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TWM612412U - Wet processing apparatus - Google Patents

Wet processing apparatus Download PDF

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Publication number
TWM612412U
TWM612412U TW110201928U TW110201928U TWM612412U TW M612412 U TWM612412 U TW M612412U TW 110201928 U TW110201928 U TW 110201928U TW 110201928 U TW110201928 U TW 110201928U TW M612412 U TWM612412 U TW M612412U
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Taiwan
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fluid
volatile
processing equipment
wet processing
deionized water
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TW110201928U
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Chinese (zh)
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蘇左將
張芳丕
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頂程國際股份有限公司
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Priority to TW110201928U priority Critical patent/TWM612412U/en
Publication of TWM612412U publication Critical patent/TWM612412U/en

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Abstract

A wet processing apparatus includes a carrying plate, a deionized water spraying device, a multi-fluid spraying device, and a dry gas jetting device. The carrying plate is configured to carry an object. The deionized water spraying device is disposed over the carrying plate, and is configured to spray first deionized water toward the object. The multi-fluid spraying device is disposed over the carrying plate, and is configured to spray a mixture fluid toward the object. The mixture fluid includes second deionized water, water steam, and a volatile fluid. The dry gas jetting device is disposed over the carrying plate, and is configured to jet dry gas toward the object.

Description

濕式處理設備Wet processing equipment

本揭露是有關於一種濕式處理技術,且特別是有關於一種濕式處理設備。The present disclosure relates to a wet treatment technology, and particularly relates to a wet treatment equipment.

以液體對製造物件進行例如清洗與蝕刻等濕式處理已廣泛地應用於電子製造產業中。舉例而言,利用單晶圓旋轉濕式蝕刻設備對晶圓進行蝕刻製程時,會經過單次或多次之酸性或鹼性蝕刻液的蝕刻或清洗液的清洗。在濕式處理過程中,不同酸性或鹼性處理液的轉換之間通常以去離子(DI)水來去除將晶圓上殘留之酸性或鹼性處理液。此外,於完成所有酸性或鹼性處理液的處理步驟後,亦需利用去離子水沖洗殘留在晶圓上的酸性或鹼性處理液。因此,每片晶圓在整個蝕刻製程所需之去離子水的使用量相當大。而且,在濕式處理期間,大部分的去離子水會因晶圓的高速旋轉而迅速的被甩出晶圓,導致去離子水的清洗效果有限。Wet processing such as cleaning and etching of manufactured objects with liquids has been widely used in the electronics manufacturing industry. For example, when a single wafer rotary wet etching equipment is used to perform an etching process on a wafer, it will go through a single or multiple etching with an acid or alkaline etching solution or cleaning with a cleaning solution. In the wet processing process, deionized (DI) water is usually used to remove the residual acid or alkaline processing liquid on the wafer between the conversion between different acidic or alkaline processing solutions. In addition, after all the processing steps of the acidic or alkaline treatment solution are completed, the remaining acidic or alkaline treatment solution on the wafer needs to be rinsed with deionized water. Therefore, the amount of deionized water required for each wafer in the entire etching process is quite large. Moreover, during wet processing, most of the deionized water will be quickly thrown out of the wafer due to the high-speed rotation of the wafer, resulting in a limited cleaning effect of the deionized water.

在水資源有限的情況下,已迫使各大半導體廠積極進行去離子水的使用減量與回收再利用。因此,亟需一種可兼顧濕式處理效果的提升與去離子水之使用量的減少的濕式處理技術。In the case of limited water resources, major semiconductor factories have been forced to actively reduce the use of deionized water and recycle. Therefore, there is an urgent need for a wet treatment technology that can balance the improvement of the wet treatment effect and the reduction of the usage of deionized water.

因此,本揭露之一目的就是在提供一種濕式處理設備,其可以輪流對物件噴灑去離子水,以及包含去離子水、水蒸汽、與揮發性流體之混合流體的霧狀小分子。水蒸汽小分子可減少濕式處理時去離子水的使用量,並可提升清洗效果。此外,揮發性流體的揮發可提供殘留在物件上之處理液與微粒擴散與移動動能,而可縮短清洗時間,進一步降低去離子水的使用量,並可提升去除效率,更可避免破壞物件,進而可降低產品缺陷,提升良率。Therefore, one of the objectives of the present disclosure is to provide a wet treatment equipment that can spray deionized water on objects in turn, and mist-like small molecules containing a mixed fluid of deionized water, water vapor, and volatile fluid. Small water vapor molecules can reduce the amount of deionized water used in wet processing and improve the cleaning effect. In addition, the volatilization of volatile fluids can provide kinetic energy for the diffusion and movement of processing liquids and particles remaining on the object, which can shorten the cleaning time, further reduce the amount of deionized water used, and improve the removal efficiency, and can prevent damage to the object. In turn, product defects can be reduced and yield can be improved.

本揭露之另一目的就是在提供一種濕式處理設備,其可以包含乾燥氮氣與揮發性溶液飽和蒸氣的二流體來噴吹物件。揮發性溶液飽和蒸氣的揮發可快速帶走物件上殘留之水分,藉此可更快速的旋乾物件,而可降低噴吹時間,進而可提升乾燥效率,不僅可有效降低乾燥氮氣的使用量,更可提升產能。此外,物件上的水分被快速帶走可降低水印(watermark)缺陷的形成機率,而可減少產品缺陷與提升良率。Another purpose of the present disclosure is to provide a wet processing equipment, which can contain two fluids of dry nitrogen and saturated vapor of a volatile solution to spray objects. The volatilization of the saturated vapor of the volatile solution can quickly take away the remaining moisture on the object, which can spin dry the object more quickly, and can reduce the spraying time, thereby improving the drying efficiency, not only effectively reducing the amount of dry nitrogen used, but also It can also increase production capacity. In addition, the moisture on the object is quickly taken away, which can reduce the probability of forming watermark defects, thereby reducing product defects and improving yield.

根據本揭露之上述目的,提出一種濕式處理設備。此濕式處理設備包含承載盤、去離子水噴灑裝置、多流體噴灑裝置、以及乾燥氣體噴射裝置。承載盤配置以承載物件。去離子水噴灑裝置設於承載盤之上方,且配置以朝物件噴灑第一去離子水。多流體噴灑裝置設於承載盤之上方,且配置以朝物件噴灑混合流體。此混合流體包含第二去離子水、水蒸汽、與揮發性流體。乾燥氣體噴射裝置設於承載盤之上方,且配置以朝物件噴射乾燥氣體。According to the above objective of the present disclosure, a wet processing equipment is proposed. The wet processing equipment includes a carrier plate, a deionized water spray device, a multi-fluid spray device, and a dry gas spray device. The carrying tray is configured to carry objects. The deionized water spraying device is arranged above the carrying plate and is configured to spray the first deionized water toward the object. The multi-fluid spraying device is arranged above the carrying plate and is configured to spray mixed fluids toward the object. The mixed fluid includes second deionized water, water vapor, and volatile fluid. The dry gas spray device is arranged above the carrier plate and is configured to spray the dry gas toward the object.

依據本揭露之一實施例,上述之濕式處理設備更包含多流體產生裝置、揮發性流體供應裝置、水蒸汽產生器、以及去離子水供應裝置。多流體產生裝置與多流體噴灑裝置流體連通,且配置以產生混合流體與供應此混合流體給多流體噴灑裝置。揮發性流體供應裝置與多流體產生裝置流體連通,且配置以供應揮發性流體給多流體產生裝置。水蒸汽產生器與多流體產生裝置流體連通,且配置以產生水蒸汽與供應水蒸汽給多流體產生裝置。去離子水供應裝置與多流體產生裝置流體連通,且配置以供應第二去離子水給多流體產生裝置。According to an embodiment of the present disclosure, the aforementioned wet processing equipment further includes a multi-fluid generating device, a volatile fluid supply device, a steam generator, and a deionized water supply device. The multi-fluid generating device is in fluid communication with the multi-fluid spraying device and is configured to generate mixed fluid and supply the mixed fluid to the multi-fluid spraying device. The volatile fluid supply device is in fluid communication with the multi-fluid generating device and is configured to supply the volatile fluid to the multi-fluid generating device. The water vapor generator is in fluid communication with the multi-fluid generating device, and is configured to generate water vapor and supply water vapor to the multi-fluid generating device. The deionized water supply device is in fluid communication with the multi-fluid generating device and is configured to supply the second deionized water to the multi-fluid generating device.

