US20080197370A1 - Light emitting diode structure and manufacturing method thereof - Google Patents
Light emitting diode structure and manufacturing method thereof Download PDFInfo
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- US20080197370A1 US20080197370A1 US11/737,133 US73713307A US2008197370A1 US 20080197370 A1 US20080197370 A1 US 20080197370A1 US 73713307 A US73713307 A US 73713307A US 2008197370 A1 US2008197370 A1 US 2008197370A1
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- emitting diode
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/8506—Containers
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/858—Means for heat extraction or cooling
- H10H20/8581—Means for heat extraction or cooling characterised by their material
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/855—Optical field-shaping means, e.g. lenses
- H10H20/856—Reflecting means
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/85—Packages
- H10H20/858—Means for heat extraction or cooling
- H10H20/8585—Means for heat extraction or cooling being an interconnection
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- H10W90/756—
Definitions
- the present invention relates to a light emitting diode structure and a manufacturing method thereof, and more particularly, to a light emitting diode structure having a silicon substrate that is manufactured in a semiconductor process.
- FIG. 1 is a schematic diagram illustrating a light emitting diode structure according to the prior art.
- the light emitting diode structure 10 includes a light emitting diode 12 , a mount lead 14 , and an inner lead 16 , wherein the mount lead 14 includes a flat-bottomed cup, and the light emitting diode 12 is disposed in the flat-bottomed cup of the mount lead 14 .
- two electrodes of the light emitting diode 12 are respectively electrically coupled to the mount lead 14 and the inner lead 16 through wires 18 .
- the light emitted from the light emitting diode 12 can be divided into two parts: light emitted from the top of the light emitting diode, and light emitted from edges of the light emitting diode.
- the flat-bottomed cup is not a good light-condensing structure, so the light will be reflected randomly and wasted.
- the light-condensing efficiency of the flat-bottomed cup is lower. Therefore, improving the light-condensing efficiency of the light emitting diode is an important subject for the industry.
- a light emitting diode structure comprises a silicon substrate having a cup-structure with a parabolic shape thereon, a plurality of through-holes at the bottom of the cup-structure penetrating the silicon substrate, a reflective layer disposed on a top surface of the silicon substrate in the cup-structure, a conductive layer filling up the through-holes at the bottom of the cup-structure, and a light emitting diode.
- the conductive layer protrudes out from the through-holes, and a part of the conductive layer protruding out from the through holes is a base.
- the light emitting diode is disposed on top of the base, and the light emitting diode is located at a focus of the cup-structure.
- a method of fabricating a light emitting diode having a silicon substrate is provided. First, a silicon substrate is provided, and then, a plurality of through-holes is fabricated on a bottom surface of the silicon substrate. Next, a conductive layer is formed on the bottom surface of the silicon substrate, and the through-holes are filled up with the conductive layer to form a base. Further, a cup-structure having a parabolic shape is fabricated on a top surface of the silicon substrate, and the base is exposed to protrude out from the bottom of the cup-structure. A reflective layer is formed on the top surface of the silicon substrate in the cup-structure. Last, a light emitting diode is bonded to the base, and the light emitting diode is located at a focus of the cup-structure.
- FIG. 1 is a schematic diagram illustrating a light emitting diode structure according to the prior art.
- FIG. 2 is a schematic diagram illustrating a light emitting diode structure according to an embodiment of the present invention.
- FIG. 3 is a microphotograph showing a micro-diffuser structure on a top surface of the silicon substrate in the cup-structure.
- FIG. 4 to FIG. 10 are schematic diagrams illustrating a method of fabricating a light emitting diode structure according an embodiment of the present invention.
- the light emitting diode structure 50 includes a silicon substrate 52 , a cup-structure having a parabolic shape on a top surface of the silicon substrate 52 , a plurality of through-holes at the bottom of the cup-structure 54 penetrating the silicon substrate 52 , a reflective layer 58 disposed on the top surface of the silicon substrate 52 in the cup-structure 54 , a conductive layer 56 filling the through-holes at the bottom of the cup-structure 54 and protruding out from the through-holes, and a light emitting diode 60 .
