US20040091197A1 - Highly adaptable heterogeneous power amplifier ic micro-systems using flip chip and micromechanical technologies on low loss substrates - Google Patents
Highly adaptable heterogeneous power amplifier ic micro-systems using flip chip and micromechanical technologies on low loss substrates Download PDFInfo
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- US20040091197A1 US20040091197A1 US10/294,518 US29451802A US2004091197A1 US 20040091197 A1 US20040091197 A1 US 20040091197A1 US 29451802 A US29451802 A US 29451802A US 2004091197 A1 US2004091197 A1 US 2004091197A1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/0006—Interconnects
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- H10W44/20—
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
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- H10W72/20—
Definitions
- This invention is in the field of re-configurable hybrid assemblies on low loss substrates.
- MMIC Monolithic Integrated Circuits
- MMICs include active devices, such as Field Effect Transistors and bipolar transistors, passive elements such as MIM capacitors, thin film and bulk resistors and inductors integrated on a single semi-insulating Gallium Arsenide substrate.
- Circuit performance and topology is generally fixed at the time of manufacture, typically using “static” impedance matching networks to interconnect various elements. This static approach limits a circuit to a single function, precludes its re-configuration, restricts its use for new modes, functions, operations and bandwidth. This inability to adapt to new configurations in real time to new requirements limits system performance, decreases system mean time between failure as well as useful operating lifetime, and flexibility.
- Micro-Electro-Mechanical Systems is the integration of mechanical elements, sensors, actuators, and electronics on a common substrate through the utilization of microfabrication technology. While typical electronics elements such as transistors are fabricated using integrated circuit (IC) process sequences (e.g., CMOS, Bipolar, or BICMOS processes), micromechanical MEMS structures are fabricated using process compatible micromachining processes that selectively etch away parts of the silicon wafer or add new structural layers to form the mechanical and electromechanical devices.
- IC integrated circuit
- a first MEM 329 having a first contact and a second contact is mounted on a substrate 301 .
- a PA power cell 325 is thermally connected to the same substrate 301 using a thermal bump 321 .
- the power cell 325 is electrically insulated from the substrate 301 .
- the power cell 325 has a first power cell bump 311 and a second power cell bump 309 as pathways for I/O functions.
- a first insulator 319 is mounted on substrate 301 supporting a second MEM 327 above the substrate 301 .
- the second MEM 327 has a first connection 315 and a second connection 317 .
- the first connection and the second connection are located on a bottom surface of the second MEM 327 .
- a first conductive via 313 vertically traverses the first insulator 319 and is connected to the first connection 315 from the second MEM 327 .
- This first conductive via 313 is further connected to a first conductor 337 .
- the first conductor is insulated from substrate 301 by a first insulating layer 333 .
- the first conductor 337 is further connected to the first power cell bump 311 .
- a second conductor 335 is insulated from the substrate 301 by a second insulating layer 331 .
- the second conductor 335 is connected to a second conductive via 307 .
- the second conductive via 307 traverses vertically a second insulator 339 .
- the second conductive via 307 is connected to a first metal member 305 .
- the first metal member 305 is formed over the upper surface of the second insulator 339 and connected to a first input to the first MEM switch 329 .
- a second metal member 303 is connected to the second contact of the first MEM switch 329 .
- the second metal member is formed over the upper surface of a third insulator 323 .
- the third insulator 323 is positioned over substrate 301 .
- FIG. 1 is an exemplary network of the prior art presenting a variable impedance varied using non-linearities in transistors
- FIG. 2 is an exemplary network of the present invention for connecting matching networks to flip chip power cells using MEM switches;
- FIG. 3 is an exemplary vertical layout of the PA power cells and MEM switches over a substrate
- FIG. 4 is an exemplary layout of a MEM switch for use with the present invention.
- This invention introduces the notion of using MEMS switches to reconfigure the topology of radio frequency matching network components to achieve added functions and characteristics.
- the approach for reducing the attenuation or non-linearity of switching elements of the prior art is to use MEMS type structures having low insertion loss to perform the switching function.
- the bias point of transistor 109 can be selectively chosen to change the impedance seen by capacitor 111 to ground. With transistor 109 not in saturation, capacitor 111 sees a current sink to ground, the current sink value determined by the bias current applied to control CONT 1 .
