US20060137989A1 - Electrochemical plating apparatus and method - Google Patents
Electrochemical plating apparatus and method Download PDFInfo
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- US20060137989A1 US20060137989A1 US11/317,715 US31771505A US2006137989A1 US 20060137989 A1 US20060137989 A1 US 20060137989A1 US 31771505 A US31771505 A US 31771505A US 2006137989 A1 US2006137989 A1 US 2006137989A1
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/10—Electrodes, e.g. composition, counter electrode
- C25D17/12—Shape or form
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- H10P14/46—
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/10—Electrodes, e.g. composition, counter electrode
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/12—Process control or regulation
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
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- H10P14/47—
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- H10W20/043—
Definitions
- the present invention relates to electrochemical plating, and more particularly to an electrochemical plating apparatus and method, which can improve uniformity of a metallic layer formed on a substrate using an anode made up of a plurality of metal bodies.
- Electrochemical plating may be performed, for example, to fill a via or contact hole, or other a feature formed in a substrate (wafer), when forming a line of circuitry in an integrated circuit.
- Chemical vapor deposition or physical vapor deposition is typically used to deposit a barrier diffusion layer on the feature and to deposit a conductive metal seed layer on the barrier diffusion layer.
- Electrochemical plating uses an electrochemical plating apparatus to deposit on the seed layer a conductive metallic layer of, for example, copper, thereby filling the feature and covering the associated structure.
- a conductive wire is defined by planarizing the deposited metallic layer by, for example, chemical-mechanical polishing.
- the deposition of the metallic layer on the seed layer is accomplished by electrically biasing the seed layer of the substrate with respect to an anode, and the seed layer and the anode are both submerged in an electrolyte solution of an electrolyte cell. That is, a voltage is applied to the seed layer and referenced to the anode, such that the electrified seed layer attracts metal ions during deposition.
- a contemporary electrochemical plating apparatus comprises an electrochemical cell 12 in which an anode 30 and a substrate 20 having a seed layer 40 thereon are submerged in an electrolyte solution 14 filling a process bath 10 .
- the anode 30 is a conductive metal (e.g., copper) body, which is typically disposed at the lower end of the electrochemical cell 12 , that is, in the bottom of the process bath 10 .
- the substrate 20 is disposed in the electrochemical cell 12 opposite the anode 30 and is positioned so that the seed layer 40 faces the anode.
- a bias voltage (V) is applied across the anode 30 and the seed layer 40 to generate, within the electrolyte solution 14 , an electrical field between the anode and seed layer, which is maintained during deposition. That is, the seed layer 40 is electrified for the deposition of the metallic layer, such that the electrolyte solution 14 in the electrochemical cell 12 acts as a medium to deliver metal ions that are supplied from the anode 30 to the seed layer 40 on the substrate 20 , whereby the chemical reaction between the anode and electrolyte solution is augmented by applying the electrical charge.
- the electrical field is set to promote an enhanced deposition of the metallic layer on the seed layer 40 according to the lines of flux generated within the electrolyte solution 14 , which extend to the substrate 20 from a point below the anode 30 , thus passing through the anode.
- the formation of a uniform (e.g., even thickness) metallic layer on the seed layer 40 may depend on optimization of several factors, including an ion travel distance D (distance between the anode 30 and the substrate 20 ); a bath resistance R b (resistance of the electrolyte solution 14 ), which depends on the ion travel distance; and a seed resistance R s (resistance of the seed layer 40 ), which depends on the thickness and uniformity of the seed layer.
- the bath resistance R b should be high and the seed resistance R s should be low (namely, by forming a thick seed layer having a high degree of uniformity).
- the configuration of the anode 30 which may constitute a continuous (planar) disc-shaped body having a flat upper surface ( FIG. 2 ) or by one having an upper surface formed of a plurality of concentrically arranged, V-shaped grooves 32 ( FIG. 3 ).
- the ion travel distance D which, when varied, changes the bath resistance and thus the current density between the anode 30 and the substrate 20 , thereby affecting the uniformity of the metallic layer formed on the seed layer 40 .