- a part of the conductive layer 56 protruding out from the through-holes is a base.
- the light emitting diode 60 is disposed on the top of the base and located at a focus of the cup-structure 54 .
- the light emitting diode structure 50 further includes a dielectric layer 62 disposed between the silicon substrate 52 and the conductive layer 56 , and the dielectric layer 62 is composed of silicon oxide, silicon nitride or silicon oxy-nitride and can serve as an etching stop layer in a manufacturing process.
- the material of the silicon substrate 52 includes polycrystalline silicon, amorphous silicon, or monocrystalline silicon, and the silicon substrate 52 can be a rectangular silicon chip or a circular silicon chip.
- the silicon substrate 52 can also include completed integrated circuits or passive devices.
- silicon has good thermal conductivity, the thermal dissipation effect of the light emitting diode structure can be increased.
- the thermal expansion factor of silicon is similar to the factor of the material of the light emitting diode, so that the reliability of the light emitting diode structure also can be increased.
- the reflective layer 58 comprises materials having high reflectivity, such as metal or optical films, and the reflective layer 58 has a parabolic shape used to reflect light emitted from side surfaces of the light emitting diode 60 upward (indicated by arrows shown in FIG. 2 ).
- the reflective layer 58 and the conductive layer 56 are electrically decoupled.
- the conductive layer 56 is composed of metal, and the conductive layer 56 can be a piece of a metal layer or a circuit layer having circuits therein.
- the conductive layer 56 is used to electrically couple the light emitting diode 60 to external circuits, so that the light emitting diode 60 can be driven.
- FIG. 3 is a microphotograph showing a micro-diffuser structure on the top surface of the silicon substrate 52 in the cup-structure 54 .
- the micro-diffuser structure on the top surface of the silicon substrate in the cup-structure 54 makes the reflective layer 58 on the cup-structure 54 also have the micro-diffuser structure.
- the micro-diffuser structure diffuses the light emitted from the light emitting diode 60 during reflection by the reflective layer 58 , so that the glare produced by smooth surfaces can be avoided.
- an undulate difference of the micro-diffuser structure is substantially 1 ⁇ m, so that the diffusion of the light from the reflective layer 58 can be obvious.
- the conductive layer 56 can extend from the bottom surface to the top surface of the silicon substrate 52 through the through-holes.
- the bottom surface of the silicon substrate 54 is not flat, the light emitting diode 60 can still be directly disposed on the top of the base in the cup-structure 54 and electrically coupled to the conductive layer 56 . No wire bonding process is required, so the manufacturing cost in the process can be saved.
- the light emitting diode 60 can be distanced from the surface of the silicon substrate 52 in the cup-structure 54 so that the light emitting diode 60 can be disposed at the focus of the cup-structure 54 .
- the light emitted from the side surfaces of the light emitting diode 60 can be condensed and reflected upward by the reflective layer 58 having a parabolic shape, similar to a light source disposed at a focus of a parabolic mirror, to have a directional condensing effect.
- the light emitting diode structure of the present invention lets the light emitted from the light emitting diode reflect upward and be condensed, and the present invention uses the micro-diffuser structure of the cup-structure to diffuse the light in order to prevent the glare.
- FIG. 4 to FIG. 10 are schematic diagrams illustrating a method of fabricating a light emitting diode structure according an embodiment of the present invention.
- a silicon substrate 100 is provided.
- a mask 104 with patterns is fabricated on the bottom surface of the silicon substrate 100 by a lithographic process, and a plurality of through-holes with high aspect ratio having an inclined sidewall is fabricated at the bottom of the silicon substrate 100 by an etching process.
- the etching process utilized for fabricating the through-holes 102 with the high aspect ratio can be a reactive ion etching (RIE) process, a Bosch process, or a wet etching process using potassium hydroxide (KOH), tetramethylammonium hydroxide (TMAH), or ethylenediamine-pyrocatechol-water (EDP) as an etching solution.
