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TWM654134U - Power supply circuit - Google Patents

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Publication number
TWM654134U
TWM654134U TW112214137U TW112214137U TWM654134U TW M654134 U TWM654134 U TW M654134U TW 112214137 U TW112214137 U TW 112214137U TW 112214137 U TW112214137 U TW 112214137U TW M654134 U TWM654134 U TW M654134U
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Taiwan
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charge pump
level
circuit
control signal
transistor
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TW112214137U
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Chinese (zh)
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李宗澤
岑嘉宏
許劍銘
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能創半導體股份有限公司
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Priority to TW112214137U priority Critical patent/TWM654134U/en
Publication of TWM654134U publication Critical patent/TWM654134U/en

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Abstract

A power supply circuit includes a clock buffer, a charge pump, a control circuit and a clamp circuit. The clock buffer is configured to generate an adjusted clock signal according to a clock signal and a level control signal. The clock signal includes a preset level. The charge pump is coupled to the clock buffer, and is configured to generate an output signal according to the adjusted clock signal and a system voltage. The control circuit is coupled to the charge pump, and is configured to generate a charge pump control signal according to the output signal. The clamp circuit is coupled between the control circuit and clock buffer, and is configured to receive the charge pump control signal and the system voltage. The clamp circuit is configured to output the level control signal according to the charge pump control signal. In response to the level of the level control signal, the adjusted clock signal includes an adjusted level.

Description

電源供應電路 Power supply circuit

本揭示內容涉及一種電源供應電路。詳細而言,本揭示內容涉及一種應用於電荷泵的電源供應電路。The present disclosure relates to a power supply circuit. Specifically, the present disclosure relates to a power supply circuit applied to a charge pump.

現有的電荷泵的控制電路中均使用放大器(比較器),以將回授的類比控制訊號轉為數位控制訊號,藉以控制電荷泵的輸出電壓。然而,數位控制訊號僅有高位準及低位準,也就是說,控制電路僅有導通及斷開兩種狀態。當控制電路中的反應時間較長,將導致電荷泵的輸出電壓太高或輸出電壓太低。再者,控制電路中使用放大器會導致控制電路的面積及功耗增加。Existing charge pump control circuits all use amplifiers (comparators) to convert the feedback analog control signal into a digital control signal to control the output voltage of the charge pump. However, the digital control signal only has high and low levels, that is, the control circuit only has two states: on and off. When the response time in the control circuit is long, the output voltage of the charge pump will be too high or too low. Furthermore, the use of amplifiers in the control circuit will increase the area and power consumption of the control circuit.

因此,有鑑於現有技術仍存在諸多缺陷,實有需要一種新穎的電源供應電路以改善上述問題。Therefore, in view of the fact that the prior art still has many defects, there is a need for a novel power supply circuit to improve the above problems.

本揭示內容的一態樣涉及一種電源供應電路。電源供應電路包含時脈緩衝器、電荷泵、控制電路以及電壓箝位電路。時脈緩衝器用以根據時脈訊號及位準控制訊號以產生調整後時脈訊號。時脈訊號具有預定位準。電荷泵耦接於時脈緩衝器,並用以根據調整後時脈訊號及系統電壓以產生輸出訊號。控制電路耦接於電荷泵,並用以根據輸出訊號產生電荷泵控制訊號。電壓箝位電路耦接於控制電路及時脈緩衝器之間,並用以接收系統電壓以及電荷泵控制訊號。電壓箝位電路根據電荷泵控制訊號產生輸出位準控制訊號。調整後時脈訊號響應於位準控制訊號之位準而具有調整後位準。One aspect of the present disclosure relates to a power supply circuit. The power supply circuit includes a clock buffer, a charge pump, a control circuit, and a voltage clamp circuit. The clock buffer is used to generate an adjusted clock signal according to a clock signal and a level control signal. The clock signal has a preset level. The charge pump is coupled to the clock buffer and is used to generate an output signal according to the adjusted clock signal and a system voltage. The control circuit is coupled to the charge pump and is used to generate a charge pump control signal according to the output signal. The voltage clamp circuit is coupled between the control circuit and the clock buffer and is used to receive the system voltage and the charge pump control signal. The voltage clamp circuit generates an output level control signal according to the charge pump control signal. The regulated clock signal has an regulated level in response to the level of the level control signal.

有鑑於前述之現有技術的缺點及不足,本揭示內容提供一種電源供應電路。藉由本揭示內容電源供應電路之設計,無需使用放大器來比較電壓,以輸出數位控制訊號。此外,電源供應電路可以大幅減少元件面積及降低功耗,以降低電路佈局的複雜性。In view of the above-mentioned shortcomings and deficiencies of the prior art, the present disclosure provides a power supply circuit. By designing the power supply circuit of the present disclosure, it is not necessary to use an amplifier to compare voltages to output a digital control signal. In addition, the power supply circuit can significantly reduce the component area and power consumption, thereby reducing the complexity of the circuit layout.

以下將以圖式及詳細敘述清楚說明本揭示內容之精神,任何所屬技術領域中具有通常知識者在瞭解本揭示內容之實施例後,當可由本揭示內容所教示之技術,加以改變及修飾,其並不脫離本揭示內容之精神與範圍。The following will clearly illustrate the spirit of the present disclosure with diagrams and detailed descriptions. After understanding the embodiments of the present disclosure, any person with ordinary knowledge in the relevant technical field can make changes and modifications based on the techniques taught by the present disclosure without departing from the spirit and scope of the present disclosure.

本文之用語只為描述特定實施例,而無意為本揭示內容之限制。單數形式如“一”、“這”、“此”、“本”以及“該”,如本文所用,同樣也包含複數形式。The terms used herein are only for describing specific embodiments and are not intended to be limiting of the present disclosure. Singular forms such as "a", "this", "here", "this" and "the" as used herein also include plural forms.

關於本文中所使用之「包含」、「包括」、「具有」、「含有」等等,均為開放性的用語,即意指包含但不限於。The terms “include”, “including”, “have”, “contain”, etc. used in this document are open terms, meaning including but not limited to.

關於本文中所使用之用詞(terms),除有特別註明外,通常具有每個用詞使用在此領域中、在本揭示內容之內容中與特殊內容中的平常意義。某些用以描述本揭示內容之用詞將於下或在此說明書的別處討論,以提供本領域技術人員在有關本揭示內容之描述上額外的引導。The terms used herein generally have the ordinary meanings of each term used in the art, in the context of the present disclosure, and in the specific context, unless otherwise specified. Certain terms used to describe the present disclosure will be discussed below or elsewhere in this specification to provide additional guidance to those skilled in the art in describing the present disclosure.

在說明書及申請專利範圍中使用了某些詞彙來指稱特定的元件。然而,所屬技術領域中具有通常知識者應可理解,同樣的元件可能會用不同的名詞來稱呼。說明書及申請專利範圍並不以名稱的差異做為區分元件的方式,而是以元件在功能上的差異來做為區分的基準。在說明書及申請專利範圍所提及的「包含」為開放式的用語,故應解釋成「包含但不限定於」。另外,「耦接」在此包含任何直接及間接的連接手段。因此,若文中描述第一元件連接於第二元件,則代表第一元件可通過電性連接或無線傳輸、光學傳輸等訊號連接方式而直接地連接於第二元件,或者通過其他元件或連接手段間接地電性或訊號連接至所述第二元件。Certain terms are used in the specification and patent application to refer to specific components. However, a person with ordinary knowledge in the art should understand that the same component may be referred to by different terms. The specification and patent application do not use the difference in name as a way to distinguish components, but use the difference in function of the components as the basis for distinction. The term "including" mentioned in the specification and patent application is an open term and should be interpreted as "including but not limited to". In addition, "coupling" includes any direct and indirect connection means. Therefore, if the text describes a first component connected to a second component, it means that the first component can be directly connected to the second component through electrical connection or signal connection methods such as wireless transmission, optical transmission, etc., or indirectly electrically or signal-connected to the second component through other components or connection means.

