US20100186513A1 - Saw torque and temperature sensor with improved temperature sensitivity - Google Patents
Saw torque and temperature sensor with improved temperature sensitivity Download PDFInfo
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- US20100186513A1 US20100186513A1 US12/755,007 US75500710A US2010186513A1 US 20100186513 A1 US20100186513 A1 US 20100186513A1 US 75500710 A US75500710 A US 75500710A US 2010186513 A1 US2010186513 A1 US 2010186513A1
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- saw
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- temperature sensor
- torque
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- 230000035945 sensitivity Effects 0.000 title description 14
- 239000000758 substrate Substances 0.000 claims abstract description 53
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 15
- 239000010453 quartz Substances 0.000 claims abstract description 13
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 13
- 238000009529 body temperature measurement Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/16—Measuring force or stress, in general using properties of piezoelectric devices
- G01L1/162—Measuring force or stress, in general using properties of piezoelectric devices using piezoelectric resonators
- G01L1/165—Measuring force or stress, in general using properties of piezoelectric devices using piezoelectric resonators with acoustic surface waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L3/00—Measuring torque, work, mechanical power, or mechanical efficiency, in general
- G01L3/02—Rotary-transmission dynamometers
- G01L3/04—Rotary-transmission dynamometers wherein the torque-transmitting element comprises a torsionally-flexible shaft
- G01L3/10—Rotary-transmission dynamometers wherein the torque-transmitting element comprises a torsionally-flexible shaft involving electric or magnetic means for indicating
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02834—Means for compensation or elimination of undesirable effects of temperature influence
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14538—Formation
Definitions
- the present invention relates to improvements in the temperature sensitivity of SAW based sensors for measuring both torque and temperature.
- Applicant's own earlier British Patent Application no. 2426336 discloses a contactless SAW based torque and temperature sensor comprising a first and a second SAW resonator provided on a substrate made of Y+34° cut of quartz.
- the first SAW has its principle axis inclined at +45° to the X-axis of the substrate, which, in use, is either aligned with the longitudinal axis of the device whose torque is to be measured or is perpendicular thereto
- the second SAW has its principle axis inclined at ⁇ 45° to the X-axis of the substrate.
- a third SAW is also present having its principle axis inclined at an angle to the principle axis of both the first and second resonators.
- the SAW resonators for torque measurement M1SAW and M2SAW are positioned on the same substrate as the resonator TSAW (or resonators T1SAW and T2SAW) used for temperature measurement.
- the substrate is made of Y+34° cut quartz, and the angle between the SAW propagation direction for TSAW (T1SAW and T2SAW) and the X axis of the substrate ⁇ is close to 30° in order to maximize sensitivity of the frequency difference F t to temperature (F t is specified in T0060, for the first embodiment it equals the difference between the resonant frequencies of M2SAW and TSAW).
- the pattern of the SAW resonators on the quartz substrate is usually made of a thin aluminum film.
- a contactless SAW based torque and temperature sensor comprising a first and a second SAW resonator provided on a substrate made of Y+34° cut of quartz (or close to it in terms of the rotation angle), said first resonator having the SAW propagation direction inclined at +45° to the X-axis of the substrate, which, in use, is either aligned with the longitudinal axis of the device whose torque is to be measured or is perpendicular thereto, and said second resonator having the SAW propagation direction inclined at ⁇ 45° to the X-axis of the substrate, and further comprising a third SAW resonator having the SAW propagation direction inclined at an angle to the X-axis of the substrate which is substantially equal to 30°, wherein each said SAW resonator is formed by laying a film of aluminum on the substrate having a thickness (h) and the SAW resonators have an average operating wavelength ⁇ where h/ ⁇ is in the range 0.0
- a sensor in accordance with the invention has the advantage that the temperature sensitivity is significantly improved as compared with the prior art.
- the Aluminum thickness is then preferably in the range of 160 nm to 240 nm.
- the resonators operate at the frequency range from 428 MHz to 437 MHz. In general, the Al thickness is less than 240 nm.
- the device whose torque is to be measured may be a drive train component, for example an axle or flexplate.
- the calculation of the h/ ⁇ ratio normalizes the parameter so as to apply to any sensor operating frequency, ⁇ being the average SAW wavelength for M1SAW, M2SAW and TSAW.
- ⁇ being the average SAW wavelength for M1SAW, M2SAW and TSAW.
