US20010006116A1 - Single mask screening process and structure produced thereby - Google Patents
Single mask screening process and structure produced thereby Download PDFInfo
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- US20010006116A1 US20010006116A1 US09/766,011 US76601101A US2001006116A1 US 20010006116 A1 US20010006116 A1 US 20010006116A1 US 76601101 A US76601101 A US 76601101A US 2001006116 A1 US2001006116 A1 US 2001006116A1
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- 238000012216 screening Methods 0.000 title claims abstract description 51
- 238000000034 method Methods 0.000 title claims abstract description 43
- 239000000919 ceramic Substances 0.000 claims abstract description 41
- 239000000758 substrate Substances 0.000 claims description 48
- 239000002184 metal Substances 0.000 claims description 11
- 229910000679 solder Inorganic materials 0.000 claims description 7
- 239000003990 capacitor Substances 0.000 claims description 4
- 238000010030 laminating Methods 0.000 claims description 4
- 238000007650 screen-printing Methods 0.000 claims description 4
- 238000005245 sintering Methods 0.000 claims description 3
- 238000001125 extrusion Methods 0.000 claims description 2
- 238000010438 heat treatment Methods 0.000 claims 4
- 239000010410 layer Substances 0.000 description 76
- 238000001465 metallisation Methods 0.000 description 6
- 239000004020 conductor Substances 0.000 description 5
- 238000001035 drying Methods 0.000 description 5
- 238000007689 inspection Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical compound FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 description 4
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 244000043261 Hevea brasiliensis Species 0.000 description 1
- 229910001315 Tool steel Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 239000000806 elastomer Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000002241 glass-ceramic Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229920003052 natural elastomer Polymers 0.000 description 1
- 229920001194 natural rubber Polymers 0.000 description 1
- 230000008520 organization Effects 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000004901 spalling Methods 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
- H05K3/1216—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by screen printing or stencil printing
- H05K3/1233—Methods or means for supplying the conductive material and for forcing it through the screen or stencil
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
- H10K71/13—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/035—Paste overlayer, i.e. conductive paste or solder paste over conductive layer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/01—Tools for processing; Objects used during processing
- H05K2203/0104—Tools for processing; Objects used during processing for patterning or coating
- H05K2203/0139—Blade or squeegee, e.g. for screen printing or filling of holes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/245—Reinforcing conductive patterns made by printing techniques or by other techniques for applying conductive pastes, inks or powders; Reinforcing other conductive patterns by such techniques
Definitions
- This invention relates to electronic substrates, and more particularly, relates to ceramic and organic substrates having multilayer features thereon for electronics packaging applications and a method for forming such multilayer features.
- a multilayered ceramic circuit substrate may comprise patterned metal layers which act as electrical conductors sandwiched between ceramic layers which act as insulators.
- Organic substrates, also coalled printed circuit boards, may be single layer or multilayer material (such as fiberglass-impregnated epoxy) and contain electrical conductors.
- the substrates are designed with termination pads for attaching semiconductor chips, capacitors, resistors, connection leads, pins, solder balls, solder columns etc.
- Interconnection between buried conductor levels in ceramic substrates can be achieved through vias formed by metal paste-filled holes in the individual ceramic layers (called greensheets) formed prior to lamination, which, upon sintering will become a sintered dense metal interconnection of metal based conductor.
- interconnection between conductor levels is by, for example, plated through hole vias.
- the termination pads are often multi-layered stacks of metallization and are conventionally produced with multiple screenings, with the underlying layer being screened and dried before application of another mask and screening and drying of the next layer.
- Gaynes et al. U.S. Pat. No. 5,565,033, the disclosure of which is incorporated by reference herein, discloses a process for making thicker layers of solder pastes and conductive adhesives. Gaynes et al. recognizes the disadvantages of multiple screenings as contamination between successively screened layers and the time associated with two passes through screening and drying.
- the individual layers may be shifted from the layer above or below it.
- Mitani et al. U.S. Pat. No. 4,324,815 the disclosure of which is incorporated by reference herein, recognizes the positional error that can occur with each printing step.
- the bottom layer could be made larger than the top layer so that the top layer is “captured” by the bottom layer.
- a typical pin grid array substrate has a nominal pad diameter of 1.5 mm, an interpad space of 0.3 mm and a pad tolerance of +0/ ⁇ 0.220 mm. This is to be compared with a typical column grid array substrate which has a nominal pad diameter of 0.800 mm, an interpad space of 0.200 mm and a pad tolerance of +/ ⁇ 0.050 mm.
