[go: up one dir, main page]

US20030145781A1 - Process and apparatus for producing a single crystal of semiconductor material - Google Patents

Process and apparatus for producing a single crystal of semiconductor material Download PDF

Info

Publication number
US20030145781A1
US20030145781A1 US10/350,570 US35057003A US2003145781A1 US 20030145781 A1 US20030145781 A1 US 20030145781A1 US 35057003 A US35057003 A US 35057003A US 2003145781 A1 US2003145781 A1 US 2003145781A1
Authority
US
United States
Prior art keywords
melt
vessel
granules
melting
single crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US10/350,570
Inventor
Wilfried von Ammon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siltronic AG
Original Assignee
Wacker Siltronic AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wacker Siltronic AG filed Critical Wacker Siltronic AG
Assigned to WACKER SILTRONIC AG reassignment WACKER SILTRONIC AG ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: VON AMMON, WILFRIED, DR.
Publication of US20030145781A1 publication Critical patent/US20030145781A1/en
Assigned to SILTRONIC AG reassignment SILTRONIC AG CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). Assignors: Wacker Siltronic Gesellschaft Fur Halbleitermaterialien Aktiengesellschaft
Priority to US12/242,080 priority Critical patent/US7655089B2/en
Priority to US12/640,755 priority patent/US8221550B2/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/08Single-crystal growth by zone-melting; Refining by zone-melting adding crystallising materials or reactants forming it in situ to the molten zone
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/08Single-crystal growth by zone-melting; Refining by zone-melting adding crystallising materials or reactants forming it in situ to the molten zone
    • C30B13/10Single-crystal growth by zone-melting; Refining by zone-melting adding crystallising materials or reactants forming it in situ to the molten zone with addition of doping materials
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/14Crucibles or vessels
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/16Heating of the molten zone
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B13/00Single-crystal growth by zone-melting; Refining by zone-melting
    • C30B13/28Controlling or regulating
    • C30B13/30Stabilisation or shape controlling of the molten zone, e.g. by concentrators, by electromagnetic fields; Controlling the section of the crystal
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1024Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032Seed pulling
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1024Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032Seed pulling
    • Y10T117/1052Seed pulling including a sectioned crucible [e.g., double crucible, baffle]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1024Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032Seed pulling
    • Y10T117/1056Seed pulling including details of precursor replenishment
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10Apparatus
    • Y10T117/1024Apparatus for crystallization from liquid or supercritical state
    • Y10T117/1032Seed pulling
    • Y10T117/1068Seed pulling including heating or cooling details [e.g., shield configuration]