- the approximate range of the normalized Al thickness h/ ⁇ of 0.021 to 0.032 is to provide a linear temperature characteristic of F t up to +150° C. with the average sensitivity close to 10 ppm/° C. (relative to the TSAW resonant frequency) and the Q ⁇ 10000.
- the senor includes a fourth SAW resonator which is inclined at an equal but opposite angle to the angle of inclination of the third SAW, the fourth SAW resonator being formed of aluminum film having the same thickness as said third SAW resonator.
- the third and fourth SAW resonators are particularly advantageously arranged symmetrically relative to the X axis of the substrate. Both the third and fourth SAWs are then used to provide temperature information.
- the third and fourth SAWs are inclined at + ⁇ ° and ⁇ ° respectively to the X axis of the substrate and are provided on a common substrate which may be formed separately from the substrate carrying the first and second SAW resonators but is preferably integrally formed therewith.
- FIG. 1 is a schematic diagram of a first torque and temperature sensor to which the present invention applies;
- FIG. 2 is a schematic diagram of a second torque and temperature sensor to which the present invention applies.
- FIG. 3 is variation of frequency difference between M2SAW and TSAW with temperature at different aluminum thicknesses (h).
- FIG. 1 there is shown a diagrammatic illustration of a sensor of the type to which the present invention is applicable.
- the sensor comprises a substrate 1 is made of Y+34° cut quartz on which are formed a first SAW resonator M1SAW ( 2 ) and a second SAW resonator M2SAW ( 3 ), the resonators being made at such an angle to X axis of the substrate that the acoustic waves propagate at +45° and ⁇ 45° to the X axis respectively, that is the principle axes of the two SAWs are inclined at +45° and ⁇ 45° to the X axis respectively (the principal axis of the resonator is defined as the direction of the phase velocity of the SAW propagating in the resonator).
- the angle of M2SAW ( 3 ) is shown as substantially 45°, that is ⁇ 45°.
- the angle of M1SAW ( 2 ) is shown as substantially ⁇ 45°, that is ⁇ 45°.
- a third resonator TSAW ( 4 ) is fabricated on the same substrate at such an angle to the X axis that the SAW in that resonator propagates at an angle to the X axis of substantially 30 degrees.
- the SAW propagation directions in M1SAW and M2SAW can also be slightly different from ⁇ 45° in order to minimize variation of the resonant frequencies of M1SAW and M2SAW with temperature.
- Each SAW resonator is formed by laying a film of Aluminum onto the substrate in order to form strips constituting the fingers of the SAW device. It has been discovered that the temperature characteristic of F t at zero torque varies with the Al film thickness as shown in FIG. 3 .
- FIG. 3 might suggest that h should be minimized in order to further increase the temperature sensitivity of F t .
- reduction of the Al film thickness well below 200 nm has been found to reduce SAW reflection from the Al strips and hence reduces the Q factor of the resonators. To a certain extent this reduction can be compensated by increasing the number of reflecting strips in the gratings.
- the area of the quartz substrate is usually limited in order to minimize the cost of the sensor. Reduction of the Al film thickness below 160 nm will noticeably affect the Q factor of the resonators working at 430 MHz range for a fixed substrate area of 4 ⁇ 6 mm.
- a thickness range of 160 nm to 240 nm optimizes the sensitivity.
- the substrate 1 in use, is attached to the surface of a shaft or the like whose torque is to be measured, this torque giving rise to a biaxial strain field as opposed to the uniaxial strain field developed in pressure monitoring applications, which biaxial strain field (principal components of strain are tension and compression strain along ⁇ 45° to the X axis of the substrate) is transmitted to the substrate so that all three resonators are strained.
- biaxial strain field principal components of strain are tension and compression strain along ⁇ 45° to the X axis of the substrate
- the sensor of FIG. 2 shows an alternative arrangement which avoids potential problems of F T , being dependent on torque.
- the senor made on a single Y+34° cut quartz substrate 20 , but in different to the previous embodiment, in addition to two torque sensing elements M1SAW ( 21 ) and M2SAW ( 22 ) positioned at ⁇ 45° to the X axis, two temperature sensing elements T1SAW ( 23 ) and T2SAW ( 24 ), are provided positioned symmetrically relative to the X axis of the substrate at equal but opposite angles of substantially +/ ⁇ 30 degrees and having resonant frequencies f 4 and f 3 .
- the first temperature element 23 has a SAW propagation direction at substantially ⁇ 30 degrees to the X-axis
- the second one 24 has a SAW propagation direction at substantially +30 degrees to the X-axis.