- One aspect of the invention relates to a method of forming a multi-layer feature on an electronic substrate article, the method comprising the steps of:
- a second aspect of the invention relates to a multi-layer feature structure on an electronic substrate article comprising:
- a multi-layer feature structure comprising:
- a second portion having a bottom and a periphery wherein the first portion contacts the bottom, and surrounds the periphery of, the second portion so that the second portion is captured by the first portion.
- FIG. 1 is a side view of a prior art multilayer pad in which the top layer is misaligned with respect to the bottom layer.
- FIG. 2 is a side view of a prior art multilayer pad in which the bottom layer has been made larger to capture the top layer.
- FIG. 3 is a flow chart showing the process flow for the prior art process of multiple screenings to form a multilayer pad.
- FIG. 4 is a flow chart showing the process flow for the process according to the present invention of multiple screenings to form a multilayer feature.
- FIGS. 5A, 5B and 5 C are schematical cross-sectional views showing the different steps in producing the multilayer feature according to the present invention.
- FIGS. 6A and 6B are top views of the multilayer feature produced according to the present invention.
- FIG. 7 is a schematical cross-sectional view of a second multilayer feature produced according to the present invention.
- FIG. 8 is a schematical cross-sectional view of a third multilayer feature produced according to the present invention.
- multilayer pad 12 has been formed on ceramic substrate 10 . Due to positional error resulting from multiple screenings, top layer 16 is not aligned with bottom layer 14 . The misalignment results in portion 18 of top layer 16 contacting ceramic substrate 10 . The consequences of this structure are that a termination pad of reduced dimension has been formed and that if top layer does not bond well with ceramic substrate 10 , the misalignment can cause delamination or spalling of top layer 16 .
- multilayer pad 12 on ceramic substrate 10 has been formed with bottom layer 14 larger than top layer 16 .
- bottom layer 14 has been formed with top layer 16 .
- a disadvantage of this arrangement is that excess space has been taken up by the multilayer pad 12 , thereby reducing the possible density of the remaining multilayer pads (not shown) on the ceramic substrate.
- FIG. 3 The prior art process for producing a two-layer multilayer pad is illustrated in FIG. 3.
- the first layer is screened 20 through a mask onto a ceramic greensheet.
- the mask is removed 22 followed by drying 24 and inspection 26 of the screened features.
- the second layer is screened 28 through a mask onto the first layer.
- the mask is then removed 30 followed by drying 32 and inspection 34 of the screened features.
- the greensheet is stacked with other ceramic greensheets, laminated and sintered.
- the first layer of the multilayer feature is screened 36 onto an electronic substrate article with the mask. Without moving the mask, the second layer is screened 38 through the same mask.
- mask 48 having feature opening 50 in line with via 47 is situated on electronic substrate article 46 .
- Mask 48 is preferably a metal mask suitable for extrusion screening but it is contemplated within the scope of the present invention that a mesh mask suitable for silk screen printing could also be used, although it is clearly not preferred because of the inherent movement of the mesh mask during the silk screen printing process.
- Nozzle 52 is poised to provide a quantity of paste for screening.
- Nozzle 52 should be relatively pliable for reasons which will become apparent hereafter. Suitable materials for nozzle 52 could be polyurethane, elastomers, thermoplastics, natural rubber, silicone, TEFLON (TEFLON, a tetrafluoroethylene (TFE) compound is a trademark of E.I. duPont de Nemours & Co.) or other similar materials.
- TEFLON a tetrafluoroethylene (TFE) compound is a trademark of E.I. duPont de Nemours & Co.
- Nozzle 52 will screen the paste into feature opening 50 . Due to the pliable nature of the nozzle 52 , part of the screened paste is scooped out by the pliable nozzle 52 leaving layer 54 only partially filling the feature opening 50 . Nozzle 52 will also wipe the mask, removing any paste residue. The resulting unfilled portion 56 of feature opening 50 will be filled by the second layer. If unfilled portion 56 were not present, there would be no place for the second layer to fill in the feature opening 50 . As can be seen in FIG. 5B, the first layer 54 will fill the bottom portion of feature opening 50 and will also usually fill the top portion of feature opening 50 along the walls of feature opening 50 . The resulting unfilled portion 56 is dish-shaped.
