US20120113403A1 - Exposure method and exposure apparatus - Google Patents
Exposure method and exposure apparatus Download PDFInfo
- Publication number
- US20120113403A1 US20120113403A1 US13/251,850 US201113251850A US2012113403A1 US 20120113403 A1 US20120113403 A1 US 20120113403A1 US 201113251850 A US201113251850 A US 201113251850A US 2012113403 A1 US2012113403 A1 US 2012113403A1
- Authority
- US
- United States
- Prior art keywords
- exposed
- subject
- exposure
- conveying
- mask pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B27/00—Photographic printing apparatus
- G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
- G03B27/42—Projection printing apparatus, e.g. enlarger, copying camera for automatic sequential copying of the same original
- G03B27/426—Projection printing apparatus, e.g. enlarger, copying camera for automatic sequential copying of the same original in enlargers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
-
- H10P76/2041—
Definitions
- the present invention relates to an exposure method and an exposure apparatus for forming a different exposure pattern on each of a plurality of exposure areas set on a subject to be exposed while conveying the subject to be exposed in one direction.
- the invention relates to an exposure method and an exposure apparatus for enhancing formation efficiency of a plurality of types of exposure patterns.
- one mask pattern group of a photomask is selected and one exposure pattern group is formed on a predetermined exposure area of a subject to be exposed by exposure using the one mask pattern group.
- the subject to be exposed is returned to a stand-by position at which the subject to be exposed is positioned before starting exposure, and then, the mask pattern group of the photomask is switched to another mask pattern group, and thereafter, the subject to be exposed is conveyed again and another exposure pattern group is formed on another exposure area of the subject to be exposed by exposure using the another mask pattern group (for example, see Japanese Laid-Open Patent Publication No. 2008-310217).
- an object of the present invention is to provide an exposure method and an exposure apparatus for enhancing the formation efficiency of a plurality of types of exposure patterns on the same subject to be exposed.
- the exposure method is a method for forming a different exposure pattern on each of a plurality of exposure areas set on a subject to be exposed in a conveying direction of the subject to be exposed at a predetermined interval while conveying the subject to be exposed in one direction
- the exposure method includes the steps of: moving a shutter in synchronization with a conveying speed of the subject to be exposed and shutting off source light when exposure on one exposure area of the subject to be exposed is completed, the exposure being performed by using one mask pattern group of a photomask in which a plurality of types of mask pattern groups corresponding to each exposure pattern is arranged and formed in the conveying direction of the subject to be exposed at a predetermined interval: returning the subject to be exposed in a direction opposite to the conveying direction by a distance in which the subject to be exposed moves while the shutter moves and switching the mask pattern group from the one mask pattern group to another mask pattern group by moving the photomask; and restarting the conveying of the subject to be exposed in the conveying
- the shutter is moved in synchronization with the conveying speed of the subject to be exposed and the source light is shut off, the subject to be exposed is returned in a direction opposite to the conveying direction by the distance in which the subject to be exposed moves while the shutter moves, and the one mask pattern group is switched to another mask pattern group by moving the photomask.
- the conveying of the subject to be exposed in the conveying direction is restarted, and at the same time, the shutter is moved in synchronization with the conveying speed of the subject to be exposed to release shut-off of the source light, exposure on the following exposure area is performed, and different exposure patterns are formed for each of a plurality of exposure areas set on the subject to be exposed in the conveying direction of the subject to be exposed at a predetermined interval.
- the shutter is moved in the conveying direction of the subject to be exposed.
- the shutter includes a plurality of light shielding portions and opening portions alternately arranged in the conveying direction of the subject to be exposed.
- the plurality of light shielding portions and opening portions are alternately switched to each other by moving the shutter in the conveying direction of the subject to be exposed.
- the exposure apparatus is an exposure apparatus for forming a different exposure pattern on each of a plurality of exposure areas set on a subject to be exposed in a conveying direction of the subject to be exposed at a predetermined interval while conveying the subject to be exposed in one direction
- the exposure apparatus includes: a conveying device which conveys the subject to be exposed at a predetermined speed; a shutter which is formed to be able to move in synchronization with a movement of the subject to be exposed and which shuts off source light and releases shut-off of the source light; and a mask stage which is arranged to face an upper surface of the conveying device and which holds a photomask in which a plurality of types of mask pattern groups corresponding to each exposure pattern are formed and the mask stage moves to perform switching of the plurality of types of mask pattern groups.
- the shutter is moved to shut off the source light when exposure on one exposure area of the subject to be exposed is completed, the exposure being performed by using one mask pattern group of the photomask.
- the conveying device returns the subject to be exposed in a direction opposite to the conveying direction by a distance in which the subject to be exposed moves while the shutter moves, and the one mask pattern group of the photomask is switched to another mask pattern group by moving the mask stage.
- the conveying of the subject to be exposed in the conveying direction is restarted, and at the same time, the shutter is moved to release shut-off of the source light, and exposure on the following exposure area is performed.
- the shutter is moved in synchronization with the movement of the exposure to be exposed to shut off the source light
- the subject to be exposed is returned by the conveying device in the direction opposite to the conveying direction by the distance in which the subject to be exposed moves while the shutter moves
- the one mask pattern group is switched to another mask pattern group by moving the mask stage
- the conveying of the subject to be exposed in the conveying direction is restarted by the conveying device
- the shutter is moved in the movement direction of the subject to be exposed in synchronization with the movement of the subject to be exposed to release shut-off of the source light, and then, exposure on the following exposure area is performed, so that different exposure patterns are formed for each of a plurality of exposure areas set on the subject to be exposed in the conveying direction of the subject to be exposed at a pre
- the shutter is moved in the conveying direction of the subject to be exposed.
- the shutter includes a plurality of light shielding portions and opening portions alternately arranged in the conveying direction of the subject to be exposed. Thereby, the plurality of light shielding portions and opening portions is alternately switched to each other by moving the shutter in the conveying direction of the subject to be exposed.