- a disadvantage of this embodiment is an increased die area, sensor interrogation time and wider frequency range occupied by the sensor.
- the present invention further provides a SAW resonator comprising a substrate having an aluminum film provided thereon of thickness to operating wavelength ratio h/ ⁇ in the range 0.021 to 0.032. More particularly, for an operating frequency range around 430 MHz, for example 428-437 MHz, the invention provides aluminum thickness of less than 260 nm, more particularly less than 240 nm and preferably in the range of 160 nm to 240 nm.
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- General Physics & Mathematics (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
Description
- This application is a Continuation of International Application PCT/GB2008/000983 filed on Mar. 19, 2008 which claims priority from GB Application 0711765.8 filed on Jun. 15, 2007.
- 1. Field of the Invention
- The present invention relates to improvements in the temperature sensitivity of SAW based sensors for measuring both torque and temperature.
- 2. The Prior Art
- Applicant's own earlier British Patent Application no. 2426336 discloses a contactless SAW based torque and temperature sensor comprising a first and a second SAW resonator provided on a substrate made of Y+34° cut of quartz. The first SAW has its principle axis inclined at +45° to the X-axis of the substrate, which, in use, is either aligned with the longitudinal axis of the device whose torque is to be measured or is perpendicular thereto, and the second SAW has its principle axis inclined at −45° to the X-axis of the substrate. A third SAW is also present having its principle axis inclined at an angle to the principle axis of both the first and second resonators.
- In the first and the third embodiments shown in FIGS. 1 and 6 of GB 2426336, the SAW resonators for torque measurement M1SAW and M2SAW are positioned on the same substrate as the resonator TSAW (or resonators T1SAW and T2SAW) used for temperature measurement. The substrate is made of Y+34° cut quartz, and the angle between the SAW propagation direction for TSAW (T1SAW and T2SAW) and the X axis of the substrate α is close to 30° in order to maximize sensitivity of the frequency difference Ft to temperature (Ft is specified in T0060, for the first embodiment it equals the difference between the resonant frequencies of M2SAW and TSAW).
- The pattern of the SAW resonators on the quartz substrate is usually made of a thin aluminum film. GB 2426336 is silent on the thickness h of the Al film and the variation of the frequency difference Ft with temperature presented in FIG. 3 of GB 2426336 is theoretically calculated for h=0. It corresponded to the average temperature sensitivity of approximately 9 kHz/° C.
- In reality the Al film thickness has a finite value, with fabricated SAW Sensors, which have been publicly available, having an approximate Al film thickness of h=260 nm and resonant frequencies of M1SAW, M2SAW and TSAW equal to 437 MHz, 435 MHz and 433 MHz respectively.
- Since the Al electrodes and reflecting strips modified properties of the quartz substrate surface, the actual temperature sensitivity of Ft in the prior art system turned out to be only 2.4 kHz/° C. that is considerably smaller than the theoretically predicted value of 9 kHz/° C.
- According to the present invention there is provided a contactless SAW based torque and temperature sensor comprising a first and a second SAW resonator provided on a substrate made of Y+34° cut of quartz (or close to it in terms of the rotation angle), said first resonator having the SAW propagation direction inclined at +45° to the X-axis of the substrate, which, in use, is either aligned with the longitudinal axis of the device whose torque is to be measured or is perpendicular thereto, and said second resonator having the SAW propagation direction inclined at −45° to the X-axis of the substrate, and further comprising a third SAW resonator having the SAW propagation direction inclined at an angle to the X-axis of the substrate which is substantially equal to 30°, wherein each said SAW resonator is formed by laying a film of aluminum on the substrate having a thickness (h) and the SAW resonators have an average operating wavelength λ where h/λ is in the range 0.021 to 0.032.
- A sensor in accordance with the invention has the advantage that the temperature sensitivity is significantly improved as compared with the prior art.
- For sensors working in the 430 MHz range, the Aluminum thickness is then preferably in the range of 160 nm to 240 nm. The resonators operate at the frequency range from 428 MHz to 437 MHz. In general, the Al thickness is less than 240 nm. The device whose torque is to be measured may be a drive train component, for example an axle or flexplate.
- The calculation of the h/λ ratio normalizes the parameter so as to apply to any sensor operating frequency, λ being the average SAW wavelength for M1SAW, M2SAW and TSAW. The approximate range of the normalized Al thickness h/λ of 0.021 to 0.032 is to provide a linear temperature characteristic of Ft up to +150° C. with the average sensitivity close to 10 ppm/° C. (relative to the TSAW resonant frequency) and the Q≧10000.
