TWM636093U - Rework apparatus - Google Patents
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- TWM636093U TWM636093U TW111209432U TW111209432U TWM636093U TW M636093 U TWM636093 U TW M636093U TW 111209432 U TW111209432 U TW 111209432U TW 111209432 U TW111209432 U TW 111209432U TW M636093 U TWM636093 U TW M636093U
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- film
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- 229910000679 solder Inorganic materials 0.000 claims abstract description 46
- 239000013078 crystal Substances 0.000 claims abstract description 17
- 239000012790 adhesive layer Substances 0.000 claims abstract description 15
- 230000007246 mechanism Effects 0.000 claims description 25
- 238000007789 sealing Methods 0.000 claims description 14
- 230000002950 deficient Effects 0.000 claims description 8
- 238000004891 communication Methods 0.000 claims description 2
- 238000005086 pumping Methods 0.000 claims 3
- 238000001179 sorption measurement Methods 0.000 claims 3
- 238000000034 method Methods 0.000 abstract description 8
- 230000008569 process Effects 0.000 abstract description 6
- 239000010408 film Substances 0.000 description 58
- 230000009471 action Effects 0.000 description 5
- 238000003825 pressing Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 230000008439 repair process Effects 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
- Control And Other Processes For Unpacking Of Materials (AREA)
- Sink And Installation For Waste Water (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
一種返修裝置,適用於設置在用以承載一待修物件的工作台上方並供安裝一具有延展性的薄膜,且該薄膜的一表面設有黏膠層,以移除該待修物件上的不良晶粒或錫球,或是重置晶粒於該待修物件,該返修裝置包含用以將該薄膜固定並能呈微繃緊狀態的一固持模組,及可真空吸附該薄膜且具有一針體以頂推該薄膜的一頂推模組。返修裝置可應用於移除晶粒、錫球以及補晶的工序,不僅具有多樣用途,且能因應晶粒及錫球尺寸調整頂推模組的針體尺寸,而能小範圍移除單一晶粒或錫球,不會影響附近不需移除的晶粒及錫球,同時返修裝置本身也不會被汙染。A repairing device, which is suitable for being installed above a workbench for carrying an object to be repaired and for installing a ductile film, and a surface of the film is provided with an adhesive layer to remove the object on the object to be repaired Bad crystal grains or solder balls, or reset crystal grains on the object to be repaired, the rework device includes a holding module for fixing the film and can be in a slightly tensioned state, and can vacuum absorb the film and has A needle is used to push a pushing module for pushing the film. The rework device can be applied to the process of removing dies, solder balls, and refilling dies. It not only has multiple uses, but also can adjust the needle size of the push module according to the size of dies and solder balls, and can remove a single die in a small area. No chips or solder balls will affect nearby chips and solder balls that do not need to be removed, and the rework device itself will not be polluted.
Description
本新型是有關於一種返修裝置,特別是指一種用於修補電路板的返修裝置。The present invention relates to a rework device, in particular to a rework device for repairing circuit boards.
一般焊接多個LED晶粒的電路板,若是其中幾個晶粒為不良品,需要將不良品的晶粒及焊接晶粒的錫球移除後,再重新焊接替補的晶粒,藉此避免整個電路板報廢,以降低損失。Generally, if a circuit board with multiple LED chips is soldered, if some of the chips are defective, it is necessary to remove the defective chips and the solder balls of the soldered chips, and then re-solder the replacement chips to avoid The entire circuit board is scrapped to reduce losses.
目前移除電路板上晶粒及錫球的方式,大多是利用吸嘴吸除。但是,此移除方式,不僅容易造成吸嘴汙染,而需要常更換吸嘴,且移除的範圍受限於吸嘴的大小。由於晶粒尺寸越來越小,而吸嘴尺寸較大無法與單一晶粒的尺寸配合,容易一併吸取在不良晶粒附近的良好晶粒。At present, most of the ways to remove the die and solder balls on the circuit board are to use suction nozzles to remove them. However, this removal method not only easily causes contamination of the suction nozzle, but also requires frequent replacement of the suction nozzle, and the removal range is limited by the size of the suction nozzle. Since the grain size is getting smaller and smaller, and the size of the suction nozzle is larger and cannot match the size of a single grain, it is easy to pick up good grains near the bad grains.
