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TWM638224U - Semiconductor package - Google Patents

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Publication number
TWM638224U
TWM638224U TW111210412U TW111210412U TWM638224U TW M638224 U TWM638224 U TW M638224U TW 111210412 U TW111210412 U TW 111210412U TW 111210412 U TW111210412 U TW 111210412U TW M638224 U TWM638224 U TW M638224U
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Taiwan
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electronic component
semiconductor package
thermally conductive
substrate
heat dissipation
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TW111210412U
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Chinese (zh)
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劉之寬
汪旭
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華碩電腦股份有限公司
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Priority to TW111210412U priority Critical patent/TWM638224U/en
Publication of TWM638224U publication Critical patent/TWM638224U/en

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Abstract

A semiconductor package includes a substrate, a first electronic component, a second electronic component, a heat dissipation component, a liquid metal thermal layer, and a heat conductive sealer. The first electronic component is disposed on the substrate. The first electronic component and the second electronic component are disposed on the substrate in a side-by-side manner. The heat dissipation component is disposed over the first electronic component and includes an extension portion extended over the second electronic component. The liquid metal thermal layer is disposed between and thermally coupled to the heat dissipation component and the first electronic component. The heat conductive sealer surrounds the first electronic component and is filled in a gap between the first electronic component and the second electronic component, and a gap between the second electronic component and the extension portion.

Description

半導體封裝semiconductor packaging

本揭露是有關於一種具有導熱密封件的半導體封裝。 The present disclosure relates to a semiconductor package with a thermally conductive seal.

隨著對高性能散熱能力的要求,散熱膏已逐漸無法滿足現今的散熱需求。由發熱元件與散熱裝置的熱阻決定了單位時間內熱量傳遞的多少,由此選用導熱率高、接觸面結合性好的材料對於提升散熱性能十分必要。液態金屬雖具有無毒、揮發性低、導熱係數高等特點,便成為較受歡迎的選擇。然而,液態金屬由於流動性高,填充在發熱元件與散熱裝置之間時容易有外漏及溢流的問題,若額外設置多個隔絕材來防止溢流,除了會增加組裝步驟的繁複程度以外,也會提升元件間的熱阻,降低散熱效能。 With the demand for high-performance heat dissipation, thermal paste has gradually been unable to meet today's heat dissipation requirements. The heat transfer rate per unit time is determined by the thermal resistance of the heating element and the cooling device. Therefore, it is necessary to select materials with high thermal conductivity and good contact surface bonding to improve heat dissipation performance. Although liquid metal has the characteristics of non-toxicity, low volatility and high thermal conductivity, it has become a more popular choice. However, due to the high fluidity of liquid metal, it is easy to have leakage and overflow problems when filling between the heating element and the heat sink. If additional insulating materials are provided to prevent overflow, it will not only increase the complexity of the assembly steps , will also increase the thermal resistance between components and reduce the heat dissipation performance.

本揭露提供一種半導體封裝,其可簡化組裝步驟以及提升散熱效能。 The disclosure provides a semiconductor package, which can simplify assembly steps and improve heat dissipation performance.

本揭露的一種半導體封裝包括基板、第一電子元件、第二電子元件、散熱元件、液態金屬導熱層及導熱密封件。第一電子元 件設置於基板上。第二電子元件與第一電子元件並列設置於基板上。散熱元件設置於第一電子元件上並包括延伸至第二電子元件上方的延伸部。液態金屬導熱層設置於散熱元件與第一電子元件之間並與散熱元件與第一電子元件形成熱耦接。導熱密封件環繞第一電子元件並填充於第一電子元件與第二電子元件之間的間隙以及第二電子元件與延伸部之間的間隙。 A semiconductor package disclosed in the present disclosure includes a substrate, a first electronic component, a second electronic component, a heat dissipation component, a liquid metal heat conduction layer, and a heat conduction seal. first electronic unit components are placed on the substrate. The second electronic component is arranged side by side with the first electronic component on the substrate. The heat dissipation element is disposed on the first electronic component and includes an extension extending above the second electronic component. The liquid metal thermal conduction layer is arranged between the heat dissipation element and the first electronic element and forms a thermal coupling with the heat dissipation element and the first electronic element. The thermally conductive sealing member surrounds the first electronic component and fills the gap between the first electronic component and the second electronic component and the gap between the second electronic component and the extension.

