TWM502980U - Pogo pin connector - Google Patents

Description

Probe connector 【0001】

The present invention relates to a connector, and more particularly to a probe connector.

【0002】

According to the continuous improvement of consumers' requirements for the appearance and performance of electronic products, probe connectors have gradually become the mainstream of the connector market. At present, probe connectors have been widely used in the following fields: mobile phones, military communications, aerospace electronics, medical equipment, portable consumer electronics, and the like.

[0003]

A conventional probe connector includes an insulative body and a plurality of probes. The insulating body is substantially rectangular. The insulating body runs forward to open a plurality of blind holes arranged at intervals. The probes respectively include a metal sleeve, an elastic member and a probe. The metal sleeve has a vertically extending receiving cylinder, and a lower end of the receiving cylinder extends a bent welding leg. The probe is slidably received in the metal sleeve, and the upper end of the probe protrudes outside the metal sleeve. The resilient element is received within the metal sleeve. When the probe is assembled to the insulative housing, the metal sleeve is received in the corresponding blind hole. The probe extends beyond the blind hole. The elastic element elastically abuts between the probe and the insulative body. The soldering foot protrudes from the outside of the insulating body and is soldered to a circuit board.

[0004]

However, the probe of the above conventional probe connector is difficult to be stably disposed on the probe connector, and at the same time, the probe connector has a bent solder fillet, which reduces the contact area of the solder joint with the circuit board. This makes it difficult for the probe connector to be securely soldered to the board, thereby affecting the electrical performance stability of the probe connector.

[0005]

The purpose of this creation is to overcome the deficiencies in the prior art described above and to provide a probe connector that ensures electrical performance stability.

[0006]

The present invention provides a probe connector including an insulative body and a plurality of probes. The insulative housing has an annular base body and a plurality of spaced apart fixing seats formed by projecting upward from the periphery of the base body. The probe is integrally formed on the insulative body. The probes respectively have a probe, an elastic element, a metal sleeve and a base. The metal sleeve has a vertically extending receiving cylinder and a soldering leg extending outward from a lower side of the peripheral edge of the receiving cylinder. The soldering feet are arranged in an arc shape. The probe is slidably mounted in a metal sleeve. The elastic member is elastically received in the probe and the metal sleeve. The base is fixed to the bottom of the metal sleeve, so that the elastic member is elastically confined between the probe and the base. The soldering foot protrudes out of the fixing seat of the insulating body.

【0007】

In summary, the probe connector is integrally formed on the insulating body by the probe, so that the probe is firmly disposed on the probe connector, and at the same time, the soldering foot of the probe protrudes from the probe. The mounting body of the insulating body is outside the fixing seat, and the soldering legs of the probe are arranged in an arc shape to increase the contact area between the soldering leg and a circuit board, so that the artificial probe connector can be stably soldered to the circuit. The board ensures the electrical stability of the creative probe connector.

[0021]

100‧‧‧Probe connector 10‧‧‧Insulated body 11‧‧‧Base 12‧‧‧First support 13‧‧‧Fixed seat 131‧‧‧Base part 132‧‧‧Receiving part 133‧‧ ‧ Jack 134 ‧ ‧ rib 135 ‧ ‧ symmetrical 136 ‧ ‧ first slot 20 ‧ ‧ probe 21 ‧ ‧ probe 211 ‧ ‧ contact part 212 ‧ ‧ sliding part 213 ‧ ‧ Storage trough 214‧‧‧First abutting surface 22‧‧‧Flexible element 23‧‧‧Metal sleeve 231‧‧‧Receiving cylinder 232‧‧‧ Stop 233‧‧‧Second support 234‧‧‧ Welding feet 235‧‧ ‧ openings 236‧‧ ‧ second top surface 24 ‧ ‧ base 241 ‧ ‧ bottom plate 242 ‧ ‧ fixed column 30 ‧ ‧ reflow cap 31 ‧ ‧ substrate 32 ‧ ‧ through hole 33‧‧‧ holding ring 34‧‧‧ holding groove 35‧‧‧ second slot

[0008]

The first figure is a perspective view of the present probe connector.
The second figure is a perspective view of another angle of the probe connector shown in the first figure.
The third figure is an exploded perspective view of the probe connector shown in the first figure.
The fourth figure is a perspective view of the insulative housing of the probe connector shown in the third figure.
Figure 5 is a cross-sectional view of the probe of the probe connector shown in the third figure.
The sixth figure is an assembly diagram of the probe connector and the return cap shown in the first figure.
The seventh figure is a perspective view of the reflow cap shown in the sixth figure.

