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US1760372A - Micrometer or the like - Google Patents

Micrometer or the like Download PDF

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Publication number
US1760372A
US1760372A US191624A US19162427A US1760372A US 1760372 A US1760372 A US 1760372A US 191624 A US191624 A US 191624A US 19162427 A US19162427 A US 19162427A US 1760372 A US1760372 A US 1760372A
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US
United States
Prior art keywords
graduations
micrometer
dull
visibility
micrometers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US191624A
Inventor
Erik G Pehrsson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CE Johansson AB
Original Assignee
CE Johansson AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CE Johansson AB filed Critical CE Johansson AB
Priority to US191624A priority Critical patent/US1760372A/en
Application granted granted Critical
Publication of US1760372A publication Critical patent/US1760372A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00Measuring instruments characterised by the use of mechanical techniques
    • G01B3/18Micrometers

Definitions

  • This invention relates to improvements in micrometers, or the like.
  • the object of the present invention therefore is to remedy this defect by providing an instrument, the graduations or scales of which are visually distinct from the background thereof. This improvement is effected by treating those areas of the instrument, whic include the graduations, so as to render the areas dull in appearance, thereby enhancing the visibility of the graduations and reducing the likelihood of errors in the use of the device.
  • micrometer embodying the present invention isillustrated.
  • the micrometer may be of standard construction and will not be described in 1927.
  • a micrometer having graduations thereon, a portion of the surface thereof including said graduations being etched to provide a dull surface for the purpose of enhancing the visibility of said graduations.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Instruments Using Mechanical Means (AREA)

Description

May 27, 1930. E. G. PEHRSSON 1,760,372
MICROMETER OR THE LIKE Filed May 16, 1927 Patented May 27, 1930 UNITED STATES EEIK e. rEHE'ssoN, or Esxrnsrulu, SWEDEN, 'ASSIGNOR zro AxrIEEoLAGEr c. E
PAT NT OFFICE JOHANSSON, OF ESKILSTUNA, SWEDEN mcEoMErEa on. THE LIKE Application filed May 16,
This invention relates to improvements in micrometers, or the like.
In the use of micrometers and other gauging and measuring instruments designed for very accurate work, errors frequently arise due to the inability of the user to read accurately the necessarily fine graduations provided. These errors result, not from a lack of a correct understanding of the use of the instruments, but to the fact that the light reflection from the graduated area is often such as to render the graduations obscure.
The object of the present invention therefore is to remedy this defect by providing an instrument, the graduations or scales of which are visually distinct from the background thereof. This improvement is effected by treating those areas of the instrument, whic include the graduations, so as to render the areas dull in appearance, thereby enhancing the visibility of the graduations and reducing the likelihood of errors in the use of the device.
In the accompanying drawing, a micrometer embodying the present invention isillustrated. The micrometer may be of standard construction and will not be described in 1927. Serial No. 191,624.
on, the graduations and the background thereof being treated to dull the same to thereby uations.
2. A micrometer having graduations thereon, a portion of the surface thereof including said graduations being etched to provide a dull surface for the purpose of enhancing the visibility of said graduations.
In testimony whereof I have subscribed my name.
ERIK G. PEHRSSON.
detail, and, as shown in the drawing,- may have two sets of graduations 10 and-l1, the former being on the member 12 and the latter on the rotatable sleeve 13. The backgrounds of the graduations are treated to dull the surfaces thereof, as indicated at 14 and 15 in the drawing, which treated surfaces this desired result is by etching, although may be as extensive as desired and may in elude in some instances the usual figures as-' figures, although the figures may be placed k sand blastin or other methods may be used,
the technique of which methods will not be described herein. i
I In micrometers and related gauging or measuring instruments the scales or graduaccentuate the visibility of saidgrad:
US191624A 1927-05-16 1927-05-16 Micrometer or the like Expired - Lifetime US1760372A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US191624A US1760372A (en) 1927-05-16 1927-05-16 Micrometer or the like

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US191624A US1760372A (en) 1927-05-16 1927-05-16 Micrometer or the like

Publications (1)

Publication Number Publication Date
US1760372A true US1760372A (en) 1930-05-27

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
US191624A Expired - Lifetime US1760372A (en) 1927-05-16 1927-05-16 Micrometer or the like

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US (1) US1760372A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD584177S1 (en) * 2007-12-04 2009-01-06 Mitutoyo Corporation Micrometer
USD952487S1 (en) * 2020-04-14 2022-05-24 Ching-Lung Lin Thickness measurement tool

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD584177S1 (en) * 2007-12-04 2009-01-06 Mitutoyo Corporation Micrometer
USD952487S1 (en) * 2020-04-14 2022-05-24 Ching-Lung Lin Thickness measurement tool

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