TWM652354U - Testing structure and filter thereof - Google Patents
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- TWM652354U TWM652354U TW112212669U TW112212669U TWM652354U TW M652354 U TWM652354 U TW M652354U TW 112212669 U TW112212669 U TW 112212669U TW 112212669 U TW112212669 U TW 112212669U TW M652354 U TWM652354 U TW M652354U
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Abstract
Description
本申請涉及通訊的技術領域,尤其涉及一種調試結構及其濾波器。The present application relates to the technical field of communications, and in particular to a debugging structure and its filter.
於現有技術中,腔體濾波器的諧振桿設置於腔體內,腔體的頂部具有蓋板,先於蓋板上加工螺紋孔,調試螺桿的周側具有匹配的螺紋孔的螺紋,上述兩者通過螺紋旋合,以實現螺桿伸入腔體的諧振桿內孔中。調節螺桿通過螺紋的上、下旋轉的方式調整位置,使用者能夠依據需求調整調節螺桿一端位於諧振器內的高度位置,進而改變諧振頻率。然,因為調試螺桿與蓋板的螺紋結構的方式並無法完全固定柱調試螺桿與蓋板,所以蓋板與調試螺桿之間仍有旋轉向上遠離諧振桿移動以及旋轉向下靠近諧振桿移動的兩種情況發生。有鑑於此,如何有效確保調試螺桿與蓋板之間能夠固定不移動,又同時能夠達到簡單調整上、下位移調試螺桿與諧振桿之間的距離,上述是目前需要解決的問題。In the prior art, the resonant rod of the cavity filter is arranged in the cavity. The top of the cavity has a cover plate. The threaded hole is processed on the cover plate first. The peripheral side of the debugging screw rod has threads that match the threaded hole. The above two Through screw threading, the screw rod extends into the inner hole of the resonant rod of the cavity. The position of the adjusting screw is adjusted by rotating the thread up and down. The user can adjust the height position of one end of the adjusting screw in the resonator according to the needs, thereby changing the resonant frequency. However, because the screw structure of the adjusting screw and the cover plate cannot completely fix the column adjusting screw rod and the cover plate, there are still two parts between the cover plate and the adjusting screw rod: rotating upward and moving away from the resonant rod, and rotating downward and moving closer to the resonant rod. situation occurs. In view of this, how to effectively ensure that the debugging screw and the cover plate can be fixed and not move, and at the same time be able to simply adjust the distance between the upper and lower displacement debugging screw and the resonant rod, are the problems that need to be solved at present.
本申請實施方式提供一種調試結構,其能夠解決現有螺桿與蓋板之間為了能夠達到簡單調整上、下位移調試螺桿與諧振桿之間的距離,進而導致調試螺桿與蓋板之間不能夠達到固定不動的問題。The embodiment of the present application provides a debugging structure, which can solve the problem that the distance between the existing screw and the cover plate cannot be adjusted in order to simply adjust the upper and lower displacements between the screw and the resonant rod. Fixed problem.
為了解決上述技術問題,本申請是這樣實現的:In order to solve the above technical problems, this application is implemented as follows:
第一方面提供了一種調試結構,其包含:蓋板與調試組件。蓋板具有固定部。調試組件包括固定套件與調試桿,固定套件固定於固定部,固定套件具有複數個固定件與環件,複數個固定件間隔設置於環件下,環件與複數個固定件形成穿孔,穿孔的內徑寬度自環件到複數個固定件漸縮,調試桿的一端自環件插入穿孔,調試桿的周側受到複數個固定件緊迫固定。The first aspect provides a debugging structure, which includes: a cover plate and a debugging component. The cover plate has a fixing part. The debugging component includes a fixing set and a debugging rod. The fixing set is fixed on the fixing part. The fixing set has a plurality of fixing parts and ring parts. The plurality of fixing parts are arranged under the ring part at intervals. The ring part and the plurality of fixing parts form perforations. The perforations are The inner diameter width is tapered from the ring to the plurality of fixing parts. One end of the debugging rod is inserted into the hole through the ring, and the peripheral side of the debugging rod is tightly fixed by the plurality of fixing parts.