【0009】

In order to explain in detail the technical content, structural features, goals and effects of the present invention, the following is a detailed description with reference to the drawings.

[0010]

Referring to the first and second figures, the probe connector 100 of the present embodiment is soldered to a circuit board (not shown), and includes an annular insulating body 10 and a plurality of probes 20.

[0011]

Referring to the first to fourth figures, the insulative housing 10 has an annular base body 11, an annular first support portion 12 projecting inwardly from the bottom edge of the base body 11, and a plurality of upwardly projecting from the periphery of the base body 11. The spacers 13 are formed at intervals. The fixing seats 13 are cylindrical and arranged at equal intervals. The bottom of the fixing base 13 is connected to the upper surface of the first supporting portion 12. The outer side of the fixing base 13 protrudes outside the periphery of the base body 11. In this embodiment, the insulative housing 10 has six fixing seats 13 .

[0012]

Referring to the first to fourth figures, the fixing base 13 has a cylindrical portion and an upwardly penetrating base portion 131 and a semi-annular opening and an outward abutting surrounding the outer periphery of the base portion 131. Part 132. A hole 133 is defined in the bottom of the base portion 131 outwardly and downwardly. The outer peripheral edge of the base portion 131 is convexly provided with a plurality of ribs 134 spaced apart from each other. The abutting portion 132 of the fixing seat 13 protrudes from the two free ends and is connected to the outside of the periphery of the base 11. The lower ends of the abutting portions 132 of the fixing seat 13 are convexly opposed to each other to form two spaced symmetric portions 135. The symmetrical portion 135 of the fixing seat 13 is externally connected to the periphery of the base 11 and is located below the outside of the insertion hole 133 of the fixing seat 13. A first slot 136 is formed between the two symmetrical portions 135 to enhance the stability of the probe 20 formed on the insulative housing 10.

[0013]

Referring to the first, third and fifth figures, in the embodiment, the probe connector 100 comprises six probes 20. The probes 20 respectively have a probe 21, an elastic member 22, a metal sleeve 23 and a base 24. The probe 21 has a cylindrical contact portion 211 and an annular sliding portion 212 projecting outwardly from the bottom of the peripheral edge of the contact portion 211. The top of the contact portion 211 is hemispherical. A receiving slot 213 is defined in the middle of the lower end of the probe 21 . The receiving portion 211 extends through the central portion of the lower end of the contact portion 211 . The top surface of the sliding portion 212 of the probe 21 is defined as a first abutting surface 214. The top wall of the receiving groove 213 is arranged in an inverted cone shape. The elastic member 22 is a spring.

[0014]

Referring to the first, third and fifth figures, the metal sleeve 23 has a vertically extending receiving cylinder 231 and an annular stop formed by the upper portion of the periphery of the receiving cylinder 231. 232. A soldering leg 234 extending outward from a lower side of the peripheral portion of the accommodating cylinder 231 and a semi-annular second supporting portion 233 protruding outwardly from the other side of the lower portion of the peripheral edge of the accommodating cylinder 231. The soldering legs 234 are disposed in an arc shape, and the soldering legs 234 have two longer sides to enhance the stability of the probe 20 and the insulative housing 10 integrally formed. An opening 235 is formed in the middle of the accommodating cylinder 231. The bottom surface of the stop portion 232 is defined as a second abutting surface 236. The first abutment surface 214 matches the second abutment surface 236. The base 24 has a disc-shaped bottom plate 241 and a fixing post 242 formed by a central portion of the upper surface of the bottom plate 241.