在本揭露的一實施例中,第一電子元件包主動元件,而第二電子元件包括被動元件。 In an embodiment of the present disclosure, the first electronic component includes an active component, and the second electronic component includes a passive component.

在本揭露的一實施例中,第二電子元件環繞第一電子元件設置。 In an embodiment of the present disclosure, the second electronic component is disposed around the first electronic component.

在本揭露的一實施例中,導熱密封件包括一體成形的環型結構。 In an embodiment of the present disclosure, the thermally conductive seal includes an integrally formed ring structure.

在本揭露的一實施例中,導熱密封件包括不連續但彼此連接的多個條狀結構,以共同環繞第一電子元件的周圍。 In an embodiment of the present disclosure, the thermally conductive sealing member includes a plurality of discontinuous but connected strip structures to surround the first electronic component together.

在本揭露的一實施例中,導熱密封件的導熱係數大於1W/mK。 In an embodiment of the present disclosure, the thermal conductivity of the thermally conductive seal is greater than 1 W/mK.

在本揭露的一實施例中,導熱密封件的壓縮率小於70%。 In one embodiment of the present disclosure, the compressibility of the thermally conductive seal is less than 70%.

在本揭露的一實施例中,半導體封裝更包括支撐環,其環繞基板的周圍區域。 In an embodiment of the present disclosure, the semiconductor package further includes a supporting ring surrounding the surrounding area of the substrate.

在本揭露的一實施例中,半導體封裝更包括黏著層,其設置於導熱密封件與第二電子元件之間以及導熱密封件與基板之間。 In an embodiment of the present disclosure, the semiconductor package further includes an adhesive layer disposed between the thermally conductive sealing member and the second electronic component and between the thermally conductive sealing member and the substrate.

在本揭露的一實施例中,半導體封裝更包括輔助密封環, 其環繞設置於導熱密封件的周圍。 In an embodiment of the present disclosure, the semiconductor package further includes an auxiliary sealing ring, It is arranged around the heat conducting seal.

基於上述,本揭露的半導體封裝的第一電子元件與第二電子元件彼此並排設置於基板上,導熱密封件環繞第一電子元件並填充於第一電子元件與第二電子元件之間的間隙以及第二電子元件與散熱元件之間的間隙。如此,半導體封裝100便可利用導熱密封件的高壓縮率,使導熱密封件同時填充散熱元件與第一電子元件之間的間隙以及第二電子元件與散熱元件之間的間隙,而不需以不同尺寸的密封件分別填充這兩個厚度不同的間隙。並且,導熱密封件的高導熱率的特性也可降低半導體封裝的熱阻,進而提升散熱效率。 Based on the above, the first electronic component and the second electronic component of the semiconductor package of the present disclosure are arranged side by side on the substrate, the thermally conductive sealing member surrounds the first electronic component and fills the gap between the first electronic component and the second electronic component and The gap between the second electronic component and the heat sink. In this way, the semiconductor package 100 can take advantage of the high compressibility of the thermally conductive sealant, so that the thermally conductive sealant can simultaneously fill the gap between the heat sink element and the first electronic component and the gap between the second electronic component and the heat sink element without using Seals of different sizes fill the two gaps of different thicknesses. In addition, the high thermal conductivity of the thermally conductive sealing member can also reduce the thermal resistance of the semiconductor package, thereby improving the heat dissipation efficiency.

100:半導體封裝 100: Semiconductor packaging

110:基板 110: Substrate

120:第一電子元件 120: The first electronic component

130:第二電子元件 130: the second electronic component

140:散熱元件 140: cooling element

142:延伸部 142: Extension

150:液態金屬導熱層 150: liquid metal heat conduction layer

160:導熱密封件 160: thermal seal

170:支撐環 170: support ring

180:黏著層 180: Adhesive layer

182:延伸區 182: Extended area

190:輔助密封環 190: Auxiliary sealing ring

圖1是依照本揭露的一實施例的一種半導體封裝的局部剖面示意圖。 FIG. 1 is a schematic partial cross-sectional view of a semiconductor package according to an embodiment of the disclosure.

圖2是依照本揭露的一實施例的一種半導體封裝的部分元件的立體示意圖。 FIG. 2 is a schematic perspective view of some components of a semiconductor package according to an embodiment of the disclosure.

