties. In the case of the use of mixtures, however, it is not necessary for each component to have semiconducting properties.
- inert low-molecular-weight compounds can be used together with semiconducting polymers.
- non-conducting polymers which serve as inert matrix or binder, together with one or more low-molecular-weight compounds or further polymers having semiconducting properties.
- the potentially admixed non-conducting component is taken to mean an electro-optically inactive, inert, passive compound.
- the molecular weight M w of the polymeric organic semiconductor is preferably greater than 10,000 g/mol, more preferably between 50,000 and 2,000,000 g/mol and most preferably between 100,000 and 1,000,000 g/mol.
- polymeric organic semiconductors are taken to mean, in particular, (i) substituted poly-p-arylenevinylenes (PAVs) as disclosed in EP 0443861, WO 94/20589, WO 98/27136, EP 1025183, WO 99/24526, DE 19953806 and EP 0964045 which are soluble in organic solvents, (ii) substituted polyfluorenes (PFs) as disclosed in EP 0842208, WO 00/22027, WO 00/22026, DE 19846767, WO 00/46321, WO 99/54385 and WO 00155927 which are soluble in organic solvents, (iii) substituted polyspirobifluorenes (PSFs) as disclosed in EP 0707020, WO 96/17036, WO 97/20877, WO 97/31048, WO 97/39045 and WO 031020790 which are soluble in organic solvents, (iv) substituted poly-
- PVKs polyvinylcarbazoles
- the organic semiconducting compound preferably has a molecular weight of 5000 g/mol or less, more preferably a molecular weight of 2000 g/mol or less.
- the OSC can be used for example as the active channel material in the semiconducting channel of an OFET, or as a layer element of an organic rectifying diode.
- the OFET layer contains an OSC as the active channel material
- it may be an n- or p-type OSC.
- the semiconducting channel may also be a composite of two or more OSC compounds of the same type, i.e. either n- or p-type.
- a p-type channel OSC compound may for example be mixed with an n-type OSC compound for the effect of doping the OSC layer.
- Multilayer semiconductors may also be used.
- the OSC may be intrinsic near the insulator interface and a highly doped region can additionally be coated next to the intrinsic layer.
- Preferred OSC compounds have a FET mobility of greater than 1 ⁇ 10 ⁇ 5 cm 2 V ⁇ 1 s ⁇ 1 , more preferably greater than 1 ⁇ 10 ⁇ 2 cm 2 V ⁇ 1 s ⁇ 1 .
- Particularly preferred polymeric OSC compounds comprise repeating units which are selected from formulae P1-P7:
- Especially preferred monomeric OSC compounds are selected from the group consisting of substituted oligoacenes such as pentacene, tetracene or anthracene, or heterocyclic derivatives thereof, like bis(trialkylsilylethynyl)oligoacenes or bis(trialkylsilylethynyl)heteroacenes, as disclosed for example in U.S. Pat. No. 6,690,029, WO 2005/055248 A1 or U.S. Pat. No. 7,385,221.
- Particularly preferred monomeric OSC compounds are selected from formula M1 (polyacenes):
- the compound of subformula M1b1 is provided and used as a mixture of the anti- and syn-isomers of the following formulae
- carbyl group denotes any monovalent or multivalent organic radical moiety which comprises at least one carbon atom either without any non-carbon atoms (like for example —C ⁇ C—), or optionally combined with at least one non-carbon atom such as N, O, S, P, Si, Se, As, Te or Ge (for example carbonyl etc.).
- hydrocarbyl group denotes a carbyl group that does additionally contain one or more H atoms and optionally contains one or more hetero atoms like for example N, O, S, P, Si, Se, As, Te or Ge.
- a carbyl or hydrocarbyl group comprising a chain of 3 or more C atoms may also be straight-chain, branched and/or cyclic, including spiro and/or fused rings.
- Preferred carbyl and hydrocarbyl groups include alkyl, alkoxy, alkylcarbonyl, alkoxycarbonyl, alkylcarbonyloxy and alkoxycarbonyloxy, each of which is optionally substituted and has 1 to 40, preferably 1 to 25, more preferably 1 to 18 C atoms, furthermore optionally substituted aryl or aryloxy having 6 to 40, preferably 6 to 25 C atoms, furthermore alkylaryloxy, arylcarbonyl, aryloxycarbonyl, arylcarbonyloxy and aryloxycarbonyloxy, each of which is optionally substituted and has 6 to 40, preferably 7 to 40 C atoms, wherein all these groups optionally contain one or more hetero atoms, especially selected from N, O, S, P, Si, Se, As, Te and Ge.
- the carbyl or hydrocarbyl group may be a saturated or unsaturated acyclic group, or a saturated or unsaturated cyclic group. Unsaturated acyclic or cyclic groups are preferred, especially aryl, alkenyl and alkynyl groups (especially ethynyl). Where the C 1 -C 40 carbyl or hydrocarbyl group is acyclic, the group may be straight-chain or branched.
- the C 1 -C 40 carbyl or hydrocarbyl group includes for example: a C 1 -C 40 alkyl group, a C 2 -C 40 alkenyl group, a C 2 -C 40 alkynyl group, a C 3 -C 40 alkyl group, a C 4 -C 40 alkyldienyl group, a C 4 -C 40 polyenyl group, a C 6 -C 18 aryl group, a C 6 -C 40 alkylaryl group, a C 6 -C 40 arylalkyl group, a C 4 -C 40 cycloalkyl group, a C 4 -C 40 cycloalkenyl group, and the like.
- Preferred among the foregoing groups are a C 1 -C 20 alkyl group, a C 2 -C 20 alkenyl group, a C 2 -C 20 alkynyl group, a C 3 -C 20 alkyl group, a C 4 -C 20 alkyldienyl group, a C 6 -C 12 aryl group and a C 4 -C 20 polyenyl group, respectively.
- groups having carbon atoms and groups having hetero atoms like e.g. an alkynyl group, preferably ethynyl, that is substituted with a silyl group, preferably a trialkylsilyl group.