第1圖為根據本揭示內容一些實施例繪示的電源供應電路100之電路方塊示意圖。在一些實施例中,請參閱第1圖,電源供應電路100包含時脈緩衝器110、電荷泵120、控制電路130以及電壓箝位電路140。電荷泵120耦接於時脈緩衝器110。控制電路130耦接於電荷泵120。電壓箝位電路140耦接於控制電路130及時脈緩衝器110之間。FIG. 1 is a circuit block diagram of a power supply circuit 100 according to some embodiments of the present disclosure. In some embodiments, referring to FIG. 1, the power supply circuit 100 includes a clock buffer 110, a charge pump 120, a control circuit 130, and a voltage clamp circuit 140. The charge pump 120 is coupled to the clock buffer 110. The control circuit 130 is coupled to the charge pump 120. The voltage clamp circuit 140 is coupled between the control circuit 130 and the clock buffer 110.

在一些實施例中,時脈緩衝器110用以根據時脈訊號CLK以及位準控制訊號VDD_CLK產生調整後時脈訊號CLK_IN至電荷泵120。其中,當位準控制訊號VDD_CLK之電壓位準越低時,時脈緩衝器110所輸出的調整後時脈訊號CLK_IN之電壓位準越低。反之,當位準控制訊號VDD_CLK之電壓位準越高時,時脈緩衝器110所輸出的調整後時脈訊號CLK_IN之電壓位準越高。 In some embodiments, the clock buffer 110 is used to generate an adjusted clock signal CLK_IN to the charge pump 120 according to the clock signal CLK and the level control signal VDD_CLK. When the voltage level of the level control signal VDD_CLK is lower, the voltage level of the adjusted clock signal CLK_IN output by the clock buffer 110 is lower. Conversely, when the voltage level of the level control signal VDD_CLK is higher, the voltage level of the adjusted clock signal CLK_IN output by the clock buffer 110 is higher.

在一些實施例中,電荷泵120可以用來產生比輸入電壓(例如系統電壓VDD)大的輸出電壓(例如輸出訊號HV)。舉例而言,假設一部電子裝置的系統高電壓為1.5V,且電子裝置當中特定高壓電路的電壓需求為9V,可利用電荷泵120基於系統高電壓1.5V轉換產生電壓高達9V的輸出訊號,藉此驅動上述特定高壓電路。此為本領域技術人員所習知,在此不予贅述以精簡說明。 In some embodiments, the charge pump 120 can be used to generate an output voltage (e.g., an output signal HV) that is greater than an input voltage (e.g., a system voltage VDD). For example, assuming that the system high voltage of an electronic device is 1.5V, and the voltage requirement of a specific high-voltage circuit in the electronic device is 9V, the charge pump 120 can be used to convert the system high voltage 1.5V to generate an output signal with a voltage as high as 9V, thereby driving the above-mentioned specific high-voltage circuit. This is known to those skilled in the art and will not be elaborated here for simplicity.

於一實例中,現有電荷泵的控制電路中設置有放大器(或比較器),以根據電荷泵的輸出電壓大小產生電荷泵的回授控制訊號,進而提高或降低電荷泵的輸出電壓。然而,若透過放大器將回授控制訊號轉換為數位控制訊號,數位控制訊號將僅有高位準及低位準,也就是說,控制電路僅有導通及斷開兩種狀態,造成控制電路的回授反應時間延長。當控制電路的回授反應時間延長,將導致電荷泵的輸出電壓不是太高就是太低。本揭示內容將於後續內容描述如何改善上述問題。 In one example, an amplifier (or comparator) is provided in the control circuit of an existing charge pump to generate a feedback control signal of the charge pump according to the output voltage of the charge pump, thereby increasing or decreasing the output voltage of the charge pump. However, if the feedback control signal is converted into a digital control signal through an amplifier, the digital control signal will only have a high level and a low level, that is, the control circuit will only have two states, on and off, resulting in a prolonged feedback response time of the control circuit. When the feedback response time of the control circuit is prolonged, the output voltage of the charge pump will be either too high or too low. This disclosure will describe how to improve the above problem in the subsequent content.

在一些實施例中,設置控制電路130之目的在於偵測電荷泵120的輸出訊號HV之輸出電壓是否超過預設電壓範圍,並比對輸出訊號HV之電壓是否等於控制電路130內部產生電流的偏壓。當輸出訊號HV之電壓位準不等於控制電路130內部產生電流的偏壓時,控制電路130啟動回授機制,以控制電壓箝位電路140改變時脈緩衝器110所輸出的調整後時脈訊號CLK_IN之電壓位準,進而改變電荷泵120的輸出訊號HV之位準。關於控制電路130與電壓箝位電路140如何決定調整後時脈訊號CLK_IN之電壓位準的詳細說明將在後續段落中進一步解釋。In some embodiments, the purpose of setting the control circuit 130 is to detect whether the output voltage of the output signal HV of the charge pump 120 exceeds a preset voltage range, and to compare whether the voltage of the output signal HV is equal to the bias voltage of the current generated inside the control circuit 130. When the voltage level of the output signal HV is not equal to the bias voltage of the current generated inside the control circuit 130, the control circuit 130 activates the feedback mechanism to control the voltage clamp circuit 140 to change the voltage level of the adjusted clock signal CLK_IN output by the clock buffer 110, thereby changing the level of the output signal HV of the charge pump 120. The details of how the control circuit 130 and the voltage clamp circuit 140 determine the voltage level of the regulated clock signal CLK_IN will be further explained in the following paragraphs.

為使本揭示內容第1圖之電源供應電路100之操作易於理解,請一併參閱第2圖至第4A圖。第2圖為根據本揭示內容一些實施例繪示的動態電壓調整方法200之流程示意圖。第3圖為根據本揭示內容一些實施例繪示的第1圖之電源供應電路100之訊號時序示意圖。第4A圖為根據本揭示內容一些實施例繪示的電源供應電路100A之電路方塊示意圖。第4A圖之電源供應電路100A對應於第1圖之電源供應電路100。電源供應電路100A包含時脈緩衝器110A、電荷泵120A、控制電路130A以及電壓箝位電路140A。時脈緩衝器110A、電荷泵120A、控制電路130A以及電壓箝位電路140A的連接方式與運作分別相似於第1圖的電源供應電路100中的對應元件,為簡潔起見,以下僅說明差異之處。To make the operation of the power supply circuit 100 of Figure 1 of the present disclosure easier to understand, please refer to Figures 2 to 4A together. Figure 2 is a flow chart of a dynamic voltage adjustment method 200 according to some embodiments of the present disclosure. Figure 3 is a signal timing chart of the power supply circuit 100 of Figure 1 according to some embodiments of the present disclosure. Figure 4A is a circuit block chart of the power supply circuit 100A according to some embodiments of the present disclosure. The power supply circuit 100A of Figure 4A corresponds to the power supply circuit 100 of Figure 1. The power supply circuit 100A includes a clock buffer 110A, a charge pump 120A, a control circuit 130A, and a voltage clamp circuit 140A. The connection method and operation of the clock buffer 110A, the charge pump 120A, the control circuit 130A and the voltage clamp circuit 140A are similar to the corresponding components in the power supply circuit 100 of FIG. 1 . For the sake of brevity, only the differences are described below.

在一些實施例中,控制電路130A包含二極體(例如圖示之齊納二極體Z1,但本揭示內容不限於此)、電晶體T1及定電流源S1。電壓箝位電路140A包含電晶體T2。齊納二極體Z1之陰極端耦接於電荷泵120A,並用以根據輸出訊號HV輸出穩壓訊號。須說明的是,齊納二極體Z1於施加逆向電壓時,將於特定範圍維持定電壓,並保護電晶體T1、定電流源S1及電壓箝位電路140A的電晶體T2不受突波電流和靜電傷害。 In some embodiments, the control circuit 130A includes a diode (e.g., the Zener diode Z1 shown in the figure, but the present disclosure is not limited thereto), a transistor T1, and a constant current source S1. The voltage clamp circuit 140A includes a transistor T2. The cathode end of the Zener diode Z1 is coupled to the charge pump 120A and is used to output a voltage regulation signal according to the output signal HV. It should be noted that when a reverse voltage is applied to the Zener diode Z1, a constant voltage will be maintained within a specific range, and the transistor T1, the constant current source S1, and the transistor T2 of the voltage clamp circuit 140A will be protected from surge current and static electricity.