在於本申請的調試結構中,穿孔的內壁具有第一螺紋,調試桿的調試頭部的外壁具有第二螺紋,第二螺紋螺合於第一螺紋。In the debugging structure of the present application, the inner wall of the perforation has a first thread, the outer wall of the debugging head of the debugging rod has a second thread, and the second thread is threaded with the first thread.
於本申請的調試結構中,第一螺紋在固定套件的軸向上具有錐度;第二螺紋在調試桿的軸向上的直徑一致,固定套件與調試桿的軸心重合。In the debugging structure of the present application, the first thread has a taper in the axial direction of the fixing set; the diameter of the second thread in the axial direction of the debugging rod is consistent, and the axes of the fixing set and the debugging rod coincide.
於本申請的調試結構中,調試桿具有調試頭部與調試桿部,調試頭部的外徑大於調試桿部的外徑。In the debugging structure of the present application, the debugging rod has a debugging head and a debugging rod part, and the outer diameter of the debugging head is larger than the outer diameter of the debugging rod part.
於本申請的調試結構中,固定部更包括第一固定槽與固定孔,固定孔位於第一固定槽的槽底,固定套件的該些個固定件容置固定於第一固定槽內,調試桿的調試桿部穿過固定孔。In the debugging structure of the present application, the fixing part further includes a first fixing slot and a fixing hole. The fixing hole is located at the bottom of the first fixing slot. The fixing pieces of the fixing kit are accommodated and fixed in the first fixing slot. The debugging rod part of the rod passes through the fixing hole.
於本申請的調試結構中,調試桿的調試桿部的外徑小於等於固定孔的孔徑。In the debugging structure of the present application, the outer diameter of the debugging rod portion of the debugging rod is less than or equal to the aperture of the fixing hole.
於本申請的調試結構中,固定部更包括第二固定槽,第一固定槽位於第二固定槽的槽底,固定套件的環件的外側容置固定於第二固定槽。In the debugging structure of the present application, the fixing part further includes a second fixing groove, the first fixing groove is located at the bottom of the second fixing groove, and the outer side of the ring member of the fixing set is accommodated and fixed in the second fixing groove.
於本申請的調試結構中,固定套件與固定部之間是通過緊迫固定、螺合固定或黏接固定。In the debugging structure of this application, the fixing kit and the fixing part are fixed by pressing, screwing or adhesive.
於本申請的調試結構中,固定部的第一固定槽的槽內壁具有第三螺紋,固定套件的該些個固定件的外壁上具有第四螺紋,第四螺紋螺合於第三螺紋。In the debugging structure of the present application, the inner wall of the first fixing groove of the fixing part has a third thread, and the outer walls of the fixing pieces of the fixing set have fourth threads, and the fourth threads are screwed to the third threads.
於本申請的調試結構中,調試桿的調試頭部的外徑小於等於對應於環件範圍內的穿孔的內徑寬度,調試桿的調試頭部的外徑大於等於對應於該些個固定件範圍內的穿孔的內徑寬度。In the debugging structure of the present application, the outer diameter of the debugging head of the debugging rod is less than or equal to the inner diameter width corresponding to the perforation within the ring range, and the outer diameter of the debugging head of the debugging rod is greater than or equal to the width corresponding to the fixing parts. The inner diameter width of the perforation within the range.
於本申請的調試結構中,環件具有環口,該些個固定件沿著環口的邊緣間隔設置。In the debugging structure of the present application, the ring member has a ring opening, and the fixing members are spaced apart along the edge of the ring opening.
於本申請的調試結構中,環件更包括導引邊,導引邊位於環口的周圍。In the debugging structure of the present application, the ring further includes a guide edge, and the guide edge is located around the ring opening.
於本申請的調試結構中,固定套件的該些個固定件相對於環件具有可彎折性。In the debugging structure of the present application, the fixing members of the fixing kit are bendable relative to the ring member.
第二方面提供了具有第一方面調試結構的濾波器,其包括外殼與諧振桿。外殼具有容置槽。以及諧振桿設置於容置槽內;其中蓋板蓋住容置槽,固定部對應於諧振桿,調試桿通過固定套件維持相對於諧振桿的高度位置,調試桿於固定套件內上、下移動調整高度位置。The second aspect provides a filter with a debugging structure of the first aspect, which includes a housing and a resonant rod. The shell has a receiving groove. And the resonant rod is arranged in the accommodating groove; the cover plate covers the accommodating groove, the fixed part corresponds to the resonant rod, the debugging rod maintains the height position relative to the resonant rod through the fixing set, and the debugging rod moves up and down in the fixing set Adjust the height position.