- nozzle 58 will screen the second layer 60 of paste into feature opening 50 to fill it as illustrated in FIG. 5C.
- Nozzle 58 is chosen to be made of a hard material such as a carbide, tool steel or ceramic material. The purpose of nozzle 58 is to fill the remaining portion 56 of feature opening 50 . If nozzle 58 were pliable like nozzle 52 , paste would be screened into feature opening 50 and then scooped out so that the feature opening would remain unfilled.
- the pastes used are preferably metal-containing (conducting) pastes although insulative (nonconducting) paste or pastes, or combinations of metal-containing pastes and insulative pastes, could be used for a given application.
- the pastes for the different layers will typically differ from layer to layer so that the most advantageous properties can be developed for each layer. That is, the first layer 54 may be formulated for adhesion to the electronic substrate article 46 while the second layer 60 may be formulated for soldering or brazing.
- the present invention is most suitable for a two-layer multilayer feature. It is possible, however, by varying the hardness of the nozzles 52 , 58 to build up three or more layers according to the present invention.
- the mask is removed 40 followed by drying 42 and inspection 44 of the screened features.
- the multilayer feature shown in FIGS. 5A, 5B and 5 C is a multilayer termination pad formed on a ceramic greensheet 46 .
- the ceramic greensheet 46 with the multilayer termination pad would be stacked with other appropriate greensheets having appropriate wiring features (as is well known to those skilled in the art), laminated under pressure and then sintered to form a multilayer ceramic substrate having at least one multilayer termination pad.
- FIG. 6A Prior to laminating and in FIG. 6B after laminating and sintering.
- the exposed part of first layer 54 becomes greater.
- first layer 54 completely captures second layer 60 . Due to the fact that the screening mask is never moved between screening steps, there is complete alignment between first layer 54 and second layer 60 . This would be true even if first layer 54 did not rise up along the walls of the feature opening as shown in FIG. 5B.
- the multilayer termination pads could be formed on a greensheet laminate, i.e. a stack of laminated greensheets, a sintered ceramic substrate, or an organic substrate, in which case the process flow of FIG. 4 would still apply. After inspection, the greensheet laminate and multilayer termination pads would be sintered while the sintered ceramic substrate and multilayer termination pads would be resintered. As to the organic substrate the preferred multilayer termination pad would comprise solder paste. After inspection, the organic substrate and multilayer termination pad would be heated to cause reflow of the solder.
- FIG. 7 Illustrated in FIG. 7 is another embodiment of the present invention in which multilayer lines or wiring patterns 62 , one of which contacts via 47 , are formed-on ceramic article 46 .
- FIG. 8 Illustrated in FIG. 8 are ceramic articles 46 , preferably ceramic greensheets, wherein one ceramic article 46 contains a multilayer feature 64 which in conjunction with via 47 forms an in-line capacitor. In practice, the two ceramic articles 46 in FIG. 8 would be adhered together, or in the case of ceramic greensheets, would be laminated and sintered.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
A process of forming a multi-layer feature on a ceramic or organic article in which first and second layers of paste are sequentially screened through a screening mask wherein the screening mask has not been moved between screening steps. A structure produced by this process is also disclosed.
Description
- This application is related to Buechele et al. U.S. patent application Ser. No. ______ entitled “A SCREENING APPARATUS INCLUDING A DUAL RESERVOIR DISPENSING ASSEMBLY” filed even date herewith, the disclosure of which is incorporated by reference herein.
- This invention relates to electronic substrates, and more particularly, relates to ceramic and organic substrates having multilayer features thereon for electronics packaging applications and a method for forming such multilayer features.
- Glass, ceramic and glass ceramic (hereafter just ceramic) and organic structures are used in the production of electronic substrates and devices for electronics packaging applications. Many different types of structures can be used. For example, a multilayered ceramic circuit substrate may comprise patterned metal layers which act as electrical conductors sandwiched between ceramic layers which act as insulators. Organic substrates, also coalled printed circuit boards, may be single layer or multilayer material (such as fiberglass-impregnated epoxy) and contain electrical conductors. The substrates are designed with termination pads for attaching semiconductor chips, capacitors, resistors, connection leads, pins, solder balls, solder columns etc. Interconnection between buried conductor levels in ceramic substrates can be achieved through vias formed by metal paste-filled holes in the individual ceramic layers (called greensheets) formed prior to lamination, which, upon sintering will become a sintered dense metal interconnection of metal based conductor. In the case of organic substrates, interconnection between conductor levels is by, for example, plated through hole vias.