- the ion travel distance may be set to provide the substrate 20 with a metallic layer 42 having a uniform thickness as shown in FIG. 4A .
- the bath resistance may be maximized, but the increased resistance results in the formation of a metallic layer 42 ′ exhibiting excessive thickness near the perimeter of the substrate 20 and thinner formations at its central portions.
- the resulting formation is a metallic layer 42 ′′ exhibiting excessive thickness near the center of the substrate 20 and thinner formations toward its perimeter.
- the present invention is directed to an apparatus and a method for electrochemical plating that substantially obviate one or more problems due to limitations and disadvantages of the related art.
- An object of the present invention is to provide an apparatus and a method for electrochemical plating, which enhances uniformity of a metallic layer formed on a substrate.
- Another object of the present invention is to provide an electrochemical plating apparatus and method for forming a metallic layer on a substrate, which enables the distance between an anode body and the substrate to be independently controlled.
- Another object of the present invention is to provide an apparatus and a method for electrochemical plating for forming a metallic layer on a substrate, which enables an optimal bath resistance to be maintained across a wafer.
- an electrochemical plating apparatus comprising an electrochemical cell containing an electrolyte solution; a plurality of bodies arranged in the electrochemical solution to form an anode; a substrate having a seed layer thereon, disposed in the electrochemical cell opposite the anode, such that the anode and the seed layer are separated by an ion travel distance; and a distance controller for independently driving at least one of the plurality of bodies to control the ion travel distance.
- a method for forming a metallic layer on a substrate having a seed layer comprising arranging, in an electrolyte solution, a plurality of bodies as an anode so that the seed layer faces the anode; setting a distance between the seed layer and a corresponding body of the anode by independently driving at least one of the plurality of bodies; and generating an electrical field between the seed layer and the anode according to the set ion travel distance.
- FIG. 1 is a schematic view of a contemporary electrochemical plating apparatus
- FIGS. 2 and 3 are each a combined plan view and cross-sectional view of the anode of FIG. 1 , respectively showing different anode body configurations;
- FIGS. 4A-4C are each cross-sectional views of views of the electrochemical plating apparatus of FIG. 1 , respectively illustrating formations of a metallic layer on a substrate according to an ion travel distance;
- FIG. 5 is a schematic view of an electrochemical plating apparatus in accordance with an exemplary embodiment of the present invention.
- FIGS. 6A and 6B are each a combined plan view and cross-sectional view of the anode of FIG. 5 , respectively showing different anode body configurations.
- the electrochemical plating apparatus comprises an electrochemical cell 112 in which an anode 130 and a substrate 120 having a seed layer 140 thereon are submerged in an electrolyte solution 114 filling a process bath 110 .
- the anode may be disposed at the lower end of the electrochemical cell (that is, in the bottom of the process bath).
- the substrate 120 is generally disposed in the electrochemical cell 112 opposite the anode 130 and positioned so that the seed layer 140 faces the anode.
- the apparatus generally includes a power source for applying a bias voltage (V) across the anode 130 and the seed layer 140 to generate, within the electrolyte solution 114 , an electrical field between the anode and seed layer, which is maintained during deposition.
- V bias voltage
- the anode 130 generally supplies metal ions to the seed layer 140 according to the generation of the electrical field and a chemical reaction between the anode and the electrolyte solution 114 .
- the anode 130 includes first and second bodies 132 and 134 that typically comprise a conductive metal (e.g., copper).
- the electrochemical plating apparatus comprises a distance controller 150 for controlling (and/or adjusting) the distance between the seed layer 140 and the anode 130 by independently driving at least one of the first and second bodies 132 and 134 , to control, adjust or maintain an ion travel distance separating the seed layer from the respective bodies of the anode.
- a plurality of bodies e.g., the first body 132 and the second body 134 ) is arranged in the electrochemical solution to form the anode 130 .
- the first body 132 may have an annular configuration, including a circular and/or centrally disposed opening.
