US20120052280A1 - Coating, article coated with coating, and method for manufacturing article - Google Patents
Coating, article coated with coating, and method for manufacturing article Download PDFInfo
- Publication number
- US20120052280A1 US20120052280A1 US13/008,991 US201113008991A US2012052280A1 US 20120052280 A1 US20120052280 A1 US 20120052280A1 US 201113008991 A US201113008991 A US 201113008991A US 2012052280 A1 US2012052280 A1 US 2012052280A1
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- United States
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- sccm
- titanium aluminum
- substrate
- vacuum chamber
- aluminum silicon
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0664—Carbonitrides
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/26—Web or sheet containing structurally defined element or component, the element or component having a specified physical dimension
- Y10T428/263—Coating layer not in excess of 5 mils thick or equivalent
- Y10T428/264—Up to 3 mils
- Y10T428/265—1 mil or less
Definitions
- the exemplary disclosure generally relates to coatings, and particularly relates to articles coated with the coatings and method for manufacturing the articles.
- PVD Physical vapor deposition
- TiN Titanium nitride
- TiAlN Titanium-aluminum nitride
- these coating materials have a low hardness and a low temperature oxidation resistance.
- FIG. 1 is a cross-sectional view of an exemplary embodiment of coating.
- FIG. 2 is a cross-sectional view of an article coated with the coating in FIG. 1 .
- FIG. 3 is a block diagram of a method for manufacturing an article coated with the coating in FIG. 1 .
- FIG. 4 is a schematic view of a magnetron sputtering coating machine for manufacturing the article in FIG. 2 .
- a coating 10 includes a titanium aluminum silicon carbon-nitride (TiAlSiCN) layer 11 .
- the TiAlSiCN layer 11 may be deposited by magnetron sputtering.
- the TiAlSiCN layer 11 has a thickness ranging from about 0.7 micrometers to about 2.5 micrometers.
- the TiAlSiCN layer 11 includes a first surface 112 and an opposite second surface 114 .
- the atomic carbon content and/or the atomic nitrogen content in the TiAlSiCN layer 11 gradually increases from the first surface 112 to the second surface 114 .
- the coating 10 may also include a color layer 13 covering on the second surface 114 of the TiAlSiCN layer 11 , to decorate the appearance of the coating 10 .
- an exemplary article 40 includes a substrate 30 , a bonding layer 20 deposited on the substrate 30 and the coating 10 deposited on bonding layer 20 .
- the first surface 112 of the coating 10 covers on the bonding layer 20 .
- the substrate 30 is made of a metal, such as high speed steel, hard alloy, or stainless steel.
- the article 40 may be cutting tools, molds, or housings of electronic devices.
- the bonding layer 20 is a titanium aluminum silicon (TiAlSi) layer.
- the bonding layer 20 has a thickness ranging from about 200 nanometers to about 300 micrometers.
- the bonding layer 20 can be deposited by magnetron sputtering.
- the chemical stability of the bonding layer 20 is between the chemical stability of the substrate 30 and the chemical stability of the coating 10
- the coefficient of thermal expansion of the bonding layer 20 is between the coefficient of thermal expansion of the substrate 30 and the coefficient of thermal expansion of the coating 10 .
- the bonding layer 20 is used to improve binding force between the substrate 30 and the coating 10 so the coating 10 can be firmly deposited on the substrate 30 .
- a method for manufacturing the article 40 may include at least the following steps:
- the substrate 30 may be made of high speed steel, hard alloy, or stainless steel.
- the substrate 30 is pretreated by cleaning the substrate 30 using deionized water and alcohol successively.
- the substrate 30 is then washed with a solution (e.g., Alcohol or Acetone) in an ultrasonic cleaner, to remove impurities such as grease, or dirt.
- a solution e.g., Alcohol or Acetone
- the substrate 30 is dried.
- the substrate 30 is cleaned by argon plasma cleaning.