- control CONT 2 for FET 107 depending on voltage value controls the characteristic of FET 107 connecting capacitor 105 to ground.
- transistors 109 and 107 could be full ON or “OFF”. In an analog environment, transistors 109 and 107 can be viewed as variable elements.
- Transistors 107 and 109 are however less than ideal for the application. When in saturation, transistor 109 has a V ce voltage across it, inducing losses. Similarly, FET 107 , when in saturation still presents an resistive impedance between capacitor 105 and ground.
- This invention calls for the use of low capacitance and low ON resistance MEMS switches to reconfigure the matching networks used in high frequency circuits. These MEMS switches are used in conjunction with flip chip technology on a low loss substrate. A typical MEMS switch is shown in FIG. 4 and is described below with respect to FIG. 4.
- FIG. 2 shows the use of MEM switches connecting matching networks to flip chip power cells.
- substrate 200 On substrate 200 are mounted digital control circuits 202 as well as Flip chip power cells 204 , 206 , 208 and 210 .
- MEM switch and matching network 212 , 214 , 216 , 218 processes high frequency analog signals presented to the flip chip power cells.
- MEM switch 220 connected to MEM switch 222 can route RF signals to various matching networks attached to contact pads such as contact pad 234 .
- MEM switch 224 is connected to MEM switch 226 allowing signal routing.
- MEM switch 228 controls switches signals applied to or from contact pad 230 .
- MEM switch 232 switches signals from contact pad 234 .
- MEM switch 238 and contact pad 236 are examples.
- contact pad 240 signals routed using MEM switch 242 .
- FIG. 3 shows the vertical crossection of the adaptable assembly described in FIG. 2.
- This assembly is for use at high frequencies and has a substrate 301 , a first MEM 329 mounted on said substrate having a first contact and a second contact.
- a PA power cell 325 is thermally connected to the substrate 301 using a thermal bump 321 .
- the power cell 325 is electrically insulated from said substrate 301 .
- the power cell 325 has a first power cell bump 311 and a second power cell bump 309 as pathways for I/O functions.
- a first insulator 319 mounted on substrate 301 supporting a second MEM 327 above the substrate 301 .
- the second MEM has a first connection 315 and a second connection 317 .
- the first connection and the second connection are located on a bottom surface of the second MEM 327 .
- the first and second connection are used for accessing the switching functions of MEM 327 .
- a first conductive via 313 vertically traverses the first insulator 319 and is connected to the first connection 315 from the second MEM 327 .
- This first conductive via 313 is further connected to a first conductor 337 .
- the first conductor is insulated from substrate 301 by a first insulating layer 333 .
- the first conductor 337 is further connected to the first power cell bump 311 .
- a second conductor 335 is insulated from the substrate 301 by a second insulating layer 331 .
- the second conductor 335 is connected to a second conductive via 307 .
- the second conductive via 307 traverses vertically a second insulator 339 .
- the second conductive via 307 is connected to a first metal member 305 .
- the first metal member 305 is formed over the upper surface of the second insulator 339 and connected to a first input to the first MEM switch 329 .
- a second metal member 303 is connected to the second contact of the first MEM switch 329 .
- the second metal member is formed over the upper surface of a third insulator 323 .
- the third insulator 323 is positioned over substrate 301 .
- the first MEM and the second MEM are formed on a choice of substrates.
- Substrates are Gallium Arsenide, Silicon Germanium, Silicon on Insulator, or Silicon on Sapphire.
- the first MEM is also connected to one or more matching networks. These networks are used for matching radio frequency power flowing out of and to the PA power cell 325 .
- the first metal member 305 or the second metal member 303 are formed as coplanar waveguide having a characteristic impedance suitable for the circuit at hand. Typically the impedance is 50 ohms.
- FIG. 4 shows a MEM, a typical multilayer switching assembly for switching a high frequency signal using the principles of this invention.
- This assembly comprises a MEMS structure 410 on a SiGe substrate.
- the MEMS structure has a first terminal 420 , a second terminal 428 , a third terminal 430 , and a fourth terminal 418 .
- Also provided is a first control input 412 , a second control input 416 , a third control input 432 , and a fourth control input 426 .
- the high frequency signal presented to said first terminal 420 can be connected from said first terminal 420 to either said second terminal 428 or said fourth terminal 418 in response to a control signal applied to said first control input 412 and said second control input 416 .