- RIE reactive ion etching
- Bosch process also known as pulsed or time-multiplexed etching, alternates repeatedly between standard isotropic plasma etch and deposition of a chemically inert passivation layer to achieve nearly vertical structures.
- the etching stop layer 106 is composed of dielectric materials, such as silicon oxide, silicon nitride, or silicon oxy-nitride, and a method of forming the etching stop layer 106 includes atmospheric pressure chemical vapor deposition, low pressure chemical vapor deposition, plasma enhanced chemical vapor deposition, or high density plasma chemical vapor deposition.
- a conductive layer 108 is formed on the etching stop layer 106 , and the through-holes 102 are filled with the conductive layer as a base.
- the conductive layer 108 comprises metal, and a method of fabricating the conductive layer 108 can be sputtering, chemical vapor deposition, or evaporation.
- a mask 110 with patterns is fabricated on the top surface of the silicon substrate 100 by a lithographic process, and then a cup-structure 112 having inclined sidewalls is fabricated on the top surface of the silicon substrate 100 by a wet etching process.
- the wet etching process uses KOH, TMAH, or EDP as an etching solution.
- a parabolic shape of the cup structure 112 is formed by a dry etching process, and the etching stop layer 106 on the top of the base is exposed. Then, a micro-diffuser structure (indicated by the micro-diffuser structure shown in FIG. 3 ) is fabricated on the surface of the cup-structure 112 .
- the dry etching process includes a reactive ion etching process or a Bosch process.
- the Bosch process also known as pulsed or time-multiplexed etching, alternates repeatedly between standard isotropic plasma etch and deposition of a chemically inert passivation layer to achieve nearly vertical structures.
- the etching stop layer 106 is used to prevent the conductive layer 108 from being etched in the dry etching process.
- the depth of the base can be controlled accurately, so the light emitting diode disposed on the base can be accurately located at the focus of the cup-structure 112 .
- the etching stop layer is etched by a dry or wet etching process to expose the base, and then a reflective layer 114 is formed on the top surface of the cup-structure 112 .
- the reflective layer 114 is a film, such as a metal or optical film, which is formed on the cup-structure 112 by sputtering, chemical vapor deposition, or evaporation.
- the mask 110 is removed, and a die-attachment process, such as a flip-chip process or a die attachment using glass frit, is performed to bond a light emitting diode 116 to the base.
- the light emitting diode 116 is located at the focus of the cup-structure 112 , and the light emitting diode structure of the present invention is thus completed.
- the present invention uses lithographic and etching processes to fabricate a parabolic-shaped cup-structure on the silicon substrate, and also fabricates a base in the cup-structure to hold the light emitting diode, so that the light emitting diode can be disposed at the focus of the cup-structure. Therefore, the problem of not being able to dispose the light emitting diode on a curved cup-structure can be solved.
- the present invention provides a micro-diffuser structure formed by the etching process to prevent glare.
- the light emitting diode structure of the present invention further provides the parabolic-shaped cup-structure to condense the light emitted from the sidewalls of the light emitting diode efficiently, so as to have a directional function.
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Abstract
Description
- 1. Field of the Invention
- The present invention relates to a light emitting diode structure and a manufacturing method thereof, and more particularly, to a light emitting diode structure having a silicon substrate that is manufactured in a semiconductor process.
- 2. Description of the Prior Art
- Conventional lighting industries give lamp cups a parabolic shape in order to effectively condense a light source of an incandescent lamp, and the incandescent lamp is disposed at a focal point of the lamp cup so that light scattering from the incandescent lamp can be used effectively. The surface of the lamp cup is a parabolic mirror with a micro-diffuser structure to enhance softness of the light. However, the incandescent lamps developed in recent years do not have high illumination efficiency, and generate high thermal radiation, so the light emitting diode structure having advantages of long life, small size, high illumination efficiency, low power consumption, and low contamination, etc. is gradually replacing the incandescent lamp and becoming the mainstream of new lighting sources.