因此,本新型之一目的,即在提供一種可以解決前述問題的返修裝置。Therefore, one purpose of the present invention is to provide a rework device that can solve the aforementioned problems.
於是,本新型返修裝置在一些實施態樣中,適用於設置在用以承載一待修物件的工作台上方並供安裝一具有延展性的薄膜,且該薄膜的一表面設有黏膠層,以移除該待修物件上的不良晶粒或錫球,或是重置晶粒於該待修物件,該返修裝置包含:一固持模組及一頂推模組。該固持模組包括一承載框及一加壓框,以將該薄膜固定並能呈微繃緊狀態。該頂推模組設置在該固持模組上方,並包括一基座及一頂針機構。該基座具有面向該薄膜的一底壁並界定一氣體通道,該底壁具有一針孔及多個分布於該針孔周圍的氣孔,該氣體通道與該等氣孔相連通且連接一抽氣裝置,用以於該底壁真空吸附該薄膜。該頂針機構沿上下方向設於該基座且部分位於該氣體通道內並具有一針體,該針體可受操作通過該針孔穿出該底壁以頂推該薄膜。Therefore, in some embodiments, the new rework device is suitable for being installed above a workbench for carrying an object to be repaired and for installing a ductile film, and a surface of the film is provided with an adhesive layer. To remove bad chips or solder balls on the object to be repaired, or to reset chips on the object to be repaired, the rework device includes: a holding module and a pushing module. The holding module includes a bearing frame and a pressing frame to fix the film and be in a slightly tensioned state. The pushing module is arranged above the holding module, and includes a base and an ejector mechanism. The base has a bottom wall facing the film and defines a gas channel, the bottom wall has a pinhole and a plurality of air holes distributed around the pinhole, the gas channel communicates with the air holes and is connected to a gas pump The device is used to vacuum absorb the film on the bottom wall. The thimble mechanism is arranged on the base along the up-down direction and is partly located in the gas passage, and has a needle body, which can be operated to pass through the pinhole and pass through the bottom wall to push the film.
在一些實施態樣中,該基座具有一座體、連接該座體且具有該底壁的一帽蓋、設於該座體與該帽蓋之間的一第一密封環,及設於該座體與該頂針機構之間的一第二密封環,該第一密封環與該第二密封環用以阻斷該氣體通道與外界環境連通。In some embodiments, the base has a base, a cap connected to the base and having the bottom wall, a first sealing ring disposed between the base and the cap, and a first sealing ring disposed between the base and the cap. A second sealing ring between the base body and the thimble mechanism, the first sealing ring and the second sealing ring are used to block the gas channel from communicating with the external environment.
在一些實施態樣中,該承載框供該薄膜藉由該黏膠層黏附固定且使該黏膠層朝下,該加壓框具有水平設置的一環板部及自該環板部內緣垂直延伸的一環推部,該環板部靠抵於該承載框並使該薄膜夾置於該環板部與該承載框之間,且該環推部往下頂推該薄膜以將該薄膜撐張。In some embodiments, the supporting frame is used for the film to be adhered and fixed by the adhesive layer and the adhesive layer faces downward, and the pressure frame has a horizontally arranged ring plate portion and vertically extends from the inner edge of the ring plate portion. a ring pushing part, the ring plate part leans against the carrying frame and sandwiches the film between the ring plate part and the carrying frame, and the ring pushing part pushes down the film to stretch the film .
在一些實施態樣中,該承載框及該加壓框為內外相配合的子母環。In some implementation aspects, the bearing frame and the pressurizing frame are sub-mother rings matched inside and outside.