- Control terminal 412 is connected to control terminal 432 using a bond wire (bond wire not shown for clarity).
- control terminal 416 is connected to control terminal 426 using a bond wire.
- the control signal presented to 416 and 426 is always logically opposite to that presented to 432 and 412 .
- the MEMS structure 410 is formed on an upper surface of a substrate.
- a first descender 434 made of a conductive material, traverses the first insulating layer 319 and and is connected to (signal) conductor 337 , as shown in FIG. 3.
- First descender 434 is also connected to first terminal 420 .
- First descender 434 is enveloped at a distance by a first conductive shield 402 .
- This conductive shield 402 traverses vertically insulating layer 319 in the case of MEMS 327 .
- a conductive shield traverses insulator 339 .
- Conductive shield 402 is typically connected to ground.
- Shield 402 is shown to be made of multiple conductive vias vertically traversing the insulating layer. These vias are arranged in a circular pattern, as exemplified in 402 and 408 , thus forming the external sheath of a coaxial structure.
- the distance between descender 434 and shield 402 is chosen based on insulating material characteristics, for a specific impedance of the coaxial structure to be presented by said first descender to the high frequency signal. This impedance is typically 50 ohms at millimeter wave operating frequencies.
- a first coplanar waveguide (CPW) 404 is connected to the second terminal 428 .
- This coplanar waveguide is positioned on the upper surface 500 of the first insulating layer 510 .
- the first coplanar waveguide presents the typical 50 ohm specific impedance to the high frequency signal.
- a second coplanar waveguide 406 is connected to the third terminal 430 .
- This second coplanar waveguide is also positioned on the upper surface of insulating layer 339 or 323 .
- the second coplanar waveguide also presents a 50 ohm specific impedance to the high frequency signal.
- Control signals are delivered to first control 412 using a control conductor, not shown, typically from digital control circuits 202 .
- the disclosed structures are not intended to be so limited.
- flip chip power cells are shown, the same principle can be applied to low power signals to be processed by an analog entity.
- multiple RF signals can be routed to delay lines or A/D converters.
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
- Micromachines (AREA)
- Amplifiers (AREA)
Abstract
Description
- 1. Field of Invention
- This invention is in the field of re-configurable hybrid assemblies on low loss substrates.
- 2. Description of the Related Art
- Monolithic Integrated Circuits (MMIC) technology is a technology supporting many of the present generation of military and commercial radio frequency sensors and communication applications. MMICs include active devices, such as Field Effect Transistors and bipolar transistors, passive elements such as MIM capacitors, thin film and bulk resistors and inductors integrated on a single semi-insulating Gallium Arsenide substrate. Circuit performance and topology is generally fixed at the time of manufacture, typically using “static” impedance matching networks to interconnect various elements. This static approach limits a circuit to a single function, precludes its re-configuration, restricts its use for new modes, functions, operations and bandwidth. This inability to adapt to new configurations in real time to new requirements limits system performance, decreases system mean time between failure as well as useful operating lifetime, and flexibility.
- Micro-Electro-Mechanical Systems (MEMS) is the integration of mechanical elements, sensors, actuators, and electronics on a common substrate through the utilization of microfabrication technology. While typical electronics elements such as transistors are fabricated using integrated circuit (IC) process sequences (e.g., CMOS, Bipolar, or BICMOS processes), micromechanical MEMS structures are fabricated using process compatible micromachining processes that selectively etch away parts of the silicon wafer or add new structural layers to form the mechanical and electromechanical devices.
- An example of a MEMS structure having a bidirectional rotating member having two positions is described in U.S. Pat. No. 6,072,686, incorporated herein by reference in its entirety.
- Another example of a MEMS structure for microwave (millimeter wave) applications is described in U.S. Pat. No. 6,046,659, incorporated herein by reference in its entirety.