Definitions

  • the present invention relates to a process for producing a single crystal of semiconductor material by means of a method which differs from the known zone pulling (Fz process) substantially because polycrystalline granules, instead of a polycrystalline stock ingot, supply the material for the growth of the single crystal.
  • the present invention also relates to an apparatus which is suitable for the production of the single crystal.
  • a process of the same general nature is already known from DE 19538020 A1.
  • the granules are melted in a vessel and fed to a melt which is located on the growing single crystal.
  • the growth of the single crystal is maintained by an equilibrium between molten granules fed to the melt and solidifying fractions of the melt.
  • the present invention provides a process for producing a single crystal of semiconductor material, in which fractions of a melt, which is kept in liquid form by a pulling coil, solidify on a seed crystal to form the growing single crystal, and granules are melted in order to maintain the growth of the single crystal, wherein the melting granules are passed to the melt after a delay.
  • the present invention also provides an apparatus for producing a single crystal, comprising a vessel which is arranged above the growing single crystal and a conveyor device for feeding granules into the vessel, and a melting coil for melting the granules, and a pulling coil for maintaining a melt on the growing single crystal, the melting granules passing through openings in the vessel and the pulling coil to the melt, so as to form a melt neck, and solidifying fractions of the melt maintaining the growth of the single crystal, wherein the vessel has a device which delays mixing of the molten granules with the melt.
  • the process of the invention makes it possible to produce single crystals with the characteristics of zone-pulled material at costs which are well below the costs of Fz material.
  • the polycrystalline granules which supply the raw material for the crystal growth are significantly less expensive than the polycrystalline stock ingots required for the Fz process.
  • polycrystalline stock ingots are rarely available in a quality and size which makes it possible to produce single crystals with diameters of 200 mm and above. Yet even if this were possible, the process for pulling single crystals with such diameters can only be controlled with difficulty. This is on account of the masses which have to be simultaneously melted and crystallized. The consequence is low yields of dislocation-free single crystals, which are not economically competitive.
  • High-frequency coils are in each case used to melt the granules and to pull the single crystal. It is particularly advantageous if the pulling coil and the melting coil are inductively decoupled. This means that the energy provided by the pulling coil is used to control the growth of the single crystal but not to melt the granules. Decoupling of this nature can be achieved simply by leaving sufficient distance between the pulling coil and the base of the vessel to which the granules are fed.
  • a melt is produced on a seed crystal in a similar manner to that which is also customary in the Fz process.
  • the volume of the melt which initially only comprises a molten drop, is increased as a result of the melting of the semiconductor material.
  • fractions of the melt are made to solidify, so as to form a growing single crystal, by slowly lowering the seed crystal with rotation.
  • the single crystal is allowed to grow into a cone. Later, the diameter of the single crystal is kept constant, with the result that most of the single crystal acquires a cylindrical appearance.
  • the semiconductor material which is required for the production of single crystals with diameters of 200 mm and above, in particular during the pulling of the cylindrical section, is supplied substantially by polycrystalline granules which are melted with the aid of the melting coil.
  • the melting granules are fed to the melt with a delay.
  • a gas stream consisting, for example, of inert gas, such as argon, to be fed from the bottom upward through the pulling coil during the production of the single crystal.
  • FIGS. 1 to 4 show preferred embodiments of the apparatus according to the invention.
  • FIG. 5 shows a plan view of a melting coil which is particularly suitable for use in an arrangement as shown in FIG. 4.
  • silicon is mentioned as a particularly preferred semiconductor material.
  • a pot-like vessel 1 which can rotate and can be displaced in the axial direction, positioned above a pulling coil 2 .
  • the vessel consists of SiO 2 , for example quartz, and, like the pulling coil, has a circular opening 3 in the center. Its interior is divided into a plurality of, preferably at least three, regions, which form a system of passages, by concentric quartz walls 4 .
  • the individual regions are connected to one another by openings 6 in such a way that the distance from the outer region to the central opening 3 is as long as possible and, for example, is in meandering form.
  • the coil turns are covered with covers 12 made from quartz in order to avoid contact between the granules and the metallic surface of the melting coil.
  • the quartz walls 4 are designed in such a way that the granules 11 supplied via a conveying device 10 cannot be scattered into the inner regions.
  • the ingot can rotate and can be displaced in both the radial and axial directions.
  • the axis of rotation of the vessel 1 is tilted through a small angle ⁇ , thus ensuring that the ingot is always wetted at the same place relative to the pulling coil 2 .
  • Radial displacement of the pulling coil makes it possible to control the way in which molten material runs out of a pool of melt 17 in the vessel 1 to the melt 8 .
  • the space in which the single crystal is pulled should as far as possible be separated in a dustproof manner from the space in which the vessel is located. It is therefore preferable for the sickle-shaped gap between the ingot 7 and the edge of the central opening 3 in the vessel to be as narrow as possible, and for a gas stream to be directed upward through the gap, making it difficult for dust to penetrate into the pulling space.
  • Production of a single crystal begins by first of all melting a small quantity of silicon in the vessel 1 and keeping it in liquid form. In this phase, the ingot 7 is not yet in contact with the pool of melt 17 which has been produced. Then, the ingot is moved downward through the central opening 3 in the vessel and the inner hole in the pulling coil. The seed pulling is commenced in a known way as a result of a molten droplet being produced on the lower tip of the ingot with the aid of the pulling coil 2 and a seed crystal being attached to this molten droplet. At this time, the ingot still has the function of the stock ingot used in the Fz process.
  • the extent of the axial displacement of the vessel 1 relative to the melting coil 5 regulates the extent to which the HF field of this coil is introduced into the molten granules.
  • the melting characteristics of the granules can be influenced in this way and also by the choice of the HF power. Displacement of the vessel relative to the pulling coil may also be advantageous for the control characteristics. If the distance from the pulling coil becomes great, energy is no longer introduced into the pool of molten granules from below, and silicon freezes at the bottom of the vessel.
  • the shape of the pulling coil is additionally modified in such a way that an upward bulge is formed integrally on the wetting side where the pulling coil adjoins the ingot which has been wetted with liquid silicon, at this location the locally higher introduction of energy means that no silicon freezes on the base of the vessel. Therefore, the molten granules can continue to run down to the melt without defects, while at the same time the direct contact surface between the molten granules and the base of the vessel consisting of SiO 2 is minimized by the layer of frozen silicon. This makes it possible to considerably reduce the introduction of oxygen into the melt and the formation of SiO.
  • the vessel 1 comprises a plate of silicon which in the center has a tubular opening 3 which is created by a section of pipe 13 which is drawn downward.
  • the plate is mounted rotatably, preferably on three wheels 14 which support the plate at the edge and also serve as a rotary drive.
  • the plate 1 and the integrally molded section of pipe 13 are protected against direct introduction of the HF field of the pulling coil 2 from below and from the side by a cooling device 15 .
  • Device 15 can be for example a water-cooled metal plate, so that melting of the lower side of the plate 1 and of the outer side of the section of pipe by the pulling coil is prevented.
  • the metal plate acts as a heat sink which dissipates the heat generated by the melting coil 5 in the plate.
  • the melting coil is arranged above the plate.
  • the central opening 3 in the plate and the inner side of the integrally molded section of pipe 13 are heated by an additional energy source, for example a radiation heating means, which is illustrated as a lens 16 for the purposes of simplification, in order to prevent freezing of the molten granules flowing to the melt and of the melt neck 18 which forms.
  • the thermal gradient which builds up in the plate and the integrally formed section of pipe ensures that a stable pool of melt 17 is formed on the top side of the plate and the inner side of the section of pipe remains in liquid form, while the base of the plate and the outer side of the integrally formed section of pipe remain in solid form.
  • the section of pipe 13 is completely closed off at the bottom by liquid silicon of the melt neck 18 .
  • Concentric quartz rings 4 which, as in the embodiment shown in FIG.
  • the embodiment shown in FIG. 2 has the advantage that the surface area of contact with quartz and therefore the introduction of oxygen into the melt 8 is reduced further, and that the melting of the granules 11 and the pulling of the single crystal are completely electromagnetically decoupled.
  • the pulling coil 2 can be optimized purely with a view to the pulling operation. Control also becomes more stable.
  • the inner molten surface of the melt neck 18 at the end of the section of pipe 13 acts as a barrier to individual granules which have not yet completely melted, since they float on the surface until they have melted. It is virtually impossible for such particles to reach the growth front of the single crystal and cause dislocations in the crystal lattice.
  • a further advantage is that the space holding the growing single crystal 9 can be very successfully sealed in a dustproof manner from the space holding the plate 1 , since the two spaces are only connected by a narrow annular gap between the metal plate 15 and the plate 1 .
  • the dustproof separation of the spaces can be improved even further by a protective shield 19 .
  • the production of a single crystal begins by first of all melting a closure at the lower end of the section of pipe and by a seed crystal being fitted and pulled into a cone in the manner which has already been described.
  • the closure used may be a piece of silicon which has been inserted into the section or pipe or the melt neck which solidified after the pulling of a previously produced single crystal. In this respect, the closure takes over the function of the ingot 7 shown in FIG. 1.
  • the upper sides of the plate 1 and the closure of the tubular central opening are melted with the aid of the melting coil 5 and the radiation heating means 16 , and further molten material is fed to the growing single crystal.
  • FIG. 3 which is similar to the apparatus shown in FIG. 2, quartz walls which are in contact with the pool of melt are completely dispensed with, so that there is no oxygen doping of the single crystal or formation of SiO.
  • the melting coil 5 in the region above the edge of the tubular opening, is designed in such a way that at that location an increase in height 20 is produced on the surface of the plate 1 , forming a barrier. If the melting coil is moved closer to the pool of melt or the HF power is increased, molten material is displaced by the repelling electromagnetic force and flows over the barrier into the tubular opening 3 .
  • the barrier acts as a filter which blocks solid semiconductor material.
  • the melting coil may be designed in such a way that a plurality of barriers in series are formed on the plate.
  • a single crystal is produced in a similar manner to the procedure which has already been described in connection with the embodiment shown in FIG. 2.
  • the melt is built up again at locations where molten material leaves the region of influence of the connecting piece.
  • the molten material which is situated on the plate between the separated turns of the melting coil bulges upward on account of the relatively weak electromagnetic force active there, and ultimately solidifies again.
  • a suitably shaped melting coil is illustrated in FIG. 5. It has a plurality of concentric turns 22 , the distances between the turns on the inner side being greater than the distances between the turns on the outer side.
  • the turns are connected to one another by connecting pieces 23 .
  • the hatched areas between the turns which lie further apart indicate the presence of webs 21 .
  • a single crystal is produced in a similar manner to the procedure which has already been described in connection with the embodiment shown in FIG. 2.
  • Silicon single crystals which have been produced using the process of the invention make it possible to produce semiconductor wafers with particularly advantageous defect properties.
  • the grown-in defects are smaller than 60 nm even at oxygen concentrations of 3-9*10 17 cm ⁇ 3 , preferably 4-8.5*10 17 cm ⁇ 3 , and particularly preferably 4.5-8*10 17 cm ⁇ 3 , and are therefore easy to eliminate by heat treatment at least in the regions where they could adversely affect electronic components.
  • the single crystals to be additionally doped with nitrogen.
  • a nitrogen concentration of 1*10 13 -6*10 15 , preferably 1*10 14 -4*10 15 is expedient.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