本新型返修裝置在一些實施態樣中,適用於設置在用以承載一待修電路板的工作台上方並供安裝一具有延展性的薄膜,且該薄膜的一表面設有黏膠層,以移除該待修電路板上的不良晶粒或錫球,該返修裝置包含:一固持模組及一頂推模組。該固持模組包括一承載框及一加壓框,以將該薄膜固定並能呈微繃緊狀態。該頂推模組設置在該固持模組上方,並包括一基座及一頂針機構。該基座具有面向該薄膜的一底壁並界定一氣體通道,該底壁具有一針孔及多個分布於該針孔周圍的氣孔,該氣體通道與該等氣孔相連通且連接一抽氣裝置,用以於該底壁真空吸附該薄膜。該頂針機構沿上下方向設於該基座且部分位於該氣體通道內並具有一針體,該針體可受操作通過該針孔穿出該底壁以於對應待移除的晶粒或錫球的位置頂推該薄膜,使該薄膜黏附待移除的晶粒或錫球。In some embodiments, the new rework device is suitable for being installed above a workbench for carrying a circuit board to be repaired and for installing a ductile film, and a surface of the film is provided with an adhesive layer, so as to To remove bad grains or solder balls on the circuit board to be repaired, the rework device includes: a holding module and a pushing module. The holding module includes a bearing frame and a pressing frame to fix the film and be in a slightly tensioned state. The pushing module is arranged above the holding module, and includes a base and an ejector mechanism. The base has a bottom wall facing the film and defines a gas channel, the bottom wall has a pinhole and a plurality of air holes distributed around the pinhole, the gas channel communicates with the air holes and is connected to a gas pump The device is used to vacuum absorb the film on the bottom wall. The thimble mechanism is arranged on the base along the up and down direction and is partly located in the gas channel, and has a needle body, which can be operated to pass through the pinhole to pass through the bottom wall to correspond to the crystal grain or tin to be removed. The position of the ball pushes against the film, causing the film to adhere to the die or solder ball to be removed.
本新型返修裝置在一些實施態樣中,適用於設置在用以承載一待修電路板的工作台上方並供安裝一具有延展性的薄膜,且該薄膜的一表面黏附多個用於替補的晶粒,該待修電路板設有待補晶的錫球,該返修裝置包含:一固持模組及一頂推模組。該固持模組包括一承載框及一加壓框,以將該薄膜固定並能呈微繃緊狀態。該頂推模組設置在該固持模組上方,並包括一基座及一頂針機構。該基座具有面向該薄膜的一底壁並界定一氣體通道,該底壁具有一針孔及多個分布於該針孔周圍的氣孔,該氣體通道與該等氣孔相連通且連接一抽氣裝置,用以於該底壁真空吸附該薄膜。該頂針機構沿上下方向設於該基座且部分位於該氣體通道內並具有一針體,該針體可受操作通過該針孔穿出該底壁以於對應待替補的晶粒的位置頂推該薄膜,使該待替補的晶粒轉移至待補晶的錫球上。In some embodiments, the new rework device is suitable for being installed above a workbench for carrying a circuit board to be repaired and for installing a ductile film, and a surface of the film is adhered to a plurality of replacement parts. Die, the circuit board to be repaired is provided with solder balls to be repaired, and the rework device includes: a holding module and a pushing module. The holding module includes a bearing frame and a pressing frame to fix the film and be in a slightly tensioned state. The pushing module is arranged above the holding module, and includes a base and an ejector mechanism. The base has a bottom wall facing the film and defines a gas channel, the bottom wall has a pinhole and a plurality of air holes distributed around the pinhole, the gas channel communicates with the air holes and is connected to a gas pump The device is used to vacuum absorb the film on the bottom wall. The thimble mechanism is arranged on the base along the up-down direction and partly located in the gas channel, and has a needle body, which can be operated to pass through the bottom wall through the pinhole to push against the position corresponding to the crystal grain to be replaced. Pushing the film, so that the crystal grain to be replaced is transferred to the solder ball to be replaced.
本新型具有以下功效:本新型返修裝置可應用於移除晶粒、錫球以及補晶的工序,不僅具有多樣用途,且能因應晶粒及錫球尺寸調整頂推模組的針體尺寸,而能小範圍移除單一晶粒或錫球,不會影響附近不需移除的晶粒及錫球,同時返修裝置本身也不會被汙染。This new model has the following effects: This new rework device can be applied to the process of removing dies, solder balls, and repairing dies. It not only has multiple uses, but also can adjust the needle body size of the push module according to the size of dies and solder balls. It can remove a single die or solder ball in a small area without affecting nearby die and solder balls that do not need to be removed, and the rework device itself will not be polluted.