在本申請實施方式中,其通過固定套件固定於蓋板的固定部,固定套件具有複數個固定件與環件,複數個固定件間隔設置於環件下,環件與複數個固定件形成穿孔,穿孔的內徑寬度自環件到複數個固定件漸縮,調試桿於通過固定套件的複數個固定件時,調試桿將複數個固定件向外撐開,調試桿同時也受到複數個固定件內縮的緊迫固定,如此固定套件可維持調試桿相對於蓋板的高度位置,不受到外力作用下的調試桿不會產生位移。In the embodiment of the present application, it is fixed to the fixed part of the cover plate through a fixing set. The fixing set has a plurality of fixing parts and a ring part. The plurality of fixing parts are arranged under the ring part at intervals. The ring part and the plurality of fixing parts form perforations. , the inner diameter width of the perforation gradually shrinks from the ring to the plurality of fixing parts. When the debugging rod passes through the plurality of fixing parts of the fixing kit, the debugging rod spreads the plurality of fixing parts outward, and the debugging rod is also subjected to the plurality of fixing parts at the same time. The parts are tightly fixed by retracting, so that the fixing kit can maintain the height position of the debugging rod relative to the cover plate, and the debugging rod will not be displaced when it is not affected by external force.
下面將結合本申請實施方式中的附圖,對本申請實施方式中的技術方案進行清楚、完整地描述,顯然,所描述的實施方式是本申請一部分實施方式,而不是全部的實施方式。基於本申請中的實施方式,本領域普通技術人員在沒有作出創造性勞動前提下所獲得的所有其他實施方式,都屬於本申請保護的範圍。The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of this application.
請參閱圖1到圖5,是本申請的第一實施方式的調試結構的立體圖、圖2是圖1中A-A’線段的剖視圖、圖3是圖1中A-A’線段的剖視分解圖、圖4是調試結構的分解立體圖與圖5是調試結構的另一分解立體圖。如圖所示,本實施方式提供一種調試結構1,其可用於射頻結構,如濾波器、雙工器、合路器、塔頂放大器等。調試結構1包括蓋板11與調試組件12。蓋板11具有固定部111。調試組件12包括固定套件121與調試桿122,固定套件121固定於固定部111,固定套件121具有複數個固定件1211與環件1212,複數個固定件1211間隔設置於環件1212下,環件1212與複數個固定件1211形成穿孔1210,穿孔1210的內徑寬度W自環件1212到複數個固定件1211漸縮(即內徑寬度由大逐漸變小),調試桿122的一端自環件1212插入穿孔1210,調試桿122的周側受到複數個固定件1211緊迫固定。如此本實施方式通過固定套件121的複數個固定件1211固定調試桿122的位置。在一些實施例中,固定套件121單體零件,複數個固定件1211與環件1212為一體成型,因而結構簡單,且可靠性好。Please refer to Figures 1 to 5, which are perspective views of the debugging structure of the first embodiment of the present application. Figure 2 is a cross-sectional view along the line AA' in Figure 1. Figure 3 is a cross-section along the line AA' in Figure 1. Exploded view, Figure 4 is an exploded perspective view of the debugging structure, and Figure 5 is another exploded perspective view of the debugging structure. As shown in the figure, this embodiment provides a
請複參閱圖3,於本實施方式中,蓋板11的固定部111更包括第一固定槽1111與固定孔1110,固定孔1110位於第一固定槽1111的槽底,固定套件121的複數個固定件1211容置固定於第一固定槽1111內。調試桿122具有調試頭部1221與調試桿部1222,調試頭部1221的外徑大於調試桿部1222的外徑。調試桿122的調試桿部1222穿過固定孔1110,其中調試桿122的調試桿部1222的外徑小於等於固定孔1110的孔徑。在一些實施例中,調試桿122的調試桿部1222的外徑略小於固定孔1110的孔徑,調試桿部1222與固定孔1110為間隙配合,兩者之間不產生摩擦。再者,固定部111更包括第二固定槽1112,第一固定槽1111位於第二固定槽1112的槽底,如此第一固定槽1111與第二固定槽1112呈現階梯式的凹槽,即第二固定槽1112的槽底中間具有第一固定槽1111的槽口,換言之,第二固定槽1112的槽底為第一固定槽1111的槽口周側的平面。Please refer to FIG. 3 again. In this embodiment, the fixing