A process for producing a single crystal of semiconductor material, in which fractions of a melt, are kept in liquid form by a pulling coil, solidify on a seed crystal to form the growing single crystal, and granules are melted in order to maintain the growth of the single crystal. The melting granules are passed to the melt after a delay. There is also an apparatus which is suitable for carrying out the process and has a device which delays mixing of the molten granules and of the melt.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the Invention [0001]
  • The present invention relates to a process for producing a single crystal of semiconductor material by means of a method which differs from the known zone pulling (Fz process) substantially because polycrystalline granules, instead of a polycrystalline stock ingot, supply the material for the growth of the single crystal. The present invention also relates to an apparatus which is suitable for the production of the single crystal. [0002]
  • 2. The Prior Art [0003]
  • A process of the same general nature is already known from DE 19538020 A1. The granules are melted in a vessel and fed to a melt which is located on the growing single crystal. The growth of the single crystal is maintained by an equilibrium between molten granules fed to the melt and solidifying fractions of the melt. [0004]
  • SUMMARY OF THE INVENTION
  • It is an object of the present invention to make it possible to produce dislocation-free single crystals, in particular with diameters of 200 mm and above. [0005]
  • The above object is achieved by the present invention which provides a process for producing a single crystal of semiconductor material, in which fractions of a melt, which is kept in liquid form by a pulling coil, solidify on a seed crystal to form the growing single crystal, and granules are melted in order to maintain the growth of the single crystal, wherein the melting granules are passed to the melt after a delay. [0006]
  • The present invention also provides an apparatus for producing a single crystal, comprising a vessel which is arranged above the growing single crystal and a conveyor device for feeding granules into the vessel, and a melting coil for melting the granules, and a pulling coil for maintaining a melt on the growing single crystal, the melting granules passing through openings in the vessel and the pulling coil to the melt, so as to form a melt neck, and solidifying fractions of the melt maintaining the growth of the single crystal, wherein the vessel has a device which delays mixing of the molten granules with the melt. [0007]
  • The process of the invention makes it possible to produce single crystals with the characteristics of zone-pulled material at costs which are well below the costs of Fz material. The polycrystalline granules which supply the raw material for the crystal growth are significantly less expensive than the polycrystalline stock ingots required for the Fz process. In addition, polycrystalline stock ingots are rarely available in a quality and size which makes it possible to produce single crystals with diameters of 200 mm and above. Yet even if this were possible, the process for pulling single crystals with such diameters can only be controlled with difficulty. This is on account of the masses which have to be simultaneously melted and crystallized. The consequence is low yields of dislocation-free single crystals, which are not economically competitive. [0008]
  • Although the process described in the abovementioned DE 19538020 A1 avoids the problems presented by the production and use of polycrystalline stock ingots, it is unsuitable for the production of dislocation-free single crystals. This is because of the particles which originate from the granules. These particles can all too easily reach the interface between the melt and the growing single crystal and end the dislocation-free growth of the single crystal. [0009]
  • This situation is where the present invention achieves these unexpected results by providing that the supply of the granules to the melt be delayed in its movement to the melt. As a result and as far as possible granules can only reach the melt when they have been completely melted. For this purpose, measures are taken to extend the distance over which the melting granules have to travel in order to reach the melt and/or to provide a barrier to these granules which have not yet completely melted. The melting granules preferably have to cover a distance of at least 25 mm, particularly preferably 50 mm, before reaching the melt. Furthermore, the invention is distinguished by the fact that measures which effectively avoid uncontrolled inclusion of oxygen in the single crystal are also provided. On the other hand, controlled amounts of oxygen can be fed to the melt via the growing single crystal, for example by positioning a ring of SiO[0010] 2 on the melt. A suitable ring is described, for example, in U.S. Pat. No. 5,089,082.
  • High-frequency coils are in each case used to melt the granules and to pull the single crystal. It is particularly advantageous if the pulling coil and the melting coil are inductively decoupled. This means that the energy provided by the pulling coil is used to control the growth of the single crystal but not to melt the granules. Decoupling of this nature can be achieved simply by leaving sufficient distance between the pulling coil and the base of the vessel to which the granules are fed. [0011]
  • At the start of the process, a melt is produced on a seed crystal in a similar manner to that which is also customary in the Fz process. The volume of the melt, which initially only comprises a molten drop, is increased as a result of the melting of the semiconductor material. In parallel, fractions of the melt are made to solidify, so as to form a growing single crystal, by slowly lowering the seed crystal with rotation. In a first phase, the single crystal is allowed to grow into a cone. Later, the diameter of the single crystal is kept constant, with the result that most of the single crystal acquires a cylindrical appearance. The semiconductor material which is required for the production of single crystals with diameters of 200 mm and above, in particular during the pulling of the cylindrical section, is supplied substantially by polycrystalline granules which are melted with the aid of the melting coil. The melting granules are fed to the melt with a delay. To keep particles away from the growing single crystal, it is preferably ensured that the space around the vessel is separated in a dustproof manner from the space around the growing single crystal. In addition to structural measures which promote such separation, it is desirable for a gas stream, consisting, for example, of inert gas, such as argon, to be fed from the bottom upward through the pulling coil during the production of the single crystal.[0012]
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • Other objects and features of the present invention will become apparent from the following detailed description considered in connection with the accompanying drawings which disclose several embodiments of the present invention. It should be understood, however, that the drawings are designed for the purpose of illustration only and not as a definition of the limits of the invention. [0013]
  • The invention is described in more detail below on the basis of figures. Identical features are provided with identical reference numerals. [0014]
  • FIGS. [0015] 1 to 4 show preferred embodiments of the apparatus according to the invention.
  • FIG. 5 shows a plan view of a melting coil which is particularly suitable for use in an arrangement as shown in FIG. 4. In the further explanations of the invention, silicon is mentioned as a particularly preferred semiconductor material.[0016]
  • DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
  • In the apparatus shown in FIG. 1, there is a pot-like vessel [0017] 1, which can rotate and can be displaced in the axial direction, positioned above a pulling coil 2. The vessel consists of SiO2, for example quartz, and, like the pulling coil, has a circular opening 3 in the center. Its interior is divided into a plurality of, preferably at least three, regions, which form a system of passages, by concentric quartz walls 4. The individual regions are connected to one another by openings 6 in such a way that the distance from the outer region to the central opening 3 is as long as possible and, for example, is in meandering form. In the regions there are individual or a plurality of parallel-connected turns of a high-frequency coil which is used to melt the granules and therefore serves as melting coil 5. In the outer region, to which the granules 11 are fed, the coil turns are covered with covers 12 made from quartz in order to avoid contact between the granules and the metallic surface of the melting coil. In the outer region, the quartz walls 4 are designed in such a way that the granules 11 supplied via a conveying device 10 cannot be scattered into the inner regions.
  • An ingot [0018] 7 of silicon, at which the molten silicon can run down through the inner hole in the pulling coil 2, to form a melt neck 18, to the melt 8 on top of the growing single crystal 9, projects into the central opening 3 in the vessel. The ingot can rotate and can be displaced in both the radial and axial directions. The axis of rotation of the vessel 1 is tilted through a small angle α, thus ensuring that the ingot is always wetted at the same place relative to the pulling coil 2. Radial displacement of the pulling coil makes it possible to control the way in which molten material runs out of a pool of melt 17 in the vessel 1 to the melt 8.
  • To prevent dust particles from being able to reach the [0019] melt 8, the space in which the single crystal is pulled should as far as possible be separated in a dustproof manner from the space in which the vessel is located. It is therefore preferable for the sickle-shaped gap between the ingot 7 and the edge of the central opening 3 in the vessel to be as narrow as possible, and for a gas stream to be directed upward through the gap, making it difficult for dust to penetrate into the pulling space.
  • Production of a single crystal begins by first of all melting a small quantity of silicon in the vessel [0020] 1 and keeping it in liquid form. In this phase, the ingot 7 is not yet in contact with the pool of melt 17 which has been produced. Then, the ingot is moved downward through the central opening 3 in the vessel and the inner hole in the pulling coil. The seed pulling is commenced in a known way as a result of a molten droplet being produced on the lower tip of the ingot with the aid of the pulling coil 2 and a seed crystal being attached to this molten droplet. At this time, the ingot still has the function of the stock ingot used in the Fz process. First of all, as a result of the ingot being melted further and as a result of the lowering of the seed crystal commencing, a starting cone in single crystal form with a melt of sufficient volume resting on it is produced. Then, the ingot, together with the pulling coil, is displaced synchronously in such a way that the material which has been melted in the vessel comes into contact with the ingot and as a result liquid silicon can move along the ingot to the melt neck 18 and, from there, to the melt 8 on the growing single crystal 9. As the process continues, granules 11 are fed to the vessel according to demand and are melted. The growth of the single crystal is now substantially maintained by molten granules.
  • The extent of the axial displacement of the vessel [0021] 1 relative to the melting coil 5 regulates the extent to which the HF field of this coil is introduced into the molten granules. The melting characteristics of the granules can be influenced in this way and also by the choice of the HF power. Displacement of the vessel relative to the pulling coil may also be advantageous for the control characteristics. If the distance from the pulling coil becomes great, energy is no longer introduced into the pool of molten granules from below, and silicon freezes at the bottom of the vessel. If the shape of the pulling coil is additionally modified in such a way that an upward bulge is formed integrally on the wetting side where the pulling coil adjoins the ingot which has been wetted with liquid silicon, at this location the locally higher introduction of energy means that no silicon freezes on the base of the vessel. Therefore, the molten granules can continue to run down to the melt without defects, while at the same time the direct contact surface between the molten granules and the base of the vessel consisting of SiO2 is minimized by the layer of frozen silicon. This makes it possible to considerably reduce the introduction of oxygen into the melt and the formation of SiO.
  • In the embodiment shown in FIG. 2, the vessel [0022] 1 comprises a plate of silicon which in the center has a tubular opening 3 which is created by a section of pipe 13 which is drawn downward. The plate is mounted rotatably, preferably on three wheels 14 which support the plate at the edge and also serve as a rotary drive. The plate 1 and the integrally molded section of pipe 13 are protected against direct introduction of the HF field of the pulling coil 2 from below and from the side by a cooling device 15. Device 15 can be for example a water-cooled metal plate, so that melting of the lower side of the plate 1 and of the outer side of the section of pipe by the pulling coil is prevented. Moreover, the metal plate acts as a heat sink which dissipates the heat generated by the melting coil 5 in the plate. The melting coil is arranged above the plate. The central opening 3 in the plate and the inner side of the integrally molded section of pipe 13 are heated by an additional energy source, for example a radiation heating means, which is illustrated as a lens 16 for the purposes of simplification, in order to prevent freezing of the molten granules flowing to the melt and of the melt neck 18 which forms. The thermal gradient which builds up in the plate and the integrally formed section of pipe ensures that a stable pool of melt 17 is formed on the top side of the plate and the inner side of the section of pipe remains in liquid form, while the base of the plate and the outer side of the integrally formed section of pipe remain in solid form. The section of pipe 13 is completely closed off at the bottom by liquid silicon of the melt neck 18. Concentric quartz rings 4, which, as in the embodiment shown in FIG. 1, define regions which are connected to one another by openings 6 in such a way that a meandering path is formed, which the molten granules have to overcome before they can reach the melt 8, project into the pool of melt 17 which is formed by partial melting of the upper side of the plate and by melting of the granules. The feed device 10 and the covers 12 have the same functions as in the embodiment shown in FIG. 1. In addition, the innermost cover, by means of a suitable structural design, is now responsible for preventing supplied granules from passing directly into the inner region of the plate.
  • The embodiment shown in FIG. 2 has the advantage that the surface area of contact with quartz and therefore the introduction of oxygen into the [0023] melt 8 is reduced further, and that the melting of the granules 11 and the pulling of the single crystal are completely electromagnetically decoupled. As a result, the pulling coil 2 can be optimized purely with a view to the pulling operation. Control also becomes more stable. Furthermore, the inner molten surface of the melt neck 18 at the end of the section of pipe 13 acts as a barrier to individual granules which have not yet completely melted, since they float on the surface until they have melted. It is virtually impossible for such particles to reach the growth front of the single crystal and cause dislocations in the crystal lattice. A further advantage is that the space holding the growing single crystal 9 can be very successfully sealed in a dustproof manner from the space holding the plate 1, since the two spaces are only connected by a narrow annular gap between the metal plate 15 and the plate 1. The dustproof separation of the spaces can be improved even further by a protective shield 19.
  • The production of a single crystal begins by first of all melting a closure at the lower end of the section of pipe and by a seed crystal being fitted and pulled into a cone in the manner which has already been described. The closure used may be a piece of silicon which has been inserted into the section or pipe or the melt neck which solidified after the pulling of a previously produced single crystal. In this respect, the closure takes over the function of the ingot [0024] 7 shown in FIG. 1. At the same time or subsequently, the upper sides of the plate 1 and the closure of the tubular central opening are melted with the aid of the melting coil 5 and the radiation heating means 16, and further molten material is fed to the growing single crystal. Then, as the demand for molten material increases, additional granules are supplied, so that a stable pool of melt is formed on the upper side of the plate, from which there is a continuous, controllable flow of molten material to the melt on the growing single crystal.
  • In the embodiment shown in FIG. 3, which is similar to the apparatus shown in FIG. 2, quartz walls which are in contact with the pool of melt are completely dispensed with, so that there is no oxygen doping of the single crystal or formation of SiO. Instead, the [0025] melting coil 5, in the region above the edge of the tubular opening, is designed in such a way that at that location an increase in height 20 is produced on the surface of the plate 1, forming a barrier. If the melting coil is moved closer to the pool of melt or the HF power is increased, molten material is displaced by the repelling electromagnetic force and flows over the barrier into the tubular opening 3. If the barrier is sufficiently high, granules which have not yet completely melted are unable to overcome the barrier, on account of the force of gravity. Therefore, the barrier acts as a filter which blocks solid semiconductor material. Of course, the melting coil may be designed in such a way that a plurality of barriers in series are formed on the plate.
  • A single crystal is produced in a similar manner to the procedure which has already been described in connection with the embodiment shown in FIG. 2. [0026]
  • In the embodiment shown in FIG. 4, the concentric quartz walls of the apparatus shown in FIG. 2 have been replaced by [0027] solid webs 21 of silicon which project from the surface of the plate 1. The individual turns of the melting coil 5 are pulled relatively far apart on the inner side, so that between the turns the plate is not melted and webs remain in place. Where the turns of the melting coil are brought together by connecting pieces, however, the webs are melted. Thus openings 6 open up a meandering path between the regions which are separated by webs, and the melting granules 11 have to overcome this path in order to reach the melt 8 on the growing single crystal 9. If the plate is rotated slowly, a web melts as soon as it passes into the region of influence of a connecting piece. At the same time, the melt is built up again at locations where molten material leaves the region of influence of the connecting piece. In this case, the molten material which is situated on the plate between the separated turns of the melting coil bulges upward on account of the relatively weak electromagnetic force active there, and ultimately solidifies again.
  • A suitably shaped melting coil is illustrated in FIG. 5. It has a plurality of [0028] concentric turns 22, the distances between the turns on the inner side being greater than the distances between the turns on the outer side. The turns are connected to one another by connecting pieces 23. The hatched areas between the turns which lie further apart indicate the presence of webs 21.
  • The use of an apparatus shown in FIG. 4 is particularly preferred, since any contact between molten material and quartz parts is completely avoided and it is possible to produce a long, meandering path which reliably prevents granules which have not yet completely melted from being introduced into the melt on the growing single crystal. If the melting coil is divided into a coil for the outer region, into which granules are introduced, and a coil for forming the meandering path, the melting current can be controlled independently of the melting of the granules. This is advantageous in particular in the difficult pulling phase of building up the cone. [0029]
  • A single crystal is produced in a similar manner to the procedure which has already been described in connection with the embodiment shown in FIG. 2. [0030]
  • Silicon single crystals which have been produced using the process of the invention make it possible to produce semiconductor wafers with particularly advantageous defect properties. The grown-in defects are smaller than 60 nm even at oxygen concentrations of 3-9*10[0031] 17 cm−3, preferably 4-8.5*1017 cm−3, and particularly preferably 4.5-8*1017 cm−3, and are therefore easy to eliminate by heat treatment at least in the regions where they could adversely affect electronic components. Furthermore, to further reduce the size of the defects and to excite oxygen precipitation, it is advantageous for the single crystals to be additionally doped with nitrogen. A nitrogen concentration of 1*1013-6*1015, preferably 1*1014-4*1015, is expedient.
  • Accordingly, while a few embodiments of the present invention have been shown and described, it is to be understood that many changes and modifications may be made thereunto without departing from the spirit and scope of the invention as defined in the appended claims. [0032]

Claims (20)

What is claimed is:
1. A process for producing a single crystal of semiconductor material, comprising
maintaining fractions of a melt in a liquid state by a pulling coil;
solidifying said liquid on a seed crystal to form a growing single crystal;
melting granules of semiconductor material in order to maintain growth of the single crystal; and
passing said melting granules to the melt after a delay.
2. The process as claimed in claim 1, comprising
passing the melting granules through a system of passages to the melt.
3. The process as claimed in claim 2,
wherein the melting granules are passed through a meandering system of passages to the melt.
4. The process as claimed in claim 1,
wherein the melting granules have to overcome at least one barrier on the way to the melt.
5. The process as claimed in claim 1,
wherein the melting granules travel a distance of at least 25 mm before reaching the melt.
6. The process as claimed in claim 1, comprising
completely melting the granules; and then feeding said granules to the melt.
7. The process as claimed in claim 1, comprising
effecting the melting of the granules and maintaining of the melt in the liquid state by an inductive energy supply; and
wherein the two operations are inductively decoupled.
8. The process as claimed in claim 1, comprising
melting the granules in an outer region of a vessel which is arranged above the growing single crystal; and
passing said granules to a central opening in the vessel and, from there, to the melt.
9. An apparatus for producing a single crystal, comprising
a vessel which is arranged above a growing single crystal;
a conveyor device for feeding granules into the vessel;
a melting coil for melting the granules;
a pulling coil for maintaining a melt on the growing single crystal;
the melting granules passing through openings in the vessel and the pulling coil to the melt, so as to form a melt neck, and solidifying fractions of the melt maintaining growth of the single crystal; and
said vessel having a device which delays mixing of molten granules and of the melt.
10. The apparatus as claimed in claim 9, further comprising
a protective shield which separates a space around the vessel in a dustproof manner from a space around the growing single crystal.
11. The apparatus as claimed in claim 9, further comprising
covers which are arranged above the melting coil and which the granules strike when they are fed into the vessel.
12. The apparatus as claimed in claim 9, further comprising
a device for cooling the vessel.
13. The apparatus as claimed in claim 12, comprising
a water-cooled metal plate which is separated from the vessel by a narrow gap, thus effecting radiant and convective cooling.
14. The apparatus as claimed in claim 9, comprising
means for mounting the vessel so that it can rotate about an axis of rotation, said vessel consists of quartz and has walls made from quartz which divide the interior of the vessel into concentric regions, these regions being in communication with one another and forming a system of passages which the melting granules have to overcome before they can pass between the opening in the vessel and an ingot of semiconductor material which projects through the opening to reach the melt.
15. The apparatus as claimed in claim 14,
wherein the axis of rotation of the vessel is tilted about an angle α.
16. The apparatus as claimed in claim 9,
wherein the vessel comprises a coolable plate of semiconductor material and has walls made from quartz which divide the interior of the vessel into concentric regions, these regions being in communication with one another and forming a system of passages which the melting granules have to overcome before they can pass through the opening in the vessel, which is designed as a section of pipe, to the melt, and the apparatus comprising a radiation heating means for heating a surface of the melt neck and the semiconductor material flowing through the section of pipe.
17. The apparatus as claimed in claim 9,
wherein the vessel comprises a coolable plate of semiconductor material, which is delimited by an outer edge, and the opening of the vessel is designed as a downwardly directed section of pipe which is connected to a raised inner edge of the plate, the inner edge of the plate forming a barrier which the molten granules have to overcome before they can pass through the opening in the vessel to the melt, and the apparatus comprising a radiation heating means for heating a surface of a melt neck and the semiconductor material flowing through the section of pipe.
18. The apparatus as claimed in claim 9, comprising
means for mounting the vessel so that it can rotate about an axis of rotation, and said vessel comprises a coolable plate of semiconductor material and has webs which are constantly remelted under the influence of the heating coil and the rotation of the vessel and divide the interior of the vessel into concentric regions, these regions being in communication with one another and forming a system of passages which the melting granules have to overcome before they can pass through the opening in the vessel, which is designed as a section of pipe, to the melt, and the apparatus comprising a radiation heating means for heating a surface of the melt neck and the semiconductor material flowing through the section of pipe.
19. A silicon single crystal comprising
an oxygen concentration of 3-9*1017 atoms/cm3 and grown-in defects with a size of less than 60 nm.
20. The silicon single crystal as claimed in claim 19, further comprising a nitrogen concentration of 1*1013-6*1015 atoms/cm3.
US10/350,570 2002-02-01 2003-01-24 Process and apparatus for producing a single crystal of semiconductor material Abandoned US20030145781A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US12/242,080 US7655089B2 (en) 2002-02-01 2008-09-30 Process and apparatus for producing a single crystal of semiconductor material
US12/640,755 US8221550B2 (en) 2002-02-01 2009-12-17 Process and apparatus for producing a single crystal of semiconductor material

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10204178.4 2002-02-01
DE10204178A DE10204178B4 (en) 2002-02-01 2002-02-01 Method and device for producing a monocrystal of semiconductor material

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US12/242,080 Continuation US7655089B2 (en) 2002-02-01 2008-09-30 Process and apparatus for producing a single crystal of semiconductor material

Publications (1)

Publication Number Publication Date
US20030145781A1 true US20030145781A1 (en) 2003-08-07

Family

ID=27634762

Family Applications (3)

Application Number Title Priority Date Filing Date
US10/350,570 Abandoned US20030145781A1 (en) 2002-02-01 2003-01-24 Process and apparatus for producing a single crystal of semiconductor material
US12/242,080 Expired - Fee Related US7655089B2 (en) 2002-02-01 2008-09-30 Process and apparatus for producing a single crystal of semiconductor material
US12/640,755 Expired - Fee Related US8221550B2 (en) 2002-02-01 2009-12-17 Process and apparatus for producing a single crystal of semiconductor material

Family Applications After (2)

Application Number Title Priority Date Filing Date
US12/242,080 Expired - Fee Related US7655089B2 (en) 2002-02-01 2008-09-30 Process and apparatus for producing a single crystal of semiconductor material
US12/640,755 Expired - Fee Related US8221550B2 (en) 2002-02-01 2009-12-17 Process and apparatus for producing a single crystal of semiconductor material

Country Status (3)

Country Link
US (3) US20030145781A1 (en)
JP (1) JP3955826B2 (en)
DE (1) DE10204178B4 (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090223949A1 (en) * 2008-03-10 2009-09-10 Siltronic Ag Induction Heating Coil and Method For Melting Granules Composed Of Semiconductor Material
US20100037815A1 (en) * 2008-08-13 2010-02-18 Siltronic Ag Method For Producing A Single Crystal Of Semiconductor Material
US20110095018A1 (en) * 2009-10-28 2011-04-28 Siltronic Ag Device For Producing A Single Crystal Composed Of Silicon By Remelting Granules
US20110107960A1 (en) * 2009-11-11 2011-05-12 Siltronic Ag Method For Producing A Single Crystal Composed Of Silicon By Remelting Granules
US20110185963A1 (en) * 2010-02-03 2011-08-04 Siltronic Ag Method For Producing A Single Crystal Composed Of Silicon Using Molten Granules
US8021483B2 (en) 2002-02-20 2011-09-20 Hemlock Semiconductor Corporation Flowable chips and methods for the preparation and use of same, and apparatus for use in the methods
US20130199440A1 (en) * 2010-04-13 2013-08-08 Schmid Silicon Technology Gmbh Monocrystalline semiconductor materials
EP2692908A1 (en) * 2012-07-30 2014-02-05 SolarWorld Industries America, Inc. Apparatus and method for the production of ingots
WO2014019789A1 (en) * 2012-07-31 2014-02-06 Siltronic Ag Method for producing a monocrystal from silicon
CN104962987A (en) * 2015-07-01 2015-10-07 哈尔滨工业大学 Horizontal-box type heating body for single-crystal growth furnace in horizontal and directional zone-melting crystallization preparation method
CN104975340A (en) * 2014-04-14 2015-10-14 硅电子股份公司 Apparatus And Process For Producing A Single Crystal Of Silicon
CN105274618A (en) * 2014-06-06 2016-01-27 硅电子股份公司 Apparatus and process for producing a crystal of semiconductor material
US9410262B2 (en) * 2012-09-04 2016-08-09 Siltronic Ag Method for producing a silicon single crystal

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010021004A1 (en) * 2010-05-14 2011-11-17 Schmid Silicon Technology Gmbh Producing monocrystalline semiconductor material useful e.g. in photovoltaics, comprises providing semiconductor material starting material, transferring it into heating zone and sinking melt into heating zone or lifting heating zone
US9664448B2 (en) 2012-07-30 2017-05-30 Solar World Industries America Inc. Melting apparatus
CN109399637A (en) * 2018-11-02 2019-03-01 大连理工大学 High-temperature non-transferred arc granulation equipment and method for diamond wire cutting silicon powder

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5034200A (en) * 1988-01-27 1991-07-23 Kabushiki Kaisha Toshiba Crystal pulling apparatus and crystal pulling method
US5080873A (en) * 1987-11-02 1992-01-14 Mitsubishi Materials Corporation Apparatus for growing crystals
US5089082A (en) * 1989-11-24 1992-02-18 Wacker-Chemitronic Gesellschaft Fur Elektronik-Grundstoffe Mbh Process and apparatus for producing silicon ingots having high oxygen content by crucible-free zone pulling, silicon ingots obtainable thereby and silicon wafers produced therefrom
US5108720A (en) * 1991-05-20 1992-04-28 Hemlock Semiconductor Corporation Float zone processing of particulate silicon
US5454424A (en) * 1991-12-18 1995-10-03 Nobuyuki Mori Method of and apparatus for casting crystalline silicon ingot by electron bean melting
US5871581A (en) * 1996-01-12 1999-02-16 Mitsubishi Materials Silicon Corporation Single crystal pulling apparatus
US6423137B1 (en) * 1998-03-12 2002-07-23 Silicon Crystal Research Institute Corp. Single crystal material supplying apparatus and single crystal material supplying method
US6843847B1 (en) * 1999-11-12 2005-01-18 Shin-Etsu Handotai Co., Ltd. Silicon single crystal wafer and production method thereof and soi wafer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4282184A (en) * 1979-10-09 1981-08-04 Siltec Corporation Continuous replenishment of molten semiconductor in a Czochralski-process, single-crystal-growing furnace
US4410494A (en) * 1981-04-13 1983-10-18 Siltec Corporation Apparatus for controlling flow of molten material between crystal growth furnaces and a replenishment crucible
JPS62246894A (en) * 1986-04-15 1987-10-28 Kyushu Denshi Kinzoku Kk Method and apparatus for producing single crystal
JPH01122988A (en) * 1987-11-06 1989-05-16 Kawasaki Steel Corp Growth of single crystal and apparatus for production thereof
DE69120326T2 (en) * 1990-03-30 1996-12-12 Sumitomo Sitix Corp Process for the production of a silicon single crystal
JP3053958B2 (en) * 1992-04-10 2000-06-19 光弘 丸山 Crystal production equipment by the floating zone melting method
DE19538020A1 (en) * 1995-10-12 1997-04-17 Wacker Siltronic Halbleitermat Large diameter single crystal silicon rod growth
JP3875314B2 (en) 1996-07-29 2007-01-31 日本碍子株式会社 Silicon crystal plate growth method, silicon crystal plate growth apparatus, silicon crystal plate, and solar cell element manufacturing method
JP3644227B2 (en) * 1997-12-22 2005-04-27 信越半導体株式会社 Method and apparatus for producing silicon single crystal
TW508378B (en) * 1998-03-09 2002-11-01 Shinetsu Handotai Kk A method for producing a silicon single crystal wafer and a silicon single crystal wafer
DE19882384T1 (en) * 1998-03-12 2000-07-27 Super Silicon Crystal Res Inst Auxiliary melting device for single crystalline material and method for melting single crystal material
JPH11292682A (en) * 1998-04-02 1999-10-26 Shin Etsu Handotai Co Ltd Production of silicon single crystal and production apparatus

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5080873A (en) * 1987-11-02 1992-01-14 Mitsubishi Materials Corporation Apparatus for growing crystals
US5034200A (en) * 1988-01-27 1991-07-23 Kabushiki Kaisha Toshiba Crystal pulling apparatus and crystal pulling method
US5089082A (en) * 1989-11-24 1992-02-18 Wacker-Chemitronic Gesellschaft Fur Elektronik-Grundstoffe Mbh Process and apparatus for producing silicon ingots having high oxygen content by crucible-free zone pulling, silicon ingots obtainable thereby and silicon wafers produced therefrom
US5108720A (en) * 1991-05-20 1992-04-28 Hemlock Semiconductor Corporation Float zone processing of particulate silicon
US5454424A (en) * 1991-12-18 1995-10-03 Nobuyuki Mori Method of and apparatus for casting crystalline silicon ingot by electron bean melting
US5871581A (en) * 1996-01-12 1999-02-16 Mitsubishi Materials Silicon Corporation Single crystal pulling apparatus
US6423137B1 (en) * 1998-03-12 2002-07-23 Silicon Crystal Research Institute Corp. Single crystal material supplying apparatus and single crystal material supplying method
US6843847B1 (en) * 1999-11-12 2005-01-18 Shin-Etsu Handotai Co., Ltd. Silicon single crystal wafer and production method thereof and soi wafer