- each time the exposure of one exposure pattern with respect to one exposure area is completed the subject to be exposed is returned by the distance in which the subject to be exposed moves while the shutter moves and exposure of another exposure pattern is performed on a new exposure area by switching the mask pattern group of the photomask, so that the movement distance of the subject to be exposed returned in the direction opposite to the conveying direction of the subject to be exposed is significantly smaller than that of the conventional art. Therefore, the total movement distance of the subject to be exposed until all the exposure is completed is significantly shorter than that of the conventional art.
- the formation efficiency of a plurality of types of exposure patterns on the same subject to be exposed is further enhanced compared with that of the conventional art.
- a proximity exposure apparatus in which a photomask is arranged to approach and face the subject to be exposed.
- a third or sixth aspect of the present invention when different exposure patterns are exposed on three or more exposure areas of the subject to be exposed, only an operation in which the shutter is moved in one direction and a plurality of opening portions and light shielding portions are switched needs to be performed, so that the drive operation control of the shutter is easily performed.
- FIG. 1 is a schematic view of an embodiment of an exposure apparatus according to the embodiment of the present invention.
- FIG. 2 is a plan view of a setting example of exposure areas set on a surface of a subject to be exposed used in the exposure apparatus;
- FIG. 3 is a plan view of a configuration example of a photomask used in the exposure apparatus
- FIG. 4 is a block diagram of a schematic configuration of a control device of the exposure apparatus
- FIG. 5 is a flowchart of an exposure method of the present invention.
- FIG. 6 is an explanatory view of the exposure method of the present invention.
- FIG. 1 is a schematic view of the embodiment of an exposure apparatus according to the present invention.
- the exposure apparatus forms a different exposure pattern on each of a plurality of exposure areas set on a subject to be exposed while conveying the subject to be exposed in one direction.
- the exposure apparatus includes a conveying device 1 , a light source 2 , a coupling optical system 3 , a mask stage 4 , a shutter 5 , an imaging device 6 , and a control device 7 .
- the conveying device 1 conveys a subject to be exposed 8 placed on an upper surface of the conveying device 1 in a direction indicated by an arrow A at a predetermined speed.
- the conveying device 1 emits air from the upper surface as well as absorbs air.
- emission power and absorption power of the air are controlled to float the subject to be exposed 8 by a predetermined amount.
- both ends of the subject to be exposed 8 are held by conveying rollers not shown in FIG. 1 to convey the subject to be exposed 8 .
- the conveying device 1 is provided with a speed sensor for detecting a moving speed of the subject to be exposed 8 and a position sensor (not shown in FIG. 1 ) for detecting the position of the subject to be exposed 8 .
- a first exposure area 9 in which a first exposure pattern group is formed and a second exposure area 10 in which a second exposure pattern group is formed are set in advance in a conveying direction (arrow A direction) at a predetermined interval.
- the subject to be exposed 8 is a color filter substrate.
- the light source 2 is provided above the conveying device 1 .
- the light source 2 emits ultraviolet light as source light 23 .
- the light source 2 is a xenon lamp, an extra high pressure mercury lamp, a laser light source, or the like.
- the coupling optical system 3 is provided in front of a light emitting direction of the light source 2 .
- the coupling optical system 3 converts the source light 23 emitted from the light source 2 into parallel light and irradiates the parallel light to a mask pattern group of a photomask 11 described below.
- the coupling optical system 3 includes optical components such as a photo integrator and a condenser lens.
- the mask stage 4 is provided to face the upper surface of the conveying device 1 .
- the mask stage 4 holds outer edges of the photomask 11 on which a first and a second mask pattern groups 12 and 13 corresponding to the first and the second exposure pattern groups, respectively, different from each other formed on the subject to be exposed 8 are arranged and formed in the conveying direction (arrow A direction) of the subject to be exposed 8 at a predetermined interval as shown in FIG. 3 .
- the mask stage 4 is formed to be able to move in the same direction (arrow C direction) as the conveying direction of the subject to be exposed 8 indicated by the arrow A.
- the shutter 5 is provided between the coupling optical system 3 and the mask stage 4 .
- the shutter 5 shuts off and releases the source light 23 irradiated to the photomask 11 .
- the shutter 5 is formed to be able to move in the same direction (arrow B direction) as the conveying direction of the subject to be exposed 8 indicated by the arrow A in synchronization with the movement of the subject to be exposed 8 .
- the imaging device 6 is provided to be able to capture an image of a position a predetermined distance away from an exposure position of the photomask 11 in the direction opposite to the conveying direction (arrow A direction).
- the imaging device 6 captures an image of the surface of the subject to be exposed 8 .
- the imaging device 6 is a line camera in which a plurality of light receiving elements are linearly aligned in a direction substantially perpendicular to the conveying direction in the plane parallel to the upper surface of the conveying device 1 .
- the imaging device 6 is arranged to capture an image of a position away from an exposure center position of the mask pattern group of the photomask 11 by a distance L in the direction opposite to the conveying direction.
- the control device 7 is electrically connected to the conveying device 1 , the light source 2 , the mask stage 4 , the shutter 5 , and the image pickup means 6 .
- the control device 7 appropriately controls the movements of the conveying device 1 , the mask stage 4 , and the shutter 5 .
- the control device 7 includes an image processing unit 14 , a memory 15 , an arithmetic unit 16 , a comparator 17 , a conveying device drive controller 18 , a mask stage drive controller 19 , a shutter drive controller 20 , a light source drive controller 21 , and a control unit 22 .
- the image processing unit 14 performs image processing on an image of the surface of the subject to be exposed 8 captured by the imaging device 6 and detects the front positions of the exposure areas 9 and 10 in the conveying direction.
- the memory 15 stores the lengths of the exposure areas 9 and 10 in the arrow A direction, the distance L between the exposure center position of the photomask 11 and the image capturing position of the imaging device 6 , and the like, and temporarily stores a calculation result of the arithmetic unit 16 described below. Furthermore, the arithmetic unit 16 calculates the movement distance of the subject to be exposed 8 on the basis of an output of the position sensor of the conveying device 1 .