當固定套件121組裝於固定部111的第一固定槽1111與第二固定槽1112時,固定套件121的環件1212的外側容置固定於第二固定槽1112,而固定套件121的複數個固定件1211容置固定於第一固定槽1111內。其中固定套件121的環件1212具有環口12120,複數個固定件1211沿著環口12120的邊緣間隔設置,如此固定套件121的複數個固定件1211相對於環件1212具有可彎折性。其中,本實施方式的固定套件121的複數個固定件1211為四個(請參閱圖5)。本實施方式的固定套件121並不限制固定件1211的數量,固定件1211達到至少兩個以上即可,使固定套件121能夠通過複數個固定件1211緊靠固定調試桿122的調試頭部1221。When the fixing set 121 is assembled in the
另外,環件1212的環口12120的口徑相同於或大於調試桿122的調試頭部的外徑D。環件1212更包括導引邊12121,導引邊12121位於環口12120的周圍。其中導引邊12121為對應於環口12120的斜邊,導引邊12121有助於導引調試桿122的調試桿部1222朝向環件1212的環口12120插入。其中調試桿122的調試頭部1221的外徑大於調試桿122的調試桿部1222的外徑。調試桿122的調試桿部1222先穿過固定套件121的穿孔1210。其中對應於環件1212範圍內的穿孔1210的第一內徑寬度為W1以及對應於複數個固定件1211範圍內的穿孔1210的第二內徑寬度為W2。調試桿122的調試頭部1221的外徑D小於等於對應於環件1212範圍內的穿孔1210的第一內徑寬度W1,調試桿122的調試頭部1221的外徑D大於等於對應於複數個固定件1211範圍內的穿孔1210的第二內徑寬度W2。In addition, the diameter of the
於本實施方式中,調試桿122的調試桿部1222不受到固定套件121的穿孔1210的內徑大小限制而直接通過。調試桿122的調試頭部1221可剛好通過對應於環件1212範圍內的穿孔1210,直到調試桿122的調試頭部1221通過複數個固定件1211時,調試頭部1221受到複數個固定件1211向內抵靠限制,即調試桿122的調試頭部1221的外徑D因為大於等於對應於複數個固定件1211範圍內的穿孔1210的第二內徑寬度W2,使調試桿122的調試頭部1221需要將複數個固定件1211向外撐開變形,同時調試桿122的調試頭部1221也會受到複數個固定件1211反作用力的內縮緊迫固定。在維持複數個固定件1211內縮的緊迫固定調試桿122的調試頭部1221情況下,將調試桿122的調試桿部1222穿入第一固定槽1111的固定孔1110,如此複數個固定件1211通過摩擦力能夠維持調試桿122的調試頭部1221的高度位置,換言之,調試桿122的調試頭部1221於不受外力作用的情況下,並不會因為調試桿122本身的重量或結構問題而導致鬆脫位移。當使用者需要調整調試桿122相對於蓋板11的高度位置時,使用者只要施力大於複數個固定件1211對於調試桿122的靜摩擦力,使用者可直接調整調試桿122於固定套件121內上、下移動。In this embodiment, the
另外,請複參閱圖2,調試桿122調整位於固定套件121的位置時,由於固定套件121與調試桿122之間是通過接觸面的緊迫固定,調試桿122的上下移動會造成固定套件121與調試桿122之間的固定接觸面產生摩擦,進而產生摩擦碎屑或金屬絲,上述碎屑或金屬絲會落入位於固定套件121下方的第一固定槽1111內,且第一固定槽1111的固定孔1110剛好被調試桿122的調試桿部1222封住。如此能避免因為調整調試桿122的高度而產生摩擦碎屑或金屬絲落入蓋板11內側的問題。In addition, please refer to Figure 2 again. When the
請參閱圖6,是本申請的第二實施方式的調試結構的的剖視圖。如圖所示,本實施方式相較於第一實施方式的差異在於固定套件121與調試桿122之間的固定結構。於本實施方式中,固定套件121的穿孔1210的內壁具有第一螺紋1213,調試桿122的調試頭部1221的外側壁具有第二螺紋1223,第二螺紋1223螺合於第一螺紋1213。在一些實施方式中,第一螺紋1213在固定套件121的軸向上的直徑漸縮;或者,第一螺紋1213在固定套件121的軸向上具有錐度。在一些實施方式中,第二螺紋1223在調試桿122的軸向上的直徑一致;或者,第二螺紋1223在調試桿122的軸向上不具有錐度,且固定套件121與調試桿122的軸心重合。隨著第二螺紋1223螺合於第一螺紋1213的進程,複數個固定件1211逐漸被撐開而產生彈性變形,複數個固定件1211的彈性回復力施加在調試頭部1221而使調試桿122被緊迫固定。本實施方式的固定套件121通過螺紋結構與複數個固定件1211緊迫固定的方式,其能夠更好的對調試桿122相對於蓋板11的高度位置進行調整與固定。另外,本實施方式的調試桿122與固定套件121之間通過螺紋結構的會更容易摩擦產生碎屑或金屬絲,本實施方式可更進一步利用前述實施方式的第一固定槽1111的槽底承接摩擦的碎屑或金屬絲,有利於調試結構1的使用。Please refer to FIG. 6 , which is a cross-sectional view of the debugging structure of the second embodiment of the present application. As shown in the figure, the difference between this embodiment and the first embodiment lies in the fixing structure between the fixing