參閱圖1與圖9,本新型返修裝置100之一實施例,適用於設置在用以承載一待修物件A的工作台(未圖示)上方並供安裝一具有延展性的薄膜B,以移除該待修物件A上的不良晶粒A1或錫球A2,或是重置晶粒於該待修物件A。例如,該待修物件A是一待修電路板A’,如圖1所示,所安裝的薄膜B用以移除該待修電路板A’上的不良晶粒A1或錫球A2,如圖9所示,所安裝的薄膜B’的一表面黏附多個用於替補的晶粒B1,該待修電路板A’設有待補晶的錫球A2以供設置替補的晶粒B1。Referring to Fig. 1 and Fig. 9, one embodiment of the
參閱圖1至圖3,該返修裝置100包含一固持模組1及一頂推模組2。該固持模組1包括一承載框11及一加壓框12,以將該薄膜B固定並能呈微繃緊狀態。在本實施例中,該薄膜B的一表面設有黏膠層B2,該承載框11為晶圓框架(wafer frame),供該薄膜B藉由該黏膠層B2黏附固定且使該黏膠層B2朝下。該加壓框12為擴張環,具有水平設置的一環板部121及自該環板部121內緣垂直延伸的一環推部122。該承載框11與該加壓框12設於一夾持機構13,該夾持機構13包括一基板131、一遮蓋132,及分別設於該遮蓋132相對兩側的一對夾指133,該基板131與該對夾指133由多個連接組件134連接且可相對開合。該加壓框12的環板部121固定於該基板131,該承載框11可分離地由該對夾指133固持。欲安裝該承載框11時,需將該夾持機構13打開,使該基板131與該對夾指133分開,待置入該承載框11後,再將該夾持機構13關閉,使該基板131與該對夾指133靠合,如圖3的剖視示意圖所示,此時該加壓框12的環板部121靠抵於該承載框11並使該薄膜B夾置於該環板部121與該承載框11之間,且該環推部122往下頂推該薄膜B以將該薄膜B撐張,而使該薄膜B呈微繃緊狀態。在變化的實施例,該承載框11及該加壓框12也可以採用現有的內外相配合的子母環(未圖示),同樣能使薄膜呈微繃緊狀態。Referring to FIGS. 1 to 3 , the
參閱圖1、圖4至圖6,該頂推模組2設置在該固持模組1上方,並包括一基座21及一頂針機構22。在本實施例中,該基座21界定一氣體通道211並具有一座體212、連接該座體212的一帽蓋213、設於該座體212與該帽蓋213之間的一第一密封環214,及設於該座體212與該頂針機構22之間的一第二密封環215。該第一密封環214與該第二密封環215用以阻斷該氣體通道211與外界環境連通。該帽蓋213具有面向該薄膜B的一底壁213a。該底壁213a具有一針孔213b及多個分布於該針孔213b周圍的氣孔213c,該氣體通道211與該等氣孔213c相連通。在該座體212設有連通該氣體通道211的一氣壓接頭216以連接一抽氣裝置(未圖示),藉以對該氣體通道211抽氣,用以於該底壁213a真空吸附該薄膜B。該頂針機構22沿上下方向設於該基座21且部分位於該氣體通道211內並具有一針座221及一針體222,該針體222可受操作通過該針孔213b穿出該底壁213a以頂推該薄膜B。Referring to FIG. 1 , FIG. 4 to FIG. 6 , the
參閱圖1、圖7與圖8,使用該返修裝置100移除不良晶粒A1的動作流程說明如下。先將該頂推模組2移動至工作位置,使該針體222的位置與待移除的不良晶粒A1的位置上下相對應。然後將該頂推模組2下降至工作高度再對該氣體通道211抽氣使該薄膜B真空吸附於該底壁213a,而後使該針體222通過該針孔213b穿出該底壁213a,以於對應待移除的不良晶粒A1的位置頂推該薄膜B,使該薄膜B黏附待移除的不良晶粒A1。藉由使該薄膜B真空吸附於該底壁213a,能使該針體222伸出該底壁213a時,使該薄膜B貼附於該針體222以減少該薄膜B凸伸出的面積,即可縮小該薄膜B可黏附晶粒的範圍,而能精確的黏附單一晶粒。當該薄膜B黏取不良晶粒A1後,使該針體222退回至該底壁213a內,再將抽氣關閉,而後使該頂推模組2上升回到原本高度,如此即完成移除一個不良晶粒A1的動作流程。有多個不良晶粒A1即重複多次前述動作流程,而移除不良錫球A2的動作流程與移除不良晶粒A1的動作流程相同。該針體222的尺寸以及該薄膜B的黏膠層B2的黏性大小,可以依據待移除晶粒A1及錫球A2的尺寸而調整。藉此移除晶粒A1及錫球A2的方式,不僅能夠小範圍單點移除單一晶粒A1或單一錫球A2,而且該針體222不會直接接觸晶粒A1及錫球A2,並可更換薄膜B,使該返修裝置100不會受到汙染。Referring to FIG. 1 , FIG. 7 and FIG. 8 , the operation flow of removing the defective die A1 using the