- A
first MEM 329 having a first contact and a second contact is mounted on asubstrate 301. APA power cell 325 is thermally connected to thesame substrate 301 using athermal bump 321. Thepower cell 325 is electrically insulated from thesubstrate 301. Thepower cell 325 has a firstpower cell bump 311 and a secondpower cell bump 309 as pathways for I/O functions. - A
first insulator 319 is mounted onsubstrate 301 supporting asecond MEM 327 above thesubstrate 301. Thesecond MEM 327 has afirst connection 315 and asecond connection 317. The first connection and the second connection are located on a bottom surface of thesecond MEM 327. - A first conductive via 313 vertically traverses the
first insulator 319 and is connected to thefirst connection 315 from thesecond MEM 327. This first conductive via 313 is further connected to afirst conductor 337. The first conductor is insulated fromsubstrate 301 by a firstinsulating layer 333. Thefirst conductor 337 is further connected to the firstpower cell bump 311. - A
second conductor 335 is insulated from thesubstrate 301 by a secondinsulating layer 331. Thesecond conductor 335 is connected to a second conductive via 307. The second conductive via 307 traverses vertically asecond insulator 339. The second conductive via 307 is connected to afirst metal member 305. Thefirst metal member 305 is formed over the upper surface of thesecond insulator 339 and connected to a first input to thefirst MEM switch 329. - A
second metal member 303 is connected to the second contact of thefirst MEM switch 329. The second metal member is formed over the upper surface of athird insulator 323. Thethird insulator 323 is positioned oversubstrate 301. - In the Drawing:
- FIG. 1 is an exemplary network of the prior art presenting a variable impedance varied using non-linearities in transistors;
- FIG. 2 is an exemplary network of the present invention for connecting matching networks to flip chip power cells using MEM switches;
- FIG. 3 is an exemplary vertical layout of the PA power cells and MEM switches over a substrate;
- FIG. 4 is an exemplary layout of a MEM switch for use with the present invention.
- This invention introduces the notion of using MEMS switches to reconfigure the topology of radio frequency matching network components to achieve added functions and characteristics. The approach for reducing the attenuation or non-linearity of switching elements of the prior art is to use MEMS type structures having low insertion loss to perform the switching function.
- As shown in FIG. 1, in the prior art, field effect transistors or bipolar transistors were biased in various ways to present a change in impedance presented by the network at various operating points of the transistors. For example, a signal applied to the input of
capacitor 101 could be shunted toground using capacitor 111 andbipolar transistor 109. The remaining signal passes throughcapacitor 103 towards the output. A change in impedance to the signal can be commanded by activatingtransistor 109. Similarly,capacitor 105 can be shunted to ground on command from control CONT2. Thus, as shown in FIG. 1, in the prior art, by changing the bias point of eithertransistor 109 orFET 107, the impedance between signal input and ground can be changed. Furthermore, the bias point oftransistor 109 can be selectively chosen to change the impedance seen bycapacitor 111 to ground. Withtransistor 109 not in saturation,capacitor 111 sees a current sink to ground, the current sink value determined by the bias current applied to control CONT1. Similarly, control CONT2 forFET 107 depending on voltage value, controls the characteristic ofFET 107 connectingcapacitor 105 to ground. In a 109 and 107 could be full ON or “OFF”. In an analog environment,digital environment transistors 109 and 107 can be viewed as variable elements.transistors -
107 and 109 are however less than ideal for the application. When in saturation,Transistors transistor 109 has a Vce voltage across it, inducing losses. Similarly, FET 107, when in saturation still presents an resistive impedance betweencapacitor 105 and ground. - This invention calls for the use of low capacitance and low ON resistance MEMS switches to reconfigure the matching networks used in high frequency circuits. These MEMS switches are used in conjunction with flip chip technology on a low loss substrate. A typical MEMS switch is shown in FIG. 4 and is described below with respect to FIG. 4.
