TWM538160U - Test device - Google Patents
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Description
本新型係關於一種測試裝置，特別是一種電子裝置的連接埠的測試裝置。The present invention relates to a test device, and more particularly to a test device for connecting ports of an electronic device.
隨著科技的進步，各種電子產品不斷地推陳出新，而各種的通訊規格與資料傳輸規格也因應使用者的需求而不斷地翻新。另一方面，在電子產品具備越來越多功能的情況下，如何在有限的空間設置種種的功能模組實為廠商在設計產品實不能不考慮的問題。有鑑於此，目前市面上開始出現同時具有多種充電模式的傳輸規格，例如以大電流進行快充，或者是在電池為低儲電量時以小電流充電以避免電池燒毀。With the advancement of technology, various electronic products are constantly being updated, and various communication specifications and data transmission specifications are constantly being refurbished in response to user needs. On the other hand, in the case of electronic products with more and more versatility, how to set up various functional modules in a limited space is a problem that manufacturers can't ignore in designing products. In view of this, transmission specifications having multiple charging modes at the same time are beginning to appear on the market, such as fast charging with a large current, or charging with a small current when the battery is low in power storage to avoid battery burning.
因此，在工廠端也需要因應電子裝置的不同的充電模式進行測試。以往，都是藉由人工手動調整設定，額外購置行動裝置與電子裝置連接，以測試電子裝置的不同功能模式，並沒有一種自動化的測試治具可以用來測試電子裝置是否具有快充模式或是多種的充電模式，甚或是測試電子裝置的供給行動裝置電力的各種充電模式是否正常。Therefore, it is also necessary to test at the factory end in response to different charging modes of the electronic device. In the past, by manually adjusting the settings, additional mobile devices were connected to the electronic device to test different functional modes of the electronic device, and no automated test fixture can be used to test whether the electronic device has a fast charge mode or A variety of charging modes, or even test the various charging modes of the electronic device to supply the mobile device power.
本新型提供了一種測試裝置，得以藉由自動化的方式測試待測電子裝置是否能夠正常提供充電及其充電模式為何。The present invention provides a test apparatus capable of testing whether the electronic device under test can normally provide charging and its charging mode by an automated method.
本新型提供了一種測試裝置，所述的測試裝置適於測試待測電子裝置的連接埠。待測電子裝置具有充電模式，且連接埠具有第一腳位與第二腳位。測試裝置具有傳輸模組與控制模組。傳輸模組電性連接第一腳位與第二腳位。控制模組電性連接傳輸模組。傳輸模組調整第一腳位的電壓準位為第一電壓值，且傳輸模組偵測第二腳位的電壓準位。控制模組依據第二腳位的電壓準位判斷待測電子裝置的充電模式是否為第一快充模式或第二快充模式。The present invention provides a test device that is adapted to test the port of the electronic device under test. The electronic device to be tested has a charging mode, and the port has a first pin and a second pin. The test device has a transmission module and a control module. The transmission module is electrically connected to the first pin and the second pin. The control module is electrically connected to the transmission module. The transmission module adjusts the voltage level of the first pin to a first voltage value, and the transmission module detects a voltage level of the second pin. The control module determines whether the charging mode of the electronic device to be tested is the first fast charging mode or the second fast charging mode according to the voltage level of the second pin.
綜合以上所述，本新型提供了一種測試裝置，所述的測試裝置用以調整待測電子裝置的第一腳位與第二腳位之中其中之一的電壓準位，並偵測第一腳位與第二腳位之中其中另一的電壓準位，藉此以判斷待測電子裝置是否具有快充模式。藉此，本新型所提供的測試裝置得以藉由自動的方式測試待測電子裝置的連接埠是否支援快充模式，從而避免了以人力進行測試的窘境。In summary, the present invention provides a test device for adjusting a voltage level of one of a first pin and a second pin of an electronic device to be tested, and detecting the first The voltage level of the other of the pin position and the second pin position, thereby determining whether the electronic device to be tested has a fast charge mode. Therefore, the test device provided by the present invention can automatically test whether the connection port of the electronic device to be tested supports the fast charge mode, thereby avoiding the dilemma of testing by human power.