- the substrate 30 is retained on a rotating bracket 50 in a vacuum chamber 60 of a magnetron sputtering coating machine 100 .
- the vacuum level of the vacuum chamber 60 is adjusted to about 8.0 ⁇ 10-3 Pa, pure argon is fed into the vacuum chamber 60 at a flux of about 100 Standard Cubic Centimeters per Minute (sccm) to about 300 sccm from a gas inlet 90 , and a bias voltage is applied to the substrate 30 in a range of about ⁇ 300 to ⁇ 500 volts for about 10-15 minutes. So the substrate 30 is washed by argon plasma, to further remove the grease or dirt. Thus, the binding force between the substrate 30 and the coating 10 is enhanced.
- sccm Standard Cubic Centimeters per Minute
- a bonding layer 20 is deposited on the substrate 30 .
- the temperature in the vacuum chamber 60 is adjusted to about 250 ⁇ 400° C. (Celsius degree); the argon is fed into the vacuum chamber 60 at a flux from about 100 sccm to about 200 sccm from the gas inlet 90 , in this exemplary embodiment, at about 150 sccm; a titanium aluminum silicon alloy target 70 in the vacuum chamber 60 is evaporated; a bias voltage applied to the substrate 30 may be in a range of about ⁇ 300 to about ⁇ 500 volts, for about 5 to 10 min, to deposit the bonding layer 20 on the substrate 30 .
- the titanium aluminum silicon alloy target 70 contains atomic silicon in a range from about 1 to about 10 wt %, and the wt % content of the atomic titanium in the titanium aluminum silicon alloy target 70 is equal to the wt % content of the atomic aluminum in the titanium aluminum silicon alloy target 70 .
- a TiAlSiCN layer 11 is deposited on the bonding layer 20 .
- the temperature in the vacuum chamber 60 is kept at about 250 ⁇ 400° C.; argon is fed into the vacuum chamber 60 at a flux from about 100 sccm to about 200 sccm, methane is fed into the vacuum chamber 60 at a flux from about 5 sccm to about 15 sccm and nitrogen is fed into the vacuum chamber 60 at a flux from about 10 sccm to about 20 sccm from the gas inlet 90 ; the titanium aluminum alloy target 70 is evaporated; a bias voltage applied to the substrate 30 may be in a range of about ⁇ 50 to about ⁇ 300 volts, for about 60 to about 150 min, to deposit the TiAlSiCN layer 11 on the bonding layer 20 .
- the flux of the nitrogen and the flux of the methane are both increased about 15 sccm to about 20 sccm every 15 minutes.
- the atomic carbon content and the atomic nitrogen content in the TiAlSiCN layer 11 gradually increases from the first surface 112 to the second surface 114 .
- the atomic carbon content and the atomic nitrogen content in the TiAlSiCN layer 11 gradually increases from near the bonding layer 20 to away from the bonding layer 20 .
- a second exemplary embodiment for depositing the TiAlSiCN layer 11 on the bonding layer 20 is as follows: the temperature in the vacuum chamber 60 is kept at about 250 ⁇ 400° C.; argon is fed into the vacuum chamber 60 at a flux from about 100 sccm to about 200 sccm, methane is fed into the vacuum chamber 60 at a flux from about 5 sccm to about 15 sccm and nitrogen is fed into the vacuum chamber 60 at a flux from about 50 sccm to about 220 sccm from the gas inlet 90 ; the titanium aluminum alloy target 70 is evaporated; a bias voltage applied to the substrate 30 may be in a range of about ⁇ 50 to about ⁇ 300 volts, for about 60 to about 150 min, to deposit the TiAlSiCN layer 11 on the bonding layer 20 .
- the flux of the methane is increased about 15 sccm to about 20 sccm every 15 minutes.
- the atomic carbon content in the TiAlSiCN layer 11 gradually increases from the first surface 112 to the second surface 114 .