- FIG. 2 shows the use of MEM switches connecting matching networks to flip chip power cells. On
substrate 200 are mounteddigital control circuits 202 as well as Flip 204, 206, 208 and 210.chip power cells - MEM switch and
212, 214, 216, 218 processes high frequency analog signals presented to the flip chip power cells. For example,matching network MEM switch 220, connected toMEM switch 222 can route RF signals to various matching networks attached to contact pads such ascontact pad 234. - Similarly,
MEM switch 224 is connected toMEM switch 226 allowing signal routing.MEM switch 228 controls switches signals applied to or fromcontact pad 230. - In the same
manner MEM switch 232 switches signals fromcontact pad 234. Another example isMEM switch 238 andcontact pad 236. Yet another path iscontact pad 240 signals routed usingMEM switch 242. - FIG. 3 shows the vertical crossection of the adaptable assembly described in FIG. 2. This assembly is for use at high frequencies and has a
substrate 301, afirst MEM 329 mounted on said substrate having a first contact and a second contact. - A
PA power cell 325 is thermally connected to thesubstrate 301 using athermal bump 321. Thepower cell 325 is electrically insulated from saidsubstrate 301. Thepower cell 325 has a firstpower cell bump 311 and a secondpower cell bump 309 as pathways for I/O functions. - A
first insulator 319 mounted onsubstrate 301 supporting asecond MEM 327 above thesubstrate 301. The second MEM has afirst connection 315 and asecond connection 317. The first connection and the second connection are located on a bottom surface of thesecond MEM 327. The first and second connection are used for accessing the switching functions ofMEM 327. - A first conductive via 313 vertically traverses the
first insulator 319 and is connected to thefirst connection 315 from thesecond MEM 327. This first conductive via 313 is further connected to afirst conductor 337. The first conductor is insulated fromsubstrate 301 by a first insulatinglayer 333. - The
first conductor 337 is further connected to the firstpower cell bump 311. - A
second conductor 335 is insulated from thesubstrate 301 by a second insulatinglayer 331. Thesecond conductor 335 is connected to a second conductive via 307. The second conductive via 307 traverses vertically asecond insulator 339. The second conductive via 307 is connected to afirst metal member 305. Thefirst metal member 305 is formed over the upper surface of thesecond insulator 339 and connected to a first input to thefirst MEM switch 329. - A
second metal member 303 is connected to the second contact of thefirst MEM switch 329. The second metal member is formed over the upper surface of athird insulator 323. Thethird insulator 323 is positioned oversubstrate 301. - The first MEM and the second MEM are formed on a choice of substrates. Substrates are Gallium Arsenide, Silicon Germanium, Silicon on Insulator, or Silicon on Sapphire.
- The first MEM is also connected to one or more matching networks. These networks are used for matching radio frequency power flowing out of and to the
PA power cell 325. - The
first metal member 305 or thesecond metal member 303 are formed as coplanar waveguide having a characteristic impedance suitable for the circuit at hand. Typically the impedance is 50 ohms. - FIG. 4 shows a MEM, a typical multilayer switching assembly for switching a high frequency signal using the principles of this invention. This assembly comprises a
MEMS structure 410 on a SiGe substrate. The MEMS structure has afirst terminal 420, asecond terminal 428, athird terminal 430, and afourth terminal 418. Also provided is afirst control input 412, asecond control input 416, athird control input 432, and afourth control input 426. Using theMEMS structure 410, the high frequency signal presented to saidfirst terminal 420 can be connected from saidfirst terminal 420 to either saidsecond terminal 428 or saidfourth terminal 418 in response to a control signal applied to saidfirst control input 412 and saidsecond control input 416.Control terminal 412 is connected to control terminal 432 using a bond wire (bond wire not shown for clarity). Similarly control terminal 416 is connected to control terminal 426 using a bond wire. The control signal presented to 416 and 426 is always logically opposite to that presented to 432 and 412. - The
MEMS structure 410 is formed on an upper surface of a substrate. Afirst descender 434, made of a conductive material, traverses the first insulatinglayer 319 and and is connected to (signal)conductor 337, as shown in FIG. 3.First descender 434 is also connected tofirst terminal 420. -
First descender 434 is enveloped at a distance by a firstconductive shield 402. Thisconductive shield 402 traverses vertically insulatinglayer 319 in the case ofMEMS 327. ForMEMS 329, a conductive shield traversesinsulator 339. -
Conductive shield 402 is typically connected to ground.Shield 402 is shown to be made of multiple conductive vias vertically traversing the insulating layer. These vias are arranged in a circular pattern, as exemplified in 402 and 408, thus forming the external sheath of a coaxial structure. The distance betweendescender 434 and shield 402 is chosen based on insulating material characteristics, for a specific impedance of the coaxial structure to be presented by said first descender to the high frequency signal. This impedance is typically 50 ohms at millimeter wave operating frequencies. - A first coplanar waveguide (CPW) 404 is connected to the
second terminal 428. This coplanar waveguide is positioned on the upper surface 500 of the first insulating layer 510. The first coplanar waveguide presents the typical 50 ohm specific impedance to the high frequency signal. - Similarly, a second
coplanar waveguide 406 is connected to thethird terminal 430. This second coplanar waveguide is also positioned on the upper surface of insulating 339 or 323. The second coplanar waveguide also presents a 50 ohm specific impedance to the high frequency signal.layer - Control signals are delivered to
first control 412 using a control conductor, not shown, typically fromdigital control circuits 202. - All references cited in this document are incorporated herein by reference in their entirety.