- Aryl and heteroaryl preferably denote a mono-, bi- or tricyclic aromatic or heteroaromatic group with up to 25 C atoms that may also comprise condensed rings and is optionally substituted with one or more groups L, wherein L is halogen or an alkyl, alkoxy, alkylcarbonyl or alkoxycarbonyl group with 1 to 12 C atoms, wherein one or more H atoms may be replaced by F or Cl.
- aryl and heteroaryl groups are phenyl in which, in addition, one or more CH groups may be replaced by N, naphthalene, thiophene, selenophene, thienothiophene, dithienothiophene, fluorene and oxazole, all of which can be unsubstituted, mono- or polysubstituted with L as defined above.
- R, R s and R 1-17 in the above formulae and subformulae are selected from straight chain, branched or cyclic alkyl having from 1 to 20 C atoms, which is unsubstituted or mono- or polysubstituted by F, Cl, Br or I, and wherein one or more non-adjacent CH 2 groups are optionally replaced, in each case independently from one another, by —O—, —S—, —NR b —, —SiR b R c —, —CX 1 ⁇ CX 2 — or —C ⁇ C— in such a manner that O and/or S atoms are not linked directly to one another, or denotes optionally substituted aryl or heteroaryl preferably having from 1 to 30 C-atoms, with R b and R c being independently of each other H or alkyl having from 1 to 12 C-atoms, and X 1 and X 2 being independently of each i other H, F, Cl
- R 15-17 and R′′ are preferably identical or different groups selected from a C 1 -C 40 -alkyl group, preferably C 1 -C 4 -alkyl, most preferably methyl, ethyl, npropyl or isopropyl, a C 6 -C 40 -aryl group, preferably phenyl, a C 6 -C 40 -arylalkyl group, a C 1 -C 40 -alkoxy group, or a C 6 -C 40 -arylalkyloxy group, wherein all these groups are optionally substituted for example with one or more halogen atoms.
- R 15-17 and R′′ are each independently selected from optionally substituted C 1-12 -alkyl, more preferably C 1-4 -alkyl, most preferably C 1-3 -alkyl, for example isopropyl, and optionally substituted C 6-10 -aryl, preferably phenyl.
- R 15-17 , or all of R′′ are identical groups, for example identical, optionally substituted, alkyl groups, as in triisopropylsilyl.
- a preferred alkyl group in this case is isopropyl.
- Preferred groups —SiR 15 R 16 R 17 and SiR′′ 3 include, without limitation, trimethylsilyl, triethylsilyl, tripropylsilyl, dimethylethylsilyl, diethylmethylsilyl, dimethylpropylsilyl, dimethylisopropylsilyl, dipropylmethylsilyl, diisopropylmethylsilyl, dipropylethylsilyl, diisopropylethylsilyl, diethylisopropylsilyl, triisopropylsilyl, trimethoxysilyl, triethoxysilyl, triphenylsilyl, diphenylisopropylsilyl, diisopropylphenylsilyl, diphenylethylsilyl, diethylphenylsilyl, diphenylmethylsilyl, triphenoxysilyl, dimethylmethoxysilyl, dimethylphenoxys
- the OSC material is an organic light emitting material and/or charge transporting material.
- the organic light emitting materials and charge transporting materials can be selected from standard materials known to the skilled person and described in the literature.
- Organic light emitting material according to the present application means a material which emits light having a ⁇ max in the range from 400 to 700 nm.
- Suitable phosphorescent compounds are, in particular, compounds which emit light, preferably in the visible region, on suitable excitation and in addition contain at least one atom having an atomic number greater than 20, preferably greater than 38 and less than 84, more preferably greater than 56 and less than 80.
- the phosphorescence emitters used are preferably compounds which contain copper, molybdenum, tungsten, rhenium, ruthenium, osmium, rhodium, iridium, palladium, platinum, silver, gold or europium, in particular compounds which contain iridium or platinum.
- Particularly preferred organic phosphorescent compounds are compounds of formulae (1) to (4):
- Formation of ring systems between a plurality of radicals R 18 means that a bridge may also be present between the groups DCy and CCy.
- ring systems between a plurality of radicals R 18 means that a bridge may also be present between two or three ligands CCy-DCy or between one or two ligands CCy-DCy and the ligand A, giving a polydentate or polypodal ligand system.
- Examples of the emitters described above are revealed by the applications WO 00/70655, WO 01/41512, WO 02/02714, WO 02/15645, EP 1191613, EP 1191612, EP 1191614, WO 04/081017, WO 05/033244, WO 05/042550, WO 05/113563, WO 06/008069, WO 06/061182, WO 06/081973 and DE 102008027005.
- Preferred dopants are selected from the class of the monostyrylamines, the distyrylamines, the tristyrylamines, the tetrastyrylamines, the styrylphosphines, the styryl ethers and the arylamines.
- a monostyrylamine is taken to mean a compound which contains one substituted or unsubstituted styryl group and at least one, preferably aromatic, amine.
- a distyrylamine is taken to mean a compound which contains two substituted or un-substituted styryl groups and at least one, preferably aromatic, amine.
- a tristyrylamine is taken to mean a compound which contains three substituted or unsubstituted styryl groups and at least one, preferably aromatic, amine.
- a tetrastyrylamine is taken to mean a compound which contains four substituted or unsubstituted styryl groups and at least one, preferably aromatic, amine.
- the styryl groups are particularly preferably stilbenes, which may also be further substituted.
- Corresponding phosphines and ethers are defined analogously to the amines.
- an arylamine or an aromatic amine is taken to mean a compound which contains three substituted or unsubstituted aromatic or heteroaromatic ring systems bonded directly to the nitrogen.
- At least one of these aromatic or heteroaromatic ring systems is preferably a condensed ring system, particularly preferably having at least 14 aromatic ring atoms.
- Preferred examples thereof are aromatic anthraceneamines, aromatic anthracenediamines, aromatic pyreneamines, aromatic pyrenediamines, aromatic chryseneamines or aromatic chrysenediamines.