- the atomic carbon content in the TiAlSiCN layer 11 gradually increases from near the bonding layer 20 to away from the bonding layer 20 .
- a third exemplary embodiment for depositing the TiAlSiCN layer 11 on the bonding layer 20 is as follows: the temperature in the vacuum chamber 60 is kept at about 250 ⁇ 400° C.; argon is fed into the vacuum chamber 60 at a flux from about 100 sccm to about 200 sccm, methane is fed into the vacuum chamber 60 at a flux from about 50 sccm to 220 sccm and nitrogen is fed into the vacuum chamber 60 at a flux from about 5 sccm to about 15 sccm from the gas inlet 90 ; the titanium aluminum alloy target 70 is evaporated; a bias voltage applied to the substrate 30 may be in a range of about ⁇ 50 to about ⁇ 300 volts, for about 60 to 150 min, to deposit the TiAlSiCN layer 11 on the bonding layer 20 .
- the flux of the nitrogen is increased about 15 sccm to about 20 sccm every 15 minutes.
- the atomic nitrogen content in the TiAlSiCN layer 11 gradually increases from the first surface 112 to the second surface 114 .
- the atomic nitrogen content in the TiAlSiCN layer 11 gradually increases from near the bonding layer 20 to away from the bonding layer 20 .
- the color layer 13 may be deposited on the TiAlSiCN layer 11 to improve the appearance of the article 40 .
- atomic silicon can be not diffused in the TiN crystal, and is from Si3N4 phrase at the boundary of the TiN crystal, which can prevent the TiN crystal from enlarging, to maintain the TiN crystal at nanometer level.
- the nanometer lever TiN crystal can improve hardness and toughness of the TiAlSiCN layer 11 .
- atomic carbon not only can react with atomic titanium, atomic aluminum and atomic nitrogen to form solid solution phrase, and can form TiC phrase, which can further improve hardness and toughness of the TiAlSiCN layer 11 .
- the atomic carbon content and/or the atomic nitrogen content in the TiAlSiCN layer 11 gradually increases from near the bonding layer 20 to away from the bonding layer 20 .
- the coefficient of thermal expansion of the TiAlSiCN layer 11 is close to the coefficient of thermal expansion of the bonding layer 20 , so the stress generated between the TiAlSiCN layer 11 and the bonding layer 20 is small.
- the TiAlSiCN layer 11 can improve the binding force between the bonding layer 20 and the TiAlSiCN layer 11 so the coating 10 can be firmly deposited on the substrate 30 .
- the TiAlSiCN layer 11 can improve the hardness of the coating 10 and the binding force between the bonding layer 20 and the TiAlSiCN layer 11 , which can improve the abrasion resistance of the coating 10 .
- the atomic aluminum and atomic silicon in the TiAlSiCN layer 11 can be react with oxygen to form SiO 2 which can prevent exterior oxygen from diffusing in the TiAlSiCN layer 11 .
- the TiAlSiCN layer 11 can make the coating 10 has high temperature oxidation resistance.
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
- The present application is related to co-pending U.S. patent applications (Attorney Docket No. US34918, US34919), entitled “COATING, ARTICLE COATED WITH COATING, AND METHOD FOR MANUFACTURING ARTICLE”, by Zhang et al. These applications have the same assignee as the present application and has been concurrently filed herewith. The above-identified applications are incorporated herein by reference.
- 1. Technical Field
- The exemplary disclosure generally relates to coatings, and particularly relates to articles coated with the coatings and method for manufacturing the articles.
- 2. Description of Related Art
- Physical vapor deposition (PVD) has conventionally been used to form a coating on metal bases of cutting tools or molds. Materials used as this coating material are required to have excellent hardness and toughness. Presently, Titanium nitride (TiN) and Titanium-aluminum nitride (TiAlN) are mainly used as a material satisfying these requirements. However, these coating materials have a low hardness and a low temperature oxidation resistance.