圖3是依照本揭露的一實施例的一種半導體封裝的局部剖面示意圖。 FIG. 3 is a schematic partial cross-sectional view of a semiconductor package according to an embodiment of the disclosure.

圖4是依照本揭露的一實施例的一種半導體封裝的部分元件的立體示意圖。 FIG. 4 is a schematic perspective view of some components of a semiconductor package according to an embodiment of the disclosure.

有關本揭露之前述及其他技術內容、特點與功效,在以下配合參考圖式之各實施例的詳細說明中,將可清楚的呈現。以下實施例中所提到的方向用語,例如:「上」、「下」、「前」、「後」、「左」、「右」等,僅是參考附加圖式的方向。因此,使用的方向用語是用來說明,而並非用來限制本揭露。並且,在下列各實施例中,相同或相似的元件將採用相同或相似的標號。 The aforementioned and other technical contents, features and effects of the present disclosure will be clearly presented in the following detailed descriptions of the embodiments with reference to the drawings. The directional terms mentioned in the following embodiments, such as "upper", "lower", "front", "rear", "left", "right", etc., are only referring to the directions of the attached drawings. Accordingly, the directional terms used are for illustration, not for limitation of the present disclosure. Also, in the following embodiments, the same or similar components will be given the same or similar symbols.

圖1是依照本揭露的一實施例的一種半導體封裝的局部剖面示意圖。圖2是依照本揭露的一實施例的一種半導體封裝的部分元件的立體示意圖。在此須注意的是,圖2及圖4省略繪示了散熱元件140,以更清楚地呈現散熱元件140下方的結構配置。請參照圖1及圖2,半導體封裝100包括基板110、第一電子元件120、第二電子元件130、散熱元件140、液態金屬導熱層150以及導熱密封件160。第一電子元件120及第二電子元件130設置於基板110上。在一實施例中,第一電子元件120與第二電子元件130以並列的方式設置於基板110上。在本實施例中,第一電子元件120可包括中央處理器(CPU)、圖形處理器(GPU)等主動元件,而第二電子元件130則可包括電容、電阻、電感等被動元件。在一實施例中,第二電子元件130的數量可為多個,其分別環繞第一電子元件120而設置。在本實施例中,第二電子元件130可包括多層陶瓷電容器(Multi-layer Ceramic Capacitor,MLCC),但本揭露並不局限於此。 FIG. 1 is a schematic partial cross-sectional view of a semiconductor package according to an embodiment of the disclosure. FIG. 2 is a schematic perspective view of some components of a semiconductor package according to an embodiment of the disclosure. It should be noted here that the heat dissipation element 140 is omitted in FIG. 2 and FIG. 4 , so as to present the structural configuration under the heat dissipation element 140 more clearly. Referring to FIG. 1 and FIG. 2 , the semiconductor package 100 includes a substrate 110 , a first electronic component 120 , a second electronic component 130 , a heat dissipation component 140 , a liquid metal heat conduction layer 150 and a heat conduction seal 160 . The first electronic component 120 and the second electronic component 130 are disposed on the substrate 110 . In one embodiment, the first electronic component 120 and the second electronic component 130 are arranged side by side on the substrate 110 . In this embodiment, the first electronic component 120 may include active components such as a central processing unit (CPU), a graphics processing unit (GPU), and the second electronic component 130 may include passive components such as capacitors, resistors, and inductors. In an embodiment, the number of the second electronic components 130 may be multiple, and they are respectively disposed around the first electronic components 120 . In this embodiment, the second electronic component 130 may include a multi-layer ceramic capacitor (Multi-layer Ceramic Capacitor, MLCC), but the disclosure is not limited thereto.