依據本揭露之一實施例,上述之揮發性流體為揮發性溶液飽和蒸氣。而且,揮發性流體供應裝置包含揮發性溶液飽和蒸氣產生器以及載氣供應裝置。揮發性溶液飽和蒸氣產生器配置以產生揮發性溶液飽和蒸氣。載氣供應裝置配置以提供氮氣來將揮發性溶液飽和蒸氣運載至多流體產生裝置。According to an embodiment of the present disclosure, the above-mentioned volatile fluid is saturated vapor of a volatile solution. Moreover, the volatile fluid supply device includes a volatile solution saturated vapor generator and a carrier gas supply device. The volatile solution saturated vapor generator is configured to generate volatile solution saturated vapor. The carrier gas supply device is configured to provide nitrogen to carry the saturated vapor of the volatile solution to the multi-fluid generating device.

依據本揭露之一實施例,上述之載氣供應裝置更包含溫度控制器,配置以控制氮氣之溫度。上述之去離子水供應裝置更包含另一溫度控制器,配置以控制第二去離子水之溫度。According to an embodiment of the present disclosure, the aforementioned carrier gas supply device further includes a temperature controller configured to control the temperature of the nitrogen gas. The aforementioned deionized water supply device further includes another temperature controller configured to control the temperature of the second deionized water.

依據本揭露之一實施例,上述之乾燥氣體噴射裝置為乾燥氮氣噴射裝置。According to an embodiment of the present disclosure, the above-mentioned dry gas injection device is a dry nitrogen injection device.

依據本揭露之一實施例,上述之乾燥氣體噴射裝置為乾燥氮氣二流體噴射裝置。而且,濕式處理設備更包含揮發性溶液飽和蒸氣產生器以及載氣供應裝置。揮發性溶液飽和蒸氣產生器與乾燥氣體噴射裝置流體連通,且配置以產生揮發性流體中之揮發性溶液飽和蒸氣。載氣供應裝置配置以提供乾燥氮氣來將揮發性溶液飽和蒸氣運載至乾燥氣體噴射裝置。According to an embodiment of the present disclosure, the above-mentioned dry gas injection device is a dry nitrogen two-fluid injection device. Moreover, the wet processing equipment further includes a volatile solution saturated vapor generator and a carrier gas supply device. The volatile solution saturated vapor generator is in fluid communication with the dry gas injection device, and is configured to generate the volatile solution saturated vapor in the volatile fluid. The carrier gas supply device is configured to provide dry nitrogen gas to carry the saturated vapor of the volatile solution to the dry gas injection device.

依據本揭露之一實施例,上述之濕式處理設備更包含乾燥氮氣噴射裝置,設於承載盤之上方,且配置以朝物件噴射另一乾燥氮氣。According to an embodiment of the present disclosure, the above-mentioned wet processing equipment further includes a dry nitrogen spray device, which is arranged above the carrier plate and is configured to spray another dry nitrogen gas toward the object.

依據本揭露之一實施例,上述之載氣供應裝置更包含溫度控制器,配置以控制乾燥氮氣之溫度。According to an embodiment of the present disclosure, the aforementioned carrier gas supply device further includes a temperature controller configured to control the temperature of the dry nitrogen.

依據本揭露之一實施例,上述之濕式處理設備更包含蝕刻液噴灑裝置,設於承載盤之上方,且配置以朝物件噴灑蝕刻液。According to an embodiment of the present disclosure, the above-mentioned wet processing equipment further includes an etching solution spraying device, which is disposed above the carrier plate and configured to spray the etching solution toward the object.

依據本揭露之一實施例,上述之濕式處理設備更包含夾持裝置、氣浮裝置、轉軸、以及馬達。夾持裝置設於承載盤上,且配置以夾持固定物件。氣浮裝置設於承載盤上,且配置以抬升物件使物件與承載盤分隔開。轉軸與承載盤連接,且配置以旋轉承載盤。馬達與轉軸連接,且配置以驅動轉軸。According to an embodiment of the present disclosure, the above-mentioned wet processing equipment further includes a clamping device, an air floatation device, a rotating shaft, and a motor. The clamping device is arranged on the carrying plate and configured to clamp the fixed object. The air flotation device is arranged on the carrying tray and is configured to lift the object to separate the object from the carrying tray. The rotating shaft is connected with the bearing plate and is configured to rotate the bearing plate. The motor is connected to the rotating shaft and is configured to drive the rotating shaft.

本揭露所敘述之二元件之間的空間關係不僅適用於圖式所繪示之方位,亦適用於圖式所未呈現之方位,例如倒置之方位。此外,本揭露所稱二個部件的「連接」或類似用語並非僅限制於此二者為直接的連接,亦可視需求而包含間接的連接。關於本文中所使用之「第一」、「第二」、…等,並非特別指次序或順位的意思,其僅為了區別以相同技術用語描述的元件或操作。The spatial relationship between the two elements described in this disclosure is not only applicable to the orientation shown in the diagram, but also applicable to the orientation not shown in the diagram, such as the inverted orientation. In addition, the term "connection" or similar terms between the two components mentioned in the present disclosure is not limited to the direct connection between the two components, and may also include indirect connection as required. Regarding the “first”, “second”, etc. used in this text, it does not specifically refer to the order or sequence, but only to distinguish the elements or operations described in the same technical terms.

請參照圖1,其係繪示依照本揭露之一實施方式的一種濕式處理設備的裝置示意圖。濕式處理設備100可應用在電子裝置於製作過程中的濕式處理,例如清洗、蝕刻等等。舉例而言,濕式處理設備100可為晶圓清洗設備、晶圓蝕刻設備、或晶圓蝕刻與清洗設備。在一些例子中,濕式處理設備100主要包含承載盤110、去離子水噴灑裝置120、多流體噴灑裝置130、以及乾燥氣體噴射裝置。乾燥氣體噴射裝置可例如為乾燥氮氣噴射裝置140或乾燥氮氣二流體噴射裝置150。在一些例子中,濕式處理設備100可包含乾燥氮氣噴射裝置140、或乾燥氮氣二流體噴射裝置150、或者乾燥氮氣噴射裝置140與乾燥氮氣二流體噴射裝置150。Please refer to FIG. 1, which is a schematic diagram of a wet processing equipment according to an embodiment of the present disclosure. The wet processing equipment 100 can be applied to wet processing in the manufacturing process of electronic devices, such as cleaning, etching, and so on. For example, the wet processing equipment 100 may be a wafer cleaning equipment, a wafer etching equipment, or a wafer etching and cleaning equipment. In some examples, the wet processing equipment 100 mainly includes a carrier plate 110, a deionized water spray device 120, a multi-fluid spray device 130, and a dry gas spray device. The dry gas spraying device may be, for example, a dry nitrogen spraying device 140 or a dry nitrogen two-fluid spraying device 150. In some examples, the wet processing equipment 100 may include a dry nitrogen spraying device 140, or a dry nitrogen two-fluid spraying device 150, or a dry nitrogen spraying device 140 and a dry nitrogen two-fluid spraying device 150.