- The termination pads are often multi-layered stacks of metallization and are conventionally produced with multiple screenings, with the underlying layer being screened and dried before application of another mask and screening and drying of the next layer. Greenstein U.S. Pat. No. 4,025,669, Siuta U.S. Pat. 5,202,153, and Knickerbocker et al. U.S. Pat. No. 5,293,504, the disclosures of which are incorporated by reference herein, are examples where multiple screenings have been utilized to obtain either a thicker layer or a multiple layer stack of metallization.
- While the prior art shows the individual layers of the stack to be perfectly aligned with every other layer in the stack, the reality is very far from this ideal case. For example, Natarajan et al. U.S. Pat. No. 5,639,562, the disclosure of which is incorporated by reference herein, shows a two layer composite metal pad with both layers perfectly aligned.
- Gaynes et al. U.S. Pat. No. 5,565,033, the disclosure of which is incorporated by reference herein, discloses a process for making thicker layers of solder pastes and conductive adhesives. Gaynes et al. recognizes the disadvantages of multiple screenings as contamination between successively screened layers and the time associated with two passes through screening and drying.
- In practice, the individual layers may be shifted from the layer above or below it. Mitani et al. U.S. Pat. No. 4,324,815, the disclosure of which is incorporated by reference herein, recognizes the positional error that can occur with each printing step. As disclosed in Mitani et al., the bottom layer could be made larger than the top layer so that the top layer is “captured” by the bottom layer.
- However, with the trend to increasing the density of the termination pads (and reducing the spacing between adjoining termination pads), it is no longer possible to oversize the bottom layer to capture the top layer. For example, a typical pin grid array substrate has a nominal pad diameter of 1.5 mm, an interpad space of 0.3 mm and a pad tolerance of +0/−0.220 mm. This is to be compared with a typical column grid array substrate which has a nominal pad diameter of 0.800 mm, an interpad space of 0.200 mm and a pad tolerance of +/−0.050 mm.
- Accordingly, it is a purpose of the present invention to have an improved process for producing multilayer stacks of metallization on a ceramic article and/or organic article.
- It is another purpose of the present invention to have an improved process for producing multilayer stacks of metallization on a ceramic article and/or organic article which eliminates the positional errors which heretofore have been inherent in multiple screenings of metallization.
- It is yet another purpose of the present invention to have an improved process for producing multilayer stacks of metallization for use as termination pads, lines and other features.
- One aspect of the invention relates to a method of forming a multi-layer feature on an electronic substrate article, the method comprising the steps of:
- a. placing a screening mask having at least one aperture over the electronic substrate article;
- b. screening a first paste through the at least one aperture of the screening mask to form a first layer of the multi-layer feature;
- c. screening a second paste through the same at least one aperture of the same screening mask used in the first screening step and onto the first paste to form a second layer of the multi-layer feature in alignment with the first layer of the multi-layer feature, wherein the screening mask has not been moved between the two screening steps; and
- d. removing the screening mask.
- A second aspect of the invention relates to a multi-layer feature structure on an electronic substrate article comprising:
- an electronic substrate article; and
- a multi-layer feature structure comprising:
- a first portion adjacent to the electronic substrate article; and
- a second portion having a bottom and a periphery wherein the first portion contacts the bottom, and surrounds the periphery of, the second portion so that the second portion is captured by the first portion.
- The features of the invention believed to be novel and the elements characteristic of the invention are set forth with particularity in the appended claims. The Figures are for illustration purposes only and are not drawn to scale. The invention itself, however, both as to organization and method of operation, may best be understood by reference to the detailed description which follows taken in conjunction with the accompanying drawings in which:
- FIG. 1 is a side view of a prior art multilayer pad in which the top layer is misaligned with respect to the bottom layer.
- FIG. 2 is a side view of a prior art multilayer pad in which the bottom layer has been made larger to capture the top layer.
- FIG. 3 is a flow chart showing the process flow for the prior art process of multiple screenings to form a multilayer pad.
- FIG. 4 is a flow chart showing the process flow for the process according to the present invention of multiple screenings to form a multilayer feature.
- FIGS. 5A, 5B and 5C are schematical cross-sectional views showing the different steps in producing the multilayer feature according to the present invention.
- FIGS. 6A and 6B are top views of the multilayer feature produced according to the present invention.