在一些實施例中,散熱元件140設置於第一電子元件120上,並且,散熱元件140可包括延伸至第二電子元件130上方的延伸部142。在一實施例中,散熱元件140可包括熱管、散熱鰭片等散熱元件,用以貼附於第一電子元件120的發熱表面,以利用熱交換的模式來散熱。為了強化散熱元件140的散熱效率,一般會在散熱元件140與第一電子元件120的兩個接合表面之間塗佈導熱材料,以加強熱傳導效率。據此,在本實施例中,液態金屬導熱層150設置於散熱元件140與第一電子元件120之間,並與散熱元件140及第一電子元件120形成熱耦接。在本實施例中,液態金屬導熱層150為液態金屬導熱膏(熱界面材料),其可包括鎵-銦-錫合金等化學組合。一般而言,液態金屬材料的沸點可高達2000℃,具有非常穩定的物理和化學性質,使其在空氣中不易揮發。液態金屬是一種具有黏性的導熱化合物,其在垂直(C平面)方向具有良好的導熱性。因此,液態金屬導熱層150能夠填充兩個接合表面之間的氣隙以降低熱阻及提升散熱效能。 In some embodiments, the heat dissipation element 140 is disposed on the first electronic component 120 , and the heat dissipation element 140 may include an extension portion 142 extending above the second electronic component 130 . In one embodiment, the heat dissipation element 140 may include heat dissipation elements such as heat pipes and heat dissipation fins, which are used for attaching to the heat generating surface of the first electronic component 120 to dissipate heat in a heat exchange mode. In order to enhance the heat dissipation efficiency of the heat dissipation element 140 , generally, a heat conduction material is coated between the two bonding surfaces of the heat dissipation element 140 and the first electronic component 120 to enhance heat conduction efficiency. Accordingly, in this embodiment, the liquid metal heat conduction layer 150 is disposed between the heat dissipation element 140 and the first electronic component 120 , and forms a thermal coupling with the heat dissipation element 140 and the first electronic component 120 . In this embodiment, the liquid metal heat conduction layer 150 is a liquid metal heat conduction paste (thermal interface material), which may include a chemical combination such as gallium-indium-tin alloy. Generally speaking, liquid metal materials have a boiling point as high as 2000°C and have very stable physical and chemical properties, making them less volatile in the air. Liquid metal is a viscous thermally conductive compound with good thermal conductivity in the vertical (C-plane) direction. Therefore, the liquid metal heat conduction layer 150 can fill the air gap between the two bonding surfaces to reduce thermal resistance and improve heat dissipation performance.

液態金屬導熱層150的設置主要是用以減少散熱元件140及第一電子元件120之間的氣隙。然而,由於液態金屬導熱層150為液態,因而容易溢流至基板110上及/或第一電子元件120的周圍以外的區域進而導致半導體封裝的可靠性及電性短路等問題。因此,在一些實施例中,導熱密封件160用以環繞第一電子元件120並填充於第一電子元件120與第二電子元件130之間的間隙以及第二電子元件130與散熱元件140的延伸部142之間的間 隙,以防止液態金屬導熱層150溢流至導熱密封件160所框圍的區域之外。 The liquid metal heat conduction layer 150 is mainly used to reduce the air gap between the heat dissipation element 140 and the first electronic element 120 . However, since the liquid metal heat conduction layer 150 is in a liquid state, it is easy to overflow to the substrate 110 and/or areas other than the first electronic component 120 to cause problems such as reliability and electrical short circuit of the semiconductor package. Therefore, in some embodiments, the thermally conductive seal 160 is used to surround the first electronic component 120 and fill the gap between the first electronic component 120 and the second electronic component 130 and the extension of the second electronic component 130 and the heat dissipation component 140 Between Section 142 gaps to prevent the liquid metal heat conduction layer 150 from overflowing beyond the area enclosed by the heat conduction seal 160 .