- the second body 134 may have a disc configuration corresponding or complementary to the annular configuration of the first body 132 , and is generally movable, under control of the distance controller 150 , with respect to the annular configuration of the first body and/or the substrate 120 /seed layer 140 . That is, regardless of its actual shape (which may also be square, hexagonal, octagonal, etc.), the second body 134 is configured to be received by (or fit within and preferably match the shape and [substantially] the dimensions of) the opening of the first body 132 .
- the first body 132 is positioned in the process bath 110 to be separated by a fixed distance D 1 ′ from the seed layer 140 on the substrate 120 .
- the first body 132 may be held in a fixed position and/or location relative to the seed layer 140 and/or the substrate 120 , and the position of the substrate 120 may be variable with respect to the first body 132 .
- the first body 132 serves to supply the metal ions to the seed layer 140 by virtue of the applied voltage and the chemical reaction between the anode 130 and the electrolyte solution 114 .
- the second body 134 is inserted into and passes through at least part of the (circular) opening of the first body 132 by the operation (driving) of the distance controller 150 .
- the second body 134 is set an adjustable distance D 2 ′ from the seed layer 140 and/or the substrate 120 .
- the second body 134 also serves to supply metal ions to the seed layer 140 by virtue of the applied voltage and the chemical reaction between the anode 130 and the electrolyte solution 114 .
- the ion travel distance between the seed layer 140 and the second body 134 (namely, the adjustable distance D 2 ′) is adjusted by the distance controller 150 , which vertically moves the second body according to a control signal generated before and/or during a manufacturing process for making the metallic layer on the substrate (e.g., a wafer), thereby enabling uniform formation of the metallic layer on the substrate 120 .
- the anode 130 may comprise 3 or more generally concentric bodies, each positioned a different distance from the substrate 120 and/or seed layer 140 .
- the distance between the seed layer 140 and each body of the anode 130 may be set by passing the second body 134 through the central opening of the first body 132 according to a driving operation of the distance controller 150
- the distance controller 150 may include independent current supplies to each anode body, to generate separate and/or different electrical fields for transferring the metal ions of each anode body 132 and 134 through the electrolyte solution 114 and thereby form the metallic layer on the substrate 120 .
- the electrolytic cell 112 may separately generate lines of flux in the electrolyte solution 114 to deliver metal ions to the seed layer 140 from each of the first and second bodies 132 and 134 in accordance with the bath resistances established by the respective ion travel distances. That is, metal ions from the first body 132 are delivered by virtue of a first bath resistance R b1 according to the fixed distance D 1 ′, while metal ions from the second body 134 are delivered by virtue of a second bath resistance R b2 according to the adjusted distance D 2 ′. Possible adjustments (relative positions) of the respective bodies of the anode 130 according to the present invention are shown in FIGS. 6A and 6B .
- the distance between the seed layer 140 and a corresponding body of the anode 130 may be set by independently driving at least one of the plurality of bodies (for example, the second body 134 ), whereby one of the plurality of bodies (for example, the first body 134 ) may be positioned a first distance from the seed layer and another of the plurality of bodies (for example, the second body 134 ) may be moved to a second (generally shorter) distance from the seed layer.
- the plurality of bodies for example, the second body 134
- the distance controller 150 may be operated (e.g., controlled by a control signal) to optimize the distance between the anode 130 and the seed layer 140 by setting the distance between the second body 134 and the anode 130 to a distance different from the fixed position of the first body 132 (for example, by moving the second body through an opening in the first body).
- the respective bath resistances R b1 and R b2 can be optimized by controlling the distance between the seed layer 140 and the respective bodies of the anode 130 (e.g., the first and second bodies 132 and 134 ), thereby enabling the metallic layer 142 to be formed relatively uniformly on the substrate 120 .
- the controller 150 may provide a different amount of current to each of the anode bodies in the anode 130 to generate different electric fields between each anode body and the substrate and/or seed layer. This embodiment may be particularly advantageous when the anode 130 comprises 3 or more anode bodies.