- An aromatic anthraceneamine is taken to mean a compound in which one diarylamino group is bonded directly to an anthracene group, preferably in the 9-position.
- An aromatic anthracenediamine is taken to mean a compound in which two diarylamino groups are bonded directly to an anthracene group, preferably in the 9,10-position.
- Aromatic pyreneamines, pyrenediamines, chryseneamines and chrysenediamines are defined analogously thereto, where the diarylamino groups are preferably bonded to the pyrene in the 1-position or in the 1,6-position.
- Further preferred dopants are selected from indenofluoreneamines or indenofluorenediamines, for example in accordance with WO 06/122630, benzoindenofluoreneamines or benzoindenofluorenediamines, for example in accordance with WO 08/006,449, and dibenzoindenofluoreneamines or dibenzoindenofluorenediamines, for example in accordance with WO 07/140,847.
- dopants from the class of the styrylamines are substituted or unsubstituted tristilbeneamines or the dopants described in WO 06/000388, WO 06/058737, WO 06/000389, WO 07/065,549 and WO 07/115,610. Preference is furthermore given to the condensed hydrocarbons disclosed in DE 102008035413.
- Suitable dopants are furthermore the structures depicted in the following table, and the derivatives of these structures disclosed in JP 06/001973, WO 04/047499, WO 06/098080, WO 07/065,678, US 2005/0260442 and WO 04/092111.
- the proportion of the dopant in the mixture of the emitting layer is between 0.1 and 50.0% by weight, preferably between 0.5 and 20.0% by weight, more preferably between 1.0 and 10.0% by weight.
- the proportion of the host material is between 50.0 and 99.9% by weight, preferably between 80.0 and 99.5% by weight, more preferably between 90.0 and 99.0% by weight.
- Suitable host materials for this purpose are materials from various classes of substance.
- Preferred host materials are selected from the classes of the oligoarylenes (for example 2, 2′,7,7′-tetraphenylspirobifluorene in accordance with EP 676461 or dinaphthylanthracene), in particular the oligoarylenes containing condensed aromatic groups, the oligoarylenevinylenes (for example DPVBi or spiro-DPVBi in accordance with EP 676461), the polypodal metal complexes (for example in accordance with WO 04/081017), the hole-conducting compounds (for example in accordance with WO 04/058911), the electron-conducting compounds, in particular ketones, phosphine oxides, sulfoxides, etc.
- the oligoarylenes for example 2, 2′,7,7′-tetraphenylspirobifluorene in accordance with EP 676461 or dinap
- Suitable host materials are furthermore also the benzo[c]phenanthrene compounds according to the invention which are described above.
- particularly preferred host materials are selected from the classes of the oligoarylenes containing naphthalene, anthracene, benzanthracene and/or pyrene or atropisomers of these compounds, the oligoarylenevinylenes, the ketones, the phosphine oxides and the sulfoxides.
- very particularly preferred host materials are selected from the classes of the oligoarylenes containing anthracene, benzanthracene and/or pyrene or atropisomers of these compounds.
- an oligoarylene is intended to be taken to mean a compound in which at least three aryl or arylene groups are bonded to one another.
- Suitable host materials are furthermore, for example, the materials depicted in the following table, and derivatives of these materials, as disclosed in WO 04/018587, WO 08/006,449, U.S. Pat. No. 5,935,721, US 2005/0181232, JP 2000/273056, EP 681019, US 2004/0247937 and US 2005/0211958.
- a hole-injection layer is a layer which is directly adjacent to the anode.
- a hole-transport layer is a layer which is located between a hole-injection layer and an emission layer. It may be preferred for them to be doped with electron-acceptor compounds, for example with F 4 -TCNQ or with compounds as described in EP 1476881 or EP 1596445.
- suitable chargetransport materials are, for example, the compounds disclosed in Y. Shirota et al., Chem. Rev. 2007, 107(4), 953-1010, or other materials as employed in these layers in accordance with the prior art.
- Examples of preferred hole-transport materials which can be used in a hole-transport or hole-injection layer of the electroluminescent device according to the invention are indenofluoreneamines and derivatives (for example in accordance with WO 06/122630 or WO 06/100896), the amine derivatives as disclosed in EP 1661888, hexaazatriphenylene derivatives (for example in accordance with WO 01/049806), amine derivatives with condensed aromatics (for example in accordance with U.S. Pat. No.
- Suitable hole-transport and hole-injection materials are furthermore derivatives of the compounds depicted above, as disclosed in JP 2001/226331, EP 676461, EP 650955, WO 01/049806, U.S. Pat. No. 4,780,536, WO 98/30071, EP 891121, EP 1661888, JP 2006/253445, EP 650955, WO 06/073054 and U.S. Pat. No. 5,061,569.
- Suitable hole-transport or hole-injection materials are furthermore, for example, the materials indicated in the following table.
- Suitable electron-transport or electron-injection materials which can be used in the electroluminescent device according to the invention are, for example, the materials indicated in the following table. Suitable electron-transport and electron-injection materials are furthermore derivatives of the compounds depicted above, as disclosed in JP 2000/053957, WO 03/060956, WO 04/028217 and WO 04/080975.
- Suitable matrix materials for the compounds according to the invention are ketones, phosphine oxides, sulfoxides and sulfones, for example in accordance with WO 04/013080, WO 04/093207, WO 06/005627 or DE 102008033943, triarylamines, carbazole derivatives, for example CBP (N,N-biscarbazolyl-biphenyl) or the carbazole derivatives disclosed in WO 05/039246, US 2005/0069729, JP 2004/288381, EP 1205527 or WO 08/086,851, indolocarbazole derivatives, for example in accordance with WO 07/063,754 or WO 08/056,746, azacarbazoles, for example in accordance with EP 1617710, EP 1617711, EP 1731584 or JP 2005/347160, bipolar matrix materials, for example in accordance with WO 07/137,725, silanes, for example in accordance with WO
- composition may comprise 0.5 to 10% by weight inert polymeric binders.