請參閱圖7,是本申請的第二實施方式的調試結構的的剖視圖。如圖所示,本實施方式相較於第一實施方式的差異在於固定套件121與蓋板11的固定部111的固定結構。於本實施方式中,固定部111的第一固定槽1111的槽內壁具有第三螺紋1113,固定套件121的複數個固定件1211容置固定於第一固定槽1111的外壁上具有第四螺紋1214,第四螺紋1214螺合於第三螺紋1113。如此將固定套件121的複數個固定件1211固定於第一固定槽1111內。另外,本實施方式關於固定套件121與固定部111的第一固定槽1111之間的固定方式可通過緊迫固定、螺合固定或黏接固定等方式,上述固定方式可依據使用者的需求作調整。本實施方式的固定套件121與蓋板11的第一固定槽1111之間通過螺紋結構的會更容易摩擦產生碎屑或金屬絲,本實施方式可更進一步利用前述實施方式的第一固定槽1111的槽底承接摩擦的碎屑或金屬絲,有利於調試結構1的使用。Please refer to FIG. 7 , which is a cross-sectional view of the debugging structure of the second embodiment of the present application. As shown in the figure, the difference between this embodiment and the first embodiment lies in the fixing structure of the fixing set 121 and the fixing
請參閱圖8與圖9,圖8是本申請的濾波器的立體圖與圖9是圖8中B-B’線段的剖視圖。如圖所示,本實施方式提供一種濾波器2,濾波器2具有如前述的調試結構1,濾波器2包括外殼21與諧振桿22,外殼21具有容置槽210,諧振桿22設置於容置槽210內;其中,蓋板11蓋住容置槽210,固定部111的固定孔1110對應於諧振桿22。本實施方式的固定套件121的複數個固定件1211是朝向諧振桿22的方向延伸,固定套件121位於蓋板11的外側,諧振桿22位於蓋板11的內側,固定套件121的複數個固定件1211朝向諧振桿22的方向與蓋板11的固定部111組合固定,調試桿122通過固定套件121維持相對於諧振桿22的高度位置H,調試桿122於固定套件121內上、下移動調整調試桿部1222相對位於諧振桿22內的高度位置H,如此實現頻率(或耦合)調試功能。Please refer to Figures 8 and 9. Figure 8 is a perspective view of the filter of the present application and Figure 9 is a cross-sectional view of the B-B' line segment in Figure 8. As shown in the figure, this embodiment provides a
綜上所述,本申請提供一種調試結構及其濾波器,調試結構通過固定套件固定於蓋板的固定部,固定套件具有複數個固定件與環件,複數個固定件間隔設置於環件下,環件與複數個固定件形成穿孔,穿孔的內徑寬度自環件到複數個固定件漸縮,調試桿於通過固定套件的複數個固定件時,調試桿將複數個固定件向外撐開,調試桿同時也受到複數個固定件內縮的緊迫固定,如此固定套件可維持調試桿相對於蓋板的高度位置,不受到外力作用下的調試桿不會產生位移。To sum up, this application provides a debugging structure and its filter. The debugging structure is fixed on the fixed part of the cover plate through a fixing set. The fixing set has a plurality of fixing pieces and a ring piece. The plurality of fixing pieces are spaced under the ring piece. , the ring and the plurality of fixing parts form a perforation, the inner diameter width of the perforation gradually shrinks from the ring to the plurality of fixing parts, and when the debugging rod passes through the plurality of fixing parts of the fixing kit, the debugging rod supports the plurality of fixing parts outwards When opened, the debugging rod is also tightly fixed by the retraction of multiple fixing parts. In this way, the fixing kit can maintain the height position of the debugging rod relative to the cover, and the debugging rod will not be displaced when not affected by external forces.
需要說明的是,在本文中,術語“包括”、“包含”或者其任何其他變體意在涵蓋非排他性的包含,從而使得包括一系列要素的過程、方法、物品或者裝置不僅包括那些要素,而且還包括沒有明確列出的其他要素,或者是還包括為這種過程、方法、物品或者裝置所固有的要素。在沒有更多限制的情況下,由語句“包括一個……”限定的要素,並不排除在包括該要素的過程、方法、物品或者裝置中還存在另外的相同要素。It should be noted that, in this document, the terms "comprising", "comprises" or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article or device that includes a series of elements not only includes those elements, It also includes other elements not expressly listed or inherent in the process, method, article or apparatus. Without further limitation, an element defined by the statement "comprises a..." does not exclude the presence of additional identical elements in a process, method, article or apparatus that includes that element.
上面結合附圖對本申請的實施方式進行了描述,但是本申請並不局限於上述的具體實施方式,上述的具體實施方式僅僅是示意性的,而不是限制性的,本領域的普通技術人員在本申請的啟示下,在不脫離本申請宗旨和請求項所保護的範圍情況下,還可做出很多形式,均屬於本申請的保護範圍。The embodiments of the present application have been described above in conjunction with the accompanying drawings. However, the present application is not limited to the above-mentioned specific embodiments. The above-mentioned specific embodiments are only illustrative and not restrictive. Those of ordinary skill in the art will Inspired by this application, many forms can be made without departing from the purpose of this application and the protection scope of the claims, all of which fall within the protection scope of this application.
1:調試結構 11:蓋板 111:固定部 1110:固定孔 1111:第一固定槽 1112:第二固定槽 1113:第三螺紋 12:調試組件 121:固定套件 1210:穿孔 1211:固定件 1212:環件 12120:環口 12121:導引邊 1213:第一螺紋 1214:第四螺紋 122:調試桿 1221:調試頭部 1222:調試桿部 1223:第二螺紋 2:濾波器 21:外殼 210:容置槽 22:諧振桿 D:外徑 W1:第一內徑寬度 W2:第二內徑寬度 H:高度位置 1:Debug structure 11:Cover 111: Fixed part 1110:Fixing hole 1111: First fixing slot 1112:Second fixing slot 1113:Third thread 12: Debugging components 121: Fixing kit 1210:Perforation 1211: Fixtures 1212:Ring piece 12120: Ring mouth 12121:Guiding edge 1213:First thread 1214:Fourth thread 122:Debug lever 1221: Debug header 1222: Debugging the rod 1223:Second thread 2: Filter 21: Shell 210: Accommodation tank 22: Resonance rod D:Outer diameter W1: First inner diameter width W2: Second inner diameter width H: height position
此處所說明的附圖用來提供對本申請的進一步理解,構成本申請的一部分,本申請的示意性實施例及其說明用於解釋本申請,並不構成對本申請的不當限定。在附圖中: 圖1是本申請的第一實施方式的調試結構的立體圖。 圖2是圖1中A-A’線段的剖視圖。 圖3是圖1中A-A’線段的剖視分解圖。 圖4是本申請的第一實施方式的調試結構的分解立體圖。 圖5是本申請的第一實施方式的調試結構的另一分解立體圖。 圖6是本申請的第二實施方式的調試結構的剖視圖。 圖7是本申請的第三實施方式的調試結構的剖視圖。 圖8是本申請的濾波器的立體圖。 圖9是圖8中B-B’線段的剖視圖。 The drawings described here are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation of the present application. In the attached picture: FIG. 1 is a perspective view of the debugging structure of the first embodiment of the present application. Figure 2 is a cross-sectional view along line A-A' in Figure 1. Figure 3 is a cross-sectional exploded view of line segment A-A' in Figure 1. 4 is an exploded perspective view of the debugging structure of the first embodiment of the present application. FIG. 5 is another exploded perspective view of the debugging structure of the first embodiment of the present application. FIG. 6 is a cross-sectional view of the debugging structure of the second embodiment of the present application. FIG. 7 is a cross-sectional view of the debugging structure of the third embodiment of the present application. Figure 8 is a perspective view of the filter of the present application. Fig. 9 is a cross-sectional view of line segment B-B' in Fig. 8.
1:調試結構 1:Debug structure
111:固定部 111: Fixed part
1110:固定孔 1110:Fixing hole
1111:第一固定槽 1111: First fixing slot
1112:第二固定槽 1112:Second fixing slot
121:固定套件 121: Fixing kit
1210:穿孔 1210:Perforation
1211:固定件 1211: Fixtures
1212:環件 1212:Ring piece
122:調試桿 122:Debug lever
1221:調試頭部 1221: Debug header
1222:調試桿部 1222: Debugging the rod
D:外徑 D:Outer diameter
W1:第一內徑寬度 W1: First inner diameter width
W2:第二內徑寬度 W2: Second inner diameter width
Claims (14)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211537297.6A CN115863945A (en) | 2022-12-02 | 2022-12-02 | Debug structure and its filters |
| CN202211537297.6 | 2022-12-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM652354U true TWM652354U (en) | 2024-03-01 |
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| Application Number | Title | Priority Date | Filing Date |
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| TW112212669U TWM652354U (en) | 2022-12-02 | 2023-11-21 | Testing structure and filter thereof |
| TW112145017A TWI898329B (en) | 2022-12-02 | 2023-11-21 | Testing structure and filter thereof |
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| Application Number | Title | Priority Date | Filing Date |
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| TW112145017A TWI898329B (en) | 2022-12-02 | 2023-11-21 | Testing structure and filter thereof |
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| CN (1) | CN115863945A (en) |
| TW (2) | TWM652354U (en) |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101826799B1 (en) * | 2016-03-17 | 2018-03-22 | 주식회사 에이스테크놀로지 | Ceramic Resonator Filter including Coupling Member |
| KR102172764B1 (en) * | 2018-10-19 | 2020-11-02 | 주식회사 에이스테크놀로지 | Cavity filter having structure for self-locking and method for producing the same |
| CN210926244U (en) * | 2020-01-08 | 2020-07-03 | 罗森伯格技术有限公司 | Apron and wave filter with self-locking function |
| CN111987399A (en) * | 2020-09-10 | 2020-11-24 | 深圳市威富通讯技术有限公司 | Filter and rod fly adjusting assembly |
| CN214336885U (en) * | 2021-04-01 | 2021-10-01 | 昆山立讯射频科技有限公司 | Debugging component and filter for radio frequency device |
| CN215732126U (en) * | 2021-04-28 | 2022-02-01 | 昆山立讯射频科技有限公司 | Cavity filter |
| CN113437456B (en) * | 2021-06-11 | 2022-12-02 | 大富科技(安徽)股份有限公司 | Cover plate assembly and filter |
| CN113851800B (en) * | 2021-08-13 | 2022-12-13 | 武汉凡谷电子技术股份有限公司 | Filter and manufacturing method thereof |
| CN217544886U (en) * | 2022-06-16 | 2022-10-04 | 大富科技(安徽)股份有限公司 | Coupling adjustment structure and filter |
| CN218770018U (en) * | 2022-12-02 | 2023-03-28 | 苏州立讯技术有限公司 | Debugging structure and filter thereof |
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2022
- 2022-12-02 CN CN202211537297.6A patent/CN115863945A/en active Pending
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2023
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Also Published As
| Publication number | Publication date |
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| TWI898329B (en) | 2025-09-21 |
| CN115863945A (en) | 2023-03-28 |
| TW202425405A (en) | 2024-06-16 |
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