- Therefore, there is room for improvement within the art.
- Many aspects of the embodiments can be better understood with reference to the following drawings. The components in the drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the exemplary coating, article coated with the coating and method for manufacturing the article. Moreover, in the drawings like reference numerals designate corresponding parts throughout the several views. Wherever possible, the same reference numbers are used throughout the drawings to refer to the same or like elements of an embodiment.
-
FIG. 1 is a cross-sectional view of an exemplary embodiment of coating. -
FIG. 2 is a cross-sectional view of an article coated with the coating inFIG. 1 . -
FIG. 3 is a block diagram of a method for manufacturing an article coated with the coating inFIG. 1 . -
FIG. 4 is a schematic view of a magnetron sputtering coating machine for manufacturing the article inFIG. 2 . - Referring to
FIG. 1 , acoating 10 includes a titanium aluminum silicon carbon-nitride (TiAlSiCN)layer 11. The TiAlSiCNlayer 11 may be deposited by magnetron sputtering. The TiAlSiCNlayer 11 has a thickness ranging from about 0.7 micrometers to about 2.5 micrometers. The TiAlSiCNlayer 11 includes afirst surface 112 and an oppositesecond surface 114. The atomic carbon content and/or the atomic nitrogen content in theTiAlSiCN layer 11 gradually increases from thefirst surface 112 to thesecond surface 114. It is to be understood that thecoating 10 may also include acolor layer 13 covering on thesecond surface 114 of the TiAlSiCNlayer 11, to decorate the appearance of thecoating 10. - Referring to
FIG. 2 , anexemplary article 40 includes asubstrate 30, abonding layer 20 deposited on thesubstrate 30 and thecoating 10 deposited onbonding layer 20. Thefirst surface 112 of thecoating 10 covers on thebonding layer 20. Thesubstrate 30 is made of a metal, such as high speed steel, hard alloy, or stainless steel. Thearticle 40 may be cutting tools, molds, or housings of electronic devices. Thebonding layer 20 is a titanium aluminum silicon (TiAlSi) layer. Thebonding layer 20 has a thickness ranging from about 200 nanometers to about 300 micrometers. Thebonding layer 20 can be deposited by magnetron sputtering. The chemical stability of thebonding layer 20 is between the chemical stability of thesubstrate 30 and the chemical stability of thecoating 10, and the coefficient of thermal expansion of thebonding layer 20 is between the coefficient of thermal expansion of thesubstrate 30 and the coefficient of thermal expansion of thecoating 10. Thus, thebonding layer 20 is used to improve binding force between thesubstrate 30 and thecoating 10 so thecoating 10 can be firmly deposited on thesubstrate 30. - Referring to
FIG. 3 , a method for manufacturing thearticle 40 may include at least the following steps: - A
substrate 30 is provided. Thesubstrate 30 may be made of high speed steel, hard alloy, or stainless steel. - The
substrate 30 is pretreated by cleaning thesubstrate 30 using deionized water and alcohol successively. Thesubstrate 30 is then washed with a solution (e.g., Alcohol or Acetone) in an ultrasonic cleaner, to remove impurities such as grease, or dirt. Thesubstrate 30 is dried. Thesubstrate 30 is cleaned by argon plasma cleaning. Thesubstrate 30 is retained on a rotatingbracket 50 in avacuum chamber 60 of a magnetron sputteringcoating machine 100. The vacuum level of thevacuum chamber 60 is adjusted to about 8.0×10-3 Pa, pure argon is fed into thevacuum chamber 60 at a flux of about 100 Standard Cubic Centimeters per Minute (sccm) to about 300 sccm from agas inlet 90, and a bias voltage is applied to thesubstrate 30 in a range of about −300 to −500 volts for about 10-15 minutes. So thesubstrate 30 is washed by argon plasma, to further remove the grease or dirt. Thus, the binding force between thesubstrate 30 and thecoating 10 is enhanced. - A