承載盤110可用以承載待進行濕式處理之物件160,例如晶圓。承載盤110具有承載面112,物件160設置在承載面112之上。在一些例子中,濕式處理設備100可包含夾持裝置170。此夾持裝置170可設於承載盤110之承載面112上,而可用以將物件160夾持固定在承載面112之上。舉例而言,夾持裝置170可為夾持梢。濕式處理設備100亦可具有不同固定裝置來固定物件160。舉例而言,可利用靜電吸盤來將物件160固定在承載盤110之承載面112上。The carrier tray 110 can be used to carry an object 160 to be wet-processed, such as a wafer. The supporting tray 110 has a supporting surface 112, and the object 160 is disposed on the supporting surface 112. In some examples, the wet processing equipment 100 may include a clamping device 170. The clamping device 170 can be arranged on the carrying surface 112 of the carrying tray 110 and can be used to clamp and fix the object 160 on the carrying surface 112. For example, the clamping device 170 may be a clamping pin. The wet processing equipment 100 may also have different fixing devices to fix the object 160. For example, an electrostatic chuck can be used to fix the object 160 on the carrying surface 112 of the carrier plate 110.

濕式處理設備100更可選擇性地包含氣浮裝置180。此氣浮裝置180可設於承載盤110中,且氣浮裝置180可朝承載面112噴射氣體,以抬升物件160,使物件160與承載盤110之承載面112分隔開,而不會直接接觸承載面112。The wet processing equipment 100 may further optionally include an air flotation device 180. The air flotation device 180 can be arranged in the carrier plate 110, and the air flotation device 180 can spray gas toward the carrying surface 112 to lift the object 160 so that the object 160 is separated from the carrying surface 112 of the carrier plate 110 without directly Contact the bearing surface 112.

在一些例子中,濕式處理設備100為可旋轉的處理設備。在這樣的例子中,濕式處理設備100更可包含轉軸190與馬達200。轉軸190與承載盤110連接,且可旋轉承載盤110。馬達200與轉軸190連接,且可以驅動轉軸190轉動,進而帶動承載盤110旋轉。In some examples, the wet processing equipment 100 is a rotatable processing equipment. In such an example, the wet processing equipment 100 may further include a rotating shaft 190 and a motor 200. The rotating shaft 190 is connected to the carrier plate 110 and can rotate the carrier plate 110. The motor 200 is connected to the rotating shaft 190 and can drive the rotating shaft 190 to rotate, thereby driving the carrier plate 110 to rotate.

去離子水噴灑裝置120設於承載盤110之承載面112的上方,且位於承載盤110所承載之物件160之上。去離子水噴灑裝置120可朝此物件160之表面162噴灑第一去離子水,來清洗物件160。The deionized water spray device 120 is arranged above the carrying surface 112 of the carrying tray 110 and on the object 160 carried by the carrying tray 110. The deionized water spray device 120 can spray the first deionized water toward the surface 162 of the object 160 to clean the object 160.

多流體噴灑裝置130同樣設於承載盤110之承載面112的上方,且位於物件160之上。多流體噴灑裝置130可例如鄰近去離子水噴灑裝置120。多流體噴灑裝置130可朝物件160之表面162噴灑混合流體。此混合流體包含多種流體的混合。在一些例子中,此混合流體包含第二去離子水、水蒸汽、與揮發性流體。揮發性流體可包含揮發性溶液及/或揮發性溶液飽和蒸氣。舉例而言,揮發性溶液可為異丙醇(IPA)。去離子水噴灑裝置120與多流體噴灑裝置130可交替運轉,以輪流朝物件160之表面162噴灑去離子水與混合流體。The multi-fluid spraying device 130 is also arranged above the carrying surface 112 of the carrying tray 110 and above the object 160. The multi-fluid spraying device 130 may be adjacent to the deionized water spraying device 120, for example. The multi-fluid spraying device 130 can spray mixed fluids toward the surface 162 of the object 160. This mixed fluid includes a mixture of multiple fluids. In some examples, the mixed fluid includes second deionized water, water vapor, and volatile fluid. The volatile fluid may include a volatile solution and/or saturated vapor of the volatile solution. For example, the volatile solution may be isopropanol (IPA). The deionized water spraying device 120 and the multi-fluid spraying device 130 can alternately operate to spray the deionized water and the mixed fluid on the surface 162 of the object 160 in turn.

請先參照圖4,其係繪示依照本揭露之一實施方式之移除殘留在物件上之處理液與微粒的示意圖。在一些例子中,物件160之表面162上設有許多元件的圖案結構164。酸性或鹼性的處理液PF與微粒PC殘留在物件160之表面162上,且可能落在圖案結構164之間。多流體噴灑裝置130可噴出混合流體霧狀小分子。混合流體MF中之水蒸汽的熱效果可產生氣穴現象。氣穴現象係在混合常溫純水與高溫水蒸氣時,因熱交換而產生具有某種程度之頻率,例如10KHz至1MHz的振動。這樣的振動可提供能量而將水分子分解為氫離子與氫氧離子,不穩定之氫離子與氫氧離子再次回到水分子時所產生之高能量可轉換為機械性衝擊,藉此水分子可迅速與物件160之表面162上殘留的酸性或鹼性的處理液PF及微粒PC結合。多流體噴灑裝置130噴出混合流體霧狀小分子,不僅可減少去離子水的使用量,亦可提升清洗效果。Please refer to FIG. 4 first, which is a schematic diagram of removing the processing liquid and particles remaining on the object according to an embodiment of the present disclosure. In some examples, the surface 162 of the object 160 is provided with a pattern structure 164 of many elements. The acidic or alkaline treatment liquid PF and particles PC remain on the surface 162 of the object 160 and may fall between the pattern structures 164. The multi-fluid spray device 130 can spray small molecules in the mist of mixed fluid. The thermal effect of water vapor in the mixed fluid MF can cause cavitation. Cavitation is when pure water at room temperature and high temperature water vapor are mixed, a certain degree of frequency, such as 10KHz to 1MHz, is generated due to heat exchange. Such vibrations can provide energy to decompose water molecules into hydrogen ions and hydroxide ions. The high energy generated when unstable hydrogen ions and hydroxide ions return to water molecules can be converted into mechanical shocks, thereby water molecules It can be quickly combined with the remaining acidic or alkaline treatment liquid PF and particulate PC on the surface 162 of the object 160. The multi-fluid spray device 130 sprays the mixed fluid mist-like small molecules, which can not only reduce the consumption of deionized water, but also improve the cleaning effect.

此外,多流體噴灑裝置130所噴出之混合流體MF中的揮發性流體,例如揮發性溶液及/或揮發性溶液飽和蒸氣,的揮發可提供殘留之處理液PF與微粒PC額外的擴散與移動動能。圖4之箭頭AR表示混合流體MF中之揮發性溶液飽和蒸氣的移動方向,揮發性溶液飽和蒸氣在揮發的過程中提供移動與擴散動能給處理液PF與微粒PC。藉此,殘留在物件160上的處理液PF與微粒PC可隨著混合流體MF而被迅速帶走。因此,可進一步降低去離子水的使用量,並可提升殘留處理液PF與微粒PC的去除效率。而由於殘留之處理液PF與微粒PC的去除效果提升,因此多流體噴灑裝置130可不需要使用太大的噴射力即可有效去除殘留之處理液PF與微粒PC。故,可降低對物件160之表面162上之圖案結構164的衝擊,例如可降低對晶圓之元件圖案結構的衝擊,而可避免物件160受損,進而可降低物件160的缺陷,有效提升產品良率。In addition, the volatilization of the volatile fluid in the mixed fluid MF sprayed by the multi-fluid spraying device 130, such as the volatile solution and/or the saturated vapor of the volatile solution, can provide additional diffusion and movement kinetic energy for the remaining processing liquid PF and particulate PC . The arrow AR in FIG. 4 indicates the moving direction of the saturated vapor of the volatile solution in the mixed fluid MF. The saturated vapor of the volatile solution provides movement and diffusion kinetic energy to the processing liquid PF and the particles PC during the volatilization process. Thereby, the processing liquid PF and the particulate PC remaining on the object 160 can be quickly taken away with the mixed fluid MF. Therefore, the amount of deionized water used can be further reduced, and the removal efficiency of the residual treatment liquid PF and particulate PC can be improved. Since the removal effect of the remaining processing liquid PF and particulate PC is improved, the multi-fluid spray device 130 can effectively remove the remaining processing liquid PF and particulate PC without using too much spray force. Therefore, the impact on the pattern structure 164 on the surface 162 of the object 160 can be reduced, for example, the impact on the device pattern structure of the wafer can be reduced, and damage to the object 160 can be avoided, thereby reducing the defects of the object 160 and effectively improving the product. Yield.