請參照圖1，圖1係為本新型之一實施例之測試裝置的功能方塊示意圖。圖1中會是有測試裝置10與待測電子裝置20。測試裝置10具有傳輸模組120與控制模組140。待測電子裝置20具有連接埠220。傳輸模組120電性連接控制模組140。且在此實施例中，測試裝置10係以傳輸模組120電性連接待測電子裝置20的連接埠220。其中，待測電子裝置20例如為主機板（mainboard），連接埠220例如係以依據通用序列匯流排的規格、是蘋果公司的lightening介面規格或者其他可用於充電之傳輸介面實作而成。於實務上，待測電子裝置20例如更具有晶片組（chipset）與充電積體電路（charger integrated circuit）以控制連接埠220選擇性地傳輸電能。後續係以待測電子裝置20與連接埠220符合通用序列匯流排的電池充電規範1.2版（battery charge 1.2, BC 1.2）的待測電子裝置20與連接埠220進行說明，但實際上並不以此為限。Please refer to FIG. 1. FIG. 1 is a functional block diagram of a test apparatus according to an embodiment of the present invention. In Fig. 1, there will be a test device 10 and an electronic device 20 to be tested. The test device 10 has a transmission module 120 and a control module 140. The electronic device 20 to be tested has a connection port 220. The transmission module 120 is electrically connected to the control module 140. In this embodiment, the test device 10 is electrically connected to the connection port 220 of the electronic device 20 to be tested by the transmission module 120. The electronic device 20 to be tested is, for example, a mainboard, and the port 220 is implemented, for example, according to the specifications of the universal serial bus, the lightening interface specification of Apple, or other transmission interface that can be used for charging. In practice, the electronic device 20 to be tested, for example, further has a chipset and a charger integrated circuit to control the connection 220 to selectively transfer electrical energy. The subsequent description is based on the electronic device 20 to be tested and the connection device 220 of the battery charging specification version 1.2 (battery charge 1.2, BC 1.2) of the electronic device 20 and the connection port 220 conforming to the universal serial bus bar, but the actual operation is not This is limited.
測試裝置10適於測試待測電子裝置20的連接埠220。待測電子裝置20具有至少一充電模式，且連接埠220具有第一腳位2220與第二腳位2240。如前述地，在待測電子裝置20與連接埠220符合通用序列匯流排的電池充電規範1.2版的情況下，連接埠220例如可以為標準下行埠(Standard Downstream Port, SDP)、充電下行埠(Charging Downstream Port, CDP)與專用充電埠(Dedicated Charging Port, DCP)的至少其中之一。在一實施例中，連接埠220的第一腳位2220例如為通用序列匯流排規格中所定義的D+腳位，第二腳位2240例如為通用序列匯流排規格中所定義的D-腳位。於實務上，連接埠220的第一腳位2220也可以是通用序列匯流排規格中所定義的D-腳位，第二腳位2240則為通用序列匯流排規格中所定義的D+腳位。後續係以第一腳位2220為D+腳位且第二腳位2240為D-腳位為例說明之。The test device 10 is adapted to test the port 220 of the electronic device 20 to be tested. The electronic device 20 to be tested has at least one charging mode, and the connection port 220 has a first pin 2220 and a second pin 2240. As described above, in the case that the electronic device 20 to be tested and the port 220 conform to the battery charging specification version 1.2 of the universal serial bus, the port 220 can be, for example, a Standard Downstream Port (SDP) and a charging down channel (SDP). Charging Downstream Port, CDP) and at least one of a Dedicated Charging Port (DCP). In an embodiment, the first pin 2220 of the port 220 is, for example, the D+ pin defined in the universal sequence bus bar specification, and the second pin 2240 is, for example, the D-pin defined in the universal sequence bus bar specification. . In practice, the first pin 2220 of the port 220 can also be the D-pin defined in the universal sequence bus specification, and the second pin 2240 is the D+ pin defined in the universal sequence bus specification. The following is an example in which the first pin 2220 is the D+ pin and the second pin 2240 is the D-pin.