在一實施例中,導熱密封件160可如圖2所示為一體成形的環型結構,在其他實施例中,導熱密封件也可如圖4所示為不連續但彼此連接的條狀結構,以共同環繞第一電子元件120的周圍。在本實施例中,導熱密封件160的材料可包括矽脂、矽膠等具高導熱係數及高壓縮率的密封材。在一實施例中,導熱密封件160的導熱係數約可大於1W/mK,舉例而言,本實施例的導熱密封件160的導熱係數約介於3W/mK至5W/mK之間。在一實施例中,導熱密封件160的壓縮率約可小於70%,舉例而言,本實施例的導熱密封件160的壓縮率約可小於50%。壓縮率是指一個物體對壓力改變造成的相對體積改變的度量,壓縮率越高代表這個物體對壓力改變所造成的相對體積改變越大。如此,本揭露的半導體封裝100使用具有高壓縮率的高導熱密封件160便可使導熱密封件160同時填充散熱元件140與第一電子元件120之間的間隙以及第二電子元件130與散熱元件140的延伸部142之間的間隙,而不需以不同尺寸的密封件分別填充這兩個厚度不同的間隙。並且,導熱密封件160的高導熱率的特性也可降低半導體封裝100的熱阻,進而提升散熱效率。 In one embodiment, the heat conduction seal 160 can be an integrally formed ring structure as shown in FIG. 2 . In other embodiments, the heat conduction seal 160 can also be a discontinuous but connected strip structure as shown in FIG. 4 , so as to surround the first electronic component 120 together. In this embodiment, the material of the thermally conductive sealing member 160 may include silicone grease, silicone glue and other sealing materials with high thermal conductivity and high compression rate. In one embodiment, the thermal conductivity of the thermally conductive sealing member 160 may be greater than 1 W/mK. For example, the thermal conductivity of the thermally conductive sealing member 160 in this embodiment is approximately between 3 W/mK and 5 W/mK. In one embodiment, the compressibility of the thermally conductive sealing member 160 may be less than 70%. For example, the compressibility of the thermally conductive sealing member 160 in this embodiment may be less than 50%. Compressibility refers to the measure of the relative volume change caused by an object’s pressure change. The higher the compressibility, the greater the relative volume change caused by the pressure change. In this way, the semiconductor package 100 of the present disclosure uses the high thermal conductivity sealing member 160 with a high compression rate so that the thermal conductive sealing member 160 can simultaneously fill the gap between the heat dissipation element 140 and the first electronic component 120 and the second electronic component 130 and the heat dissipation element. The gap between the extension portion 142 of 140 does not need to fill the two gaps with different thicknesses with sealing members of different sizes. Moreover, the high thermal conductivity of the thermally conductive sealing member 160 can also reduce the thermal resistance of the semiconductor package 100 , thereby improving the heat dissipation efficiency.

在一實施例中,半導體封裝100更可包括支撐環170,其環繞基板110的周圍區域,以增加半導體封裝100的結構強度,進而降低半導體封裝100的翹曲。在一實施例中,支撐環170的 材料可包括金屬等硬度較高的材料,其可環繞基板110的周邊,以增強基板110的結構強度,因而能減少因各材料間的熱膨脹係數(Coefficient of Thermal Expansion,CTE)不同而導致的翹曲問題。 In one embodiment, the semiconductor package 100 may further include a supporting ring 170 surrounding the surrounding area of the substrate 110 to increase the structural strength of the semiconductor package 100 and thereby reduce warpage of the semiconductor package 100 . In one embodiment, the support ring 170 The material can include a material with high hardness such as metal, which can surround the periphery of the substrate 110 to enhance the structural strength of the substrate 110, thereby reducing warpage caused by differences in coefficients of thermal expansion (Coefficient of Thermal Expansion, CTE) between various materials. song problem.

在一實施例中,半導體封裝100更可包括黏著層180,其設置於導熱密封件160與第二電子元件130之間以及導熱密封件160與基板110之間,以將導熱密封件160貼附於第二電子元件130與基板110上。具體而言,黏著層180可先貼附於導熱密封件160上,再將導熱密封件160環繞第一電子元件120設置,使其承靠並貼附於第二電子元件130與基板110上。在一實施例中,黏著層180可包括聚醯亞胺薄膜(polyimide(PI)film)。此外,黏著層180可包括延伸區182,其可延伸貼附至支撐環170的上表面。 In one embodiment, the semiconductor package 100 may further include an adhesive layer 180 disposed between the thermally conductive seal 160 and the second electronic component 130 and between the thermally conductive seal 160 and the substrate 110 to attach the thermally conductive seal 160 on the second electronic component 130 and the substrate 110 . Specifically, the adhesive layer 180 can be attached to the thermally conductive sealing member 160 first, and then the thermally conductive sealing member 160 is disposed around the first electronic component 120 to be supported and attached to the second electronic component 130 and the substrate 110 . In one embodiment, the adhesive layer 180 may include a polyimide (PI) film. In addition, the adhesive layer 180 can include an extension area 182 that can be extended and attached to the upper surface of the support ring 170 .