接著,請以本案圖式上方及右方起算為第一端,電晶體T1之第一端耦接於齊納二極體Z1之陽極端。電晶體T1之第二端耦接於節點N1及定電流源S1。電晶體T1之控制端響應系統電壓VDD導通。參考電流IHV通過電晶體T1於節點N1處產生電壓位準。 Next, please count from the top and right of the diagram as the first end. The first end of transistor T1 is coupled to the anode end of Zener diode Z1. The second end of transistor T1 is coupled to node N1 and constant current source S1. The control end of transistor T1 is turned on in response to system voltage VDD. Reference current I HV passes through transistor T1 to generate a voltage level at node N1.

在一些實施例中,電晶體T1可用N型金屬氧化物半導體場效電晶體(P-type Metal-Oxide-Semiconductor Field-Effect Transistor,NMOS)來實作,電晶體T2可用P型金屬氧化物半導體場效電晶體(N-type Metal-Oxide-Semiconductor Field-Effect Transistor,PMOS)來實作。然而,本揭示內容不以此為限,舉例來說,根據電荷泵控制訊號CP_C的不同設計,電晶體T2亦可選用NMOS來實作。 In some embodiments, transistor T1 can be implemented by N-type metal-oxide-semiconductor field-effect transistor (P-type Metal-Oxide-Semiconductor Field-Effect Transistor, NMOS), and transistor T2 can be implemented by P-type metal-oxide-semiconductor field-effect transistor (PMOS). However, the present disclosure is not limited to this. For example, according to different designs of the charge pump control signal CP_C, transistor T2 can also be implemented by NMOS.

在一些實施例中,控制電路130A及電壓箝位電路140A之間包含電容C1。電容C1耦接於控制電路130A之節點N1及電壓箝位電路140A之電晶體T2。電容C1經充電或放電以提供不同位準之電荷泵控制訊號CP_C。In some embodiments, a capacitor C1 is included between the control circuit 130A and the voltage clamp circuit 140A. The capacitor C1 is coupled to the node N1 of the control circuit 130A and the transistor T2 of the voltage clamp circuit 140A. The capacitor C1 is charged or discharged to provide a charge pump control signal CP_C of different levels.

於步驟210中,請參閱第2圖至第4A圖,時脈緩衝器110A接收時脈訊號CLK,並用以根據時脈訊號CLK及位準控制訊號VDD_CLK產生調整後時脈訊號CLK_IN。In step 210, referring to FIGS. 2 to 4A, the clock buffer 110A receives the clock signal CLK and generates an adjusted clock signal CLK_IN according to the clock signal CLK and the level control signal VDD_CLK.

於步驟220中,電荷泵120A用以根據調整後時脈訊號CLK_IN及系統電壓VDD以產生輸出訊號HV。輸出訊號HV與調整後時脈訊號CLK_IN及系統電壓VDD的關係式如式1所示。In step 220, the charge pump 120A is used to generate an output signal HV according to the regulated clock signal CLK_IN and the system voltage VDD. The relationship between the output signal HV, the regulated clock signal CLK_IN and the system voltage VDD is shown in equation 1.

式1: Formula 1: .

於式1中,K及M均為正整數。須說明的是,於一些實施例中,電荷泵120A可為迪克森電荷泵(Dickson charge pump),並且包含多級的二極體/電容器單元(例如二極體/電容器單元SG1~SGn),每個電容器的一側由時脈訊號(例如調整後時脈訊號CLK_IN)抬升電壓,並透過電容器及二極體之組合累積電壓,以逐漸達到倍壓的效果。K及M之數值依據電荷泵120A之多級的二極體/電容器單元(例如二極體/電容器單元SG1~SGn)之數量及需求所設計。In Formula 1, K and M are both positive integers. It should be noted that in some embodiments, the charge pump 120A may be a Dickson charge pump and include multiple stages of diode/capacitor units (e.g., diode/capacitor units SG1-SGn), one side of each capacitor is boosted by a clock signal (e.g., adjusted clock signal CLK_IN), and the voltage is accumulated through the combination of capacitors and diodes to gradually achieve a voltage doubling effect. The values of K and M are designed according to the number and requirements of the multiple stages of diode/capacitor units (e.g., diode/capacitor units SG1-SGn) of the charge pump 120A.

於步驟230中,請參閱第2圖至第4A圖,舉例來說,電晶體T2可以是PMOS(但本揭示內容不限於此),且電晶體T2的汲極端的位準為系統電壓VDD,閘極端的位準為電荷泵控制訊號CP_C,源極端的位準為位準控制訊號VDD_CLK。當電荷泵控制訊號CP_C小於系統電壓VDD與電晶體T2之臨界電壓之間的差值時,電晶體T2導通而存在導通阻值。當電荷泵控制訊號CP_C越小時,電晶體T2受導通的程度越大(相當於電晶體T2內的導通阻值越小),使得位準控制訊號VDD_CLK之電壓越高;反之,當電荷泵控制訊號CP_C越大時,電晶體T2受導通的程度越小(相當於電晶體T2的導通阻值越大),使得位準控制訊號VDD_CLK之電壓越低。導通電阻所指為當電晶體在導通狀態時,在汲極和源極之間發生的電阻性行為,而導通阻值所指則為述電阻性行為所產生的阻值。In step 230, please refer to FIG. 2 to FIG. 4A. For example, transistor T2 can be a PMOS (but the present disclosure is not limited thereto), and the drain level of transistor T2 is the system voltage VDD, the gate level is the charge pump control signal CP_C, and the source level is the level control signal VDD_CLK. When the charge pump control signal CP_C is less than the difference between the system voltage VDD and the critical voltage of transistor T2, transistor T2 is turned on and has an on-resistance. When the charge pump control signal CP_C is smaller, the degree of conduction of transistor T2 is greater (equivalent to the smaller on-resistance of transistor T2), making the voltage of level control signal VDD_CLK higher; conversely, when the charge pump control signal CP_C is larger, the degree of conduction of transistor T2 is smaller (equivalent to the larger on-resistance of transistor T2), making the voltage of level control signal VDD_CLK lower. On-resistance refers to the resistive behavior between the drain and source when the transistor is in the on state, and on-resistance refers to the resistance generated by the resistive behavior.

詳細而言,當輸出訊號HV之電壓位準下降時,會使得位準控制訊號VDD_CLK上升,因此時脈緩衝器110A所產生的調整後時脈訊號CLK_IN的脈衝振幅相較於時脈訊號CLK來得高,使得電荷泵120A拉抬輸出訊號HV的位準;當輸出訊號HV之電壓位準上升時,會使得位準控制訊號VDD_CLK下降,因此時脈緩衝器110A所產生的調整後時脈訊號CLK_IN的脈衝振幅相較於時脈訊號CLK來得低,使得電荷泵120A拉低輸出訊號HV的位準,藉此達到調節輸出訊號HV的功效。隨著電荷泵120A所產生的輸出訊號HV之位準提高,參考電流I HV會增大。定電流源S1用以輸出參考電流I REF,且控制電路130A用以根據輸出訊號HV產生參考電流I HV,並根據參考電流I HV及參考電流I REF產生電荷泵控制訊號CP_C。當參考電流I HV增大至大於參考電流I REF,即產生分流自節點N1流向電壓箝位電路140A而對電容C1進行充電,使得電荷泵控制訊號CP_C的位準逐漸提高,電壓箝位電路140A的電晶體T2響應電荷泵控制訊號CP_C之電壓位準而逐漸關閉。 In detail, when the voltage level of the output signal HV decreases, the level control signal VDD_CLK increases, so the pulse amplitude of the adjusted clock signal CLK_IN generated by the clock buffer 110A is higher than the clock signal CLK, so that the charge pump 120A pulls up the level of the output signal HV; when the voltage level of the output signal HV increases, the level control signal VDD_CLK decreases, so the pulse amplitude of the adjusted clock signal CLK_IN generated by the clock buffer 110A is lower than the clock signal CLK, so that the charge pump 120A pulls down the level of the output signal HV, thereby achieving the effect of adjusting the output signal HV. As the level of the output signal HV generated by the charge pump 120A increases, the reference current I HV increases. The constant current source S1 is used to output the reference current I REF , and the control circuit 130A is used to generate the reference current I HV according to the output signal HV, and generate the charge pump control signal CP_C according to the reference current I HV and the reference current I REF . When the reference current I HV increases to be greater than the reference current I REF , a shunt is generated from the node N1 to flow to the voltage clamp circuit 140A to charge the capacitor C1, so that the level of the charge pump control signal CP_C gradually increases, and the transistor T2 of the voltage clamp circuit 140A gradually closes in response to the voltage level of the charge pump control signal CP_C.