- the OSC composition comprises one or more organic binders, preferably polymeric binders to adjust the rheological properties, as described for example in WO 2005/055248 A1, in particular an organic binder which has a low permittivity ( ⁇ ) at 1,000 Hz of 3.3 or less, very preferably in a proportion of binder to OSC compounds from 20:1 to 1:20, preferably 10:1 to 1:10, more preferably 5:1 to 1:5, most preferably 1:2 to 1:5 by weight.
- organic ⁇ permittivity
- the binder is selected for example from poly( ⁇ -methylstyrene), polyvinylcinnamate, poly(4-vinylbiphenyl) or poly(4-methylstyrene), or blends thereof.
- the binder may also be a semiconducting binder selected for example from poly-arylamines, polyfluorenes, polythiophenes, polyspirobifluorenes, substituted polyvinylenephenylenes, polycarbazoles or polystilbenes, or copolymers thereof.
- an inert binder is a polymer having a glass transition temperature in the range of ⁇ 70 to 160° C., preferably 0 to 150° C., more preferably 50 to 140° C. and most preferably 70 to 130° C.
- the glass transition temperature can be determined by measuring the DSC of the polymer (DIN EN ISO 11357, heating rate 10° C. per minute).
- composition according to the present invention may additionally comprise one or more further components like for example surface-active compounds, lubricating agents, conductive additives, dispersing agents, hydrophobing agents, adhesive agents, flow improvers, defoaming agents, deaerators, diluents which may be reactive or non-reactive, auxiliaries, colourants, dyes or pigments, sensitizers, stabilizers, nanoparticles or inhibitors.
- these further components should not be oxidising or otherwise capable of chemically reacting with the OSC or have an electrically doping effect on the OSC.
- volatile wetting agents Surprising improvements can be achieved with volatile wetting agents.
- volatile as used above and below means that the agent can be removed from the organic semiconducting materials by evaporation, after these materials have been deposited onto a substrate of an OE device, under conditions (like temperature and/or reduced pressure) that do not significantly damage these materials or the OE device.
- the wetting agent has a boiling point or sublimation temperature of ⁇ 350° C., more preferably ⁇ 300° C., most preferably ⁇ 250° C., at the pressure employed, very preferably at atmospheric pressure (1013 hPa). Evaporation can also be accelerated e.g. by applying heat and/or reduced pressure.
- the wetting agents are not capable of chemically reacting with the OSC compounds.
- they are selected from compounds that do not have a permanent doping effect on the OSC material (e.g. by oxidising or otherwise chemically reacting with the OSC material). Therefore, the formulation preferably should not contain additives, like e.g. oxidants or protonic or lewis acids, which react with the OSC materials by forming ionic products.
- compositions comprising volatile components having similar boiling points.
- the difference of the boiling point of the wetting agent and the organic solvent is in the range of ⁇ 50° C. to 50° C., more preferably in the range of ⁇ 30° C. to 30° C. and most preferably in the range of ⁇ 20° C. to 20° C.
- Preferred wetting agents are non-aromatic compounds. With further preference the wetting agents are non-ionic compounds. Particular useful wetting agents comprise a surface tension of at most 35 mN/m, preferably of at most 30 mN/m, and more preferably of at most 25 mN/m. The surface tension can be measured using a FTA (First Ten Angstrom) 125 contact angle goniometer at 25° C. Details of the method are available from First Ten Angstrom as published by Roger P. Woodward, Ph.D. “Surface Tension Measurements Using the Drop Shape Method”. Preferably, the pendant drop method can be used to determine the surface tension.
- FTA First Ten Angstrom
- the pendant drop method can be used to determine the surface tension.
- the difference of the surface tension of the organic solvent and the wetting agent is preferably at least 1 mN/m, preferably at least 5 mN/m and more preferably at least 10 mN/m.
- wetting agents comprising a molecular weight of at least 100 g/mol, preferably at least 150 g/mol, more preferably at least 180 g/mol and most preferably at least 200 g/mol.
- Suitable and preferred wetting agents that do not oxidise or otherwise chemically react with the OSC materials are selected from the group consisting of siloxanes, alkanes, amines, alkenes, alkynes, alcohols and/or halogenated derivates of these compounds. Furthermore, fluoroethers, fluoroesters and/or fluoroketones can be used.
- these compounds are selected from methylsiloxanes having 6 to 20 carbon atoms, especially 8 to 16 carbon atoms; C 7 -C 14 alkanes, C 7 -C 14 alkenes, C 7 -C 14 alkynes, alcohols having 7 to 14 carbon atoms, fluoroethers having 7 to 14 carbon atoms, fluoroesters having 7 to 14 carbon atoms and fluoroketones having 7 to 14 carbon atoms.
- Most preferred wetting agents are methylsiloxanes having 8 to 14 carbon atoms.
- Useful and preferred alkanes having 7 to 14 carbon atoms include heptane, octane, nonane, decane, undecane, dodecane, tridecane, tetradecane, 3-methylheptane, 4-ethylheptane, 5-propyldecane, trimethylcyclohexane and decalin.
- Halogenated alkanes having 7 to 14 carbon atoms include 1-chloroheptane, 1,2-dichlorooctane, tetrafluorooctane, decafluorododecane, perfluorononane, 1,1,1-trifluoromethyldecane, and perfluoromethyldecalin.
- Useful and preferred alkenes having 7 to 14 carbon atoms include heptene, octene, nonene, 1-decene, 4-decene, undecene, dodecene, tridecene, tetradecene, 3-methylheptene, 4-ethylheptene, 5-propyldecene, and trimethylcyclohexene.
- Halogenated alkenes having 7 to 14 carbon atoms include 1,2-dichlorooctene, tetrafluorooctene, decafluorododecene, perfluorononene, and 1,1,1-trifluoromethyldecene.
- Useful and preferred alkynes having 7 to 14 carbon atoms include octyne, nonyne, 1-decyne, 4-decyne, dodecyne, tetradecyne, 3-methylheptyne, 4-ethylheptyne, 5-propyldecyne, and trimethylcyclohexyne.