圖3是依照本揭露的一實施例的一種半導體封裝的局部剖面示意圖。圖4是依照本揭露的一實施例的一種半導體封裝的部分元件的立體示意圖。在此必須說明的是,本實施例的半導體封裝100與前述實施例的半導體封裝100相似,因此,本實施例沿用前述實施例的元件標號與部分內容,其中採用相同的標號來表示相同或近似的元件,並且省略了相同技術內容的說明。關於省略部分的說明可參考前述實施例,本實施例不再重複贅述。以下將主要針對本實施例的半導體封裝100與前述實施例的半導體封裝100之間的差異做說明。 FIG. 3 is a schematic partial cross-sectional view of a semiconductor package according to an embodiment of the disclosure. FIG. 4 is a schematic perspective view of some components of a semiconductor package according to an embodiment of the disclosure. It must be noted here that the semiconductor package 100 of this embodiment is similar to the semiconductor package 100 of the preceding embodiment, therefore, this embodiment follows the component numbers and part of the content of the previous embodiment, where the same number is used to indicate the same or similar elements, and the description of the same technical content is omitted. For the description of the omitted part, reference may be made to the foregoing embodiments, and this embodiment will not be repeated. The following will mainly focus on the differences between the semiconductor package 100 of this embodiment and the semiconductor package 100 of the previous embodiments.

在一實施例中,半導體封裝100a更可包括輔助密封環190, 其環繞設置於導熱密封件160a的周圍,以進一步防止液態金屬導熱層150的溢流。在本實施例中,輔助密封環190與導熱密封件160a可以並排的方式設置於基板110上。在一實施例中,輔助密封環190的材料可包括泡棉。在一實施例中,輔助密封環190的導熱係數約可小於導熱密封件160a的導熱係數。舉例而言,本實施例的輔助密封環190的導熱係數約介於0.04W/mK至0.05W/mK之間。在一實施例中,輔助密封環190的壓縮率約可小於導熱密封件160的壓縮率。舉例而言,本實施例的輔助密封環190的壓縮率約可小於70%。當然,本實施例僅用以舉例說明,本揭露並不以此為限。在本實施例中,導熱密封件160a可如圖4所示為不連續但彼此連接的條狀結構,以共同環繞第一電子元件120的周圍。 In one embodiment, the semiconductor package 100a may further include an auxiliary sealing ring 190, It is arranged around the heat conduction seal 160a to further prevent the liquid metal heat conduction layer 150 from overflowing. In this embodiment, the auxiliary sealing ring 190 and the thermally conductive sealing member 160a can be arranged side by side on the substrate 110 . In an embodiment, the material of the auxiliary sealing ring 190 may include foam. In one embodiment, the thermal conductivity of the auxiliary seal ring 190 may be approximately less than the thermal conductivity of the thermally conductive seal 160a. For example, the thermal conductivity of the auxiliary sealing ring 190 in this embodiment is approximately between 0.04W/mK and 0.05W/mK. In one embodiment, the compressibility of the auxiliary seal ring 190 may be approximately less than the compressibility of the thermally conductive seal 160 . For example, the compression ratio of the auxiliary sealing ring 190 in this embodiment may be less than 70%. Of course, this embodiment is only used for illustration, and the disclosure is not limited thereto. In this embodiment, as shown in FIG. 4 , the thermally conductive sealing member 160 a may be a discontinuous but connected strip structure to surround the first electronic component 120 together.

綜上所述,本揭露的半導體封裝的第一電子元件與第二電子元件彼此並排設置於基板上,導熱密封件環繞第一電子元件並填充於第一電子元件與第二電子元件之間的間隙以及第二電子元件與散熱元件之間的間隙。如此,半導體封裝100便可利用導熱密封件的高壓縮率,使導熱密封件同時填充散熱元件與第一電子元件之間的間隙以及第二電子元件與散熱元件之間的間隙,而不需以不同尺寸的密封件分別填充這兩個厚度不同的間隙。並且,導熱密封件的高導熱率的特性也可降低半導體封裝的熱阻,進而提升散熱效率。 In summary, in the semiconductor package of the present disclosure, the first electronic component and the second electronic component are arranged side by side on the substrate, and the thermally conductive seal surrounds the first electronic component and fills the space between the first electronic component and the second electronic component. The gap and the gap between the second electronic component and the heat dissipation component. In this way, the semiconductor package 100 can take advantage of the high compressibility of the thermally conductive sealant, so that the thermally conductive sealant can simultaneously fill the gap between the heat sink element and the first electronic component and the gap between the second electronic component and the heat sink element without using Seals of different sizes fill the two gaps of different thicknesses. In addition, the high thermal conductivity of the thermally conductive sealing member can also reduce the thermal resistance of the semiconductor package, thereby improving the heat dissipation efficiency.