電晶體T2的導通阻值逐漸變大的過程中,電晶體T2仍處於導通狀態,電晶體T2之汲極端與源極端間的電流路徑隨著電荷泵控制訊號CP_C而逐漸緊縮,但不完全為關斷狀態。此外,隨著電荷泵120A所產生的輸出訊號HV之位準降低,參考電流I HV會隨之降低。當參考電流I HV降低至低於參考電流I REF,此時電容C1對節點N1放電,使得電荷泵控制訊號CP_C的位準逐漸降低。此時,電壓箝位電路140A的電晶體T2響應電荷泵控制訊號CP_C之電壓位準而使得電晶體T2之汲極端與源極端間的電流路徑受導通的程度更大。換言之,電晶體T2的導通阻值逐漸變小,電晶體T2之汲極端與源極端間的電流路徑隨著電荷泵控制訊號CP_C而逐漸擴大。 While the on-resistance of transistor T2 gradually increases, transistor T2 is still in the on state, and the current path between the drain terminal and the source terminal of transistor T2 gradually shrinks along with the charge pump control signal CP_C, but is not completely in the off state. In addition, as the level of the output signal HV generated by the charge pump 120A decreases, the reference current I HV decreases accordingly. When the reference current I HV decreases to be lower than the reference current I REF , the capacitor C1 discharges to the node N1, causing the level of the charge pump control signal CP_C to gradually decrease. At this time, the transistor T2 of the voltage clamp circuit 140A responds to the voltage level of the charge pump control signal CP_C and makes the current path between the drain and source of the transistor T2 more conductive. In other words, the conduction resistance of the transistor T2 gradually decreases, and the current path between the drain and source of the transistor T2 gradually expands along with the charge pump control signal CP_C.

請參閱第4B圖,第4B圖係為第4A圖之電源供應電路100A中的時脈緩衝器110A的示意圖,如第4B圖所示,時脈緩衝器110A包括反相器V1及反相器V2。請再參閱圖3,反相器V1及反相器V2用以根據位準控制訊號VDD_CLK之位準將時脈訊號CLK轉換為調整後時脈訊號CLK_IN。調整後時脈訊號CLK_IN的振幅大小受控於位準控制訊號VDD_CLK。Please refer to FIG. 4B, which is a schematic diagram of the clock buffer 110A in the power supply circuit 100A of FIG. 4A. As shown in FIG. 4B, the clock buffer 110A includes an inverter V1 and an inverter V2. Please refer to FIG. 3 again, the inverter V1 and the inverter V2 are used to convert the clock signal CLK into the adjusted clock signal CLK_IN according to the level of the level control signal VDD_CLK. The amplitude of the adjusted clock signal CLK_IN is controlled by the level control signal VDD_CLK.

於步驟240中,承上述步驟230,於第3圖中階段I1,當電壓箝位電路140A的電晶體T2逐漸關閉,位準控制訊號VDD_CLK之電壓位準隨著逐漸降低。時脈緩衝器110A響應位準控制訊號VDD_CLK之電壓位準,調整後時脈訊號CLK_IN之多個脈衝如第3圖之階段I1所示亦逐漸降低,進而決定階段I1中的輸出訊號HV之位準變化量。如第3圖所示,輸出訊號HV之位準變化量於階段I1之前段變化較劇烈,並於階段I2逐漸趨緩。In step 240, following the above step 230, in stage I1 in FIG. 3, when the transistor T2 of the voltage clamp circuit 140A is gradually turned off, the voltage level of the level control signal VDD_CLK gradually decreases. The clock buffer 110A responds to the voltage level of the level control signal VDD_CLK, and the multiple pulses of the adjusted clock signal CLK_IN also gradually decrease as shown in stage I1 of FIG. 3, thereby determining the level change amount of the output signal HV in stage I1. As shown in FIG. 3, the level change amount of the output signal HV changes more drastically in the first stage of stage I1, and gradually slows down in stage I2.

輸出訊號HV之位準實際上如第3圖所示,於預設電壓範圍上限及下限之間振盪,而電荷泵控制訊號CP_C、位準控制訊號VDD_CLK及調整後時脈訊號CLK_IN之脈衝均響應輸出訊號HV之位準同步變化。舉例而言,輸出訊號HV之位準可為9伏特(V)或10V,預設電壓範圍可為上述位準的±5%至±10%之間。預設電壓範圍之數值可依據實際需求設計,並不以上述舉例為限。The level of the output signal HV actually oscillates between the upper and lower limits of the preset voltage range as shown in Figure 3, and the pulses of the charge pump control signal CP_C, the level control signal VDD_CLK and the adjusted clock signal CLK_IN all respond to the synchronous change of the level of the output signal HV. For example, the level of the output signal HV can be 9 volts (V) or 10V, and the preset voltage range can be between ±5% and ±10% of the above level. The value of the preset voltage range can be designed according to actual needs and is not limited to the above example.

第5圖為根據本揭示內容一些實施例繪示的電源供應電路100B之電路方塊示意圖。第5圖之電源供應電路100B對應於第1圖之電源供應電路100。電源供應電路100B包含時脈緩衝器110B、電荷泵120B、控制電路130B以及電壓箝位電路140B。電壓箝位電路140B包含可變電阻R1。可變電阻R1耦接於系統電壓VDD與時脈緩衝器110B之間,且受控於電荷泵控制訊號CP_C。時脈緩衝器110B、電荷泵120B以及控制電路130B的連接方式與運作分別相似於第1圖的電源供應電路100及第4A圖的電源供應電路100A中的對應元件。FIG. 5 is a circuit block diagram of a power supply circuit 100B according to some embodiments of the present disclosure. The power supply circuit 100B of FIG. 5 corresponds to the power supply circuit 100 of FIG. 1. The power supply circuit 100B includes a clock buffer 110B, a charge pump 120B, a control circuit 130B, and a voltage clamp circuit 140B. The voltage clamp circuit 140B includes a variable resistor R1. The variable resistor R1 is coupled between the system voltage VDD and the clock buffer 110B, and is controlled by the charge pump control signal CP_C. The connection method and operation of the clock buffer 110B, the charge pump 120B, and the control circuit 130B are similar to the corresponding components in the power supply circuit 100 of FIG. 1 and the power supply circuit 100A of FIG. 4A .

在一些實施例中,控制電路130B包含定電流源S1及可變電流源S2。可變電流源S2耦接於電荷泵120B,並用以轉換輸出訊號HV為參考電流IHV,其中參考電流IHV之電流值與輸出訊號HV之電壓位準呈正相關。定電流源S1耦接於可變電流源S2,並用以輸出參考電流IREF。在本實施例中,當電荷泵控制訊號CP_C越小時,位準控制訊號VDD_CLK之電壓越高;反之,當電荷泵控制訊號CP_C越大時,位準控制訊號VDD_CLK之電壓越低。 In some embodiments, the control circuit 130B includes a constant current source S1 and a variable current source S2. The variable current source S2 is coupled to the charge pump 120B and used to convert the output signal HV into a reference current I HV , wherein the current value of the reference current I HV is positively correlated with the voltage level of the output signal HV. The constant current source S1 is coupled to the variable current source S2 and used to output a reference current I REF . In this embodiment, when the charge pump control signal CP_C is smaller, the voltage of the level control signal VDD_CLK is higher; conversely, when the charge pump control signal CP_C is larger, the voltage of the level control signal VDD_CLK is lower.