- FIG. 7 is a schematical cross-sectional view of a second multilayer feature produced according to the present invention.
- FIG. 8 is a schematical cross-sectional view of a third multilayer feature produced according to the present invention.
- Referring to the drawings in more detail, and particularly referring to FIG. 1,
multilayer pad 12 has been formed on ceramic substrate 10. Due to positional error resulting from multiple screenings,top layer 16 is not aligned withbottom layer 14. The misalignment results inportion 18 oftop layer 16 contacting ceramic substrate 10. The consequences of this structure are that a termination pad of reduced dimension has been formed and that if top layer does not bond well with ceramic substrate 10, the misalignment can cause delamination or spalling oftop layer 16. - In FIG. 2,
multilayer pad 12 on ceramic substrate 10 has been formed withbottom layer 14 larger thantop layer 16. In this way, full contact betweentop layer 16 andbottom layer 14 is assured even if there is positional error from the multiple screenings. A disadvantage of this arrangement is that excess space has been taken up by themultilayer pad 12, thereby reducing the possible density of the remaining multilayer pads (not shown) on the ceramic substrate. - The prior art process for producing a two-layer multilayer pad is illustrated in FIG. 3. The first layer is screened 20 through a mask onto a ceramic greensheet. The mask is removed 22 followed by drying 24 and
inspection 26 of the screened features. Thereafter, the second layer is screened 28 through a mask onto the first layer. The mask is then removed 30 followed by drying 32 andinspection 34 of the screened features. Finally the greensheet is stacked with other ceramic greensheets, laminated and sintered. - It doesn't matter whether the same mask or different masks are used in the prior art process to screen both of the layers, the result will be the same, namely, misalignment between the two layers due to positional error.
- Referring now to FIG. 4, the process according to the present invention is illustrated. The first layer of the multilayer feature is screened 36 onto an electronic substrate article with the mask. Without moving the mask, the second layer is screened 38 through the same mask.
- Referring now to FIG. 5A,
mask 48 having feature opening 50 in line with via 47 is situated onelectronic substrate article 46.Mask 48 is preferably a metal mask suitable for extrusion screening but it is contemplated within the scope of the present invention that a mesh mask suitable for silk screen printing could also be used, although it is clearly not preferred because of the inherent movement of the mesh mask during the silk screen printing process.Nozzle 52 is poised to provide a quantity of paste for screening. - The preferred screening apparatus, including the nozzle, is described in more detail in Applicants' RELATED APPLICATION.
Nozzle 52 should be relatively pliable for reasons which will become apparent hereafter. Suitable materials fornozzle 52 could be polyurethane, elastomers, thermoplastics, natural rubber, silicone, TEFLON (TEFLON, a tetrafluoroethylene (TFE) compound is a trademark of E.I. duPont de Nemours & Co.) or other similar materials. -
Nozzle 52 will screen the paste intofeature opening 50. Due to the pliable nature of thenozzle 52, part of the screened paste is scooped out by thepliable nozzle 52 leavinglayer 54 only partially filling thefeature opening 50.Nozzle 52 will also wipe the mask, removing any paste residue. The resultingunfilled portion 56 offeature opening 50 will be filled by the second layer. Ifunfilled portion 56 were not present, there would be no place for the second layer to fill in thefeature opening 50. As can be seen in FIG. 5B, thefirst layer 54 will fill the bottom portion offeature opening 50 and will also usually fill the top portion offeature opening 50 along the walls offeature opening 50. The resultingunfilled portion 56 is dish-shaped. - It is not necessary to dry
layer 54 before proceeding to the next screening step. - Next,
nozzle 58 will screen thesecond layer 60 of paste intofeature opening 50 to fill it as illustrated in FIG. 5C.Nozzle 58 is chosen to be made of a hard material such as a carbide, tool steel or ceramic material. The purpose ofnozzle 58 is to fill the remainingportion 56 offeature opening 50. Ifnozzle 58 were pliable likenozzle 52, paste would be screened intofeature opening 50 and then scooped out so that the feature opening would remain unfilled. - The pastes used are preferably metal-containing (conducting) pastes although insulative (nonconducting) paste or pastes, or combinations of metal-containing pastes and insulative pastes, could be used for a given application.