- the apparatus and the method for electrochemical plating according to the invention can control uniformity of the metallic layer formed on a substrate provided with a seed layer, by independently adjusting distances between the substrate and respective bodies constituting the anode.
- uniformity of an electrochemical metal layer for semiconductor devices having a small feature size is advantageously controlled.
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Abstract
Description
- This application claims the benefit of Korean Patent Application No. 10-2004-0111156, filed on Dec. 23, 2004, which is hereby incorporated by reference as if fully set forth herein.
- 1. Field of the Invention
- The present invention relates to electrochemical plating, and more particularly to an electrochemical plating apparatus and method, which can improve uniformity of a metallic layer formed on a substrate using an anode made up of a plurality of metal bodies.
- 2. Discussion of the Related Art
- Electrochemical plating may be performed, for example, to fill a via or contact hole, or other a feature formed in a substrate (wafer), when forming a line of circuitry in an integrated circuit. Chemical vapor deposition or physical vapor deposition is typically used to deposit a barrier diffusion layer on the feature and to deposit a conductive metal seed layer on the barrier diffusion layer. Electrochemical plating uses an electrochemical plating apparatus to deposit on the seed layer a conductive metallic layer of, for example, copper, thereby filling the feature and covering the associated structure. Finally, a conductive wire is defined by planarizing the deposited metallic layer by, for example, chemical-mechanical polishing.
- During the electrochemical plating, the deposition of the metallic layer on the seed layer is accomplished by electrically biasing the seed layer of the substrate with respect to an anode, and the seed layer and the anode are both submerged in an electrolyte solution of an electrolyte cell. That is, a voltage is applied to the seed layer and referenced to the anode, such that the electrified seed layer attracts metal ions during deposition.
- Referring to
FIG. 1 , a contemporary electrochemical plating apparatus comprises anelectrochemical cell 12 in which ananode 30 and asubstrate 20 having aseed layer 40 thereon are submerged in anelectrolyte solution 14 filling a process bath 10. Theanode 30 is a conductive metal (e.g., copper) body, which is typically disposed at the lower end of theelectrochemical cell 12, that is, in the bottom of the process bath 10. Thesubstrate 20 is disposed in theelectrochemical cell 12 opposite theanode 30 and is positioned so that theseed layer 40 faces the anode. A bias voltage (V) is applied across theanode 30 and theseed layer 40 to generate, within theelectrolyte solution 14, an electrical field between the anode and seed layer, which is maintained during deposition. That is, theseed layer 40 is electrified for the deposition of the metallic layer, such that theelectrolyte solution 14 in theelectrochemical cell 12 acts as a medium to deliver metal ions that are supplied from theanode 30 to theseed layer 40 on thesubstrate 20, whereby the chemical reaction between the anode and electrolyte solution is augmented by applying the electrical charge. The electrical field is set to promote an enhanced deposition of the metallic layer on theseed layer 40 according to the lines of flux generated within theelectrolyte solution 14, which extend to thesubstrate 20 from a point below theanode 30, thus passing through the anode. - The formation of a uniform (e.g., even thickness) metallic layer on the
seed layer 40 may depend on optimization of several factors, including an ion travel distance D (distance between theanode 30 and the substrate 20); a bath resistance Rb (resistance of the electrolyte solution 14), which depends on the ion travel distance; and a seed resistance Rs (resistance of the seed layer 40), which depends on the thickness and uniformity of the seed layer. Here, the bath resistance Rb should be high and the seed resistance Rs should be low (namely, by forming a thick seed layer having a high degree of uniformity). Also significantly influencing metallic layer formation is the configuration of theanode 30, which may constitute a continuous (planar) disc-shaped body having a flat upper surface (FIG. 2 ) or by one having an upper surface formed of a plurality of concentrically arranged, V-shaped grooves 32 (FIG. 3 ). Neither of these configurations, however, consider the ion travel distance D, which, when varied, changes the bath resistance and thus the current density between theanode 30 and thesubstrate 20, thereby affecting the uniformity of the metallic layer formed on theseed layer 40. - For example, for an optimal bath resistance, the ion travel distance may be set to provide the
substrate 20 with ametallic layer 42 having a uniform thickness as shown inFIG. 4A . Meanwhile, as shown inFIG. 4B , if the ion travel distance is increased to a first distance D1, the bath resistance may be maximized, but the increased resistance results in the formation of ametallic layer 42′ exhibiting excessive thickness near the perimeter of thesubstrate 20 and thinner formations at its central portions. On the other hand, as shown inFIG. 4C , if the ion travel distance is decreased to a second distance D2, thereby lowering the bath resistance, the resulting formation is ametallic layer 42″ exhibiting excessive thickness near the center of thesubstrate 20 and thinner formations toward its perimeter. - Accordingly, the present invention is directed to an apparatus and a method for electrochemical plating that substantially obviate one or more problems due to limitations and disadvantages of the related art.
- An object of the present invention is to provide an apparatus and a method for electrochemical plating, which enhances uniformity of a metallic layer formed on a substrate.
- Another object of the present invention is to provide an electrochemical plating apparatus and method for forming a metallic layer on a substrate, which enables the distance between an anode body and the substrate to be independently controlled.
- Another object of the present invention is to provide an apparatus and a method for electrochemical plating for forming a metallic layer on a substrate, which enables an optimal bath resistance to be maintained across a wafer.
- Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention. The objectives and other advantages of the invention may be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
- To achieve these objects and other advantages in accordance with the purpose of the invention, as embodied and broadly described herein, there is provided an electrochemical plating apparatus comprising an electrochemical cell containing an electrolyte solution; a plurality of bodies arranged in the electrochemical solution to form an anode; a substrate having a seed layer thereon, disposed in the electrochemical cell opposite the anode, such that the anode and the seed layer are separated by an ion travel distance; and a distance controller for independently driving at least one of the plurality of bodies to control the ion travel distance.
- In another aspect of the present invention, there is provided a method for forming a metallic layer on a substrate having a seed layer, the method comprising arranging, in an electrolyte solution, a plurality of bodies as an anode so that the seed layer faces the anode; setting a distance between the seed layer and a corresponding body of the anode by independently driving at least one of the plurality of bodies; and generating an electrical field between the seed layer and the anode according to the set ion travel distance.
- It is to be understood that both the foregoing general description and the following detailed description of the present invention are exemplary and explanatory and are intended to provide further explanation of the invention as claimed.
- The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principle of the invention. In the drawings:
-
FIG. 1 is a schematic view of a contemporary electrochemical plating apparatus; -
FIGS. 2 and 3 are each a combined plan view and cross-sectional view of the anode ofFIG. 1 , respectively showing different anode body configurations; -
FIGS. 4A-4C are each cross-sectional views of views of the electrochemical plating apparatus ofFIG. 1 , respectively illustrating formations of a metallic layer on a substrate according to an ion travel distance; -
FIG. 5 is a schematic view of an electrochemical plating apparatus in accordance with an exemplary embodiment of the present invention; and -
FIGS. 6A and 6B are each a combined plan view and cross-sectional view of the anode ofFIG. 5 , respectively showing different anode body configurations. - Reference will now be made in detail to the preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, like reference designations will be used throughout the drawings to refer to the same or similar parts.