- the comparator 17 compares the movement distance of the conveying device 1 calculated by the arithmetic unit 16 with the each length read from the memory 15 .
- the conveying device drive controller 18 controls forward drive and reverse drive of the conveying device 1 .
- the mask stage drive controller 19 moves the mask stage 4 and switches the mask pattern group of the photomask 11 from the first mask pattern group 12 to the second mask pattern group 13 .
- the shutter drive controller 20 moves the shutter 5 in synchronization with a conveying speed of the subject to be exposed 8 .
- the light source drive controller 21 controls drive to turn on and off the light source 2 .
- the control unit 22 integrally controls the entire apparatus so that the constituent elements described above are appropriately driven.
- step S 1 the mask stage 4 stops at a standby position and the first mask pattern group 12 of the photomask 11 is selected.
- the shutter 5 stops at a standby position and the shut off of the source light 23 is released.
- step S 2 the conveying device 1 is controlled and driven in a forward direction by the conveying device drive controller 18 , and an operation for conveying the subject to be exposed 8 in the arrow A direction at a predetermined speed is started.
- step S 3 the image processing unit 14 performs image processing on an image of the surface of the subject to be exposed 8 captured by the imaging device 6 , and a front edge portion of a reference pattern group, which includes a plurality of reference patterns formed in advance in the first exposure area 9 , in the arrow A direction is detected at a front edge portion of the first exposure area 9 in the arrow A direction.
- step S 4 after the front edge portion of the first exposure area 9 in the arrow A direction is detected on the basis of the output of the position sensor of the conveying device 1 , the arithmetic unit 16 calculates a distance in which the subject to be exposed 8 moves. Then, the comparator 17 compares the calculated movement distance of the subject to be exposed 8 with the distance L read from the memory 15 . If both distances correspond to each other and, in step S 4 , it is determined to be YES, the process proceeds to step S 5 .
- step S 5 the light source drive controller 21 starts and turns on the light source 2 . Then, the source light 23 which is emitted from the light source 2 and converted into parallel light through the coupling optical system 3 is irradiated to the first mask pattern group 12 of the photomask 11 , and a first exposure pattern 24 is formed by exposure on the first exposure area 9 of the subject to be exposed 8 (see FIG. 6A ).
- step S 6 a movement distance of the subject to be exposed 8 is calculated by the arithmetic unit 16 on the basis of the output of the position sensor of the conveying device 1 , the distance is compared with the length of the first exposure area 9 in the arrow A direction read from the memory 15 by the comparator 17 , and it is determined whether or not the distance and the length correspond to each other and the exposure on the first exposure area 9 is completed. If the distance and the length correspond to each other (see FIG. 6B ) and “YES” is determined in step S 6 , the process proceeds to step S 7 .
- step S 7 the shutter drive controller 20 starts and moves the shutter 5 in the arrow B direction in synchronization with the conveying speed of the subject to be exposed 8 (see FIG. 6C ).
- the source light 23 is completely shut off by the shutter 5
- the movement of the shutter 5 is stopped and, at the same time, the conveying device 1 is stopped (see FIG. 6D ).
- step S 8 the conveying device 1 is driven in the reverse direction by the convey conveying device drive controller 18 , and the subject to be exposed 8 is returned in the direction (arrow D direction) opposite to the arrow A direction by a distance in which the subject to be exposed 8 moves and overruns while the shutter 5 moves (see FIG. 6E ).
- the mask stage drive controller 19 is started, the mask stage 4 is moved in the arrow C direction, and the mask pattern group of the photomask 11 is switched from the first mask pattern group 12 to the second mask pattern group 13 (see FIG. 6E ).
- step S 9 the conveying device 1 is driven in the forward direction by the conveying device drive controller 18 , the subject to be exposed 8 is conveyed again in the arrow A direction, and the shutter drive controller 20 is started to move the shutter 5 in the arrow B direction in synchronization with the conveying speed of the subject to be exposed 8 (see FIG. 6F ).
- the shut off of the source light 23 is completely released, the movement of the shutter 5 is stopped, and a second exposure pattern 25 is formed by exposure on the second exposure area 10 of the subject to be exposed 8 by the second mask pattern group 13 of the photomask 11 (see FIG. 6G ).
- step S 10 a movement distance of the subject to be exposed 8 is calculated by the arithmetic unit 16 on the basis of the output of the position sensor of the conveying device 1 , the distance is compared with the length of the second exposure area 10 in the arrow A direction read from the memory 15 by the comparator 17 , and it is determined whether or not the distance and the length correspond to each other and the exposure on the second exposure area 10 is completed.
- the distance and the length correspond to each other and “YES” is determined, the exposure ends.
- the light source 2 is turned off by the control of the light source drive controller 21 and the drive of the conveying device 1 is stopped by the control of the conveying device drive controller 18 .
- the conveying device 1 is continuously driven.
- the present invention is not limited to this, and there may be three or more exposure areas set on the subjects to be exposed 8 .
- three or more mask pattern groups are arranged in the conveying direction of the subject to be exposed 8 (arrow A direction), and when step S 10 is completed, the process returns to step S 7 , and steps S 7 to S 10 are repeatedly performed until the exposure on all the exposure areas is completed.
- a shutter in which a plurality of opening portions and light shielding portions are alternately formed in the movement direction (arrow B direction) is used as the shutter 5 .
- the present invention is not limited to this, and the first and the second mask pattern groups 12 and 13 may be arranged and formed in a direction substantially perpendicular to the conveying direction of the subject to be exposed 8 .
- the mask stage 4 moves in the direction substantially perpendicular to the conveying direction of the subject to be exposed 8 , and the switching between the first and the second mask pattern groups 12 and 13 is performed.
- the present invention is not limited to this, and the embodiment may be applied to a projection exposure apparatus in which the exposure is performed by projecting the mask pattern group of the photomask 11 onto the subject to be exposed 8 .
- the movement direction of the shutter 5 is opposite to the conveying direction of the subject to be exposed 8 .