- As the light source changes from the conventional incandescent lamp to the light emitting diode, the difference between the light emitting diode structure and the incandescent lamp is large, so the parabolic lamp cup of the incandescent lamp cannot be reused for the light emitting diode. Please refer to
FIG. 1 .FIG. 1 is a schematic diagram illustrating a light emitting diode structure according to the prior art. As shown inFIG. 1 , the lightemitting diode structure 10 includes alight emitting diode 12, amount lead 14, and aninner lead 16, wherein themount lead 14 includes a flat-bottomed cup, and thelight emitting diode 12 is disposed in the flat-bottomed cup of themount lead 14. In addition, two electrodes of thelight emitting diode 12 are respectively electrically coupled to themount lead 14 and theinner lead 16 throughwires 18. - In the conventional light
emitting diode structure 10, the light emitted from thelight emitting diode 12 can be divided into two parts: light emitted from the top of the light emitting diode, and light emitted from edges of the light emitting diode. Although the light emitted from the top of the light emitting diode can be reflected upward by the flat-bottomed cup, the flat-bottomed cup is not a good light-condensing structure, so the light will be reflected randomly and wasted. Compared with the parabolic lamp cup, the light-condensing efficiency of the flat-bottomed cup is lower. Therefore, improving the light-condensing efficiency of the light emitting diode is an important subject for the industry. - It is therefore an object of the present invention to provide a light emitting diode structure having high directionality and high thermal dissipation and a manufacturing method thereof that uses a semiconductor process.
- According to an embodiment of the present invention, a light emitting diode structure is provided. The light emitting diode structure comprises a silicon substrate having a cup-structure with a parabolic shape thereon, a plurality of through-holes at the bottom of the cup-structure penetrating the silicon substrate, a reflective layer disposed on a top surface of the silicon substrate in the cup-structure, a conductive layer filling up the through-holes at the bottom of the cup-structure, and a light emitting diode. The conductive layer protrudes out from the through-holes, and a part of the conductive layer protruding out from the through holes is a base. The light emitting diode is disposed on top of the base, and the light emitting diode is located at a focus of the cup-structure.
- According to an embodiment of the present invention, a method of fabricating a light emitting diode having a silicon substrate is provided. First, a silicon substrate is provided, and then, a plurality of through-holes is fabricated on a bottom surface of the silicon substrate. Next, a conductive layer is formed on the bottom surface of the silicon substrate, and the through-holes are filled up with the conductive layer to form a base. Further, a cup-structure having a parabolic shape is fabricated on a top surface of the silicon substrate, and the base is exposed to protrude out from the bottom of the cup-structure. A reflective layer is formed on the top surface of the silicon substrate in the cup-structure. Last, a light emitting diode is bonded to the base, and the light emitting diode is located at a focus of the cup-structure.
- These and other objectives of the present invention will no doubt become obvious to those of ordinary skill in the art after reading the following detailed description of the preferred embodiment that is illustrated in the various figures and drawings.