請同時參照圖1與圖2,其中圖2係繪示依照本揭露之一實施方式的一種濕式處理設備之多流體供應系統的裝置示意圖。在一些例子中,濕式處理設備100更可包含多流體供應系統300。多流體供應系統300可與多流體噴灑裝置130流體連通,且可提供多種流體之混合流體給多流體噴灑裝置130。在一些例子中,多流體供應系統300主要可包含多流體產生裝置310、揮發性流體供應裝置320、水蒸汽產生器330、以及去離子水供應裝置340。Please refer to FIG. 1 and FIG. 2 at the same time. FIG. 2 is a schematic diagram of a multi-fluid supply system of a wet processing equipment according to an embodiment of the present disclosure. In some examples, the wet processing equipment 100 may further include a multi-fluid supply system 300. The multi-fluid supply system 300 can be in fluid communication with the multi-fluid spraying device 130 and can provide a mixed fluid of multiple fluids to the multi-fluid spraying device 130. In some examples, the multi-fluid supply system 300 may mainly include a multi-fluid generating device 310, a volatile fluid supply device 320, a steam generator 330, and a deionized water supply device 340.

多流體產生裝置310可與多流體噴灑裝置130流體連通。多流體產生裝置310可產生混合流體,並將所產生之混合流體供應給多流體噴灑裝置130。多流體產生裝置310可產生第二去離子水、揮發性流體、與水蒸汽的混合流體。The multi-fluid generating device 310 may be in fluid communication with the multi-fluid spraying device 130. The multi-fluid generating device 310 can generate a mixed fluid and supply the generated mixed fluid to the multi-fluid spraying device 130. The multi-fluid generating device 310 can generate a mixed fluid of the second deionized water, a volatile fluid, and water vapor.

揮發性流體供應裝置320可與多流體產生裝置310流體連通,而可供應揮發性流體給多流體產生裝置310。在一些示範例子中,揮發性流體供應裝置320所供應之揮發性流體為揮發性溶液飽和蒸氣。如圖2所示,在這樣的例子中,揮發性流體供應裝置320可例如包含揮發性溶液飽和蒸氣產生器322以及載氣供應裝置324。揮發性溶液飽和蒸氣產生器322可與多流體產生裝置310流體連通。揮發性溶液飽和蒸氣產生器322可產生揮發性溶液飽和蒸氣,並將揮發性溶液飽和蒸氣供應給多流體產生裝置310。The volatile fluid supply device 320 may be in fluid communication with the multi-fluid generating device 310 and may supply volatile fluid to the multi-fluid generating device 310. In some exemplary examples, the volatile fluid supplied by the volatile fluid supply device 320 is saturated vapor of the volatile solution. As shown in FIG. 2, in such an example, the volatile fluid supply device 320 may include, for example, a volatile solution saturated vapor generator 322 and a carrier gas supply device 324. The volatile solution saturated vapor generator 322 may be in fluid communication with the multi-fluid generating device 310. The volatile solution saturated vapor generator 322 can generate the volatile solution saturated vapor and supply the volatile solution saturated vapor to the multi-fluid generating device 310.

載氣供應裝置324則可與揮發性溶液飽和蒸氣產生器322流體連通。載氣供應裝置324可提供載氣給揮發性溶液飽和蒸氣產生器322,藉以利用載氣來將揮發性溶液飽和蒸氣產生器322所產生之揮發性溶液飽和蒸氣載送至多流體產生裝置310。載氣可例如為氮氣。在一些示範例子中,載氣供應裝置324更可包含溫度控制器326。溫度控制器326配置以控制供應給揮發性溶液飽和蒸氣產生器322之載氣,例如氮氣的溫度。溫度控制器326的配置可對載氣進行各種溫度的設定,而可擴展濕式處理設備100的應用性,例如高溫製程的應用。The carrier gas supply device 324 can be in fluid communication with the volatile solution saturated vapor generator 322. The carrier gas supply device 324 can provide carrier gas to the volatile solution saturated vapor generator 322, so as to use the carrier gas to carry the volatile solution saturated vapor generated by the volatile solution saturated vapor generator 322 to the multi-fluid generator 310. The carrier gas may be nitrogen, for example. In some exemplary examples, the carrier gas supply device 324 may further include a temperature controller 326. The temperature controller 326 is configured to control the temperature of the carrier gas, such as nitrogen, supplied to the volatile solution saturated vapor generator 322. The configuration of the temperature controller 326 can set various temperatures of the carrier gas, and can expand the applicability of the wet processing equipment 100, such as the application of high-temperature processes.

在其他例子中,揮發性流體供應裝置320所供應之揮發性流體為揮發性溶液。在這樣的例子中,揮發性流體供應裝置320所提供之揮發性溶液可直接經由管路流到多流體產生裝置310中,因而無需載氣供應裝置324。揮發性流體供應裝置320可選擇性地配置溫度控制器(未繪示),以控制所供應之揮發性溶液的溫度。In other examples, the volatile fluid supplied by the volatile fluid supply device 320 is a volatile solution. In such an example, the volatile solution provided by the volatile fluid supply device 320 can directly flow into the multi-fluid generating device 310 via the pipeline, so the carrier gas supply device 324 is not required. The volatile fluid supply device 320 can optionally be equipped with a temperature controller (not shown) to control the temperature of the supplied volatile solution.

水蒸汽產生器330同樣可與多流體產生裝置310流體連通。水蒸汽產生器330可產生水蒸汽,並將水蒸氣供應給多流體產生裝置310。The steam generator 330 may also be in fluid communication with the multi-fluid generating device 310. The water vapor generator 330 may generate water vapor and supply the water vapor to the multi-fluid generating device 310.

去離子水供應裝置340可與多流體產生裝置310流體連通。藉此,去離子水供應裝置340可供應第二去離子水給多流體產生裝置310。在一些示範例子中,去離子水供應裝置340更可包含溫度控制器342,以控制供應給多流體產生裝置310之第二去離子水的溫度,以利擴展濕式處理設備100的應用性。The deionized water supply device 340 may be in fluid communication with the multi-fluid generating device 310. In this way, the deionized water supply device 340 can supply the second deionized water to the multi-fluid generating device 310. In some exemplary examples, the deionized water supply device 340 may further include a temperature controller 342 to control the temperature of the second deionized water supplied to the multi-fluid generating device 310 so as to expand the applicability of the wet processing equipment 100.