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
- This application is a continuation of PCT/JP2010/054565, filed on Mar. 17, 2010.
- 1. Field of the Invention
- The present invention relates to an exposure method and an exposure apparatus for forming a different exposure pattern on each of a plurality of exposure areas set on a subject to be exposed while conveying the subject to be exposed in one direction. In particular, the invention relates to an exposure method and an exposure apparatus for enhancing formation efficiency of a plurality of types of exposure patterns.
- 2. Description of Related Art
- Conventionally, in this type of exposure method, while a subject to be exposed is being conveyed in one direction, one mask pattern group of a photomask is selected and one exposure pattern group is formed on a predetermined exposure area of a subject to be exposed by exposure using the one mask pattern group. Next, the subject to be exposed is returned to a stand-by position at which the subject to be exposed is positioned before starting exposure, and then, the mask pattern group of the photomask is switched to another mask pattern group, and thereafter, the subject to be exposed is conveyed again and another exposure pattern group is formed on another exposure area of the subject to be exposed by exposure using the another mask pattern group (for example, see Japanese Laid-Open Patent Publication No. 2008-310217).
- However, in such a conventional exposure method, every time the exposure by one mask pattern group is completed, the subject to be exposed is returned to the standby position at which the subject to be exposed is positioned before the exposure is started, so that the more the types of the exposure patterns to be formed, the longer the total movement distance in which the subject to be exposed moves until all exposures to the subject to be exposed are completed. Therefore, when a plurality of exposure patterns is formed on the same subject to be exposed, there is a problem that the formation efficiency of exposure patterns is low.
- Therefore, in view of the above-mentioned problems, an object of the present invention is to provide an exposure method and an exposure apparatus for enhancing the formation efficiency of a plurality of types of exposure patterns on the same subject to be exposed.
- In order to achieve the above object, the exposure method according to the present invention is a method for forming a different exposure pattern on each of a plurality of exposure areas set on a subject to be exposed in a conveying direction of the subject to be exposed at a predetermined interval while conveying the subject to be exposed in one direction, and the exposure method includes the steps of: moving a shutter in synchronization with a conveying speed of the subject to be exposed and shutting off source light when exposure on one exposure area of the subject to be exposed is completed, the exposure being performed by using one mask pattern group of a photomask in which a plurality of types of mask pattern groups corresponding to each exposure pattern is arranged and formed in the conveying direction of the subject to be exposed at a predetermined interval: returning the subject to be exposed in a direction opposite to the conveying direction by a distance in which the subject to be exposed moves while the shutter moves and switching the mask pattern group from the one mask pattern group to another mask pattern group by moving the photomask; and restarting the conveying of the subject to be exposed in the conveying direction and at the same time moving the shutter in synchronization with the conveying speed of the subject to be exposed to release shut-off of the source light, and exposure on the following exposure area is performed when the switching the mask pattern group from the one mask pattern group of the photomask to another mask pattern group is completed.
- By the above-mentioned configuration, when exposure on one exposure area of the object to be exposed is completed, the exposure being performed while conveying the subject to be exposed in one direction by using one mask pattern group of the photomask in which a plurality of types of mask pattern groups corresponding to each exposure pattern are formed, the shutter is moved in synchronization with the conveying speed of the subject to be exposed and the source light is shut off, the subject to be exposed is returned in a direction opposite to the conveying direction by the distance in which the subject to be exposed moves while the shutter moves, and the one mask pattern group is switched to another mask pattern group by moving the photomask. When the switching the mask pattern group from the one mask pattern group of the photomask to another mask pattern group is completed, the conveying of the subject to be exposed in the conveying direction is restarted, and at the same time, the shutter is moved in synchronization with the conveying speed of the subject to be exposed to release shut-off of the source light, exposure on the following exposure area is performed, and different exposure patterns are formed for each of a plurality of exposure areas set on the subject to be exposed in the conveying direction of the subject to be exposed at a predetermined interval.
- The shutter is moved in the conveying direction of the subject to be exposed.
- Furthermore, the shutter includes a plurality of light shielding portions and opening portions alternately arranged in the conveying direction of the subject to be exposed. Thereby, the plurality of light shielding portions and opening portions are alternately switched to each other by moving the shutter in the conveying direction of the subject to be exposed.
- The exposure apparatus according to the present invention is an exposure apparatus for forming a different exposure pattern on each of a plurality of exposure areas set on a subject to be exposed in a conveying direction of the subject to be exposed at a predetermined interval while conveying the subject to be exposed in one direction, and the exposure apparatus includes: a conveying device which conveys the subject to be exposed at a predetermined speed; a shutter which is formed to be able to move in synchronization with a movement of the subject to be exposed and which shuts off source light and releases shut-off of the source light; and a mask stage which is arranged to face an upper surface of the conveying device and which holds a photomask in which a plurality of types of mask pattern groups corresponding to each exposure pattern are formed and the mask stage moves to perform switching of the plurality of types of mask pattern groups. The shutter is moved to shut off the source light when exposure on one exposure area of the subject to be exposed is completed, the exposure being performed by using one mask pattern group of the photomask. The conveying device returns the subject to be exposed in a direction opposite to the conveying direction by a distance in which the subject to be exposed moves while the shutter moves, and the one mask pattern group of the photomask is switched to another mask pattern group by moving the mask stage. The conveying of the subject to be exposed in the conveying direction is restarted, and at the same time, the shutter is moved to release shut-off of the source light, and exposure on the following exposure area is performed.
- By the above-mentioned configuration, when exposure on one exposure area of the subject to be exposed is completed, the exposure being performed by using one mask pattern group of the photomask while conveying the exposure to be exposed in one direction at a predetermined speed, the shutter is moved in synchronization with the movement of the exposure to be exposed to shut off the source light, the subject to be exposed is returned by the conveying device in the direction opposite to the conveying direction by the distance in which the subject to be exposed moves while the shutter moves, the one mask pattern group is switched to another mask pattern group by moving the mask stage, the conveying of the subject to be exposed in the conveying direction is restarted by the conveying device, and at the same time, the shutter is moved in the movement direction of the subject to be exposed in synchronization with the movement of the subject to be exposed to release shut-off of the source light, and then, exposure on the following exposure area is performed, so that different exposure patterns are formed for each of a plurality of exposure areas set on the subject to be exposed in the conveying direction of the subject to be exposed at a predetermined interval.