傳輸模組120電性連接連接埠220的第一腳位2220，且傳輸模組電性連接連接埠220的第二腳位2240。傳輸模組120調整第一腳位2220的電壓準位為第一電壓值，且傳輸模組120偵測第二腳位的電壓準位。在一實施例中，傳輸模組120係受控於控制模組140而依據控制模組140的指示調整第一腳位2220的電壓準位為第一電壓值，並偵測第二腳位2240的電壓準位。藉此，控制模組140得以依據第二腳為2240判斷出待測電子裝置20的充電模式為第一快充模式或第二快充模式。所述的第一電壓值例如為0.6伏特（Volt, V）。所述的第一快充模式例如為連接埠220能支援充電下行埠的傳輸模式，所述的第二快充模式例如為連接埠220能支援專用充電埠的傳輸模式，但並不以此為限。其中，控制模組例如為中央處理器（Central Processing Unit, CPU）、微處理器（micro control processor, CPU）或者是專用集成電路（Application-specific integrated circuit, ASIC），但並不以此為限。The transmission module 120 is electrically connected to the first pin 2220 of the connection port 220, and the transmission module is electrically connected to the second pin 2240 of the connection port 220. The transmission module 120 adjusts the voltage level of the first pin 2220 to a first voltage value, and the transmission module 120 detects the voltage level of the second pin. In an embodiment, the transmission module 120 is controlled by the control module 140 and adjusts the voltage level of the first pin 2220 to a first voltage value according to the instruction of the control module 140, and detects the second pin 2240. Voltage level. Thereby, the control module 140 can determine, according to the second pin 2240, that the charging mode of the electronic device 20 to be tested is the first fast charging mode or the second fast charging mode. The first voltage value is, for example, 0.6 volts (Volt, V). The first fast charging mode is, for example, a transmission mode in which the connection port 220 can support the charging downlink, and the second fast charging mode is, for example, a transmission mode in which the connection port 220 can support the dedicated charging port, but limit. The control module is, for example, a central processing unit (CPU), a micro control processor (CPU), or an application-specific integrated circuit (ASIC), but is not limited thereto. .
從另一個角度來說，控制模組140係指示傳輸模組120調整第一腳位2220的電壓準位，且控制模組140係指示傳輸模組120偵測第二腳位2240的電壓準位，控制模組140係依據傳輸模組120的偵測結果取得第二腳位2240的電壓準位，並依據第二腳位2240的電壓準位判斷待測電子裝置20的充電模式為第一快充模式或第二快充模式。In another aspect, the control module 140 instructs the transmission module 120 to adjust the voltage level of the first pin 2220, and the control module 140 instructs the transmission module 120 to detect the voltage level of the second pin 2240. The control module 140 obtains the voltage level of the second pin 2240 according to the detection result of the transmission module 120, and determines the charging mode of the electronic device 20 to be tested as the first fast according to the voltage level of the second pin 2240. Charge mode or second fast charge mode.
在一實施例中，當控制模組140判斷第一腳位2220的電壓準位實質上等於第二腳位2240的電壓準位時，控制模組140判斷待測電子裝置20的充電模式為第一快充模式或第二快充模式。於一實施例中，當控制模組140判斷第二腳位2240的電壓準位與第一電壓值的差值不大於一預設電壓門檻值時，控制模組140判斷待測電子裝置20的充電模式為第一快充模式或第二快充模式。所述的預設電壓門檻值係為所屬技術領域具有通常知識者經詳閱本說明書後可自由定義，在此並不加以限制。In an embodiment, when the control module 140 determines that the voltage level of the first pin 2220 is substantially equal to the voltage level of the second pin 2240, the control module 140 determines that the charging mode of the electronic device 20 to be tested is the first A fast charge mode or a second fast charge mode. In an embodiment, when the control module 140 determines that the difference between the voltage level of the second pin 2240 and the first voltage value is not greater than a predetermined voltage threshold, the control module 140 determines the electronic device 20 to be tested. The charging mode is the first fast charging mode or the second fast charging mode. The preset voltage threshold is freely defined by those having ordinary knowledge in the art, and is not limited herein.