詳細而言,當輸出訊號HV之電壓位準下降時,會使得位準控制訊號VDD_CLK上升。因此,時脈緩衝器110B所產生的調整後時脈訊號CLK_IN的脈衝振幅相較於時脈訊號CLK來得高,使得電荷泵120B拉抬輸出訊號HV的位準。當輸出訊號HV之電壓位準上升時,電荷泵控制訊號CP_C之位準會上升,使得位準控制訊號VDD_CLK的位準下降。因此,時脈緩衝器110B所產生的調整後時脈訊號CLK_IN的脈衝振幅相較於時脈訊號CLK來得低,使得電荷泵120B拉低輸出訊號HV的位準,藉此達到調節輸出訊號HV的功效。 Specifically, when the voltage level of the output signal HV decreases, the level control signal VDD_CLK increases. Therefore, the pulse amplitude of the adjusted clock signal CLK_IN generated by the clock buffer 110B is higher than the clock signal CLK, so that the charge pump 120B raises the level of the output signal HV. When the voltage level of the output signal HV increases, the level of the charge pump control signal CP_C increases, causing the level of the level control signal VDD_CLK to decrease. Therefore, the pulse amplitude of the adjusted clock signal CLK_IN generated by the clock buffer 110B is lower than that of the clock signal CLK, so that the charge pump 120B pulls down the level of the output signal HV, thereby achieving the effect of adjusting the output signal HV.

隨著電荷泵120B所產生的輸出訊號HV之位準提高,可變電流源S2受控於輸出訊號HV,故輸出的參考電流IHV增大。當參考電流IHV大於參考電流IREF,即產生分流自節點N1流向電壓箝位電路140B,而對電容C1進行充電,使得電荷泵控制訊號CP_C的位準逐漸提高。響應於電荷泵控制訊號CP_C的位準的提高,電壓箝位電路140B的可變電阻R1的電阻值逐漸增大,導致位準控制訊號VDD_CLK的位準下降。此外,隨著電荷泵120B所產生的輸出訊號HV之位準降低,可變電流源S2受控於輸出訊號HV,故輸出的參考電流I HV降低。當參考電流I HV低於參考電流I REF,此時電容C1對節點N1放電,使得電荷泵控制訊號CP_C的位準逐漸降低,電壓箝位電路140B的可變電阻R1的電阻值逐漸變小,導致位準控制訊號VDD_CLK的位準上升。 As the level of the output signal HV generated by the charge pump 120B increases, the variable current source S2 is controlled by the output signal HV, so the output reference current I HV increases. When the reference current I HV is greater than the reference current I REF , a current is generated from the node N1 to flow to the voltage clamp circuit 140B, and the capacitor C1 is charged, so that the level of the charge pump control signal CP_C gradually increases. In response to the increase in the level of the charge pump control signal CP_C, the resistance value of the variable resistor R1 of the voltage clamp circuit 140B gradually increases, resulting in a decrease in the level of the level control signal VDD_CLK. In addition, as the level of the output signal HV generated by the charge pump 120B decreases, the variable current source S2 is controlled by the output signal HV, so the output reference current I HV decreases. When the reference current I HV is lower than the reference current I REF , the capacitor C1 discharges to the node N1, causing the level of the charge pump control signal CP_C to gradually decrease, and the resistance value of the variable resistor R1 of the voltage clamp circuit 140B gradually decreases, resulting in an increase in the level control signal VDD_CLK.

第6圖為根據本揭示內容一些實施例繪示的電源供應電路100C之電路方塊示意圖。第6圖之電源供應電路100C對應於第1圖之電源供應電路100。電源供應電路100C包含時脈緩衝器110C、電荷泵120C、控制電路130C以及電壓箝位電路140C。控制電路130C包含電壓箝位電路141C。時脈緩衝器110C、電荷泵120C、控制電路130C以及電壓箝位電路140C的連接方式與運作分別相似於第1圖的電源供應電路100、第4A圖的電源供應電路100A及第5圖的電源供應電路100B中的對應元件。FIG. 6 is a circuit block diagram of a power supply circuit 100C according to some embodiments of the present disclosure. The power supply circuit 100C of FIG. 6 corresponds to the power supply circuit 100 of FIG. 1. The power supply circuit 100C includes a clock buffer 110C, a charge pump 120C, a control circuit 130C, and a voltage clamp circuit 140C. The control circuit 130C includes a voltage clamp circuit 141C. The connection and operation of the clock buffer 110C, the charge pump 120C, the control circuit 130C, and the voltage clamp circuit 140C are similar to the corresponding elements in the power supply circuit 100 of FIG. 1 , the power supply circuit 100A of FIG. 4A , and the power supply circuit 100B of FIG. 5 .

在一些實施例中,有別於控制電路130A以及控制電路130B,控制電路130C包含可變電阻R2及定電流源S1。可變電阻R2耦接於電荷泵120C,並用以轉換輸出訊號HV為參考電流I HV。定電流源S1耦接於電壓箝位電路141C,並用以根據參考電流I HV及定電流源S1之阻抗以於節點N1處產生偏壓。電壓箝位電路141C包含可變電阻R2,可變電阻R2受控於輸出訊號HV。可變電阻R2之功能類似於可變電阻R1,其功能為響應於輸出訊號HV越大,則可變電阻R2之電阻值會變得越小,使得電壓箝位電路141C輸出更大的參考電流I HV。據此,電壓箝位電路140C可根據輸出訊號HV的位準調整電荷泵控制訊號CP_C之電壓位準,藉以影響位準控制訊號VDD_CLK的電壓位準。時脈緩衝器110C、電荷泵120C的運作原理相同相似於前述之實施例中的對應元件,不再贅述。 In some embodiments, different from the control circuit 130A and the control circuit 130B, the control circuit 130C includes a variable resistor R2 and a constant current source S1. The variable resistor R2 is coupled to the charge pump 120C and used to convert the output signal HV into a reference current IHV . The constant current source S1 is coupled to the voltage clamp circuit 141C and used to generate a bias voltage at the node N1 according to the reference current IHV and the impedance of the constant current source S1. The voltage clamp circuit 141C includes a variable resistor R2, and the variable resistor R2 is controlled by the output signal HV. The function of the variable resistor R2 is similar to that of the variable resistor R1. The larger the output signal HV is, the smaller the resistance value of the variable resistor R2 will be, so that the voltage clamp circuit 141C outputs a larger reference current I HV . Accordingly, the voltage clamp circuit 140C can adjust the voltage level of the charge pump control signal CP_C according to the level of the output signal HV, thereby affecting the voltage level of the level control signal VDD_CLK. The operating principles of the clock buffer 110C and the charge pump 120C are the same as those of the corresponding components in the aforementioned embodiments, and will not be repeated.