100:半導體封裝 100: Semiconductor packaging

110:基板 110: Substrate

120:第一電子元件 120: The first electronic component

130:第二電子元件 130: the second electronic component

140:散熱元件 140: cooling element

142:延伸部 142: Extension

150:液態金屬導熱層 150: liquid metal heat conduction layer

160:導熱密封件 160: thermal seal

170:支撐環 170: support ring

180:黏著層 180: Adhesive layer

182:延伸區 182: Extended area

Claims (10)

一種半導體封裝,包括: 一基板; 一第一電子元件,設置於該基板上; 一第二電子元件,與該第一電子元件並列地設置於該基板上; 一散熱元件,設置於該第一電子元件上並包括延伸至該第二電子元件上方的一延伸部; 一液態金屬導熱層,設置於該散熱元件與該第一電子元件之間並與該散熱元件及該第一電子元件形成熱耦接; 導熱密封件,環繞該第一電子元件並填充於該第一電子元件與該第二電子元件之間的間隙以及該第二電子元件與該延伸部之間的間隙。 A semiconductor package comprising: a substrate; a first electronic component disposed on the substrate; a second electronic component, arranged side by side with the first electronic component on the substrate; A heat dissipation element is disposed on the first electronic component and includes an extension extending above the second electronic component; A liquid metal heat conduction layer is arranged between the heat dissipation element and the first electronic component and forms a thermal coupling with the heat dissipation element and the first electronic component; The thermally conductive seal surrounds the first electronic component and fills the gap between the first electronic component and the second electronic component and the gap between the second electronic component and the extension. 如請求項1所述的半導體封裝,其中該第一電子元件包括主動元件,而該第二電子元件包括被動元件。The semiconductor package as claimed in claim 1, wherein the first electronic component comprises an active component, and the second electronic component comprises a passive component. 如請求項1所述的半導體封裝,其中該第二電子元件環繞該第一電子元件設置。The semiconductor package as claimed in claim 1, wherein the second electronic component is disposed around the first electronic component. 如請求項1所述的半導體封裝,其中該導熱密封件包括一體成形的環型結構。The semiconductor package as claimed in claim 1, wherein the thermally conductive seal comprises an integrally formed ring structure. 如請求項1所述的半導體封裝,其中該導熱密封件包括不連續但彼此連接的多個條狀結構,以共同環繞該第一電子元件的周圍。The semiconductor package as claimed in claim 1, wherein the thermally conductive sealing member comprises a plurality of discontinuous but connected strip structures to surround the first electronic component together. 如請求項1所述的半導體封裝,其中該導熱密封件的導熱係數大於1 W/mK。The semiconductor package of claim 1, wherein the thermal conductivity of the thermally conductive seal is greater than 1 W/mK. 如請求項1所述的半導體封裝,其中該導熱密封件的壓縮率小於70%。The semiconductor package of claim 1, wherein the thermally conductive seal has a compressibility of less than 70%. 如請求項1所述的半導體封裝,更包括一支撐環,其環繞該基板的周圍區域。The semiconductor package as claimed in claim 1, further comprising a support ring surrounding the surrounding area of the substrate. 如請求項1所述的半導體封裝,更包括一黏著層,其設置於該導熱密封件與該第二電子元件之間以及該導熱密封件與該基板之間。The semiconductor package as claimed in claim 1 further comprises an adhesive layer disposed between the thermally conductive sealing member and the second electronic component and between the thermally conductive sealing member and the substrate. 如請求項1所述的半導體封裝,更包括一輔助密封環,其環繞設置於該導熱密封件的周圍。The semiconductor package as claimed in claim 1, further comprising an auxiliary sealing ring disposed around the thermally conductive sealing member.
TW111210412U 2022-09-23 2022-09-23 Semiconductor package TWM638224U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI864971B (en) * 2023-08-18 2024-12-01 華碩電腦股份有限公司 Electronic assembly and manufacturing method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI864971B (en) * 2023-08-18 2024-12-01 華碩電腦股份有限公司 Electronic assembly and manufacturing method thereof

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