此外，於另一實施例中，當判斷待測電子裝置20的充電模式為第一快充模式或第二快充模式時，控制模組140更指示傳輸模組120設定第一腳位2220和第二腳位2240其中之一的電壓準位為第二電壓值。控制模組140更依據第一腳位2220和第二腳位2240其中之另一的電壓準位判斷待測電子裝置20的充電模式為第一快充模式或第二快充模式。第二電壓值例如為3.3伏特，但不以此為限。以前述之第一快充模式對應於充電下行埠且第二快充模式對應於專用充電埠的傳輸模式為例，當控制模組140判斷第一腳位2220和第二腳位2240其中之另一的電壓準位實質上為第二電壓值時，控制模組140判斷待測電子裝置20具有第一快充模式。而當控制模組140判斷第一腳位2220和第二腳位2240其中之另一的電壓準位實質上不為第二電壓值時，控制模組140判斷待測電子裝置20具有第二快充模式。In addition, in another embodiment, when it is determined that the charging mode of the electronic device 20 to be tested is the first fast charging mode or the second fast charging mode, the control module 140 further instructs the transmission module 120 to set the first pin 2220 and The voltage level of one of the second pins 2240 is a second voltage value. The control module 140 further determines, according to the voltage level of the other of the first pin 2220 and the second pin 2240, that the charging mode of the electronic device 20 to be tested is the first fast charging mode or the second fast charging mode. The second voltage value is, for example, 3.3 volts, but is not limited thereto. Taking the transmission mode of the first fast charging mode corresponding to the charging downlink and the second fast charging mode corresponding to the dedicated charging port as an example, when the control module 140 determines the first pin 2220 and the second pin 2240 When the voltage level of one is substantially the second voltage value, the control module 140 determines that the electronic device 20 to be tested has the first fast charge mode. When the control module 140 determines that the voltage level of the other of the first pin 2220 and the second pin 2240 is substantially not the second voltage value, the control module 140 determines that the electronic device 20 to be tested has the second fastest. Charge mode.
於一實施例中，當控制模組140判斷第一腳位2220與第二腳位2240其中之另一的電壓準位與第二電壓值的差值不大於另一預設電壓門檻值時，控制模組140判斷第一腳位2220與第二腳位2240其中之另一的電壓準位實質上等於第二電壓值。所述的預設電壓門檻值係為所屬技術領域具有通常知識者經詳閱本說明書後可自由定義，在此並不加以限制。In an embodiment, when the control module 140 determines that the difference between the voltage level of the first pin 2220 and the second pin 2240 and the second voltage value is not greater than another preset voltage threshold, The control module 140 determines that the voltage level of the other of the first pin 2220 and the second pin 2240 is substantially equal to the second voltage value. The preset voltage threshold is freely defined by those having ordinary knowledge in the art, and is not limited herein.
此外，當控制模組140判斷待測電子裝置20的充電模式不為第一快充模式或第二快充模式時，控制模組140更自待測電子裝置20取得識別訊號。識別訊號指示待測電子裝置20是否具有標準充電模式。在待測電子裝置20與連接埠220符合通用序列匯流排的電池充電規範1.2版的情況下標準充電模式例如為連接埠220支援標準下型埠的傳輸模式。更進一步地來說，當控制模組140判斷待測電子裝置20的充電模式並非第一快充模式亦非第二快充模式，且識別訊號指示待測電子裝置20的充電模式為標準充電模式時，控制模組140判斷待測電子裝置20的充電模式為標準充電模式。從另一個角度來說，控制模組140係藉由識別訊號進一步地確認待測電子裝置20的充電模式的確為標準充電模式。In addition, when the control module 140 determines that the charging mode of the electronic device 20 to be tested is not the first fast charging mode or the second fast charging mode, the control module 140 obtains the identification signal from the electronic device 20 to be tested. The identification signal indicates whether the electronic device 20 to be tested has a standard charging mode. In the case where the electronic device 20 to be tested and the battery pack specification 1.2 of the universal serial bus bar comply with the connection port 220, the standard charging mode is, for example, a transmission mode in which the port 220 supports the standard down type. Further, when the control module 140 determines that the charging mode of the electronic device 20 to be tested is not the first fast charging mode or the second fast charging mode, and the identification signal indicates that the charging mode of the electronic device 20 to be tested is the standard charging mode. The control module 140 determines that the charging mode of the electronic device 20 to be tested is a standard charging mode. From another point of view, the control module 140 further confirms that the charging mode of the electronic device 20 to be tested is a standard charging mode by the identification signal.