-
FIG. 1 is a schematic diagram illustrating a light emitting diode structure according to the prior art. -
FIG. 2 is a schematic diagram illustrating a light emitting diode structure according to an embodiment of the present invention. -
FIG. 3 is a microphotograph showing a micro-diffuser structure on a top surface of the silicon substrate in the cup-structure. -
FIG. 4 toFIG. 10 are schematic diagrams illustrating a method of fabricating a light emitting diode structure according an embodiment of the present invention. - Please refer to
FIG. 2 , which is a schematic diagram illustrating a light emitting diode structure according to an embodiment of the present invention. As shown inFIG. 2 , the lightemitting diode structure 50 includes asilicon substrate 52, a cup-structure having a parabolic shape on a top surface of thesilicon substrate 52, a plurality of through-holes at the bottom of the cup-structure 54 penetrating thesilicon substrate 52, areflective layer 58 disposed on the top surface of thesilicon substrate 52 in the cup-structure 54, aconductive layer 56 filling the through-holes at the bottom of the cup-structure 54 and protruding out from the through-holes, and alight emitting diode 60. A part of theconductive layer 56 protruding out from the through-holes is a base. Thelight emitting diode 60 is disposed on the top of the base and located at a focus of the cup-structure 54. In addition, the lightemitting diode structure 50 further includes adielectric layer 62 disposed between thesilicon substrate 52 and theconductive layer 56, and thedielectric layer 62 is composed of silicon oxide, silicon nitride or silicon oxy-nitride and can serve as an etching stop layer in a manufacturing process. - The material of the
silicon substrate 52 includes polycrystalline silicon, amorphous silicon, or monocrystalline silicon, and thesilicon substrate 52 can be a rectangular silicon chip or a circular silicon chip. Thesilicon substrate 52 can also include completed integrated circuits or passive devices. In addition, because silicon has good thermal conductivity, the thermal dissipation effect of the light emitting diode structure can be increased. Also, the thermal expansion factor of silicon is similar to the factor of the material of the light emitting diode, so that the reliability of the light emitting diode structure also can be increased. - The
reflective layer 58 comprises materials having high reflectivity, such as metal or optical films, and thereflective layer 58 has a parabolic shape used to reflect light emitted from side surfaces of thelight emitting diode 60 upward (indicated by arrows shown inFIG. 2 ). In addition, thereflective layer 58 and theconductive layer 56 are electrically decoupled. Theconductive layer 56 is composed of metal, and theconductive layer 56 can be a piece of a metal layer or a circuit layer having circuits therein. Theconductive layer 56 is used to electrically couple thelight emitting diode 60 to external circuits, so that thelight emitting diode 60 can be driven. - It should be noted that the surface of the cup-
structure 54 could further have a micro-diffuser structure thereon, as shown inFIG. 3 .FIG. 3 is a microphotograph showing a micro-diffuser structure on the top surface of thesilicon substrate 52 in the cup-structure 54. The micro-diffuser structure on the top surface of the silicon substrate in the cup-structure 54 makes thereflective layer 58 on the cup-structure 54 also have the micro-diffuser structure. The micro-diffuser structure diffuses the light emitted from thelight emitting diode 60 during reflection by thereflective layer 58, so that the glare produced by smooth surfaces can be avoided. In this embodiment, an undulate difference of the micro-diffuser structure is substantially 1 μm, so that the diffusion of the light from thereflective layer 58 can be obvious. - In addition, because the through-holes at the bottom of the cup-
structure 54 penetrate thesilicon substrate 52, theconductive layer 56 can extend from the bottom surface to the top surface of thesilicon substrate 52 through the through-holes. Although the bottom surface of thesilicon substrate 54 is not flat, thelight emitting diode 60 can still be directly disposed on the top of the base in the cup-structure 54 and electrically coupled to theconductive layer 56. No wire bonding process is required, so the manufacturing cost in the process can be saved. Furthermore, because the base of theconductive layer 56 protrudes out from the through-holes, thelight emitting diode 60 can be distanced from the surface of thesilicon substrate 52 in the cup-structure 54 so that thelight emitting diode 60 can be disposed at the focus of the cup-structure 54. The light emitted from the side surfaces of thelight emitting diode 60 can be condensed and reflected upward by thereflective layer 58 having a parabolic shape, similar to a light source disposed at a focus of a parabolic mirror, to have a directional condensing effect. - Therefore, the light emitting diode structure of the present invention lets the light emitted from the light emitting diode reflect upward and be condensed, and the present invention uses the micro-diffuser structure of the cup-structure to diffuse the light in order to prevent the glare.