- Also, the pastes for the different layers will typically differ from layer to layer so that the most advantageous properties can be developed for each layer. That is, the
first layer 54 may be formulated for adhesion to theelectronic substrate article 46 while thesecond layer 60 may be formulated for soldering or brazing. - The present invention is most suitable for a two-layer multilayer feature. It is possible, however, by varying the hardness of the
52, 58 to build up three or more layers according to the present invention.nozzles - Referring back to FIG. 4, the mask is removed 40 followed by drying 42 and
inspection 44 of the screened features. - In a preferred embodiment of the present invention, the multilayer feature shown in FIGS. 5A, 5B and 5C is a multilayer termination pad formed on a
ceramic greensheet 46. Subsequent to the step of inspecting, theceramic greensheet 46 with the multilayer termination pad would be stacked with other appropriate greensheets having appropriate wiring features (as is well known to those skilled in the art), laminated under pressure and then sintered to form a multilayer ceramic substrate having at least one multilayer termination pad. - The resulting multilayer feature is shown in FIG. 6A prior to laminating and in FIG. 6B after laminating and sintering. As a result of laminating, the exposed part of
first layer 54 becomes greater. As can be seen,first layer 54 completely capturessecond layer 60. Due to the fact that the screening mask is never moved between screening steps, there is complete alignment betweenfirst layer 54 andsecond layer 60. This would be true even iffirst layer 54 did not rise up along the walls of the feature opening as shown in FIG. 5B. - Surprisingly, there is little or no contamination of the
first layer 54 by thesecond layer 60 even though the paste for thesecond layer 60 can be screened on while the paste for thefirst layer 54 is still wet. The fact thatfirst nozzle 52 wipes themask 48 after screening is useful in avoiding intermixing of thefirst layer 54 and thesecond layer 60. - Instead of forming the multilayer termination pads on ceramic greensheets, the multilayer termination pads could be formed on a greensheet laminate, i.e. a stack of laminated greensheets, a sintered ceramic substrate, or an organic substrate, in which case the process flow of FIG. 4 would still apply. After inspection, the greensheet laminate and multilayer termination pads would be sintered while the sintered ceramic substrate and multilayer termination pads would be resintered. As to the organic substrate the preferred multilayer termination pad would comprise solder paste. After inspection, the organic substrate and multilayer termination pad would be heated to cause reflow of the solder.
- Too, instead of forming multilayer termination pads, the present invention could be utilized to form other multilayer features. Illustrated in FIG. 7 is another embodiment of the present invention in which multilayer lines or
wiring patterns 62, one of which contacts via 47, are formed-onceramic article 46. Illustrated in FIG. 8 areceramic articles 46, preferably ceramic greensheets, wherein oneceramic article 46 contains amultilayer feature 64 which in conjunction with via 47 forms an in-line capacitor. In practice, the twoceramic articles 46 in FIG. 8 would be adhered together, or in the case of ceramic greensheets, would be laminated and sintered. - It will be apparent to those skilled in the art having regard to this disclosure that other modifications of this invention beyond those embodiments specifically described here may be made without departing from the spirit of the invention. Accordingly, such modifications are considered within the scope of the invention as limited solely by the appended claims.
Claims (29)
1. A method of forming a multi-layer feature on an electronic substrate article, the method comprising the steps of:
a. placing a screening mask having at least one aperture over the electronic substrate article;
b. screening a first paste through the at least one aperture of the screening mask to form a first layer of the multi-layer feature;
c. screening a second paste through the same at least one aperture of the same screening mask used in the first screening step and onto the first paste to form a second layer of the multi-layer feature in alignment with the first layer of the multi-layer feature, wherein the screening mask has not been moved between the two screening steps; and
d. removing the screening mask.
2. The method of further comprising the step of heating the multi-layer feature.
claim 1
3. The method of wherein in the first screening step, the paste only partially fills the at least one aperture of the screening mask.
claim 1
4. The method of wherein in the second screening step, the paste fills the remainder of the at least one aperture of the screening mask.
claim 3
5. The method of wherein the first paste is wet when the second paste is screened onto it.
claim 1
6. The method of wherein the first and second pastes are metal-containing pastes.
claim 1
7. The method of wherein the first and second pastes are insulative pastes.
claim 1
8. The method of wherein one of the first and second pastes is a metal-containing paste and the other of the first and second pastes is an insulative paste.
claim 1
9. The method of wherein the electronic substrate article is an organic article.
claim 1
10. The method of wherein the electronic substrate article is an organic article, the first and second pastes comprise solder and the step of heating the multi-layer feature causes reflow of the solder layers.
claim 2
11. The method of wherein the electronic substrate article is a ceramic substrate and the step of heating causes sintering of the multi-layer feature.
claim 2
12. The method of wherein the ceramic substrate is a ceramic greensheet and the method further comprises, prior to the step of heating: screening a paste onto at least a second ceramic greensheet to form a wiring feature;
claim 11
removing the screening mask; and
stacking and laminating the ceramic greensheets.