在一實施例中，控制模組140例如係經由所述的第一腳位2220或第二腳位2240與待測電子裝置溝通，以取得識別訊號。於另一實施例中，測試裝置10例如更具有通訊模組（未繪示），控制模組140係藉由訊模組而以有線或者是無線的方式自待測電子裝置20或其他的後端伺服器取得相關的資訊。上述僅為舉例示範，然實際上並不以此為限。In one embodiment, the control module 140 communicates with the electronic device to be tested, for example, via the first pin 2220 or the second pin 2240 to obtain an identification signal. In another embodiment, the test device 10 has a communication module (not shown), for example, and the control module 140 is self-tested by the electronic device 20 or other after being wired or wirelessly by the module. The server obtains relevant information. The above is merely an example, but it is not limited to this.
請接著參照圖2，圖2係為本新型之另一實施例之測試裝置的功能方塊示意圖。在圖2所示的實施例中，測試裝置30所具有的元件及其相對關係實相仿於圖1所示的實施例，相關細節不再予以贅述。而與圖1所述的實施例不同的是，測試裝置30更具有偵測模組360、開關模組370與負載模組380。控制模組340電性連接偵測模組360與開關模組370。開關模組370電性連接於偵測模組360與負載模組380之間。另一方面，連接埠220例如更具有電源腳位2260。在待測電子裝置20與連接埠220符合通用序列匯流排的電池充電規範1.2版的情況下，電源腳位2260例如為VBUS腳位。Please refer to FIG. 2, which is a functional block diagram of a test apparatus according to another embodiment of the present invention. In the embodiment shown in FIG. 2, the components of the test apparatus 30 and their relative relationships are similar to those of the embodiment shown in FIG. 1, and the details will not be described again. The test device 30 further has a detection module 360, a switch module 370 and a load module 380. The control module 340 is electrically connected to the detection module 360 and the switch module 370. The switch module 370 is electrically connected between the detection module 360 and the load module 380. On the other hand, the port 220 has, for example, a power pin 2260. In the case where the electronic device 20 to be tested and the port 220 conform to the battery charging specification version 1.2 of the universal serial bus, the power pin 2260 is, for example, a VBUS pin.
偵測模組360電性連接連接埠220中的電源腳位2260。在圖2所示的實施例中，當控制模組340判斷待測電子裝置20具有第一快充模式或第二快充模式時，控制模組340更調整流經電源腳位2260的電流的大小為預設電流值。偵測模組360偵測流經電源腳位2260的實際電流的大小。當實際電流的大小與預設電流值的差值大於預設電流門檻值時，控制模組340判斷連接埠220失效。The detection module 360 is electrically connected to the power pin 2260 in the connection port 220. In the embodiment shown in FIG. 2, when the control module 340 determines that the electronic device 20 to be tested has the first fast charging mode or the second fast charging mode, the control module 340 further adjusts the current flowing through the power pin 2260. The size is the preset current value. The detection module 360 detects the actual current flowing through the power pin 2260. When the difference between the magnitude of the actual current and the preset current value is greater than the preset current threshold, the control module 340 determines that the port 220 is disabled.
更具體地來說，負載模組380具有等效子負載，而測試裝置30相對於電源腳位2260具有等效主負載。控制模組340選擇性地將等效子負載電性連接至等效主負載，以調整流經電源腳位2260的電流的大小為預設電流值。在此實施例中，控制模組340係藉由導通開關模組370，以將負載模組380電性連接至偵測模組360，從而將等效子負載電性連接至等效主負載。藉此，調整測試裝置30相對於電源腳位2260的總等效負載，從而調整流經電源腳位2260的電流的大小為預設電流值。More specifically, load module 380 has an equivalent sub-load, while test device 30 has an equivalent main load relative to power pin 2260. The control module 340 selectively electrically connects the equivalent sub-load to the equivalent main load to adjust the magnitude of the current flowing through the power pin 2260 to a preset current value. In this embodiment, the control module 340 is electrically connected to the detection module 360 by the conduction switch module 370 to electrically connect the equivalent sub-load to the equivalent main load. Thereby, the total equivalent load of the test device 30 with respect to the power pin 2260 is adjusted, thereby adjusting the magnitude of the current flowing through the power pin 2260 to a preset current value.