bonding layer 20 is deposited on thesubstrate 30. The temperature in thevacuum chamber 60 is adjusted to about 250˜400° C. (Celsius degree); the argon is fed into thevacuum chamber 60 at a flux from about 100 sccm to about 200 sccm from thegas inlet 90, in this exemplary embodiment, at about 150 sccm; a titanium aluminumsilicon alloy target 70 in thevacuum chamber 60 is evaporated; a bias voltage applied to thesubstrate 30 may be in a range of about −300 to about −500 volts, for about 5 to 10 min, to deposit thebonding layer 20 on thesubstrate 30. The titanium aluminumsilicon alloy target 70 contains atomic silicon in a range from about 1 to about 10 wt %, and the wt % content of the atomic titanium in the titanium aluminumsilicon alloy target 70 is equal to the wt % content of the atomic aluminum in the titanium aluminumsilicon alloy target 70. - A TiAlSiCN
layer 11 is deposited on thebonding layer 20. In a first exemplary embodiment, the temperature in thevacuum chamber 60 is kept at about 250˜400° C.; argon is fed into thevacuum chamber 60 at a flux from about 100 sccm to about 200 sccm, methane is fed into thevacuum chamber 60 at a flux from about 5 sccm to about 15 sccm and nitrogen is fed into thevacuum chamber 60 at a flux from about 10 sccm to about 20 sccm from thegas inlet 90; the titaniumaluminum alloy target 70 is evaporated; a bias voltage applied to thesubstrate 30 may be in a range of about −50 to about −300 volts, for about 60 to about 150 min, to deposit theTiAlSiCN layer 11 on thebonding layer 20. During depositing the TiAlSiCNlayer 11 on thebonding layer 20, the flux of the nitrogen and the flux of the methane are both increased about 15 sccm to about 20 sccm every 15 minutes. Thus, the atomic carbon content and the atomic nitrogen content in theTiAlSiCN layer 11 gradually increases from thefirst surface 112 to thesecond surface 114. In other words, the atomic carbon content and the atomic nitrogen content in theTiAlSiCN layer 11 gradually increases from near thebonding layer 20 to away from thebonding layer 20. - A second exemplary embodiment for depositing the TiAlSiCN
layer 11 on thebonding layer 20 is as follows: the temperature in thevacuum chamber 60 is kept at about 250˜400° C.; argon is fed into thevacuum chamber 60 at a flux from about 100 sccm to about 200 sccm, methane is fed into thevacuum chamber 60 at a flux from about 5 sccm to about 15 sccm and nitrogen is fed into thevacuum chamber 60 at a flux from about 50 sccm to about 220 sccm from thegas inlet 90; the titaniumaluminum alloy target 70 is evaporated; a bias voltage applied to thesubstrate 30 may be in a range of about −50 to about −300 volts, for about 60 to about 150 min, to deposit the TiAlSiCNlayer 11 on thebonding layer 20. During depositing the TiAlSiCNlayer 11 on thebonding layer 20, the flux of the methane is increased about 15 sccm to about 20 sccm every 15 minutes. Thus, in the second exemplary embodiment, the atomic carbon content in theTiAlSiCN layer 11 gradually increases from thefirst surface 112 to thesecond surface 114. In other words, the atomic carbon content in theTiAlSiCN layer 11 gradually increases from near thebonding layer 20 to away from thebonding layer 20. - A third exemplary embodiment for depositing the TiAlSiCN