Cited By (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8021483B2 (en) 2002-02-20 2011-09-20 Hemlock Semiconductor Corporation Flowable chips and methods for the preparation and use of same, and apparatus for use in the methods
US9084296B2 (en) 2008-03-10 2015-07-14 Siltronic Ag Induction heating coil and method for melting granules composed of semiconductor material
US20090223949A1 (en) * 2008-03-10 2009-09-10 Siltronic Ag Induction Heating Coil and Method For Melting Granules Composed Of Semiconductor Material
TWI398193B (en) * 2008-03-10 2013-06-01 世創電子材料公司 Inductive heating coil and method of melting particles composed of semiconductor material
TWI415979B (en) * 2008-08-13 2013-11-21 Siltronic Ag Verfahren zur herstellung eines einkristalls aus halbleitermaterial
US20130192518A1 (en) * 2008-08-13 2013-08-01 Siltronic Ag Method for producing a single crystal of semiconductor material
US20100037815A1 (en) * 2008-08-13 2010-02-18 Siltronic Ag Method For Producing A Single Crystal Of Semiconductor Material
DE102008038810A1 (en) 2008-08-13 2010-02-25 Siltronic Ag Process for producing an ice crystal from semiconductor material
US8580033B2 (en) * 2008-08-13 2013-11-12 Siltronic Ag Method for producing a single crystal of semiconductor material
KR101132877B1 (en) 2008-08-13 2012-04-03 실트로닉 아게 Method for producing a single crystral of semiconductor material
US8475592B2 (en) * 2008-08-13 2013-07-02 Siltronic Ag Method for producing a single crystal of semiconductor material
US20110095018A1 (en) * 2009-10-28 2011-04-28 Siltronic Ag Device For Producing A Single Crystal Composed Of Silicon By Remelting Granules
CN102051671A (en) * 2009-10-28 2011-05-11 硅电子股份公司 Device for producing a single crystal composed of silicon by remelting granules
TWI424100B (en) * 2009-10-28 2014-01-21 Siltronic Ag Vorrichtung zur herstellung eines einkristalls aus silizium durch umschmelzen von granulat
US8834627B2 (en) * 2009-11-11 2014-09-16 Siltronic Ag Method for producing a single crystal composed of silicon by remelting granules
TWI424101B (en) * 2009-11-11 2014-01-21 Siltronic Ag Verfahren zur herstellung eines einkristalls aus silizium durch umschmelzen von granulat
US20110107960A1 (en) * 2009-11-11 2011-05-12 Siltronic Ag Method For Producing A Single Crystal Composed Of Silicon By Remelting Granules
CN102061512A (en) * 2009-11-11 2011-05-18 硅电子股份公司 Method for producing a single crystal of silicon by remelting granules
US8454746B2 (en) 2010-02-03 2013-06-04 Siltronic Ag Method for producing a single crystal composed of silicon using molten granules
US20110185963A1 (en) * 2010-02-03 2011-08-04 Siltronic Ag Method For Producing A Single Crystal Composed Of Silicon Using Molten Granules
US20130199440A1 (en) * 2010-04-13 2013-08-08 Schmid Silicon Technology Gmbh Monocrystalline semiconductor materials
EP2692908A1 (en) * 2012-07-30 2014-02-05 SolarWorld Industries America, Inc. Apparatus and method for the production of ingots
CN103572363A (en) * 2012-07-30 2014-02-12 太阳世界工业美国有限公司 Apparatus and method for production of ingots
US9315917B2 (en) 2012-07-30 2016-04-19 Solar World Industries America Inc. Apparatus and method for the production of ingots
WO2014019789A1 (en) * 2012-07-31 2014-02-06 Siltronic Ag Method for producing a monocrystal from silicon
US9410262B2 (en) * 2012-09-04 2016-08-09 Siltronic Ag Method for producing a silicon single crystal
CN104975340A (en) * 2014-04-14 2015-10-14 硅电子股份公司 Apparatus And Process For Producing A Single Crystal Of Silicon
EP2933358A1 (en) 2014-04-14 2015-10-21 Siltronic AG Apparatus and process for producing a single crystal of silicon
DE102014207149A1 (en) 2014-04-14 2015-10-29 Siltronic Ag Apparatus and method for producing a single crystal of silicon
US9828692B2 (en) * 2014-04-14 2017-11-28 Siltronic Ag Apparatus and process for producing a single crystal of silicon
CN105274618A (en) * 2014-06-06 2016-01-27 硅电子股份公司 Apparatus and process for producing a crystal of semiconductor material
US9828693B2 (en) * 2014-06-06 2017-11-28 Siltronic Ag Apparatus and process for producing a crystal of semiconductor material
CN104962987A (en) * 2015-07-01 2015-10-07 哈尔滨工业大学 Horizontal-box type heating body for single-crystal growth furnace in horizontal and directional zone-melting crystallization preparation method

Also Published As

Publication number Publication date
US8221550B2 (en) 2012-07-17
US7655089B2 (en) 2010-02-02
JP3955826B2 (en) 2007-08-08
DE10204178A1 (en) 2003-09-04
JP2003226595A (en) 2003-08-12
DE10204178B4 (en) 2008-01-03
US20090084669A1 (en) 2009-04-02
US20100158783A1 (en) 2010-06-24

Similar Documents

Publication Publication Date Title
US8221550B2 (en) Process and apparatus for producing a single crystal of semiconductor material
EP3619339B1 (en) Crystal pulling system and method including crucible and barrier
US20030061985A1 (en) Process for preparing an arsenic-doped single crystal silicon using a submersed dopant feeder
WO1993012272A1 (en) Method of and apparatus for casting crystalline silicon ingot by electron beam melting
EP2971275B1 (en) Crucible assembly for controlling oxygen and related methods
KR101323901B1 (en) Method for producing a single crystal composed of silicon using molten granules
WO2014159879A1 (en) Czochralski crucible for controlling oxygen and related methods
US5556461A (en) Method for producing a silicon single crystal by a float-zone method
JPH09142988A (en) Method and apparatus for forming silicon single crystal
JPH06345584A (en) Method and apparatus for pulling monocrystal
JP3496388B2 (en) Supply method and supply pipe for granular silicon raw material
JP2003508332A (en) Manufacturing method of single crystal silicon with uniform thermal history
JP4555677B2 (en) Apparatus for producing a crystal rod having a predetermined cross section and a columnar polycrystalline structure by continuous crystallization
JP2002531374A (en) Single crystal processing by in-situ seed injection
CN107075721B (en) Weirs for Suppression of Melt Contamination
JP2952733B2 (en) Silicon single crystal manufacturing method
US20220389609A1 (en) Use of quartz plates during growth of single crystal silicon ingots
DK177587B1 (en) Method and apparatus for producing a single crystal of semiconductor material
JPH07110798B2 (en) Single crystal manufacturing equipment
JP2009007228A (en) Method and apparatus for producing spherical crystals
JP2013184842A (en) Silicon single crystal manufacturing device and method of manufacturing the same
KR20010113724A (en) Apparatus Growing Single Crystals
JPH02243587A (en) Pulling up single crystal and device therefor
JPH03159985A (en) Process for producing single crystal
JPH03174389A (en) Single crystal manufacturing equipment

Legal Events

Date Code Title Description
AS Assignment

Owner name: WACKER SILTRONIC AG, GERMANY

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:VON AMMON, WILFRIED, DR.;REEL/FRAME:013700/0477

Effective date: 20030103

AS Assignment

Owner name: SILTRONIC AG, GERMANY

Free format text: CHANGE OF NAME;ASSIGNOR:WACKER SILTRONIC GESELLSCHAFT FUR HALBLEITERMATERIALIEN AKTIENGESELLSCHAFT;REEL/FRAME:015596/0720

Effective date: 20040122

STCB Information on status: application discontinuation

Free format text: ABANDONED -- AFTER EXAMINER'S ANSWER OR BOARD OF APPEALS DECISION