13. The method of wherein the ceramic substrate is a ceramic greensheet laminate.
claim 11
14. The method of wherein the ceramic substrate is a sintered ceramic substrate.
claim 11
15. The method of wherein the screening mask is a metal mask.
claim 1
16. The method of claim I wherein the screening mask is that used in silk screen printing.
17. The method of wherein the first and second steps of screening are by extrusion screening.
claim 1
18. The method of wherein the first and second steps of screening are by silk screen printing.
claim 1
19. The method of wherein the multi-layer feature is a termination pad.
claim 1
20. The method of wherein the multi-layer feature is a wiring line.
claim 1
21. The method of wherein the multi-layer feature is part of a capacitor.
claim 1
22. A multi-layer feature structure on an electronic substrate article comprising:
an electronic substrate article; and
a multi-layer feature structure comprising:
a first portion adjacent to the electronic substrate article; and
a second portion having a bottom and a periphery wherein the first portion contacts the bottom, and surrounds the periphery of, the second portion so that the second portion is captured by the first portion.
23. The multi-layer feature structure of wherein the multi-layer feature is a termination pad.
claim 22
24. The multi-layer feature structure of wherein the multi-layer feature is a wiring line.
claim 22
25. The multi-layer feature structure of wherein the multi-layer feature is part of a capacitor.
claim 22
26. The multi-layer feature structure of wherein the electronic substrate article is an organic substrate.
claim 22
27. The multi-layer feature structure of wherein the electronic substrate article is a ceramic greensheet.
claim 22
28. The multi-layer feature structure of wherein the electronic substrate article is a ceramic greensheet laminate.
claim 22
29. The multi-layer feature structure of wherein the electronic substrate article is a sintered ceramic substrate.
claim 22
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/766,011 US20010006116A1 (en) | 1998-12-07 | 2001-01-18 | Single mask screening process and structure produced thereby |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/206,159 US6238741B1 (en) | 1998-12-07 | 1998-12-07 | Single mask screening process |
| US09/766,011 US20010006116A1 (en) | 1998-12-07 | 2001-01-18 | Single mask screening process and structure produced thereby |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US09/206,159 Division US6238741B1 (en) | 1998-12-07 | 1998-12-07 | Single mask screening process |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| US20010006116A1 true US20010006116A1 (en) | 2001-07-05 |
Family
ID=22765232
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US09/206,159 Expired - Fee Related US6238741B1 (en) | 1998-12-07 | 1998-12-07 | Single mask screening process |
| US09/766,011 Abandoned US20010006116A1 (en) | 1998-12-07 | 2001-01-18 | Single mask screening process and structure produced thereby |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US09/206,159 Expired - Fee Related US6238741B1 (en) | 1998-12-07 | 1998-12-07 | Single mask screening process |
Country Status (1)
| Country | Link |
|---|---|
| US (2) | US6238741B1 (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002054414A3 (en) * | 2000-12-29 | 2003-01-03 | Magin Display Technologies Ltd | Fat conductor |
| KR100619367B1 (en) | 2004-08-26 | 2006-09-08 | 삼성전기주식회사 | Printed circuit board with capacitor having high dielectric constant and manufacturing method |
| CN116568469A (en) * | 2020-11-27 | 2023-08-08 | 乐尔幸华奥斯株式会社 | Screen mask, pattern mold, method for manufacturing artificial marble, and artificial marble |
| US12459292B2 (en) | 2020-11-27 | 2025-11-04 | Lx Hausys, Ltd. | Artificial marble including opaque striped region and transparent base region |