- Referring to
FIG. 5 , the electrochemical plating apparatus according to the present invention comprises an electrochemical cell 112 in which ananode 130 and asubstrate 120 having aseed layer 140 thereon are submerged in anelectrolyte solution 114 filling aprocess bath 110. The anode may be disposed at the lower end of the electrochemical cell (that is, in the bottom of the process bath). Thus, thesubstrate 120 is generally disposed in the electrochemical cell 112 opposite theanode 130 and positioned so that theseed layer 140 faces the anode. The apparatus generally includes a power source for applying a bias voltage (V) across theanode 130 and theseed layer 140 to generate, within theelectrolyte solution 114, an electrical field between the anode and seed layer, which is maintained during deposition. Theanode 130 generally supplies metal ions to theseed layer 140 according to the generation of the electrical field and a chemical reaction between the anode and theelectrolyte solution 114. - According to the present invention, the
anode 130 includes first and 132 and 134 that typically comprise a conductive metal (e.g., copper). Also, the electrochemical plating apparatus according to the present invention comprises asecond bodies distance controller 150 for controlling (and/or adjusting) the distance between theseed layer 140 and theanode 130 by independently driving at least one of the first and 132 and 134, to control, adjust or maintain an ion travel distance separating the seed layer from the respective bodies of the anode. Thus, a plurality of bodies (e.g., thesecond bodies first body 132 and the second body 134) is arranged in the electrochemical solution to form theanode 130. Thefirst body 132 may have an annular configuration, including a circular and/or centrally disposed opening. Thesecond body 134 may have a disc configuration corresponding or complementary to the annular configuration of thefirst body 132, and is generally movable, under control of thedistance controller 150, with respect to the annular configuration of the first body and/or thesubstrate 120/seed layer 140. That is, regardless of its actual shape (which may also be square, hexagonal, octagonal, etc.), thesecond body 134 is configured to be received by (or fit within and preferably match the shape and [substantially] the dimensions of) the opening of thefirst body 132. - The
first body 132 is positioned in theprocess bath 110 to be separated by a fixed distance D1′ from theseed layer 140 on thesubstrate 120. Alternatively, thefirst body 132 may be held in a fixed position and/or location relative to theseed layer 140 and/or thesubstrate 120, and the position of thesubstrate 120 may be variable with respect to thefirst body 132. Thefirst body 132 serves to supply the metal ions to theseed layer 140 by virtue of the applied voltage and the chemical reaction between theanode 130 and theelectrolyte solution 114. Thesecond body 134 is inserted into and passes through at least part of the (circular) opening of thefirst body 132 by the operation (driving) of thedistance controller 150. Generally, thesecond body 134 is set an adjustable distance D2′ from theseed layer 140 and/or thesubstrate 120. Thesecond body 134 also serves to supply metal ions to theseed layer 140 by virtue of the applied voltage and the chemical reaction between theanode 130 and theelectrolyte solution 114. The ion travel distance between theseed layer 140 and the second body 134 (namely, the adjustable distance D2′) is adjusted by thedistance controller 150, which vertically moves the second body according to a control signal generated before and/or during a manufacturing process for making the metallic layer on the substrate (e.g., a wafer), thereby enabling uniform formation of the metallic layer on thesubstrate 120. Naturally, theanode 130 may comprise 3 or more generally concentric bodies, each positioned a different distance from thesubstrate 120 and/orseed layer 140. - In the exemplary embodiment of the present invention, the distance between the
seed layer 140 and each body of the anode 130 (i.e., the ion travel distance) may be set by passing thesecond body 134 through the central opening of thefirst body 132 according to a driving operation of thedistance controller 150 In addition to or in place of the anode body driver, thedistance controller 150 may include independent current supplies to each anode body, to generate separate and/or different electrical fields for transferring the metal ions of each 132 and 134 through theanode body electrolyte solution 114 and thereby form the metallic layer on thesubstrate 120. Therefore, the electrolytic cell 112 may separately generate lines of flux in theelectrolyte solution 114 to deliver metal ions to theseed layer 140 from each of the first and 132 and 134 in accordance with the bath resistances established by the respective ion travel distances. That is, metal ions from thesecond bodies first body 132 are delivered by virtue of a first bath resistance Rb1 according to the fixed distance D1′, while metal ions from thesecond body 134 are delivered by virtue of a second bath resistance Rb2 according to the adjusted distance D2′. Possible adjustments (relative positions) of the respective bodies of theanode 130 according to the present invention are shown inFIGS. 6A and 6B . - In the electroplating apparatus and method according to the present invention, the distance between the