- Furthermore, the shutter is moved in the conveying direction of the subject to be exposed.
- The shutter includes a plurality of light shielding portions and opening portions alternately arranged in the conveying direction of the subject to be exposed. Thereby, the plurality of light shielding portions and opening portions is alternately switched to each other by moving the shutter in the conveying direction of the subject to be exposed.
- According to a first or fourth aspect of the present invention, each time the exposure of one exposure pattern with respect to one exposure area is completed, the subject to be exposed is returned by the distance in which the subject to be exposed moves while the shutter moves and exposure of another exposure pattern is performed on a new exposure area by switching the mask pattern group of the photomask, so that the movement distance of the subject to be exposed returned in the direction opposite to the conveying direction of the subject to be exposed is significantly smaller than that of the conventional art. Therefore, the total movement distance of the subject to be exposed until all the exposure is completed is significantly shorter than that of the conventional art. Thus, the formation efficiency of a plurality of types of exposure patterns on the same subject to be exposed is further enhanced compared with that of the conventional art.
- According to a second or fifth aspect of the present invention, it is possible to form a proximity exposure apparatus in which a photomask is arranged to approach and face the subject to be exposed.
- Furthermore, according to a third or sixth aspect of the present invention, when different exposure patterns are exposed on three or more exposure areas of the subject to be exposed, only an operation in which the shutter is moved in one direction and a plurality of opening portions and light shielding portions are switched needs to be performed, so that the drive operation control of the shutter is easily performed.
-
FIG. 1 is a schematic view of an embodiment of an exposure apparatus according to the embodiment of the present invention; -
FIG. 2 is a plan view of a setting example of exposure areas set on a surface of a subject to be exposed used in the exposure apparatus; -
FIG. 3 is a plan view of a configuration example of a photomask used in the exposure apparatus; -
FIG. 4 is a block diagram of a schematic configuration of a control device of the exposure apparatus; -
FIG. 5 is a flowchart of an exposure method of the present invention; and -
FIG. 6 is an explanatory view of the exposure method of the present invention. - Hereinafter, an embodiment of the present invention will be described in detail with reference to the attached drawings.
FIG. 1 is a schematic view of the embodiment of an exposure apparatus according to the present invention. The exposure apparatus forms a different exposure pattern on each of a plurality of exposure areas set on a subject to be exposed while conveying the subject to be exposed in one direction. The exposure apparatus includes aconveying device 1, alight source 2, a couplingoptical system 3, amask stage 4, ashutter 5, animaging device 6, and acontrol device 7. - The
conveying device 1 conveys a subject to be exposed 8 placed on an upper surface of theconveying device 1 in a direction indicated by an arrow A at a predetermined speed. Theconveying device 1 emits air from the upper surface as well as absorbs air. Thus, emission power and absorption power of the air are controlled to float the subject to be exposed 8 by a predetermined amount. In this state, both ends of the subject to be exposed 8 are held by conveying rollers not shown inFIG. 1 to convey the subject to be exposed 8. Theconveying device 1 is provided with a speed sensor for detecting a moving speed of the subject to be exposed 8 and a position sensor (not shown inFIG. 1 ) for detecting the position of the subject to be exposed 8. - As shown in
FIG. 2 , on the subject to be exposed 8 used here, afirst exposure area 9 in which a first exposure pattern group is formed and asecond exposure area 10 in which a second exposure pattern group is formed are set in advance in a conveying direction (arrow A direction) at a predetermined interval. For example, the subject to be exposed 8 is a color filter substrate. - The
light source 2 is provided above theconveying device 1. Thelight source 2 emits ultraviolet light assource light 23. Thelight source 2 is a xenon lamp, an extra high pressure mercury lamp, a laser light source, or the like. - The coupling
optical system 3 is provided in front of a light emitting direction of thelight source 2. The couplingoptical system 3 converts thesource light 23 emitted from thelight source 2 into parallel light and irradiates the parallel light to a mask pattern group of aphotomask 11 described below. The couplingoptical system 3 includes optical components such as a photo integrator and a condenser lens. - The
mask stage 4 is provided to face the upper surface of theconveying device 1. Themask stage 4 holds outer edges of thephotomask 11 on which a first and a second 12 and 13 corresponding to the first and the second exposure pattern groups, respectively, different from each other formed on the subject to be exposed 8 are arranged and formed in the conveying direction (arrow A direction) of the subject to be exposed 8 at a predetermined interval as shown inmask pattern groups FIG. 3 . Themask stage 4 is formed to be able to move in the same direction (arrow C direction) as the conveying direction of the subject to be exposed 8 indicated by the arrow A. - The
shutter 5 is provided between the couplingoptical system 3 and themask stage 4. Theshutter 5 shuts off and releases thesource light 23 irradiated to thephotomask 11. Theshutter 5 is formed to be able to move in the same direction (arrow B direction) as the conveying direction of the subject to be exposed 8 indicated by the arrow A in synchronization with the movement of the subject to be exposed 8. - The