- Halogenated alkynes having 7 to 14 carbon atoms include 1,2-dichlorooctyne, tetrafluorooctyne, decafluorododecyne, perfluorononyne, and 1,1,1-trifluoromethyldecyne.
- Useful and preferred alcanols having 7 to 14 carbon atoms include, heptanol, octanol, nonanol, decanol, undecanol, dodecanol, tridecanol, tetradecanol, 3-methylheptanol, 3,5-dimethyl-1-hexyn-3-ol, 4-ethylheptanol, 5-propyldecanol, trimethylcyclohexanol and hydroxyldecalin.
- Halogenated alkanols having 7 to 14 carbon atoms include 1-chloroheptanol, 1,2-dichlorooctanol, tetrafluorooctanol, decafluorododecanol, perfluorononanol, 1,1,1-trifluoromethyldecanol, and 2-trifluoromethyl-1-hydroxydecalin.
- Useful and preferred fluoroethers having 7 to 14 carbon atoms include 3-ethoxy-1,1,1,2,3,4,4,5,5,6,6,6 dodecafluoro-2-trifluoromethylhexane, 3-propoxy-1,1,1,2,3,4,4,5,5,6,6,6 dodecafluoro-2-trifluoromethylhexane, and 3-propoxy-1,1,1,2,3,4,4,5,5,5 decafluoro-2-trifluoromethylpentane.
- Useful and preferred fluoroesters having 7 to 14 carbon atoms include 3-(1,1,1,2,3,4,4,5,5,6,6,6 dodecafluoro-2-trifluoromethylhexyl)ethanoate, and 3-(1,1,1,2,3,4,4,5,5,5 decafluoro-2-trifluoromethylpentyl)propanoate.
- Useful and preferred fluoroketones having 7 to 14 carbon atoms include 3-(1,1,1,2,3,4,4,5,5,6,6,6 dodecafluoro-2-trifluoromethylhexyl)ethylketone, and 3-(1,1,1,2,3,4,4,5,5,5 decafluoro-2-trifluoromethylpentyl)propylketone.
- siloxanes include hexamethyldisiloxane, octamethyltrisiloxane, decamethyltetrasiloxane, dodecamethylpentasiloxane, and tetradecamethylhexasiloxane.
- the composition may comprise at most 5% by weight of wetting additives. More preferably, the composition comprises 0.01 to 3% by weight, most preferably 0.1 to 1% by weight of wetting agent.
- composition according to the present invention can be used for the preparation of organic electronic (OE) devices, for example transistors like OFETs or organic photovoltaic (OPV) devices like diodes or solar cells.
- OE organic electronic
- OLED organic photovoltaic
- Especially preferred OE devices are OFETs.
- a preferred OFET according to the present invention comprises the following components:
- FIG. 1A exemplarily and schematically depicts a typical bottom gate (BG), top contact (TC) OFET device according to the present invention, comprising a substrate ( 1 ), a gate electrode ( 2 ), a layer of dielectric material ( 3 ) (also known as gate insulator layer), an OSC layer ( 4 ), and source and drain (S/D) electrodes ( 5 ), and an optional passivation or protection layer ( 6 ).
- BG bottom gate
- TC top contact
- FIG. 1A exemplarily and schematically depicts a typical bottom gate (BG), top contact (TC) OFET device according to the present invention, comprising a substrate ( 1 ), a gate electrode ( 2 ), a layer of dielectric material ( 3 ) (also known as gate insulator layer), an OSC layer ( 4 ), and source and drain (S/D) electrodes ( 5 ), and an optional passivation or protection layer ( 6 ).
- the device of FIG. 1A can be prepared by a process comprising the steps of depositing a gate electrode ( 2 ) on a substrate ( 1 ), depositing a dielectric layer ( 3 ) on top of the gate electrode ( 2 ) and the substrate ( 1 ), depositing an OSC layer ( 4 ) on top of the dielectric layer ( 3 ), depositing S/D electrodes ( 5 ) on top of the OSC layer ( 4 ), and optionally depositing a passivation or protection layer ( 6 ) on top of the S/D electrodes ( 5 ) and the OSC layer ( 4 ).
- FIG. 1B exemplarily and schematically depicts a typical bottom gate (BG), bottom contact (BC) OFET device according to the present invention, comprising a substrate ( 1 ), a gate electrode ( 2 ), a dielectric layer ( 3 ), S/D electrodes ( 5 ), an OSC layer ( 4 ), and an optional passivation or protection layer ( 6 ).
- BG bottom gate
- BC bottom contact
- FIG. 1B exemplarily and schematically depicts a typical bottom gate (BG), bottom contact (BC) OFET device according to the present invention, comprising a substrate ( 1 ), a gate electrode ( 2 ), a dielectric layer ( 3 ), S/D electrodes ( 5 ), an OSC layer ( 4 ), and an optional passivation or protection layer ( 6 ).
- the device of FIG. 1B can be prepared by a process comprising the steps of depositing a gate electrode ( 2 ) on a substrate ( 1 ), depositing a dielectric layer ( 3 ) on top of the gate electrode ( 2 ) and the substrate ( 1 ), depositing S/D electrodes ( 5 ) on top of the dielectric layer ( 3 ), depositing an OSC layer ( 4 ) on top of the S/D electrodes ( 4 ) and the dielectric layer ( 3 ), and optionally depositing a passivation or protection layer ( 6 ) on top of the OSC layer ( 4 ).
- FIG. 2 exemplarily and schematically depicts a top gate (TG) OFET device according to the present invention, comprising a substrate ( 1 ), source and drain electrodes ( 5 ), an OSC layer ( 4 ), a dielectric layer ( 3 ), and a gate electrode ( 2 ), and an optional passivation or protection layer ( 6 ).