在一些例子中,請繼續參照圖1,乾燥氣體噴射裝置,例如乾燥氮氣噴射裝置140及/或乾燥氮氣二流體噴射裝置150,設於承載盤110之上方,且配置以朝承載面112上之物件160之表面162噴射乾燥氣體,來去除物件160上的殘留液體,以乾燥物件160。乾燥氮氣噴射裝置140可朝物件160噴射乾燥氮氣。乾燥氮氣二流體噴射裝置150則可朝物件160之表面162噴射乾燥氮氣與揮發性溶液飽和蒸氣,即此時的乾燥氣體包含乾燥氮氣與揮發性溶液飽和蒸氣。當濕式處理設備100同時包含乾燥氮氣噴射裝置140與乾燥氮氣二流體噴射裝置150時,乾燥氮氣噴射裝置140與乾燥氮氣二流體噴射裝置150可輪流對物件160之表面162噴射乾燥氣體。In some examples, please continue to refer to FIG. 1, a dry gas injection device, such as a dry nitrogen gas injection device 140 and/or a dry nitrogen two-fluid injection device 150, is disposed above the carrier plate 110 and is configured to face the supporting surface 112. The surface 162 of the object 160 is sprayed with drying gas to remove the residual liquid on the object 160 to dry the object 160. The dry nitrogen spray device 140 can spray dry nitrogen toward the object 160. The dry nitrogen two-fluid spray device 150 can spray dry nitrogen and volatile solution saturated vapor toward the surface 162 of the object 160, that is, the dry gas at this time includes dry nitrogen and volatile solution saturated vapor. When the wet processing equipment 100 includes a dry nitrogen spraying device 140 and a dry nitrogen two-fluid spraying device 150, the dry nitrogen spraying device 140 and the dry nitrogen two-fluid spraying device 150 can spray dry gas on the surface 162 of the object 160 in turn.

請同時參照圖1與圖3,其中圖3係繪示依照本揭露之一實施方式的一種濕式處理設備之乾燥氮氣二流體供應系統的裝置示意圖。在濕式處理設備100至少包含有乾燥氮氣二流體噴射裝置150的例子中,濕式處理設備100更可包含乾燥氮氣二流體供應系統400。乾燥氮氣二流體供應系統400可與乾燥氮氣二流體噴射裝置150流體連通,且可提供二種乾燥流體給乾燥氮氣二流體噴射裝置150。在一些例子中,乾燥氮氣二流體供應系統400主要可包含揮發性溶液飽和蒸氣產生器410以及載氣供應裝置420。Please refer to FIGS. 1 and 3 at the same time. FIG. 3 is a schematic diagram of a dry nitrogen two-fluid supply system of a wet processing equipment according to an embodiment of the present disclosure. In an example where the wet processing equipment 100 includes at least a dry nitrogen two-fluid injection device 150, the wet processing equipment 100 may further include a dry nitrogen two-fluid supply system 400. The dry nitrogen two-fluid supply system 400 can be in fluid communication with the dry nitrogen two-fluid injection device 150 and can provide two kinds of dry fluids to the dry nitrogen two-fluid injection device 150. In some examples, the dry nitrogen two-fluid supply system 400 may mainly include a volatile solution saturated vapor generator 410 and a carrier gas supply device 420.

揮發性溶液飽和蒸氣產生器410可與乾燥氮氣二流體噴射裝置150流體連通。揮發性溶液飽和蒸氣產生器410可產生揮發性溶液飽和蒸氣,並將揮發性溶液飽和蒸氣供應給乾燥氮氣二流體噴射裝置150。The volatile solution saturated vapor generator 410 may be in fluid communication with the dry nitrogen two-fluid injection device 150. The volatile solution saturated vapor generator 410 can generate the volatile solution saturated vapor and supply the volatile solution saturated vapor to the dry nitrogen two-fluid injection device 150.

載氣供應裝置420可與揮發性溶液飽和蒸氣產生器410流體連通。載氣供應裝置420可提供載氣給揮發性溶液飽和蒸氣產生器410。藉此,可利用載氣將揮發性溶液飽和蒸氣產生器410所產生之揮發性溶液飽和蒸氣載送至乾燥氮氣二流體噴射裝置150。載氣可例如為乾燥氮氣。在一些示範例子中,載氣供應裝置420更可包含溫度控制器422。溫度控制器422配置以控制供應給揮發性溶液飽和蒸氣產生器410之載氣,例如乾燥氮氣的溫度。The carrier gas supply device 420 may be in fluid communication with the volatile solution saturated vapor generator 410. The carrier gas supply device 420 can provide carrier gas to the volatile solution saturated vapor generator 410. Thereby, the volatile solution saturated vapor generated by the volatile solution saturated vapor generator 410 can be carried to the dry nitrogen two-fluid injection device 150 by the carrier gas. The carrier gas can be dry nitrogen, for example. In some exemplary examples, the carrier gas supply device 420 may further include a temperature controller 422. The temperature controller 422 is configured to control the temperature of the carrier gas, such as dry nitrogen, supplied to the volatile solution saturated vapor generator 410.

乾燥氮氣二流體噴射裝置150可噴出乾燥氮氣與揮發性溶液飽和蒸氣。揮發性液體飽和蒸汽的揮發可將殘留在物件160之表面162上的水分快速帶走,因此可降低乾燥製程的時間,而可降低乾燥氮氣的使用量。此外,由於乾燥氮氣與揮發性液體飽和蒸汽之二流體可更快速地旋乾物件160之表面162上的水分,因此可大幅提升乾燥效率,而可降低水印缺陷在物件160之表面162上的形成機率,進而可降低產品缺陷與提升良率,並可提高產量。The dry nitrogen two-fluid spray device 150 can spray dry nitrogen and saturated vapor of volatile solution. The volatilization of the saturated vapor of the volatile liquid can quickly take away the moisture remaining on the surface 162 of the object 160, so that the time of the drying process can be reduced, and the amount of dry nitrogen used can be reduced. In addition, since the two fluids of dry nitrogen and volatile liquid saturated steam can spin dry the moisture on the surface 162 of the object 160 more quickly, the drying efficiency can be greatly improved, and the formation of watermark defects on the surface 162 of the object 160 can be reduced. Probability, which in turn can reduce product defects and improve yield, and increase production.

在一些例子中,如圖1所示,濕式處理設備100可為濕式蝕刻處理設備,而更包含蝕刻液噴灑裝置210。蝕刻液噴灑裝置210同樣設於承載盤110之承載面112的上方,且可朝物件160之表面162噴灑蝕刻液。蝕刻液可例如為酸性溶液或鹼性溶液。在一些示範例子中,濕式處理設備100為單晶圓旋轉濕式蝕刻設備。In some examples, as shown in FIG. 1, the wet processing equipment 100 may be a wet etching processing equipment, and further includes an etching liquid spraying device 210. The etching liquid spraying device 210 is also arranged above the bearing surface 112 of the carrier plate 110 and can spray the etching liquid toward the surface 162 of the object 160. The etching solution can be, for example, an acidic solution or an alkaline solution. In some exemplary examples, the wet processing equipment 100 is a single wafer rotary wet etching equipment.

在一些例子中,可利用濕式處理設備100對物件160濕式清洗處理。請參照圖1,在這樣的例子中,可利用去離子水噴灑裝置120對物件160噴灑第一去離子水,且可利用多流體噴灑裝置130對此物件160噴灑混合流體。混合流體可包含第二去離子水、水蒸汽、與揮發性流體。揮發性流體可例如包含揮發性溶液及/或揮發性溶液飽和蒸氣。可以交替方式,利用去離子水噴灑裝置120與多流體噴灑裝置130來對物件160輪流噴灑第一去離子水與混合流體。對物件160噴灑第一去離子與混合流體時,可利用馬達200來驅動轉軸190,以帶動承載盤110及其上之物件160旋轉。In some examples, the wet processing equipment 100 may be used to wet clean the object 160. Please refer to FIG. 1, in such an example, the first deionized water can be sprayed on the object 160 by the deionized water spray device 120, and the mixed fluid can be sprayed on the object 160 by the multi-fluid spray device 130. The mixed fluid may include a second deionized water, water vapor, and a volatile fluid. The volatile fluid may, for example, include a volatile solution and/or a saturated vapor of the volatile solution. Alternatively, the deionized water spray device 120 and the multi-fluid spray device 130 may be used to spray the first deionized water and the mixed fluid on the object 160 in turn. When spraying the first deionized and mixed fluid on the object 160, the motor 200 can be used to drive the rotating shaft 190 to drive the carrier plate 110 and the object 160 thereon to rotate.