- In an advantageous development, the sensor includes a fourth SAW resonator which is inclined at an equal but opposite angle to the angle of inclination of the third SAW, the fourth SAW resonator being formed of aluminum film having the same thickness as said third SAW resonator. The third and fourth SAW resonators are particularly advantageously arranged symmetrically relative to the X axis of the substrate. Both the third and fourth SAWs are then used to provide temperature information. Preferably, the third and fourth SAWs are inclined at +α° and −α° respectively to the X axis of the substrate and are provided on a common substrate which may be formed separately from the substrate carrying the first and second SAW resonators but is preferably integrally formed therewith.
- In order that the invention may be well understood, there will now be described some embodiments thereof, given by way of example, reference being made to the accompanying drawings, in which:
-
FIG. 1 is a schematic diagram of a first torque and temperature sensor to which the present invention applies; -
FIG. 2 is a schematic diagram of a second torque and temperature sensor to which the present invention applies; and -
FIG. 3 is variation of frequency difference between M2SAW and TSAW with temperature at different aluminum thicknesses (h). - Referring first to
FIG. 1 , there is shown a diagrammatic illustration of a sensor of the type to which the present invention is applicable. The sensor comprises a substrate 1 is made of Y+34° cut quartz on which are formed a first SAW resonator M1SAW (2) and a second SAW resonator M2SAW (3), the resonators being made at such an angle to X axis of the substrate that the acoustic waves propagate at +45° and −45° to the X axis respectively, that is the principle axes of the two SAWs are inclined at +45° and −45° to the X axis respectively (the principal axis of the resonator is defined as the direction of the phase velocity of the SAW propagating in the resonator). InFIG. 1 , the angle of M2SAW (3) is shown as substantially 45°, that is ˜45°. The angle of M1SAW (2) is shown as substantially −45°, that is ˜−45°. The −45° angle may also be characterized as a +135° angle. This provides minimum variation of their resonant frequencies f2 and f1 with temperature T, maximum sensitivity of FM=f1−f2 to torque M and small variation of this sensitivity with temperature. A third resonator TSAW (4) is fabricated on the same substrate at such an angle to the X axis that the SAW in that resonator propagates at an angle to the X axis of substantially 30 degrees. All three resonators are electrically connected either in series or in parallel by means of either conducting tracks on the substrate or by bond wires. As an example, resonant frequencies can be selected as follows: for M1SAW f1=437 MHz, for M2SAW f2=435 MHz and for TSAW f3=433 MHz. - If the cut angle of the quartz substrate differs slightly from 34° then the SAW propagation directions in M1SAW and M2SAW can also be slightly different from ±45° in order to minimize variation of the resonant frequencies of M1SAW and M2SAW with temperature.
- Each SAW resonator is formed by laying a film of Aluminum onto the substrate in order to form strips constituting the fingers of the SAW device. It has been discovered that the temperature characteristic of Ft at zero torque varies with the Al film thickness as shown in
FIG. 3 . - As can be seen from
FIG. 3 , reducing the Al film thickness below 260 nm significantly improves linearity and increases sensitivity of the frequency difference Ft to temperature. This allows more accurate temperature measurement and hence betters temperature compensation of the torque reading within the entire temperature range from −40° to +125° C. accepted in automotive industry as a standard. - Quite often the required temperature range for torque measurement is extended up to +150° C. If h=335 nm then an unambiguous temperature measurement can only be performed up to approximately +70° C. If h=263 nm then the curve of Ft versus temperature becomes rather nonlinear at T>+130° and the accuracy of temperature measurement decreases. However, if h=200 nm the temperature characteristic of Ft stays linear up to +150° C. and the sensitivity is twice as high as the one at h=260 nm.
-
FIG. 3 might suggest that h should be minimized in order to further increase the temperature sensitivity of Ft. However, reduction of the Al film thickness well below 200 nm has been found to reduce SAW reflection from the Al strips and hence reduces the Q factor of the resonators. To a certain extent this reduction can be compensated by increasing the number of reflecting strips in the gratings. However, the area of the quartz substrate is usually limited in order to minimize the cost of the sensor. Reduction of the Al film thickness below 160 nm will noticeably affect the Q factor of the resonators working at 430 MHz range for a fixed substrate area of 4×6 mm. - Accordingly, a thickness range of 160 nm to 240 nm optimizes the sensitivity.