- TG top gate
- the device of FIG. 2 can be prepared by a process comprising the steps of depositing S/D electrodes ( 5 ) on a substrate ( 1 ), depositing an OSC layer ( 4 ) on top of the S/D electrodes ( 4 ) and the substrate ( 1 ), depositing a dielectric layer ( 3 ) on top of the OSC layer ( 4 ), depositing a gate electrode ( 2 ) on top of the dielectric layer ( 3 ), and optionally depositing a passivation or protection layer ( 6 ) on top of the gate electrode ( 2 ) and the dielectric layer ( 3 ).
- the passivation or protection layer ( 6 ) in the devices described in FIGS. 1A , 1 B and 2 has the purpose of protecting the OSC layer and the S/D or gate electrodes from further layers or devices that may be later provided thereon, and/or from environmental influence.
- the formulation preferably comprises or contains, more preferably consists essentially of, most preferably consists exclusively of, a p-type semiconductor and a n-type semiconductor, or an acceptor and a donor material.
- a preferred material of this type is a blend or mixture of poly(3-substituted thiophene) or P3AT with a C 60 or C 70 fullerene or modified C 60 molecule like PCBM [(6,6)phenyl C61-butyric acid methyl ester], as disclosed for example in WO 94/05045 A1, wherein preferably the ratio of P3AT to fullerene is from 2:1 to 1:2 by weight, more preferably from 1.2:1 to 1:1.2 by weight.
- FIG. 3 and FIG. 4 exemplarily and schematically depict typical and preferred OPV devices according to the present invention [see also Waldauf et al., Appl. Phys. Lett. 89, 233517 (2006)].
- An OPV device as shown in FIG. 3 preferably comprises:
- An inverted OPV device as shown in FIG. 4 preferably comprises:
- the hole transporting polymer is for example a polythiophene.
- the electron transporting material is for example an inorganic material such as zinc oxide or cadmium selenide, or an organic material such as a fullerene derivate (like for example PCBM) or a polymer (see for example Coakley, K. M. and McGehee, M. D. Chem. Mater. 2004, 16, 4533). If the bilayer is a blend an optional annealing step may be necessary to optimize device performance.
- the OSC layer is deposited onto a substrate, followed by removal of the solvent together with any volatile additive(s) present, to form a film or layer.
- OE devices for example glass, ITO coated glass, ITO glass with pre coated layers including PEDOT, PANI etc, or plastics, plastics materials being preferred, examples including alkydresins, allylesters, benzocyclobutenes, butadienestyrene, cellulose, celluloseacetate, epoxide, epoxy polymers, ethylenechlorotrifluoroethylene, ethylene-tetra-fluoroethylene, fibre glass enhanced plastic, fluorocarbon polymers, hexafluoropropylenevinylidene-fluoride copolymer, high density polyethylene, parylene, polyamide, polyimide, polyaramid, polydimethylsiloxane, polyethersulphone, polyethylene, polyethylenenaphthalate, polyethyleneterephthalate, polyketone, polymethylmethacrylate, polypropylene, polystyrene, polysulphone, polytetrafluoroethylene, polyurethanes,
- Preferred substrate materials are polyethyleneterephthalate, polyimide, and polyethylenenaphthalate.
- the substrate may be any plastic material, metal or glass coated with the above materials.
- the substrate should preferably be homogeneous to ensure good pattern definition.
- the substrate may also be uniformly pre-aligned by extruding, stretching, rubbing or by photochemical techniques to induce the orientation of the organic semiconductor in order to enhance carrier mobility.
- the electrodes can be deposited by liquid coating, such as spray-, dip-, web- or spin-coating, or by vacuum deposition or vapor deposition methods.
- Suitable electrode materials and deposition methods are known to the person skilled in the art.
- Suitable electrode materials include, without limitation, inorganic or organic materials, or composites of the two.
- suitable conductor or electrode materials include polyaniline, polypyrrole, PEDOT or doped conjugated polymers, further dispersions or pastes of graphite or particles of metal such as Au, Ag, Cu, Al, Ni or their mixtures as well as sputter coated or evaporated metals such as Cu, Cr, Pt/Pd or metal oxides such as indium tin oxide (ITO).
- Organometallic precursors may also be used deposited from a liquid phase.
- Deposition of the OSC layer can be achieved by standard methods that are known to the skilled person and are described in the literature. Suitable and preferred deposition methods include liquid coating and printing techniques. Very preferred deposition methods include, without limitation, dip coating, spin coating, spray coating, aerosol jetting, ink jet printing, nozzle printing, letter-press printing, screen printing, gravure printing, doctor blade coating, roller printing, reverse-roller printing, offset lithography printing, flexographic printing, web printing, spray coating, dip coating, curtain coating, brush coating, slot dye coating or pad printing. Gravure, flexographic and inkjet printing are more preferred. Inkjet printing is most preferred.
- an insulator layer can be deposited on a substrate in order to achieve a special type of an OE according to the present invention.
- the insulator layer is deposited by solution processing, very preferably using a solution of a dielectric material, which is optionally cross-linkable, in one or more organic solvents.
- the solvent used for depositing the dielectric material is orthogonal to the solvent used for depositing the OSC material, and vice versa.
- the OSC or dielectric material is spun for example between 1000 and 2000 rpm for a period of for example 30 seconds to give a layer with a typical layer thickness between 0.5 and 1.5 ⁇ m.
- the film can be heated at an elevated temperature to remove all residual volatile solvents.
- a cross-linkable dielectric is used, it is preferably cross-linked after deposition by exposure to electron beam or electromagnetic (actinic) radiation, like for example X-ray, UV or visible radiation.
- actinic radiation can be used having a wavelength of from 50 nm to 700 nm, preferably from 200 to 450 nm, more preferably from 300 to 400 nm.
- Suitable radiation dosages are typically in the range from 25 to 3,000 mJ/cm 2 .
- Suitable radiation sources include mercury, mercury/xenon, mercury/halogen and xenon lamps, argon or xenon laser sources, x-ray, or e-beam.