[0015]

Referring to the first to fifth figures, when the present probe connector 100 is assembled, the probe 21 can be slidably mounted in the metal sleeve 23. The elastic member 22 is elastically housed in the probe 21 and the metal sleeve 23. The base 24 is fixed to the bottom of the metal sleeve 23 to elastically limit the elastic member 22 between the probe 21 and the base 24. Specifically, the probe 21 is installed in the accommodating cylinder 231 of the metal sleeve 23 through the opening 235 of the metal sleeve 23 . The contact portion 211 protrudes from the accommodating cylinder 231 , and the sliding portion 212 is slidably received in the accommodating cylinder 231 of the metal sleeve 23 .

[0016]

Referring to the first to fifth figures, the elastic member 22 is elastically received in the receiving slot 213 of the probe 21 and the receiving sleeve 231 of the metal sleeve 23, and the upper end of the elastic member 22 abuts against the receiving slot 213. Top wall. The base 24 is fixed to the bottom of the accommodating cylinder 231 of the metal sleeve 23 . The elastic member 22 is sleeved on the fixing post 242, and the lower end of the elastic member 22 abuts against the upper surface of the bottom plate 241 of the base 24, so that the elastic member 22 is elastically limited to the upper surface of the bottom plate 241 of the base 24 and the receiving groove of the probe 21. 213 between the top walls of the tank. The mounting post 242 provides a central location for the resilient member 22 to facilitate control of its compression profile. Therefore, the sliding portion 212 of the probe 21 can slide up and down along the inner groove wall of the accommodating cylinder 231. The probe 21 is elastically stretchable up and down in the accommodating cylinder 231. When the elastic member 22 is in a free state, the sliding portion 212 of the probe 21 is held by the stopper portion 232.

[0017]

Referring to the first to fifth figures, the plurality of probes 20 are integrally formed on the insulative housing 10 such that the probe 20 is firmly disposed on the probe connector 100. Specifically, the accommodating cylinder 231 of the metal sleeve 23 is fixed in the fixing base 13 . The contact portion 211 of the probe 21 is exposed on the fixing base 13. The soldering leg 234 of the metal sleeve 23 protrudes out of the fixing seat 13 of the insulative housing 10 through the insertion hole 133, and the soldering leg 234 can be stably soldered to the circuit board, so that the artificial probe connector 100 can be securely soldered to the board.

[0018]

Referring to FIG. 1 to FIG. 7 , when the probe connector 100 performs a surface mount process, a reflow cap 30 is mounted on the insulative housing 10 and the probe 20 . The reflow cap 30 has a disc-shaped substrate 31. A plurality of through holes 32 are formed in the periphery of the substrate 31 at intervals. The substrates 31 are respectively protruded downward to form a plurality of holding rings 33 disposed at intervals. The holding rings 33 respectively correspond to and communicate with the through holes 32. A retaining groove 34 is recessed upwardly from the bottom of the inner circumference of the retaining ring 33. A second slot 35 communicating with the through hole 32 is defined in the outer side and the inner side of the retaining ring 33 .

[0019]

Referring to FIG. 1 to FIG. 7 , the holding ring 33 is fixed on the fixing seat 13 , and the contact portion 211 of the probe 21 is received in the holding ring 33 . Specifically, the upper end of the fixing base 13 is retained in the holding groove 34. The retaining ring 33 abuts against the abutting portion 132. The ribs 134 on both sides of the outer circumference of the fixing seat 13 abut against both sides of the inner wall of the retaining ring 33. The rib 134 at the front end of the outer periphery of the base portion 131 of the fixing seat 13 is limited to the second slot 35 at the front end of the retaining ring 33 to prevent the reflow cap 30 from rotating. The rib 134 at the front end of the outer periphery of the fixing seat 13 is located between the two side walls of the second slot 35 and corresponds to the soldering leg 234 extending outside the fixing seat 13. It can be seen that the present probe connector 100 can smoothly perform the surface mount process by the reflow cap 30.