第7圖為根據本揭示內容一些實施例繪示的電源供應電路100D之電路方塊示意圖。第7圖之電源供應電路100D對應於第1圖之電源供應電路100。電源供應電路100D包含時脈緩衝器110D、電荷泵120D、控制電路130D以及電壓箝位電路140D。時脈緩衝器110D、電荷泵120D的連接方式與運作方式分別相似於圖4A中對應的時脈緩衝器110A、電荷泵120A,為簡潔起見,相關細節不再贅述。此外,控制電路130D的連接方式與運作方式分別相似於第4A圖之控制電路130A。電壓箝位電路140D的連接方式與運作分別相似於第5圖之電壓箝位電路140B或第6圖之電壓箝位電路140C,由於控制電路130D以及電壓箝位電路140D的細節可參考第4A圖至第6圖,不再贅述。FIG. 7 is a circuit block diagram of a power supply circuit 100D according to some embodiments of the present disclosure. The power supply circuit 100D of FIG. 7 corresponds to the power supply circuit 100 of FIG. 1. The power supply circuit 100D includes a clock buffer 110D, a charge pump 120D, a control circuit 130D, and a voltage clamp circuit 140D. The connection method and operation method of the clock buffer 110D and the charge pump 120D are similar to the corresponding clock buffer 110A and the charge pump 120A in FIG. 4A, respectively. For the sake of brevity, the relevant details are not repeated. In addition, the connection method and operation method of the control circuit 130D are similar to the control circuit 130A in FIG. 4A. The connection method and operation of the voltage clamp circuit 140D are similar to those of the voltage clamp circuit 140B in FIG. 5 or the voltage clamp circuit 140C in FIG. 6 . The details of the control circuit 130D and the voltage clamp circuit 140D can be found in FIGS. 4A to 6 , and will not be described in detail.

第8圖為根據本揭示內容一些實施例繪示的電源供應電路100E之電路方塊示意圖。第8圖之電源供應電路100E對應於第1圖之電源供應電路100。電源供應電路100E包含時脈緩衝器110E、電荷泵120E、控制電路130E以及電壓箝位電路140E。時脈緩衝器110E、電荷泵120E以及控制電路130E的連接方式與運作方式分別相似於第4A圖中對應的時脈緩衝器110A、電荷泵120A以及控制電路130A,為簡潔起見,以下僅說明電壓箝位電路140E的細節。FIG. 8 is a circuit block diagram of a power supply circuit 100E according to some embodiments of the present disclosure. The power supply circuit 100E of FIG. 8 corresponds to the power supply circuit 100 of FIG. 1. The power supply circuit 100E includes a clock buffer 110E, a charge pump 120E, a control circuit 130E, and a voltage clamp circuit 140E. The connection method and operation method of the clock buffer 110E, the charge pump 120E, and the control circuit 130E are similar to the corresponding clock buffer 110A, the charge pump 120A, and the control circuit 130A in FIG. 4A, respectively. For the sake of brevity, only the details of the voltage clamp circuit 140E are described below.

在一些實施例中,電壓箝位電路140E包含可變電流源S3。可變電流源S3耦接於控制電路130E的節點N1,並用以接收系統電壓VDD以及電荷泵控制訊號CP_C,藉以根據電荷泵控制訊號CP_C之位準以輸出位準控制訊號VDD_CLK。在本實施例中,當電荷泵控制訊號CP_C越小時,位準控制訊號VDD_CLK之電壓越高;反之,當電荷泵控制訊號CP_C越大時,位準控制訊號VDD_CLK之電壓越低。In some embodiments, the voltage clamp circuit 140E includes a variable current source S3. The variable current source S3 is coupled to the node N1 of the control circuit 130E and is used to receive the system voltage VDD and the charge pump control signal CP_C, so as to output the level control signal VDD_CLK according to the level of the charge pump control signal CP_C. In this embodiment, when the charge pump control signal CP_C is smaller, the voltage of the level control signal VDD_CLK is higher; conversely, when the charge pump control signal CP_C is larger, the voltage of the level control signal VDD_CLK is lower.

詳細而言,隨著電荷泵120E所產生的輸出訊號HV之位準提高,參考電流I HV會增大。當參考電流I HV大於參考電流I REF時,即產生分流自節點N1流向電壓箝位電路140E,而對電容C1進行充電,使得電荷泵控制訊號CP_C的位準逐漸提高,電壓箝位電路140E的可變電流源S3響應電荷泵控制訊號CP_C之電壓位準而降低輸出之電流I C。此外,隨著電荷泵120E所產生的輸出訊號HV之位準降低,參考電流I HV也會降低。當參考電流I HV低於參考電流I REF,此時電容C1對節點N1放電,使得電荷泵控制訊號CP_C的位準逐漸降低,響應於電荷泵控制訊號CP_C之電壓位準之增大,電壓箝位電路140E的可變電流源S3輸出較低之電流I C,亦即輸出位準較低之位準控制訊號VDD_CLK至時脈緩衝器110E。由於位準控制訊號VDD_CLK是根據電流I C以及時脈緩衝器110E的內阻而產生,因此當電流I C越大,位準控制訊號VDD_CLK之電壓越大,反之亦然。 In detail, as the level of the output signal HV generated by the charge pump 120E increases, the reference current I HV increases. When the reference current I HV is greater than the reference current I REF , a shunt is generated from the node N1 to the voltage clamp circuit 140E, and the capacitor C1 is charged, so that the level of the charge pump control signal CP_C gradually increases, and the variable current source S3 of the voltage clamp circuit 140E responds to the voltage level of the charge pump control signal CP_C and reduces the output current I C . In addition, as the level of the output signal HV generated by the charge pump 120E decreases, the reference current I HV also decreases. When the reference current I HV is lower than the reference current I REF , the capacitor C1 discharges the node N1, causing the level of the charge pump control signal CP_C to gradually decrease. In response to the increase in the voltage level of the charge pump control signal CP_C, the variable current source S3 of the voltage clamp circuit 140E outputs a lower current IC , that is, outputs a lower level control signal VDD_CLK to the clock buffer 110E. Since the level control signal VDD_CLK is generated according to the current IC and the internal resistance of the clock buffer 110E, the larger the current IC is, the larger the voltage of the level control signal VDD_CLK is, and vice versa.

第9圖為根據本揭示內容一些實施例繪示的電源供應電路100F之電路方塊示意圖。第9圖之電源供應電路100F對應於第1圖之電源供應電路100。電源供應電路100F包含時脈緩衝器110F、電荷泵120F、控制電路130F以及電壓箝位電路140F。時脈緩衝器110F、電荷泵120F以及電壓箝位電路140F的連接方式與運作方式分別相似於第4A圖中對應的時脈緩衝器110A、電荷泵120A以及電壓箝位電路140A,為簡潔起見,以下僅說明關於控制電路130F的細節。FIG. 9 is a circuit block diagram of a power supply circuit 100F according to some embodiments of the present disclosure. The power supply circuit 100F of FIG. 9 corresponds to the power supply circuit 100 of FIG. 1. The power supply circuit 100F includes a clock buffer 110F, a charge pump 120F, a control circuit 130F, and a voltage clamp circuit 140F. The connection and operation of the clock buffer 110F, the charge pump 120F, and the voltage clamp circuit 140F are similar to the corresponding clock buffer 110A, the charge pump 120A, and the voltage clamp circuit 140A in FIG. 4A , respectively. For the sake of brevity, only the details of the control circuit 130F are described below.

在一些實施例中,控制電路130F包含齊納二極體Z1、電晶體T1及電流鏡電路131F。電流鏡電路131F耦接於電晶體T1,並用以複製定電流源S1之參考電流I REF,以輸出至電晶體T1之第二端。在一些實施例中,電流鏡電路131F包含電晶體T3至電晶體T4。電晶體T3耦接於節點N1。電晶體T3之汲極端耦接於電晶體T1之源極端以及地端。定電流源S1之第一端耦接於系統電壓VDD。定電流源S1之第二端耦接於電晶體T4之汲極端。電晶體T4之源極端耦接於地端。電晶體T4的汲極端與閘極端互相電性連接,且連接於電晶體T3之閘極端。須說明的是,電流鏡之特性為無論在何種負載條件下,電流鏡的輸出電流都可以保持恆定不變。電流鏡電路131F為類比電路,但本揭示內容不以此為限。 In some embodiments, the control circuit 130F includes a Zener diode Z1, a transistor T1, and a current mirror circuit 131F. The current mirror circuit 131F is coupled to the transistor T1, and is used to replicate the reference current I REF of the constant current source S1 to output it to the second end of the transistor T1. In some embodiments, the current mirror circuit 131F includes transistors T3 to T4. Transistor T3 is coupled to the node N1. The drain terminal of transistor T3 is coupled to the source terminal of transistor T1 and the ground terminal. The first end of the constant current source S1 is coupled to the system voltage VDD. The second end of the constant current source S1 is coupled to the drain terminal of the transistor T4. The source terminal of the transistor T4 is coupled to the ground terminal. The drain terminal and the gate terminal of transistor T4 are electrically connected to each other and connected to the gate terminal of transistor T3. It should be noted that the characteristic of the current mirror is that the output current of the current mirror can remain constant regardless of the load conditions. The current mirror circuit 131F is an analog circuit, but the content of this disclosure is not limited to this.