seed layer 140 and a corresponding body of theanode 130 may be set by independently driving at least one of the plurality of bodies (for example, the second body 134), whereby one of the plurality of bodies (for example, the first body 134) may be positioned a first distance from the seed layer and another of the plurality of bodies (for example, the second body 134) may be moved to a second (generally shorter) distance from the seed layer. Thus, thedistance controller 150 may be operated (e.g., controlled by a control signal) to optimize the distance between theanode 130 and theseed layer 140 by setting the distance between thesecond body 134 and theanode 130 to a distance different from the fixed position of the first body 132 (for example, by moving the second body through an opening in the first body). As a result, the respective bath resistances Rb1 and Rb2 can be optimized by controlling the distance between theseed layer 140 and the respective bodies of the anode 130 (e.g., the first andsecond bodies 132 and 134), thereby enabling the metallic layer 142 to be formed relatively uniformly on thesubstrate 120. - Alternatively or additionally, the
controller 150 may provide a different amount of current to each of the anode bodies in theanode 130 to generate different electric fields between each anode body and the substrate and/or seed layer. This embodiment may be particularly advantageous when theanode 130 comprises 3 or more anode bodies. - As apparent from the above description, the apparatus and the method for electrochemical plating according to the invention can control uniformity of the metallic layer formed on a substrate provided with a seed layer, by independently adjusting distances between the substrate and respective bodies constituting the anode. As a result, when forming a metallic layer on a large-scale substrate (wafer), uniformity of an electrochemical metal layer for semiconductor devices having a small feature size is advantageously controlled.
- It will be apparent to those skilled in the art that various modifications can be made in the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention covers such modifications provided they come within the scope of the appended claims and their equivalents.
Claims (20)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2004-0111156 | 2004-12-23 | ||
| KR1020040111156A KR100698063B1 (en) | 2004-12-23 | 2004-12-23 | Electrochemical Plating Apparatus and Method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US20060137989A1 true US20060137989A1 (en) | 2006-06-29 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US11/317,715 Abandoned US20060137989A1 (en) | 2004-12-23 | 2005-12-22 | Electrochemical plating apparatus and method |
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| Country | Link |
|---|---|
| US (1) | US20060137989A1 (en) |
| KR (1) | KR100698063B1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080121526A1 (en) * | 2006-11-27 | 2008-05-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Adjustable anode assembly for a substrate wet processing apparatus |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040200727A1 (en) * | 2001-12-07 | 2004-10-14 | Akihiro Aiba | Copper electroplating method, pure copper anode for copper electroplating, and semiconductor wafer plated thereby with little particle adhesion |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3074414B2 (en) * | 1992-03-26 | 2000-08-07 | 三菱マテリアル株式会社 | Manufacturing method of metal thin film |
| KR20010057966A (en) * | 1999-12-23 | 2001-07-05 | 신현준 | Electro-plating with space adjustment for evenly consuming an anode |
| US6270646B1 (en) * | 1999-12-28 | 2001-08-07 | International Business Machines Corporation | Electroplating apparatus and method using a compressible contact |
| US6746589B2 (en) * | 2000-09-20 | 2004-06-08 | Ebara Corporation | Plating method and plating apparatus |
-
2004
- 2004-12-23 KR KR1020040111156A patent/KR100698063B1/en not_active Expired - Fee Related
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2005
- 2005-12-22 US US11/317,715 patent/US20060137989A1/en not_active Abandoned
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040200727A1 (en) * | 2001-12-07 | 2004-10-14 | Akihiro Aiba | Copper electroplating method, pure copper anode for copper electroplating, and semiconductor wafer plated thereby with little particle adhesion |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080121526A1 (en) * | 2006-11-27 | 2008-05-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Adjustable anode assembly for a substrate wet processing apparatus |
| US8101052B2 (en) * | 2006-11-27 | 2012-01-24 | Taiwan Semiconductor Manufacturing Co., Ltd. | Adjustable anode assembly for a substrate wet processing apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20060072497A (en) | 2006-06-28 |
| KR100698063B1 (en) | 2007-03-23 |
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