配合上述，測試裝置30得以藉由調整第一腳位2220或第二腳位2240其中之一的電壓準位，並偵測第一腳位2220或第二腳位2240其中之另一的電壓準位，以判斷出待測電子裝置20的充電模式可以是標準下行埠、充電下行埠與專用充電埠當中的何者。此外，不管待測電子裝置20的充電模式為何，測試裝置30更可藉由調整流經電源腳位2260的電流，以判斷出連接埠220是否失效。In conjunction with the above, the test device 30 can adjust the voltage level of one of the first pin 2220 or the second pin 2240 and detect the voltage of the other pin 2220 or the second pin 2240. In order to determine whether the charging mode of the electronic device 20 to be tested may be the standard downlink, the charging downlink, and the dedicated charging port. In addition, regardless of the charging mode of the electronic device 20 to be tested, the testing device 30 can further determine whether the port 220 is ineffective by adjusting the current flowing through the power pin 2260.
請再參照圖3，圖3係為本新型之更一實施例之測試裝置的功能方塊示意圖。在圖3所示的實施例中，測試裝置40更具有功能異常警示模組490，功能異常警示模組490電性連接控制模組440。當控制模組440判斷連接埠220失效時，功能異常警示模組490警示待測電子裝置20的充電模式異常。此外，當控制模組440判斷待測電子裝置的充電模式並非第一快充模式亦非第二快充模式，且控制模組440並無法自待測電子裝置20取得識別訊號時，功能異常警示模組490警示待測電子裝置20的充電模式異常。Please refer to FIG. 3 again. FIG. 3 is a functional block diagram of a test apparatus according to a further embodiment of the present invention. In the embodiment shown in FIG. 3, the test device 40 further has a function abnormality warning module 490, and the function abnormality warning module 490 is electrically connected to the control module 440. When the control module 440 determines that the connection port 220 is invalid, the function abnormality warning module 490 alerts the charging mode of the electronic device 20 to be tested to be abnormal. In addition, when the control module 440 determines that the charging mode of the electronic device to be tested is not the first fast charging mode or the second fast charging mode, and the control module 440 cannot obtain the identification signal from the electronic device 20 to be tested, the function abnormality warning The module 490 alerts the charging mode of the electronic device 20 to be tested to be abnormal.
功能異常警示模組490例如具有多個警示燈或揚聲器。當控制模組440判斷待測電子裝置20具有標準下行埠、充電下行埠與專用充電埠其中之一時，控制模組440指示功能異常警示模組490點亮其中一個警示燈。而當控制模組440判斷出連接埠220失效或充電模式異常時，控制模組440指示功能異常警示模組490點亮對應的警示燈。於另一實施例中，控制模組440更指示功能異常警示模組490以揚聲器發出警報。The malfunction alarm module 490 has, for example, a plurality of warning lights or speakers. When the control module 440 determines that the electronic device 20 to be tested has one of a standard downlink, a charging downlink, and a dedicated charging port, the control module 440 instructs the function abnormality warning module 490 to illuminate one of the warning lights. When the control module 440 determines that the connection port 220 is invalid or the charging mode is abnormal, the control module 440 instructs the function abnormality warning module 490 to illuminate the corresponding warning light. In another embodiment, the control module 440 further instructs the function abnormality warning module 490 to issue an alarm with the speaker.