- the exposure to actinic radiation will induce a cross-linking reaction in the cross-linkable groups of the dielectric material in the exposed regions. It is also possible for example to use a light source having a wavelength outside the absorption band of the cross-linkable groups, and to add a radiation sensitive photosensitizer to the cross-linkable material.
- the dielectric material layer is annealed after exposure to radiation, for example at a temperature from 70° C. to 130° C., for example for a period of from 1 to 30 minutes, preferably from 1 to 10 minutes.
- the annealing step at elevated temperature can be used to complete the cross-linking reaction that was induced by the exposure of the cross-linkable groups of the dielectric material to photoradiation.
- a leveling step can be preferably performed. Surprising improvements can be achieved by heating and/or annealing the obtained layer comprising the solvent. Preferably, the heating and/or annealing is performed for a period of time in the range of 1 to 300 seconds, more preferably in the range of 2 to 100 seconds.
- the temperature of the leveling step depends on the melting point of the solvent. Preferably, the temperature of the leveling step is situated in the range of 1° C. to 20° C., more preferably of 2° C. to 5° C. above the melting point of the solvent.
- Removal of the solvent and any volatile additive(s) is preferably achieved by evaporation, for example by exposing the deposited layer to high temperature and/or reduced pressure, preferably at ⁇ 50° C. to 200° C., more preferably 20° C. to 135° C.
- the solvent(s) and any volatile additive can be evaporated under reduced pressure.
- the pressure for solvent evaporation ranges from 10 ⁇ 3 mbar to 1 bar, more preferably from 10 ⁇ 2 mbar to 100 mbar and most preferably from 0.1 mbar to 10 mbar.
- the evaporation of the solvent can be preferably achieved below the melting point of the solvent. Astonishing improvements can be obtained by a evaporation temperature preferably ranging from 0.1° C. to 40° C., more preferably from 1° C. to 30° C. below the melting point of the solvent.
- the present composition provides an improved method for achieving multilayer OE devices. Astonishing improvements can be achieved by methods wherein at least two layers comprising organic semiconducting compounds are applied and the second layer is achieved by using a composition of the present invention.
- the thickness of the OSC layer is preferably from 1 nm to 50 ⁇ m, more preferably from 2 to 1000 nm and most preferably 3 to 500 nm.
- Preferred layers comprising organic light emitting materials and/or charge transporting materials can have a thickness in the range of 2 to 150 nm.
- the OE device and its components can be prepared from standard materials and standard methods, which are known to the person skilled in the art and described in the literature.
- polymer includes homopolymers and copolymers, e.g. statistical, alternating or block copolymers.
- polymer as used hereinafter does also include oligomers and dendrimers. Dendrimers are typically branched macromolecular compounds consisting of a multifunctional core group onto which further branched monomers are added in a regular way giving a tree-like structure, as described e.g. in M. Fischer and F. Vögtle, Angew. Chem., Int. Ed. 1999, 38, 885.
- conjugated polymer means a polymer containing in its backbone (or main chain) mainly C atoms with sp 2 -hybridisation, or optionally sp-hybridisation, which may also be replaced by hetero atoms, enabling interaction of one ⁇ -orbital with another across an intervening ⁇ -bond.
- this is for example a backbone with alternating carbon-carbon (or carbon-hetero atom) single and multiple (e.g. double or triple) bonds, but does also include polymers with units like 1,3-phenylene.
- “Mainly” means in this connection that a polymer with naturally (spontaneously) occurring defects, which may lead to interruption of the conjugation, is still regarded as a conjugated polymer. Also included in this meaning are polymers wherein the backbone comprises for example units like arylamines, arylphosphines and/or certain heterocycles (i.e. conjugation via N-, O-, P- or S-atoms) and/or metal organic complexes (i.e. conjugation via a metal atom).
- conjugated linking group means a group connecting two rings (usually aromatic rings) consisting of C atoms or hetero atoms with sp 2 -hybridisation or sp-hybridisation. See also “IUPAC Compendium of Chemical terminology, Electronic version”.
- the molecular weight is given as the number average molecular weight M n or as weight average molecular weight M w , which unless stated otherwise are determined by gel permeation chromatography (GPC) against polystyrene standards.
- small molecule means a monomeric, i.e. a non-polymeric compound.
- the substrate (2 cm 2 glass plates coated with PEDOT) was activated by heating for 10 minutes at 180° C. and used directly.
- OLED polymer ink was formulated by dissolving 0.5% by weight OLED polymer comprising structural units of the following formulae
- the ink was printed with the Dimatix DMP 2800 printer (print head heated to 60° C. plus heated glove) onto the substrate. 6 mm squares were printed with a drop spacing of 5, 10, 15, 20, 25, 30, 35 and 40 ⁇ m. Drop formation in the ink jet process was good as determined by visualization using a microscope illuminated by a strobe which effectively freezes the droplets in flight.
- An excellent OLED film was formed as observed via a fluorescence method (using a Nikon Eclipse E400 microscope).
- Example 1 was repeated. However, 1% OLED polymer as mentioned in Example 1 was dissolved in 2-methylnaphthalene, pentamethylbenzene and 1,5-dimethylnaphthalene by heating the solvent to 80° C., respectively.
- compositions were processed as described in Example 1. However, the temperature of the leveling step was about 2-5° C. above the melting point of the solvent for approximately 20 seconds and the solvent removal was performed at 100° C.
- Excellent OLED films were formed as observed via a fluorescence method (using a Nikon Eclipse E400 microscope).
- Example 1 was repeated. However, 1% OLED polymer as mentioned in Example 1 was dissolved in 1,2,4,5-tetramethylbenzene by heating the solvent to 85° C.
- the composition was processed as described in Example 1. However, the temperature of the leveling step was about 88° C. and the solvent removal was performed at 100° C.
- An excellent OLED film was formed as observed via a fluorescence method (using a Nikon Eclipse E400 microscope).
- the substrate (2 cm 2 glass plates coated with PEDOT) was activated by heating for 10 minutes at 180° C. and used directly.