- Although presented in exemplary fashion employing specific embodiments, the disclosed structures are not intended to be so limited. For example, while flip chip power cells are shown, the same principle can be applied to low power signals to be processed by an analog entity. For example, multiple RF signals can be routed to delay lines or A/D converters.
- Those skilled in the art will also appreciate that numerous changes and modifications could be made to the embodiment described herein without departing in any way from the invention. These changes and modifications and all obvious variations of the disclosed embodiment are intended to be embraced by the claims to the limits set by law.
Claims (8)
Priority Applications (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/294,518 US6728432B1 (en) | 2002-11-13 | 2002-11-13 | Highly adaptable heterogeneous power amplifier IC micro-systems using flip chip and micromechanical technologies on low loss substrates |
| DE60317923T DE60317923T2 (en) | 2002-11-13 | 2003-11-13 | HIGH-ADAPTIVE HETEROGEN POWER AMPLIFIER THROUGH FLIP-CHIP AND MICRO-ELECTRO-MECHANICAL (MEM) SYSTEMS ON LOSS-FREE SUBSTRATES |
| EP03786761A EP1561243B1 (en) | 2002-11-13 | 2003-11-13 | Highly adaptable heterogeneous power amplifier ic micro-systems using flip chip and microelectromechanical technologies on low loss substrates |
| PCT/US2003/036629 WO2004044986A1 (en) | 2002-11-13 | 2003-11-13 | Highly adaptable heterogeneous power amplifier ic micro-systems using flip chip and microelectromechanical technologies on low loss substrates |
| KR1020057008526A KR100677793B1 (en) | 2002-11-13 | 2003-11-13 | Highly adaptive assembly using flip chip and microelectromechanical techniques on low loss substrates |
| DK03786761T DK1561243T3 (en) | 2002-11-13 | 2003-11-13 | Highly adaptive heterogeneous power amplifier IC microsystems using flip chip and microelectromechanical technologies on low-loss substrates |
| ES03786761T ES2294352T3 (en) | 2002-11-13 | 2003-11-13 | VERY ADAPTABLE HETEROGENEO POWER AMPLIFIER WITH MICRO INTEGRATED CIRCUIT SYSTEMS USING FLIP CHIP MICROPASTILLA AND MICRO ELECTROMECHANICAL TECHNOLOGIES IN LOW LOST SUBSTRATE. |
| AU2003295565A AU2003295565B2 (en) | 2002-11-13 | 2003-11-13 | Highly adaptable heterogeneous power amplifier IC micro-systems using flip chip and microelectromechanical technologies on low loss substrates |
| NO20051946A NO20051946L (en) | 2002-11-13 | 2005-04-21 | Highly adaptable heterogeneous power amplifier IC microsystems using flipchart and microelectromechanical technologies on low-loss substrates |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/294,518 US6728432B1 (en) | 2002-11-13 | 2002-11-13 | Highly adaptable heterogeneous power amplifier IC micro-systems using flip chip and micromechanical technologies on low loss substrates |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US6728432B1 US6728432B1 (en) | 2004-04-27 |
| US20040091197A1 true US20040091197A1 (en) | 2004-05-13 |
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| US10/294,518 Expired - Lifetime US6728432B1 (en) | 2002-11-13 | 2002-11-13 | Highly adaptable heterogeneous power amplifier IC micro-systems using flip chip and micromechanical technologies on low loss substrates |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6728432B1 (en) |
| EP (1) | EP1561243B1 (en) |
| KR (1) | KR100677793B1 (en) |
| AU (1) | AU2003295565B2 (en) |
| DE (1) | DE60317923T2 (en) |
| DK (1) | DK1561243T3 (en) |
| ES (1) | ES2294352T3 (en) |
| NO (1) | NO20051946L (en) |
| WO (1) | WO2004044986A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050184836A1 (en) * | 2004-02-20 | 2005-08-25 | Chia-Shing Chou | Microelectromechanical device having a common ground plane layer and a set of contact teeth and method for making the same |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7605477B2 (en) * | 2007-01-25 | 2009-10-20 | Raytheon Company | Stacked integrated circuit assembly |