參閱圖9至圖11,該待修電路板A’移除不良晶粒A1及錫球A2後,可利用點錫設備在移除錫球A2的位置再設置錫球A2,而後使用該返修裝置100補晶。使用該返修裝置100補晶時,需安裝表面黏附多個用於替補的晶粒B1的薄膜B’,例如藍膜或UV膜,補晶動作流程說明如下。先將該頂推模組2移動至工作位置,使該針體222的位置與待補晶粒的錫球A2位置上下相對應。然後將該頂推模組2下降至工作高度,再使該針體222通過該針孔213b穿出該底壁213a,以於對應待替補的晶粒B1的位置頂推該薄膜B’並使待替補的晶粒B1接觸錫球A2,而後對該氣體通道211抽氣使該薄膜B’真空吸附於該底壁213a,使該待替補的晶粒B1轉移至待補晶的錫球A2上。藉由使該薄膜B’真空吸附於該底壁213a,能使該薄膜B’貼附於該針體222,以減少該薄膜B’黏附該待替補的晶粒B1的面積,使該待替補的晶粒B1容易脫離該薄膜B’而轉移至錫球A2上。而後使該針體222退回至該底壁213a內,再將抽氣關閉,接著使該頂推模組2上升回到原本高度,如此即完成補充一個晶粒的動作流程。有多個位置需要補充晶粒即重複多次前述動作流程。Referring to Fig. 9 to Fig. 11, after the defective grain A1 and solder ball A2 are removed from the circuit board A' to be repaired, the solder ball A2 can be installed at the position where the solder ball A2 was removed by using the solder spotting equipment, and then the rework device can be used 100 refill crystals. When using the
在一機台可以設置至少兩個返修裝置100,其中一個返修裝置100用於移除晶粒及錫球,另一個返修裝置100用於補晶,而能提升生產效率。At least two
綜上所述,本新型返修裝置100可應用於移除晶粒、錫球以及補晶的工序,不僅具有多樣用途,且能因應晶粒及錫球尺寸調整頂推模組2的針體222尺寸,而能小範圍移除單一晶粒或錫球,不會影響附近不需移除的晶粒及錫球,同時返修裝置100本身也不會被汙染。To sum up, the
惟以上所述者,僅為本新型之實施例而已,當不能以此限定本新型實施之範圍,凡是依本新型申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。But the above-mentioned ones are only embodiments of the present invention, and should not limit the scope of implementation of the present invention with this. All simple equivalent changes and modifications made according to the patent scope of the present application and the content of the patent specification are still within the scope of the present invention. Within the scope covered by this patent.