在一些實施例中,上述位準控制訊號VDD_CLK及輸出訊號HV皆為類比訊號,但本揭示內容不以此為限。此外,雖然在本揭示內容以上多個實施例中,皆以位準控制訊號VDD_CLK反比於電荷泵控制訊號CP_C作為穩定輸出訊號HV的手段,但在本揭示內容一些衍生的變化例中,可設計位準控制訊號VDD_CLK正比於電荷泵控制訊號CP_C作為穩定輸出訊號HV的手段,舉例來說,可增加反相電路(例如反相器)或是改變電晶體開關的類型(例如用NMOS替代PMOS,或用PMOS替代NMOS)來實現。In some embodiments, the level control signal VDD_CLK and the output signal HV are both analog signals, but the present disclosure is not limited thereto. In addition, although in the above embodiments of the present disclosure, the level control signal VDD_CLK is inversely proportional to the charge pump control signal CP_C as a means to stabilize the output signal HV, in some derivative variations of the present disclosure, the level control signal VDD_CLK can be designed to be proportional to the charge pump control signal CP_C as a means to stabilize the output signal HV. For example, this can be achieved by adding an inverting circuit (such as an inverter) or changing the type of transistor switch (such as replacing PMOS with NMOS, or replacing NMOS with PMOS).

在一些實施例中,電晶體T1、T3以及T4可用NMOS來實作,電晶體T2可用PMOS來實作。然而,本揭示內容不以此為限,舉例來說,根據電荷泵控制訊號CP_C的不同設計,電晶體T2亦可選用NMOS來實作。In some embodiments, transistors T1, T3 and T4 may be implemented by NMOS, and transistor T2 may be implemented by PMOS. However, the present disclosure is not limited thereto. For example, according to different designs of the charge pump control signal CP_C, transistor T2 may also be implemented by NMOS.

依據前述實施例,本揭示內容提供一種電源供應電路及動態電壓調整方法。藉由本揭示內容電源供應電路之設計,無需使用放大器來比較電壓,以輸出數位控制訊號,藉此連續性調整電荷泵的輸出電壓於預設電壓範圍內。此外,電源供應電路可以大幅減少元件面積及降低功耗,以降低電路佈局的複雜性。According to the above-mentioned embodiments, the present disclosure provides a power supply circuit and a dynamic voltage adjustment method. By designing the power supply circuit of the present disclosure, it is not necessary to use an amplifier to compare voltages to output a digital control signal, thereby continuously adjusting the output voltage of the charge pump within a preset voltage range. In addition, the power supply circuit can significantly reduce the component area and power consumption, thereby reducing the complexity of the circuit layout.

雖然本揭示內容以詳細之實施例揭露如上,然而本揭示內容並不排除其他可行之實施態樣。因此,本揭示內容之保護範圍當視所附之申請專利範圍所界定者為準,而非受於前述實施例之限制。Although the present disclosure is disclosed in detail with the embodiments as above, the present disclosure does not exclude other feasible implementations. Therefore, the protection scope of the present disclosure shall be determined by the scope of the attached patent application, rather than being limited by the aforementioned embodiments.

對本領域技術人員而言,在不脫離本揭示內容之精神和範圍內,當可對本揭示內容作各種之更動與潤飾。基於前述實施例,所有對本揭示內容所作的更動與潤飾,亦涵蓋於本揭示內容之保護範圍內。For those skilled in the art, various changes and modifications can be made to the disclosed content without departing from the spirit and scope of the disclosed content. Based on the above embodiments, all changes and modifications made to the disclosed content are also covered by the protection scope of the disclosed content.

100, 100A, 100B, 100C, 100D, 100E,100F:電源供應電路 110, 110A, 110B, 110C, 110D, 110E, 110F:時脈緩衝器 120, 120A, 120B, 120C, 120D, 120E,120F:電荷泵 130, 130A, 130B, 130C, 130D, 130E,130F:控制電路 131F:電流鏡電路 140, 140A, 140B, 140C, 140D, 140E,140F, 141C:電壓箝位電路 200:方法 210~240:步驟 CP_C:電荷泵控制訊號 CLK:時脈訊號 CLK_IN:調整後時脈訊號 C1:電容 HV:輸出訊號 I1~I2:階段 I HV, I REF:參考電流 I C:電流 N1:節點 R1~R2:可變電阻 S1:定電流源 S2, S3:可變電流源 SG1~SGn:二極體/電容器單元 T1~T4:電晶體 VDD:系統電壓 VDD_CLK:位準控制訊號 Z1:齊納二極體 100, 100A, 100B, 100C, 100D, 100E, 100F: power supply circuit 110, 110A, 110B, 110C, 110D, 110E, 110F: clock buffer 120, 120A, 120B, 120C, 120D, 120E, 120F: charge pump 130, 130A, 130B, 130C, 130D, 130E, 130F: control circuit 131F: current mirror circuit 140, 140A, 140B, 140C, 140D, 140E, 140F, 141C: voltage clamp circuit 200: method 210~240: step CP_C: charge pump control signal CLK: clock signal CLK_IN: adjusted clock signal C1: capacitor HV: output signal I1~I2: stage I HV , I REF : reference current IC : current N1: node R1~R2: variable resistor S1: constant current source S2, S3: variable current source SG1~SGn: diode/capacitor unit T1~T4: transistor VDD: system voltage VDD_CLK: level control signal Z1: Zener diode

參照後續段落中的實施方式以及下列圖式,當可更佳地理解本揭示內容: 第1圖為根據本揭示內容一些實施例繪示的電源供應電路之電路方塊示意圖; 第2圖為根據本揭示內容一些實施例繪示的動態電壓調整方法之流程示意圖; 第3圖為根據本揭示內容一些實施例繪示的電源供應電路之訊號時序示意圖; 第4A圖為根據本揭示內容一些實施例繪示的電源供應電路之電路方塊示意圖; 第4B圖係為第4A圖之電源供應電路中的時脈緩衝器的電路架構圖; 第5圖為根據本揭示內容一些實施例繪示的電源供應電路之電路方塊示意圖; 第6圖為根據本揭示內容一些實施例繪示的電源供應電路之電路方塊示意圖; 第7圖為根據本揭示內容一些實施例繪示的電源供應電路之電路方塊示意圖; 第8圖為根據本揭示內容一些實施例繪示的電源供應電路之電路方塊示意圖;以及 第9圖為根據本揭示內容一些實施例繪示的電源供應電路之電路方塊示意圖。 The present disclosure can be better understood by referring to the implementation methods in the subsequent paragraphs and the following figures: Figure 1 is a circuit block diagram of a power supply circuit according to some embodiments of the present disclosure; Figure 2 is a flow diagram of a dynamic voltage adjustment method according to some embodiments of the present disclosure; Figure 3 is a signal timing diagram of a power supply circuit according to some embodiments of the present disclosure; Figure 4A is a circuit block diagram of a power supply circuit according to some embodiments of the present disclosure; Figure 4B is a circuit architecture diagram of a clock buffer in the power supply circuit of Figure 4A; Figure 5 is a circuit block diagram of a power supply circuit according to some embodiments of the present disclosure; FIG. 6 is a schematic diagram of a circuit block of a power supply circuit according to some embodiments of the present disclosure; FIG. 7 is a schematic diagram of a circuit block of a power supply circuit according to some embodiments of the present disclosure; FIG. 8 is a schematic diagram of a circuit block of a power supply circuit according to some embodiments of the present disclosure; and FIG. 9 is a schematic diagram of a circuit block of a power supply circuit according to some embodiments of the present disclosure.