請一併參照圖2,利用多流體噴灑裝置130朝物件160之表面162噴灑混合流體時,可利用載氣供應裝置324提供載氣,而以載氣運載揮發性溶液飽和蒸氣至多流體產生裝置310。多流體產生裝置310將揮發性溶液飽和蒸氣、水蒸汽產生器330所產生之水蒸汽、與去離子水供應裝置340供應之第二去離子水混合後,再將混合流體供應給多流體噴灑裝置130。此外,更可根據清洗處理需求,利用載氣供應裝置324之溫度控制器326來控制所提供之載氣的溫度,及/或利用去離子水供應裝置340之溫度控制器342來控制所提供之第二去離子水的溫度,以提供所需溫度之混合流體。Please also refer to FIG. 2, when the multi-fluid spraying device 130 is used to spray the mixed fluid on the surface 162 of the object 160, the carrier gas supply device 324 can be used to provide carrier gas, and the carrier gas can carry the saturated vapor of the volatile solution to the multi-fluid generating device 310 . The multi-fluid generating device 310 mixes the saturated vapor of the volatile solution, the water vapor generated by the water vapor generator 330, and the second deionized water supplied by the deionized water supply device 340, and then supplies the mixed fluid to the multi-fluid spraying device 130. In addition, the temperature controller 326 of the carrier gas supply device 324 can be used to control the temperature of the supplied carrier gas, and/or the temperature controller 342 of the deionized water supply device 340 can be used to control the temperature of the supplied carrier gas according to the cleaning process requirements. The temperature of the second deionized water to provide the mixed fluid at the required temperature.

接著,可利用乾燥氣體噴射裝置,例如乾燥氮氣噴射裝置140及/或乾燥氮氣二流體噴射裝置150,對物件160噴射乾燥氣體,以吹乾物件160。乾燥氮氣噴射裝置140所噴射之乾燥氣體為乾燥氮氣,乾燥氮氣二流體噴射裝置150所噴射之乾燥氣體為乾燥氮氣與揮發性溶液飽和蒸氣所組成之二流體。在濕式處理設備100同時包含乾燥氮氣噴射裝置140與乾燥氮氣二流體噴射裝置150的例子中,可以交替方式,利用乾燥氮氣噴射裝置140與乾燥氮氣二流體噴射裝置150來對物件160輪流噴射乾燥氮氣、以及乾燥氮氣與揮發性溶液飽和蒸氣。對物件160噴射乾燥氣體時,可利用轉軸190來帶動承載盤110及其上之物件160旋轉,而加速物件160的乾燥。Then, a dry gas spray device, such as a dry nitrogen spray device 140 and/or a dry nitrogen two-fluid spray device 150, can be used to spray a dry gas on the object 160 to dry the object 160. The dry gas sprayed by the dry nitrogen spray device 140 is dry nitrogen, and the dry gas sprayed by the dry nitrogen two-fluid spray device 150 is two fluids composed of dry nitrogen and saturated vapor of the volatile solution. In an example where the wet processing equipment 100 includes both a dry nitrogen spraying device 140 and a dry nitrogen two-fluid spraying device 150, the dry nitrogen spraying device 140 and the dry nitrogen two-fluid spraying device 150 can be alternately used to spray and dry the object 160 in turn. Nitrogen, dry nitrogen and saturated vapor of volatile solution. When the drying gas is sprayed on the object 160, the rotating shaft 190 can be used to drive the carrier plate 110 and the object 160 thereon to rotate, thereby accelerating the drying of the object 160.

請一併參照圖3,利用乾燥氮氣二流體噴射裝置150朝物件160之表面162噴射乾燥氮氣二流體時,可利用揮發性溶液飽和蒸氣產生器410產生揮發性溶液飽和蒸氣,並利用載氣供應裝置420提供乾燥氮氣作為載氣,來將揮發性溶液飽和蒸氣運送至乾燥氮氣二流體噴射裝置150。同樣可根據乾燥處理需求,利用載氣供應裝置420之溫度控制器422來控制所提供之載氣的溫度,以提供所需溫度之二流體。Please also refer to FIG. 3, when the dry nitrogen two-fluid injection device 150 is used to spray the dry nitrogen two-fluid toward the surface 162 of the object 160, the volatile solution saturated steam generator 410 can be used to generate the volatile solution saturated steam, and the carrier gas can be used for supply The device 420 provides dry nitrogen as a carrier gas to transport the saturated vapor of the volatile solution to the dry nitrogen two-fluid injection device 150. Similarly, the temperature controller 422 of the carrier gas supply device 420 can be used to control the temperature of the provided carrier gas according to the drying process requirements to provide the second fluid at the required temperature.

在濕式處理設備100包含蝕刻液噴灑裝置210的例子中,濕式處理設備100為濕式蝕刻處理設備。可利用蝕刻液噴灑裝置210朝物件160之表面162噴灑蝕刻液,來蝕刻物件160之表面162。對物件160噴灑蝕刻液時,可利用轉軸190來帶動承載盤110及其上之物件160旋轉。可於每道蝕刻製程後,利用濕式處理設備100對物件160進行清洗處理與後續之乾燥處理。In an example in which the wet processing equipment 100 includes the etching liquid spraying device 210, the wet processing equipment 100 is a wet etching processing equipment. The etching solution spray device 210 can be used to spray the etching solution toward the surface 162 of the object 160 to etch the surface 162 of the object 160. When spraying the etching solution on the object 160, the rotating shaft 190 can be used to drive the carrier plate 110 and the object 160 thereon to rotate. After each etching process, the wet processing equipment 100 can be used to clean and dry the object 160.

以下利用一示範例子來說明濕式處理設備100對物件160的濕式蝕刻處理、清洗處理、與乾燥處理。請再次參照圖1,利用傳送機構(未繪示)將物件160載送到承載盤110上時,夾持裝置170打開,以承接傳送機構所放下之物件160,而後夾持裝置170關上以夾緊物件160,而將物件160固定在承載盤110之承載面112之上。接下來,可對物件160進行濕式蝕刻製程,以利用馬達200帶動轉軸190轉動,而進一步帶動承載盤110及固定於其上之物件160旋轉。接著,承載盤110可根據蝕刻液回收位置而升降至適當位置,再以蝕刻液噴灑裝置210朝物件160之表面162噴灑蝕刻液來進行物件160的蝕刻。此時,蝕刻液因物件160旋轉所產生之離心力而被甩出物件160,而落到承載盤110周圍之蝕刻液回收裝置中。於設定之蝕刻秒數後,停止噴灑蝕刻液,承載盤110再升降至清洗位置,以清除殘留在物件160上之蝕刻液與微粒。Hereinafter, an exemplary example is used to describe the wet etching, cleaning, and drying processing of the object 160 by the wet processing equipment 100. Please refer to FIG. 1 again, when the object 160 is loaded onto the carrier plate 110 by the conveying mechanism (not shown), the clamping device 170 is opened to accept the object 160 placed by the conveying mechanism, and then the clamping device 170 is closed to clamp The object 160 is tightened, and the object 160 is fixed on the carrying surface 112 of the carrying tray 110. Next, a wet etching process can be performed on the object 160 to use the motor 200 to drive the rotation shaft 190 to rotate, and to further drive the carrier plate 110 and the object 160 fixed thereon to rotate. Then, the carrier plate 110 can be raised and lowered to an appropriate position according to the etching solution recovery position, and then the etching solution spray device 210 is used to spray the etching solution onto the surface 162 of the object 160 to perform the etching of the object 160. At this time, the etching solution is thrown out of the object 160 due to the centrifugal force generated by the rotation of the object 160 and falls into the etching solution recovery device around the carrier plate 110. After the set number of etching seconds, the spraying of the etching solution is stopped, and the carrier plate 110 is raised and lowered to the cleaning position to remove the etching solution and particles remaining on the object 160.