imaging device 6 is provided to be able to capture an image of a position a predetermined distance away from an exposure position of thephotomask 11 in the direction opposite to the conveying direction (arrow A direction). Theimaging device 6 captures an image of the surface of the subject to be exposed 8. Theimaging device 6 is a line camera in which a plurality of light receiving elements are linearly aligned in a direction substantially perpendicular to the conveying direction in the plane parallel to the upper surface of the conveyingdevice 1. Specifically, theimaging device 6 is arranged to capture an image of a position away from an exposure center position of the mask pattern group of thephotomask 11 by a distance L in the direction opposite to the conveying direction. - The
control device 7 is electrically connected to the conveyingdevice 1, thelight source 2, themask stage 4, theshutter 5, and the image pickup means 6. Thecontrol device 7 appropriately controls the movements of the conveyingdevice 1, themask stage 4, and theshutter 5. As shown inFIG. 4 , thecontrol device 7 includes animage processing unit 14, amemory 15, anarithmetic unit 16, acomparator 17, a conveyingdevice drive controller 18, a maskstage drive controller 19, a shutter drive controller 20, a lightsource drive controller 21, and acontrol unit 22. - Here, the
image processing unit 14 performs image processing on an image of the surface of the subject to be exposed 8 captured by theimaging device 6 and detects the front positions of the 9 and 10 in the conveying direction. Theexposure areas memory 15 stores the lengths of the 9 and 10 in the arrow A direction, the distance L between the exposure center position of theexposure areas photomask 11 and the image capturing position of theimaging device 6, and the like, and temporarily stores a calculation result of thearithmetic unit 16 described below. Furthermore, thearithmetic unit 16 calculates the movement distance of the subject to be exposed 8 on the basis of an output of the position sensor of the conveyingdevice 1. Furthermore, thecomparator 17 compares the movement distance of the conveyingdevice 1 calculated by thearithmetic unit 16 with the each length read from thememory 15. The conveyingdevice drive controller 18 controls forward drive and reverse drive of the conveyingdevice 1. The maskstage drive controller 19 moves themask stage 4 and switches the mask pattern group of thephotomask 11 from the firstmask pattern group 12 to the secondmask pattern group 13. The shutter drive controller 20 moves theshutter 5 in synchronization with a conveying speed of the subject to be exposed 8. Furthermore, the lightsource drive controller 21 controls drive to turn on and off thelight source 2. Thecontrol unit 22 integrally controls the entire apparatus so that the constituent elements described above are appropriately driven. - Next, an operation of the exposure apparatus configured as described above and an exposure method performed by using the exposure apparatus will be described with reference to
FIG. 5 . Here, a case will be described in which thefirst exposure area 9 and thesecond exposure area 10, on the each surfaces of which different exposure patterns are formed, are set on the subject to be exposed 8 at a predetermined interval in the conveying direction. - First, in step S1, the
mask stage 4 stops at a standby position and the firstmask pattern group 12 of thephotomask 11 is selected. Theshutter 5 stops at a standby position and the shut off of the source light 23 is released. - In step S2, the conveying
device 1 is controlled and driven in a forward direction by the conveyingdevice drive controller 18, and an operation for conveying the subject to be exposed 8 in the arrow A direction at a predetermined speed is started. - In step S3, the
image processing unit 14 performs image processing on an image of the surface of the subject to be exposed 8 captured by theimaging device 6, and a front edge portion of a reference pattern group, which includes a plurality of reference patterns formed in advance in thefirst exposure area 9, in the arrow A direction is detected at a front edge portion of thefirst exposure area 9 in the arrow A direction. - In step S4, after the front edge portion of the
first exposure area 9 in the arrow A direction is detected on the basis of the output of the position sensor of the conveyingdevice 1, thearithmetic unit 16 calculates a distance in which the subject to be exposed 8 moves. Then, thecomparator 17 compares the calculated movement distance of the subject to be exposed 8 with the distance L read from thememory 15. If both distances correspond to each other and, in step S4, it is determined to be YES, the process proceeds to step S5. - In step S5, the light
source drive controller 21 starts and turns on thelight source 2. Then, the source light 23 which is emitted from thelight source 2 and converted into parallel light through the couplingoptical system 3 is irradiated to the firstmask pattern group 12 of thephotomask 11, and afirst exposure pattern 24 is formed by exposure on thefirst exposure area 9 of the subject to be exposed 8 (seeFIG. 6A ). - In step S6, a movement distance of the subject to be exposed 8 is calculated by the
arithmetic unit 16 on the basis of the output of the position sensor of the conveyingdevice 1, the distance is compared with the length of thefirst exposure area 9 in the arrow A direction read from thememory 15 by thecomparator 17, and it is determined whether or not the distance and the length correspond to each other and the exposure on thefirst exposure area 9 is completed. If the distance and the length correspond to each other (seeFIG. 6B ) and “YES” is determined in step S6, the process proceeds to step S7. - In step S7, the shutter drive controller 20 starts and moves the
shutter 5 in the arrow B direction in synchronization with the conveying speed of the subject to be exposed 8 (seeFIG. 6C ). When the source light 23 is completely shut off by theshutter 5, the movement of theshutter 5 is stopped and, at the same time, the conveyingdevice 1 is stopped (seeFIG. 6D ). - In step S8, the conveying
device 1 is driven in the reverse direction by the convey conveyingdevice drive controller 18, and the subject to be exposed 8 is returned in the direction (arrow D direction) opposite to the arrow A direction by a distance in which the subject to be exposed 8 moves and overruns while theshutter 5 moves (seeFIG. 6E ). At the same time, the maskstage drive controller 19 is started, themask stage 4 is moved in the arrow C direction, and the mask pattern group of thephotomask 11 is switched from the firstmask pattern group 12 to the second mask pattern group 13 (seeFIG. 6E ). - In step S9, the conveying