綜合以上所述，本新型提供了一種測試裝置，所述的測試裝置用以調整待測電子裝置的第一腳位與第二腳位之中其中之一的電壓準位，並偵測第一腳位與第二腳位之中其中另一的電壓準位，藉此以判斷待測電子裝置是否具有快充模式。另一方面，本新型所提供的測試裝置更能進一步地調整第一腳位或第二腳位的電壓準位，或者是調整流經連接埠中的電源腳位的電流，藉此以進一步地測試出待測電子裝置是具有快充模式下的哪一種充電模式，並測試出待測電子裝置得多種充電模式是否正常。藉此，本新型所提供的測試裝置得以藉由自動的方式測試待測電子裝置的連接埠是否支援快充模式，從而避免了以人力進行測試的窘境。In summary, the present invention provides a test device for adjusting a voltage level of one of a first pin and a second pin of an electronic device to be tested, and detecting the first The voltage level of the other of the pin position and the second pin position, thereby determining whether the electronic device to be tested has a fast charge mode. On the other hand, the test device provided by the present invention can further adjust the voltage level of the first pin or the second pin, or adjust the current flowing through the power pin in the port, thereby further It is tested whether the electronic device to be tested has the charging mode in the fast charging mode, and tests whether the various charging modes of the electronic device to be tested are normal. Therefore, the test device provided by the present invention can automatically test whether the connection port of the electronic device to be tested supports the fast charge mode, thereby avoiding the dilemma of testing by human power.
雖然本新型以前述之較佳實施例揭露如上，然其並非用以限定本發明，任何熟習相像技藝者，在不脫離本發明之精神和範圍內，當可作些許之更動與潤飾，因此本發明之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。Although the present invention has been described above in terms of the preferred embodiments thereof, it is not intended to limit the invention, and it is obvious to those skilled in the art that the invention may be modified and retouched without departing from the spirit and scope of the invention. The patent protection scope of the invention is subject to the definition of the scope of the patent application attached to the specification.
10、30、40‧‧‧測試裝置
120、320、420‧‧‧傳輸模組
140、340、440‧‧‧控制模組
360、460‧‧‧偵測模組
370、470‧‧‧開關模組
380、480‧‧‧負載模組
490‧‧‧功能異常警示模組
20‧‧‧待測電子裝置
220‧‧‧連接埠
2220‧‧‧第一腳位
2240‧‧‧第二腳位
2260‧‧‧電源腳位10, 30, 40‧‧‧ test equipment
120, 320, 420‧‧‧ transmission module
140, 340, 440‧‧‧ control modules
360, 460‧‧‧Detection module
370, 470‧‧‧ switch module
380, 480‧‧‧ load module
490‧‧‧Functional Warning Module
20‧‧‧Electronic device to be tested
220‧‧‧Connected
2220‧‧‧First position
2240‧‧‧second foot
2260‧‧‧Power pin
圖1係為本新型之一實施例之測試裝置的功能方塊示意圖。 圖2係為本新型之另一實施例之測試裝置的功能方塊示意圖。 圖3係為本新型之更一實施例之測試裝置的功能方塊示意圖。1 is a functional block diagram of a test apparatus according to an embodiment of the present invention. 2 is a functional block diagram of a test apparatus according to another embodiment of the present invention. 3 is a functional block diagram of a test apparatus according to a further embodiment of the present invention.
10‧‧‧測試裝置 10‧‧‧Testing device
120‧‧‧傳輸模組 120‧‧‧Transmission module
140‧‧‧控制模組 140‧‧‧Control Module
20‧‧‧待測電子裝置 20‧‧‧Electronic device to be tested
220‧‧‧連接埠 220‧‧‧Connected
2220‧‧‧第一腳位 2220‧‧‧First position
2240‧‧‧第二腳位 2240‧‧‧second foot
Claims (9)
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW105214483U TWM538160U (en) | 2016-09-21 | 2016-09-21 | Test device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW105214483U TWM538160U (en) | 2016-09-21 | 2016-09-21 | Test device |
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| Publication Number | Publication Date |
|---|---|
| TWM538160U true TWM538160U (en) | 2017-03-11 |
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| Application Number | Title | Priority Date | Filing Date |
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| TW105214483U TWM538160U (en) | 2016-09-21 | 2016-09-21 | Test device |
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| Country | Link |
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| TW (1) | TWM538160U (en) |
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2016
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