進行清洗處理時,可以交替方式,利用去離子水噴灑裝置120與多流體噴灑裝置130來輪流對物件160噴灑去離子水與混合流體。可視製程需求,來分別設定去離子水噴灑裝置120與多流體噴灑裝置130的噴灑時間。During the cleaning process, the deionized water spraying device 120 and the multi-fluid spraying device 130 can be used alternately to spray the deionized water and the mixed fluid on the object 160 in turn. Depending on the process requirements, the spraying time of the deionized water spraying device 120 and the multi-fluid spraying device 130 can be set separately.

待清洗處理結束,可根據製程需求,而單獨利用乾燥氮氣噴射裝置140或乾燥氮氣二流體噴射裝置150,或利用乾燥氮氣噴射裝置140與乾燥氮氣二流體噴射裝置150來進行乾燥處理。可以交替方式,利用乾燥氮氣噴射裝置140與乾燥氮氣二流體噴射裝置150來輪流對物件160噴射乾燥氮氣、及乾燥氮氣二流體。同樣可視製程需求,來分別設定乾燥氮氣噴射裝置140與乾燥氮氣二流體噴射裝置150的噴射時間。After the cleaning process is completed, the dry nitrogen injection device 140 or the dry nitrogen two-fluid injection device 150 alone, or the dry nitrogen injection device 140 and the dry nitrogen two-fluid injection device 150 can be used for the drying process according to the process requirements. Alternatively, the dry nitrogen spray device 140 and the dry nitrogen two-fluid spray device 150 can be used to spray dry nitrogen and dry nitrogen two fluids to the object 160 in turn. Similarly, depending on the process requirements, the spraying time of the dry nitrogen spray device 140 and the dry nitrogen two-fluid spray device 150 can be set separately.

完成乾燥處理後,承載盤110升降到傳送位置後停止旋轉。夾持裝置170打開,傳送裝置將完成濕式處理的物件160取出,再放置下一片待濕式處理的物件160,然後重覆上述步驟直至處理完所有物件160。After the drying process is completed, the carrier tray 110 is raised and lowered to the transfer position and then stops rotating. The clamping device 170 is opened, and the conveying device takes out the wet-processed object 160, and then places the next object 160 to be wet-processed, and then repeats the above steps until all the objects 160 are processed.

由上述之實施方式可知,本揭露之一優點就是因為本揭露可以輪流對物件噴灑去離子水,以及包含去離子水、水蒸汽、與揮發性流體之混合流體的霧狀小分子。水蒸汽小分子可減少濕式處理時去離子水的使用量,並可提升清洗效果。此外,揮發性流體的揮發可提供殘留在物件上之處理液與微粒擴散與移動動能,而可縮短清洗時間,進一步降低去離子水的使用量,並可提升去除效率,更可避免破壞物件,進而可降低產品缺陷,提升良率。As can be seen from the above-mentioned embodiments, one of the advantages of the present disclosure is that the present disclosure can spray deionized water on the object in turn, and mist-like small molecules containing a mixed fluid of deionized water, water vapor, and volatile fluid. Small water vapor molecules can reduce the amount of deionized water used in wet processing and improve the cleaning effect. In addition, the volatilization of volatile fluids can provide kinetic energy for the diffusion and movement of processing liquids and particles remaining on the object, which can shorten the cleaning time, further reduce the amount of deionized water used, and improve the removal efficiency, and can prevent damage to the object. In turn, product defects can be reduced and yield can be improved.

本揭露之另一優點就是因為本揭露可以包含乾燥氮氣與揮發性溶液飽和蒸氣的二流體來噴吹物件。揮發性溶液飽和蒸氣的揮發可快速帶走物件上殘留之水分,藉此可更快速的旋乾物件,而可降低噴吹時間,進而可提升乾燥效率,不僅可有效降低乾燥氮氣的使用量,更可提升產能。此外,物件上的水分被快速帶走可降低水印缺陷的形成機率,而可減少產品缺陷與提升良率。Another advantage of the present disclosure is that the present disclosure can spray objects with two fluids including dry nitrogen and saturated vapor of volatile solution. The volatilization of the saturated vapor of the volatile solution can quickly take away the remaining moisture on the object, which can spin dry the object more quickly, and can reduce the spraying time, thereby improving the drying efficiency, not only effectively reducing the amount of dry nitrogen used, but also It can also increase production capacity. In addition, the moisture on the object is quickly taken away to reduce the probability of forming watermark defects, which can reduce product defects and improve yield.

雖然本揭露已以實施例揭示如上,然其並非用以限定本揭露,任何在此技術領域中具有通常知識者,在不脫離本揭露之精神和範圍內,當可作各種之更動與潤飾,因此本揭露之保護範圍當視後附之申請專利範圍所界定者為準。Although the present disclosure has been disclosed in the above embodiments, it is not intended to limit the present disclosure. Anyone with ordinary knowledge in this technical field can make various changes and modifications without departing from the spirit and scope of the present disclosure. Therefore, the scope of protection of this disclosure shall be subject to the scope of the attached patent application.

100:濕式處理設備 110:承載盤 112:承載面 120:去離子水噴灑裝置 130:多流體噴灑裝置 140:乾燥氮氣噴射裝置 150:乾燥氮氣二流體噴射裝置 160:物件 162:表面 164:圖案結構 170:夾持裝置 180:氣浮裝置 190:轉軸 200:馬達 210:蝕刻液噴灑裝置 300:多流體供應系統 310:多流體產生裝置 320:揮發性流體供應裝置 322:揮發性溶液飽和蒸氣產生器 324:載氣供應裝置 326:溫度控制器 330:水蒸汽產生器 340:去離子水供應裝置 342:溫度控制器 400:乾燥氮氣二流體供應系統 410:揮發性溶液飽和蒸氣產生器 420:載氣供應裝置 422:溫度控制器 AR:箭頭 MF:混合流體 PC:微粒 PF:處理液 100: Wet processing equipment 110: Carrier plate 112: bearing surface 120: Deionized water spray device 130: Multi-fluid spraying device 140: Dry nitrogen injection device 150: Dry nitrogen two-fluid injection device 160: Object 162: Surface 164: Pattern structure 170: Clamping device 180: Air flotation device 190: Hinge 200: Motor 210: Etching liquid spraying device 300: Multi-fluid supply system 310: Multi-fluid generator 320: Volatile fluid supply device 322: Volatile solution saturated steam generator 324: Carrier Gas Supply Device 326: Temperature Controller 330: Steam Generator 340: Deionized water supply device 342: Temperature Controller 400: Dry nitrogen two-fluid supply system 410: Saturated vapor generator for volatile solution 420: carrier gas supply device 422: temperature controller AR: Arrow MF: Mixed fluid PC: Particles PF: Treatment fluid

為讓本揭露之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下: [圖1]係繪示依照本揭露之一實施方式的一種濕式處理設備的裝置示意圖。 [圖2]係繪示依照本揭露之一實施方式的一種濕式處理設備之多流體供應系統的裝置示意圖。 [圖3]係繪示依照本揭露之一實施方式的一種濕式處理設備之乾燥氮氣二流體供應系統的裝置示意圖。 [圖4]係繪示依照本揭露之一實施方式之移除殘留在物件上之處理液與微粒的示意圖。 In order to make the above and other objectives, features, advantages and embodiments of the present disclosure more obvious and understandable, the description of the accompanying drawings is as follows: [Fig. 1] is a schematic diagram of a wet processing equipment according to an embodiment of the present disclosure. [Fig. 2] is a schematic diagram showing a device of a multi-fluid supply system of a wet processing equipment according to an embodiment of the present disclosure. [Fig. 3] is a schematic diagram showing a dry nitrogen two-fluid supply system of a wet processing equipment according to an embodiment of the present disclosure. [Fig. 4] is a schematic diagram showing the removal of the processing liquid and particles remaining on the object according to an embodiment of the present disclosure.