device 1 is driven in the forward direction by the conveyingdevice drive controller 18, the subject to be exposed 8 is conveyed again in the arrow A direction, and the shutter drive controller 20 is started to move theshutter 5 in the arrow B direction in synchronization with the conveying speed of the subject to be exposed 8 (seeFIG. 6F ). When the shut off of the source light 23 is completely released, the movement of theshutter 5 is stopped, and asecond exposure pattern 25 is formed by exposure on thesecond exposure area 10 of the subject to be exposed 8 by the secondmask pattern group 13 of the photomask 11 (seeFIG. 6G ). - In step S10, a movement distance of the subject to be exposed 8 is calculated by the
arithmetic unit 16 on the basis of the output of the position sensor of the conveyingdevice 1, the distance is compared with the length of thesecond exposure area 10 in the arrow A direction read from thememory 15 by thecomparator 17, and it is determined whether or not the distance and the length correspond to each other and the exposure on thesecond exposure area 10 is completed. Here, if the distance and the length correspond to each other and “YES” is determined, the exposure ends. Thelight source 2 is turned off by the control of the lightsource drive controller 21 and the drive of the conveyingdevice 1 is stopped by the control of the conveyingdevice drive controller 18. Here, if a plurality of subjects to be exposed 8 is sequentially conveyed and exposure is continuously performed on the plurality of subjects to be exposed 8, the conveyingdevice 1 is continuously driven. - Although, in the above embodiment, a case is described in which there are two exposure areas set on the subject to be exposed 8, the present invention is not limited to this, and there may be three or more exposure areas set on the subjects to be exposed 8. In this case, three or more mask pattern groups are arranged in the conveying direction of the subject to be exposed 8 (arrow A direction), and when step S10 is completed, the process returns to step S7, and steps S7 to S10 are repeatedly performed until the exposure on all the exposure areas is completed. In this case, it is preferred that a shutter in which a plurality of opening portions and light shielding portions are alternately formed in the movement direction (arrow B direction) is used as the
shutter 5. - Although, in the above embodiment, a case is described in which the first and the second
12 and 13 are arranged and formed in the conveying direction of the subject to be exposed 8 at a predetermined interval, the present invention is not limited to this, and the first and the secondmask pattern groups 12 and 13 may be arranged and formed in a direction substantially perpendicular to the conveying direction of the subject to be exposed 8. In this case, themask pattern groups mask stage 4 moves in the direction substantially perpendicular to the conveying direction of the subject to be exposed 8, and the switching between the first and the second 12 and 13 is performed.mask pattern groups - Although, in the above embodiment, a case is described in which the embodiment is applied to a proximity exposure apparatus in which the
photomask 11 is arranged to approach and face the subject to be exposed 8, the present invention is not limited to this, and the embodiment may be applied to a projection exposure apparatus in which the exposure is performed by projecting the mask pattern group of thephotomask 11 onto the subject to be exposed 8. In this case, the movement direction of theshutter 5 is opposite to the conveying direction of the subject to be exposed 8. - It should be noted that the entire contents of Japanese Patent Application No. 2009-090617, filed on Apr. 3, 2009, on which the convention priority is claimed is incorporated herein by reference.
- It should also be understood that many modifications and variations of the described embodiments of the invention will occur to a person having an ordinary skill in the art without departing from the spirit and scope of the present invention as claimed in the appended claims.
Claims (6)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009090617A JP5258051B2 (en) | 2009-04-03 | 2009-04-03 | Exposure method and exposure apparatus |
| JP2009-090617 | 2009-04-03 | ||
| PCT/JP2010/054565 WO2010113644A1 (en) | 2009-04-03 | 2010-03-17 | Exposure method and exposure apparatus |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2010/054565 Continuation WO2010113644A1 (en) | 2009-04-03 | 2010-03-17 | Exposure method and exposure apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20120113403A1 true US20120113403A1 (en) | 2012-05-10 |
| US8497979B2 US8497979B2 (en) | 2013-07-30 |
Family
ID=42827944
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US13/251,850 Expired - Fee Related US8497979B2 (en) | 2009-04-03 | 2011-10-03 | Exposure method and exposure apparatus |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8497979B2 (en) |
| JP (1) | JP5258051B2 (en) |
| KR (1) | KR101688128B1 (en) |
| CN (1) | CN102365589B (en) |
| TW (1) | TWI490658B (en) |
| WO (1) | WO2010113644A1 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5354803B2 (en) | 2010-06-28 | 2013-11-27 | 株式会社ブイ・テクノロジー | Exposure equipment |
| JP6762640B1 (en) * | 2020-07-06 | 2020-09-30 | 株式会社 ベアック | Exposure device |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06232031A (en) * | 1993-02-01 | 1994-08-19 | Nikon Corp | Aligner |
| JPH0794387A (en) * | 1993-09-21 | 1995-04-07 | Nikon Corp | Exposure equipment |
| US5677754A (en) * | 1994-06-17 | 1997-10-14 | Nikon Corporation | Scanning exposure apparatus |
| US6078381A (en) * | 1993-02-01 | 2000-06-20 | Nikon Corporation | Exposure method and apparatus |
| US6160611A (en) * | 1997-12-18 | 2000-12-12 | Sanei Giken Co., Ltd. | Exposing apparatus and method |
| JP2001305747A (en) * | 2000-02-18 | 2001-11-02 | Nikon Corp | Exposure apparatus and exposure method |
| US6608665B1 (en) * | 1993-06-11 | 2003-08-19 | Nikon Corporation | Scanning exposure apparatus having adjustable illumination area and methods related thereto |