100:返修裝置
1:固持模組
11:承載框
12:加壓框
121:環板部
122:環推部
13:夾持機構
131:基板
132:遮蓋
133:夾指
134:連接組件
2:頂推模組
21:基座
211:氣體通道
212:座體
213:帽蓋
213a:底壁
213b:針孔
213c:氣孔
214:第一密封環
215:第二密封環
216:氣壓接頭
22:頂針機構
221:針座
222:針體
A:待修物件
A’:待修電路板
A1:不良晶粒
A2:錫球
B:薄膜
B’:薄膜
B1:替補的晶粒
B2:黏膠層100: Rework device
1: Holding module
11: Bearing frame
12: Pressurized frame
121: ring plate part
122: ring push department
13: Clamping mechanism
131: Substrate
132: cover
133: pinch finger
134: Connection components
2: push module
21: base
211: gas channel
212: seat body
213:
本新型之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是本新型返修裝置的一實施例裝載薄膜以移除待修物件的晶粒及錫球的一側視示意圖; 圖2是該實施例的固持模組與夾持機構的一立體分解圖; 圖3是該實施例的固持模組在固持薄膜狀態之一截面示意圖; 圖4是該實施例的頂推模組的一立體圖; 圖5是該頂推模組的一剖視圖; 圖6是該頂推模組的一不完整的立體圖; 圖7與圖8為類似圖1的側視示意圖,並與圖1相配合說明該實施例移除晶粒的動作流程;及 圖9至圖11為類似圖1的側視示意圖,說明該實施例用於補晶的動作流程。 Other features and functions of the present invention will be clearly presented in the implementation manner with reference to the drawings, wherein: Fig. 1 is a side view schematic diagram of an embodiment of the new rework device loaded with film to remove crystal grains and solder balls of the object to be repaired; Fig. 2 is a three-dimensional exploded view of the holding module and the clamping mechanism of the embodiment; Fig. 3 is a schematic cross-sectional view of the holding module of this embodiment in a holding film state; Fig. 4 is a perspective view of the pushing module of this embodiment; Fig. 5 is a sectional view of the pushing module; Fig. 6 is an incomplete perspective view of the pushing module; 7 and FIG. 8 are schematic side views similar to FIG. 1, and cooperate with FIG. 1 to illustrate the operation process of removing the die in this embodiment; and FIG. 9 to FIG. 11 are schematic side views similar to FIG. 1 , illustrating the operation flow of this embodiment for crystal replenishment.
100:返修裝置 100: Rework device
1:固持模組 1: Holding module
11:承載框 11: Bearing frame
12:加壓框 12: Pressurized frame
2:頂推模組 2: push module
21:基座 21: base
22:頂針機構 22: Ejector mechanism
222:針體 222: needle body
A:待修物件 A: Items to be repaired
A’:待修電路板 A’: circuit board to be repaired
A1:不良晶粒 A1: Bad grain
A2:錫球 A2: solder ball
B:薄膜 B: film
B2:黏膠層 B2: Adhesive layer
Claims (6)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111209432U TWM636093U (en) | 2022-08-31 | 2022-08-31 | Rework apparatus |
| CN202222674034.1U CN218388138U (en) | 2022-08-31 | 2022-10-11 | Rework device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW111209432U TWM636093U (en) | 2022-08-31 | 2022-08-31 | Rework apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM636093U true TWM636093U (en) | 2023-01-01 |
Family
ID=84929190
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW111209432U TWM636093U (en) | 2022-08-31 | 2022-08-31 | Rework apparatus |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN218388138U (en) |
| TW (1) | TWM636093U (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116598236B (en) * | 2023-07-19 | 2023-10-13 | 昆山鸿义精微科技有限公司 | Grain sorting method and sorting system |
| WO2025116643A1 (en) * | 2023-12-01 | 2025-06-05 | 삼성전자 주식회사 | Repair kit device for arranging sealing member |
-
2022
- 2022-08-31 TW TW111209432U patent/TWM636093U/en unknown
- 2022-10-11 CN CN202222674034.1U patent/CN218388138U/en active Active
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| Publication number | Publication date |
|---|---|
| CN218388138U (en) | 2023-01-24 |
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