100:濕式處理設備 100: Wet processing equipment

110:承載盤 110: Carrier plate

112:承載面 112: bearing surface

120:去離子水噴灑裝置 120: Deionized water spray device

130:多流體噴灑裝置 130: Multi-fluid spraying device

140:乾燥氮氣噴射裝置 140: Dry nitrogen injection device

150:乾燥氮氣二流體噴射裝置 150: Dry nitrogen two-fluid injection device

160:物件 160: Object

162:表面 162: Surface

170:夾持裝置 170: Clamping device

180:氣浮裝置 180: Air flotation device

190:轉軸 190: Hinge

200:馬達 200: Motor

210:蝕刻液噴灑裝置 210: Etching liquid spraying device

Claims (10)

一種濕式處理設備,包含: 一承載盤,配置以承載一物件; 一去離子水噴灑裝置,設於該承載盤之上方,且配置以朝該物件噴灑一第一去離子水; 一多流體噴灑裝置,設於該承載盤之上方,且配置以朝該物件噴灑一混合流體,其中該混合流體包含一第二去離子水、一水蒸汽、與一揮發性流體;以及 一乾燥氣體噴射裝置,設於該承載盤之上方,且配置以朝該物件噴射一乾燥氣體。 A wet processing equipment, including: A carrying tray, configured to carry an object; A deionized water spraying device, arranged above the carrying plate, and configured to spray a first deionized water toward the object; A multi-fluid spraying device arranged above the carrier plate and configured to spray a mixed fluid toward the object, wherein the mixed fluid includes a second deionized water, a water vapor, and a volatile fluid; and A dry gas spray device is arranged above the carrier plate and is configured to spray a dry gas toward the object. 如請求項1所述之濕式處理設備,更包含: 一多流體產生裝置,與該多流體噴灑裝置流體連通,且配置以產生該混合流體與供應該混合流體給該多流體噴灑裝置; 一揮發性流體供應裝置,與該多流體產生裝置流體連通,且配置以供應該揮發性流體給該多流體產生裝置; 一水蒸汽產生器,與該多流體產生裝置流體連通,且配置以產生該水蒸汽與供應該水蒸汽給該多流體產生裝置;以及 一去離子水供應裝置,與該多流體產生裝置流體連通,且配置以供應該第二去離子水給該多流體產生裝置。 The wet processing equipment described in claim 1, further including: A multi-fluid generating device, in fluid communication with the multi-fluid spraying device, and configured to generate the mixed fluid and supply the mixed fluid to the multi-fluid spraying device; A volatile fluid supply device in fluid communication with the multi-fluid generating device and configured to supply the volatile fluid to the multi-fluid generating device; A water vapor generator in fluid communication with the multi-fluid generating device and configured to generate the water vapor and supply the water vapor to the multi-fluid generating device; and A deionized water supply device is in fluid communication with the multi-fluid generating device and configured to supply the second deionized water to the multi-fluid generating device. 如請求項2所述之濕式處理設備,其中該揮發性流體為一揮發性溶液飽和蒸氣,且該揮發性流體供應裝置包含: 一揮發性溶液飽和蒸氣產生器,配置以產生該揮發性溶液飽和蒸氣;以及 一載氣供應裝置,配置以提供一氮氣來將該揮發性溶液飽和蒸氣運載至該多流體產生裝置。 The wet processing equipment according to claim 2, wherein the volatile fluid is a saturated vapor of a volatile solution, and the volatile fluid supply device includes: A volatile solution saturated vapor generator configured to generate saturated vapor of the volatile solution; and A carrier gas supply device is configured to provide a nitrogen gas to carry the saturated vapor of the volatile solution to the multi-fluid generating device. 如請求項3所述之濕式處理設備,其中 該載氣供應裝置更包含一溫度控制器,配置以控制該氮氣之一溫度;以及 該去離子水供應裝置更包含另一溫度控制器,配置以控制該第二去離子水之一溫度。 The wet processing equipment described in claim 3, wherein The carrier gas supply device further includes a temperature controller configured to control a temperature of the nitrogen; and The deionized water supply device further includes another temperature controller configured to control a temperature of the second deionized water. 如請求項1所述之濕式處理設備,其中該乾燥氣體噴射裝置為一乾燥氮氣噴射裝置。The wet processing equipment according to claim 1, wherein the dry gas injection device is a dry nitrogen injection device. 如請求項1所述之濕式處理設備,其中該乾燥氣體噴射裝置為一乾燥氮氣二流體噴射裝置,且該濕式處理設備更包含: 一揮發性溶液飽和蒸氣產生器,與該乾燥氣體噴射裝置流體連通,且配置以產生該揮發性流體中之一揮發性溶液飽和蒸氣;以及 一載氣供應裝置,配置以提供一乾燥氮氣來將該揮發性溶液飽和蒸氣運載至該乾燥氣體噴射裝置。 The wet processing equipment according to claim 1, wherein the dry gas injection device is a dry nitrogen two-fluid injection device, and the wet processing equipment further comprises: A volatile solution saturated vapor generator, in fluid communication with the dry gas injection device, and configured to generate a volatile solution saturated vapor in the volatile fluid; and A carrier gas supply device is configured to provide a dry nitrogen gas to carry the saturated vapor of the volatile solution to the dry gas injection device. 如請求項6所述之濕式處理設備,更包含一乾燥氮氣噴射裝置,設於該承載盤之上方,且配置以朝該物件噴射另一乾燥氮氣。The wet processing equipment according to claim 6, further comprising a dry nitrogen spray device, which is arranged above the carrier plate and is configured to spray another dry nitrogen gas toward the object. 如請求項6所述之濕式處理設備,其中該載氣供應裝置更包含一溫度控制器,配置以控制該乾燥氮氣之一溫度。The wet processing equipment according to claim 6, wherein the carrier gas supply device further includes a temperature controller configured to control a temperature of the dry nitrogen. 如請求項1所述之濕式處理設備,更包含一蝕刻液噴灑裝置,設於該承載盤之上方,且配置以朝該物件噴灑一蝕刻液。The wet processing equipment according to claim 1, further comprising an etching solution spraying device, which is arranged above the carrier plate and configured to spray an etching solution toward the object. 如請求項1所述之濕式處理設備,更包含: 一夾持裝置,設於該承載盤上,且配置以夾持固定該物件; 一氣浮裝置,設於該承載盤上,且配置以抬升該物件使該物件與該承載盤分隔開; 一轉軸,與該承載盤連接,且配置以旋轉該承載盤;以及 一馬達,與該轉軸連接,且配置以驅動該轉軸。 The wet processing equipment described in claim 1, further including: A clamping device arranged on the carrying plate and configured to clamp and fix the object; An air flotation device, arranged on the carrying tray, and configured to lift the object to separate the object from the carrying tray; A rotating shaft connected to the carrying plate and configured to rotate the carrying plate; and A motor is connected to the rotating shaft and configured to drive the rotating shaft.
TW110201928U 2021-02-22 2021-02-22 Wet processing apparatus TWM612412U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI842030B (en) * 2022-07-29 2024-05-11 大陸商杭州善上水科技有限公司 Small-molecule drinking water, preparation method and application
US12371351B2 (en) 2019-10-22 2025-07-29 Hangzhou shanshangshui Technology Co., Ltd Protonated small-molecule drinking water, preparation method and application

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12371351B2 (en) 2019-10-22 2025-07-29 Hangzhou shanshangshui Technology Co., Ltd Protonated small-molecule drinking water, preparation method and application
TWI842030B (en) * 2022-07-29 2024-05-11 大陸商杭州善上水科技有限公司 Small-molecule drinking water, preparation method and application

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