- The substrate 1, in use, is attached to the surface of a shaft or the like whose torque is to be measured, this torque giving rise to a biaxial strain field as opposed to the uniaxial strain field developed in pressure monitoring applications, which biaxial strain field (principal components of strain are tension and compression strain along ±45° to the X axis of the substrate) is transmitted to the substrate so that all three resonators are strained.
- In the embodiment of
FIG. 1 , all three SAWs are mounted on a common substrate. However, it will be understood that this is not essential, and they could instead be mounted on separate substrates as taught in the above referenced prior art. - The sensor of
FIG. 2 shows an alternative arrangement which avoids potential problems of FT, being dependent on torque. - In this embodiment, the sensor made on a single Y+34°
cut quartz substrate 20, but in different to the previous embodiment, in addition to two torque sensing elements M1SAW (21) and M2SAW (22) positioned at ±45° to the X axis, two temperature sensing elements T1SAW (23) and T2SAW (24), are provided positioned symmetrically relative to the X axis of the substrate at equal but opposite angles of substantially +/−30 degrees and having resonant frequencies f4 and f3. Thefirst temperature element 23 has a SAW propagation direction at substantially −30 degrees to the X-axis, the second one 24 has a SAW propagation direction at substantially +30 degrees to the X-axis. - F M=f1−f2 is measured depending predominantly on torque and FT″=f1+f2−f3−f4 depending only on temperature. Using measured value of FT″ one can easily calculate temperature. Furthermore, FM′=f3−f4 can be measured that will depend predominantly on torque although with a smaller torque sensitivity. As a result torque can also be calculated from the value FM′ giving us a redundancy that increases reliability of torque measurements.
- A disadvantage of this embodiment is an increased die area, sensor interrogation time and wider frequency range occupied by the sensor.
- The present invention further provides a SAW resonator comprising a substrate having an aluminum film provided thereon of thickness to operating wavelength ratio h/λ in the range 0.021 to 0.032. More particularly, for an operating frequency range around 430 MHz, for example 428-437 MHz, the invention provides aluminum thickness of less than 260 nm, more particularly less than 240 nm and preferably in the range of 160 nm to 240 nm.
Claims (12)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0711765.8 | 2007-06-15 | ||
| GB0711765.8A GB2450168B (en) | 2007-06-15 | 2007-06-15 | A SAW torque and temperature sensor with improved temperature sensitivity |
| PCT/GB2008/000983 WO2008152343A1 (en) | 2007-06-15 | 2008-03-19 | Saw torque and temperature sensor with improved temperature sensitivity |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/GB2008/000983 Continuation WO2008152343A1 (en) | 2007-06-15 | 2008-03-19 | Saw torque and temperature sensor with improved temperature sensitivity |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20100186513A1 true US20100186513A1 (en) | 2010-07-29 |
| US8082800B2 US8082800B2 (en) | 2011-12-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US12/755,007 Active US8082800B2 (en) | 2007-06-15 | 2010-04-06 | Saw torque and temperature sensor with improved temperature sensitivity |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8082800B2 (en) |
| EP (1) | EP2160580B1 (en) |
| JP (1) | JP5387919B2 (en) |
| CN (1) | CN101772695A (en) |
| GB (1) | GB2450168B (en) |
| TW (1) | TWI448670B (en) |
| WO (1) | WO2008152343A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013074422A1 (en) * | 2011-11-17 | 2013-05-23 | Transense Technologies Plc | Quartz Substrate Orientations for Compact Monolithic Differential Temperature Sensor, and Sensors Using Same |
| US8987843B2 (en) | 2012-11-06 | 2015-03-24 | International Business Machines Corporation | Mapping density and temperature of a chip, in situ |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102288339A (en) * | 2011-05-04 | 2011-12-21 | 北京理工大学 | Passive and wireless acoustic surface wave torque sensor with self temperature and vibration compensation functions |