- Please refer to
FIG. 4 toFIG. 10 , which are schematic diagrams illustrating a method of fabricating a light emitting diode structure according an embodiment of the present invention. As shown inFIG. 4 , asilicon substrate 100 is provided. Then, amask 104 with patterns is fabricated on the bottom surface of thesilicon substrate 100 by a lithographic process, and a plurality of through-holes with high aspect ratio having an inclined sidewall is fabricated at the bottom of thesilicon substrate 100 by an etching process. The etching process utilized for fabricating the through-holes 102 with the high aspect ratio can be a reactive ion etching (RIE) process, a Bosch process, or a wet etching process using potassium hydroxide (KOH), tetramethylammonium hydroxide (TMAH), or ethylenediamine-pyrocatechol-water (EDP) as an etching solution. The Bosch process, also known as pulsed or time-multiplexed etching, alternates repeatedly between standard isotropic plasma etch and deposition of a chemically inert passivation layer to achieve nearly vertical structures. - As shown in
FIG. 5 , themask 104 is removed, and then anetching stop layer 106 is formed in the through-holes 102. Theetching stop layer 106 is composed of dielectric materials, such as silicon oxide, silicon nitride, or silicon oxy-nitride, and a method of forming theetching stop layer 106 includes atmospheric pressure chemical vapor deposition, low pressure chemical vapor deposition, plasma enhanced chemical vapor deposition, or high density plasma chemical vapor deposition. - As shown in
FIG. 6 , aconductive layer 108 is formed on theetching stop layer 106, and the through-holes 102 are filled with the conductive layer as a base. Theconductive layer 108 comprises metal, and a method of fabricating theconductive layer 108 can be sputtering, chemical vapor deposition, or evaporation. - As shown in
FIG. 7 , amask 110 with patterns is fabricated on the top surface of thesilicon substrate 100 by a lithographic process, and then a cup-structure 112 having inclined sidewalls is fabricated on the top surface of thesilicon substrate 100 by a wet etching process. The wet etching process uses KOH, TMAH, or EDP as an etching solution. - As shown in
FIG. 8 , next a parabolic shape of thecup structure 112 is formed by a dry etching process, and theetching stop layer 106 on the top of the base is exposed. Then, a micro-diffuser structure (indicated by the micro-diffuser structure shown inFIG. 3 ) is fabricated on the surface of the cup-structure 112. The dry etching process includes a reactive ion etching process or a Bosch process. The Bosch process, also known as pulsed or time-multiplexed etching, alternates repeatedly between standard isotropic plasma etch and deposition of a chemically inert passivation layer to achieve nearly vertical structures. It should be noted that theetching stop layer 106 is used to prevent theconductive layer 108 from being etched in the dry etching process. The depth of the base can be controlled accurately, so the light emitting diode disposed on the base can be accurately located at the focus of the cup-structure 112. - As shown in
FIG. 9 , the etching stop layer is etched by a dry or wet etching process to expose the base, and then areflective layer 114 is formed on the top surface of the cup-structure 112. Thereflective layer 114 is a film, such as a metal or optical film, which is formed on the cup-structure 112 by sputtering, chemical vapor deposition, or evaporation. - As shown in
FIG. 10 , themask 110 is removed, and a die-attachment process, such as a flip-chip process or a die attachment using glass frit, is performed to bond alight emitting diode 116 to the base. Thelight emitting diode 116 is located at the focus of the cup-structure 112, and the light emitting diode structure of the present invention is thus completed. - In summary, the present invention uses lithographic and etching processes to fabricate a parabolic-shaped cup-structure on the silicon substrate, and also fabricates a base in the cup-structure to hold the light emitting diode, so that the light emitting diode can be disposed at the focus of the cup-structure. Therefore, the problem of not being able to dispose the light emitting diode on a curved cup-structure can be solved. In addition, the present invention provides a micro-diffuser structure formed by the etching process to prevent glare. The light emitting diode structure of the present invention further provides the parabolic-shaped cup-structure to condense the light emitted from the sidewalls of the light emitting diode efficiently, so as to have a directional function.
- Those skilled in the art will readily observe that numerous modifications and alterations of the device and method may be made while retaining the teachings of the invention.