layer 11 on thebonding layer 20 is as follows: the temperature in thevacuum chamber 60 is kept at about 250˜400° C.; argon is fed into thevacuum chamber 60 at a flux from about 100 sccm to about 200 sccm, methane is fed into thevacuum chamber 60 at a flux from about 50 sccm to 220 sccm and nitrogen is fed into thevacuum chamber 60 at a flux from about 5 sccm to about 15 sccm from thegas inlet 90; the titaniumaluminum alloy target 70 is evaporated; a bias voltage applied to thesubstrate 30 may be in a range of about −50 to about −300 volts, for about 60 to 150 min, to deposit the TiAlSiCNlayer 11 on thebonding layer 20. During depositing the TiAlSiCNlayer 11 on thebonding layer 20, the flux of the nitrogen is increased about 15 sccm to about 20 sccm every 15 minutes. Thus, in the third exemplary embodiment, the atomic nitrogen content in theTiAlSiCN layer 11 gradually increases from thefirst surface 112 to thesecond surface 114. In other words, the atomic nitrogen content in theTiAlSiCN layer 11 gradually increases from near thebonding layer 20 to away from thebonding layer 20. - It is to be understood that the
color layer 13 may be deposited on theTiAlSiCN layer 11 to improve the appearance of thearticle 40. - During depositing the
TiAlSiCN layer 11, atomic silicon can be not diffused in the TiN crystal, and is from Si3N4 phrase at the boundary of the TiN crystal, which can prevent the TiN crystal from enlarging, to maintain the TiN crystal at nanometer level. The nanometer lever TiN crystal can improve hardness and toughness of theTiAlSiCN layer 11. Additionally, atomic carbon not only can react with atomic titanium, atomic aluminum and atomic nitrogen to form solid solution phrase, and can form TiC phrase, which can further improve hardness and toughness of theTiAlSiCN layer 11. - Additionally, the atomic carbon content and/or the atomic nitrogen content in the
TiAlSiCN layer 11 gradually increases from near thebonding layer 20 to away from thebonding layer 20. The coefficient of thermal expansion of theTiAlSiCN layer 11 is close to the coefficient of thermal expansion of thebonding layer 20, so the stress generated between theTiAlSiCN layer 11 and thebonding layer 20 is small. Thus, theTiAlSiCN layer 11 can improve the binding force between thebonding layer 20 and theTiAlSiCN layer 11 so thecoating 10 can be firmly deposited on thesubstrate 30. As said above, theTiAlSiCN layer 11 can improve the hardness of thecoating 10 and the binding force between thebonding layer 20 and theTiAlSiCN layer 11, which can improve the abrasion resistance of thecoating 10. - When the
coating 10 is located in high temperature and oxygen environment, the atomic aluminum and atomic silicon in theTiAlSiCN layer 11 can be react with oxygen to form SiO2 which can prevent exterior oxygen from diffusing in theTiAlSiCN layer 11. Thus, theTiAlSiCN layer 11 can make thecoating 10 has high temperature oxidation resistance. - It is to be understood, however, that even through numerous characteristics and advantages of the exemplary disclosure have been set forth in the foregoing description, together with details of the system and function of the disclosure, the disclosure is illustrative only, and changes may be made in detail, especially in matters of shape, size, and arrangement of parts within the principles of the disclosure to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.