| CN105716759A (en) * | 2016-02-02 | 2016-06-29 | 上海交通大学 | Rotating shaft torque measuring device based on surface transverse wave |
| US10450863B2 (en) | 2016-06-02 | 2019-10-22 | General Electric Company | Turbine engine shaft torque sensing |
| FR3094480B1 (en) | 2019-03-29 | 2021-10-01 | Frecnsys | Acoustic wave sensor and interrogation thereof |
| CN111366111B (en) * | 2020-03-30 | 2021-12-03 | 电子科技大学 | Strain sensor composed of three LGS surface acoustic wave resonators and testing method |
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| US20030000309A1 (en) * | 2001-06-29 | 2003-01-02 | Anthony Lonsdale | Torque measurement |
| US7165455B2 (en) * | 2004-12-18 | 2007-01-23 | Honeywell International Inc. | Surface acoustic wave sensor methods and systems |
| US20090314104A1 (en) * | 2004-08-16 | 2009-12-24 | Raymond David Lohr | Torque measurement within a powertrain |
| US7795779B2 (en) * | 2005-05-20 | 2010-09-14 | Transense Technologies Plc | Saw torque and temperature sensor |
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| JP3953558B2 (en) * | 1996-10-09 | 2007-08-08 | 京セラキンセキ株式会社 | Surface acoustic wave device |
| CN1130824C (en) * | 1998-10-16 | 2003-12-10 | 精工爱普生株式会社 | Surface acoustic wave device |
| CN1221074C (en) * | 1999-11-16 | 2005-09-28 | 三菱电机株式会社 | elastic wave device |
| JP3897229B2 (en) * | 2001-04-27 | 2007-03-22 | 株式会社村田製作所 | Surface wave filter |
| JP2005505775A (en) * | 2001-10-16 | 2005-02-24 | トランセンス テクノロジーズ ピーエルシー | Temperature-stable SAW sensor with third-order elastic constant |
| TW508904B (en) * | 2001-11-30 | 2002-11-01 | Diamond Si Co Ltd | Surface acoustic wave filter and its manufacturing method |
| TWI273661B (en) * | 2004-07-16 | 2007-02-11 | Ji-Yan Shen | Structure and fabricating method of a surface acoustic wave chip with an embedded air cavity |
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2007
- 2007-06-15 GB GB0711765.8A patent/GB2450168B/en not_active Expired - Fee Related
-
2008
- 2008-03-19 JP JP2010511713A patent/JP5387919B2/en active Active
- 2008-03-19 CN CN200880020267A patent/CN101772695A/en active Pending
- 2008-03-19 WO PCT/GB2008/000983 patent/WO2008152343A1/en not_active Ceased
- 2008-03-19 EP EP08718820.7A patent/EP2160580B1/en active Active
- 2008-03-31 TW TW097111740A patent/TWI448670B/en active
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2010
- 2010-04-06 US US12/755,007 patent/US8082800B2/en active Active
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030000309A1 (en) * | 2001-06-29 | 2003-01-02 | Anthony Lonsdale | Torque measurement |
| US20090314104A1 (en) * | 2004-08-16 | 2009-12-24 | Raymond David Lohr | Torque measurement within a powertrain |
| US7165455B2 (en) * | 2004-12-18 | 2007-01-23 | Honeywell International Inc. | Surface acoustic wave sensor methods and systems |
| US7795779B2 (en) * | 2005-05-20 | 2010-09-14 | Transense Technologies Plc | Saw torque and temperature sensor |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013074422A1 (en) * | 2011-11-17 | 2013-05-23 | Transense Technologies Plc | Quartz Substrate Orientations for Compact Monolithic Differential Temperature Sensor, and Sensors Using Same |
| EP2781022A4 (en) * | 2011-11-17 | 2015-08-05 | Transense Technologies Plc | QUARTZ SUBSTRATES DIRECTIONS FOR COMPACT MONOLITHIC TEMPERATURE DIFFERENTIAL SENSOR, AND SENSORS USING THE SAME |
| US9673777B2 (en) | 2011-11-17 | 2017-06-06 | Transense Technologies Plc | Quartz substrate orientations for compact monolithic differential temperature sensor, and sensors using same |
| US8987843B2 (en) | 2012-11-06 | 2015-03-24 | International Business Machines Corporation | Mapping density and temperature of a chip, in situ |
| US9140669B2 (en) | 2012-11-06 | 2015-09-22 | International Business Machines Corporation | Mapping density and temperature of a chip, in situ |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200905176A (en) | 2009-02-01 |
| JP5387919B2 (en) | 2014-01-15 |
| TWI448670B (en) | 2014-08-11 |
| GB2450168A (en) | 2008-12-17 |
| EP2160580A1 (en) | 2010-03-10 |
| GB2450168B (en) | 2012-03-07 |
| GB0711765D0 (en) | 2007-07-25 |
| EP2160580B1 (en) | 2016-08-24 |
| US8082800B2 (en) | 2011-12-27 |
| WO2008152343A1 (en) | 2008-12-18 |
| JP2010530959A (en) | 2010-09-16 |
| CN101772695A (en) | 2010-07-07 |
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