| US20070013894A1 (en) * | 2005-07-13 | 2007-01-18 | Asml Netherlands B.V. | Stage apparatus, lithographic apparatus and device manufacturing method |
| WO2007049436A1 (en) * | 2005-10-25 | 2007-05-03 | V Technology Co., Ltd. | Exposure apparatus |
| JP2007193154A (en) * | 2006-01-20 | 2007-08-02 | Hitachi High-Technologies Corp | Exposure apparatus, exposure method, and manufacturing method of display panel substrate |
| US20070242249A1 (en) * | 2006-03-03 | 2007-10-18 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3725671B2 (en) * | 1997-08-08 | 2005-12-14 | 日立ハイテク電子エンジニアリング株式会社 | Proximity exposure apparatus and method, and liquid crystal display manufacturing method |
| JP3360662B2 (en) * | 1999-10-05 | 2002-12-24 | 日本電気株式会社 | Electron beam drawing method and electron beam drawing mask |
| JP2002099097A (en) * | 2000-09-25 | 2002-04-05 | Nikon Corp | Scanning exposure method and scanning type exposure apparatus |
| KR20080108226A (en) * | 2006-03-03 | 2008-12-12 | 가부시키가이샤 니콘 | Exposure method and apparatus, and device manufacturing method |
| JP4764237B2 (en) * | 2006-04-11 | 2011-08-31 | 株式会社ブイ・テクノロジー | Exposure equipment |
| JP5083517B2 (en) | 2007-06-18 | 2012-11-28 | 凸版印刷株式会社 | Different pattern exposure method |
| JP5235061B2 (en) * | 2007-08-30 | 2013-07-10 | 株式会社ブイ・テクノロジー | Exposure equipment |
-
2009
- 2009-04-03 JP JP2009090617A patent/JP5258051B2/en not_active Expired - Fee Related
-
2010
- 2010-03-17 KR KR1020117024326A patent/KR101688128B1/en not_active Expired - Fee Related
- 2010-03-17 CN CN201080014236.0A patent/CN102365589B/en not_active Expired - Fee Related
- 2010-03-17 WO PCT/JP2010/054565 patent/WO2010113644A1/en not_active Ceased
- 2010-04-02 TW TW099110265A patent/TWI490658B/en not_active IP Right Cessation
-
2011
- 2011-10-03 US US13/251,850 patent/US8497979B2/en not_active Expired - Fee Related
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06232031A (en) * | 1993-02-01 | 1994-08-19 | Nikon Corp | Aligner |
| US6078381A (en) * | 1993-02-01 | 2000-06-20 | Nikon Corporation | Exposure method and apparatus |
| US6411364B1 (en) * | 1993-02-01 | 2002-06-25 | Nikon Corporation | Exposure apparatus |
| US6608665B1 (en) * | 1993-06-11 | 2003-08-19 | Nikon Corporation | Scanning exposure apparatus having adjustable illumination area and methods related thereto |
| JPH0794387A (en) * | 1993-09-21 | 1995-04-07 | Nikon Corp | Exposure equipment |
| US5677754A (en) * | 1994-06-17 | 1997-10-14 | Nikon Corporation | Scanning exposure apparatus |
| US6160611A (en) * | 1997-12-18 | 2000-12-12 | Sanei Giken Co., Ltd. | Exposing apparatus and method |
| JP2001305747A (en) * | 2000-02-18 | 2001-11-02 | Nikon Corp | Exposure apparatus and exposure method |
| US20070013894A1 (en) * | 2005-07-13 | 2007-01-18 | Asml Netherlands B.V. | Stage apparatus, lithographic apparatus and device manufacturing method |
| WO2007049436A1 (en) * | 2005-10-25 | 2007-05-03 | V Technology Co., Ltd. | Exposure apparatus |
| JP2007193154A (en) * | 2006-01-20 | 2007-08-02 | Hitachi High-Technologies Corp | Exposure apparatus, exposure method, and manufacturing method of display panel substrate |
| US20070242249A1 (en) * | 2006-03-03 | 2007-10-18 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2010113644A1 (en) | 2010-10-07 |
| TW201107892A (en) | 2011-03-01 |
| JP5258051B2 (en) | 2013-08-07 |
| KR101688128B1 (en) | 2016-12-20 |
| US8497979B2 (en) | 2013-07-30 |
| CN102365589B (en) | 2014-03-26 |
| KR20120007000A (en) | 2012-01-19 |
| JP2010243679A (en) | 2010-10-28 |
| CN102365589A (en) | 2012-02-29 |
| TWI490658B (en) | 2015-07-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8982321B2 (en) | Exposure method and exposure apparatus | |
| TW200712733A (en) | Projection device and projection control method | |
| KR101674131B1 (en) | Alignment method, alignment device, and exposure device | |
| ATE557320T1 (en) | IMAGE PROJECTOR | |
| TW201608345A (en) | Drawing device | |
| US9030646B2 (en) | Exposure apparatus and photomask used therein | |
| US8497979B2 (en) | Exposure method and exposure apparatus | |
| JP5098041B2 (en) | Exposure method | |
| TW202043845A (en) | Direct drawing type exposure apparatus which has a simple structure that can be reduced in cost and execute an exposure process with high productivity | |
| US8717544B2 (en) | Alignment method, alignment apparatus, and exposure apparatus | |
| US9207546B2 (en) | Exposure method and exposure apparatus | |
| TWI481971B (en) | Exposure method and exposure apparatus | |
| JP2008076709A (en) | Exposure equipment | |
| TWI391796B (en) | Exposure apparatus and exposed substance | |
| JP6661303B2 (en) | Position detecting device, position detecting method, exposure apparatus and exposure method | |
| JP2786945B2 (en) | Film exposure equipment | |
| CN121000854A (en) | Optical platform including multiple optical projectors | |
| KR100915452B1 (en) | Locating method and apparatus of pixel image using spatial light modulator | |
| JP2016058591A5 (en) | Light source device, illumination device, exposure device, and article manufacturing method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AS | Assignment |
Owner name: V. TECHNOLOGY CO., LTD., JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:KAJIYAMA, KOICHI;REEL/FRAME:027009/0392 Effective date: 20110906 |
|
| AS | Assignment |
Owner name: V TECHNOLOGY CO., LTD., JAPAN Free format text: CORRECTION ASSIGNMENT TO CORRECT ERROR IN ASSIGNEE'S NAME AND TITLE IN ASSIGNMENT RECORDED AT REEL 027009 FRAME 0392;ASSIGNOR:KAJIYAMA, KOICHI;REEL/FRAME:028406/0730 Effective date: 20110906 |
|
| FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
| STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
| FPAY | Fee payment |
Year of fee payment: 4 |
|
| FEPP | Fee payment procedure |
Free format text: MAINTENANCE FEE REMINDER MAILED (ORIGINAL EVENT CODE: REM.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
| LAPS | Lapse for failure to pay maintenance fees |
Free format text: PATENT EXPIRED FOR FAILURE TO PAY MAINTENANCE FEES (ORIGINAL EVENT CODE: EXP.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
| STCH | Information on status: patent discontinuation |
Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362 |
|
| FP | Lapsed due to failure to pay maintenance fee |
Effective date: 20210730 |