[0020]

In summary, the probe connector 100 is integrally formed on the insulative housing 10 by the probe 20, so that the probe 20 is stably disposed on the probe connector 100, and at the same time, the probe 20 is The soldering leg 234 protrudes from the fixing seat 13 of the insulative housing 10, and the soldering leg 234 of the probe 20 is disposed in an arc shape to increase the contact area between the soldering leg 234 and the circuit board, so that the creation The probe connector 100 can be securely soldered to the circuit board to ensure electrical performance stability of the inventive probe connector 100.

100‧‧‧ probe connector

10‧‧‧Insulated body

11‧‧‧ base

12‧‧‧First support

13‧‧‧ Fixed seat

131‧‧‧Base section

132‧‧‧Abutment

133‧‧‧ jack

134‧‧‧ ribs

135‧‧ symmetrical part

136‧‧‧first slot

20‧‧‧ probe

21‧‧‧ Probe

23‧‧‧Metal sleeve

24‧‧‧Base

Claims (10)

[Item 1] A probe connector comprising:
An insulative housing having an annular base body and a plurality of spaced apart fixing seats formed upwardly from the periphery of the base body; and a plurality of probes integrally formed on the insulative housing, the probes respectively having a probe and an elastic element a metal sleeve and a base, the metal sleeve has a vertically extending receiving cylinder and a welding leg extending outward from a lower side of the peripheral edge of the receiving cylinder, the welding legs being arranged in a curved shape The probe is slidably mounted in a metal sleeve. The elastic member is elastically received in the probe and the metal sleeve. The base is fixed on the bottom of the metal sleeve, so that the elastic member is elastically limited. Between the probe and the base, the soldering foot protrudes from the fixing seat of the insulating body. [Item 2] The probe connector of claim 1, wherein the mounts are cylindrical and are equally spaced. [Item 3] The probe connector of claim 1, wherein the insulative housing has an annular first support portion projecting inwardly from a bottom periphery of the base body, the bottom of the mount being connected to the first support portion Upper surface. [Item 4] The probe connector of claim 1, wherein the fixing base has a base portion, and a bottom portion of the base portion extends outwardly and downwardly, and the metal sleeve is welded. The foot protrudes out of the fixing seat of the insulating body through the socket. [Item 5] The probe connector of claim 4, wherein the fixing base has a semi-annular opening and an outward abutting portion surrounding a lower portion of the outer periphery of the base portion, and the fixing seat is abutted. The two free ends of the base portion are extended and connected to the outside of the periphery of the base body, and the lower portions of the two free ends of the abutting portion of the fixing seat are convexly formed to form two spaced symmetrical portions, and the symmetrical portion of the fixing seat is externally connected to the periphery of the base body. A first slot is formed between the two symmetrical portions. [Item 6] The probe connector of claim 4, wherein the outer peripheral edge of the base portion is convexly provided with a plurality of spaced apart ribs, and the rib at the front end of the outer peripheral edge of the base portion protrudes from The soldering feet outside the fixing seat correspond to each other. [Item 7] The probe connector of claim 1, wherein the lower end of the lower end of the probe extends downwardly to define a receiving slot, and the elastic member is elastically received in the receiving slot of the probe and the receiving sleeve of the metal sleeve. Inside. [Item 8] The probe connector of claim 7, wherein the upper end of the elastic member abuts against the top wall of the receiving slot, the base has a bottom plate, and a fixing formed by a central portion of the upper surface of the bottom plate The elastic member is sleeved on the fixing column, and the lower end of the elastic member abuts against the upper surface of the bottom plate, so that the elastic member is elastically restricted between the upper surface of the bottom plate and the top wall of the receiving groove of the probe. [Item 9] The probe connector of claim 7, wherein the probe has a cylindrical contact portion, the lower end of the lower end of the contact portion extends downwardly to open the receiving groove, and the receiving groove top The wall is set in an inverted cone shape. [Item 10] The probe connector of claim 9, wherein the probe has an annular sliding portion projecting outwardly from a bottom portion of the periphery of the contact portion, the metal sleeve having an upper portion of the periphery of the receiving cylinder An annular stop formed to protrude inwardly, a top surface of the sliding portion of the probe is defined as a first abutting surface, and a bottom surface of the stopping portion is defined as a second abutting surface, and the first abutting surface is The second top surface matches.