| CN105914445B (en) * | 2016-05-09 | 2019-04-19 | 中国科学院上海微系统与信息技术研究所 | RF coplanar waveguide element based on silicon-on-insulator substrate and method for fabricating the same |
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| US5719073A (en) * | 1993-02-04 | 1998-02-17 | Cornell Research Foundation, Inc. | Microstructures and single mask, single-crystal process for fabrication thereof |
| US5761350A (en) * | 1997-01-22 | 1998-06-02 | Koh; Seungug | Method and apparatus for providing a seamless electrical/optical multi-layer micro-opto-electro-mechanical system assembly |
| US6607934B2 (en) * | 2000-11-18 | 2003-08-19 | Lenghways Technology Co., Ltd. | Micro-electromechanical process for fabrication of integrated multi-frequency communication passive components |
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| US5808527A (en) * | 1996-12-21 | 1998-09-15 | Hughes Electronics Corporation | Tunable microwave network using microelectromechanical switches |
| US6072686A (en) * | 1998-12-11 | 2000-06-06 | The Aerospace Corporation | Micromachined rotating integrated switch |
| US6232841B1 (en) * | 1999-07-01 | 2001-05-15 | Rockwell Science Center, Llc | Integrated tunable high efficiency power amplifier |
| US6667873B2 (en) * | 2001-03-27 | 2003-12-23 | The United States Of America As Represented By The Secretary Of The Air Force | Adaptive manifold |
-
2002
- 2002-11-13 US US10/294,518 patent/US6728432B1/en not_active Expired - Lifetime
-
2003
- 2003-11-13 AU AU2003295565A patent/AU2003295565B2/en not_active Ceased
- 2003-11-13 EP EP03786761A patent/EP1561243B1/en not_active Expired - Lifetime
- 2003-11-13 KR KR1020057008526A patent/KR100677793B1/en not_active Expired - Lifetime
- 2003-11-13 ES ES03786761T patent/ES2294352T3/en not_active Expired - Lifetime
- 2003-11-13 WO PCT/US2003/036629 patent/WO2004044986A1/en not_active Ceased
- 2003-11-13 DK DK03786761T patent/DK1561243T3/en active
- 2003-11-13 DE DE60317923T patent/DE60317923T2/en not_active Expired - Lifetime
-
2005
- 2005-04-21 NO NO20051946A patent/NO20051946L/en not_active Application Discontinuation
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5719073A (en) * | 1993-02-04 | 1998-02-17 | Cornell Research Foundation, Inc. | Microstructures and single mask, single-crystal process for fabrication thereof |
| US5761350A (en) * | 1997-01-22 | 1998-06-02 | Koh; Seungug | Method and apparatus for providing a seamless electrical/optical multi-layer micro-opto-electro-mechanical system assembly |
| US6607934B2 (en) * | 2000-11-18 | 2003-08-19 | Lenghways Technology Co., Ltd. | Micro-electromechanical process for fabrication of integrated multi-frequency communication passive components |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050184836A1 (en) * | 2004-02-20 | 2005-08-25 | Chia-Shing Chou | Microelectromechanical device having a common ground plane layer and a set of contact teeth and method for making the same |
| US7101724B2 (en) * | 2004-02-20 | 2006-09-05 | Wireless Mems, Inc. | Method of fabricating semiconductor devices employing at least one modulation doped quantum well structure and one or more etch stop layers for accurate contact formation |
Also Published As
| Publication number | Publication date |
|---|---|
| AU2003295565B2 (en) | 2005-07-21 |
| KR20050086582A (en) | 2005-08-30 |
| AU2003295565A1 (en) | 2004-06-03 |
| US6728432B1 (en) | 2004-04-27 |
| DE60317923D1 (en) | 2008-01-17 |
| DE60317923T2 (en) | 2008-11-13 |
| WO2004044986A9 (en) | 2004-11-11 |
| NO20051946L (en) | 2005-04-21 |
| DK1561243T3 (en) | 2008-01-28 |
| WO2004044986A1 (en) | 2004-05-27 |
| ES2294352T3 (en) | 2008-04-01 |
| KR100677793B1 (en) | 2007-02-02 |
| EP1561243B1 (en) | 2007-12-05 |
| EP1561243A1 (en) | 2005-08-10 |
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