100:電源供應電路 100: Power supply circuit

110:時脈緩衝器 110: Clock buffer

120:電荷泵 120: Charge pump

130:控制電路 130: Control circuit

140:電壓箝位電路 140: Voltage clamp circuit

CP_C:電荷泵控制訊號 CP_C: Charge pump control signal

CLK:時脈訊號 CLK: clock signal

CLK_IN:調整後時脈訊號 CLK_IN: adjusted clock signal

HV:輸出訊號 HV: output signal

VDD_CLK:位準控制訊號 VDD_CLK: Level control signal

VDD:系統電壓 VDD: system voltage

Claims (9)

一種電源供應電路,包含:一時脈緩衝器,用以根據一時脈訊號及一位準控制訊號以產生一調整後時脈訊號,其中該時脈訊號具有一預定位準;一電荷泵,耦接於該時脈緩衝器,並用以根據該調整後時脈訊號及一系統電壓以產生一輸出訊號;一控制電路,耦接於該電荷泵,該控制電路用以根據該輸出訊號產生一電荷泵控制訊號;以及一第一電壓箝位電路,耦接於該控制電路及該時脈緩衝器之間,並用以接收該系統電壓以及該電荷泵控制訊號,其中該第一電壓箝位電路根據該電荷泵控制訊號產生該位準控制訊號,且該調整後時脈訊號響應於該位準控制訊號之位準而具有一調整後位準。 A power supply circuit includes: a clock buffer, used to generate an adjusted clock signal according to a clock signal and a level control signal, wherein the clock signal has a preset level; a charge pump, coupled to the clock buffer, and used to generate an output signal according to the adjusted clock signal and a system voltage; a control circuit, coupled to the charge pump, and used to generate an output signal according to the adjusted clock signal and a system voltage. The output signal generates a charge pump control signal; and a first voltage clamp circuit is coupled between the control circuit and the clock buffer and is used to receive the system voltage and the charge pump control signal, wherein the first voltage clamp circuit generates the level control signal according to the charge pump control signal, and the adjusted clock signal has an adjusted level in response to the level of the level control signal. 如請求項1所述之電源供應電路,其中該控制電路包含:一定電流源,該定電流源用以輸出一第一參考電流,且該控制電路用以根據該輸出訊號產生一第二參考電流,並根據該第一參考電流以及該第二參考電流產生該電荷泵控制訊號。 A power supply circuit as described in claim 1, wherein the control circuit comprises: a constant current source, the constant current source is used to output a first reference current, and the control circuit is used to generate a second reference current according to the output signal, and generate the charge pump control signal according to the first reference current and the second reference current. 如請求項2所述之電源供應電路,其中該第一電壓箝位電路另包含一第一可變電阻,該第一可變電阻 之一電阻值隨該電荷泵控制訊號之位準變化,其中該控制電路另包含:一第二電壓箝位電路,耦接於該電荷泵以及該定電流源,並用以根據該輸出訊號產生該第二參考電流,其中該第二電壓箝位電路包含:一第二可變電阻,該第二可變電阻之一電阻值隨該輸出訊號之位準變化,以調整該第二參考電流之位準。 A power supply circuit as described in claim 2, wherein the first voltage clamping circuit further comprises a first variable resistor, a resistance value of which varies with the level of the charge pump control signal, wherein the control circuit further comprises: a second voltage clamping circuit coupled to the charge pump and the constant current source, and used to generate the second reference current according to the output signal, wherein the second voltage clamping circuit comprises: a second variable resistor, a resistance value of which varies with the level of the output signal to adjust the level of the second reference current. 如請求項2所述之電源供應電路,其中該控制電路另包含:一可變電流源,耦接於該電荷泵以及該定電流源,並用以將該輸出訊號轉換為該第二參考電流;其中該第一電壓箝位電路包含:一第一可變電阻,該第一可變電阻之一電阻值隨該電荷泵控制訊號之位準變化。 The power supply circuit as described in claim 2, wherein the control circuit further comprises: a variable current source coupled to the charge pump and the constant current source and used to convert the output signal into the second reference current; wherein the first voltage clamp circuit comprises: a first variable resistor, a resistance value of the first variable resistor changes with the level of the charge pump control signal. 如請求項2所述之電源供應電路,其中該控制電路另包含:一齊納二極體,耦接於該電荷泵,並用以根據該輸出訊號輸出一第二參考電流;以及一第一電晶體,該第一電晶體之第一端耦接於該齊納二極體,該第一電晶體之第二端耦接於該定電流源。 The power supply circuit as described in claim 2, wherein the control circuit further comprises: a Zener diode coupled to the charge pump and used to output a second reference current according to the output signal; and a first transistor, the first end of the first transistor is coupled to the Zener diode, and the second end of the first transistor is coupled to the constant current source. 如請求項5所述之電源供應電路,其中該第 一電壓箝位電路另包含:一第一可變電阻,該第一可變電阻之一電阻值隨該電荷泵控制訊號之位準變化。 The power supply circuit as described in claim 5, wherein the first voltage clamping circuit further comprises: a first variable resistor, a resistance value of the first variable resistor changes with the level of the charge pump control signal. 如請求項5所述之電源供應電路,其中該第一電壓箝位電路另包含:一可變電流源,耦接於該控制電路,並用以接收該系統電壓,其中該可變電流源之一輸出電流之位準隨該電荷泵控制訊號之位準變化,且該位準控制訊號之位準正比於該輸出電流之位準。 The power supply circuit as described in claim 5, wherein the first voltage clamping circuit further comprises: a variable current source coupled to the control circuit and used to receive the system voltage, wherein the level of an output current of the variable current source varies with the level of the charge pump control signal, and the level of the level control signal is proportional to the level of the output current. 如請求項5所述之電源供應電路,其中該第一電壓箝位電路包含:一第二電晶體,具有:一第一端,用以接收該系統電壓;一第二端,耦接於該時脈緩衝器,用以輸出該位準控制訊號至該時脈緩衝器;以及一控制端,耦接於該控制電路,用以接收該電荷泵控制訊號。 A power supply circuit as described in claim 5, wherein the first voltage clamping circuit comprises: a second transistor having: a first end for receiving the system voltage; a second end coupled to the clock buffer for outputting the level control signal to the clock buffer; and a control end coupled to the control circuit for receiving the charge pump control signal. 如請求項8所述之電源供應電路,其中該控制電路另包含:一第三電晶體,該第三電晶體之第一端耦接於該第一電晶體之該第二端以及一地端;以及 一第四電晶體,其中該定電流源之第一端耦接於該系統電壓,該定電流源之第二端耦接於該第四電晶體之第一端,該第四電晶體之第二端耦接於該地端,該第四電晶體之控制端耦接於該第四電晶體之該第一端以及該第三電晶體之控制端。 A power supply circuit as described in claim 8, wherein the control circuit further comprises: a third transistor, wherein the first terminal of the third transistor is coupled to the second terminal of the first transistor and a ground terminal; and a fourth transistor, wherein the first terminal of the constant current source is coupled to the system voltage, the second terminal of the constant current source is coupled to the first terminal of the fourth transistor, the second terminal of the fourth transistor is coupled to the ground terminal, and the control terminal of the fourth transistor is coupled to the first terminal of the fourth transistor and the control terminal of the third transistor.
TW112214137U 2023-12-25 2023-12-25 Power supply circuit TWM654134U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI873050B (en) * 2024-06-18 2025-02-11 大陸商北京歐錸德微電子技術有限公司 Charge pump, control chip and electronic device capable of reducing voltage ripple
TWI887933B (en) * 2023-12-25 2025-06-21 能創半導體股份有限公司 Power supply circuit and dynamic voltage adjustment method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI887933B (en) * 2023-12-25 2025-06-21 能創半導體股份有限公司 Power supply circuit and dynamic voltage adjustment method
TWI873050B (en) * 2024-06-18 2025-02-11 大陸商北京歐錸德微電子技術有限公司 Charge pump, control chip and electronic device capable of reducing voltage ripple

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