Claims (16)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010268020 | 2010-08-31 | ||
| CN2010102680209A CN102383093A (en) | 2010-08-31 | 2010-08-31 | Coating, covered element having coating and preparation method of covered element |
| CN201010268020.9 | 2010-08-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20120052280A1 true US20120052280A1 (en) | 2012-03-01 |
| US8518534B2 US8518534B2 (en) | 2013-08-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US13/008,991 Expired - Fee Related US8518534B2 (en) | 2010-08-31 | 2011-01-19 | Coating, article coated with coating, and method for manufacturing article |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8518534B2 (en) |
| CN (1) | CN102383093A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130285065A1 (en) * | 2012-04-26 | 2013-10-31 | Mingwei Zhu | Pvd buffer layers for led fabrication |
| US20160362782A1 (en) * | 2015-06-15 | 2016-12-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | Gas dispenser and deposition apparatus using the same |
| CN112941470A (en) * | 2021-02-04 | 2021-06-11 | 上海应用技术大学 | TiAlSiCN micro-nano coating and preparation method thereof |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106591784B (en) * | 2016-11-12 | 2019-07-09 | 常州大学 | A kind of method that ion plating prepares TiAlSiCN coating |
| CN108517488B (en) * | 2018-05-14 | 2019-07-09 | 武汉大学 | A kind of alloy material component surface anti-corrosion wear-resistant composite coating and preparation method thereof |
| CN113774347A (en) * | 2021-09-14 | 2021-12-10 | 北京市辐射中心 | Superhard and tough nano composite coating, preparation method and use equipment |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3900592A (en) * | 1973-07-25 | 1975-08-19 | Airco Inc | Method for coating a substrate to provide a titanium or zirconium nitride or carbide deposit having a hardness gradient which increases outwardly from the substrate |
| US5304417A (en) * | 1989-06-02 | 1994-04-19 | Air Products And Chemicals, Inc. | Graphite/carbon articles for elevated temperature service and method of manufacture |
| US5580653A (en) * | 1994-05-13 | 1996-12-03 | Kabushiki Kaisha Kobe Seiko Sho | Hard coating having excellent wear resistance properties, and hard coating coated member |
| US6555241B1 (en) * | 1996-06-27 | 2003-04-29 | Vaw Motor Gmbh | Cast aluminum part having a casting surface |
| US7147939B2 (en) * | 2003-02-27 | 2006-12-12 | Kennametal Inc. | Coated carbide tap |
| US7368182B2 (en) * | 2004-02-12 | 2008-05-06 | Hitachi Tool Engineering, Ltd. | Hard coating and its formation method, and hard-coated tool |
-
2010
- 2010-08-31 CN CN2010102680209A patent/CN102383093A/en active Pending
-
2011
- 2011-01-19 US US13/008,991 patent/US8518534B2/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3900592A (en) * | 1973-07-25 | 1975-08-19 | Airco Inc | Method for coating a substrate to provide a titanium or zirconium nitride or carbide deposit having a hardness gradient which increases outwardly from the substrate |
| US5304417A (en) * | 1989-06-02 | 1994-04-19 | Air Products And Chemicals, Inc. | Graphite/carbon articles for elevated temperature service and method of manufacture |
| US5580653A (en) * | 1994-05-13 | 1996-12-03 | Kabushiki Kaisha Kobe Seiko Sho | Hard coating having excellent wear resistance properties, and hard coating coated member |
| US6555241B1 (en) * | 1996-06-27 | 2003-04-29 | Vaw Motor Gmbh | Cast aluminum part having a casting surface |
| US7147939B2 (en) * | 2003-02-27 | 2006-12-12 | Kennametal Inc. | Coated carbide tap |
| US7368182B2 (en) * | 2004-02-12 | 2008-05-06 | Hitachi Tool Engineering, Ltd. | Hard coating and its formation method, and hard-coated tool |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130285065A1 (en) * | 2012-04-26 | 2013-10-31 | Mingwei Zhu | Pvd buffer layers for led fabrication |
| US9396933B2 (en) * | 2012-04-26 | 2016-07-19 | Applied Materials, Inc. | PVD buffer layers for LED fabrication |
| US11011676B2 (en) | 2012-04-26 | 2021-05-18 | Applied Materials, Inc. | PVD buffer layers for LED fabrication |
| US20160362782A1 (en) * | 2015-06-15 | 2016-12-15 | Taiwan Semiconductor Manufacturing Co., Ltd. | Gas dispenser and deposition apparatus using the same |
| US12281385B2 (en) * | 2015-06-15 | 2025-04-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | Gas dispenser and deposition apparatus using the same |
| CN112941470A (en) * | 2021-02-04 | 2021-06-11 | 上海应用技术大学 | TiAlSiCN micro-nano coating and preparation method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| US8518534B2 (en) | 2013-08-27 |
| CN102383093A (en) | 2012-03-21 |
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