Claims (17)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/247,236 US7821094B2 (en) | 2007-02-16 | 2008-10-08 | Light emitting diode structure |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW096106235A TWI334656B (en) | 2007-02-16 | 2007-02-16 | Light emitting diode structure and manufacturing method thereof |
| TW096106235 | 2007-02-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US12/247,236 Division US7821094B2 (en) | 2007-02-16 | 2008-10-08 | Light emitting diode structure |
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| Publication Number | Publication Date |
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| US20080197370A1 true US20080197370A1 (en) | 2008-08-21 |
| US7510892B2 US7510892B2 (en) | 2009-03-31 |
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| US11/737,133 Expired - Fee Related US7510892B2 (en) | 2007-02-16 | 2007-04-18 | Light emitting diode structure and manufacturing method thereof |
| US12/247,236 Expired - Fee Related US7821094B2 (en) | 2007-02-16 | 2008-10-08 | Light emitting diode structure |
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| Application Number | Title | Priority Date | Filing Date |
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| US12/247,236 Expired - Fee Related US7821094B2 (en) | 2007-02-16 | 2008-10-08 | Light emitting diode structure |
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| TW (1) | TWI334656B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100207152A1 (en) * | 2009-02-17 | 2010-08-19 | Jung Min Won | Lighting emitting device package |
| EP3297036A1 (en) * | 2009-09-24 | 2018-03-21 | MSG Lithoglas GmbH | Method for producing an assembly comprising a component on a carrier substrate and assembly and method for producing a semi-finished product |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2221885A4 (en) * | 2007-11-19 | 2013-09-25 | Panasonic Corp | SEMICONDUCTOR LIGHT EMITTING DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR LIGHT EMITTING DEVICE |
| US10500770B2 (en) * | 2010-03-02 | 2019-12-10 | So-Semi Technologies, Llc | LED packaging with integrated optics and methods of manufacturing the same |
| JP6789837B2 (en) * | 2017-02-08 | 2020-11-25 | 株式会社東海理化電機製作所 | Display device |
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2007
- 2007-02-16 TW TW096106235A patent/TWI334656B/en not_active IP Right Cessation
- 2007-04-18 US US11/737,133 patent/US7510892B2/en not_active Expired - Fee Related
-
2008
- 2008-10-08 US US12/247,236 patent/US7821094B2/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6015719A (en) * | 1997-10-24 | 2000-01-18 | Hewlett-Packard Company | Transparent substrate light emitting diodes with directed light output |
| US6469322B1 (en) * | 1998-02-06 | 2002-10-22 | General Electric Company | Green emitting phosphor for use in UV light emitting diodes |
| US6521916B2 (en) * | 1999-03-15 | 2003-02-18 | Gentex Corporation | Radiation emitter device having an encapsulant with different zones of thermal conductivity |
| US7244924B2 (en) * | 2000-07-14 | 2007-07-17 | Omron Corporation | Transparent optical component for light emitting/receiving elements |
| US20080265266A1 (en) * | 2004-09-22 | 2008-10-30 | Osram Opto Semiconductors Gmbh | Housing for an Optoelectronic Component, Optoelectronic Component and Method for the Production of an Optoelectronic Component |
| US20070257272A1 (en) * | 2006-05-03 | 2007-11-08 | Hutchins Edward L | Multi-element LED lamp package |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100207152A1 (en) * | 2009-02-17 | 2010-08-19 | Jung Min Won | Lighting emitting device package |
| US8648365B2 (en) * | 2009-02-17 | 2014-02-11 | Lg Innotek Co., Ltd. | Lighting emitting device package |
| EP3297036A1 (en) * | 2009-09-24 | 2018-03-21 | MSG Lithoglas GmbH | Method for producing an assembly comprising a component on a carrier substrate and assembly and method for producing a semi-finished product |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI334656B (en) | 2010-12-11 |
| US7510892B2 (en) | 2009-03-31 |
| US7821094B2 (en) | 2010-10-26 |
| US20090032832A1 (en) | 2009-02-05 |
| TW200836367A (en) | 2008-09-01 |
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