| US12459872B2 (en) | 2020-11-27 | 2025-11-04 | Lx Hausys, Ltd. | Artificial marble including stripes having high light transmittance |
| US12479765B2 (en) | 2020-11-27 | 2025-11-25 | Lx Hausys, Ltd. | Artificial marble having high light transmittance |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2169717B1 (en) * | 2004-08-17 | 2017-06-28 | Mitsubishi Materials Corporation | Method of manufacturing an insulation substrate |
| FR2936362B1 (en) * | 2008-09-25 | 2010-09-10 | Saint Gobain | METHOD FOR MANUFACTURING AN ELECTROCONDUCTIVE SUBMILLIMETRIC GRID COATED WITH A SURGRILLE GRID, ELECTROCONDUCTIVE SUBMILLIMETER GRID COVERED WITH AN OVERGRILL |
| FR2946462B1 (en) * | 2009-06-09 | 2011-07-01 | Commissariat Energie Atomique | METHOD FOR PRODUCING AT LEAST ONE MICROCOMPONENT WITH A SINGLE MASK |
| US9232645B2 (en) | 2013-11-22 | 2016-01-05 | International Business Machines Corporation | High speed differential wiring in glass ceramic MCMS |
| MX374704B (en) | 2013-12-31 | 2025-03-06 | Johnson & Johnson Consumer Inc | SINGLE-PASS PROCESS FOR FORMING A MULTI-LAYER CONFORMAL FILM PRODUCT |
| JP6588020B2 (en) | 2013-12-31 | 2019-10-09 | ジョンソン・アンド・ジョンソン・コンシューマー・インコーポレイテッド | Method for forming a multilayer shaped film |
| MX383455B (en) | 2013-12-31 | 2025-03-14 | Johnson & Johnson Consumer Inc | PROCESS FOR FORMING A FORMED FILM PRODUCT. |
| KR102093157B1 (en) * | 2014-12-01 | 2020-03-25 | 삼성전기주식회사 | Multi-layer ceramic substrate |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4025669A (en) | 1973-11-15 | 1977-05-24 | Owens-Illinois, Inc. | Multiple pass method of applying printing paste upon a substrate |
| US4324815A (en) | 1978-01-24 | 1982-04-13 | Mitani Electronics Industry Corp. | Screen-printing mask and method |
| US5149671A (en) * | 1990-12-03 | 1992-09-22 | Grumman Aerospace Corporation | Method for forming multilayer indium bump contact |
| US5202153A (en) | 1991-08-23 | 1993-04-13 | E. I. Du Pont De Nemours And Company | Method for making thick film/solder joints |
| US5293504A (en) | 1992-09-23 | 1994-03-08 | International Business Machines Corporation | Multilayer ceramic substrate with capped vias |
| US5478700A (en) | 1993-12-21 | 1995-12-26 | International Business Machines Corporation | Method for applying bonding agents to pad and/or interconnection sites in the manufacture of electrical circuits using a bonding agent injection head |
| US5613181A (en) | 1994-12-21 | 1997-03-18 | International Business Machines Corporation | Co-sintered surface metallization for pin-join, wire-bond and chip attach |
| US5699733A (en) * | 1996-09-25 | 1997-12-23 | Industrial Technology Research Institute | Screen printing on film coated substrates |
-
1998
- 1998-12-07 US US09/206,159 patent/US6238741B1/en not_active Expired - Fee Related
-
2001
- 2001-01-18 US US09/766,011 patent/US20010006116A1/en not_active Abandoned
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002054414A3 (en) * | 2000-12-29 | 2003-01-03 | Magin Display Technologies Ltd | Fat conductor |
| EP1354237A4 (en) * | 2000-12-29 | 2004-05-26 | Magin Display Technologies Ltd | THICK CONDUCTOR |
| KR100619367B1 (en) | 2004-08-26 | 2006-09-08 | 삼성전기주식회사 | Printed circuit board with capacitor having high dielectric constant and manufacturing method |
| CN116568469A (en) * | 2020-11-27 | 2023-08-08 | 乐尔幸华奥斯株式会社 | Screen mask, pattern mold, method for manufacturing artificial marble, and artificial marble |
| US12459292B2 (en) | 2020-11-27 | 2025-11-04 | Lx Hausys, Ltd. | Artificial marble including opaque striped region and transparent base region |
| US12459872B2 (en) | 2020-11-27 | 2025-11-04 | Lx Hausys, Ltd. | Artificial marble including stripes having high light transmittance |
| US12479765B2 (en) | 2020-11-27 | 2025-11-25 | Lx Hausys, Ltd. | Artificial marble having high light transmittance |
Also Published As
| Publication number | Publication date |
|---|---|
| US6238741B1 (en) | 2001-05-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |