TWM644439U - Infrared sensor calibration device - Google Patents
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Abstract
本創作係提供一種紅外線感測器校正裝置,係包括:一溫控熱源;一設置有至少一紅外線溫度感測器之一溫控箱體;及一處理器,該處理器電性連接所述溫控熱源及紅外線溫度感測器,且該處理器係設置有相互電性連接之一控制單元及一處理計算單元,而該控制單元係控制該溫控箱體內之空間溫度且產生至少一空間溫度數值,另該控制單元係控制該溫控熱源之溫度且產生有至少二熱源溫度數值,而該紅外線溫度感測器產生有至少二熱源感測數值, 另該處理計算單元由該熱源溫度數值與該熱源感測數值產生各空間溫度之一初始增幅關係式,且該處理計算單元由該各初始增幅關係式取得各空間溫度之一增幅數值,又該處理計算單元由該各空間溫度之增幅數值與空間溫度數值產生有一校正增幅關係式。 The invention provides an infrared sensor calibration device, which includes: a temperature-controlled heat source; a temperature-controlled box with at least one infrared temperature sensor; and a processor, which is electrically connected to the A temperature-controlled heat source and an infrared temperature sensor, and the processor is provided with a control unit and a processing calculation unit electrically connected to each other, and the control unit controls the temperature of the space in the temperature-controlled box and generates at least one space temperature values, and the control unit controls the temperature of the temperature-controlled heat source and generates at least two heat source temperature values, and the infrared temperature sensor generates at least two heat source sensing values, In addition, the processing calculation unit generates an initial increase relational expression of each space temperature from the heat source temperature value and the heat source sensing value, and the processing calculation unit obtains an increase value of each space temperature from each initial increase relational expression, and the The processing calculation unit generates a correction increase relational expression from the increase value of each space temperature and the space temperature value.
Description
本創作係有關於一種校正裝置,尤指一種可降低儲存成本與運算成本之紅外線感測器校正裝置。The invention relates to a calibration device, especially an infrared sensor calibration device that can reduce storage costs and computing costs.
因為紅外線具有極強的穿透力,所以在通訊、醫療、探測、軍事、太空等領域已被廣泛的使用,更因為紅外線感測技術的應用上也會被拿來作為成像系統,所以紅外線感測技術已經被廣泛的使用在各種領域中,而其中若是將紅外線應用在成像系統時,其大多所選擇的紅外線波常為8~15微米,主要是因為在此波段之紅外線可以在常溫下使用,且可以對待測物進行溫度感測並以其溫度感測訊號來完成成像。Because infrared has strong penetrating power, it has been widely used in communication, medical treatment, detection, military, space and other fields, and because the application of infrared sensing technology will also be used as an imaging system, so infrared sensing Measurement technology has been widely used in various fields, and if infrared is used in imaging systems, most of the infrared waves selected are usually 8-15 microns, mainly because infrared in this band can be used at room temperature , and can sense the temperature of the object to be tested and complete the imaging with the temperature sensing signal.
但紅外線感測技術在使用時,其紅外線感測器感測一物體並產生有紅外線圖像,若該紅外線圖像係以640*480個點所構成,那該紅外線感測器便是感測了640*480的點位來形成紅外線圖像,但是各點位的數值會因為環境溫度的變化或紅外線鏡頭自身溫度變化而產生不同增益,因此,在有溫度變化下,後續在成像時,便會因為各點增益不同而有成像不清楚之狀況發生,因此習知會使用非均勻校正(NUC)方法 , 對增益進行校正來使成像變清晰。However, when infrared sensing technology is used, its infrared sensor senses an object and generates an infrared image. If the infrared image is composed of 640*480 points, then the infrared sensor is a sensor The points of 640*480 are used to form an infrared image, but the values of each point will have different gains due to changes in the ambient temperature or the temperature of the infrared lens itself. Because the gain of each point is different, the imaging will not be clear. Therefore, it is known that the non-uniform correction (NUC) method is used to correct the gain to make the image clearer.
而上述之非均勻校正(NUC)方法主要是利用兩點校正,以固定紅外線感測器的環境溫度及調整溫度的變溫黑體(Black body)作為發射校正源,並量測高、低兩點溫度且記錄各點量測值,計算得到各點增益後以平均值作為調整標準,進而將各點增益調整成一樣的結果,但是這僅是對紅外線感測器的環境溫度所建立之資料,若在紅外線感測器自身溫度變化的狀況下,其所完成之校正參數便無法使用,同樣會有成像不清楚之狀況發生,因此為解決此問題,其紅外線感測器之感測設備便需要計算多筆各點增益後之平均值作為調整標準,但該感測設備在進行多筆計算後,除了需要大容量之儲存單元來進行儲存外,更需要依據不同之環境狀態來選擇不同的校正參數來使用,也因此需要高階之運算單元來進行多筆增益運算,進而造成儲存成本與運算成本之增加。The above-mentioned non-uniform correction (NUC) method mainly uses two-point correction, using a fixed ambient temperature of the infrared sensor and a temperature-adjusted black body (Black body) as the emission correction source, and measuring the high and low two-point temperature And record the measurement value of each point, calculate the gain of each point and use the average value as the adjustment standard, and then adjust the gain of each point to the same result, but this is only the information established for the ambient temperature of the infrared sensor. When the temperature of the infrared sensor itself changes, the completed calibration parameters cannot be used, and the imaging will also be unclear. Therefore, in order to solve this problem, the sensing equipment of the infrared sensor needs to be calculated. The average value of multiple gain points is used as the adjustment standard. However, after multiple calculations, the sensing device not only needs a large-capacity storage unit for storage, but also needs to select different calibration parameters according to different environmental conditions. To use, and therefore requires a high-level computing unit to perform multiple gain calculations, resulting in an increase in storage costs and computing costs.
故,如何將上述缺失問題加以改進,乃為本案創作人所欲解決之技術困難點之所在。Therefore, how to improve the above-mentioned deficiencies is the technical difficulty that the author of this case wants to solve.
爰此,為有效解決上述之問題,本創作之主要目的在於提供一種可降低儲存成本與運算成本之紅外線感測器校正裝置。Therefore, in order to effectively solve the above-mentioned problems, the main purpose of this invention is to provide an infrared sensor calibration device that can reduce storage costs and computing costs.
為達上述目的,本創作係提供一種紅外線感測器校正裝置,係包括:一溫控熱源;一溫控箱體,該溫控箱體內設置有至少一紅外線溫度感測器;及一處理器,該處理器電性連接所述溫控熱源及紅外線溫度感測器,且該處理器係設置有相互電性連接之一控制單元及一處理計算單元,而該控制單元係控制該溫控箱體內之空間溫度且產生有不同的一空間溫度數值,另該控制單元係控制該溫控熱源之溫度且產生有至少二熱源溫度數值,而該紅外線溫度感測器於其一空間溫度感測該溫控熱源之溫度並產生有至少二熱源感測數值,而該處理計算單元由該熱源溫度數值與該熱源感測數值產生各空間溫度之一初始增幅關係式,且該處理計算單元由該各初始增幅關係式取得各空間溫度之一增幅數值,又該處理計算單元由該各空間溫度之增幅數值與空間溫度數值產生有一校正增幅關係式。In order to achieve the above purpose, the invention provides an infrared sensor calibration device, which includes: a temperature-controlled heat source; a temperature-controlled box, at least one infrared temperature sensor is arranged in the temperature-controlled box; and a processor , the processor is electrically connected to the temperature control heat source and the infrared temperature sensor, and the processor is provided with a control unit and a processing calculation unit electrically connected to each other, and the control unit controls the temperature control box The space temperature in the body produces a different space temperature value, and the control unit controls the temperature of the temperature-controlled heat source and produces at least two heat source temperature values, and the infrared temperature sensor senses the temperature of the space The temperature of the heat source is controlled and at least two heat source sensing values are generated, and the processing calculation unit generates an initial increase relationship expression of each space temperature from the heat source temperature value and the heat source sensing value, and the processing calculation unit is composed of each The initial increasing relational expression obtains an increasing value of each space temperature, and the processing calculation unit generates a correction increasing relational expression from the increasing value of each space temperature and the space temperature value.
根據本創作紅外線感測器校正裝置之一實施例,其中所述處理器更包括有一空間溫度感測器,該空間溫度感測器係感測所述溫控箱體內之空間溫度並產生有所述空間溫度數值。According to an embodiment of the infrared sensor calibration device of the present invention, the processor further includes a space temperature sensor, which senses the space temperature in the temperature-controlled box and generates a certain The above-mentioned space temperature value.
根據本創作紅外線感測器校正裝置之一實施例,其中所述溫控箱體更包括有一感測閘口,而該紅外線溫度感測器係通過所述感測閘口感測該溫控熱源之溫度並產生有所述熱源感測數值。According to an embodiment of the infrared sensor calibration device of the present invention, the temperature control box further includes a sensing gate, and the infrared temperature sensor senses the temperature of the temperature control heat source through the sensing gate And generate the sensing value of the heat source.
根據本創作紅外線感測器校正裝置之一實施例,其中所述溫控箱體更包括有一連通口,而該處理器係通過所述連通口電性連接所述紅外線溫度感測器。According to an embodiment of the infrared sensor calibration device of the present invention, the temperature control box further includes a communication port, and the processor is electrically connected to the infrared temperature sensor through the communication port.
根據本創作紅外線感測器校正裝置之一實施例,其中所述處理器更包括有一儲存單元,該儲存單元係儲存所述校正增幅關係式。According to an embodiment of the infrared sensor calibration device of the present invention, the processor further includes a storage unit for storing the calibration gain relational expression.
根據本創作紅外線感測器校正裝置之一實施例,其中所述處理計算單元接收該紅外線溫度感測器之環境溫度並由該校正增幅關係式計算出一校正結果,而該紅外線溫度感測器由該校正結果進行校正並感測一待測物之溫度且會產生有一感測數值,而該處理計算單元接收該感測數值並進行成像。According to an embodiment of the infrared sensor calibration device of the present invention, wherein the processing calculation unit receives the ambient temperature of the infrared temperature sensor and calculates a calibration result from the correction gain relational formula, and the infrared temperature sensor Perform calibration based on the calibration result and sense the temperature of a test object to generate a sensing value, and the processing calculation unit receives the sensing value and performs imaging.
本創作之上述目的及其結構與功能上的特性,將依據所附圖式之較佳實施例予以說明。The above-mentioned purpose of this creation and its structural and functional characteristics will be described according to the preferred embodiments of the accompanying drawings.
在以下,針對本創作有關紅外線感測器校正裝置之構成及技術內容等,列舉各種適用的實例並配合參照隨文所附圖式而加以詳細地説明;然而,本創作當然不是限定於所列舉之該等的實施例、圖式或詳細說明內容而已。In the following, for the composition and technical content of the infrared sensor calibration device of this creation, various applicable examples are listed and described in detail with reference to the accompanying drawings; however, the creation is certainly not limited to the listed ones. These embodiments, drawings, or detailed descriptions are just for reference.
再者,熟悉此項技術之業者亦當明瞭:所列舉之實施例與所附之圖式僅提供參考與說明之用,並非用來對本創作加以限制者;能夠基於該等記載而容易實施之修飾或變更而完成之創作,亦皆視為不脫離本創作之精神與意旨的範圍內,當然該等創作亦均包括在本創作之申請專利範圍。Furthermore, those who are familiar with this technology should also be clear: the enumerated embodiments and the attached drawings are only for reference and description, and are not used to limit the creation; Creations completed through modifications or changes are also deemed to be within the scope of the spirit and intent of this creation, and of course such creations are also included in the scope of patent applications for this creation.
又,以下實施例所提到的方向用語,例如:「上」、「下」、「左」、「右」、「前」、「後」等,僅是參考附加圖示的方向。因此,使用的方向用語是用來說明,而並非用來限制本創作;再者,在下列各實施例中,相同或相似的元件將採用相同或相似的元件標號。In addition, the directional terms mentioned in the following embodiments, such as "upper", "lower", "left", "right", "front", "rear", etc., are only referring to the directions attached to the drawings. Therefore, the used directional terms are used for illustration, not for limiting the invention; moreover, in the following embodiments, the same or similar elements will use the same or similar element numbers.
首先,請先參閱第1圖及第2圖所示,係為本創作紅外線感測器校正裝置1之示意圖及方塊圖,其中所述紅外線感測器校正裝置1係包括有一溫控熱源2及一溫控箱體3及一處理器4。First of all, please refer to Figure 1 and Figure 2, which are schematic diagrams and block diagrams of the infrared
其中所述溫控熱源2係電性連接所述處理器4,而該熱源係為黑體。The temperature-controlled
其中所述溫控箱體3內部設置有至少一紅外線溫度感測器31及至少一空間溫度感測器32,另該溫控箱體3一側設置有一感測閘口33,而另一側設置有一連通口34。At least one
其中所述處理器4係以訊號連接線通過所述連通口34電性連接所述紅外線溫度感測器31,且該處理器4設置有相互電性連接之一控制單元41及一處理計算單元42及一儲存單元43。Wherein the
而該紅外線感測器校正裝置1對該溫控箱體3內之紅外線溫度感測器31進行產生校正公式時,該處理器4之控制單元41控制該溫控熱源2之溫度及該溫控箱體3內之空間溫度,使該溫控熱源2產生有一熱源溫度數值,該熱源溫度數值即為黑體溫度,而該溫控箱體3內之空間溫度到達設定溫度後,該空間溫度感測器32感測所述溫控箱體3內之空間溫度並產生有一空間溫度數值(如空間溫度數值為20.57,但,不以此為限,需以實際使用情況而定),此時,該控制單元41開啟該感測閘口33,而該紅外線溫度感測器31係通過所述感測閘口33感測該溫控熱源2之溫度並產生有一熱源感測數值,而該處理計算單元42接收所述熱源溫度數值及熱源感測數值並進行關係式之計算,係將該熱源溫度數值界定為X與熱源感測數值界定為Y,且於此空間溫度數值為20.57度中,該控制單元41再控制該溫控熱源2之溫度,使該溫控熱源2產生有另一熱源溫度數值X,而該紅外線溫度感測器31係通過所述感測閘口33感測該溫控熱源2之溫度並產生有另一熱源感測數值Y,而該處理計算單元42則透過至少二熱源溫度數值及至少二熱源感測數值產生一初始增幅關係式。And when the infrared
而於本實施例中,係以產生6組初始增幅關係式為實施方式,但各熱源溫度數值X與該熱源感測數值Y所設定之數值與組數並不因此為限,而該熱源溫度數值X係取五組數值,與該熱源感測數值Y為紅外線溫度感測器31對應熱源溫度數值X所產生的感測數值,進而產生有所述初始增幅關係式為:Y=數值1X-數值2,並紀錄該初始增幅關係式之所屬空間溫度數值為數值3,並且其中數值1便為該初始增幅關係式之一增幅數值。In this embodiment, it is implemented by generating 6 sets of initial gain relational formulas, but the numerical value and the number of groups set by each heat source temperature value X and the heat source sensing value Y are not limited thereto, and the heat source temperature The value X is five sets of values, and the heat source sensing value Y is the sensing value generated by the
另外,該處理器4之控制單元41再控制該溫控箱體3內之空間溫度,使該溫控熱源2產生有所述熱源溫度數值,而該溫控箱體3內之空間溫度到達設定溫度後,該空間溫度感測器32感測所述溫控箱體3內之空間溫度並產生有所述空間溫度數值,並產生有另一組初始增幅關係式,重複此方式,直至產生有6組初始增幅關係式。In addition, the
其中該處理計算單元42便可由該各初始增幅關係式取得各空間溫度之增幅數值,而該處理計算單元42接收所述各空間溫度數值及增幅數值並進行關係式之計算且產生有一校正增幅關係式,係將該空間溫度數值界定為X1與增幅數值界定為Y,進而產生所述所述校正增幅關係式,該校正增幅關係式為:Y1=數值3X1+數值4,且該校正增幅關係式則可儲存於儲存單元43內。Wherein, the
而該處理器4具有所述校正增幅關係式後,該處理器4使用在其他紅外線溫度感測器31時,該處理計算單元42先接收該紅外線溫度感測器31之環境溫度,且將該環境溫度帶入所述校正增幅關係式中之X1,進而可以算出其校正增幅關係式之Y1,而該Y1即為一校正結果,而該紅外線溫度感測器31由該校正結果進行校正,藉此,該紅外線溫度感測器31在感測一待測物之溫度所產生之感測數值便可於該處理器4上呈現清晰的圖像,而其中該儲存單元43可省去需要儲存多個初始增幅關係式而造成儲存成本增加,及處理計算單元42可省去需要計算多個校正增幅關係式而造成運算成本增加等問題,進而達到可降低儲存成本與運算成本之功效者。And after the
以上已將本創作做一詳細說明,惟以上所述者,僅為本創作之一較佳實施例而已,當不能限定本創作實施之範圍,即凡依本創作申請範圍所作之均等變化與修飾等,皆應仍屬本創作之專利涵蓋範圍。The above has made a detailed description of this creation, but the above is only one of the preferred embodiments of this creation, and should not limit the scope of implementation of this creation, that is, all equal changes and modifications made according to the scope of application of this creation etc., should still be covered by the patent of this creation.
1:紅外線感測器校正裝置1: Infrared sensor calibration device
2:溫控熱源2: Temperature control heat source
3:溫控箱體3: Temperature control box
31:紅外線溫度感測器31: Infrared temperature sensor
32:空間溫度感測器32: Space temperature sensor
33:感測閘口33: Sensing gate
34:連通口34: Connecting port
4:處理器4: Processor
41:控制單元41: Control unit
42:處理計算單元42: Processing computing unit
43:儲存單元43: storage unit
第1圖係本創作紅外線感測器校正裝置之示意圖。 第2圖係本創作紅外線感測器校正裝置之方塊圖。 Figure 1 is a schematic diagram of the infrared sensor calibration device of this invention. Figure 2 is a block diagram of the infrared sensor calibration device of this invention.
1:紅外線感測器校正裝置 1: Infrared sensor calibration device
2:溫控熱源 2: Temperature control heat source
3:溫控箱體 3: Temperature control box
31:紅外線溫度感測器 31: Infrared temperature sensor
32:空間溫度感測器 32: Space temperature sensor
33:感測閘口 33: Sensing gate
34:連通口 34: Connecting port
4:處理器 4: Processor
Claims (6)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW112201662U TWM644439U (en) | 2023-02-24 | 2023-02-24 | Infrared sensor calibration device |
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| TW112201662U TWM644439U (en) | 2023-02-24 | 2023-02-24 | Infrared sensor calibration device |
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| TWM644439U true TWM644439U (en) | 2023-08-01 |
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