- a printing ink was prepared by mixing a phosphorescent compound according to formula 107
- the ink was printed with the Dimatix DMP 2800 printer (print head heated to 60° C. plus heated glove) onto the substrate. 6 mm squares were printed with a drop spacing of 5, 10, 15, 20, 25, 30, 35 and 40 ⁇ m. Drop formation in the ink jet process was good as determined by visualization using a microscope illuminated by a strobe which effectively freezes the droplets in flight.
- An excellent OLED film was formed as observed via a fluorescence method (using a Nikon Eclipse E400 microscope).
- Example 6 was repeated. However, glass substrates were prepared with a PEDOT layer as described above with a further layer of polymer comprising structural units of the following formulae.
- the polymer was spin coated from toluene and dried for 5 minutes at 100° C. to obtain a hole transporting layer.
- Example 6 The ink as described in Example 6 was then printed and dried as above and provided the level film.
- An excellent OLED film was formed as observed via a fluorescence method (using a Nikon Eclipse E400 microscope).
- the mixture comprising a phosphorescent compound according to formula 107 and a host material having the formula 147 as mentioned in Example 6 in a weight ratio of 1:4 have been dissolved in 2-methylnaphthalene, 1,5-dimethylnaphthalene (1,5-DMN), 5-indanol, 1,2,3,4-tetrahydro-1-naphthol, 5,6,7,8-tetrahydro-2-naphthol, 2-ethoxynaphthalene, 2-indanol, sulfolane, biphenyl and 1,2,4,5-tetramethylbenzene at elevated temperatures (typically 10° C. above the melting point of the solvent).
- the concentration of both compounds 107 and 147 in the solvent was about 1% by weight.
- the mixture comprising a phosphorescent compound according to formula 107 and a host material having the formula 147 as mentioned in Example 6 in a weight ratio of 1:4 have been dissolved in 1:1 biphenyl:1,5-DMN, 1:1 biphenyl:1,2,4,5-tetramethylbenzene, 2-methylnaphthalene and 2-ethoxynaphthalene at elevated temperatures (typically 10° C. above the melting point of the solvent).
- the concentration of both compounds 107 and 147 in the solvent was about 1% by weight.
- An excellent OLED film was formed as observed via a fluorescence method (using a Nikon Eclipse E400 microscope).
- Corning Eagle XG glass was washed in an ultrasonic methanol bath for 2 minutes and then rinsed with methanol. Approximately 40 nm thick silver gate electrodes were evaporated.
- a UV curable dielectric layer of a dielectric material LisiconTM D207 (available from Merck KGaA) was spun on top of the OSC layer on the device and annealed at 120° C. for 1 minutes to give a dry dielectric film of approximately 1 micron thick. The dielectric layer was then crosslinked by UV curing under 365 nm wavelength late, a total UV dose of 2.6 Jcm ⁇ 2 .
- the electrodes were treated with a reactive washing solution LisiconTM M001 (available from Merck KGaA) SAM treatment by spin coating from isopropyl alcohol rinsed off with isopropyl alcohol and then dried on the spin coater.
- LisiconTM M001 available from Merck KGaA
- An OSC formulation was prepared by dissolving of 1.33 parts of a compound of formula M2 and 0.67 parts ⁇ -methylstyrene in pentamethylbenzene filtering the solution through a 0.45 ⁇ m PTFE cartridge filter.
- one of Y 1 and Y 2 denotes —CH ⁇ or ⁇ CH— and the other denotes —S— and one of Y 3 and Y 4 denotes —CH ⁇ or ⁇ CH— and the other denotes —S—.
- the OSC formulation was then printed using a Dimatix DMP2831 ink-jet printer.
- the cartridge and head were heated to above the melting point of the solvent (pentamethylbenzene).
- Each device was individually printed over the source/drain electrodes.
- the resulting print was warmed to 52° C. to allow the ink to reflow, this was then placed in a bell jar with no heat and the pressure was reduced to 5 mbar and left for 20 minutes, in order to remove solvent.
- the transistor characteristic and the linear and saturation mobility of the device are depicted in FIG. 5 .
- the device has a mobility (linear 0.01 cm 2 /Vs, saturation 0.02 cm 2 /Vs) and good on/off ratio (10 4 ).
- the transistor characteristics are very good.
- the data show that the ink according to the present invention can be printed using Ink-jet printing techniques, and can also generate working transistor devices that demonstrate both acceptable mobility and a good on/off ratio.
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| EP10003857 | 2010-04-12 | ||
| EP10003857.9 | 2010-04-12 | ||
| PCT/EP2011/001682 WO2011128035A1 (fr) | 2010-04-12 | 2011-04-05 | Composition et procédé pour la préparation de dispositifs électroniques organiques |
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| PCT/EP2011/001682 A-371-Of-International WO2011128035A1 (fr) | 2010-04-12 | 2011-04-05 | Composition et procédé pour la préparation de dispositifs électroniques organiques |
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| US15/266,532 Continuation US10256408B2 (en) | 2010-04-12 | 2016-09-15 | Composition and method for preparation of organic electronic devices |
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| US15/266,532 Expired - Fee Related US10256408B2 (en) | 2010-04-12 | 2016-09-15 | Composition and method for preparation of organic electronic devices |
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| EP (1) | EP2559079B1 (fr) |
| JP (1) | JP6073216B2 (fr) |
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Also Published As
| Publication number | Publication date |
|---|---|
| JP6073216B2 (ja) | 2017-02-01 |
| JP2013529375A (ja) | 2013-07-18 |
| CN102844902B (zh) | 2016-06-08 |
| KR101896723B1 (ko) | 2018-09-07 |
| EP2559079A1 (fr) | 2013-02-20 |
| US20170062725A1 (en) | 2017-03-02 |
| WO2011128035A1 (fr) | 2011-10-20 |
| US10256408B2 (en) | 2019-04-09 |
| CN102844902A (zh) | 2012-12-26 |
| EP2559079B1 (fr) | 2020-04-01 |
| KR20130043631A (ko) | 2013-04-30 |
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